JPH0250195B2 - - Google Patents

Info

Publication number
JPH0250195B2
JPH0250195B2 JP56202813A JP20281381A JPH0250195B2 JP H0250195 B2 JPH0250195 B2 JP H0250195B2 JP 56202813 A JP56202813 A JP 56202813A JP 20281381 A JP20281381 A JP 20281381A JP H0250195 B2 JPH0250195 B2 JP H0250195B2
Authority
JP
Japan
Prior art keywords
current
electrode
electrodes
separated
separation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56202813A
Other languages
Japanese (ja)
Other versions
JPS58104016A (en
Inventor
Katsumi Suzuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP20281381A priority Critical patent/JPS58104016A/en
Publication of JPS58104016A publication Critical patent/JPS58104016A/en
Publication of JPH0250195B2 publication Critical patent/JPH0250195B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/505Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges
    • C23C16/509Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using radio frequency discharges using internal electrodes
    • C23C16/5093Coaxial electrodes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Photoreceptors In Electrophotography (AREA)
  • Chemical Vapour Deposition (AREA)

Description

【発明の詳細な説明】 発明の技術分野 本発明はたとえばグロー放電により感光体表面
にアモルフアスSi層を形成する成膜方法および成
膜装置に関する。
DETAILED DESCRIPTION OF THE INVENTION Technical Field of the Invention The present invention relates to a film forming method and a film forming apparatus for forming an amorphous Si layer on the surface of a photoreceptor by, for example, glow discharge.

発明の技術的背景と問題点 一般に、電子写真装置などにおいてはSe、
ZnO、OPCなどの感光体を用いているが、Se感
光体はガラス転移点が42〜40℃と低いことから、
夏など装置内部の温度上昇が激しいときなどは表
面電位の低下を引き起こし画像濃度低下の不都合
を生じ、また、ZnO感光体は耐湿性およびライフ
が短かくなる欠点があつた。
Technical background and problems of the invention Generally, in electrophotographic devices, Se,
Photoreceptors such as ZnO and OPC are used, but Se photoreceptors have a low glass transition point of 42 to 40℃, so
When the temperature inside the device increases rapidly, such as in summer, the surface potential decreases, resulting in a decrease in image density, and ZnO photoreceptors also have the disadvantage of shortened moisture resistance and life.

そこで、金点アモルフアスSi(a−Si)なる感
光体が注目されてきた。このa−Si感光体はたと
えば第1図および第2図に示すように成形され
る。すなわち、10-5トール以上の真空にされたチ
ヤンバー1内にSiH4ガスと10ppm程度のB2H6
混合ガスを導入管2を介して導入し、圧力を0.1
〜1トールにするとともにアルミドラム基板3の
温度をヒータ5により250℃の状態としR.Fパワ
ー供給源4から電極9へパワーを供給してグロー
放電を開始する。これにより、SiH4、B2H6は矢
印の方向に移動し、チヤンバー1内でグロー放電
によつてSi−H、Si−H2、Si−H3などのラジカ
ルを形成し、アルミドラム基板3上に堆積されて
アモルフアスSi層が形成される。一方、チヤンバ
ー1内のSiH4、B2H6ガスはメカニカルブースタ
ーポンプ7およびロータリーポンプ8を通じて排
気され、図示しない燃焼塔を介して廃去される。
なお、アルミドラム基板3は第2図に示す如く回
転され、円周方向の堆積むらはない。
Therefore, a photoreceptor made of gold-dot amorphous Si (a-Si) has attracted attention. This a-Si photoreceptor is molded, for example, as shown in FIGS. 1 and 2. That is, a mixed gas of SiH 4 gas and about 10 ppm B 2 H 6 is introduced into the chamber 1, which is evacuated to 10 -5 Torr or more, through the introduction pipe 2, and the pressure is reduced to 0.1.
The temperature of the aluminum drum substrate 3 is set to 250° C. by the heater 5, and power is supplied from the RF power supply source 4 to the electrode 9 to start glow discharge. As a result, SiH 4 and B 2 H 6 move in the direction of the arrow and form radicals such as Si-H, Si-H 2 and Si-H 3 by glow discharge within the chamber 1, and the aluminum drum substrate 3 to form an amorphous Si layer. On the other hand, the SiH 4 and B 2 H 6 gases in the chamber 1 are exhausted through the mechanical booster pump 7 and the rotary pump 8, and are disposed of through a combustion tower (not shown).
Note that the aluminum drum substrate 3 is rotated as shown in FIG. 2, and there is no uneven deposition in the circumferential direction.

しかしながら、従来においては、SiH4、B2H6
のガスの流れを見ても分かるように、排気が下か
らなされるためにアルミドラム基板3の上、中、
下部でガスの密度が異なる。このため、グロー放
電のマツチング状態が変化し堆積終了後のアルミ
ドラム基板3上のa−Si層6の膜厚がドラム基板
3の上、中、下部で異なり、不均一になるという
不都合があつた。
However, in the past, SiH 4 , B 2 H 6
As can be seen from the gas flow, the exhaust is done from below, so the aluminum drum board 3 is
The density of the gas is different at the bottom. For this reason, the matching state of the glow discharge changes, and the film thickness of the a-Si layer 6 on the aluminum drum substrate 3 after deposition is different at the top, middle, and bottom of the drum substrate 3, resulting in an inconvenient nonuniformity. Ta.

発明の目的 本発明の上記事情に着目してなされたもので、
その目的とするところは、アモルフアスSi層の膜
厚を均一に形成できるようにした成膜方法および
成膜装置を提供しようとするものである。
Purpose of the Invention The present invention has been made focusing on the above circumstances,
The purpose is to provide a film forming method and a film forming apparatus that can form an amorphous Si layer with a uniform thickness.

発明の概要 本発明は筒状の電極をその軸方向に亘つて複数
個に分離し、これら各分離電極にそれぞれ個別に
電源を接続し、これら各電源から各分離電極に常
時一定量の電流を供給するようにしたものであ
る。
Summary of the Invention The present invention separates a cylindrical electrode into a plurality of parts along its axis, connects a power source to each of these separated electrodes individually, and constantly supplies a constant amount of current from each power source to each separated electrode. It was designed to be supplied.

発明の実施例 以下、本発明の一実施例を第3図および第4図
にもとずいて説明する。図中11はチヤンバー
で、このチヤンバー11内には膜支持体としての
アルミニユーム製のドラム基板12が回転可能に
収納されている。このドラム基板12内にはヒー
タ13が挿入され、また、ドラム基板12の外周
部は筒状の電極14によつて囲繞されている。こ
の電極14はその軸方向に亘つて上、中、下部に
分離され、これら各分離電極14a,14b,1
4c間には絶縁管15,16,17が介在されて
いる。これら分離電極14a,14b,14cに
はそれぞれ別々のR.F電源P1,P2,P3が接続され
ている。また、上記分離電極14a,14b,1
4cに供給される放電電流量は電流計18,1
9,20によつてモニターされるようになつてい
る。さらに、上記電流計18,19,20と上記
R.F電源P1,P2,P3とはフイドバツク回路18
a,19b,20cを回して接続され、電流計1
8,19,20に流される電流が所定値と異なつ
たときは上記R.E電源P1,P2,P3に信号が送ら
れ、常時、所定の電流量が流れるようにコントロ
ールするようになつている。
Embodiment of the Invention Hereinafter, an embodiment of the present invention will be described based on FIGS. 3 and 4. In the figure, reference numeral 11 denotes a chamber, and within this chamber 11 is rotatably housed an aluminum drum substrate 12 serving as a membrane support. A heater 13 is inserted into the drum substrate 12, and the outer periphery of the drum substrate 12 is surrounded by a cylindrical electrode 14. This electrode 14 is divided into upper, middle, and lower parts in the axial direction, and each of these separated electrodes 14a, 14b, 1
Insulating tubes 15, 16, and 17 are interposed between 4c. Separate RF power supplies P 1 , P 2 and P 3 are connected to these separation electrodes 14a, 14b and 14c, respectively. In addition, the separation electrodes 14a, 14b, 1
The amount of discharge current supplied to 4c is measured by the ammeter 18,1
9 and 20. Furthermore, the above-mentioned ammeters 18, 19, 20 and the above-mentioned
RF power supplies P 1 , P 2 , P 3 are feedback circuit 18
Connected by turning a, 19b, 20c, ammeter 1
When the current flowing through terminals 8, 19, and 20 differs from a predetermined value, a signal is sent to the RE power supplies P 1 , P 2 , and P 3 to control the current so that a predetermined amount of current flows at all times. There is.

また、上記チヤンバー11の底部には排気管2
3が接続され、この排気管23にはメカニカルブ
ースタポンプ21およびロータリーポンプ22が
装着されている。
Furthermore, an exhaust pipe 2 is provided at the bottom of the chamber 11.
3 is connected to the exhaust pipe 23, and a mechanical booster pump 21 and a rotary pump 22 are attached to this exhaust pipe 23.

また、上記分離電極14a,14b,14cは
内部にガス通路24を有し、内周面には多数個の
噴出孔25…か穿設されている。さらに、上記チ
ヤンバー11の内底部にはガス導入管26が接続
されている。
Further, the separation electrodes 14a, 14b, 14c have a gas passage 24 inside, and a large number of ejection holes 25 are bored in the inner peripheral surface. Furthermore, a gas introduction pipe 26 is connected to the inner bottom of the chamber 11 .

しかして、成膜時には真空チヤンバー11を
10-6トールの真空に引くとともにヒーター13に
通電して導電性のドラム基板12を250℃に加熱
する。また、ガス導入管26よりSiH4ガス
300SCCMを導入し、ガス噴出口25よりドラム基
板12の表面に向けてSiH4ガスを噴きつける。
ガスはメカニカルブースターポンプ21とロータ
リポンプ22の排気系により排出される。真空容
器11内のSiH4ガス圧が1.0トールとなる様に図
示しない排気バルブを調整する。又、円周方向で
のa−SiH膜の均一性を確保するためドラム基板
12は図示しないモーターにより回転させる。
However, during film formation, the vacuum chamber 11 is
A vacuum of 10 -6 Torr is drawn and electricity is applied to the heater 13 to heat the conductive drum substrate 12 to 250°C. In addition, SiH 4 gas is introduced from the gas introduction pipe 26.
A 300 SCCM is introduced and SiH 4 gas is sprayed from the gas spout 25 toward the surface of the drum substrate 12.
The gas is exhausted by an exhaust system of a mechanical booster pump 21 and a rotary pump 22. An exhaust valve (not shown) is adjusted so that the SiH 4 gas pressure in the vacuum container 11 is 1.0 Torr. Further, in order to ensure uniformity of the a-SiH film in the circumferential direction, the drum substrate 12 is rotated by a motor (not shown).

この状態からラジオフリークエンシーパワー
(R.F.Power)電源P1,P2,P3をONにしすべて
の電源P1,P2,P3のパワーを500Wに設定する。
From this state, turn on the radio frequency power (RFPower) power supplies P 1 , P 2 , and P 3 and set the power of all power supplies P 1 , P 2 , and P 3 to 500W.

一般にSiH4のプラズマ放電は排気口(下方)
に集中する傾向があるため、電流計18,19,
20によつてモニターされる値は下方ほど大きく
なる。そのため、この値をフイードバツクする回
路18a,19b,20cによりR.Fパワーは真
中の電源P2の500Wを基準とすると電源P1ではよ
り大きなパワー550W、電源P3ではより小さなパ
ワー450Wに設定されなおされる。
Generally, SiH 4 plasma discharge is performed at the exhaust port (downward).
Ammeters 18, 19,
The value monitored by 20 becomes larger as it moves downward. Therefore, using circuits 18a, 19b, and 20c that feed back these values , the RF power is reset to a larger power of 550W for power supply P1 and a smaller power of 450W for power supply P3 , based on the 500W of power supply P2 in the middle. Ru.

約3時間の成膜でドラム基板12の表面にa−
SiH感光膜12aが約25μm成膜されるが、この
間プラズマの状況変化に伴いフイードバツク回路
18a,19b,20cにより、上、中、下部の
R.Fパワー電源P1,P2,P3のパワー設定値はその
都度設定しなおされる。
After about 3 hours of film formation, a-
A SiH photoresist film 12a is deposited to a thickness of approximately 25 μm, and during this time, feedback circuits 18a, 19b, and 20c are used to control the upper, middle, and lower portions as the plasma situation changes.
The power setting values of the RF power sources P 1 , P 2 , and P 3 are reset each time.

この様に成膜されたa−Si感光体ドラム上の感
光体膜厚はドラム基板12の上中下の表面で25μ
m±0.5μmであつた。
The photoreceptor film thickness on the a-Si photoreceptor drum formed in this way is 25μ on the upper, middle and lower surfaces of the drum substrate 12.
m±0.5 μm.

これに対し(第1図)に示す従来のa−Si感光
体装置で単一の電極に単一のR.E電源より1kWの
パワーを投入して作製したa−Si感光体ドラムで
は、a−Si膜の膜厚は上方で21μm、中くらいで
25μm、下方で28μmときわめて不均一であつた。
On the other hand, in the a-Si photoreceptor drum shown in the conventional a-Si photoreceptor device shown in FIG. The thickness of the membrane is 21μm at the top and about 21μm at the middle.
It was extremely non-uniform, measuring 25 μm and 28 μm at the bottom.

なお、上記一実施例においては電極14を3分
割したが、これに限られることなく、電極14を
さらに細かく分割し、これら各分離電極への電流
値の大小をそれぞれ別々の電源へフイードバツク
すればさらに均一な膜厚を得ることができる。
In the above embodiment, the electrode 14 is divided into three parts, but the present invention is not limited to this. If the electrode 14 is further divided into three parts, and the magnitude of the current to each of these separated electrodes is fed back to a separate power supply, the electrode 14 can be divided into three parts. A more uniform film thickness can be obtained.

発明の効果 本発明は以上説明したように、筒状の電極をそ
の軸方向に亘つて複数個に分離し、これら分離電
極にそれぞれ個別に電源を接続し、これら電源か
ら上記分離電極に常時一定量の電流を供給するよ
うにしたから、電極と膜支持体との間における反
応ガスの密度が変化しても膜支持体に対し均一的
にアモルフアスSi層を成膜できるという効果を奏
するものである。
Effects of the Invention As explained above, the present invention separates a cylindrical electrode into a plurality of parts in the axial direction, connects a power source to each of these separated electrodes individually, and supplies constant constant power from these power sources to the separated electrode. Since the amount of current is supplied, an amorphous Si layer can be uniformly formed on the membrane support even if the density of the reaction gas between the electrode and the membrane support changes. be.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の成膜装置を示す側断面図、第2
図はその横断面図、第3図は本発明の一実施例で
ある成膜装置を示す側断面図、第4図はその横断
面図である。 12……膜支持体(ドラム基板)、14a,1
4b,14c……分離電極、12a……アモルフ
アスSi層、P1,P2,P3……電源。
Figure 1 is a side sectional view showing a conventional film forming apparatus;
The figure is a cross-sectional view thereof, FIG. 3 is a side cross-sectional view showing a film forming apparatus which is an embodiment of the present invention, and FIG. 4 is a cross-sectional view thereof. 12... Membrane support (drum substrate), 14a, 1
4b, 14c...separation electrode, 12a...amorphous Si layer, P1 , P2 , P3 ...power supply.

Claims (1)

【特許請求の範囲】 1 筒状の電極に電流を供給し放電させることに
より筒状の膜支持体の表面にアモルフアスSi層を
成膜する方法において、上記筒状の電極をその軸
方向に亘つて複数個に分離し、これら分離電極に
それぞれ個別に電源を接続し、これら電源から上
記各分離電極に対し常時一定量の電流を供給して
成膜することを特徴とする成膜方法。 2 各分離電極を膜支持体の上、中、下部にそれ
ぞれ対向させたことを特徴とする特許請求の範囲
第1項記載の成膜方法。 3 各分離電極に供給される電流をモニターし、
所定の電流値と異なる電流が流れたときはこれを
電源へフイードバツクして各分離電極へ一定量の
電流が流れるように制御することを特徴とする特
許請求の範囲第1項または第2項記載の成膜方
法。 4 筒状の膜支持体に対向して設けられ軸方向に
亘つて分離された複数個の分離電極からなり放電
することにより前記膜支持体の表面にアモルフア
スSi層を成膜する筒状の電極と、この電極の分離
電極にそれぞれ接続され電流を供給する複数個の
電源と、これら電源から上記分離電極に流れる電
流を一定値に制御する制御手段とを具備してなる
ことを特徴とする成膜装置。
[Claims] 1. A method for forming an amorphous Si layer on the surface of a cylindrical membrane support by supplying a current to a cylindrical electrode and discharging it, wherein the cylindrical electrode is extended in its axial direction. A method for forming a film, characterized in that the separated electrodes are separated into a plurality of electrodes, each of the separated electrodes is individually connected to a power source, and a constant amount of current is constantly supplied to each of the separated electrodes from these power sources to form a film. 2. The film forming method according to claim 1, wherein the separation electrodes are arranged to face the upper, middle, and lower parts of the membrane support, respectively. 3 Monitor the current supplied to each separation electrode,
Claim 1 or 2, characterized in that when a current different from a predetermined current value flows, this is fed back to the power source and controlled so that a constant amount of current flows to each separation electrode. film formation method. 4 A cylindrical electrode comprising a plurality of separated electrodes provided facing a cylindrical membrane support and separated in the axial direction, and forming an amorphous Si layer on the surface of the membrane support by discharging. A structure characterized by comprising: a plurality of power supplies connected to each of the separation electrodes of the electrode for supplying current; and a control means for controlling the current flowing from these power supplies to the separation electrode to a constant value. Membrane device.
JP20281381A 1981-12-16 1981-12-16 Film forming method Granted JPS58104016A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20281381A JPS58104016A (en) 1981-12-16 1981-12-16 Film forming method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20281381A JPS58104016A (en) 1981-12-16 1981-12-16 Film forming method

Publications (2)

Publication Number Publication Date
JPS58104016A JPS58104016A (en) 1983-06-21
JPH0250195B2 true JPH0250195B2 (en) 1990-11-01

Family

ID=16463621

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20281381A Granted JPS58104016A (en) 1981-12-16 1981-12-16 Film forming method

Country Status (1)

Country Link
JP (1) JPS58104016A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004083486A1 (en) * 1993-03-23 2004-09-30 Atsushi Yamagami Method and apparatus for plasma cdv by use of ultrashort wave

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5933250B2 (en) * 1977-05-20 1984-08-14 株式会社日立製作所 Condenser type gas plasma processing equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2004083486A1 (en) * 1993-03-23 2004-09-30 Atsushi Yamagami Method and apparatus for plasma cdv by use of ultrashort wave

Also Published As

Publication number Publication date
JPS58104016A (en) 1983-06-21

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