JPH0251060A - Spectrum ultrasonic microscope - Google Patents
Spectrum ultrasonic microscopeInfo
- Publication number
- JPH0251060A JPH0251060A JP63202570A JP20257088A JPH0251060A JP H0251060 A JPH0251060 A JP H0251060A JP 63202570 A JP63202570 A JP 63202570A JP 20257088 A JP20257088 A JP 20257088A JP H0251060 A JPH0251060 A JP H0251060A
- Authority
- JP
- Japan
- Prior art keywords
- frequency
- frequency distribution
- transducer
- incidence
- subject
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
【発明の詳細な説明】 〈産業上の利用分野〉 間に行うスペクトラム超音波顕微鏡に関する。[Detailed description of the invention] <Industrial application field> Regarding spectrum ultrasound microscopy performed in between.
〈従来技術〉 近年、圧電体を用いて超音波を発振し、音響し検 ンズで屈折させ超音波伝播用液体を介して被験体。<Conventional technology> In recent years, piezoelectric materials have been used to oscillate ultrasonic waves and perform sound detection. The subject through the liquid for ultrasound propagation is refracted by lenses.
倹
表面上に収束させながら被験体表面をX−Yスキャンさ
せ、その反射波或いは透過波の出力を得る櫟
ことで被験体の弾性的性質を二次元で表示する超音波顕
微鏡が開発されている。An ultrasonic microscope has been developed that displays the elastic properties of the object in two dimensions by scanning the surface of the object in an X-Y manner while converging on the surface and obtaining the output of the reflected or transmitted waves. .
代表的な超音波顕微鏡の概要を説明すると、第2図に示
すように、数十から数百MHzの一定の周波数を発振す
る高周波発振器9を用いて高周波バースト信号を作り、
圧電体10に印加する。高周波バースト信号は圧電体で
音波に変換(印加され挾
た電気信号を音波に変換して被験体に入射し、その反射
音波を再び電気信号に変換する装置を「トランスジュー
サー」と呼ぶ)され、溶融石英或いはサファイア等より
なる遅延材ll中を伝播し、遅延材と超音波伝播用液体
12の音速の差により屈折され被検体13上に収束され
る。試料の音響的な性質を反映した音波の反射波は、再
び超音波伝播用液体12に放出され、遅延材11で位相
整合されたのち圧電体10で再び電気信号に変換される
。得られた電気信号を増幅しダイオード検波した後その
出力をビデオ信号として用いている。To give an overview of a typical ultrasonic microscope, as shown in Fig. 2, a high frequency burst signal is created using a high frequency oscillator 9 that oscillates at a constant frequency of several tens to several hundred MHz.
A voltage is applied to the piezoelectric body 10. The high-frequency burst signal is converted into a sound wave by a piezoelectric material (a device that converts the applied electric signal into a sound wave and enters the subject, and converts the reflected sound wave back into an electric signal is called a "transducer"). It propagates through a delay material 11 made of fused silica, sapphire, etc., is refracted by the difference in sound speed between the delay material and the ultrasonic propagation liquid 12, and is focused onto the subject 13. The reflected wave of the sound wave reflecting the acoustic properties of the sample is emitted again into the ultrasonic propagation liquid 12, phase-matched by the delay material 11, and then converted into an electric signal by the piezoelectric body 10 again. The obtained electrical signal is amplified and diode-detected, and the output is used as a video signal.
二次元の反射強度の画像として表示する。Displayed as a two-dimensional reflection intensity image.
今までの超音波顕微鏡はこのようにある一定の周波数の
音波を音響レンズによって垂直成分も含−めた広い入射
角で被験体に照射し、その反射波of1.ib:出力を
画像の明暗として表示するものが殆どであ\5、二、[
される弾性表面波によるエネルギーの基板深部力l向へ
の漏洩、エネルギーが弾性表面波としてトランスジュー
サーの位置から検出不可能な領域へ逃げてしまうことに
よる反射波成分の現象等、多くの現象の影響が積分され
た結果としての出力しか得れず、且つ常に一画像内での
相対的な出力の関係しか提供しえない、このように今日
の超音波顕微鏡は、その原理からくる定量計測を行う上
での困難さをもっている。Conventional ultrasound microscopes irradiate the subject with sound waves of a certain frequency through an acoustic lens at a wide angle of incidence, including the vertical component, and the reflected waves of1. ib: Most display the output as brightness and darkness of the image.\5,2,[ Energy leakage due to surface acoustic waves toward the deep force of the substrate, and energy is detected from the position of the transducer as surface acoustic waves. The output can only be obtained as a result of integrating the effects of many phenomena, such as the phenomenon of reflected wave components escaping into impossible regions, and it always provides only the relative output relationship within one image. As described above, today's ultrasound microscopes have difficulties in performing quantitative measurements due to their principles.
超音波顕微鏡を用いて定量計測を可能とするものに特開
昭61−20857号公報に記載の■(z)曲線法を原
理とするものがある。 V (z)上を伝播し、再放出
された成分の干渉に起因するような機械的走査をするこ
となく、被験体表面に1’!1\ ・
励起される弾性表面波の音速成いは弾性表面波をゝ゛−
−励起る超音波の周波数など、絶対値として正確に、短
時間に試料表面二次元的に高分解能で得ならば膜厚をあ
るいは亀裂深さを定量的にそれら−の情報から得ること
が可能となり、現在の精密加工等における被破壊検査手
段、あるいは物性研究の分野など極めて広い分野で有用
な評価装置となる。There is a method based on the ■(z) curve method described in Japanese Patent Application Laid-Open No. 61-20857 that allows quantitative measurement using an ultrasonic microscope. 1'! propagating on V(z) and onto the surface of the subject without mechanical scanning such as that due to interference of re-emitted components. 1\・The sound velocity of the excited surface acoustic wave or the surface acoustic wave is
- If the frequency of the excited ultrasonic wave is obtained accurately as an absolute value and in a short time with two-dimensional high resolution on the sample surface, it is possible to quantitatively obtain the film thickness or crack depth from such information. This makes it a useful evaluation device in a wide range of fields, such as destructive inspection means in current precision machining and physical property research.
〈発明が解決しようとする課題〉
点トランスジューサーを精度良(上下する必要が〜ある
ため、−枚の画像を作成するのに膨大な時間梼
被験体の定量測定を行おうとすると測定に長時間かかる
という問題点があった。<Problem to be solved by the invention> It takes a huge amount of time to create a point transducer with high accuracy (it needs to be moved up and down). There was a problem that it took a while.
く問題点を解決するための手段〉
本発明は以上の問題点を省みてなされたもので、広帯域
の高周波パルスを発振する手段と、発振さ体に入射しそ
の反射波を受信するトランスジューサーと、得られた信
号を周波数分析する手段と、その周波数分布の特徴を定
量的に抽出あるいは記した変化が観られ、実際の非破壊
検査や物性研究に重要な情報を提供しえることを我々は
明らかにンスジューサーを移動させるか或いはトランス
ジ゛音波の試料への入射角に依存した反射波の周波数ゝ
−厚等の構造パラメータ、あるいは亀裂の存在や剥−1
梗
離を被験体表面で二次元的にかつ定量的に測定、検出を
可能とするものである。Means for Solving the Problems> The present invention has been made in consideration of the above problems, and includes a means for oscillating a broadband high-frequency pulse, a transducer for making the oscillator enter a body, and receiving the reflected wave. We have developed a method for frequency analysis of the obtained signals, quantitatively extracting or observing changes in the characteristics of the frequency distribution, and are able to provide important information for actual non-destructive testing and physical property research. Obviously, the frequency of the reflected wave depends on the angle of incidence of the transducer on the sample, or the structural parameters such as the thickness, or the presence of cracks or peeling.
This makes it possible to measure and detect infarction two-dimensionally and quantitatively on the surface of a subject.
その反射波の周波数分布や反射係数の周波数依存を得て
おくならば(1)式によって得ることが出来る。If the frequency distribution of the reflected wave and the frequency dependence of the reflection coefficient are obtained, it can be obtained using equation (1).
PI(θ、f)
R(θ
f )
P2(θ
f )
・・・・・・ (1)
ここでP2は装置の応答関数の周波数分布であり、綬
Plは被験体に於ける反射波の周波数分布である。1こ
のように入射角θを一定とするならば、無次元データで
ある周波数fの関数の反射係数が得られる。PI (θ, f) R (θ f ) P2 (θ f ) ... (1) Here, P2 is the frequency distribution of the response function of the device, and Pl is the frequency distribution of the reflected wave at the test object. This is the frequency distribution. 1 If the incident angle θ is kept constant in this way, the reflection coefficient as a function of the frequency f, which is dimensionless data, can be obtained.
特に、第4図に示すように反射係数が物性定数或いは構
造パラメータの関数として、ある周波数23で極小をも
つ場合、反射係数の極小をとる周定な情報として反射波
全体のエネルギーに影lを゛受けることなく得ることが
出来る。In particular, as shown in Figure 4, when the reflection coefficient has a minimum at a certain frequency 23 as a function of physical property constants or structural parameters, the constant information that takes the minimum reflection coefficient has an influence on the energy of the entire reflected wave. ``You can get without receiving.
このように、−画面内に於ける出力の相対値を情報とし
て用いる従来の超音波顕微鏡に対して、7秩
本発明のスペクトラム超音波顕微鏡は、被験体表1面各
点に於ける反射波の周波数分布の形状を測定状
対象とすることで、被験体の表面状態やトランス1!ジ
ユーサーの特性、装置全体の電気的或いは機械検
的な不安定要素を取り除き、被験体固有の音波にに対し
ているいろな超音波の入射角で反射波の周検
波数依存性を調べたところ、被験体の物性と構造1に依
存して入射角にある程度の幅を持たせた場合゛−でもそ
の周波数分布の形状はその入射角の広がりの中心の角度
で入射したときとほぼ同じ形状をとることを見出してい
ることから、トランスジューサーの形状を第6図に示す
ような構造にすること穢
で超音波を被験体表面に収束させ、トランスジューサー
の圧電体面積より狭い領域の観察が可能で高い分解能を
もって画像を得ることができる。In this way, unlike conventional ultrasound microscopes that use the relative value of output within the screen as information, the spectrum ultrasound microscope of the present invention uses the reflected waves at each point on the surface of the subject. By using the shape of the frequency distribution as the measurement target, the surface condition of the test object and the transformer 1! After removing the electrical and mechanical instability factors of the characteristics of the Juicer and the entire device, we investigated the frequency detection frequency dependence of the reflected waves at various incident angles of ultrasonic waves with respect to the sound waves specific to the subject. Even if the angle of incidence has a certain range depending on the physical properties and structure of the object, the shape of the frequency distribution will be almost the same as when the incidence is at the center of the spread of the angle of incidence. By making the shape of the transducer as shown in Figure 6, it is possible to focus the ultrasonic waves on the surface of the subject and observe an area narrower than the area of the piezoelectric material of the transducer. It is possible to obtain images with high resolution.
〈実施例〉
以下本発明を実施例により図面に基づき詳細に説明する
。<Example> The present invention will be described in detail below with reference to the drawings and examples.
第1図にスペクトラム超音波顕微鏡のブロックダイアダ
ラムの例を示した。Figure 1 shows an example of a block diaphragm for a spectrum ultrasound microscope.
インパルス発信器を広帯域高周波パルス発信器1として
用い、トランスジューサーは超音波を被検
験体に入射し、反射波を受信するよう設置する。An impulse transmitter is used as a wideband high-frequency pulse transmitter 1, and a transducer is installed to inject ultrasonic waves into a subject and receive reflected waves.
トランスジューサーの受信部3は広帯域用増幅器4に接
続され、増幅された信号はスペクトルアナライザーより
なる周波数分析装置5に依って周波数分析され、A/D
変換される。得られた周波数分布はコンピューターより
なる周波数分布デジタル演算及び記憶装置6によって操
作者に依ってプログラムされた特徴抽出が行われて記憶
された後、結果が画像出力装置7に表示される。試料台
と連結しているX−Yステージ駆動装置8はインバルス
発信器から出される信号に同期してX−Yスキャンされ
る。The receiving section 3 of the transducer is connected to a broadband amplifier 4, and the amplified signal is frequency-analyzed by a frequency analyzer 5 consisting of a spectrum analyzer.
converted. The obtained frequency distribution is subjected to feature extraction programmed by the operator by a frequency distribution digital calculation and storage device 6 comprised of a computer and stored, and then the result is displayed on an image output device 7. The X-Y stage drive device 8 connected to the sample stage is subjected to X-Y scanning in synchronization with the signal output from the impulse oscillator.
以上の構成によりなる装置によってつぎの様な測定が可
能であった。The following measurements were possible with the apparatus configured as described above.
膜の構成されている試料に基板、膜、超音波伝播用液体
の組合せで決まるある特定の入射角で超音波を入射し、
その反射率が極小になる周波数があった場合、膜厚dと
反射率極小周波数fは基板、膜、超音波伝播用液体の組
合せで決定される定数Cとつぎの関係があることを我々
は見出している。Ultrasonic waves are incident on a sample consisting of a membrane at a certain angle of incidence determined by the combination of the substrate, membrane, and ultrasonic propagation liquid,
If there is a frequency at which the reflectance becomes minimum, we can find that the film thickness d and the minimum reflectance frequency f have the following relationship with a constant C determined by the combination of the substrate, film, and ultrasonic propagation liquid. I'm finding out.
f*d−C・・・・・・(2)
入射角で特定の周波数で特異な吸収による極小を示さな
いものに対して同じトランスジューサーを用いて採取し
た場合の周波数分布24を記憶させておく0次に第5図
Bに示すように同じ入射角で。f*d-C...(2) Store the frequency distribution 24 when sampled using the same transducer for those that do not exhibit a minimum due to singular absorption at a specific frequency at the incident angle. at the same angle of incidence as shown in Figure 5B.
梗 !−・□
被験体で得られたそれぞれの周波数での反射波の、1゛
周波数分布25の成分が得られたとすると、各周波数で
於いて周波数分布25の値から周波数分布祇
24の値を引くと第5図Cに示すように被験体特有の極
小現象を明確に示す周波数分布26が得られる。得られ
た周波数分布26で極小値をとった周波数27を得、(
2)式から膜厚dを算出してdの大小を明暗として画像
出力装置のモニター画超音波を約30degで入射する
と、擬領弾性表梗
開披と呼ばれる表面波が被験体表面に励起され、基板に
エネルギーを放出しながら伝播することがわかっている
。このことから、トランスジューサーの音波の入射角を
30degに設定し、スペクトル超音波顕微鏡の周波数
分布のデジタル演算及び記憶装置に、第5図Aに示すよ
うに試料が先の杖
・5、−い、被験体全面の膜厚分布図
を得るように設定し1雫だ。Ryo! −・□
Assuming that a component of the 1゛ frequency distribution 25 of the reflected wave at each frequency obtained by the subject is obtained, subtracting the value of the frequency distribution 24 from the value of the frequency distribution 25 at each frequency results in the 5th component. As shown in Figure C, a frequency distribution 26 is obtained that clearly shows the minimum phenomenon unique to the subject. Obtain the frequency 27 that takes the minimum value in the obtained frequency distribution 26, and (
2) Calculate the film thickness d from the formula and set the magnitude of d to be bright and dark. When ultrasonic waves are incident on the monitor screen of the image output device at approximately 30 degrees, a surface wave called pseudo-elastic surface hemorrhage is excited on the surface of the subject. , is known to propagate while emitting energy to the substrate. From this, the incident angle of the sound wave of the transducer was set to 30 deg, and the frequency distribution digital calculation and storage device of the spectral ultrasound microscope was stored as shown in Figure 5A.
・5. - Set to obtain a film thickness distribution map for the entire surface of the subject, and use 1 drop.
檎
測定の結果、被験体全面に渡って高い空間分解能1・τ
Z1、
で膜厚の分布図が二次元的に得られ、後に破壊検・ヘー
査に依って調べたところスペクトラム超音波顕微鏡に依
って得られた膜厚分布図が正しい値を示している事が実
証された。As a result of the measurement, a high spatial resolution of 1·τ was achieved over the entire surface of the subject.
A two-dimensional film thickness distribution map was obtained using Z1, and later investigation by destructive inspection and inspection revealed that the film thickness distribution map obtained using a spectrum ultrasound microscope showed correct values. has been proven.
また膜の構成されている試料に基板、膜、超音波伝播用
液体の組合せで決まる、ある特定の入射角で超音波を入
射すると弾性表面波と呼ばれる波が強く試料表面に励起
される。この場合、極微小な面積に超音波を照射し、そ
の領域の反射音波を採取すると、基板にエネルギーを放
出しなくとも弾性表面波として受信用トランスジューサ
ーによって検出出来ない領域まで伝播していくため、弾
性表面波を励起した周波数成分のみが大きく反射波出力
の極小をとることを我々はみいだした。Furthermore, when an ultrasonic wave is incident on a sample containing a membrane at a certain angle of incidence determined by the combination of the substrate, membrane, and ultrasonic propagation liquid, waves called surface acoustic waves are strongly excited on the sample surface. In this case, if an extremely small area is irradiated with ultrasonic waves and the reflected sound waves are collected from that area, they will propagate as surface acoustic waves to areas that cannot be detected by the receiving transducer without emitting energy to the substrate. We found that only the frequency component that excited the surface acoustic wave was large, and the reflected wave output reached a minimum.
このため、第6図に示すように中心入射角40deg、
入射角幅4degにトランスジューサーを設定した0周
波数分布のデジタル演算及び記憶装置では先の例と同様
、得られる反射波の周波数分布の極小周波数を求め、膜
がクロム、基板が銅の場合の定数Cを求め、膜厚dを求
めるように設定し、被;体全面にわたり測定を行・た、
この結′1果、極微小な面積に超音波を照射し、その領
域の一反射波を採取することによって反射波出力の極小
現象が大きく現れ、正確にしかも短時間に膜厚の瞠
被験体全面の膜厚測定が行われた。Therefore, as shown in Fig. 6, the central incidence angle is 40 degrees,
In the digital calculation and storage device for zero frequency distribution with a transducer set to an incident angle width of 4 degrees, as in the previous example, find the minimum frequency of the frequency distribution of the resulting reflected wave, and calculate the constant when the film is chromium and the substrate is copper. C was determined, the film thickness d was determined, and measurements were taken over the entire surface of the object.
As a result, by irradiating ultrasonic waves onto a very small area and collecting one reflected wave from that area, the phenomenon of the minimum reflected wave output appears greatly, and it is possible to accurately and quickly measure the thickness of the film under test. The film thickness was measured over the entire surface.
溶融石英基板上に金の膜を蒸着した試料を塩酸に浸して
おくと、境界への塩酸の進入によって金の膜が短時間に
しかも微小領域で多くの部分から剥離する事が知られて
いる。It is known that when a sample with a gold film deposited on a fused silica substrate is immersed in hydrochloric acid, the gold film peels off from many parts in a short time and in a small area due to the hydrochloric acid entering the boundary. .
しかし、今までこの剥離の過程を継続的に観察すること
は困難であった。このため超音波伝播媒体に塩酸を用い
、本発明のスペクトラム超音波顕微鏡によって測定を行
った。基板から膜が剥離すると、膜が密着していた時に
は基板へのエネルギーと漏洩しながら伝播する擬似弾性
表面波の影響で存在していた反射波出力のある周波数で
の極小現象が起きなくなることを我々は見出したため、
周波数分布のデジタル演算及び記憶装置に於いて一枚
極小現象の起きた被験体の部分はモニター画面を11明
に、極小現象の起きなかった点に於いてはモニター画面
を暗として表示しながら且つ(2)式にを行った。However, until now it has been difficult to continuously observe this peeling process. For this purpose, hydrochloric acid was used as the ultrasound propagation medium, and measurements were performed using the spectrum ultrasound microscope of the present invention. When the film is peeled off from the substrate, the minimum phenomenon at a certain frequency in the reflected wave output, which existed when the film was in close contact due to the influence of pseudo surface acoustic waves propagating while leaking energy to the substrate, no longer occurs. Because we found
In the digital calculation and storage device of the frequency distribution, the monitor screen is displayed as 11 bright at the part of the subject where the minimum phenomenon occurred, and the monitor screen is displayed in darkness at the point where the minimum phenomenon did not occur. Equation (2) was performed.
この測定によって金の膜の剥離の様子が時間を追って観
察された。また観察の後スペクトラム超音波顕微鏡の記
憶していた反射波出力極小周波数から膜厚分布を画像表
示したところ、膜厚の薄い部分からより多くの剥離が発
生していたことが判明した。Through this measurement, the peeling of the gold film was observed over time. Furthermore, after the observation, when the film thickness distribution was displayed as an image based on the minimum reflected wave output frequency stored in the spectrum ultrasound microscope, it was found that more peeling occurred from the thinner parts of the film.
基板上に膜の形成されている試料に於いて第(3)式の
関係が成り立つ場合は膜と基板の間に異種の物質よりな
る中間層が存在するか、あるいは境界が完全に接合して
いないことを示しているその領域の反射波を採取してそ
のそれぞれの入射−角で反射波の出力が極小となる周波
数が完全に密・・・・・・ (3)
このため、溶融石英の上に金の膜を蒸着し、入射角θ1
=17.Odeg及び入射角θ2−25゜Qdegに設
定し、入射角幅θ3=3 d e gで第7図に示す樺
なセンサーを用いてそれぞれの入射角で独立に反射波を
採取出来るように設定を行った。If the relationship in equation (3) holds for a sample with a film formed on a substrate, it means that there is an intermediate layer made of different materials between the film and the substrate, or that the boundary is completely bonded. Collect the reflected waves in the region where the fused silica A gold film is deposited on top, and the incident angle θ1
=17. Odeg and incident angle θ2 - 25°Qdeg, and the incident angle width θ3 = 3deg. Using the birch sensor shown in Figure 7, set so that reflected waves can be collected independently at each incident angle. went.
さらに前もって得られたfl、f2に対して(3)式が
成り立つかどうか判断を行い、成り立たなければ明を、
成り立てば暗をその測定点の状態としてモニター両面に
表示するよう周波数分布のデジタル演算及び記憶装置を
設定し測定を行っ7.−た、この結果、被替体に明の部
分が認められたた′1め、破壊試験に依って確認したと
ころ、モニター両面で明の表示の行われた領域に油膜の
存在が確fl f2
≠
fl’ f2 。Furthermore, it is determined whether equation (3) holds for fl and f2 obtained in advance, and if it does not hold, then
If it holds true, set the frequency distribution digital calculation and storage device to display darkness on both sides of the monitor as the state of the measurement point, and perform the measurement7. - As a result, a bright area was observed on the replacement object, so a destructive test was conducted to confirm the presence of an oil film in the area where the bright color was displayed on both sides of the monitor fl f2 ≠ fl' f2.
た。Ta.
広帯域パルス発信器は100MHz付近までの周波数成
分を持つ信号を発信するよう設定を行い、出力はカラー
モニター画面で赤青緑の3原色それぞれの色の輝度を独
立に周波数分布のデジタル演算及び記憶装置からの命令
により表現するように設定を行った。The wideband pulse oscillator is set to emit a signal with frequency components up to around 100 MHz, and the output is a digital calculation and storage device for the frequency distribution of the brightness of each of the three primary colors of red, blue, and green independently on a color monitor screen. I set it up so that it is expressed according to the command from .
周波数分布のデジタル演算及び記憶装置には前さらに得
られた反射係数の周波数分布をOMHzから30MHz
までを緑に、30MHzから60MHzまでを青に、6
0MHzから100MHzまでを赤で、それぞれの周波
数領域の反射係数の積分値をそれに対応する色の輝度に
変換してカラーモニター画面に表示する信号を送るよう
設定を−っぽく表される領域と、緑に表現される領域の
2つの領域に大別されて表された。この観察の後、被;
体各部の化学組成比を化学分析装置を用い+1字調べた
ところ、カラーモニター画面で黄色っぽ<−表される領
域は緑に表現される領域とは異なった化学組成比をして
いることが判明した。The frequency distribution digital calculation and storage device further stores the frequency distribution of the obtained reflection coefficient from OMHz to 30MHz.
up to green, 30MHz to 60MHz blue, 6
An area represented by a --shape indicates settings for converting the integral value of the reflection coefficient in each frequency range into the luminance of the corresponding color and sending a signal to be displayed on the color monitor screen, with the range from 0MHz to 100MHz in red. The area is roughly divided into two areas, the area shown in green. After this observation, the subject;
When we investigated the chemical composition ratio of each part of the body using a chemical analyzer, we found that the areas represented as yellowish <- on the color monitor screen had a different chemical composition ratio than the areas represented as green. found.
〈発明の効果〉
秋
以上説明したように、本発明によれば被験体表面をX−
Yスキャンしながら一定の入射角で広帯5棟
域の超音波を被験体に入射しその反射波を採取し、1定
量的に観察することが出来、極めて汎用性の高い測定装
置として活用される。<Effects of the Invention> As explained above, according to the present invention, the surface of the subject is
While performing Y-scanning, ultrasonic waves in a wide range of 5 areas are incident on the subject at a constant angle of incidence, and the reflected waves can be collected and quantitatively observed.It is used as an extremely versatile measurement device. Ru.
の周波数分布の特徴を色に依って表現するようにスペク
トラム超音波顕微鏡の設定を行い、x−Y秩
ステージ駆動装置によって被験体全面の観測を行測定の
結果、被験体はカラーモニター画面で買追、1゜且つ定
量的に測定することが出来る。The spectrum ultrasound microscope was set to express the characteristics of the frequency distribution by color, and the entire surface of the subject was observed using the x-Y stage drive device.The measurement results were displayed on the color monitor screen. Additionally, it can be measured quantitatively at 1°.
第1図は本発明の典型的な実施例のブロックダイヤグラ
ム、第2図は従来の超音波顕微鏡のブロツクダイヤグラ
ム、第3図はV(z)曲線法を超音波顕微鏡で行うとき
のブロックダイヤフグラム、第4図は出力極小を持つ周
波数分布の例、第5図、へA、B、Cは反射係数の求め
方の説明図、第6図は中心入射角θl、入射角幅θ2に
設定したトランスジューサーの説明図、第7図は2つの
入射角θ1及びθ2を持ち、入射角幅θ3のトランスジ
ューサーの説明図である。
l・・J・・・広帯域高周波パルス発信器2・・・・・
・トランスジューサーの発信部3・・・・・・トランス
ジューサーの受信部4・・・・・・広帯域用増幅器
5・・・・・・周波数分析装置
6・・・・・・デジタル演算及び記憶装置7・・・・・
・画像出力装置
8・・・・・・X−Yステージ駆動装置9・・・・・・
高周波発信器
IO・・・・・・圧電体
l・・・・・・遅延材
2・・・・・・超音波伝播用液体
族
3・・・・・・被験体
4・・・・・・サーキエレーター
5・・・・・・増幅器
6・・・・・・出力検出装置
7・・・・・・画像出力装置
8・・・・・・X−Yステージ駆動装置9・・・・・・
音響レンズ
0・・・・・・出力検出装置
l・・・・・・V(z)曲線出力解析装置2・・・・・
・Zステージ駆動装置
3・・・・・・反射係数極小周波数
4・・・・・・特異な極小を持たない周波数分布棟
5・・・・・・被験体に於いて
得られる周波数分布
千金
26・・・・・・得られた被験体の反射率捻
27・・・・・・得られた被験体の反射率の極小をとる
周波数
秋
28・・・・・・被験体の基板
9・・・・・・被験体の膜
0・・・・・・超音波伝播用液体
1・・・・・・中心入射角
2・・・・・・入射角幅
3・・・・・・超音波伝播用液体
4・・・・・・中心入射角θ1
5・・・・・・中心入射角θ2
6・・・・・・入射角幅θ3
特 許
出 願
人
凸版印刷株式会社
代表者 鈴木和夫
第1図
第2図
第4図
十
J5図CFigure 1 is a block diagram of a typical embodiment of the present invention, Figure 2 is a block diagram of a conventional ultrasound microscope, and Figure 3 is a block diagram when the V(z) curve method is performed using an ultrasound microscope. Fig. 4 is an example of a frequency distribution with an output minimum, Fig. 5, A, B, and C are explanatory diagrams of how to obtain the reflection coefficient, and Fig. 6 is set to the center incident angle θl and the incident angle width θ2. FIG. 7 is an explanatory diagram of a transducer having two incident angles θ1 and θ2, and an incident angle width θ3. l...J...Broadband high frequency pulse oscillator 2...
Transducer transmitting section 3... Transducer receiving section 4... Broadband amplifier 5... Frequency analyzer 6... Digital calculation and storage device 7...
・Image output device 8...X-Y stage drive device 9...
High frequency oscillator IO... Piezoelectric material l... Delay material 2... Liquid family for ultrasonic propagation 3... Test object 4... Circhierator 5...Amplifier 6...Output detection device 7...Image output device 8...X-Y stage drive device 9...・
Acoustic lens 0...Output detection device l...V(z) curve output analysis device 2...
・Z stage drive device 3...Reflection coefficient minimum frequency 4...Frequency distribution ridge with no peculiar minimum 5...Frequency distribution obtained in the subject 26 ...Reflectance of the obtained test object 27 ... Frequency at which the obtained reflectance of the test object is minimized 28 ... Substrate 9 of the test object... ...Membrane of subject 0 ... Liquid for ultrasound propagation 1 ... Center incidence angle 2 ... Incident angle width 3 ... Ultrasonic propagation Liquid 4... Central incident angle θ1 5... Center incident angle θ2 6... Incident angle width θ3 Patent Permission Applicant Toppan Printing Co., Ltd. Representative Kazuo Suzuki No. 1 Figure 2 Figure 4 Figure 10 J5 Figure C
Claims (1)
た電気信号を音波に変換し被検体に一定の入射角で入射
しその反射波を受信するトランスジューサーと、得られ
た信号を周波数分析する手段と、その周波数分布の特徴
を定量的に抽出あるいは記憶する手段とを具備し、さら
にこれらの行程と連動する、被検体表面平行に、被検体
に対してトランスジューサーを移動させるか或いはトラ
ンスジューサーに対して被検体を音波の発振と受信およ
び周波数分析の行程を同期させて二次元的に移動させる
駆動手段を有し、被検体各点に於ける超音波の試料への
入射角に依存した周波数分布の情報或いは其から求めら
れた定量的な被検体の情報を二次元に出力する手段を有
する事を特徴とするスペクトラム超音波顕微鏡。 2)広帯域の高周波パルスを発振する手段と、入射角に
依存する周波数分布の特徴を損なわない程度に入射角に
幅を持たせ被検体表面に音波を収束させるか或いは微小
部からの反射波成分のみを受信する等の方法によって被
検体の微小領域のみからの反射波を受信するトランスジ
ューサーと、得られた信号を周波数分析する手段と、そ
の周波数分布の特徴を定量的に抽出あるいは記憶する手
段とを具備し、さらにこれらの行程と連動する、被検体
表面平行に、被検体に対してトランスジューサーを移動
させるか或いはトランスジューサーに対して被検体を音
波の発振と受信および周波数分析の行程を同期させて二
次元的に移動させる駆動手段を有し、被検体各点に於け
る超音波の試料への入射角に依存した周波数分布の情報
或いは其から求められた定量的な被検体の情報を二次元
に出力する手段を有する事を特徴とするスペクトラム超
音波顕微鏡。[Claims] 1) means for oscillating a broadband high-frequency pulse, a transducer for converting the oscillated electrical signal into a sound wave, making it incident on a subject at a constant angle of incidence, and receiving the reflected wave; It is equipped with a means for frequency analysis of the detected signal and a means for quantitatively extracting or storing the characteristics of the frequency distribution. It has a drive means that moves the object two-dimensionally with respect to the transducer by synchronizing the processes of oscillation and reception of sound waves and frequency analysis, and has a driving means that moves the object two-dimensionally with respect to the transducer, and the ultrasonic wave at each point of the object moves the object two-dimensionally. 1. A spectrum ultrasound microscope characterized by having means for two-dimensionally outputting information on a frequency distribution depending on the incident angle or quantitative object information obtained from the information. 2) A means of oscillating a broadband high-frequency pulse, and converging the sound wave on the surface of the object by giving a width to the angle of incidence to an extent that does not impair the characteristics of the frequency distribution that depends on the angle of incidence, or emitting reflected wave components from minute parts. A transducer that receives reflected waves from only a minute region of a subject by a method such as receiving only a small area of the subject, a means for frequency analysis of the obtained signal, and a means for quantitatively extracting or storing the characteristics of the frequency distribution. Furthermore, in conjunction with these steps, the transducer is moved relative to the object parallel to the surface of the object, or the object is moved relative to the transducer, and the steps of emitting and receiving sound waves and frequency analysis are performed. It has a driving means for synchronized two-dimensional movement, and provides information on the frequency distribution depending on the angle of incidence of ultrasonic waves on the sample at each point of the object, or quantitative information on the object obtained from it. A spectrum ultrasonic microscope characterized by having means for outputting in two dimensions.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63202570A JPH079418B2 (en) | 1988-08-12 | 1988-08-12 | Spectrum ultrasound microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63202570A JPH079418B2 (en) | 1988-08-12 | 1988-08-12 | Spectrum ultrasound microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0251060A true JPH0251060A (en) | 1990-02-21 |
| JPH079418B2 JPH079418B2 (en) | 1995-02-01 |
Family
ID=16459688
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63202570A Expired - Fee Related JPH079418B2 (en) | 1988-08-12 | 1988-08-12 | Spectrum ultrasound microscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH079418B2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7040170B2 (en) | 2003-08-21 | 2006-05-09 | Murata Manufacturing Co., Ltd. | Methods for measuring strength of film and determining quality of object having the film |
| CN113624845A (en) * | 2020-05-06 | 2021-11-09 | 明格(上海)信息技术有限公司 | Ultrasonic color imaging method, system, device, computing equipment and readable medium |
-
1988
- 1988-08-12 JP JP63202570A patent/JPH079418B2/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7040170B2 (en) | 2003-08-21 | 2006-05-09 | Murata Manufacturing Co., Ltd. | Methods for measuring strength of film and determining quality of object having the film |
| CN113624845A (en) * | 2020-05-06 | 2021-11-09 | 明格(上海)信息技术有限公司 | Ultrasonic color imaging method, system, device, computing equipment and readable medium |
| CN113624845B (en) * | 2020-05-06 | 2025-01-07 | 明格(上海)信息技术有限公司 | Ultrasonic color imaging method, system, device, computing device and readable medium |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH079418B2 (en) | 1995-02-01 |
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