JPH0258769B2 - - Google Patents
Info
- Publication number
- JPH0258769B2 JPH0258769B2 JP8009381A JP8009381A JPH0258769B2 JP H0258769 B2 JPH0258769 B2 JP H0258769B2 JP 8009381 A JP8009381 A JP 8009381A JP 8009381 A JP8009381 A JP 8009381A JP H0258769 B2 JPH0258769 B2 JP H0258769B2
- Authority
- JP
- Japan
- Prior art keywords
- solution
- semiconductor substrate
- chamber
- reservoir
- raw material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000758 substrate Substances 0.000 claims description 37
- 239000013078 crystal Substances 0.000 claims description 28
- 239000004065 semiconductor Substances 0.000 claims description 19
- 238000000034 method Methods 0.000 claims description 17
- 239000002994 raw material Substances 0.000 claims description 16
- 239000007791 liquid phase Substances 0.000 claims description 10
- 239000002699 waste material Substances 0.000 claims description 4
- 239000007788 liquid Substances 0.000 claims description 3
- 125000006850 spacer group Chemical group 0.000 description 10
- 230000002159 abnormal effect Effects 0.000 description 5
- 239000000203 mixture Substances 0.000 description 3
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010348 incorporation Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B19/00—Liquid-phase epitaxial-layer growth
- C30B19/06—Reaction chambers; Boats for supporting the melt; Substrate holders
- C30B19/063—Sliding boat system
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Description
【発明の詳細な説明】
この発明は液相エピタキシヤル方法によつて半
導体結晶層を得るために用いれらる、エピタキシ
ヤル成長方法および装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an epitaxial growth method and apparatus used to obtain a semiconductor crystal layer by a liquid phase epitaxial method.
半導体層成長の方法のひとつとしての液相エピ
タキシヤルの方法には従来よりいくつかの方法が
考えられている。そのひとつとしてのメルト落下
式のいわゆるスリツトボートによるエピタキシヤ
ル装置の概略を第1図に示す。 Several methods have been considered for liquid phase epitaxial growth as one of the methods for growing semiconductor layers. FIG. 1 shows an outline of one such epitaxial apparatus using a melt drop type so-called slit boat.
第1図において、Hは支持体で基板結晶を入れ
る容器18が設けてあり、半導体基板は19に示
される。12は液相エピタキシヤル用の原料溶液
17(GaAs、GaP、Ga1-xAlxAsなどの薄膜を成
長させる場合には、前記成分を含むGa溶液を用
いる)をいれる下部に穴のあいた溜を有するスラ
イダー、14にこのスライダーを移動させる押
棒、15に溜にある原料を下方へ落下させる為の
重しおよび揮発を防ぐ為のふたを示す。13に液
相エピタキシヤル使用後の原料16を入れる上部
に穴のあいた溜を有するスライダー、17はこの
スライダーを移動させる押棒を示す。上記の装置
によるエピタキシヤルの工程はつぎの様になる。 In FIG. 1, reference numeral H denotes a support, and a container 18 for containing a substrate crystal is provided, and 19 indicates a semiconductor substrate. Reference numeral 12 denotes a reservoir with a hole at the bottom into which a raw material solution 17 for liquid phase epitaxial use is placed (a Ga solution containing the above components is used when growing thin films such as GaAs, GaP, Ga 1-x Al x As, etc.). 14 is a push rod for moving the slider, 15 is a weight for dropping the raw materials in the reservoir downward, and a lid for preventing volatilization. Reference numeral 13 indicates a slider having a holed reservoir at the top into which the raw material 16 after liquid phase epitaxial use is placed, and reference numeral 17 indicates a push rod for moving this slider. The epitaxial process using the above apparatus is as follows.
押棒14を押し、スライダー12を移動さ
せ、原料溶液を11の支持体中に落とし、基板
19と接触させる。 The push rod 14 is pushed, the slider 12 is moved, the raw material solution is dropped into the support 11, and brought into contact with the substrate 19.
所望の厚さの成長後、押棒17を押し、スラ
イダー13を移動させ、原料溶液を溜へ落下さ
せ、基板上への結晶成長を中止させる。 After the desired thickness has been grown, the push rod 17 is pushed and the slider 13 is moved to drop the raw material solution into the reservoir and stop the crystal growth on the substrate.
多成長の場合には、この工程をくりかえして、
多層の結晶を得る。 In case of multiple growth, repeat this process.
Obtain multilayer crystals.
ところで、この様な工程で、P型GaAs基板上
に、P型Ga1-xAlxAs、(x0.3)、N型Ga1-yAly
As(y0.6)の結晶を成長させて、シングルヘ
テロ接合型赤色発光素子を得ているが、発光効率
及び発光波長特性の成長結晶の面内の不均一性が
あり、全体として、半導体装置として用いる際に
極めて具合が悪い。この特性の面内不均一性の原
因として、(a)溶液落下時に基板に不均一に接触す
る為の異常成長、(b)溶液中に含まれる酸化物20
等が落下して、基板に接触し、成長を防たげる。
等が考えられる。 By the way, in this process, P-type Ga 1-x Al x As, (x0.3), N-type Ga 1-y Al y are formed on the P-type GaAs substrate.
A single heterojunction red light-emitting device has been obtained by growing As (y0.6) crystals, but there is in-plane non-uniformity in luminous efficiency and emission wavelength characteristics, and as a whole, the semiconductor device It is extremely uncomfortable when used as The causes of this in-plane non-uniformity of properties are (a) abnormal growth due to non-uniform contact with the substrate when the solution falls, and (b) oxide 20 contained in the solution.
etc., may fall and come into contact with the substrate, preventing growth.
etc. are possible.
本発明は、上記の様な従来の液相エピタキシヤ
ル法に帰因する発光効率、発光波長等の特性の不
均一性を除去する新しい液相エピタキシヤル成長
方法及び成長装置を提供することにある。 An object of the present invention is to provide a new liquid phase epitaxial growth method and growth apparatus that eliminates the non-uniformity of characteristics such as luminous efficiency and emission wavelength caused by the conventional liquid phase epitaxial method as described above. .
従来の方法では、基板上へ溶液を落下させる際
に基板上に直接落としている為に、溶液落下時に
基板に不均一に接触する為の異常成長が起こつた
り、溶液中に含まれる酸化物20等が落下して、
基板に付着し、成長を防げるために得られる半導
体装置の特性は不均一であつた。 In the conventional method, when the solution is dropped onto the substrate, it is dropped directly onto the substrate, which may cause abnormal growth due to non-uniform contact with the substrate when the solution falls, or oxides contained in the solution. 20 mag falls,
Because it adheres to the substrate and prevents growth, the properties of the resulting semiconductor device are non-uniform.
本方法では、基板に接触する原料溶液を下方よ
り一定の厚さに限定しつつ入れることにより、異
常成長もなく、酸化物等の混入を防いだ状態で均
一なエピタキシヤル層を作るものである。 In this method, the raw material solution that comes into contact with the substrate is introduced from below to a constant thickness, thereby creating a uniform epitaxial layer without abnormal growth and preventing the incorporation of oxides, etc. .
第2図は、本発明の方法にかかわる半導体エピ
タキシヤル成長装置を示すものである。第2図a
はエピタキシヤル成長前の状態、第2図bはエピ
タキシヤル成長時の状態を示す。第2図のエピタ
キシヤル装置は、支持体21の結晶基板ホルダー
部28に、上部スライダ22の穴と同じ大きさの
穴を有するふたxを有し、また、ホルダー部を結
晶基板表面部と他の部分に底の部分でつながる様
に基けられたスペーサーyを有している。b図の
ように押棒24を押すことによりスライダー22
を動かし、原料溶液27の1つを、この結晶基板
29と接触させて、結晶成長を行なう。このとき
ホルダー上部のふたxを通つた原料溶液27は、
落下の途中基板に接触することなく、スペーサー
yの下部を通り、スペーサーyと結晶基板29と
の間に入り結晶基板29と接触し、結晶成長を開
始する。また、このとき、素子特性に悪影響をお
よぼす酸化物20等は、溶液溜の中かスペーサー
y上部にたまり、スペーサーyと結晶基板との間
には、存在しない状態で結晶成長を行なうことが
出来る。 FIG. 2 shows a semiconductor epitaxial growth apparatus relating to the method of the present invention. Figure 2a
2b shows the state before epitaxial growth, and FIG. 2b shows the state during epitaxial growth. The epitaxial apparatus shown in FIG. 2 has a lid x having a hole of the same size as the hole of the upper slider 22 in the crystal substrate holder part 28 of the support body 21, and the holder part is connected to the crystal substrate surface part and other parts. It has a spacer y that is connected to the bottom part of the spacer y. By pushing the push rod 24 as shown in Figure b, the slider 22
is moved, one of the raw material solutions 27 is brought into contact with this crystal substrate 29, and crystal growth is performed. At this time, the raw material solution 27 passing through the lid x on the top of the holder is
During the fall, it passes under the spacer y without contacting the substrate, enters between the spacer y and the crystal substrate 29, comes into contact with the crystal substrate 29, and starts crystal growth. Furthermore, at this time, oxides 20 and the like that adversely affect the device characteristics accumulate in the solution reservoir or above the spacer y, and crystal growth can occur in a state where they do not exist between the spacer y and the crystal substrate. .
また第2図cは、成長を終えた後、不要な原料
溶液26を結晶基板の表面より除去し、結晶基板
29上に新らしい組成の層を成長させる準備の場
合の例を示す。このとき、素子特性に悪影響をお
よぼす酸化物20等は、スペーサーyにそつて廃
液溜へ落下する為に基板との接触がなく、異常成
長や組成の異なつた結晶が成長することなく、均
一な結晶を得ることができる。 Further, FIG. 2c shows an example in which, after the growth is completed, unnecessary raw material solution 26 is removed from the surface of the crystal substrate to prepare for growing a layer of a new composition on the crystal substrate 29. At this time, the oxides 20, etc. that adversely affect the device characteristics fall along the spacer y into the waste liquid reservoir, so they do not come into contact with the substrate, and there is no abnormal growth or crystals with different compositions, and a uniform Crystals can be obtained.
同様なことをくりかえすことにより、第2層以
上の結晶層を得ることが可能である。また、スペ
ーサーの数を増やし、増やしたスペーサーの一部
を基板結晶のホルダーとすることで、基板結晶は
多数枚置くことが可能で、同時に多数枚の結晶成
長を行なうことが可能である。 By repeating the same process, it is possible to obtain a second or higher crystal layer. Furthermore, by increasing the number of spacers and using some of the increased spacers as holders for the substrate crystals, it is possible to place a large number of substrate crystals, and it is possible to grow a large number of crystals at the same time.
本発明の方法による液相エピタキシヤル成長の
効果は、次の様である。 The effects of liquid phase epitaxial growth according to the method of the present invention are as follows.
(1) 成長したエピタキシヤル層の組成が均一で、
異状成長がない。(1) The composition of the grown epitaxial layer is uniform,
No abnormal growth.
(2) 成長したエピタキシヤル層の厚さが均一で、
異状成長した突起等がない。(2) The thickness of the grown epitaxial layer is uniform;
There are no abnormally grown protrusions.
第1図は従来の液相エピタキシヤル成長装置を
示す図、第2図はa,b,cは本発明のエピタキ
シヤル成長装置および方法を示す図である。
21…結晶基板ホルダー2,8を有する支持
体、22…原料溶液溜を有するスライダー、29
…結晶基板、23…廃液溜を有するスライダー、
x…原料溶液を通す穴のあいたふた、y…原料溶
液の落下する場所と結晶基板を分離するスペーサ
ー。
FIG. 1 is a diagram showing a conventional liquid phase epitaxial growth apparatus, and FIG. 2 is a diagram showing a, b, and c of the epitaxial growth apparatus and method of the present invention. 21...Support having crystal substrate holders 2, 8, 22...Slider having raw material solution reservoir, 29
...crystal substrate, 23...slider having a waste liquid reservoir,
x... A lid with holes through which the raw material solution passes, y... A spacer that separates the place where the raw material solution falls from the crystal substrate.
Claims (1)
溶液を収容する溶液溜が設けられ、中室には半導
体基板を角度を持つて収容する支持体があつて、
下室には不要な原料溶液を収容する廃液溜が設け
られ、前記上室の溶液溜から溶液を落下させ、中
室に収容された半導体基板表面に接触させて液相
エピタキシヤル成長を行う方法において、前記溶
液溜から落下した溶液を、前記半導体基板の裏面
側の狭い空隙を介して半導体基板表面に到達する
ようにしてエピタキシヤル成長を行うことを特徴
とする半導体結晶のエピタキシヤル層の成長方
法。 2 溶液を狭い空隙を介し、下室側から半導体基
板表面に到達するようにしたことを特徴とする特
許請求の範囲第1項記載の半導体結晶のエピタキ
シヤル層の成長方法。 3 上下方向3室以上に仕切られ、上室には原料
溶液を収容する溶液溜が設けられ、中室には半導
体基板を角度をもつて収容する支持体があつて、
下室には不要な原料溶液を収容する廃液溜が設け
られ、前記上室の溶液溜の底部及び中室の半導体
基板を収容する支持体の上部にはスリツトが設け
られ、そのスリツト位置を合せて上室の溶液溜か
ら溶液を落下させ、中室に収容された半導体基板
表面に接触させて液相エピタキシヤル成長させる
成長装置において、前記半導体基板の裏面側に狭
い空隙を設け、前記溶液を前記スリツトから狭い
空隙を通過させ、下室側から前記半導体基板表面
に接触せしめることを特徴とする半導体結晶のエ
ピタキシヤル成長層の成長装置。[Claims] 1. Partitioned into three or more chambers in the vertical direction, the upper chamber is provided with a solution reservoir for accommodating the raw material solution, and the middle chamber is provided with a support body for accommodating the semiconductor substrate at an angle,
A method in which a waste solution reservoir for storing unnecessary raw material solution is provided in the lower chamber, and the solution is dropped from the solution reservoir in the upper chamber and brought into contact with the surface of a semiconductor substrate accommodated in the middle chamber to perform liquid phase epitaxial growth. Growth of an epitaxial layer of a semiconductor crystal, characterized in that epitaxial growth is performed by allowing the solution falling from the solution reservoir to reach the surface of the semiconductor substrate through a narrow gap on the back side of the semiconductor substrate. Method. 2. The method for growing an epitaxial layer of a semiconductor crystal according to claim 1, wherein the solution is made to reach the surface of the semiconductor substrate from the lower chamber side through a narrow gap. 3 Partitioned into three or more chambers in the vertical direction, the upper chamber is provided with a solution reservoir for containing the raw material solution, the middle chamber has a support body for accommodating the semiconductor substrate at an angle,
A waste liquid reservoir is provided in the lower chamber to accommodate unnecessary raw material solutions, and slits are provided at the bottom of the solution reservoir in the upper chamber and at the top of the support body that accommodates the semiconductor substrate in the middle chamber, and the slit positions are aligned. In a growth apparatus in which liquid phase epitaxial growth is performed by dropping a solution from a solution reservoir in an upper chamber into contact with the surface of a semiconductor substrate housed in a middle chamber, a narrow gap is provided on the back side of the semiconductor substrate, and the solution is An apparatus for growing an epitaxial growth layer of a semiconductor crystal, characterized in that the slit passes through a narrow gap and is brought into contact with the surface of the semiconductor substrate from the lower chamber side.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8009381A JPS57196527A (en) | 1981-05-28 | 1981-05-28 | Method and device for growing epitaxial layer of semiconductor crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8009381A JPS57196527A (en) | 1981-05-28 | 1981-05-28 | Method and device for growing epitaxial layer of semiconductor crystal |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57196527A JPS57196527A (en) | 1982-12-02 |
| JPH0258769B2 true JPH0258769B2 (en) | 1990-12-10 |
Family
ID=13708575
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8009381A Granted JPS57196527A (en) | 1981-05-28 | 1981-05-28 | Method and device for growing epitaxial layer of semiconductor crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57196527A (en) |
-
1981
- 1981-05-28 JP JP8009381A patent/JPS57196527A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57196527A (en) | 1982-12-02 |
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