JPH0259412U - - Google Patents

Info

Publication number
JPH0259412U
JPH0259412U JP13821088U JP13821088U JPH0259412U JP H0259412 U JPH0259412 U JP H0259412U JP 13821088 U JP13821088 U JP 13821088U JP 13821088 U JP13821088 U JP 13821088U JP H0259412 U JPH0259412 U JP H0259412U
Authority
JP
Japan
Prior art keywords
laser plane
adjustment mechanism
utility
scope
registration request
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13821088U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13821088U priority Critical patent/JPH0259412U/ja
Publication of JPH0259412U publication Critical patent/JPH0259412U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案に係るレーザ平面干渉計の一実
施例を示す斜視図、第2図はX軸調整部の機構を
示す正面図、第3図は干渉計本体の内部構造の一
実施例を示す説明図、第4図乃至第6図は従来に
おけるレーザ平面干渉計の別異の例を示す図であ
る。 6……二軸調整機構、8……X軸調整部、10
……Y軸調整部。
Fig. 1 is a perspective view showing an embodiment of the laser plane interferometer according to the present invention, Fig. 2 is a front view showing the mechanism of the X-axis adjustment section, and Fig. 3 is an embodiment of the internal structure of the interferometer body. 4 to 6 are diagrams showing different examples of conventional laser plane interferometers. 6...Two-axis adjustment mechanism, 8...X-axis adjustment section, 10
...Y-axis adjustment section.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 試料面に対して異なる二軸方向での角度調整機
構を備えてなるレーザ平面干渉計。
A laser plane interferometer equipped with an angle adjustment mechanism in two different axial directions relative to the sample surface.
JP13821088U 1988-10-25 1988-10-25 Pending JPH0259412U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13821088U JPH0259412U (en) 1988-10-25 1988-10-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13821088U JPH0259412U (en) 1988-10-25 1988-10-25

Publications (1)

Publication Number Publication Date
JPH0259412U true JPH0259412U (en) 1990-05-01

Family

ID=31400337

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13821088U Pending JPH0259412U (en) 1988-10-25 1988-10-25

Country Status (1)

Country Link
JP (1) JPH0259412U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59225305A (en) * 1983-06-06 1984-12-18 Ricoh Co Ltd Alignment device in interference measuring machine

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59225305A (en) * 1983-06-06 1984-12-18 Ricoh Co Ltd Alignment device in interference measuring machine

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