JPH026272U - - Google Patents

Info

Publication number
JPH026272U
JPH026272U JP1988083015U JP8301588U JPH026272U JP H026272 U JPH026272 U JP H026272U JP 1988083015 U JP1988083015 U JP 1988083015U JP 8301588 U JP8301588 U JP 8301588U JP H026272 U JPH026272 U JP H026272U
Authority
JP
Japan
Prior art keywords
contacts
pitch
probe
adjacent
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1988083015U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988083015U priority Critical patent/JPH026272U/ja
Publication of JPH026272U publication Critical patent/JPH026272U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本考案のプローブの一部破断側面図
、第2図〜第4図はプローブの接触子とリードと
の接触状態の推移を示す側面図、第5図は、短絡
チエツク回路の概略図である。 1……ケース、2,3……接触子、4……スプ
リング、5……開口、6,6a,6b等……リー
ド、7……検出器、8……ラツチ回路、9……増
幅器、10……ブザー。
Fig. 1 is a partially cutaway side view of the probe of the present invention, Figs. 2 to 4 are side views showing changes in the contact state between the probe contact and the lead, and Fig. 5 is a short circuit check circuit. It is a schematic diagram. 1... Case, 2, 3... Contact, 4... Spring, 5... Opening, 6, 6a, 6b, etc.... Lead, 7... Detector, 8... Latch circuit, 9... Amplifier, 10...buzzer.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] プリント基板上に半田付けされた電子部品の多
数の隣接するリード6a,6b,6c,6d間の
短絡の有無をチエツクするためのプローブであつ
て、一端が短絡テスト回路7〜11に接続された
少なくとも2本の並列された接触子2,3を有し
、該接触子2,3は軸方向に弾発的に付勢され、
その先端がケース1の先端開口5から突出してお
り、又、隣接する接触子2,3間のピツチdは、
チエツク対象のリード列6a,6b,6c,6d
のピツチpに対してp≦d≦1.5pの関係を有
することを特徴とするプローブ。
A probe for checking the presence or absence of short circuits between a large number of adjacent leads 6a, 6b, 6c, and 6d of electronic components soldered on a printed circuit board, one end of which is connected to short circuit test circuits 7 to 11. It has at least two parallel contacts 2, 3, the contacts 2, 3 are elastically biased in the axial direction,
Its tip protrudes from the tip opening 5 of the case 1, and the pitch d between the adjacent contacts 2 and 3 is
Lead rows 6a, 6b, 6c, 6d to be checked
A probe characterized in that it has a relationship of p≦d≦1.5p with respect to the pitch p.
JP1988083015U 1988-06-24 1988-06-24 Pending JPH026272U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988083015U JPH026272U (en) 1988-06-24 1988-06-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988083015U JPH026272U (en) 1988-06-24 1988-06-24

Publications (1)

Publication Number Publication Date
JPH026272U true JPH026272U (en) 1990-01-16

Family

ID=31307748

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988083015U Pending JPH026272U (en) 1988-06-24 1988-06-24

Country Status (1)

Country Link
JP (1) JPH026272U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6335970B2 (en) * 1981-03-23 1988-07-18 Konika Kk

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6335970B2 (en) * 1981-03-23 1988-07-18 Konika Kk

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