JPH0264435A - Measuring apparatus for particle size - Google Patents
Measuring apparatus for particle sizeInfo
- Publication number
- JPH0264435A JPH0264435A JP63215092A JP21509288A JPH0264435A JP H0264435 A JPH0264435 A JP H0264435A JP 63215092 A JP63215092 A JP 63215092A JP 21509288 A JP21509288 A JP 21509288A JP H0264435 A JPH0264435 A JP H0264435A
- Authority
- JP
- Japan
- Prior art keywords
- light
- particle size
- light receiving
- transmission cable
- sensing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002245 particle Substances 0.000 title claims abstract description 59
- 230000005540 biological transmission Effects 0.000 claims abstract description 29
- 238000006243 chemical reaction Methods 0.000 claims abstract description 12
- 230000003287 optical effect Effects 0.000 claims description 38
- 238000009826 distribution Methods 0.000 claims description 11
- 239000000126 substance Substances 0.000 claims description 7
- 239000000843 powder Substances 0.000 description 7
- 239000000463 material Substances 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 239000013078 crystal Substances 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 238000005259 measurement Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000000149 argon plasma sintering Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000002050 diffraction method Methods 0.000 description 3
- 239000010419 fine particle Substances 0.000 description 3
- CPBQJMYROZQQJC-UHFFFAOYSA-N helium neon Chemical compound [He].[Ne] CPBQJMYROZQQJC-UHFFFAOYSA-N 0.000 description 3
- 238000005253 cladding Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
- G01N15/02—Investigating particle size or size distribution
- G01N15/0205—Investigating particle size or size distribution by optical means
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
11上例杜肛分死
この発明は、粒度計、特に粉体等微粒子の粒度を測定す
る粒度測定装置に関連する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a particle size meter, and particularly to a particle size measuring device for measuring the particle size of fine particles such as powder.
災米立茨五
例えば、特開昭49−27285号公報に示されるよう
に、ガス状の流体中に粉末材料を懸濁させて、粉末材料
にレーザビームを照射することにより粉末材料の粒度を
測定する技術は公知である。For example, as shown in Japanese Unexamined Patent Publication No. 49-27285, the particle size of the powder material is reduced by suspending the powder material in a gaseous fluid and irradiating the powder material with a laser beam. Techniques for measuring are known.
発光装置から発射された単色平行光線の収斂レーザビー
ムを粉末材料に対して照射すると、粉末材料によってフ
ランホーファの回折像が光学系の焦点面に形成される。When a powder material is irradiated with a convergent monochromatic parallel laser beam emitted from a light emitting device, a Franhofer diffraction image is formed by the powder material on the focal plane of the optical system.
この回折像の光強度は光学系の焦点面に配置された光電
池により検出される。The light intensity of this diffraction image is detected by a photocell placed at the focal plane of the optical system.
このとき、回折を受けない光は焦点に集光し1円錐状に
回折された光は光軸の周りに結像する。そして、同一回
折角を有する光は常に焦点面上の同一半径上に集光する
。At this time, the light that does not undergo diffraction is condensed at a focal point, and the light that has been diffracted into one cone forms an image around the optical axis. Light having the same diffraction angle is always focused on the same radius on the focal plane.
ガス状の流体中に懸濁された粉末材料は種々の直径を有
する粒子の集合であり、それらの粒子から得られる回折
像はさまざまな半径上の位置に結像する。即ち、焦点面
上には粒子径の分布に対応した回折光強度分布が観察さ
れる。従って、光学系の焦点面上に結像した回折像の光
強度を光電池で検出して粒子径を測定することができる
。A powder material suspended in a gaseous fluid is a collection of particles having different diameters, and the diffraction images obtained from those particles are focused at different radial positions. That is, a diffracted light intensity distribution corresponding to the particle size distribution is observed on the focal plane. Therefore, the particle diameter can be measured by detecting the light intensity of the diffraction image formed on the focal plane of the optical system using a photocell.
フランホーファの回折像を利用する粒度測定装置につい
て説明すると、aを粒子の半径、c=1/λ E /
x a7、Eを粒子上への入射エネルギ、λを平行光線
波長、pを焦点面上の位置、k=2π/λ、ω=s/f
、sを焦点面上の半径、ρをディスクの中心からの距離
とすると、振幅U(p)は。To explain a particle size measuring device that uses Franhofer's diffraction image, a is the radius of the particle, and c=1/λ E /
x a7, E is the incident energy on the particle, λ is the wavelength of parallel light, p is the position on the focal plane, k = 2π/λ, ω = s/f
, s is the radius on the focal plane, and ρ is the distance from the center of the disk, then the amplitude U(p) is.
U(p)=2πc/a’Jo(kρω)ρdρ (
1)で与えられる6式(1)を積分すると。U(p)=2πc/a'Jo(kρω)ρdρ (
If we integrate Equation 6 (1) given by 1).
U(p)= xa”c(2Jo(ka ω)/ka ω
) (2)従って、光度分布I (p)は。U(p)=xa”c(2Jo(ka ω)/ka ω
) (2) Therefore, the luminous intensity distribution I (p) is.
I (p) = (U (p))’
=(za”c)”(2Ja(ka ω)/ka ω)”
(3)となる、焦点上の強度を10とすると、式
(1)でω=0とおけばよいから、
■。=(πa2c)” (4)
で与えられる。従って比強度をYとすれば、Y = I
(p)/ I。=4(J、(kρω)八ρω)”
(5)となる1式(3)右辺の(J、(ka ω)/k
a ω)”の極大値は、
d(Jt(kaω)/kaω)/d(kaω)=O(6
)を満足するkaωで与えられる。ベッセル関数の斬化
式より式(6)が成立するにはJz(kaω)=0であ
ればよく、また最小値はJl(kaω)=0が成立すれ
ばよい。I (p) = (U (p))' = (za"c)" (2Ja(ka ω)/ka ω)"
(3) If the intensity on the focal point is 10, it is sufficient to set ω=0 in equation (1), so (2). =(πa2c)” (4)
is given by Therefore, if the specific intensity is Y, then Y = I
(p)/I. =4(J, (kρω)8ρω)”
(5), the right side of equation (3) (J, (ka ω)/k
The maximum value of ``a ω)'' is d(Jt(kaω)/kaω)/d(kaω)=O(6
) is given by kaω that satisfies According to the Bessel function reduction equation, for equation (6) to hold, Jz(kaω)=0 is sufficient, and the minimum value only needs to be Jl(kaω)=0.
焦点面上の半径Sは無次元半径Xa=kaωとすると、
5=Xaλf/2xa (7)とな
る、このように、回折像の直径は粒子径の直径に反比例
することになる。更に、式(5)から明らかなように、
比強度は粒子の位置には無関係に決定され、粒子が光束
中のどの位置にあっても回折像の位置は変わらない。l
だ、粒子径が大きい場合には回折リングの直径は小さく
、粒子径が小さい場合には回折リングの直径が大きくな
る。しかし、粒子径と回折リングの直径との関係は使用
する光又はレンズの種類等により変化する。従って、装
置の内容を決定すると、粒子径と回折リングの直径との
関係は一義的に決定される。複数の粒子が存在する場合
にも、それぞれの粒子が形成する回折リングはレンズの
使用により同心円となる。If the radius S on the focal plane is a dimensionless radius Xa=kaω, then 5=Xaλf/2xa (7) Thus, the diameter of the diffraction image is inversely proportional to the diameter of the particle size. Furthermore, as is clear from equation (5),
The specific intensity is determined independently of the position of the particle, and the position of the diffraction image does not change no matter where the particle is in the light beam. l
However, if the particle size is large, the diameter of the diffraction ring will be small, and if the particle size is small, the diameter of the diffraction ring will be large. However, the relationship between the particle size and the diameter of the diffraction ring changes depending on the type of light or lens used. Therefore, once the contents of the apparatus are determined, the relationship between the particle size and the diameter of the diffraction ring is uniquely determined. Even when a plurality of particles are present, the diffraction rings formed by each particle become concentric circles due to the use of a lens.
他面、米国特許第4,274,741号公報には複数の
扇形の光電池を使用する粒度測定装置が開示されている
。この粒度測定装置を第3図及び第4図について説明す
る。図示しない発光装置からヘリウム−ネオンレーザの
単色光線1が試料を内蔵した透明の容器2に対し照射さ
れる。容器2を通過した光はレンズ3を通じて焦点面4
上の焦点5上に結像される。受光装W6の焦点面7には
第4図に示すように1種々の大きさを有する複数の扇形
の光電池8が設けられている。光電池8の出力は導線9
及び増幅器10.11を通じて演算回路12に供給され
、焦点面7において焦点5からの半径に対応する光強度
が測定される。このように1回折リングの大きさにより
試料の粒度を決定することができる。On the other hand, US Pat. No. 4,274,741 discloses a particle size measuring device that uses a plurality of sector-shaped photovoltaic cells. This particle size measuring device will be explained with reference to FIGS. 3 and 4. A monochromatic beam 1 of a helium-neon laser is irradiated from a light emitting device (not shown) to a transparent container 2 containing a sample. The light passing through the container 2 passes through the lens 3 to the focal plane 4.
The image is formed on the upper focal point 5. As shown in FIG. 4, a plurality of sector-shaped photovoltaic cells 8 having various sizes are provided on the focal plane 7 of the light receiving device W6. The output of the photocell 8 is connected to the conductor 9
The light is supplied to the arithmetic circuit 12 through the amplifiers 10 and 11, and the light intensity corresponding to the radius from the focal point 5 is measured at the focal plane 7. In this way, the particle size of the sample can be determined by the size of the single diffraction ring.
また、特公昭57−21042号公報又は56−667
37号公報に示されるように、光散乱による粒子径測定
装置が公知である。この粒子径測定装置では、偏向され
ていないレーザ光等の単一波長光を粒子に照射したとき
、散乱光強度の散乱角分布を垂直成分と水平成分とにつ
いて測定すると粒子径の変化に対して特定の光強度分布
が得られる。この理論はミー(Mis)により提起され
「ミー散乱」と指称されている。ミーは垂直及び水平偏
向強度分布に基づいて得られる1個の粒子からの散乱光
強度が散乱角度1粒子径パラメータα及び被測定物質の
複素屈折率の関数で示されることを解析している。粒子
径パラメータαは、Dρを粒子径、λを光源の波長とす
ると。Also, Japanese Patent Publication No. 57-21042 or 56-667
As shown in Japanese Patent No. 37, a particle size measuring device using light scattering is known. With this particle size measuring device, when a particle is irradiated with single wavelength light such as an unpolarized laser beam, the scattering angle distribution of the scattered light intensity is measured for the vertical and horizontal components. A specific light intensity distribution is obtained. This theory was proposed by Mis and is referred to as "Mie scattering." Mie analyzes that the intensity of scattered light from a single particle obtained based on the vertical and horizontal polarization intensity distribution is expressed as a function of the scattering angle, the particle diameter parameter α, and the complex refractive index of the substance to be measured. For the particle diameter parameter α, let Dρ be the particle diameter and λ be the wavelength of the light source.
α=πDp/λ
で定義される。ここで、 (1) α〈0.3ではレ
イライ散乱領域、 (2) 0 、3 <αく2では
ミー散乱領域、 (3) 2<αでは振動領域として
表わされる。このように散乱光強度を測定して粒子の体
積又は粒径を求めることができる。It is defined as α=πDp/λ. Here, (1) when α<0.3, it is expressed as a Rayleigh scattering region; (2) when 0,3<α2, it is a Mie scattering region; (3) when 2<α, it is expressed as a vibration region. By measuring the scattered light intensity in this way, the volume or particle size of the particles can be determined.
が しようとする課題
ところで、上記の米国特許に開示される粒度測定装置で
は、所定の扇形状に形成された複数のシリコン単結晶を
光電池として使用しなければならない。このため、シリ
コン単結晶を所定の扉形に成形して光電池を製造したり
、光電池に導線を接続する工程を熟練者により慎重に行
わなければならず、光電池の製造に長時間を要していた
。従って、受光装置の価格が高騰した。However, in the particle size measuring device disclosed in the above-mentioned US patent, a plurality of silicon single crystals formed in a predetermined fan shape must be used as photovoltaic cells. For this reason, the process of manufacturing photovoltaic cells by molding silicon single crystal into a predetermined door shape and connecting conductor wires to the photovoltaic cells must be carefully performed by skilled workers, making it time consuming to manufacture photovoltaic cells. Ta. Therefore, the price of light receiving devices has increased.
また、従来の粒度測定装置では焦点面に配置された光電
池の形状が予め決められており、変更することができな
い。このため、回折光又は散乱光の分解能を変更するに
は種々の形状を有する光電池を具備する多数の受光装置
を準備して必要に応じて受光装置を交換しなければなら
ないから、膨大な設備費用及び工数を必要とする。Furthermore, in conventional particle size measuring devices, the shape of the photovoltaic cell placed in the focal plane is predetermined and cannot be changed. For this reason, in order to change the resolution of diffracted light or scattered light, it is necessary to prepare a large number of light receiving devices equipped with photocells of various shapes and replace the light receiving devices as necessary, resulting in huge equipment costs. and man-hours.
そこで、この発明は上記の欠点を解消して安価に製造で
きかつ回折光又は散乱光の分解能を自由に選択すること
のできる粒度測定装置を提供することを目的とする。SUMMARY OF THE INVENTION Therefore, an object of the present invention is to provide a particle size measuring device which can solve the above-mentioned drawbacks, can be manufactured at low cost, and can freely select the resolution of diffracted light or scattered light.
を するための手
この発明による粒度測定装置は、粒度を測定すべき物質
を収容する透明な容器と、容器に対し光線を照射する発
光装置と、発光装置から照射された光線が容器内の物質
により回折又は散乱されて形成された受光面上の回折像
の光強度分布又は散乱光強度分布を測定する受光装置と
を有する。受光装置は受光面上に配置された受光端部を
有する可撓性の光伝達ケーブルと、光伝達ケーブルの発
光端部に隣接して配置された光電変換装置とを有する。The particle size measuring device according to the present invention includes a transparent container containing a substance whose particle size is to be measured, a light emitting device that irradiates a light beam onto the container, and a light beam irradiated from the light emitting device that detects the substance in the container. and a light-receiving device that measures the light intensity distribution or scattered light intensity distribution of a diffraction image on the light-receiving surface formed by diffraction or scattering. The light receiving device includes a flexible optical transmission cable having a light receiving end disposed on the light receiving surface, and a photoelectric conversion device disposed adjacent to the light emitting end of the optical transmission cable.
詐二J1
可撓性の光伝達ケーブルを使用することにより、高価な
シリコン単結晶の光電池を使用せず受光装置を安価に製
造することができる。また、光伝達ケーブルの受光端部
と発光端部を所望の形状に形成できるうえ、発光端部に
光学的に接続された受光装置の発・光端部を光伝達ケー
ブルを通じて所望の場所に設置することが可能となる。Shoji J1 By using a flexible optical transmission cable, a light receiving device can be manufactured at low cost without using expensive silicon single crystal photovoltaic cells. In addition, the light-receiving end and the light-emitting end of the optical transmission cable can be formed into a desired shape, and the light-emitting and light-emitting ends of the light receiving device, which is optically connected to the light-emitting end, can be installed at a desired location through the optical transmission cable. It becomes possible to do so.
受光面に配置された光伝達ケーブルの受光端部を適宜選
択することにより回折光又は散乱光の分解能を任意に選
択することができる。更に、光伝達ケーブルは温度、衝
撃及び振動の影響を受けにくく、電磁ノイズの影響を受
けないので、光伝達ケーブルの発光端部を発光装置等の
発熱部から十分に離れた位置に設置して正確な測定を行
うことができる。By appropriately selecting the light receiving end of the optical transmission cable disposed on the light receiving surface, the resolution of the diffracted light or scattered light can be arbitrarily selected. Furthermore, since optical transmission cables are not easily affected by temperature, shock, and vibration, and are not affected by electromagnetic noise, the light-emitting end of the optical transmission cable should be placed sufficiently away from heat-generating parts such as light-emitting devices. Accurate measurements can be taken.
更に、粒度の測定条件を変えて異なる直径の回折リング
又は散乱光を形成する場合に、受光面上の光強度を測定
しかつ測定値をコンピュータ処理することにより、回折
光又は散乱光の全体的に又は部分的に種々の分解能で粒
度を測定することができる。Furthermore, when changing the particle size measurement conditions to form diffraction rings or scattered lights of different diameters, the overall size of the diffracted or scattered lights can be determined by measuring the light intensity on the light receiving surface and processing the measured values by computer. Particle size can be measured partially or partially with various resolutions.
去−」L−釘
以下、光回折法を利用して粒度を測定する粒度測定装置
について実施したこの発明の実施例を第1図及び第2図
について説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, an embodiment of the present invention will be described with reference to FIGS. 1 and 2, which was implemented with respect to a particle size measuring device that measures particle size using an optical diffraction method.
まず、第1図に示すように、この発明による粒度測定装
置20は、粒度を測定すべき物質を収容する透明な容器
(セル)21と、容器21に対し光線を照射する発光装
置22と、発光装置22から照射された光線が容器21
内の物質により回折されて形成された焦点面である受光
面23上の回折像の光強度分布を測定する受光装置24
とを有する。発光装置22はヘリウム−ネオンレーザで
あり、拡散レンズ22aが設けられている。実際にはへ
リウムーネオンレーザの代わりに半導体レーザを使用す
ることも可能である。また、拡散レンズ22aと後述の
凸レンズ26の代わりにビームエックスパンダを使用す
ることもできる。First, as shown in FIG. 1, a particle size measuring device 20 according to the present invention includes a transparent container (cell) 21 that accommodates a substance whose particle size is to be measured, a light emitting device 22 that irradiates the container 21 with light, and The light beam irradiated from the light emitting device 22
A light receiving device 24 that measures the light intensity distribution of a diffraction image on a light receiving surface 23, which is a focal plane formed by diffraction by a substance inside the light receiving device 24.
and has. The light emitting device 22 is a helium-neon laser and is provided with a diffusion lens 22a. In fact, it is also possible to use a semiconductor laser instead of a helium-neon laser. Furthermore, a beam expander can be used instead of the diffusing lens 22a and the convex lens 26, which will be described later.
発光装置22から拡散状態で発射された単色光は容器2
1の前後に配置された光学系25に導入される。光学系
25は発光装置22から拡散された光を平行光線に変換
する凸レンズ26と、容器21を通過した光を集光′す
る集光レンズ27とを有する。集光レンズ27は実際に
は2つのレンズ27aと、27bを有する。集光レンズ
27の受光面23には受光装置24の受光端部28(第
2図)が配置される。容器21内には水又はアルコール
等の光透過性溶液内に微粒子が混入された懸濁液が収容
されている。受光装置24の出力はコンピュータからな
る演算回路30に供給され、演算回路30の出力はデイ
スプレー装置31とプリンタ32に供給される。また、
演算回路30はキーボード33の入力により制御される
0発光装置22の発光状態は演算回路30を通じてキー
ボード33により制御される。The monochromatic light emitted from the light emitting device 22 in a diffused state is emitted from the container 2.
1 is introduced into an optical system 25 arranged before and after the optical system 1. The optical system 25 includes a convex lens 26 that converts the light diffused from the light emitting device 22 into parallel light beams, and a condensing lens 27 that condenses the light that has passed through the container 21. The condenser lens 27 actually has two lenses 27a and 27b. A light-receiving end 28 (FIG. 2) of the light-receiving device 24 is arranged on the light-receiving surface 23 of the condenser lens 27 . The container 21 contains a suspension in which fine particles are mixed in a light-transmitting solution such as water or alcohol. The output of the light receiving device 24 is supplied to an arithmetic circuit 30 consisting of a computer, and the output of the arithmetic circuit 30 is supplied to a display device 31 and a printer 32. Also,
The light emitting state of the light emitting device 22 is controlled by the keyboard 33 through the calculation circuit 30.
第2図に示すように、受光装置24は受光面23上に配
置された受光端部28を有する可撓性の光伝達ケーブル
34と、光伝達ケーブル34の発光端部35に隣接して
配置された光電変換装W36とを有する。光電変換装置
i36は受光トランジスタ、受光ダイオード等の光電池
が使用される。As shown in FIG. 2, the light receiving device 24 is arranged adjacent to a flexible optical transmission cable 34 having a light receiving end 28 disposed on the light receiving surface 23 and a light emitting end 35 of the optical transmission cable 34. and a photoelectric conversion device W36. The photoelectric conversion device i36 uses a photovoltaic cell such as a light receiving transistor or a light receiving diode.
詳細には図示しないが、各光伝達ケーブル34は入射し
た光を伝達するコアと、コアの周囲に形成されたクラッ
ドと、クラッドの外面を被覆する外装とを有する。第2
図に示すように5例えば光伝達ケーブル34はケース3
7内に3列に配置され、各列の光伝達ケーブル34の数
は回折リングの大きさに適合する長さを与える。Although not shown in detail, each optical transmission cable 34 has a core that transmits incident light, a cladding formed around the core, and an exterior covering the outer surface of the cladding. Second
For example, the optical transmission cable 34 is connected to the case 3 as shown in the figure.
7 in three rows, the number of optical transmission cables 34 in each row giving the length to match the size of the diffraction ring.
上記の構成において1発光装置22から拡散されかつ発
射されたレーザ光は凸レンズ26により平行光線に変換
された後、透明な容器21に照射される。容器21内を
通過した光は集光レンズ27により受光面23上の焦点
29に集光される。In the above configuration, the laser light diffused and emitted from one light emitting device 22 is converted into a parallel light beam by the convex lens 26, and then irradiated onto the transparent container 21. The light passing through the container 21 is focused by a condensing lens 27 onto a focal point 29 on the light receiving surface 23 .
容器21内の微粒子により回折された回折光は焦点29
上に集光されずに受光面23上に光の回折リングを形成
する。この状態で1回折光は受光面23上に配置された
受光装置24の受光端部28に入射し光伝達ケーブル3
4を通り光電変換装置36に伝達され、光電変換装置3
6により光強度が電気信号に変換される。光電変換装置
36の出力は演算回路30により数値変換され、デイス
プレー装置31により表示される。図示の例では、光伝
達ケーブル34は3列に配置されるが、各光伝達ケーブ
ル34の受光端部28上の受光断面積は一定であるから
、焦点29を含む半径上に受光端部28を配置しておく
と、回折リングを形成する各半径上の光強度及び回折リ
ングの大きさを計測することができる。The diffracted light diffracted by the fine particles in the container 21 is focused at a focal point 29.
A diffraction ring of light is formed on the light receiving surface 23 without being focused upward. In this state, the first diffracted light enters the light receiving end 28 of the light receiving device 24 disposed on the light receiving surface 23 and enters the optical transmission cable 3.
4 to the photoelectric conversion device 36, and the photoelectric conversion device 3
6 converts the light intensity into an electrical signal. The output of the photoelectric conversion device 36 is converted into a numerical value by the arithmetic circuit 30 and displayed by the display device 31. In the illustrated example, the optical transmission cables 34 are arranged in three rows, but since the light receiving cross-sectional area on the light receiving end 28 of each optical transmission cable 34 is constant, the light receiving end 28 is arranged on the radius including the focal point 29. , it is possible to measure the light intensity on each radius forming the diffraction ring and the size of the diffraction ring.
この場合、可撓性の光伝達ケーブル34を使用すること
により、高価なシリコン単結晶の光電池を使用すること
なく受光装置24を製造することができる。また、光伝
達ケーブル34の受光端部28と発光端部35を所望の
形状に形成できるので、受光装置24を所望の場所に設
置することが可能となる。更に、受光面23に配置され
た光伝達ケーブル34の受光端部28を適宜選択するこ
とにより回折光の分解能を任意に選択することができる
。即ち、回折光の分解能を向上するとき。In this case, by using the flexible optical transmission cable 34, the light receiving device 24 can be manufactured without using an expensive silicon single crystal photovoltaic cell. Further, since the light receiving end 28 and the light emitting end 35 of the optical transmission cable 34 can be formed into a desired shape, the light receiving device 24 can be installed at a desired location. Further, by appropriately selecting the light receiving end portion 28 of the optical transmission cable 34 disposed on the light receiving surface 23, the resolution of the diffracted light can be arbitrarily selected. That is, when improving the resolution of diffracted light.
多数の光伝達ケーブル34の受光端部28から受光した
光の光量を部分的に又は全体的に測定することができる
。逆に、低い分解能で粒度を測定する場合には不必要な
受光端部28での受光を測定しなければよい。このよう
に多数の受光端部28から必要な受光端部28のみを選
択する操作は。The amount of light received from the light receiving ends 28 of the multiple optical transmission cables 34 can be measured partially or entirely. Conversely, when measuring particle size with low resolution, unnecessary light reception at the light receiving end 28 need not be measured. The operation of selecting only the necessary light-receiving end 28 from a large number of light-receiving ends 28 is as follows.
キーボード33を通じて演算回路30を作動させること
により極めて容易に行うことができる。This can be done very easily by operating the arithmetic circuit 30 through the keyboard 33.
更に、光伝達ケーブル34は温度、衝撃及び振動の影響
を受けにくく、電磁ノイズの影響を受けないので、光伝
達ケーブル34の発光端部35を発光装置22等の発熱
部から十分に離れた位置に設置して正確な測定を行うこ
とができる。また、粒度の測定条件を変えて異なる直径
の回折リングを形成する場合に、光伝達ケーブル34を
通じて回折リングの各半径上の光強度を測定しかつ測定
値をコンピュータ処理することにより、変化した条件の
下に種々の分解能で粒度を測定することができる。Furthermore, since the optical transmission cable 34 is not easily affected by temperature, shock and vibration, and is not affected by electromagnetic noise, the light emitting end 35 of the optical transmission cable 34 should be positioned sufficiently away from the heat generating part of the light emitting device 22 etc. It can be installed in any location to perform accurate measurements. In addition, when changing the particle size measurement conditions to form diffraction rings of different diameters, the light intensity on each radius of the diffraction ring can be measured through the optical transmission cable 34 and the measured values can be processed by a computer, so that the changed conditions can be changed. Particle size can be measured at various resolutions below.
この発明の上記実施例は変更が可能である。例えば、上
記の実施例では光回折法を利用して粒度を測定する粒度
測定装置について説明したが、光散乱法による粒度の測
定にもこの発明を実施できることは明らかである。この
場合に光源から照射される光線の光軸に対し直角方向に
散乱する光の散乱光強度を測定しなければならないが、
受光装置24の各受光端部28が散乱光に対し直角面を
なすように受光装置24を配置して、ケース37を直線
状以外に環状又は円弧状に形成することもできる。The above embodiments of the invention can be modified. For example, in the above embodiment, a particle size measuring device that measures particle size using optical diffraction method was described, but it is clear that the present invention can also be implemented in measuring particle size using light scattering method. In this case, it is necessary to measure the scattered light intensity of the light scattered in a direction perpendicular to the optical axis of the light beam emitted from the light source.
The light receiving device 24 may be arranged so that each light receiving end 28 of the light receiving device 24 forms a plane perpendicular to the scattered light, and the case 37 may be formed in a ring shape or an arc shape instead of a straight shape.
1JR戸碩釆
上述のように、所定の扇形状に形成された複数のシリコ
ン単結晶を光電池として使用する必要がなく、光電池を
短時間にかつ低価格で製造することができる。また、光
伝達ケーブル及び光電変換装置を介して受光面の所望の
位置の光量を測定することができるので、回折光又は散
乱光の全体的な又は部分的な分解能を適宜変更すること
が可能となる。この場合に、コンピュータの演算回路を
通じて種々の大きさの回折リング又は散乱光に受光装置
を適用することができる。また、受光面の配置を変更す
ることにより光回折法で使用したこの発明の粒度測定装
置をそのまま光散乱法の粒度ホク定装置として使用する
ことができる。更に、光伝達ケーブルの発光端部を所望
の位置に設置できるので、取付スペースの有効活用を図
ることができる。As described above, it is not necessary to use a plurality of silicon single crystals formed in a predetermined fan shape as a photovoltaic cell, and the photovoltaic cell can be manufactured in a short time and at a low cost. In addition, since the amount of light at a desired position on the light receiving surface can be measured via the optical transmission cable and photoelectric conversion device, it is possible to change the overall or partial resolution of the diffracted light or scattered light as appropriate. Become. In this case, the light receiving device can be applied to diffraction rings or scattered light of various sizes through a computer arithmetic circuit. Further, by changing the arrangement of the light-receiving surface, the particle size measuring device of the present invention used in the optical diffraction method can be used as it is as a particle size determination device in the light scattering method. Furthermore, since the light emitting end of the optical transmission cable can be installed at a desired position, the installation space can be used effectively.
第1図はこの発明による粒度測定装置の概略を示すブロ
ック図、第2図は受光装置の概略を示す斜視図、第3図
は従来の粒度測定装置のブロック図、第4図は従来の粒
度測定装置の受光装置を示すブロック図である。
2000粒度測定装置、 215.容器、 2260発
光装置、 239.受光面、 24.。
受光装置、 280.受光端部、
達ケーブル、3501発光端部、
変換装置。
340.先広
368.光電
特許出願人 株式会社 ワイ・デー・ケー代 理 人
清水敬−(番より1名)r′、、’、、、、、、)/
第1図
第3図
第4図
第2図Fig. 1 is a block diagram schematically showing a particle size measuring device according to the present invention, Fig. 2 is a perspective view schematically showing a light receiving device, Fig. 3 is a block diagram of a conventional particle size measuring device, and Fig. 4 is a conventional particle size measuring device. FIG. 2 is a block diagram showing a light receiving device of the measuring device. 2000 particle size measuring device, 215. container, 2260 light emitting device, 239. Light receiving surface, 24. . Light receiving device, 280. Light receiving end, cable, 3501 light emitting end, conversion device. 340. Sakihiro 368. Photoelectric patent applicant Y.D.K. Co., Ltd. Agent
Kei Shimizu - (1 person from the number) r',,',,,,,,)/ Figure 1 Figure 3 Figure 4 Figure 2
Claims (1)
対し光線を照射する発光装置と、発光装置から照射され
た光線が容器内の物質により回折又は散乱されて形成さ
れた受光面上の回折像の光強度分布又は散乱光強度分布
を測定する受光装置とを有する粒度測定装置において、
受光装置は受光面上に配置された受光端部を有する可撓
性の光伝達ケーブルと、光伝達ケーブルの発光端部に隣
接して配置された光電変換装置とを有することを特徴と
する粒度測定装置。A transparent container that contains a substance whose particle size is to be measured, a light emitting device that irradiates the container with light, and a light receiving surface formed by diffracting or scattering the light rays emitted from the light emitting device by the substance in the container. In a particle size measuring device having a light receiving device for measuring a light intensity distribution of a diffraction image or a scattered light intensity distribution,
The light receiving device has a flexible optical transmission cable having a light receiving end disposed on the light receiving surface, and a photoelectric conversion device disposed adjacent to the light emitting end of the optical transmission cable. measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63215092A JPH0264435A (en) | 1988-08-31 | 1988-08-31 | Measuring apparatus for particle size |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63215092A JPH0264435A (en) | 1988-08-31 | 1988-08-31 | Measuring apparatus for particle size |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0264435A true JPH0264435A (en) | 1990-03-05 |
Family
ID=16666621
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63215092A Pending JPH0264435A (en) | 1988-08-31 | 1988-08-31 | Measuring apparatus for particle size |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0264435A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000031680A1 (en) * | 1998-11-26 | 2000-06-02 | Vlg Virtual Laser Systems Gmbh | Active unit for reproducing large-scale images |
| US6807874B2 (en) * | 2002-01-21 | 2004-10-26 | Shimadzu Corporation | Collecting apparatus of floating dusts in atmosphere |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58206948A (en) * | 1982-05-28 | 1983-12-02 | Toshiba Corp | Measuring device of intensity of front minute angle scattered light |
| JPS5970944A (en) * | 1982-10-15 | 1984-04-21 | Toshiba Corp | Apparatus for measuring particle diameter |
| JPS6114543A (en) * | 1984-06-30 | 1986-01-22 | Toshiba Corp | Particle size maesuring instrument |
| JPS61110033A (en) * | 1984-11-02 | 1986-05-28 | Toray Ind Inc | Measuring apparatus for agglutination reaction |
-
1988
- 1988-08-31 JP JP63215092A patent/JPH0264435A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58206948A (en) * | 1982-05-28 | 1983-12-02 | Toshiba Corp | Measuring device of intensity of front minute angle scattered light |
| JPS5970944A (en) * | 1982-10-15 | 1984-04-21 | Toshiba Corp | Apparatus for measuring particle diameter |
| JPS6114543A (en) * | 1984-06-30 | 1986-01-22 | Toshiba Corp | Particle size maesuring instrument |
| JPS61110033A (en) * | 1984-11-02 | 1986-05-28 | Toray Ind Inc | Measuring apparatus for agglutination reaction |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000031680A1 (en) * | 1998-11-26 | 2000-06-02 | Vlg Virtual Laser Systems Gmbh | Active unit for reproducing large-scale images |
| US6807874B2 (en) * | 2002-01-21 | 2004-10-26 | Shimadzu Corporation | Collecting apparatus of floating dusts in atmosphere |
| US6923848B2 (en) * | 2002-01-21 | 2005-08-02 | Shimadzu Corporation | Collecting apparatus of floating dusts in atmosphere |
| US7041153B2 (en) * | 2002-01-21 | 2006-05-09 | Shimadzu Corporation | Method of measuring floating dusts |
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