JPH02663U - - Google Patents

Info

Publication number
JPH02663U
JPH02663U JP7727488U JP7727488U JPH02663U JP H02663 U JPH02663 U JP H02663U JP 7727488 U JP7727488 U JP 7727488U JP 7727488 U JP7727488 U JP 7727488U JP H02663 U JPH02663 U JP H02663U
Authority
JP
Japan
Prior art keywords
contact
probe
measured object
measured
inclined surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7727488U
Other languages
Japanese (ja)
Other versions
JPH0611461Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988077274U priority Critical patent/JPH0611461Y2/en
Publication of JPH02663U publication Critical patent/JPH02663U/ja
Application granted granted Critical
Publication of JPH0611461Y2 publication Critical patent/JPH0611461Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図ａは本考案によるプローブの一実施例を
示す側面図、第１図ｂは同プローブの正面図、第
２図は被測定物の端子上における同プローブの配
置状態を示す平面図、第３図ａ，ｂは従来のプロ
ーブに一例を示す側面図および平面図である。 ３……接点部、３ａ……傾斜面、５……たわみ
部、６……端子。 FIG. 1a is a side view showing an embodiment of the probe according to the present invention, FIG. 1b is a front view of the probe, and FIG. 2 is a plan view showing the arrangement of the probe on the terminal of the object to be measured. FIGS. 3a and 3b are a side view and a plan view showing an example of a conventional probe. 3... Contact portion, 3a... Inclined surface, 5... Flexible portion, 6... Terminal.

Claims (1)

【実用新案登録請求の範囲】 (1) 被測定物の入出力端子６に接触して被測定
物の電気特性を検査するためのプローブにおいて
、 板材よりなり、その片面の前記被測定物の入出
力端子と接触する位置が所定の接触面積を得るよ
うに傾斜面３ａをなして形成された接点部３と、
該接触時に所定のたわみ量をもつて前記被測定物
に所定の接触荷重を与えるたわみ部５とを備えた
ことを特徴とするプローブ。 (2) 前記傾斜面３ａはハーフエツチングによつ
て形成されたことを特徴とする請求項１記載のプ
ローブ。[Claims for Utility Model Registration] (1) A probe for inspecting the electrical characteristics of a measured object by contacting the input/output terminal 6 of the measured object, which is made of a plate and has an input terminal of the measured object on one side. a contact portion 3 formed with an inclined surface 3a so that the position in contact with the output terminal has a predetermined contact area;
A probe comprising: a bending portion 5 which applies a predetermined contact load to the object to be measured with a predetermined amount of deflection upon contact. (2) The probe according to claim 1, wherein the inclined surface 3a is formed by half etching.
JP1988077274U 1988-06-13 1988-06-13 probe Expired - Lifetime JPH0611461Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988077274U JPH0611461Y2 (en) 1988-06-13 1988-06-13 probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988077274U JPH0611461Y2 (en) 1988-06-13 1988-06-13 probe

Publications (2)

Publication Number Publication Date
JPH02663U true JPH02663U (en) 1990-01-05
JPH0611461Y2 JPH0611461Y2 (en) 1994-03-23

Family

ID=31302270

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988077274U Expired - Lifetime JPH0611461Y2 (en) 1988-06-13 1988-06-13 probe

Country Status (1)

Country Link
JP (1) JPH0611461Y2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0459144U (en) * 1990-09-28 1992-05-21
JPH0459146U (en) * 1990-09-28 1992-05-21

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58100439A (en) * 1981-12-11 1983-06-15 Hitachi Ltd Prober
JPS6080772A (en) * 1983-10-08 1985-05-08 Rohm Co Ltd Probe needle
JPS6297966U (en) * 1985-12-11 1987-06-22

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58100439A (en) * 1981-12-11 1983-06-15 Hitachi Ltd Prober
JPS6080772A (en) * 1983-10-08 1985-05-08 Rohm Co Ltd Probe needle
JPS6297966U (en) * 1985-12-11 1987-06-22

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0459144U (en) * 1990-09-28 1992-05-21
JPH0459146U (en) * 1990-09-28 1992-05-21

Also Published As

Publication number Publication date
JPH0611461Y2 (en) 1994-03-23

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