JPH0271269U - - Google Patents

Info

Publication number
JPH0271269U
JPH0271269U JP15037788U JP15037788U JPH0271269U JP H0271269 U JPH0271269 U JP H0271269U JP 15037788 U JP15037788 U JP 15037788U JP 15037788 U JP15037788 U JP 15037788U JP H0271269 U JPH0271269 U JP H0271269U
Authority
JP
Japan
Prior art keywords
test
mode selection
selection switch
test device
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15037788U
Other languages
English (en)
Other versions
JPH0637347Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP15037788U priority Critical patent/JPH0637347Y2/ja
Publication of JPH0271269U publication Critical patent/JPH0271269U/ja
Application granted granted Critical
Publication of JPH0637347Y2 publication Critical patent/JPH0637347Y2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)

Description

【図面の簡単な説明】
第１図はこの考案の一実施例を示す接続図、第
２図はこの考案の変形実施例を示す接続図、第３
図は従来の技術を説明するための接続図である。 １００：交流試験装置、２００：直流試験装置
、３００：被試験ＩＣ、４００：プローブ群、５
００：交流試験用スキヤナ、６００：直流試験用
スキヤナ、７００，８００：モード切替スイツチ
、９０１：ガード電圧接続スイツチ。

Claims (1)

  1. 【実用新案登録請求の範囲】 Ａ 被試験ＩＣの端子に接触するプローブと、 Ｂ このプローブに直流試験装置と交流試験装置
    を選択的に接続する高周波用リレーによつて構成
    したモード切替スイツチと、 Ｃ このモード切替スイツチが直流試験装置を選
    択している状態において、モード切替スイツチを
    切替制御するための励磁コイルを直流駆動信号と
    同電位に維持するガード回路に接続し、モード切
    替スイツチが交流試験装置を選択した状態におい
    て、上記励磁コイルを交流試験装置の共通電位に
    接続するガード電圧接続スイツチと、 を具備して成るＩＣ試験用スキヤナ。
JP15037788U 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ Expired - Fee Related JPH0637347Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15037788U JPH0637347Y2 (ja) 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15037788U JPH0637347Y2 (ja) 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ

Publications (2)

Publication Number Publication Date
JPH0271269U true JPH0271269U (ja) 1990-05-30
JPH0637347Y2 JPH0637347Y2 (ja) 1994-09-28

Family

ID=31423465

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15037788U Expired - Fee Related JPH0637347Y2 (ja) 1988-11-18 1988-11-18 Ｉｃ試験用スキャナ

Country Status (1)

Country Link
JP (1) JPH0637347Y2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013124996A (ja) * 2011-12-16 2013-06-24 Fuji Electric Co Ltd 半導体試験装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013124996A (ja) * 2011-12-16 2013-06-24 Fuji Electric Co Ltd 半導体試験装置

Also Published As

Publication number Publication date
JPH0637347Y2 (ja) 1994-09-28

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees