JPH0273671A - Manufacture of photoelectric transfer element - Google Patents

Manufacture of photoelectric transfer element

Info

Publication number
JPH0273671A
JPH0273671A JP63225303A JP22530388A JPH0273671A JP H0273671 A JPH0273671 A JP H0273671A JP 63225303 A JP63225303 A JP 63225303A JP 22530388 A JP22530388 A JP 22530388A JP H0273671 A JPH0273671 A JP H0273671A
Authority
JP
Japan
Prior art keywords
powder
electrode
alloy
layer
photoelectric transfer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63225303A
Other languages
Japanese (ja)
Other versions
JP2522024B2 (en
Inventor
Naoki Ito
直樹 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP63225303A priority Critical patent/JP2522024B2/en
Publication of JPH0273671A publication Critical patent/JPH0273671A/en
Application granted granted Critical
Publication of JP2522024B2 publication Critical patent/JP2522024B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy
    • Y02E10/547Monocrystalline silicon PV cells

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  • Photovoltaic Devices (AREA)

Abstract

PURPOSE:To manufacture a photoelectric transfer element wherein output characteristics are improved by forming the photoelectric transfer layer of the photoelectric transfer element using single crystal semiconductor powder, by p-n junction which arises in powder by alloying with a rear electrode. CONSTITUTION:An Al film is stacked as a rear electrode 4 on a diffusion preventive layer 5 by, for example, deposition. Separately, n-type single powder 2 is mixed with insulating material 7 and is dissolved in organic substance to make paste, and this paste is printed onto the electrode 4. Next, it is inserted into a heating furnace together with a substrate and is heated in inert gas and forming gas. First, it is heated at a specific temperature so as to evaporate the organic substance and further it is heated so as to generate eutectic solution of Al of the electrode 4 with Si to form Al-Si alloy between Si powder 8 and the electrode 4. When the temperature is further raised, insulating substance 7 fuses and covers the Al-Si alloy. Thereafter, when the temperature is lowered gradually, the fused part between the powder 8 and the alloy layer diffuses with Al as dopant into Si, whereby a p-type Si layer 6 is formed at the time of solidification.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、単結晶半導体粉末を用いた光電変換素子の製
造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a method for manufacturing a photoelectric conversion element using single crystal semiconductor powder.

〔従来の技術〕[Conventional technology]

半導体を用いた充電変換素子において、半導体には多種
の物質が用いられている。薄膜半導体層ヲ用いる場合、
多く利用されているのはアモルファス31である。とこ
ろがアモルファスSlを用いる場合、膜厚としては11
tm程度でよいが、真空装置を用いて形成するため装置
自体のA11l模が大きく、コスト高となる上、(t 
II性の点での光劣化という大きな問題がある。半導体
に単結晶51を用いる場合、信鯨性、変換効率の点では
問題がない、しかし、材料として使用するSlが200
nと厚く、また高価であるという問題がある。
In charge conversion elements using semiconductors, various materials are used for the semiconductors. When using a thin film semiconductor layer,
Amorphous 31 is often used. However, when using amorphous Sl, the film thickness is 11
tm, but since it is formed using a vacuum device, the A11L size of the device itself is large, which increases the cost.
There is a big problem of photodeterioration in terms of II properties. When using single crystal 51 as a semiconductor, there is no problem in terms of stability and conversion efficiency, but if the Sl used as material is 200
There are problems in that it is thick and expensive.

そこで、材料、プロセス共低コスト化可能な充電変換素
子が望まれるわけであるが、これに対して単結晶半導体
の粉末を用いた光電変換素子が考えられている。この構
造及び製造方法を第2図に従って説明すると、基板1上
にまず拡散防止層5として、例えばMo層が形成され、
次に裏面型8i4として、例えばに11が形成される。
Therefore, there is a need for a charge conversion element that can reduce costs in terms of materials and processes, and in response to this, photoelectric conversion elements using single crystal semiconductor powder are being considered. This structure and manufacturing method will be explained with reference to FIG. 2. First, a Mo layer, for example, is formed as the diffusion prevention layer 5 on the substrate 1,
Next, for example, 11 is formed as the back surface mold 8i4.

その上に、粒Pk25n程度の結晶粒であるp形単結晶
St粉末8を絶縁材料7と混合させ、有機物質に溶かし
込んで形成したペーストを印刷する。m縁材料7として
はガラス原料が、有機物質としてはポリビニルアルコー
ルなどが用いられる0次に、基板ごと加熱炉へ装入し、
不活性ガス及びフォーミングガス中で加熱する。200
℃程度で有機物質は蒸発してしまう、さらに加熱して約
600℃前後にすると、裏面を極4のMとStとの共融
が始まり、Sl粉体8と1Pit4との間にAj−5l
の溶融合金が形成される。
A paste formed by mixing p-type single-crystal St powder 8 having crystal grains of about Pk25n with insulating material 7 and dissolving it in an organic substance is printed on it. A glass raw material is used as the edge material 7, and polyvinyl alcohol is used as the organic substance. Next, the substrate is charged into a heating furnace,
Heat in inert gas and forming gas. 200
The organic substance evaporates at about ℃. When heated further to about 600℃, eutectic fusion of M and St of pole 4 starts on the back side, and Aj-5l is formed between Sl powder 8 and 1Pit 4.
of molten alloy is formed.

さらに温度を上げると絶縁物質7が溶解し、MS1合金
石の上をカバーする。その後温度を徐々に下げていくと
、A7電極4とSi粉体8とのkl−3i溶融合金から
の析出層はp゛形Si9となり、裏面電極4との電気的
コンタクトが形成される。次いで、結晶粒表面をみがき
、その上に光入射側電極10として極薄のA7薄膜を形
成する。このTLff+は、裏面電極4との対向電極で
あると同時にSl粉体8とのショットキー接合を形成す
る目的をもつ。
When the temperature is further increased, the insulating material 7 melts and covers the top of the MS1 alloy stone. Thereafter, when the temperature is gradually lowered, the deposited layer from the kl-3i molten alloy of the A7 electrode 4 and the Si powder 8 becomes p'-type Si9, and electrical contact with the back electrode 4 is formed. Next, the surfaces of the crystal grains are polished, and an extremely thin A7 thin film is formed thereon as the light incident side electrode 10. This TLff+ has the purpose of forming a Schottky junction with the Sl powder 8 as well as being a counter electrode with the back electrode 4 .

〔発明が解決しようとする課題〕 このような光;変換素子樽造では、ショットキー接合を
形成することによってダイオードを構成し、光電変換可
能とするため、光入射側の電極10としてはSi粉体8
とショットキー接合が形成可能である金属を用いなけれ
ばならなく、電極材料の選択範囲が狭くなるという欠点
がある。また金属をq橿として用いているため、電気的
コンタクトを良好にするためにit極の厚みは少なくと
も数10人程度は必要であり、光の透過率が減少してし
まうと共に反射率も増加し、Si粉末8に結成される充
電変換層に入る実質的な入射光量が減少してしまい、出
力特性も低くなるといった問題があった。
[Problem to be Solved by the Invention] Such light; in the conversion element barrel manufacturing, a diode is formed by forming a Schottky junction, and in order to enable photoelectric conversion, Si powder is used as the electrode 10 on the light incident side. body 8
A metal that can form a Schottky junction with the metal must be used, which has the disadvantage of narrowing the selection range of electrode materials. In addition, since metal is used as the q-ring, the thickness of the IT electrode must be at least several tens of layers in order to make good electrical contact, which reduces the light transmittance and increases the reflectance. However, there was a problem in that the substantial amount of incident light entering the charge conversion layer formed on the Si powder 8 was reduced, and the output characteristics were also lowered.

本発明の課題は、光入射側電極から充電変換層を形成す
る半導体粉末へ入る入射量を増加させ、高出力特性を持
つ低コスト光電変換素子を製造する方法を提供すること
にある。
An object of the present invention is to provide a method for manufacturing a low-cost photoelectric conversion element with high output characteristics by increasing the amount of light incident on the semiconductor powder forming the charge conversion layer from the light incident side electrode.

〔課題を解決するための手段〕[Means to solve the problem]

上記の課題の解決のために、本発明は、第一導電形の単
結晶半導体粉末を同一平面上に密に配置する工程と、そ
の面の一側において半導体粉末に、第二R型彫のための
ドーピング不純物を含む導電性材料の′ifl膜を接触
させる工程と、加熱により半導体粉末と導電性材料とを
合金化させたのち冷却して半導体粉末内の一部に第二導
電形の領域を形成する工程と、半導体粉末の他側を透光
性電極で覆う工程とを備えたものとする。
In order to solve the above problems, the present invention includes a step of arranging single crystal semiconductor powder of a first conductivity type densely on the same plane, and a second R-shape carved into the semiconductor powder on one side of the surface. A process of contacting an 'ifl film of a conductive material containing doping impurities for the purpose of heating, and heating to alloy the semiconductor powder and the conductive material, and then cooling to form a region of the second conductivity type in a part of the semiconductor powder. and a step of covering the other side of the semiconductor powder with a transparent electrode.

〔作用〕[Effect]

上記の方法では、ト′−ピング不純物を含む導電性材料
は半導体粉末と合金化し、冷却することにより半導体粉
末内に充電変換層を形成するpn接合をつくると共に、
光電変tag子の一方の1を掻となる。半導体粉末の他
側を覆う透光性電極は、ショットキー接合形成を兼ねる
電極より高透過率。
In the above method, the conductive material containing the toping impurity is alloyed with the semiconductor powder and upon cooling creates a p-n junction that forms a charge conversion layer within the semiconductor powder;
Scratch one of the photoelectric transducer tags. The transparent electrode covering the other side of the semiconductor powder has higher transmittance than the electrode that also forms the Schottky junction.

低反射率にできるため、光を変換層への入射光量が増加
し、素子の出力特性が向上する。
Since the reflectance can be made low, the amount of light incident on the conversion layer is increased, and the output characteristics of the device are improved.

〔実施例〕〔Example〕

以下本発明の一実施例を、第2図と共通の部分には同一
の符号を付した第1図(al〜(alを引用して説明す
る。後工程として加熱工程が入るため、絶縁材料として
はアルミナ珪酸ガラス、石英ガラス。
An embodiment of the present invention will be described below with reference to FIG. 1 (al to (al) in which parts common to those in FIG. Examples include alumina silicate glass and quartz glass.

アルミナ等のセラミックを用いる絶縁性基板1上に基板
からの不純物拡散防止として拡散防止層5を形成する 
(図a)。拡散防止I!!5としては二酸化硅素膜、″
g!化硅化膜素膜いは高融点金属であるMo。
A diffusion prevention layer 5 is formed on an insulating substrate 1 made of ceramic such as alumina to prevent impurities from diffusing from the substrate.
(Figure a). Prevention of spread I! ! 5 is a silicon dioxide film,
g! The silicon oxide film is Mo, which is a high melting point metal.

N1膜などが用いられる0次に拡散防止J55の上に裏
面電極4としてA7膜を、例えば蒸着により積層する 
(図b)、別に、25n程度の粒径の結晶粒であるn形
単結晶S1粉末2を絶縁材料7と混合させ、有機物質に
溶かし込んでペーストを作成し、このペーストをM膜4
の上に印刷する (図c)s絶縁材料7としてはガラス
原料が、有機物質としてはポリビニルアルコールなどが
用いられる0次に、基板ごと加熱炉に装入し、不活性ガ
スおよびフォーミングガス中で加熱する。200℃程度
の加熱でまず有機物質が蒸発し、さらに加熱し600℃
前後にすると裏面電極4のMとStとの共融が始まり、
Sl粉体8と電極4の間にAN−81合金が形成される
An A7 film is laminated as the back electrode 4 on the zero-order diffusion prevention J55 using an N1 film or the like, for example, by vapor deposition.
(Figure b), separately, an n-type single crystal S1 powder 2, which is crystal grains with a grain size of about 25 nm, is mixed with an insulating material 7, dissolved in an organic substance to create a paste, and this paste is applied to the M film 4.
(Figure c) Glass raw material is used as the insulating material 7, and polyvinyl alcohol is used as the organic substance.Next, the substrate is charged into a heating furnace and heated in an inert gas and forming gas. Heat. Organic substances first evaporate by heating to about 200℃, then further heating to 600℃
When moving back and forth, eutectic fusion between M and St of the back electrode 4 begins,
AN-81 alloy is formed between the Sl powder 8 and the electrode 4.

さらに温度を上げるとm緑物質7が溶解し、M−si金
合金上カバーする。これは光入射側電極3と裏面を極4
との短絡を防ぐ役割を果たす、その後徐々に温度を下げ
ていくと、Si粉体8と合金層との溶解部はMがドーパ
ントとしてSl内に拡散することにより、凝固の際p形
5ill 6が形成される(図d)、従って、n形St
粉体2にはpn接合が形成されたことになる。その後結
晶粒表面をみがき、ては、透光性導電材料であるITO
や5nOtl膜などを用いる。ITOや5nOtなどを
用いた場合、その薄膜により反射率を制御することがで
き、例えば700人程鹿の厚さの薄膜を形成すれば反射
率を最小にすることができる。
When the temperature is further increased, the m-green substance 7 melts and covers the M-si gold alloy. This is the light incident side electrode 3 and the back side electrode 4.
When the temperature is then gradually lowered, M diffuses into the Si as a dopant in the melted zone between the Si powder 8 and the alloy layer, resulting in p-type 5ill 6 during solidification. is formed (figure d), thus n-type St
This means that a pn junction is formed in the powder 2. After that, the surface of the crystal grains is polished, and then ITO, which is a translucent conductive material, is polished.
or 5nOtl film. When ITO, 5nOt, or the like is used, the reflectance can be controlled by the thin film. For example, by forming a thin film as thick as about 700 deer, the reflectance can be minimized.

本発明の別の実施例として、基板として絶縁性のもので
はなく高融点金属、例えば0M。1Ni等の金属板を用
いてもよい、この場合、拡散防止J!5は形成しなくて
もよい、さらに、本発明の大間電池特性としての評価を
行った。従来法としては光入射窓としてA7Bを約50
人の厚さに形成し、本発明としては光入射窓としてIT
Oを約700 人の厚さに形成した。その結果、従来法
で短絡光電流が12mA / cdの出力であったもの
が、本発明では15m^/dに向上し、変換効率の向上
を図ることができた。
In another embodiment of the invention, the substrate is not insulating but a refractory metal, such as 0M. A metal plate such as 1Ni may also be used; in this case, diffusion prevention J! 5 may not be formed.Furthermore, the characteristics of the Ohma battery of the present invention were evaluated. In the conventional method, A7B is used as the light entrance window.
It is formed to a human thickness, and the present invention uses IT as a light entrance window
O was formed to a thickness of about 700 people. As a result, the short-circuit photocurrent output was 12 mA/cd in the conventional method, but it was increased to 15 m^/d in the present invention, and it was possible to improve the conversion efficiency.

以上の実施例では単結晶半導体粉末としn形S1粉末を
用いたが、p形粉末を用いてもよく、その際は裏面電橋
としては5n−3b合金などを使用すればよい。
In the above embodiments, n-type S1 powder was used as the single-crystal semiconductor powder, but p-type powder may also be used, and in that case, a 5n-3b alloy or the like may be used for the backside electrical bridge.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、単結晶半導体粉末を用いた光電変換素
子の光電変喚層も、従来の光入射側電極とのシシットキ
ー接合によらないで、裏面電lEiとの合金化によって
粉末内に生ずるpnf1合によって形成するので、光入
射側電極として透過率1反射率の点で存効な透光性電橋
を採用することができ、従来法に(らぺ製造工程数を増
加させることなく、出力特性の向上した低コストの光電
変換素子が製造可能になった。
According to the present invention, the photoelectric conversion layer of a photoelectric conversion element using a single crystal semiconductor powder is also formed in the powder by alloying with the back surface electrode, instead of by the conventional shishit-key bonding with the light incident side electrode. Since it is formed by pnf1 combination, it is possible to use a transparent electric bridge that is effective in terms of transmittance and reflectance as the light incident side electrode, and it is possible to use a transparent electric bridge that is effective in terms of transmittance and reflectance. It has become possible to manufacture low-cost photoelectric conversion elements with improved output characteristics.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の光電変換素子の製造工程を
順次示す断面図、第2121は従来の単結晶半導体粉末
を用いた光′g1変填変量素子面図である。 1:絶縁性基板、2:n形Sl粉末、3;光入射側電極
、4:s面電極、5:拡散防止層、6:p形Sll1g
、7:絶縁材料。 代理人弁理士 山 口  濃     い第2図 第1図
FIG. 1 is a sectional view sequentially showing the manufacturing process of a photoelectric conversion device according to an embodiment of the present invention, and FIG. 2121 is a plan view of a conventional optical g1 variable variable device using single crystal semiconductor powder. 1: Insulating substrate, 2: N-type Sl powder, 3: Light incident side electrode, 4: S-plane electrode, 5: Anti-diffusion layer, 6: P-type Sl1g
, 7: Insulating material. Representative Patent Attorney Yoshii YamaguchiFigure 2Figure 1

Claims (1)

【特許請求の範囲】[Claims] 1)第一導電形の単結晶半導体粉末を同一平面上に密に
配置する工程と、その面の一側において半導体粉末に、
第二導電形のためのドーピング不純物を含む導電性材料
の薄膜を接触させる工程と、加熱により半導体粉末と導
電性材料とを合金化させたのち冷却して半導体粉末内の
一部に第二導電形の領域を形成する工程と、半導体粉末
の他側を透光性電極で覆う工程とを備えたことを特徴と
する光電変換素子の製造方法。
1) A process of densely arranging single crystal semiconductor powder of the first conductivity type on the same plane, and placing the semiconductor powder on one side of the plane,
A process of contacting a thin film of conductive material containing doping impurities for a second conductivity type, and heating to alloy the semiconductor powder and the conductive material, and then cooling to form a second conductivity in a part of the semiconductor powder. 1. A method for manufacturing a photoelectric conversion element, comprising a step of forming a shaped region and a step of covering the other side of the semiconductor powder with a light-transmitting electrode.
JP63225303A 1988-09-08 1988-09-08 Method for manufacturing photoelectric conversion element Expired - Lifetime JP2522024B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63225303A JP2522024B2 (en) 1988-09-08 1988-09-08 Method for manufacturing photoelectric conversion element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63225303A JP2522024B2 (en) 1988-09-08 1988-09-08 Method for manufacturing photoelectric conversion element

Publications (2)

Publication Number Publication Date
JPH0273671A true JPH0273671A (en) 1990-03-13
JP2522024B2 JP2522024B2 (en) 1996-08-07

Family

ID=16827229

Family Applications (1)

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Country Status (1)

Country Link
JP (1) JP2522024B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0548126A (en) * 1991-08-09 1993-02-26 Sharp Corp Photoelectric conversion element and manufacturing method thereof
JP2002043602A (en) * 2000-07-27 2002-02-08 Kyocera Corp Photoelectric conversion device and method of manufacturing the same
JP2002261301A (en) * 2001-02-28 2002-09-13 Kyocera Corp Photoelectric conversion device
JP2005243872A (en) * 2004-02-26 2005-09-08 Kyocera Corp Photoelectric conversion device and manufacturing method thereof
US12072656B1 (en) 2023-03-16 2024-08-27 Toshiba Tec Kabushiki Kaisha Image forming apparatus abnormality detection

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51129192A (en) * 1975-05-06 1976-11-10 Agency Of Ind Science & Technol Manufacturing method of solar battery
JPS55158687A (en) * 1979-05-30 1980-12-10 Toshiba Corp Piezoelectric oxide material
JPS61124179A (en) * 1984-09-04 1986-06-11 テキサス インスツルメンツ インコ−ポレイテツド Solar array and making thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51129192A (en) * 1975-05-06 1976-11-10 Agency Of Ind Science & Technol Manufacturing method of solar battery
JPS55158687A (en) * 1979-05-30 1980-12-10 Toshiba Corp Piezoelectric oxide material
JPS61124179A (en) * 1984-09-04 1986-06-11 テキサス インスツルメンツ インコ−ポレイテツド Solar array and making thereof

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0548126A (en) * 1991-08-09 1993-02-26 Sharp Corp Photoelectric conversion element and manufacturing method thereof
JP2002043602A (en) * 2000-07-27 2002-02-08 Kyocera Corp Photoelectric conversion device and method of manufacturing the same
JP2002261301A (en) * 2001-02-28 2002-09-13 Kyocera Corp Photoelectric conversion device
JP2005243872A (en) * 2004-02-26 2005-09-08 Kyocera Corp Photoelectric conversion device and manufacturing method thereof
US12072656B1 (en) 2023-03-16 2024-08-27 Toshiba Tec Kabushiki Kaisha Image forming apparatus abnormality detection

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