JPH028706A - Surface shape measuring apparatus - Google Patents

Surface shape measuring apparatus

Info

Publication number
JPH028706A
JPH028706A JP24645088A JP24645088A JPH028706A JP H028706 A JPH028706 A JP H028706A JP 24645088 A JP24645088 A JP 24645088A JP 24645088 A JP24645088 A JP 24645088A JP H028706 A JPH028706 A JP H028706A
Authority
JP
Japan
Prior art keywords
movement amount
movement
optical sensor
signal
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24645088A
Other languages
Japanese (ja)
Other versions
JPH0726824B2 (en
Inventor
Hitoshi Takabayashi
高林 均
Toshio Ichikawa
市川 敏夫
Kenji Matsumaru
松丸 憲司
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP63246450A priority Critical patent/JPH0726824B2/en
Publication of JPH028706A publication Critical patent/JPH028706A/en
Publication of JPH0726824B2 publication Critical patent/JPH0726824B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To enable measurement of a surface shape at a very high accuracy in a fine order by moving a Z table so that a difference is down to zero between a value of a height signal of a surface to be measured and a value stored and set to add a movement value thereof to the height signal. CONSTITUTION:An object to be measured mounted on an X-Y table is irradiated with a light beam from a light source 61, reflected light thereof is received with a photodetector 64 of a photosensor 6 and signals i1 and i2 are outputted to a computation 65 to compute the Z-wise moving table of the surface of an object to be measured. The height signal is compared with a fixed value stored and set previously and a Z-way moving table is driven with a motor 14 in such a direction that the resultant difference approaches zero. As the Z-wise movement value is added to the height signal with a signal processor 12, the photosensor 6 follows irregularities of the object to be measured. This enables the use of a highly sensitive photosensor 6 to measure a surface shape at a very high accuracy in a fine order.

Description

【発明の詳細な説明】 く本発明の産業上の利用分野〉 本発明は、光センサを用いて被測定物の表面形状(即ち
表面の凹凸)を広い面積にわたって、極めて高精度に且
つ高速で測定できるようにした表面形状測定装置に関す
る。
[Detailed Description of the Invention] Industrial Application Field of the Present Invention The present invention uses an optical sensor to measure the surface shape (i.e. surface irregularities) of a measured object over a wide area with extremely high precision and at high speed. The present invention relates to a surface shape measuring device capable of performing measurements.

〈従来技術〉 従来より、非接触式に被測定物の表面形状(表面の凹凸
)を測定する方法として、特開昭51−124944号
公報において光束ビームを被測定物の表面に直交するX
−Y方向に移動させつつ照射し、その反射した光点象に
よって測定する方法が提案されている。
<Prior art> As a conventional method for measuring the surface shape (surface irregularities) of a measured object in a non-contact manner, Japanese Unexamined Patent Publication No. 124944/1983 discloses a method in which a light beam is directed by an X orthogonal beam to the surface of the measured object.
A method has been proposed in which the object is irradiated while moving in the -Y direction and the reflected light spots are measured.

また、同一公報には、被測定物の表面の凹凸に合わせて
光照射−受光装置を進退させ、口の進退量を凹凸の吊と
して検出する技術も提案されている。
The same publication also proposes a technique in which a light emitting/receiving device is moved back and forth in accordance with the unevenness of the surface of the object to be measured, and the amount of movement of the mouth is detected as the height of the unevenness.

く本発明が解決しようとする問題点〉 しかしながら、このような従来の方法では、被測定物表
面の凹凸に合わせて、検出装置を進退させ、この進退量
を凹凸の測定値とする方法では、極めて微小なオーダー
で測定したい場合には、この微小な進退量を凹凸に完全
に一致する(即ち、差をゼロにする)ように制御するこ
とは困難であるという問題があった。
Problems to be Solved by the Present Invention> However, in such conventional methods, the detection device is moved back and forth in accordance with the unevenness of the surface of the object to be measured, and this amount of movement is used as the measurement value of the unevenness. When it is desired to measure on an extremely minute order, there is a problem in that it is difficult to control this minute amount of advance and retreat so that it perfectly matches the unevenness (that is, makes the difference zero).

また、極めて微小なオーダーでの測定値を高精度にjq
るためには、検出装置の感度を極めて高くしなければな
らないため、測定可能な凹凸量(Z方向の距@)が極め
て狭くなるため、類い距離の凹凸がilF+定できても
、長い距離の凹凸は測定範囲外へはみ出してしまうため
、測定可能な範囲が著しく狭くなるという問題があった
In addition, measurements on extremely small orders can be made with high precision.
In order to do this, the sensitivity of the detection device must be extremely high, and the amount of unevenness that can be measured (distance in the Z direction) becomes extremely narrow. Since the unevenness extends outside the measurement range, there is a problem in that the measurable range is significantly narrowed.

本発明は前記問題点を解決した装置を提供することを目
的としている。
An object of the present invention is to provide a device that solves the above problems.

ぐ前記問題点を解決するための手段〉 前記問題点を解決するために本発明の表面形状測定装置
では (1) 被測定物をX方向に移動させるX方向移動テー
ブルと、 前記X方向移動テーブルの移動量を検出するX方向移#
J吊検出器と、 被測定物を前記X方向と直交するY方向に移動させるY
方向移動テーブルと、 前記Y方向移動テーブルの移11Jffiを検出するY
方向移動量検出器と、 被測定物表面に光ビームを照射し、その反射光点の位置
を検出することによって、被測定物表面の高さ信号を出
力する光センサと、 前記尤センサを前記X−Y平面に垂直な2方向に移動さ
せるZ方向移動テーブルと、 前記Z方向移動テーブルの移動量を検出するZ方向移l
lJ吊検出器と、 前記X方向移動量検出器及びY方向移!lJ吊検出器か
ら出力される移0吊信号が、変化した場合における、該
移!lJm信号変化前の前記光センサからの高さ信号を
記憶する記憶装置と、 前記記1装置に記憶された高さ信号と、前記移!lI吊
信号変化後の前記光センサからの高さ信号とを比較して
、両者の差が零に近づく方向に、前記X方向移動テーブ
ルを移動させる制御信号を出力するX方向移動制611
装置と、 前記光センサからの高さ信号と前記Z方向移動場検出器
からの移動中とを加算する加算装置とを備えている。
Means for Solving the Problems> In order to solve the problems described above, the surface shape measuring apparatus of the present invention includes (1) an X-direction moving table for moving the object to be measured in the X-direction; and the X-direction moving table. X direction movement to detect the amount of movement #
J-suspended detector, and Y that moves the object to be measured in the Y direction orthogonal to the X direction.
a direction movement table; and a Y direction movement table for detecting movement 11Jffi of the Y direction movement table.
a directional movement amount detector; an optical sensor that outputs a height signal of the surface of the object to be measured by irradiating a light beam onto the surface of the object to be measured and detecting the position of a reflected light point; A Z-direction moving table that moves in two directions perpendicular to the X-Y plane, and a Z-direction moving table that detects the amount of movement of the Z-direction moving table.
lJ hanging detector, the X-direction movement amount detector and Y-direction movement! When the shift 0 suspension signal output from the lJ suspension detector changes, the corresponding shift! a storage device that stores the height signal from the optical sensor before the lJm signal changes; a storage device that stores the height signal from the optical sensor before the lJm signal changes; an X-direction movement control 611 that compares the height signal from the optical sensor after the II suspension signal has changed and outputs a control signal to move the X-direction movement table in a direction in which the difference between the two approaches zero;
and a summing device that adds the height signal from the optical sensor and the moving signal from the Z-direction moving field detector.

また、 (2) 被測定物をX方向に移動させるX方向移動テー
ブルと、 前記X方向移動テーブルの移動量を検出するX方向移′
vJ吊検出器と、 被測定物を前記X方向と直交するY方向に移動させるY
方向移動テーブルと、 前記Y方向移動テーブルの移IJfflを検出づるY方
向移動量検出器と、 被測定物表面に光ビームを照射し、その反射光点の位置
を検出することによって、被測定物表面の高さ信号を出
力する光センサと、 前記光センサを前記X−Y平面に垂直なX方向に移動さ
せるX方向移動テーブルと、 前記X方向移動テーブルの移all吊を検出するZ方向
移動量検出器と、 被測定物をオプティカルフラットとした場合における、
曲記X方向移lJl吊検出器及びY方向移動量検出器か
ら出力される移動量に対応づけて、前記光センサから出
力される高さ信号が予め記憶設定された移動テーブルず
れ吊設窓装置と、前記X方向移動量検出器及びY方向移
動量検出器から出力される移11Jffi信号が、変化
した場合における、該移動量信号変化前の前記光センサ
からの高さ信号を記憶する記憶装置と、 前記記憶装置に記憶された高さ信号と、前記移動量信号
変化後の前記光センサからの高さ信号とを比較して、両
者の差が零に近づく方向に、前記X方向移動テーブルを
移動させる制御信号を出力するZ方向移動制m+装置と
、 前記光センサからの高さ信号と前記7方向移動量検出器
からの移0吊とを加算し、この加算結果からさらに、前
記移動テーブルずれ量設定装置に設定されたずれ量を、
前記X方向移1)lffi検出器及びY方向移動量検出
器から出力される移動場に対応づけて、減算する演算装
置と を備えている。
(2) an X-direction moving table for moving the object to be measured in the X-direction; and an X-direction moving table for detecting the amount of movement of the X-direction moving table.
vJ suspension detector, and Y that moves the object to be measured in the Y direction orthogonal to the X direction.
a directional movement table; a Y-direction movement amount detector that detects the movement IJffl of the Y-direction movement table; an optical sensor that outputs a surface height signal; an X-direction movement table that moves the optical sensor in the X direction perpendicular to the X-Y plane; and a Z-direction movement that detects the lifting of the X-direction movement table. When the quantity detector and the object to be measured are optically flat,
A moving table shift hanging window device in which a height signal outputted from the optical sensor is stored and set in advance in association with the amount of movement outputted from the X-direction movement lJl hanging detector and the Y-direction movement amount detector. and a storage device for storing the height signal from the optical sensor before the movement amount signal changes when the movement 11Jffi signal output from the X-direction movement amount detector and the Y-direction movement amount detector changes. and comparing the height signal stored in the storage device with the height signal from the optical sensor after the change in the movement amount signal, and moving the X-direction moving table in a direction in which the difference between the two approaches zero. A Z-direction movement control device that outputs a control signal for moving the m The amount of deviation set on the table deviation amount setting device,
The X-direction movement 1) includes an arithmetic device that performs subtraction in association with the movement field output from the lffi detector and the Y-direction movement amount detector.

く作用〉 このようにしたため、 前記(1)では、被測定物の表面の凹凸に追随するよう
に7方向に光センサが移動制御され、このZ方向移!1
lffiと光センサ出力とが加算されるから、光センサ
の追随移動が被測定物表面の凹凸に完全に一致しなくて
も、この不一致分が加算されることになるから、正確に
出力される。
In this way, in (1) above, the optical sensor is controlled to move in seven directions so as to follow the irregularities on the surface of the object to be measured, and this Z direction movement! 1
Since lffi and the optical sensor output are added, even if the optical sensor's tracking movement does not perfectly match the irregularities on the surface of the object to be measured, this mismatch will be added, so the output will be accurate. .

また前記(2)では、X−Y方向移!Il誤差及びZ方
向追随移動y4差の双方がなくなる。
In addition, in (2) above, the movement in the X-Y direction! Both the Il error and the Z-direction follow-up movement y4 difference are eliminated.

く本発明の実施例〉 以下、図面に基づいて本発明の一実施例を説明する。Examples of the present invention> Hereinafter, one embodiment of the present invention will be described based on the drawings.

第1〜5図は本発明の一実施例を示している。1 to 5 show an embodiment of the present invention.

図において、1は被測定物Wを据え付ける平板状の基台
であって、この基台1は×方向811Jテーブル2上を
水平方向(X軸方向)にパルスモータ3によって移動可
能になっており、このX方向移動テーブル2はX方向と
直交するY方向移動テーブル4上を鉛直方向(Y軸方向
)にパルスモータ5によって移動可能になっている。
In the figure, reference numeral 1 denotes a flat base on which the object to be measured W is installed, and this base 1 is movable in the x direction on a table 2 in the horizontal direction (X-axis direction) by a pulse motor 3. This X-direction moving table 2 is movable by a pulse motor 5 in the vertical direction (Y-axis direction) on a Y-direction moving table 4 perpendicular to the X direction.

これらの基台1、X方向移動テーブル2、X方向移動テ
ーブル4は鉛直に設定されているため、被測定物Wは基
台1の表面に鉛直状態で据え付けられる。
Since the base 1, the X-direction moving table 2, and the X-direction moving table 4 are set vertically, the object W to be measured is installed on the surface of the base 1 in a vertical state.

基台1の前方には光センサ6が固定台7上に固定設置さ
れている。
In front of the base 1, an optical sensor 6 is fixedly installed on a fixed base 7.

光センサ6は、第2図に示すように、 指向性の良い光束ビームを発する光源61と、この光束
を絞って被測定物Wの表面に照射する照射レンズ62と
、 光軸が照射レンズ62の光軸からある角度でずれ、被測
定物Wの表面の光点からの反射光束を絞って受光素子6
4の受光面64aに反射光点の像を結像させる結像レン
ズ63と、 反射光点が被測定物Wの表面の7方向<X−Y平面に直
交する方向)の変位によって変化する場合の軌跡に受光
面64aが一致するように配置され、受光面64aにお
ける反射光点の像の位置に応じた二つの信号i1、iz
を出力する受光素子64と、 受光素子64の二つの出力jl、12から被測定物Wの
表面の高さの変化z1を として演算する演算器65と によって構成されている。
As shown in FIG. 2, the optical sensor 6 includes a light source 61 that emits a light beam with good directionality, an irradiation lens 62 that narrows down this light beam and irradiates it onto the surface of the object W to be measured, and an optical axis of the irradiation lens 62. is shifted at a certain angle from the optical axis of
An imaging lens 63 that forms an image of a reflected light spot on the light-receiving surface 64a of 4, and a case where the reflected light spot changes due to displacement of the surface of the object W in 7 directions <direction orthogonal to the X-Y plane). The light-receiving surface 64a is arranged so as to match the locus of the light-receiving surface 64a, and two signals i1, iz
It is composed of a light receiving element 64 which outputs , and a computing unit 65 which calculates a change z1 in the height of the surface of the object W from the two outputs jl and 12 of the light receiving element 64.

第3図に示すように、被測定物Wの表面に7方向(X−
Y平面に直交する方向)の変位(即ち表面の凹凸)が存
在すると、照射レンズ62からの光束が表面で反射され
、結像レンズ63によって結像される反射光点のfll
QはZ方向の変位に対応してZ一方向に変位する。
As shown in FIG. 3, the surface of the object W to be measured is
If there is a displacement (in a direction perpendicular to the Y plane) (i.e. surface unevenness), the light beam from the irradiation lens 62 is reflected on the surface, and the reflected light spot is imaged by the imaging lens 63.
Q is displaced in the Z direction corresponding to the displacement in the Z direction.

この2′方向の反射光点のIQの変位を検出するために
、前記したように、受光素子64の受光面64aはZ′
力方向即ら、反射光点の像Qの軌跡に一致させである。
In order to detect the IQ displacement of the reflected light spot in the 2' direction, the light receiving surface 64a of the light receiving element 64 is
The direction of the force, ie, the locus of the image Q of the reflected light spot, is made to match.

受光素子64としては、例えば第4図に示すように、Z
一方向の変位を電気信号に変換する一次元の拡散型PI
Nダイオードが用いられる。この受光素子64は2′方
向の両端に設けた端子64b、64cにそれぞれ接続し
た負荷抵抗器R,Rに流れる受光電流i+、izの比が
、反射光点の90の2一方向の位置変化に応じて変化す
るもので、中心線ノ0から光点の像Qの7一方向の距離
Zoは として求められる。
As the light receiving element 64, for example, as shown in FIG.
One-dimensional diffused PI that converts displacement in one direction into electrical signals
N diodes are used. This light-receiving element 64 has a ratio of light-receiving currents i+ and iz flowing through load resistors R and R connected to terminals 64b and 64c provided at both ends in the 2' direction, respectively, due to a change in the position of the reflected light spot in 90 directions. The distance Zo in one direction from the center line 0 to the image Q of the light spot is determined as follows.

なお、第3図に示された光センサ6は、被測定物Wが散
乱面である場合の測定に用いられるタイプの光学系を示
したものであり、被測定物Wが鏡面の場合には、鏡面反
射をするので、照射光束と反射光束が、被測定物Wの表
面の法線に対して対称になるようなタイプの光センサが
用いられる。
Note that the optical sensor 6 shown in FIG. 3 shows an optical system of the type used for measurement when the object W to be measured is a scattering surface, and when the object W to be measured is a mirror surface, , a type of optical sensor is used in which the irradiated light beam and the reflected light beam are symmetrical with respect to the normal to the surface of the object W because of specular reflection.

X方向移動テーブル2、Y方向移動テーブル4によるX
方向、Y方向の8移動量X、Yは、それぞれパルスモー
タ3.5を駆動するXドライバ8、Yドライバ9の駆動
出力を受領するX方向移動量検出器10、Y方向移動量
検出器11によって検出される。
X by the X-direction moving table 2 and the Y-direction moving table 4
8 movement amounts X and Y in the direction and Y direction are determined by an X-direction movement amount detector 10 and a Y-direction movement amount detector 11 that receive drive outputs of an X driver 8 and a Y driver 9, respectively, which drive a pulse motor 3.5. detected by.

信号処理器12は、第5図の如く構成されている。The signal processor 12 is configured as shown in FIG.

121は、被測定物をオプティカルフラットとした場合
における、前記X方向移動量検出器10及びY方向移v
J量検出器11から出力される移動ff1X、Yに対応
づけて、前記光センサ6から出力される高さ@号z1が
予め記憶設定された移動テーブルずれ吊設定装置である
121 indicates the X-direction movement amount detector 10 and the Y-direction movement v when the object to be measured is an optical flat.
This is a moving table shift suspension setting device in which the height @#z1 outputted from the optical sensor 6 is stored in advance in association with the movement ff1X, Y outputted from the J amount detector 11.

即ち、オプティカルフラットを測定した場合の光センサ
6の出力はX、Yテーブル移動における各移動位置ごと
の7方向のずれ吊を示している。
That is, the output of the optical sensor 6 when measuring the optical flat indicates the deviation in seven directions for each movement position in the X and Y table movements.

このずれ吊がX−Y平面の全体について、予め設定しで
ある。
This offset is set in advance for the entire X-Y plane.

122は、前記光センサ6からの高さ信号Z1から、前
記移動テーブルずれ吊設定K@12に設定されたずれ量
を、前記X方向移動量検出器10及びY方向移動量検出
器11から出力される移動量に対応づけて、減算する減
算装置である。
122 outputs the displacement amount set in the moving table displacement suspension setting K@12 from the height signal Z1 from the optical sensor 6 from the X-direction movement amount detector 10 and the Y-direction movement amount detector 11. This is a subtraction device that subtracts in correspondence with the amount of movement.

123は、この移動テーブルずれ示設定装@121への
設定vノ作、減算装@122の動作、及びX、Yドライ
バー8.9の動作を制御する制御l装置である。
Reference numeral 123 denotes a control device that controls the setting of the moving table shift indicating device @121, the operation of the subtraction device @122, and the operation of the X and Y drivers 8.9.

上記の如く表面形状測定装置は構成されているので、被
測定!Ill!IWを基台1上に据え付け、X方向移V
ノテーブル2及びY方向移動テーブル4によって、基台
1をX−Y平面で移動しつつ、光センサ6の光源61の
光ビームを被測定物Wの表面に照9Aする。
Since the surface shape measuring device is configured as described above, it is possible to measure the surface shape! Ill! Install IW on base 1 and move it in the X direction V
While the base 1 is moved in the XY plane by the table 2 and the Y-direction moving table 4, a light beam from the light source 61 of the optical sensor 6 is directed onto the surface of the object W to be measured 9A.

受光素子64からは信号i1、izが出力され、演算器
65は信号i1、izを受領して被測定物Wの表面の7
方向の高さZlを演算する。これは減算装置122へ出
力される。
The light receiving element 64 outputs signals i1 and iz, and the computing unit 65 receives the signals i1 and iz and calculates the
Calculate the height Zl in the direction. This is output to subtraction device 122.

光センサ6の出力Z1及びX、Y方向移動量検出器10
.11からのX、Y方向の移ilJ吊X、Yは設定装置
121及び減算装置122へ出力される。
Output Z1 of optical sensor 6 and X and Y direction movement amount detector 10
.. 11 in the X and Y directions are output to the setting device 121 and the subtraction device 122.

i!i制御装置123に制御されて、移動テーブルずれ
争設定菰@121に設定されたX−Y平面の位置に対応
したずれ吊が、光センサ6の出力から減算される。この
結果、X−Y方向移動による誤差のない表面測定がなさ
れる。
i! Under the control of the i-control device 123, the displacement corresponding to the position on the XY plane set in the moving table displacement setting value 121 is subtracted from the output of the optical sensor 6. As a result, surface measurements can be made without errors due to movement in the X-Y directions.

第6.7図tよ、前記光センサ6が7方向移動テーブル
13上をモータ14によってX−Y平面と直交するZ軸
方向に移動可能に設置された場合を示している。このZ
方向移動テーブル13による光センサ6の7方向移vJ
ffiZは、周波数安定化されていないl−113−N
eレーザを使用した光センサ6の移動を検出する干渉α
1艮器から成るZ方向移llJ吊検出器15によって行
なわれる。
FIG. 6.7 t shows a case where the optical sensor 6 is installed movably on the seven-direction moving table 13 in the Z-axis direction perpendicular to the X-Y plane by the motor 14. This Z
Seven direction movement vJ of optical sensor 6 by direction movement table 13
ffiZ is l-113-N which is not frequency stabilized.
Interference α to detect movement of optical sensor 6 using e-laser
This is carried out by a Z-direction movement detector 15 consisting of one device.

第7図の信号処理器12は第8図の如く構成されている
The signal processor 12 shown in FIG. 7 is constructed as shown in FIG.

第8図において、124は、X方向移り吊検出器10及
びY方向移動量検出器11から出力される移動量イ8号
が、変化した場合における、移effi信号変化前の光
センサ6からの高さ信号を記憶する記憶装置である。
In FIG. 8, reference numeral 124 indicates the amount of movement from the optical sensor 6 before the movement effi signal changes when the movement amount A8 output from the X-direction movement detector 10 and the Y-direction movement amount detector 11 changes. This is a storage device that stores height signals.

125は、記憶装置124に記憶された高さ信号と、前
記移り1ffi信号変化後の光センサ6からの高さ信号
とを比較して、両者の差が零に近づく方向に、前記Z方
向移動テーブル13を移動させる制御信号を出力するZ
方向移動制tS装置である。
125 compares the height signal stored in the storage device 124 with the height signal from the optical sensor 6 after the shift 1ffi signal change, and moves the Z direction in a direction in which the difference between the two approaches zero. Z outputs a control signal to move the table 13
It is a directional movement controlled tS device.

126は、光センサ6からの高さ信号と7方向移動量検
出器15からの移動部とを加算する加算装置である。
Reference numeral 126 denotes an adding device that adds the height signal from the optical sensor 6 and the moving part from the seven-direction movement amount detector 15.

127はこれらの各初春を制御する制御装置である。127 is a control device that controls each of these early springs.

このように構成されているので、被測定物体のX−Y方
向への移動によって表面の高さが変化すると、光ヒンサ
6の高さ信号Z1は変化するが、この変化が前のある時
点で記憶装置124に記憶された高さ信号と2方向移動
制御装@125で比較され、両者の差がゼロに近づくよ
うに7ドライバー16へ制御信号が出力される。この結
果、光センサ6は表面の凹凸に追随する方向へ7テーブ
ル13によって移動される。(このため、第4図の受光
素子64の受光面64aの中心線J!O近傍に常に反射
光点の像Qが近づくようにされる。)この時の2検出器
15からの7方向移動量と光センサ6からの高さとが加
算8置126で加算される。
With this configuration, when the surface height of the object to be measured changes due to movement in the X-Y direction, the height signal Z1 of the optical hinge 6 changes, but this change does not occur at a certain point before. The height signal stored in the storage device 124 is compared with the two-direction movement control device @125, and a control signal is output to the 7 driver 16 so that the difference between the two approaches zero. As a result, the optical sensor 6 is moved by the table 7 in a direction that follows the unevenness of the surface. (For this reason, the image Q of the reflected light spot is always made to approach near the center line J!O of the light receiving surface 64a of the light receiving element 64 in FIG. 4.) At this time, the movement from the two detectors 15 in seven directions The amount and the height from the optical sensor 6 are added by addition 8 and 126.

従って、凹凸に対する追随が完全に一致しなくても、こ
の加算によって、正確に測定されるから、橿めて高精度
に測定でき、また、このように加算で補なうから高速α
j定が可能となる。しかも、表面の凹凸の変化量が大き
くても、常にPINダイオードの中央10近くへ光像を
近づけるように制■しているから、測定fi囲からはみ
だすことがないため、測定範囲も著しく拡大する。
Therefore, even if the tracking of unevenness does not match perfectly, this addition will measure accurately, making it possible to measure with high precision.
It becomes possible to determine j. Moreover, even if the amount of change in surface irregularities is large, the optical image is always controlled to approach the center 10 of the PIN diode, so it will not go outside the measurement fi area, and the measurement range will be significantly expanded. .

なお第5図に示したX−Y方向移動によるずれ吊の減算
を、この第8図の構成に追加すれば、第5図と第8図の
双方の利点を加重でき、−層高精度となる。
Furthermore, if the subtraction of the misalignment due to the X-Y direction movement shown in Fig. 5 is added to the configuration of Fig. 8, the advantages of both Fig. 5 and Fig. 8 can be weighted, and - high layer accuracy and Become.

なお、被測定物を基台1に固定した場合、その鉛直固定
位置から、ずれる場合がある。
Note that when the object to be measured is fixed to the base 1, it may shift from its vertical fixed position.

このため、信号処理器12で被11!1定物Wの表面の
三点の2方向の高さを光センサ6の出力によって記憶し
、この三点の7方向の高さが等しい値となるように被測
定物Wを仮想的に置き変えた場合の、他の任意の点の7
方向高さを出力するように演算するように)I4成すれ
ば、さらに高精度となる。
Therefore, the signal processor 12 stores the heights of three points on the surface of the object W in two directions based on the output of the optical sensor 6, and the heights of these three points in seven directions become equal values. 7 of any other arbitrary point when the measured object W is virtually replaced as shown in FIG.
If the calculation is performed so as to output the directional height), the accuracy will be even higher.

なお、Z方向の高さから7方向の等高線の位置を出力す
るように構成することもできる。
Note that it can also be configured to output the positions of contour lines in seven directions from the height in the Z direction.

く本発明の効果〉 以上説明したように本発明では、極めて高’Iii度に
、高速に、微小なオーダーでの表面形状の測定が可能と
なる。
Effects of the Present Invention> As explained above, according to the present invention, it is possible to measure the surface shape on the minute order with extremely high degree of precision and at high speed.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の表面形状測定装置の門構部
を示す斜視図、第2図はその回路部のブロック図、第3
図は光セン丈による測定原理を示す図、第4図は受光束
子の一例を示す説明図、第5図は第2図の信号処理器の
具体的構成を示すブロック図である。第6図は本発明の
他の実施例を示す斜視図、第7図はその回路部のブロッ
ク図、第8図はその信号処理部の具体的構成を示すブロ
ック図である。 W・・・・・・被測定物、1・・・・・・基台、2・・
・・・・X方向移動テーブル、4・・・・・・Y方向移
動テーブル、6・・・・・・光センサ、10・・・・・
・X方向移動量検出器、11・・・・・・Y方向移vJ
ffi検出器、12・・・・・・信号処理器、13・・
・・・・Z方向移動テーブル、15・・・・・・2方向
移仙吊検出器。 特許出願人    アンリツ株式会社
FIG. 1 is a perspective view showing the gate structure of a surface profile measuring device according to an embodiment of the present invention, FIG. 2 is a block diagram of its circuit section, and FIG.
FIG. 4 is an explanatory diagram showing an example of a light-receiving bundler, and FIG. 5 is a block diagram showing a specific configuration of the signal processor shown in FIG. 2. FIG. 6 is a perspective view showing another embodiment of the present invention, FIG. 7 is a block diagram of its circuit section, and FIG. 8 is a block diagram showing the specific configuration of its signal processing section. W...Object to be measured, 1...Base, 2...
...X-direction moving table, 4...Y-direction moving table, 6... Optical sensor, 10...
・X-direction movement amount detector, 11...Y-direction movement vJ
ffi detector, 12... Signal processor, 13...
...Z-direction moving table, 15...2-direction moving sensor. Patent applicant: Anritsu Corporation

Claims (2)

【特許請求の範囲】[Claims] (1)被測定物をX方向に移動させるX方向移動テーブ
ルと、 前記X方向移動テーブルの移動量を検出するX方向移動
量検出器と、 被測定物を前記X方向と直交するY方向に移動させるY
方向移動テーブルと、 前記Y方向移動テーブルの移動量を検出するY方向移動
量検出器と、 被測定物表面に光ビームを照射し、その反射光点の位置
を検出することによつて、被測定物表面の高さ信号を出
力する光センサと、 前記光センサを前記X−Y平面に垂直なZ方向に移動さ
せるZ方向移動テーブルと、 前記Z方向移動テーブルの移動量を検出するZ方向移動
量検出器と、 前記X方向移動量検出器及びY方向移動量検出器から出
力される移動量信号が、変化した場合における、該移動
量信号変化前の前記光センサからの高さ信号を記憶する
記憶装置と、 前記記憶装置に記憶された高さ信号と、前記移動量信号
変化後の前記光センサからの高さ信号とを比較して、両
者の差が零に近づく方向に、前記Z方向移動テーブルを
移動させる制御信号を出力するZ方向移動制御装置と、 前記光センサからの高さ信号と前記Z方向移動量検出器
からの移動量とを加算する加算装置とを備えた表面形状
測定装置。
(1) An X-direction movement table that moves the object to be measured in the X direction; an X-direction movement amount detector that detects the amount of movement of the X-direction movement table; and an X-direction movement amount detector that moves the object to be measured in the Y direction orthogonal to the X direction. Move Y
a directional movement table; a Y-direction movement amount detector for detecting the movement amount of the Y-direction movement table; an optical sensor that outputs a height signal of the surface of the object to be measured; a Z-direction moving table that moves the optical sensor in the Z direction perpendicular to the X-Y plane; and a Z-direction moving table that detects the amount of movement of the Z-direction moving table. When the movement amount detector, the movement amount signal output from the X-direction movement amount detector and the Y-direction movement amount detector change, the height signal from the optical sensor before the movement amount signal changes is determined. The height signal stored in the storage device is compared with the height signal from the optical sensor after the movement amount signal has changed, and the height signal is adjusted in the direction in which the difference between the two approaches zero. A surface comprising: a Z-direction movement control device that outputs a control signal for moving a Z-direction movement table; and an addition device that adds a height signal from the optical sensor and a movement amount from the Z-direction movement amount detector. Shape measuring device.
(2)被測定物をX方向に移動させるX方向移動テーブ
ルと、 前記X方向移動テーブルの移動量を検出するX方向移動
量検出器と、 被測定物を前記X方向と直交するY方向に移動させるY
方向移動テーブルと、 前記Y方向移動テーブルの移動量を検出するY方向移動
量検出器と、 被測定物表面に光ビームを照射し、その反射光点の位置
を検出することによつて、被測定物表面の高さ信号を出
力する光センサと、 前記光センサを前記X−Y平面に垂直なZ方向に移動さ
せるZ方向移動テーブルと、 前記Z方向移動テーブルの移動量を検出するZ方向移動
量検出器と、 被測定物をオプティカルフラットとした場合における、
前記X方向移動量検出器及びY方向移動量検出器から出
力される移動量に対応づけて、前記光センサから出力さ
れる高さ信号が予め記憶設定された移動テーブルずれ量
設定装置と、 前記X方向移動量検出器及びY方向移動量検出器から出
力される移動量信号が、変化した場合における、該移動
量信号変化前の前記光センサからの高さ信号を記憶する
記憶装置と、 前記記憶装置に記憶された高さ信号と、前記移動量信号
変化後の前記光センサからの高さ信号とを比較して、両
者の差が零に近づく方向に、前記Z方向移動テーブルを
移動させる制御信号を出力するZ方向移動制御装置と、 前記光センサからの高さ信号と前記Z方向移動量検出器
からの移動量とを加算し、この加算結果からさらに、前
記移動テーブルずれ量設定装置に設定されたずれ量を、
前記X方向移動量検出器及びY方向移動量検出器から出
力される移動量に対応づけて、減算する演算装置と を備えた表面形状測定装置。
(2) an X-direction movement table that moves the object to be measured in the X direction; an X-direction movement amount detector that detects the amount of movement of the X-direction movement table; and an X-direction movement amount detector that moves the object to be measured in the Y direction orthogonal to the X direction. Move Y
a directional movement table; a Y-direction movement amount detector for detecting the movement amount of the Y-direction movement table; an optical sensor that outputs a height signal of the surface of the object to be measured; a Z-direction moving table that moves the optical sensor in the Z direction perpendicular to the X-Y plane; and a Z-direction moving table that detects the amount of movement of the Z-direction moving table. When using a movement amount detector and an optical flat object to be measured,
a moving table deviation amount setting device in which a height signal output from the optical sensor is stored and set in advance in association with the movement amount output from the X-direction movement amount detector and the Y-direction movement amount detector; a storage device that stores the height signal from the optical sensor before the movement amount signal changes when the movement amount signal output from the X-direction movement amount detector and the Y-direction movement amount detector changes; Comparing the height signal stored in a storage device with the height signal from the optical sensor after the change in the movement amount signal, and moving the Z-direction moving table in a direction in which the difference between the two approaches zero. a Z-direction movement control device that outputs a control signal; a height signal from the optical sensor and a movement amount from the Z-direction movement amount detector; The amount of deviation set to
A surface shape measuring device comprising: an arithmetic unit that performs subtraction in association with the movement amount output from the X-direction movement amount detector and the Y-direction movement amount detector.
JP63246450A 1988-09-30 1988-09-30 Surface shape measuring device Expired - Lifetime JPH0726824B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63246450A JPH0726824B2 (en) 1988-09-30 1988-09-30 Surface shape measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63246450A JPH0726824B2 (en) 1988-09-30 1988-09-30 Surface shape measuring device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP14489181A Division JPS5847209A (en) 1981-09-15 1981-09-15 Device for measuring surface configuration

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP28426094A Division JP2511809B2 (en) 1994-10-25 1994-10-25 Surface shape measuring device

Publications (2)

Publication Number Publication Date
JPH028706A true JPH028706A (en) 1990-01-12
JPH0726824B2 JPH0726824B2 (en) 1995-03-29

Family

ID=17148619

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63246450A Expired - Lifetime JPH0726824B2 (en) 1988-09-30 1988-09-30 Surface shape measuring device

Country Status (1)

Country Link
JP (1) JPH0726824B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250618A (en) * 2001-02-26 2002-09-06 Fotonikusu:Kk Exercise table control method and device, and three-dimensional surface shape measurement method and device
CN113805529A (en) * 2021-08-05 2021-12-17 傲深实验室科技(杭州)有限公司 A height measuring method and system based on numerical control equipment height measuring components

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098864A (en) * 1973-12-27 1975-08-06
JPS51124944A (en) * 1975-04-25 1976-10-30 Nippon Kogaku Kk <Nikon> Device to detect a tangent line of contour line on a three dimentional object

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5098864A (en) * 1973-12-27 1975-08-06
JPS51124944A (en) * 1975-04-25 1976-10-30 Nippon Kogaku Kk <Nikon> Device to detect a tangent line of contour line on a three dimentional object

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002250618A (en) * 2001-02-26 2002-09-06 Fotonikusu:Kk Exercise table control method and device, and three-dimensional surface shape measurement method and device
CN113805529A (en) * 2021-08-05 2021-12-17 傲深实验室科技(杭州)有限公司 A height measuring method and system based on numerical control equipment height measuring components

Also Published As

Publication number Publication date
JPH0726824B2 (en) 1995-03-29

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