JPH0298995A - Manufacture of multilayer wiring board - Google Patents
Manufacture of multilayer wiring boardInfo
- Publication number
- JPH0298995A JPH0298995A JP25239988A JP25239988A JPH0298995A JP H0298995 A JPH0298995 A JP H0298995A JP 25239988 A JP25239988 A JP 25239988A JP 25239988 A JP25239988 A JP 25239988A JP H0298995 A JPH0298995 A JP H0298995A
- Authority
- JP
- Japan
- Prior art keywords
- photosensitive resin
- hole
- blind
- multilayer wiring
- wiring board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- 229920005989 resin Polymers 0.000 claims abstract description 47
- 239000011347 resin Substances 0.000 claims abstract description 47
- 239000000945 filler Substances 0.000 claims abstract description 16
- 238000000149 argon plasma sintering Methods 0.000 claims abstract description 15
- 238000000034 method Methods 0.000 claims description 24
- 230000003287 optical effect Effects 0.000 claims description 11
- 239000002245 particle Substances 0.000 claims description 10
- 239000010410 layer Substances 0.000 abstract description 19
- 239000004020 conductor Substances 0.000 abstract description 13
- 239000011229 interlayer Substances 0.000 abstract description 8
- 239000000243 solution Substances 0.000 description 16
- 239000010419 fine particle Substances 0.000 description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 9
- 229910052802 copper Inorganic materials 0.000 description 9
- 239000010949 copper Substances 0.000 description 9
- 239000003822 epoxy resin Substances 0.000 description 8
- 229920000647 polyepoxide Polymers 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 5
- 210000004709 eyebrow Anatomy 0.000 description 5
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 5
- 238000007747 plating Methods 0.000 description 5
- 229920001721 polyimide Polymers 0.000 description 5
- 239000009719 polyimide resin Substances 0.000 description 5
- GZVHEAJQGPRDLQ-UHFFFAOYSA-N 6-phenyl-1,3,5-triazine-2,4-diamine Chemical compound NC1=NC(N)=NC(C=2C=CC=CC=2)=N1 GZVHEAJQGPRDLQ-UHFFFAOYSA-N 0.000 description 4
- 239000000654 additive Substances 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 4
- 239000011146 organic particle Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- 230000000996 additive effect Effects 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 239000002904 solvent Substances 0.000 description 3
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000005011 phenolic resin Substances 0.000 description 2
- 238000007788 roughening Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- VZSRBBMJRBPUNF-UHFFFAOYSA-N 2-(2,3-dihydro-1H-inden-2-ylamino)-N-[3-oxo-3-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)propyl]pyrimidine-5-carboxamide Chemical compound C1C(CC2=CC=CC=C12)NC1=NC=C(C=N1)C(=O)NCCC(N1CC2=C(CC1)NN=N2)=O VZSRBBMJRBPUNF-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 1
- OWYWGLHRNBIFJP-UHFFFAOYSA-N Ipazine Chemical compound CCN(CC)C1=NC(Cl)=NC(NC(C)C)=N1 OWYWGLHRNBIFJP-UHFFFAOYSA-N 0.000 description 1
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- 206010034972 Photosensitivity reaction Diseases 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- -1 acrylic compound Chemical class 0.000 description 1
- 239000012670 alkaline solution Substances 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 239000002518 antifoaming agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- ZCDOYSPFYFSLEW-UHFFFAOYSA-N chromate(2-) Chemical compound [O-][Cr]([O-])(=O)=O ZCDOYSPFYFSLEW-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 238000007766 curtain coating Methods 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 229910000040 hydrogen fluoride Inorganic materials 0.000 description 1
- 239000010954 inorganic particle Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 239000011368 organic material Substances 0.000 description 1
- 239000011242 organic-inorganic particle Substances 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000036211 photosensitivity Effects 0.000 description 1
- 239000006187 pill Substances 0.000 description 1
- 239000004645 polyester resin Substances 0.000 description 1
- 229920001225 polyester resin Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- HNJBEVLQSNELDL-UHFFFAOYSA-N pyrrolidin-2-one Chemical compound O=C1CCCN1 HNJBEVLQSNELDL-UHFFFAOYSA-N 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- 238000007761 roller coating Methods 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Landscapes
- Production Of Multi-Layered Print Wiring Board (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、多層配線板の製造方法に係り、特に導体回路
と有機質絶縁層が交互に4n層された、いわゆるビルド
アップ法多層配線板の製造方法に関するものである。Detailed Description of the Invention (Industrial Field of Application) The present invention relates to a method for manufacturing a multilayer wiring board, and particularly to a method for manufacturing a multilayer wiring board using the so-called build-up method, in which 4n layers of conductive circuits and organic insulating layers are alternately formed. This relates to a manufacturing method.
(従来技術)
近年、電子技術の進歩に伴い、大型コンピュータなどの
電子機器に対する高密度化あるいは演算機能の高速化が
進められている。その結果、プリント配線板においても
高密度化を目的として配線回路が多層に形成された多層
配線板が使用されている。(Prior Art) In recent years, with the progress of electronic technology, electronic devices such as large-sized computers have been made to have higher density and faster calculation functions. As a result, multilayer wiring boards in which wiring circuits are formed in multiple layers are also used in printed wiring boards for the purpose of increasing density.
従来、多層配線板としては、例えば内層回路が形成され
た複数の回路板をプリプレグを絶縁層として積層し、加
熱プレスして一体化した後、スルーホールによって眉間
を接続し導通させた多層配線板が使用されていた。Conventionally, multilayer wiring boards include, for example, a multilayer wiring board in which multiple circuit boards on which inner layer circuits are formed are laminated using prepreg as an insulating layer, heat pressed to integrate them, and then the eyebrows are connected through through holes for continuity. was used.
しかしながら、前述の如き多層配線板は、層数が多くな
り高密度になるにつれて眉間接続のためのスルーホール
が多くなり、導体回路を通すための面積が狭められるた
め、複雑な回路を形成し、かつ高密度化することは困難
であった。However, as the number of layers increases and the density of the multilayer wiring board as described above increases, the number of through holes for connecting between the eyebrows increases, and the area for passing conductor circuits becomes narrower, resulting in the formation of complex circuits. Moreover, it was difficult to increase the density.
このような困難さを克服することのできる多層配線板と
して、導体回路と有機質絶縁層とを交互に積層し、層間
接続の必要なところのみをブラインドスルーホールを用
いて接続するビルドアンプ法多層配線板の開発が活発に
進められている。このようなビルドアンプ法多層配線板
では不必要なスルーホールスペースが無くなり、導体回
路を通すための面積が狭められることがなく、複雑な回
路を形成し、かつ高密度化することが可能となる。A multilayer wiring board that can overcome these difficulties is the build amplifier method multilayer wiring, in which conductor circuits and organic insulating layers are alternately laminated, and only where interlayer connections are necessary are connected using blind through holes. Development of the board is actively underway. This kind of build amplifier method multilayer wiring board eliminates unnecessary through hole space, and the area for passing conductor circuits is not narrowed, making it possible to form complex circuits and increase density. .
このビルドアンプ法多層配線板に用いられる有機質s
縁iとしては、形成すべきブラインドスルーホール径を
考慮すると感光性樹脂を用いることが望ましい。The organic material used in this build amplifier method multilayer wiring board
Considering the diameter of the blind through hole to be formed, it is desirable to use photosensitive resin as the edge i.
しかしながら、有機質絶縁材料とし、て感光性樹脂を用
い、フォトリソ法によりブラインドスルホールを形成す
ると、ブラインドスルーホール側壁がほぼ垂直になるた
め、この絶lt!層の上部に導体回路を形成した多層配
vAFy、に熱衝撃が加わるとブラインドスルーホール
の肩の部分で断線が多発し易く、ブラインドスルーホー
ルの接続信頼性がモ′伍保できないという問題点があっ
た。However, when a photosensitive resin is used as an organic insulating material and a blind through hole is formed by photolithography, the side wall of the blind through hole becomes almost vertical, so this is completely impossible! When a thermal shock is applied to the multilayer VAFy, which has a conductor circuit formed on the top of the layer, disconnections tend to occur frequently at the shoulders of the blind through holes, resulting in the problem that the connection reliability of the blind through holes cannot be guaranteed. there were.
この問題点を解決するために、従来からブラインドスル
ーホールの形状を上部に拡がったテーパー状にして、ブ
ラインドスルー、トールの接続信頼性を確保する方法が
開示されている。In order to solve this problem, a method has conventionally been disclosed in which the shape of the blind through hole is made into a tapered shape that widens upward to ensure the reliability of the blind through and toll connections.
例えば、特開昭54−18989号公報にはフォトマス
クと感光性樹脂の間にブラインドスルーホール周辺でコ
ントラスト比を低下させる手段を導入し、ブラインドス
ルーホール断面をテーパー状にする方法が開示されてい
る。しかし、この方法ではフォトマスク、感光性樹脂、
ブラインドスルーホール周辺でコントラスト比を低下さ
せる手段の王者の位置関係を厳密に管理しなければ、再
現性良くブラインドスルーホール断面をテーパー状にす
ることはできず、作業性が悪いという欠点を存している
。For example, Japanese Unexamined Patent Publication No. 18989/1989 discloses a method in which a means for reducing the contrast ratio around the blind through hole is introduced between a photomask and a photosensitive resin to make the cross section of the blind through hole tapered. There is. However, with this method, the photomask, photosensitive resin,
Unless the positional relationship of the main means of reducing the contrast ratio around the blind through hole is strictly controlled, it is not possible to make the cross section of the blind through hole tapered with good reproducibility, which has the disadvantage of poor workability. ing.
(発明が解決しようとする問題点)
本発明は、上記従来技術の問題点を解決し、ブラインド
スルーホール断面の形状を容易に上部に拡がったテーパ
ー状にして、さらに作業性の良いピルドア、ブ法多層配
線板の製造方法を提供することにある。(Problems to be Solved by the Invention) The present invention solves the above-mentioned problems of the prior art, and makes the cross-section of the blind through hole easily tapered to the top, thereby improving workability of pill doors and blocks. An object of the present invention is to provide a method for manufacturing a multilayer wiring board.
(問題点を解決するための手段および作用)上記の目的
を達成するために、本発明者らは多層配線板製造プロセ
スについて鋭意研究を重ねた結果、感光性層間絶縁材料
中に光散乱性フィラーを含有させ活性光線を散乱させる
ことによって、ブラインドスルーボールを上方に向かっ
て径がテーパー状に拡大した形状にすることがてきるこ
とに想到し、導体回路間の接続信頼性を比較的容易にし
かも確実に確保することのできる多層配線板の製造方法
を完成するに至った。(Means and effects for solving the problem) In order to achieve the above object, the present inventors have conducted extensive research on the manufacturing process of multilayer wiring boards, and have found that a light-scattering filler is incorporated into the photosensitive interlayer insulating material. By scattering actinic rays by scattering actinic rays through the blind-through ball, we came up with the idea that it is possible to form a blind-through ball into a shape whose diameter tapers upward, thereby making it relatively easy to improve the connection reliability between conductor circuits. Moreover, we have completed a method for manufacturing multilayer wiring boards that can be reliably produced.
すなわち、本発明は、導体回路を形成しである基板上に
ネガ型感光性樹脂を塗布し、次いで上部よりブラインド
スルーホールを形成する箇所以外の箇所の感光性樹脂に
活性光線を照射することによって、ブラインドスルーホ
ールとなるべき孔を有する眉間1@I[を形成し、その
後このブラインドスルーホールとなるべき孔の内表面お
よび層間絶縁層の表面にさらに導体回路を形成する多層
配線板の製造方法において、前記ネガ型感光性樹脂とし
て光散乱性のフィラーを含有してなるネガ型感光性樹脂
を使用することによって、前記感光性樹脂の露光箇所を
下方に向かって拡大させ、上方に向かって径が拡大した
形状のブラインドスルーホールとなるべき孔を形成する
ことができ、この結果極めて信頼性に優れた多層配線板
をf!A造することができるのである。That is, in the present invention, a negative photosensitive resin is applied onto a substrate on which a conductor circuit is formed, and then actinic rays are irradiated from above onto the photosensitive resin at locations other than the locations where blind through holes are to be formed. A method for producing a multilayer wiring board, which comprises forming a hole between the eyebrows 1@I [ having a hole to become a blind through hole, and then further forming a conductor circuit on the inner surface of the hole to become a blind through hole and on the surface of an interlayer insulating layer. By using a negative photosensitive resin containing a light-scattering filler as the negative photosensitive resin, the exposed area of the photosensitive resin is expanded downward and the diameter is increased upward. It is possible to form a hole that should become a blind through hole with an enlarged shape, and as a result, an extremely reliable multilayer wiring board can be created. It is possible to build A.
以下に多層配線板の製造方法にしたがって、本発明の詳
細な説明する。The present invention will be described in detail below in accordance with a method for manufacturing a multilayer wiring board.
第一に導体回路を形成しである基板上に光散乱性のフィ
ラーを含有するネガ型感光性樹脂を塗布する。First, a negative photosensitive resin containing a light-scattering filler is applied onto a substrate on which a conductive circuit is to be formed.
本発明において層間絶縁膜を形成するネガ型感光性樹脂
としては、アクリル樹脂、感光性フェノール樹脂、感光
性エポキシ樹脂、感光性を付与したエポキシ変成ポリイ
ミド樹脂、感光性ポリイミド樹脂の中から選ばれる少な
くとも一種を使用することが有利である。In the present invention, the negative photosensitive resin forming the interlayer insulating film is at least selected from acrylic resin, photosensitive phenol resin, photosensitive epoxy resin, epoxy-modified polyimide resin imparted with photosensitivity, and photosensitive polyimide resin. It is advantageous to use one species.
また本発明に用いられる光散乱性フィラーとしては、有
機物微粒子、無機質微粒子何れも用いることができる。Further, as the light-scattering filler used in the present invention, both organic fine particles and inorganic fine particles can be used.
有機物微粒子としては、エポキシ樹脂、フェノール樹脂
、ベンゾグアナミン樹脂、ポリイミド樹脂の中から選ば
れる何れか少なくとも一種を使用することが有利であり
、予め硬化処理の施された樹脂微粒子であることが望ま
しい。As the organic particles, it is advantageous to use at least one selected from epoxy resins, phenol resins, benzoguanamine resins, and polyimide resins, and preferably resin particles that have been previously hardened.
ここで予め硬化処理の施されている有機物粒子を使用す
る理由は、硬化処理がなされていないと、感光性樹脂、
あるいはこの樹脂を溶剤を用いて溶解した液に添加した
際に樹脂液中に溶解してしまうからである。無機質微粒
子としては、シリカ、タルク、アルミナ、酸化チタン、
ジルコニアの中から選ばれる何れか少なくとも一種を使
用することが有利である。さらに、これら有機物微粒子
と無機ff微粒子を組み合わせて使用することも可能で
ある。有機物微粒子、無機質微粒子何れの場合も、感光
性樹脂とある程度の光学屈折率の差を有するものである
ことが望ましい、光学屈折率の差が大きいものであれば
少量の添加で大きな効果を得ることができるが、余り光
学屈折率の差が太きいとブラインドスルーホール形状の
制御が非常に難しく現実的でない、このため感光性樹脂
と微粒子の光学屈折率の差は、0.1〜0.7程度であ
ることが望ましい。The reason for using organic particles that have been pre-cured is that if they are not cured, the photosensitive resin
Alternatively, this is because when the resin is added to a solution in which the resin is dissolved using a solvent, it is dissolved in the resin solution. Inorganic fine particles include silica, talc, alumina, titanium oxide,
It is advantageous to use at least one selected from zirconia. Furthermore, it is also possible to use a combination of these organic fine particles and inorganic FF fine particles. In the case of both organic particles and inorganic particles, it is desirable that they have a certain degree of difference in optical refractive index from the photosensitive resin.If the difference in optical refractive index is large, a large effect can be obtained by adding a small amount. However, if the difference in optical refractive index is too large, it is very difficult to control the shape of the blind through hole and it is not practical. Therefore, the difference in optical refractive index between the photosensitive resin and the fine particles is 0.1 to 0.7. It is desirable that the
光散乱性フィラーの配合量は、感光性樹脂と添加する微
粒子との光学屈折率およびブラインドスルーホール形状
のテーパー角度に密接な関係があり一部には規定できな
いが、一般には20〜50%とすることが有利である。The amount of the light-scattering filler is closely related to the optical refractive index of the photosensitive resin and the added fine particles and the taper angle of the blind through hole shape, so it cannot be specified in part, but it is generally 20 to 50%. It is advantageous to do so.
光散乱性フィラーの粒径は0.1μm〜10μmである
ことが好ましい、これは、粒径が108mより大きくな
ると光散乱の程度が不均一になりブラインドスルーホー
ルの形状を正確にコントロールすることができなくなっ
てしまうからである。The particle size of the light-scattering filler is preferably 0.1 μm to 10 μm. This is because if the particle size is larger than 108 m, the degree of light scattering becomes uneven and it is difficult to accurately control the shape of the blind through hole. This is because you will not be able to do it.
さらに望ましくは光散乱性フィラーの粒径は0゜5μm
〜5μmである。More preferably, the particle size of the light scattering filler is 0°5 μm.
~5 μm.
また、本発明で用いられる光散乱性フィラーの少なくと
も一部にクロム酸などの特定の薬液に対して可溶な物を
用いることもできる。このようなフィラーを用いて硬化
形成された絶縁層を特定の薬液で処理することによって
絶縁層表面を札化しm縁面上部に形成される導体回路を
強固に密着させることが可能となる。前記特定の薬液に
対して可溶な光散乱性フィラーとしては、エポキシ樹脂
、ポリエステル樹脂、ビスマレイド−トリアジン樹脂等
の有機物微粒子、シリカ、酸化亜鉛、炭酸カルシウム等
の無機質微粒子があげられる。また、前記特定の薬液と
してはクロム酸、クロム酸塩、過マンガン酸、オゾン等
の酸化性薬液、塩酸、硫酸、硝酸、フッ化水素等の酸、
あるいはアルカリ溶液等が挙げられる。Further, at least a portion of the light-scattering filler used in the present invention may be soluble in a specific chemical solution, such as chromic acid. By treating the insulating layer cured using such a filler with a specific chemical solution, the surface of the insulating layer becomes a tag, and it becomes possible to firmly adhere the conductive circuit formed on the upper edge surface. Examples of the light-scattering filler soluble in the specific chemical solution include organic particles such as epoxy resin, polyester resin, and bismaleide-triazine resin, and inorganic particles such as silica, zinc oxide, and calcium carbonate. In addition, the specific chemicals include oxidizing chemicals such as chromic acid, chromate, permanganic acid, and ozone; acids such as hydrochloric acid, sulfuric acid, nitric acid, and hydrogen fluoride;
Alternatively, an alkaline solution may be used.
塗布の方法としては、例えばローラコート法、デイツプ
コート法、スピナーコート法、カーテンコート法、スク
リーン印刷法など各種の手法を用いることができる。As a coating method, various methods can be used, such as a roller coating method, dip coating method, spinner coating method, curtain coating method, and screen printing method.
前記感光性樹脂を溶解するためにメチルエチルケトン、
セロソルブ、セロソルブアセテート、ジメチルホルムア
ミド、ピロリドン等の溶剤を用いることができる。また
感光性樹脂とフィラーの密着力を高めるためのカップリ
ング剤、塗布性能を改善するための消泡剤、レベリング
剤、その他必要な添加剤を加えることができる。methyl ethyl ketone to dissolve the photosensitive resin;
Solvents such as cellosolve, cellosolve acetate, dimethylformamide, and pyrrolidone can be used. Further, a coupling agent for increasing the adhesion between the photosensitive resin and the filler, an antifoaming agent for improving coating performance, a leveling agent, and other necessary additives can be added.
また、必要に応じて熱硬化型の樹脂を添加しても問題は
ない。Further, there is no problem even if a thermosetting resin is added as necessary.
次いで感光性樹脂に含まれる溶剤を揮発させ、感光性樹
脂の皮膜を形成する。この上部にブラインドスルホール
を形成するためのフォトマスクをおき、前記感光性樹脂
を露光し、次いで現像処理、硬化処理を経て上方に向か
って径がテーパー状に拡大した形状のブラインドスルー
ホールを存する眉間絶縁層を形成する。Next, the solvent contained in the photosensitive resin is evaporated to form a photosensitive resin film. A photomask for forming a blind through hole is placed on top of this, and the photosensitive resin is exposed to light. Then, through development and curing treatment, a blind through hole with a diameter tapered upward is formed between the eyebrows. Form an insulating layer.
硬化した絶縁層上部に導体回路を形成する方法としては
、PVD法、あるいは前記硬化した絶((層を粗化して
アディティブ法で行うことができる。The conductor circuit can be formed on the cured insulating layer by a PVD method or an additive method by roughening the cured insulating layer.
硬化した絶縁層を粗化してアディティブ法で行うことは
生産性、コストの面で非常に有利な方法である。Roughening the cured insulating layer using an additive method is a very advantageous method in terms of productivity and cost.
さらに、前述した工程を繰り返すことにより導体回路と
絶縁層を交互に積層したビルドアンプ法多層配線板を得
る。Further, by repeating the above steps, a build amplifier method multilayer wiring board in which conductor circuits and insulating layers are alternately laminated is obtained.
(実施例)
以下に実施例および比較例を説明するが、本発明はこれ
らに限定されるものではない。また、実施例中の組合を
表すC1″L位記号「部」は重量部を意味する。(Example) Examples and comparative examples will be described below, but the present invention is not limited thereto. In addition, the symbol "parts" in the C1"L position indicating the combination in the examples means parts by weight.
実施例1
1)感光性ポリイミド樹脂(日立化成工業間、商品名:
T−14) ao部、ベンゾグアナミン樹脂微粒子(
日本触媒化学製、商品名:エポスターM、平均粒径2μ
m) 20部を混合したのち、ホモデイスパー攪拌機で
粘度300CPSに11!1整し、次いで3本ロールで
混練して感光性樹脂の溶液を調整した。Example 1 1) Photosensitive polyimide resin (Hitachi Chemical Co., Ltd., trade name:
T-14) ao part, benzoguanamine resin fine particles (
Manufactured by Nippon Shokubai Kagaku, product name: Eposter M, average particle size 2μ
m) After mixing 20 parts, the viscosity was adjusted to 11:1 to 300 CPS using a homodisper stirrer, and then kneaded using three rolls to prepare a photosensitive resin solution.
2)次いで銅張り積層板の表面を常法によりフォトエツ
チングして得られる印刷配線板上に前記感光性樹脂の溶
液をスピンコータを用いて塗布し、水平状態で20分放
置したのち、so’cで指触乾燥させてFJさ約50μ
mの感光性樹脂層を形成した。2) Next, the photosensitive resin solution was applied using a spin coater onto the printed wiring board obtained by photoetching the surface of the copper-clad laminate using a conventional method, and after being left in a horizontal position for 20 minutes, so Let it dry to the touch and FJ approximately 50μ
A photosensitive resin layer of m was formed.
3)次いでこれに100μmΦの黒丸が形成されたフォ
トマスクフィルムを密着させ、ショートアークランプで
450 m j / c +rl露光した。これをN−
メチルピロリドン溶液で現像処理することにより、lO
OμmΦのブラインドスルーホールを形成した0次いで
、超高圧水銀灯で3 J / c rd露光し、さらに
200°Cで1時間加熱処理するこkによりフォトマス
クフィルムに相当する、寸法精度に優れた層間絶縁皮膜
を得た。3) Next, a photomask film on which a black circle of 100 μmΦ was formed was closely attached to this, and exposure was performed at 450 m j / c + rl using a short arc lamp. This is N-
By developing with methylpyrrolidone solution, lO
A blind through hole of 0 μmΦ was formed in the film, which was then exposed to 3 J/crd using an ultra-high pressure mercury lamp and further heat-treated at 200°C for 1 hour, resulting in interlayer insulation with excellent dimensional accuracy equivalent to a photomask film. A film was obtained.
ブラインドスルーホール部分の断面をB察したところ、
ブラインドスルーホールは上方に向かって径がテーパー
状に拡大した形状であり、最上部の径は100μm、最
下部の径は90部mであった。When I looked at the cross section of the blind through hole part, I found that
The blind through hole had a diameter tapered upward, with a diameter of 100 μm at the top and a diameter of 90 μm at the bottom.
なお、本実施例の感光性ポリイミド樹脂の光学的屈折率
は約1.4、ベンゾグアナミン樹脂微粒子の光学的屈折
率は約1.5であった。The optical refractive index of the photosensitive polyimide resin of this example was about 1.4, and the optical refractive index of the benzoguanamine resin particles was about 1.5.
4)ブラインドスルーホールを形成した層間絶縁被膜上
に、銅を蒸着法により20μm析出させ、その後エツチ
ングマスクを常法に従い形成し、回路以外の銅をエツチ
ング除去し配線回路を形成し実施例2
1)タレゾールノボラック型エポキシ樹脂(口本化策製
、商品名: EOCN−104S)の50%アクリル化
物 80部、ビスフェノールA型エポキシ樹脂(油化シ
ェル製、商品名:エビコート3001) 211!、
ペンジルアルキルケクール(チバ・ガイギー製、商品名
コイルガキュアー651) 6部、イミダゾール(四国
化成製、商品名:2部4MH2) 6部、エポキシ樹
脂微粒子(東し製、商品名:トレバール、平均粒径1.
8μm)15部、シリカ微粒子(龍森製、商品名:ク
リスタライト■XX、平均粒径2μm) 40部を混合
したのち、ホモデイスパー攪拌機で粘度600CPSに
調整し、次いで3本ロールで混練して感光性樹脂の溶液
を調整した。4) Copper was deposited to a thickness of 20 μm by vapor deposition on the interlayer insulating film in which the blind through holes were formed, and then an etching mask was formed according to a conventional method, and copper other than the circuit was etched away to form a wiring circuit. Example 2 1 ) 80 parts of 50% acrylic compound of Talesol novolac type epoxy resin (manufactured by Kuchimoto Kasaku, trade name: EOCN-104S), bisphenol A type epoxy resin (manufactured by Yuka Shell, trade name: Ebicoat 3001) 211! ,
Penzyl alkylkecool (manufactured by Ciba Geigy, trade name: Coil Gacure 651) 6 parts, imidazole (manufactured by Shikoku Kasei, trade name: 2 parts 4MH2) 6 parts, epoxy resin fine particles (manufactured by Toshi, trade name: Trevar, Average particle size 1.
After mixing 15 parts of silica fine particles (manufactured by Ryumori Co., Ltd., trade name: Crystallite XX, average particle size 2 μm), the viscosity was adjusted to 600 CPS using a homodisper stirrer, and then kneaded with three rolls and exposed to light. A liquid resin solution was prepared.
2)次いで銅張り積層板の表面を常法によりフォトエツ
チングして得られる印刷配線板上に前記感光性樹脂のt
a液をナイフコータを用いて塗布し、水平状態で20分
放置したのち、70゛Cで指触乾燥させて厚さ約50μ
mの感光性樹脂層を形成した。2) Next, the surface of the copper-clad laminate is photoetched using a conventional method, and the photosensitive resin is applied onto the printed wiring board.
Apply solution A using a knife coater, leave it in a horizontal position for 20 minutes, and dry to the touch at 70°C to a thickness of about 50μ.
A photosensitive resin layer of m was formed.
3)次いでこれに100μmΦの黒丸が形成されたフォ
トマスクフィルムを密着させ、ショートアークランプで
450mj/crrrl光した。これをクロロセン溶液
で現像処理することにより、100μmΦのブラインド
スルーホールを形成した。3) Next, a photomask film on which a black circle of 100 μmΦ was formed was closely attached to this, and light was emitted at 450 mj/crrrl using a short arc lamp. By developing this with a chlorocene solution, a blind through hole with a diameter of 100 μm was formed.
さらに100°Cで1時間、150°Cで10時間加熱
処理することによりフォトマスクフィルムに相当する、
寸法精度に優れた眉間絶縁皮nりを得た。By further heat-treating at 100°C for 1 hour and 150°C for 10 hours, it becomes a photomask film.
A glabellar insulating skin with excellent dimensional accuracy was obtained.
ブラインドスルーホール部分の断面を観察したところ、
ブラインドスルーホールは上方に向かって径がテーパー
状に拡大した形状であり、最上部の径は1100a、最
下部の径は85μmであった。When I observed the cross section of the blind through hole part,
The diameter of the blind through hole was tapered upward, and the diameter at the top was 1100 a and the diameter at the bottom was 85 μm.
なお、本実施例の感光性樹脂マトリックスの光学的屈折
率は約1.45、エポキシ樹脂微粒子の光学的屈折率は
約1.45、シリカ微粒子の光学的屈折率は約1.3で
あった。In this example, the optical refractive index of the photosensitive resin matrix was about 1.45, the optical refractive index of the epoxy resin particles was about 1.45, and the optical refractive index of the silica particles was about 1.3. .
4)この眉間絶縁被膜をクロム酸処理すると、クロム酸
に可溶なエポキシ樹脂お)末が溶解除去されて非常に複
雑な粗化面を形成され、この粗化面上に導体を形成した
場合、非常に高い密着力が得られる0例えば、ブライン
ドスルーホールを形成した!σ間絶縁被膜を、温度70
°C,濃度500g/lのクロム酸で相化し、中和液(
シブレー社製、商品名: PM950)に浸漬して水洗
する。次いで、化学銅めっき前処理としてパラジウム触
媒(シブレー社製、商品名:キャタボジット44)を付
与して表面を・活性化し、下記組成の化学銅めっき液に
15分間浸漬したのち、下記組成の電気銅めっき液によ
り層間絶縁被膜上部に均一に20μmの銅を析出させた
。4) When this insulating film between the eyebrows is treated with chromic acid, the epoxy resin powder that is soluble in chromic acid is dissolved and removed, forming a very complex roughened surface, and when a conductor is formed on this roughened surface. For example, a blind through hole can be formed with very high adhesion! The insulating film between σ and temperature 70
°C, phased with chromic acid at a concentration of 500 g/l, and neutralized solution (
Dip in PM950 (manufactured by Sibley, Inc., product name: PM950) and wash with water. Next, as a chemical copper plating pretreatment, a palladium catalyst (manufactured by Sibley Co., Ltd., trade name: Catabosite 44) was applied to activate the surface, and after immersing it in a chemical copper plating solution with the following composition for 15 minutes, electrolytic copper with the following composition was applied. Copper with a thickness of 20 μm was uniformly deposited on the upper part of the interlayer insulating film using a plating solution.
化学銅めっき液組成
シブレー社製 32BA I2.5%328L
12.5%
328C1,5%
純 水 73.5%温
度 25°C電気銅
めっき液組成
Cu5On ・5oto 150 g
/ 111zS0. 40
g7N” −200ppm
添加剤 所定量
温度 25°C
陰極電流密度 2八/d−友
5)次いでエツチングマスクを常法に従い形成し、回路
以外の銅をエツチング除去し配線回路を形成した。Chemical copper plating solution composition Sibley 32BA I2.5% 328L
12.5% 328C1.5% Pure water 73.5% temperature
Degree 25°C Electrolytic copper plating solution composition Cu5On ・5oto 150 g
/ 111zS0. 40
g7N'' -200ppm Additive Predetermined amount Temperature 25°C Cathode current density 28/d-tomo 5) Next, an etching mask was formed according to a conventional method, and copper other than the circuit was etched away to form a wiring circuit.
比較例1
実施例1の樹脂組成のうち、ベンゾグアナミン樹脂微粒
子を含まない点が異なるだけでその他の条件は同一であ
る。Comparative Example 1 The only difference in the resin composition of Example 1 was that it did not contain benzoguanamine resin fine particles, and the other conditions were the same.
ブラインドスルーホール部分の断面を観察したところ、
ブラインドスルーホール最上部の径は1100a、最下
部の径も100μmであり、垂直に切り立った形状であ
った。When I observed the cross section of the blind through hole part,
The blind through hole had a diameter of 1100 a at the top and a diameter of 100 μm at the bottom, and had a vertical shape.
表1に実施例1.2、比較例におけるブラインドスルー
ホールの接続信頼性の評価結果を示す6表1
−Condition C
(発明の効果)
以上述べたように、本発明方法によれば、ブラインドス
ルーボール断面の形状を容易に上部に拡がったテーパー
状にすることができ、導体回路間の接続信頼性を比較的
容易にしかも置火に確保することができ、さらに作業性
の良いビルドアップ法多層配線板の製造方法を提供する
ことができ、産業上寄与する効果は極めて大きい。Table 1 shows the evaluation results of the connection reliability of blind through holes in Example 1.2 and Comparative Example. The shape of the cross-section of the ball can be easily made into a tapered shape that spreads upward, and the connection reliability between conductor circuits can be ensured relatively easily and easily, and the multi-layer build-up method has better workability. A method for manufacturing a wiring board can be provided, and the effect of contributing to industry is extremely large.
以上that's all
Claims (1)
層に積層されてなる多層配線板の製造方法において、 前記感光性樹脂が、光散乱性のフィラーを含有してなる
ネガ型感光性樹脂であることを特徴とする多層配線板の
製造方法。 2)前記光散乱性のフィラーは、平均粒子径が0.1〜
10μmであることを特徴とする請求項1記載の多層配
線板の製造方法。 3)前記光散乱性のフィラーは、前記感光性樹脂との光
学屈折率の差が0.1〜0.7であることを特徴とする
請求項1記載の多層配線板の製造方法。[Claims] 1) A method for producing a multilayer wiring board in which a conductive circuit and an organic insulating layer made of a photosensitive resin are laminated in multiple layers, wherein the photosensitive resin contains a light-scattering filler. 1. A method for producing a multilayer wiring board, characterized in that the negative photosensitive resin is used as a negative photosensitive resin. 2) The light-scattering filler has an average particle diameter of 0.1 to
2. The method for manufacturing a multilayer wiring board according to claim 1, wherein the thickness is 10 μm. 3) The method of manufacturing a multilayer wiring board according to claim 1, wherein the light-scattering filler has an optical refractive index difference of 0.1 to 0.7 with respect to the photosensitive resin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63252399A JP2517369B2 (en) | 1988-10-06 | 1988-10-06 | Method for manufacturing multilayer wiring board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63252399A JP2517369B2 (en) | 1988-10-06 | 1988-10-06 | Method for manufacturing multilayer wiring board |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP34453295A Division JP2649153B2 (en) | 1995-12-04 | 1995-12-04 | Multilayer wiring board and photosensitive resin insulation |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0298995A true JPH0298995A (en) | 1990-04-11 |
| JP2517369B2 JP2517369B2 (en) | 1996-07-24 |
Family
ID=17236793
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63252399A Expired - Lifetime JP2517369B2 (en) | 1988-10-06 | 1988-10-06 | Method for manufacturing multilayer wiring board |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2517369B2 (en) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06232554A (en) * | 1993-01-29 | 1994-08-19 | Victor Co Of Japan Ltd | Manufacture of multilayer printed wiring board |
| JPH07170070A (en) * | 1993-12-15 | 1995-07-04 | Sony Corp | Method for manufacturing multilayer printed wiring board |
| JPH088536A (en) * | 1994-06-16 | 1996-01-12 | Sony Corp | Method for manufacturing multilayer printed wiring board |
| JP2000068642A (en) * | 1998-08-25 | 2000-03-03 | Fujitsu Ltd | Method for manufacturing multilayer circuit board |
| JP2017118084A (en) * | 2015-12-24 | 2017-06-29 | サムソン エレクトロ−メカニックス カンパニーリミテッド. | Printed circuit board |
| JP2024011061A (en) * | 2022-07-13 | 2024-01-25 | 株式会社村田製作所 | Electronic components, coil components, and methods of manufacturing electronic components |
| JP2024011062A (en) * | 2022-07-13 | 2024-01-25 | 株式会社村田製作所 | Electronic components and electronic component manufacturing methods |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5478989A (en) * | 1977-12-07 | 1979-06-23 | Hitachi Ltd | Manufacture for semiconductor device |
| JPS56147846A (en) * | 1980-04-18 | 1981-11-17 | Matsushita Electric Works Ltd | Photosetting polyester resin composition |
| JPS5862636A (en) * | 1981-09-17 | 1983-04-14 | チバ−ガイギ−・アクチエンゲゼルシヤフト | Photosensitive painting composition and use as protective mask |
| JPS5849702A (en) * | 1981-09-18 | 1983-03-24 | Matsushita Electric Works Ltd | Photo-setting resin composition |
| JPS61121393A (en) * | 1984-11-19 | 1986-06-09 | 旭化成株式会社 | Manufacture of multilayer wiring board |
| JPS61276398A (en) * | 1985-05-31 | 1986-12-06 | 日本電気株式会社 | Multilayer circuit board |
| JPS6220399A (en) * | 1985-07-19 | 1987-01-28 | 株式会社日立製作所 | Formation of multilayer interconnection |
| JPS6286003A (en) * | 1985-10-11 | 1987-04-20 | Tokuyama Soda Co Ltd | Composite composition for photopolymerization |
| JPS62247597A (en) * | 1986-04-19 | 1987-10-28 | 日本電気株式会社 | Structure of insulating layer |
| JPS6317903A (en) * | 1986-07-10 | 1988-01-25 | Nippon Paint Co Ltd | Photo-setting resin composition |
| JPS6318697A (en) * | 1986-07-11 | 1988-01-26 | 日本電気株式会社 | Multilayer interconnection board |
| JPS6351402A (en) * | 1986-08-20 | 1988-03-04 | Nippon Paint Co Ltd | Photo-setting resin composition |
| JPS63126297A (en) * | 1986-11-14 | 1988-05-30 | イビデン株式会社 | Multilayer printed interconnection board and manufacture of the same |
| JPS63126927A (en) * | 1986-11-15 | 1988-05-30 | Asahi Chem Ind Co Ltd | Open and spinning apparatus |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06232554A (en) * | 1993-01-29 | 1994-08-19 | Victor Co Of Japan Ltd | Manufacture of multilayer printed wiring board |
| JPH07170070A (en) * | 1993-12-15 | 1995-07-04 | Sony Corp | Method for manufacturing multilayer printed wiring board |
| JPH088536A (en) * | 1994-06-16 | 1996-01-12 | Sony Corp | Method for manufacturing multilayer printed wiring board |
| JP2000068642A (en) * | 1998-08-25 | 2000-03-03 | Fujitsu Ltd | Method for manufacturing multilayer circuit board |
| JP2017118084A (en) * | 2015-12-24 | 2017-06-29 | サムソン エレクトロ−メカニックス カンパニーリミテッド. | Printed circuit board |
| KR20170076409A (en) * | 2015-12-24 | 2017-07-04 | 삼성전기주식회사 | Printed circuit board |
| JP2024011061A (en) * | 2022-07-13 | 2024-01-25 | 株式会社村田製作所 | Electronic components, coil components, and methods of manufacturing electronic components |
| JP2024011062A (en) * | 2022-07-13 | 2024-01-25 | 株式会社村田製作所 | Electronic components and electronic component manufacturing methods |
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|---|---|
| JP2517369B2 (en) | 1996-07-24 |
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