JPH0310064A - Formation of nitride film - Google Patents

Formation of nitride film

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Publication number
JPH0310064A
JPH0310064A JP14379989A JP14379989A JPH0310064A JP H0310064 A JPH0310064 A JP H0310064A JP 14379989 A JP14379989 A JP 14379989A JP 14379989 A JP14379989 A JP 14379989A JP H0310064 A JPH0310064 A JP H0310064A
Authority
JP
Japan
Prior art keywords
cathode
nitride film
base material
nitrogen gas
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP14379989A
Other languages
Japanese (ja)
Inventor
Koji Okamoto
康治 岡本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nissin Electric Co Ltd
Original Assignee
Nissin Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nissin Electric Co Ltd filed Critical Nissin Electric Co Ltd
Priority to JP14379989A priority Critical patent/JPH0310064A/en
Publication of JPH0310064A publication Critical patent/JPH0310064A/en
Pending legal-status Critical Current

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  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To form a nitride film excellent in surface roughness on the surface of a base material by allowing metallic ions produced from a cathode made of metallic material by means of arc discharge to react with nitrogen gas introduced together with trace amounts of oxygen gas. CONSTITUTION:In a vacuum vessel 1 in which evacuation is exerted via an exhaust hole 2, a cathode 3 composed of metallic material, such as Ti, and a base material 4, such as steel material, fitted on a holder 5 are disposed in a manner to be opposed to each other. Subsequently, arc discharge is produced between the above cathode 3 and the inner wall of the vessel 1 by means of an arc electric power source 6 via a trigger electrode 8, by which the metallic ions of the above metallic material are produced from the cathode 3. The above metallic ions are accelerated by a bias voltage impressed from a bias electric power source 7 on the holder 5. These metallic ions are allowed to react with nitrogen gas fed through a gas-introducing hole 9, by which a nitride film of TiN, etc., is formed on the base material 4. At this time, trace amounts og oxygen gas are introduced together with the above nitrogen gas. By this method, evaporated grains generated from the cathode 3 can be refined, and the surface roughness of the above nitride film can be improved.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、たとえば切削工具など耐摩耗性被覆膜など
として用いられる窒化チタン膜などのような窒化物膜の
形成方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for forming a nitride film such as a titanium nitride film used as a wear-resistant coating film for cutting tools, for example.

〔従来の技術〕[Conventional technology]

第1図は真空アーク蒸着法に用いられる真空アーク放電
型P V D (Physical Vapour D
eposit4on)装置を示す概念図である。排気口
2から図外の真空ポンプなどによって排気された真空容
器1にはガス導入口9から窒素ガスが導入され、そのガ
ス圧が0.5〜505Torrとなるようにされる。真
空容器1内では、窒化物膜を形成すべき基材4がホルダ
5に固定されて配置され、この基材4に対向して前記窒
化物膜を構成するTlなどの金属からなる陰極3が設け
られている。陰極3の近傍にはトリガ電極8が設けられ
ており、このトリガ電極8と陰極3との間にはアーク電
源6からのアーク電圧が印加されている。
Figure 1 shows a vacuum arc discharge type P V D (Physical Vapor D) used in the vacuum arc evaporation method.
FIG. 2 is a conceptual diagram showing an eposit4on) device. Nitrogen gas is introduced from the gas introduction port 9 into the vacuum container 1, which is evacuated from the exhaust port 2 by a vacuum pump (not shown), and the gas pressure is adjusted to 0.5 to 505 Torr. Inside the vacuum container 1, a base material 4 on which a nitride film is to be formed is fixedly placed on a holder 5, and a cathode 3 made of a metal such as Tl that forms the nitride film is placed opposite to this base material 4. It is provided. A trigger electrode 8 is provided near the cathode 3, and an arc voltage from an arc power source 6 is applied between the trigger electrode 8 and the cathode 3.

成膜に当たっては、トリガ電極8を陰極3に接触/離間
させてアーク放電を生じさせ、これによりトリガ電極8
と同電位となっている真空容器lと陰極3との間でのア
ーク放電を起こさせる。このアーク放電により、陰極3
を構成する金属が渾発してイオン化し、このイオン化し
た金属は、陰8iii3とホルダ5との間にバイアス1
ltfi7から与えられたバイアス電圧により加速され
て、基材4の表面に導かれる。このようにして、陰極3
を構成する金属とガス導入口9からの窒素ガスとの反応
を基材4の表面で生じさせることにより、基材4表面に
窒化物膜が形成される。この窒化物膜は、金属イオンが
加速されて基材4の表面に導かれるため、基材4に対し
て良好な密着性ををするものとなり、また高い成膜速度
で形成することができる。
During film formation, the trigger electrode 8 is brought into contact with/separated from the cathode 3 to generate an arc discharge.
An arc discharge is caused between the vacuum vessel l and the cathode 3, which are at the same potential. This arc discharge causes the cathode 3
The metal constituting the ion is ionized, and the ionized metal is transferred to the bias 1 between the negative 8iii3 and the holder 5.
It is accelerated by the bias voltage applied from ltfi7 and guided to the surface of the base material 4. In this way, cathode 3
A nitride film is formed on the surface of the base material 4 by causing a reaction between the metal forming the base material 4 and the nitrogen gas from the gas inlet 9 on the surface of the base material 4 . In this nitride film, metal ions are accelerated and guided to the surface of the base material 4, so that it has good adhesion to the base material 4 and can be formed at a high film formation rate.

〔発明が解決しようとする課題] 陰極3と真空容器1との間でアーク放電が生じる場合、
陰極3の近傍の陰極点と呼ばれる領域で金属が溶融・暴
発するが、この蒸発した金属は大部分は前述のようにイ
オン化する。ところが暴発した金属の中には一部中性原
子が存在し、この中性原子の溶融粒子(ドロップレット
)が基材4方向に飛来して、基材4の表面に付着すると
、基材4表面に形成された窒化物膜表面の粗度が劣化す
る。すなわち前記ドロンブレットの付着により、基材4
の表面には数μm径の粒子が点在することになる。この
ため、基材4がたとえばVTRなどの回転シリンダなど
のように磁気テープなどに摺接して用いられるものなど
である場合には、磁気テープを傷付けることになるなど
の問題が生しることになる。
[Problem to be solved by the invention] When arc discharge occurs between the cathode 3 and the vacuum vessel 1,
Metal melts and explodes in a region called a cathode spot near the cathode 3, and most of this evaporated metal is ionized as described above. However, some neutral atoms are present in the exploded metal, and when these molten particles (droplets) of neutral atoms fly in the direction of the base material 4 and adhere to the surface of the base material 4, the base material 4 The roughness of the nitride film formed on the surface deteriorates. In other words, due to the adhesion of the drone bullet, the base material 4
Particles with a diameter of several μm are scattered on the surface. Therefore, if the base material 4 is used in sliding contact with a magnetic tape, such as a rotating cylinder of a VTR, problems such as damage to the magnetic tape may occur. Become.

この発明の目的は、表面粗度が格段に向上されるように
して良好な窒化物膜の形成が行われるようにした窒化物
膜の形成方法を提供することである。
An object of the present invention is to provide a method for forming a nitride film in which a good nitride film can be formed by significantly improving the surface roughness.

〔課題を解決するための手段〕[Means to solve the problem]

この発明では、前述の第1図に示した構成による真空ア
ーク蒸着法において、ガス導入口9からは窒素ガスとと
もに酸素ガスが導入される。
In the present invention, in the vacuum arc evaporation method using the configuration shown in FIG. 1, oxygen gas is introduced from the gas inlet 9 together with nitrogen gas.

〔作用〕[Effect]

第1図に示された構成によって、陰極3からの金属材料
の蒸着中に、真空容器l内にA、rやHeなどの不活性
ガス、窒素ガス、または酸素ガスなどを適量導入すると
、この導入されたガスにより陰極3の表面が汚染され、
これにより陰極3を構成する金属材料の仕事関数が低下
してアーク放電が生じ易くなる。このため、陰極3では
、ガスを導入しない場合に比較して陰極点の数が多くな
り、これによって陰極点1個当たりの電流が小さくなる
。これにより蒸発する粒子の大きさが小さくなることに
なる。この結果、基材4表面に付着するドロップレット
の大きさが小さくなり、基材4表面の窒化物膜の表面の
粗度が向上される。
With the configuration shown in FIG. 1, if an appropriate amount of inert gas such as A, R, or He, nitrogen gas, or oxygen gas is introduced into the vacuum vessel l during the vapor deposition of the metal material from the cathode 3, this The surface of the cathode 3 is contaminated by the introduced gas,
As a result, the work function of the metal material constituting the cathode 3 decreases, making arc discharge more likely to occur. Therefore, in the cathode 3, the number of cathode spots is increased compared to the case where no gas is introduced, and the current per cathode spot is thereby reduced. This will reduce the size of the evaporated particles. As a result, the size of droplets adhering to the surface of the base material 4 is reduced, and the surface roughness of the nitride film on the surface of the base material 4 is improved.

このような効果は、真空容器lに導入されるガスの種類
により異なるのであるが、窒素ガスとともに1Mff1
の酸素ガスを導入した場合に著しいことが本件発明者に
よって見出されている。すなわち、真空容器l内に窒素
ガスとともに酸素ガスを導入することにより、基材4の
表面に良好な窒化物膜を形成させることができる。
Although this effect differs depending on the type of gas introduced into the vacuum vessel l, it is
The inventor of the present invention has found that this is remarkable when oxygen gas of That is, by introducing oxygen gas together with nitrogen gas into the vacuum container 1, a good nitride film can be formed on the surface of the base material 4.

上記窒素ガスとともに導入される酸素ガスが多量である
場合には、基材4の表面に形成される膜は酸素を多く含
んだものとなり、また陰極3が酸素を吸収して絶縁物化
し、安定したアーク放電を行わせることができなくなる
という問題が生じる。
If a large amount of oxygen gas is introduced together with the nitrogen gas, the film formed on the surface of the base material 4 will contain a large amount of oxygen, and the cathode 3 will absorb oxygen and become an insulator, making it stable. A problem arises in that it is no longer possible to cause arc discharge to occur.

また、酸素ガスが少ない場合には、基材4表面に付着す
るドロンプレットの大きさを充分に小さくすることがで
きなくなり、窒化物膜の表面粗度を充分に良好なものと
することができない。
In addition, when oxygen gas is low, it is not possible to sufficiently reduce the size of the Droplet adhering to the surface of the base material 4, and the surface roughness of the nitride film cannot be made sufficiently good. .

このような理由から、真空容器lに導入される酸素ガス
の流量は、窒素ガスおよび酸素ガスの各分圧をそれぞれ
Put、  Po、とした場合に、PMt≧5 X 1
0−’Torr であって、酸素ガスの分圧POzがlXl0−’〜l 
X 10−”Torrの範囲であり、かつP () z
 < K P di なる条件が満たされることが好ましい。
For this reason, the flow rate of oxygen gas introduced into the vacuum container l is as follows: PMt≧5×1, where the partial pressures of nitrogen gas and oxygen gas are respectively Put and Po.
0-'Torr, and the partial pressure POz of oxygen gas is lXl0-'~l
X 10-”Torr, and P () z
It is preferable that the condition <K P di is satisfied.

〔実施例〕〔Example〕

第1図に示すPVD装置により、下記の条件で基材表面
に窒化チタン膜を成膜した。
A titanium nitride film was formed on the surface of the base material using the PVD apparatus shown in FIG. 1 under the following conditions.

陰極 :Tl 基材 :  5KH51(千Uチン系高速度工具鋼鋼材
)(表面粗さR□80.2μm) ガス圧カニ  l X I Q−’〜3 X I 0−
3Torrアーク電流:60A バイアス電圧ニー2oov 膜厚:lIIm このような条件下で、窒素ガスの分圧P W zと酸素
ガスの分圧Po、とを変化させて成膜を行った場合の、
基材表面の粗度の測定結果が第2図に示されている。こ
の第2図において、表面粗さに関しては、シンボル’O
Jが最大高さR□8が0,5μm以下であることを示し
、シンボル「Δ」がR1、が1〜34mであることを示
している。またシンボル「・」は形成された膜がチタン
の酸化物が主体の膜であったことを示し、シンボル「×
」は真空容器1と陰極3との間のアーク放電が安定に行
えなかったことを示している。
Cathode: Tl Base material: 5KH51 (1,000 U tin-based high-speed tool steel) (Surface roughness R□80.2 μm) Gas pressure crab l X I Q-' ~ 3 X I 0-
3Torr arc current: 60A Bias voltage knee 2oov Film thickness: lIIm When film formation is performed by changing the partial pressure P W z of nitrogen gas and the partial pressure Po of oxygen gas under these conditions,
The measurement results of the roughness of the base material surface are shown in FIG. In this Figure 2, regarding surface roughness, symbol 'O
J indicates that the maximum height R□8 is 0.5 μm or less, and symbol “Δ” indicates that R1 is 1 to 34 m. In addition, the symbol "・" indicates that the film formed was mainly composed of titanium oxide, and the symbol "×"
" indicates that the arc discharge between the vacuum vessel 1 and the cathode 3 could not be stably performed.

この第2図に示された測定結果から、第2図において二
点鎖線で囲まれた領域Sでは表面粗度の良好な窒化チタ
ン膜が形成されることが理解される。すなわち、窒素ガ
スの分圧P//2が5X10−’Torr以上で、かつ
酸素ガスの分圧PO2がl X 10−’〜I X 1
0−”Torrの範囲であり、かつP Oz < +/
2P M 2 である場合には窒化チタンを生体とした良好な窒化チタ
ン膜が形成される。
From the measurement results shown in FIG. 2, it is understood that a titanium nitride film with good surface roughness is formed in the region S surrounded by the two-dot chain line in FIG. That is, the partial pressure P//2 of nitrogen gas is 5X10-'Torr or more, and the partial pressure PO2 of oxygen gas is lX10-'~IX1
0-”Torr, and P Oz < +/
In the case of 2P M 2 , a good titanium nitride film is formed using titanium nitride as a living body.

なお、第2図の領域Sにおける膜は、真空容器1内に窒
素ガスのみを導入した場合に比較して色調がやや褐色で
あり、かつ膜中に比較的多くの酸素が含有されており、
その硬さは化学量論組成がTiNである膜と同程度であ
る。
The film in region S in FIG. 2 is slightly browner in color than when only nitrogen gas is introduced into the vacuum vessel 1, and contains a relatively large amount of oxygen.
Its hardness is comparable to that of a film whose stoichiometric composition is TiN.

〔発明の効果〕〔Effect of the invention〕

以上のようにこの発明の窒化物膜の形成方法によれば、
表面粗度が格段に向上された、すなわち表面が滑らかな
良好な窒化物膜を基材表面に形成することができるよう
になる。これによって、たとえば窒化物膜で被覆した基
材が磁気テープなどに摺接する部材などとして用いられ
る場合などには、磁気テープに損傷を与えることが防が
れる。
As described above, according to the method for forming a nitride film of the present invention,
A good nitride film with significantly improved surface roughness, that is, a smooth surface, can be formed on the surface of the base material. This prevents damage to the magnetic tape, for example, when the base material coated with the nitride film is used as a member that comes into sliding contact with a magnetic tape or the like.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は真空アーク放電型PVD装置の基本的な構成を
示す概念図、第2図はこの発明の一実施例に従って形成
した窒化チタン膜の表面粗度と窒素ガスおよび酸素ガス
の各分圧との関係を示す図である。 1・・・真空容器、3・・・陰極、4・・・基材、9・
・・ガス導入口
Fig. 1 is a conceptual diagram showing the basic configuration of a vacuum arc discharge type PVD apparatus, and Fig. 2 shows the surface roughness of a titanium nitride film formed according to an embodiment of the present invention and the partial pressures of nitrogen gas and oxygen gas. FIG. DESCRIPTION OF SYMBOLS 1... Vacuum container, 3... Cathode, 4... Base material, 9...
・・Gas inlet

Claims (1)

【特許請求の範囲】  真空容器と金属材料で構成した陰極との間のアーク放
電により、前記陰極から前記金属材料の金属イオンを生
じさせ、この金属イオンと前記真空容器内に導入した窒
素ガスとの反応により基材表面に前記金属材料の窒化物
膜を形成させる窒化物膜の形成方法において、 前記真空容器内に窒素ガスとともに酸素ガスを導入する
ことを特徴とする窒化物膜の形成方法。
[Claims] Metal ions of the metal material are generated from the cathode by arc discharge between a vacuum container and a cathode made of a metal material, and the metal ions and the nitrogen gas introduced into the vacuum container are combined with each other. A method for forming a nitride film in which a nitride film of the metal material is formed on the surface of a substrate by the reaction described above, the method comprising: introducing oxygen gas together with nitrogen gas into the vacuum container.
JP14379989A 1989-06-05 1989-06-05 Formation of nitride film Pending JPH0310064A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14379989A JPH0310064A (en) 1989-06-05 1989-06-05 Formation of nitride film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14379989A JPH0310064A (en) 1989-06-05 1989-06-05 Formation of nitride film

Publications (1)

Publication Number Publication Date
JPH0310064A true JPH0310064A (en) 1991-01-17

Family

ID=15347252

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14379989A Pending JPH0310064A (en) 1989-06-05 1989-06-05 Formation of nitride film

Country Status (1)

Country Link
JP (1) JPH0310064A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101676389B1 (en) * 2015-12-18 2016-11-18 김강민 Cap with a built-in ventilation device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101676389B1 (en) * 2015-12-18 2016-11-18 김강민 Cap with a built-in ventilation device

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