JPH03106459U - - Google Patents
Info
- Publication number
- JPH03106459U JPH03106459U JP1990013090U JP1309090U JPH03106459U JP H03106459 U JPH03106459 U JP H03106459U JP 1990013090 U JP1990013090 U JP 1990013090U JP 1309090 U JP1309090 U JP 1309090U JP H03106459 U JPH03106459 U JP H03106459U
- Authority
- JP
- Japan
- Prior art keywords
- lever
- conductive material
- contact needle
- supported
- solenoid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004973 liquid crystal related substance Substances 0.000 claims description 3
- 239000000523 sample Substances 0.000 claims description 3
- 239000010409 thin film Substances 0.000 claims description 3
- 239000004020 conductor Substances 0.000 claims 3
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Description
第１図は本考案の、第２図は従来の、それぞれ
液晶回路基板検査用プローブを示す側面図である
。
１……接触針、２……針ホルダ、３……板ばね
、４……支持部、５……螺子孔、６……調整螺子
、７……圧縮ばね、８……レバー、９……薄膜、
１０……磁性体、１１……ソレノイド。
FIG. 1 is a side view of a liquid crystal circuit board inspection probe according to the present invention, and FIG. 2 is a conventional probe for inspecting a liquid crystal circuit board. DESCRIPTION OF SYMBOLS 1... Contact needle, 2... Needle holder, 3... Leaf spring, 4... Support part, 5... Screw hole, 6... Adjustment screw, 7... Compression spring, 8... Lever, 9... thin film,
10...Magnetic material, 11...Solenoid.
Claims (1)
れたレバーと、このレバーの先端部に支持された
、導電材製の接触針と、上記レバーの表面で、ピ
ボツト機構部分と接触針との間部分にコーテイン
グされた導電材製の薄膜と、上記レバーの基端部
に支持された磁性体と、この磁性体の周囲を囲ん
だ状態で設けられ、通電に基づいて上記接触針を
下方に移動させる方向にレバーを揺動させるソレ
ノイドと、このソレノイドに印加する電圧を制御
する制御器とから成る、液晶回路基板検査用プロ
ーブ。 A lever whose middle part is swingably supported by a pivot mechanism, a contact needle made of a conductive material supported at the tip of this lever, and a surface of the lever between the pivot mechanism part and the contact needle. A thin film made of a conductive material is coated on the lever, a magnetic body is supported at the base end of the lever, and the magnetic body is surrounded by a thin film made of a conductive material, and the contact needle is moved downward based on energization. This probe for inspecting liquid crystal circuit boards consists of a solenoid that swings a lever in the direction in which the lever is moved, and a controller that controls the voltage applied to the solenoid.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990013090U JPH0745019Y2 (en) | 1990-02-15 | 1990-02-15 | Liquid crystal circuit board inspection probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1990013090U JPH0745019Y2 (en) | 1990-02-15 | 1990-02-15 | Liquid crystal circuit board inspection probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03106459U true JPH03106459U (en) | 1991-11-01 |
| JPH0745019Y2 JPH0745019Y2 (en) | 1995-10-11 |
Family
ID=31504096
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1990013090U Expired - Lifetime JPH0745019Y2 (en) | 1990-02-15 | 1990-02-15 | Liquid crystal circuit board inspection probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0745019Y2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006258774A (en) * | 2005-03-18 | 2006-09-28 | Fujitsu Ltd | Four-probe probe head and method for evaluating semiconductor characteristics |
-
1990
- 1990-02-15 JP JP1990013090U patent/JPH0745019Y2/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006258774A (en) * | 2005-03-18 | 2006-09-28 | Fujitsu Ltd | Four-probe probe head and method for evaluating semiconductor characteristics |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0745019Y2 (en) | 1995-10-11 |
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