JPH0311434B2 - - Google Patents
Info
- Publication number
- JPH0311434B2 JPH0311434B2 JP56151626A JP15162681A JPH0311434B2 JP H0311434 B2 JPH0311434 B2 JP H0311434B2 JP 56151626 A JP56151626 A JP 56151626A JP 15162681 A JP15162681 A JP 15162681A JP H0311434 B2 JPH0311434 B2 JP H0311434B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- circuit
- low frequency
- bridge circuit
- detection section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 16
- 238000000034 method Methods 0.000 claims description 9
- 238000010008 shearing Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 9
- 238000000691 measurement method Methods 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000001939 inductive effect Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000005674 electromagnetic induction Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56151626A JPS5853768A (ja) | 1981-09-25 | 1981-09-25 | 誘電正接測定方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56151626A JPS5853768A (ja) | 1981-09-25 | 1981-09-25 | 誘電正接測定方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5853768A JPS5853768A (ja) | 1983-03-30 |
| JPH0311434B2 true JPH0311434B2 (de) | 1991-02-15 |
Family
ID=15522650
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56151626A Granted JPS5853768A (ja) | 1981-09-25 | 1981-09-25 | 誘電正接測定方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5853768A (de) |
-
1981
- 1981-09-25 JP JP56151626A patent/JPS5853768A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5853768A (ja) | 1983-03-30 |
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