JPH0315121B2 - - Google Patents
Info
- Publication number
- JPH0315121B2 JPH0315121B2 JP7368284A JP7368284A JPH0315121B2 JP H0315121 B2 JPH0315121 B2 JP H0315121B2 JP 7368284 A JP7368284 A JP 7368284A JP 7368284 A JP7368284 A JP 7368284A JP H0315121 B2 JPH0315121 B2 JP H0315121B2
- Authority
- JP
- Japan
- Prior art keywords
- film thickness
- eddy current
- current displacement
- measurement
- tatsuchiroll
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000006073 displacement reaction Methods 0.000 claims description 11
- 238000005259 measurement Methods 0.000 claims description 9
- 239000003973 paint Substances 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims 2
- 239000004020 conductor Substances 0.000 description 3
- 238000013459 approach Methods 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 238000012886 linear function Methods 0.000 description 1
Landscapes
- Coating Apparatus (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Description
【発明の詳細な説明】
本装置は渦電流型変位計を応用して塗料の膜厚
を精度よく測定する装置である。DETAILED DESCRIPTION OF THE INVENTION This device is a device that accurately measures the film thickness of paint by applying an eddy current displacement meter.
渦電流型変位計の原理は、高周波電流の流れて
いるコイルに導体が近づくと導体内に渦電流が発
生し、之により発生する磁束でコイルのインピー
ダンスは実効的に減少する。このコイルのインピ
ーダンスの変化を利用してコイルと導体間の変位
を測定するものである。 The principle of an eddy current displacement meter is that when a conductor approaches a coil through which a high-frequency current is flowing, an eddy current is generated within the conductor, and the resulting magnetic flux effectively reduces the impedance of the coil. This change in impedance of the coil is used to measure the displacement between the coil and the conductor.
従来、この渦電流変位計を応用して、第１図に
示すようなタツチロール方式の塗料の膜厚測定装
置がある。前記渦電流変位計はその測定原理上、
被測定物の材質、温度により出力が変化し測定誤
差となる。又タツチロール方式塗料膜厚測定装置
では、タツチロールの摩耗が測定誤差となる。更
に詳述すると、渦電流変位計はその測定原理上
(1) 被測定物の材質により、変位〜出力特性が変
化する。その材質の相異による出力変化の例が
第２図に示される。 Conventionally, there has been a Tatsuchiroll-type paint film thickness measuring device as shown in FIG. 1, which is an application of this eddy current displacement meter. The eddy current displacement meter has the following principles in its measurement principle:
The output changes depending on the material and temperature of the object to be measured, resulting in measurement errors. In addition, in the Tatsuchiroll type paint film thickness measuring device, wear of the Tatsuchiroll causes measurement errors. To explain in more detail, the measurement principles of the eddy current displacement meter are as follows: (1) Displacement-output characteristics vary depending on the material of the object to be measured. An example of output changes due to differences in materials is shown in FIG.
(2) 温度により変位〜出力特性が変化する。その
温度特性が第３図に示される。(2) Displacement and output characteristics change depending on temperature. Its temperature characteristics are shown in FIG.
このように何れにも測定誤差の要因がある。
次に従来のタツチロール方式渦電流膜厚計の原
理を第１図によつて説明すると、第１図に於け
るl1は変位計で測定し、l2はタツチロールの外
径とセンサー位置の相対位置から決まり、一定
値である。従つて膜厚をｔとするとｔは下記第
(1)式より求められる。 In this way, there are factors that cause measurement errors in both cases.
Next, the principle of the conventional Tatsuchi Roll type eddy current film thickness meter will be explained with reference to Figure 1. In Figure 1, l 1 is measured by a displacement meter, and l 2 is the relative distance between the outer diameter of the Tatsuchi Roll and the sensor position. It is determined from the position and is a constant value. Therefore, if the film thickness is t, then t is
It is obtained from equation (1).
ｔ＝l1−l2 …(1)
(3) このようなタツチロール方式の膜厚計はタツ
チロールが被測定物と接触するため、長時間使
用すればタツチロールが摩耗し、上記第(1)式の
l1が変化し、また測定誤差となるのである。 t=l 1 -l 2 ...(1) (3) Since the Tatsuchiroll type film thickness meter comes into contact with the object to be measured, if it is used for a long time, the Tatsuchiroll will wear out, and the above formula (1) of
l 1 changes, which also causes a measurement error.
本発明の目的は、前記したような従来の３つの
問題点を解決する装置を提供するものである。 An object of the present invention is to provide a device that solves the three conventional problems as described above.
以下、本発明を添付図面の第４図、第５図に示
す実施例をもとに説明すると、第２図からわかる
ように渦電流変位計の出力ｆ（ｌ）は下記の第(2)
式に示す指数関係で近似できる。（測定範囲を小
さくすれば１次関数でも可能である。）
ｆ（ｌ）＝c0eci Hereinafter, the present invention will be explained based on the embodiment shown in FIGS. 4 and 5 of the attached drawings. As can be seen from FIG. 2, the output f(l) of the eddy current displacement meter is
It can be approximated by the exponential relationship shown in the formula. (A linear function is also possible if the measurement range is made smaller.) f(l)=c 0 e ci
Claims (1)
料の膜厚を連続的に測定する装置において、４ケ
の渦電流変位計を有し、各々の測定値より金属の
材質と、測定時の温度とにより定まる２つの定数
項と、前記膜厚測定装置タツチロールの摩耗量
と、塗料膜厚と、を演算する演算装置及び演算結
果を表示する表示装置を有することを特徴とした
膜厚測定装置。1 A device that continuously measures the film thickness of paint applied to a metal surface using an eddy current displacement meter.It has four eddy current displacement meters, and the material of the metal and the measurement can be determined from each measurement value. The film thickness is characterized by having a calculation device that calculates two constant terms determined by the temperature at the time, the wear amount of the film thickness measuring device Tatsuchiroll, and the paint film thickness, and a display device that displays the calculation results. measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7368284A JPS60128302A (en) | 1984-04-12 | 1984-04-12 | Film thickness measuring device of paint |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7368284A JPS60128302A (en) | 1984-04-12 | 1984-04-12 | Film thickness measuring device of paint |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60128302A JPS60128302A (en) | 1985-07-09 |
| JPH0315121B2 true JPH0315121B2 (en) | 1991-02-28 |
Family
ID=13525225
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7368284A Granted JPS60128302A (en) | 1984-04-12 | 1984-04-12 | Film thickness measuring device of paint |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60128302A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6719906B2 (en) * | 2016-01-08 | 2020-07-08 | 株式会社東京精密 | Eddy current sensor and tool holder mounting state detection device including the same |
-
1984
- 1984-04-12 JP JP7368284A patent/JPS60128302A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60128302A (en) | 1985-07-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3936734A (en) | Method for contactless measurement of conductivity and/or temperature on metals by means of eddy currents | |
| US6120833A (en) | Method and device for measuring the thickness of an insulating coating | |
| JPS62137537A (en) | Sample temperature measuring apparatus for viscosity measuring device | |
| KR860003492A (en) | Method and device for measuring thickness of thin metal film deposited on conductive support | |
| Leclercq et al. | Apparatus for simultaneous temperature and heat‐flow measurements under transient conditions | |
| US3855522A (en) | Electromagnetic type measuring apparatus for digitally measuring electric conductivity | |
| US2703384A (en) | Apparatus for measuring the thickness of nonmagnetic coatings on magnetic material | |
| US20070229064A1 (en) | Motion transducer for motion related to the direction of the axis of an eddy-current displacement sensor | |
| JPH0315121B2 (en) | ||
| JPS6166104A (en) | Method for measuring thickness of thin metal film | |
| US2827609A (en) | Magnetic bridge gauge | |
| JPS6023738Y2 (en) | magnetic field detector | |
| JPS60131404A (en) | Measuring device for film thickness | |
| JPS5757204A (en) | Method of measuring thickness of film formed on surface of ferromagnetic substance | |
| JPS63169513A (en) | Coating film thickness measuring instrument | |
| JPS5575608A (en) | Film thickness measuring unit | |
| JPS57192872A (en) | Eddy current type flow velocity meter | |
| JPS609697Y2 (en) | Continuous induction liquid level gauge | |
| JPS5825286Y2 (en) | Jisei Souken Shiyutsuki | |
| KR100415922B1 (en) | Non-magnetic coating layer thickness calibration method using magnetic induction sensor | |
| JPH022085B2 (en) | ||
| JPH0552470B2 (en) | ||
| JPH0323872B2 (en) | ||
| JPH05280921A (en) | Section measuring device of steel material | |
| SU1179096A2 (en) | Thickness gauge for dielectric coatings |