JPH0317274A - Film formation - Google Patents
Film formationInfo
- Publication number
- JPH0317274A JPH0317274A JP14506790A JP14506790A JPH0317274A JP H0317274 A JPH0317274 A JP H0317274A JP 14506790 A JP14506790 A JP 14506790A JP 14506790 A JP14506790 A JP 14506790A JP H0317274 A JPH0317274 A JP H0317274A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic field
- substrate
- film
- gas
- microwaves
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000015572 biosynthetic process Effects 0.000 title description 5
- 239000000758 substrate Substances 0.000 claims abstract description 31
- 230000005684 electric field Effects 0.000 claims abstract description 20
- 229910003460 diamond Inorganic materials 0.000 claims abstract description 10
- 239000010432 diamond Substances 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims description 12
- 230000003993 interaction Effects 0.000 claims description 8
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 abstract description 4
- HSFWRNGVRCDJHI-UHFFFAOYSA-N alpha-acetylene Natural products C#C HSFWRNGVRCDJHI-UHFFFAOYSA-N 0.000 abstract description 2
- 125000002534 ethynyl group Chemical group [H]C#C* 0.000 abstract description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 abstract 2
- 239000010408 film Substances 0.000 description 32
- 239000007789 gas Substances 0.000 description 15
- 239000010409 thin film Substances 0.000 description 9
- 229910052799 carbon Inorganic materials 0.000 description 7
- 238000000576 coating method Methods 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 4
- 238000005530 etching Methods 0.000 description 4
- 238000010438 heat treatment Methods 0.000 description 4
- 125000004432 carbon atom Chemical group C* 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 3
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 3
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 125000001475 halogen functional group Chemical group 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 2
- 229910010271 silicon carbide Inorganic materials 0.000 description 2
- 241000894007 species Species 0.000 description 2
- 229910000951 Aluminide Inorganic materials 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 241001364096 Pachycephalidae Species 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910021529 ammonia Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 238000005094 computer simulation Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 235000012489 doughnuts Nutrition 0.000 description 1
- 238000002003 electron diffraction Methods 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- UIUXUFNYAYAMOE-UHFFFAOYSA-N methylsilane Chemical compound [SiH3]C UIUXUFNYAYAMOE-UHFFFAOYSA-N 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 229910021332 silicide Inorganic materials 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000002230 thermal chemical vapour deposition Methods 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Chemical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
(発明の利用分野)
本発明はマイクロ波電界を加えるとともに、外部磁場を
加え、それらの相互作用を用い、かつその電界の最も大
きい空間に被膜形成手段を設け、被膜形成を行うための
薄膜形成装置および形成方法に関する。Detailed Description of the Invention (Field of Application of the Invention) The present invention applies a microwave electric field and an external magnetic field, utilizes their interaction, and provides a film forming means in the space where the electric field is largest. The present invention relates to a thin film forming apparatus and a forming method.
〔従来の技術]
従来、′a膜の形戊手段としてVr.CR (電子サイ
クロ1・ロン共鳴)を用い、その発11k Ji kA
を利用してこの共鳴空間より「離れた位置Jに基板を配
設し、そこでの被膜特にアモルファス構造を有する被膜
を形成する方法が知られている。[Prior Art] Conventionally, Vr. Using CR (electron cyclo1-ron resonance), its emission 11k Ji kA
A method is known in which a substrate is disposed at a position J distant from this resonance space by utilizing the resonance space, and a film, particularly a film having an amorphous structure, is formed there.
さらに一般的にはかかるECR CVD(化学気相法)
に加えて、反応性ガスを用いる被膜形成手段として数種
類知られており、それらは熱CVD 、加熱フィラメン
トCVO、化学輸送法、13.56MI+,の周波数を
用いるプラズマCVD法、マイクロ波のみを用いるプラ
ズマC’i’D法が知られている。特にHCR CVt
l法は活性種を磁場によりビンチングし、高エネルギ化
することにより電子エネルギを大きくし、効率よく気体
をプラズマ化させている。しかしプラズマ化させること
により、気体が有する高エネルギにより基板の被形成面
がスバツタ(損傷)を受けることを防ぐため、このEC
R条件を満たした空間より「離れた位置」に基板を配設
し、高エネルギ条件下でのプラズマ状態を避けたイオン
シャワー化した反応性気体を到達させることにより被膜
形成または異方性エッチングを行っていた。More generally, such ECR CVD (chemical vapor deposition method)
In addition, several methods of film formation using reactive gases are known, including thermal CVD, heated filament CVO, chemical transport, plasma CVD using a frequency of 13.56 MI+, and plasma using only microwaves. The C'i'D method is known. Especially HCR CVt
In the I method, activated species are binned using a magnetic field to increase the energy, thereby increasing the electron energy and efficiently converting the gas into plasma. However, in order to prevent the formation surface of the substrate from being damaged due to the high energy of the gas, this EC
Film formation or anisotropic etching is performed by arranging the substrate at a "remote position" from the space that satisfies the R condition and delivering reactive gas in the form of an ion shower that avoids a plasma state under high energy conditions. I was going.
しかしかかるシャワー化した反応性気体を用いた被膜形
威方法では、その気体の種類により異方性エッチングま
たはアモルファス構造の被膜形戊等のエッチングまたは
ディボジッションのいずれか一方のプロセスのみを採用
したものであった。However, in such a film formation method using a shower of reactive gas, only one of the processes of anisotropic etching, etching or deposition of an amorphous structure film, etc., is adopted depending on the type of gas. It was something.
そのため、この場合の被形成面上にはアモルファス構造
の被膜が形成されやすく、結晶性特に多結晶性または単
結晶を有する被膜の形成はきわめて困難であった。加え
て高いエネルギを用いることにより、初めて反応性気体
の活性化または反応をさせ得る被膜形成も不可能であっ
た。Therefore, in this case, a coating having an amorphous structure is likely to be formed on the surface to be formed, and it is extremely difficult to form a coating having crystallinity, particularly polycrystalline or single crystal. In addition, by using high energy, it was also impossible to form a film that could activate or react reactive gases for the first time.
本発明は被膜形成をその一部でエッチングをさせつつ被
膜形成を行わんとするもので、好ましくは少なくとも一
部に結晶性を有する被膜を形威せんとするものである。The present invention aims to form a film by etching a part of the film, and preferably forms a film having crystallinity in at least a part thereof.
この目的のため、マイクロ波電力の電界強度が最も大き
くなる領域に被形成面を有する基板を配設する。さらに
その領域で電場・磁場相互作用を有せしめる。例えば、
ECR (電子サイクロトロン共鳴)を生せしめる。さ
らにルR場の強度程度を調整すると、この領域において
のみ初めて分解または反応をさせることができる被膜形
成が可能となる。例えば、i一カーボン(ダイヤモンド
または微結晶粒を有する炭素被M)また高融点の金属ま
たはセラミック性絶縁被膜である。For this purpose, a substrate having a surface to be formed is disposed in a region where the electric field strength of microwave power is greatest. Furthermore, electric field/magnetic field interaction is created in that region. for example,
Generates ECR (Electron Cyclotron Resonance). Furthermore, by adjusting the intensity of the R field, it becomes possible to form a film that can undergo decomposition or reaction for the first time only in this region. Examples include i-carbon (diamond or carbon coatings with microcrystalline grains) or high-melting metal or ceramic insulating coatings.
すなわち本発明は従来より知られたマイクロ波を用いた
プラズマCvD法に磁場の力を加え、さらにマイクロ波
の電場と磁場との相互作用、好ましくはECR (エレ
クトロンサイクロトロン共鳴)条件又はホイッスラー共
鳴条件を含む相互作用を利用して、幅広い圧力範囲にお
いて高密度高エネルギのプラズマを発生させる。その共
鳴空間での高エネルギ状態を利用して、例えば活性炭素
原子を多量に発生させ、再現性にすぐれ、均一な膜厚、
均質な特性のダイヤモンド、i一カーボン膜等の被膜の
形成を可能としたものである.また加える磁場の強さを
任意に変更可能な為、電子のみではなく特定のイオンの
ECR条件を設定することができる特徴がある。That is, the present invention adds the force of a magnetic field to the conventionally known plasma CvD method using microwaves, and further improves the interaction between the electric field of the microwave and the magnetic field, preferably ECR (electron cyclotron resonance) conditions or Whistler resonance conditions. Using these interactions, high-density, high-energy plasma is generated over a wide pressure range. Utilizing the high energy state in the resonance space, for example, a large amount of activated carbon atoms can be generated, resulting in excellent reproducibility, uniform film thickness, and
This makes it possible to form diamond, i-carbon, and other films with uniform properties. Furthermore, since the strength of the applied magnetic field can be changed arbitrarily, it is possible to set ECR conditions not only for electrons but also for specific ions.
また本発明の構成に付加して、マイクロ波と磁場との相
互作用により高密度プラズマを発生させた後、基板表面
上まで至る間に高エネルギを持つ光(例えば紫外光)を
照射し、活性種にエネルギを与えつづけると、高密度プ
ラズマ発生領域より十分離れた位置においても高エネル
ギ状態に励起された炭素原子が存在し、より大面積にダ
イヤモンド、i一カーボン膜を形成することも可能であ
った。Additionally, in addition to the structure of the present invention, after high-density plasma is generated by the interaction of microwaves and a magnetic field, high-energy light (for example, ultraviolet light) is irradiated while reaching the substrate surface to activate the plasma. If energy is continued to be applied to the seeds, carbon atoms excited to a high energy state will exist even at a location sufficiently far away from the high-density plasma generation region, making it possible to form a diamond or i-carbon film over a larger area. there were.
さらに磁場とマイクロ波の相互作用により発生する高エ
ネルギ励起種に直流バイアス電圧を加えて、基板側に多
量の励起子が到達するようにすることは薄膜の形威速度
を向上させる効果があった.以下に実施例を示し、さら
に本発明を説明する。Furthermore, applying a DC bias voltage to high-energy excited species generated by the interaction of a magnetic field and microwaves, so that a large number of excitons reach the substrate side, had the effect of improving the forming speed of the thin film. .. Examples will be shown below to further explain the present invention.
第1図に本発明にて用いた磁場印加可能なマイクロ波プ
ラズマCVD装置を示す。FIG. 1 shows a microwave plasma CVD apparatus capable of applying a magnetic field used in the present invention.
同図において、この装置は減圧状態に保持可能なプラズ
マ発生空間(1)、加熱空間(3)、補助空間(2)、
磁場を発生する電磁石(5)、(5゜)およびその電源
(25)、マイクロ波発振器(4)、排気系を構威する
ターボ分子ボンブ(8)、ロータリーボンブ(l4)、
圧力調整バルブ(l1)、赤外線加熱ヒータ(20)、
およびその電源(23)、赤外線反射面(2l)、基板
ホルダ(10’) 、基板(IOLマイクロ波導入窓(
15)、ガス導入系(6).(7) 、水冷系(18)
, (18′)より構威されている。In the figure, this device includes a plasma generation space (1) that can be maintained in a reduced pressure state, a heating space (3), an auxiliary space (2),
An electromagnet (5), (5°) that generates a magnetic field and its power source (25), a microwave oscillator (4), a turbo molecular bomb (8) that makes up the exhaust system, a rotary bomb (l4),
Pressure adjustment valve (l1), infrared heater (20),
and its power source (23), infrared reflective surface (2l), substrate holder (10'), substrate (IOL microwave introduction window (
15), Gas introduction system (6). (7), water cooling system (18)
, (18').
まず薄膜形成用基板(10)を基仮ホルダ(10“)上
に設置する。このホルダは高熱伝導性を有し、かつマイ
クロ波をできるだけ乱さないため、セラごックの窒化ア
ルξニュームを用いた。この基板ホルダを赤外線ヒータ
(20)より放物反射面(2l)レンズ系(22)を用
いて集光し加熱する。(例えば500’C)次に水素(
6)をIOSCCMガス系(7)を通して高密度プラズ
マ発生領域(2)へと導入し、外部より2.45GGl
lzの周波数のマイクロ波を500Wの強さで加える.
さらに、磁場約2Kガウスを磁石(5) . (5’
)より印加し、高密度プラズマをプラズマ発生空間(1
〉にて発生させる。この時プラズマ発生空間(1)の圧
力はQ,lPaに保持されている。この高密度プラズマ
領域より高エネルギを持つ水素原子または電子が基板(
lO)上に到り、表面を洗浄にする。さらにこの水素を
中止し、ガス系(7)より炭化物気体例えばアセチレン
(cztb)、メタン(CI+4)を活性化せしめる。First, the thin film forming substrate (10) is placed on the base temporary holder (10'').This holder has high thermal conductivity and in order to not disturb the microwave as much as possible, aluminum nitride of Ceragoc is used. This substrate holder is heated by condensing light from an infrared heater (20) using a parabolic reflecting surface (2l) and a lens system (22) (for example, 500'C). Next, hydrogen (
6) is introduced into the high-density plasma generation region (2) through the IOSCCM gas system (7), and 2.45 GGl is introduced from the outside.
Apply microwaves with a frequency of lz at a strength of 500W.
Furthermore, a magnetic field of approximately 2K Gauss is applied to the magnet (5). (5'
), high-density plasma is applied from the plasma generation space (1
〉 At this time, the pressure in the plasma generation space (1) is maintained at Q, lPa. From this high-density plasma region, hydrogen atoms or electrons with high energy are transferred to the substrate (
1O) and clean the surface. Furthermore, this hydrogen supply is stopped and carbide gases such as acetylene (cztb) and methane (CI+4) are activated from the gas system (7).
そして高エネルギに励起された炭素原子が生戒され、約
500″C加熱された基板(10)上に、この炭素原子
が体積し、ダイヤモンド又はi一カーボン膜が形成され
る。The carbon atoms excited with high energy are then collected and deposited on the substrate (10) heated to about 500''C, forming a diamond or i-carbon film.
第1図において、磁場は2つのリング状の磁石(5),
(5’)を用いたヘルムホルツコイル方式を採用した。In Figure 1, the magnetic field consists of two ring-shaped magnets (5),
A Helmholtz coil method using (5') was adopted.
さらに、4分割した空間(30)に対し電場・磁場の強
度を調べた結果を第2図に示す。Furthermore, FIG. 2 shows the results of examining the strength of the electric and magnetic fields for the space (30) divided into four parts.
第2図(A)において、横軸(X軸)は空間(20)の
横方向(反応性気体の放出方向)であり、縦軸(R軸)
は磁石の直径方向を示す。図面における曲線は磁場の等
電位面を示す。そしてその線に示されている数字は磁石
(5)が約2000ガウスの時に得られる磁場の強さを
示す。磁石(5)の強度を調整すると、電極・磁場の相
互作用を有する空間(100)(875±185ガウス
)で大面積において磁場の強さを基板の被形戊面の広い
面積にわたって概略均一にさせることができる。図面は
等磁場面を示し、特に線(26)が875ガウスとなる
εCR(電子サイクロトロン共鳴)条件を生ずる等磁場
面である。In FIG. 2 (A), the horizontal axis (X-axis) is the horizontal direction of the space (20) (reactive gas release direction), and the vertical axis (R-axis)
indicates the diameter direction of the magnet. The curves in the drawings indicate equipotential surfaces of the magnetic field. The number shown on the line indicates the strength of the magnetic field obtained when the magnet (5) is approximately 2000 Gauss. By adjusting the strength of the magnet (5), the strength of the magnetic field can be made approximately uniform over a large area of the shaped surface of the substrate in the space (100) (875 ± 185 Gauss) where the electrode-magnetic field interacts. can be done. The drawing shows an isomagnetic scene, in particular an isomagnetic scene that gives rise to the εCR (electron cyclotron resonance) condition where the line (26) is 875 Gauss.
さらにこの共鳴条件を生ずる空間(100)は第2図(
ロ)に示す如く、電場が最大となる領域となるようにし
ている。第2図(n)の横軸は第2図(A)と同じく反
応性気体の流れる方向を示し、縦軸は電場(電界強度)
の強さを示す。Furthermore, the space (100) that produces this resonance condition is shown in Figure 2 (
As shown in (b), the area is set so that the electric field is maximum. The horizontal axis in Figure 2 (n) indicates the flow direction of the reactive gas as in Figure 2 (A), and the vertical axis indicates the electric field (field strength).
Shows the strength of
すると電界領域(100)以外に領域(100゜)も最
大となる領域に該当する。しかしにここに対応する6R
場(第2図(A))はきわめて等磁場面が多く存在して
いる。即ち頌域(100’)には基板の被形戊面の直径
方向(第2図(A)における縦軸方向)での膜厚のぱら
つきが大きくなり、(26’)の共鳴条件を満たすEC
R条件部分で良質の被膜ができるのみである。結果とし
て均一かつ均質な被膜を期待できない。Then, in addition to the electric field area (100), the area (100°) also corresponds to the maximum area. However, the 6R corresponding here
The field (Fig. 2 (A)) has an extremely large number of isomagnetic scenes. That is, in the hollow region (100'), there is a large variation in film thickness in the diameter direction of the shaped surface of the substrate (vertical axis direction in FIG. 2 (A)), and the EC that satisfies the resonance condition of (26')
A good quality film was only formed under the R condition. As a result, a uniform and homogeneous coating cannot be expected.
もちろんドーナツ型に作らんとする場合はそれでもよい
。Of course, if you want to make it into a donut shape, that's fine.
また領域(100)に対してその原点対称の反対の側に
も電場が最大であり、かつ磁場が広い領域にわたって一
定となる領域を有する.基板の加熱を行う必要がない場
合はかかる空間での被膜形成が有効である。しかしマイ
クロ波の電場を乱すことなく加熱を行う手段が得にくい
。There is also a region on the opposite side of the region (100) symmetrical to the origin where the electric field is maximum and the magnetic field is constant over a wide region. When there is no need to heat the substrate, forming a film in such a space is effective. However, it is difficult to find a way to perform heating without disturbing the microwave electric field.
これらの結果、基板の出し入れの容易さ、加熱の容易さ
を考慮し、均一な膜でありかつ均質な被膜とするために
は第2図(八)の領域(100)が3つの領域の中では
最も工業的に量産性の優れた位置と推定される。As a result, considering the ease of putting in and taking out the substrate and the ease of heating, in order to obtain a uniform film and a homogeneous coating, the area (100) in Figure 2 (8) is one of the three areas. It is estimated that this is the location with the highest industrial productivity.
この結果、本発明では領域(100)に基仮(10)を
配設すると、この基板が円形であった場合、半径100
1まで、好ましくは半径50mmまでの大きさで均一、
均質に被膜形成が可能となった。As a result, in the present invention, when the substrate (10) is arranged in the area (100), if this substrate is circular, the radius is 100.
1, preferably uniform in size up to a radius of 50 mm,
It became possible to form a uniform film.
さらに大面積とするには、例えばこの4倍の面積におい
て同じく均一な膜厚とするには周波数を2.45Gll
zではな< 1.225GIlzとすればこの空間の直
径(第2図(A)のR方向)を2倍とすることができる
。For an even larger area, for example, to achieve the same uniform film thickness over an area four times larger than this, the frequency should be set to 2.45 Gll.
If z<1.225GIlz, the diameter of this space (in the R direction in FIG. 2(A)) can be doubled.
第3図は第2図における基板(10)の位置における円
形空間の磁場(A)および電場(B)の等磁場、等電場
の図面である。第3図(B)より明らかなごとく、電場
は最大25XV/+にまで達せしめ得ることがわかる。FIG. 3 is a diagram of equal magnetic fields and equal electric fields of the magnetic field (A) and electric field (B) in a circular space at the position of the substrate (10) in FIG. 2. FIG. As is clear from FIG. 3(B), it can be seen that the electric field can reach a maximum of 25XV/+.
また比較のために同条件下で磁場を印加せずに薄膜形成
を行った。その時基板上に形威された薄膜はグラファイ
ト膜であった。For comparison, a thin film was formed under the same conditions without applying a magnetic field. The thin film formed on the substrate at that time was a graphite film.
さらに本実施例と同条件下において基板温度を650゜
C以上とした場合ダイヤモンド薄膜を形戊することが可
能であった。Further, it was possible to form a diamond thin film when the substrate temperature was set to 650°C or higher under the same conditions as in this example.
本実施例にて形成された薄膜の電子線回折像をとったと
ころアモルファス特有のハローパターンとともにダイヤ
モンドのスポットがみられ、iカーボン膜となっていた
。さらに基板温度を上げて形威してゆくにしたがい、ハ
ローパターンが少しづつ消えてゆき650゜C以上でダ
イヤモンドとなった。When an electron diffraction image of the thin film formed in this example was taken, diamond spots were observed along with a halo pattern peculiar to an amorphous film, indicating that the film was an i-carbon film. As the temperature of the substrate was further increased and the shape was improved, the halo pattern gradually disappeared and became a diamond at temperatures above 650°C.
また基板加熱温度を150℃未満とした場合、磁場を加
えてもi一カーボン膜を作成することはできなかった。Further, when the substrate heating temperature was less than 150° C., an i-carbon film could not be formed even if a magnetic field was applied.
かかる方式において、基板上に炭化珪化物気体(メチル
シラン)を用い炭化珪素の多結晶膜を作ることができる
。アルミニューム化物気体とアンモニアとの反応により
窒化アルξニューム被膜を作ることもできる。さらにタ
ングステン、チタン、モリブデンまたはそれらの珪化物
の高融点導体を作ることもできる。In this method, a polycrystalline film of silicon carbide can be formed on a substrate using a silicon carbide gas (methylsilane). Aluminum nitride coatings can also be produced by reaction of aluminide gas with ammonia. Furthermore, high melting point conductors of tungsten, titanium, molybdenum or their silicides can also be made.
本発明の構戒を取ることにより、従来作製されていた結
晶性を少なくとも一部に有する被膜の作製条件より幅広
い条件下にて作製可能であった.また従来法に比べ大而
a6こ均一な薄膜を形成することが可能であった。By taking the precautions of the present invention, it was possible to produce films under a wider range of conditions than conventionally produced films that had at least some crystallinity. Furthermore, it was possible to form a more uniform thin film than in the conventional method.
さらに作製された薄膜は引張、圧縮とも膜応力をほとん
ど有さない良好な膜であった。Furthermore, the produced thin film was a good film with almost no film stress in either tension or compression.
第1図は本発明で用いる磁場・電場相互作用を用いたマ
イクロ波CVD装置の概略を示す。
第2図はコンピュータシミュレイションによる磁場およ
び電場特性を示す。
第3図は電場・磁場相互作用をさせた位置での磁場およ
び電場の特性を示す。
1・・・・プラズマ発生空間
10. 10゜・・基板および基板ホルダ4・・・・マ
イクロ波発振器
5.5”・・・外部磁場発生器
20・・・・基板加熱ヒータ
100 ・・・最大電場となる空間FIG. 1 schematically shows a microwave CVD apparatus using magnetic field/electric field interaction used in the present invention. FIG. 2 shows the magnetic field and electric field characteristics by computer simulation. Figure 3 shows the characteristics of the magnetic field and electric field at a position where the electric field and magnetic field interact. 1...Plasma generation space 10. 10°...Substrate and substrate holder 4...Microwave oscillator 5.5"...External magnetic field generator 20...Substrate heater 100...Space with maximum electric field
Claims (1)
を囲んで設けられた磁場発生手段、前記プラズマ発生室
にマイクロ波を供給する手段を備えた磁場及び電場の相
互作用を利用して被膜を形成する方法であって、前記プ
ラズマ発生室に炭化物気体を導入し、該気体に対して外
部より磁界及びマイクロ波を加え、電子サイクロトロン
共鳴条件を満たす共鳴磁場の±21.2%以内の磁場領
域内に被形成面を有する基板を設けることにより、被形
成面上にダイヤモンド膜を形成することを特徴とする被
膜形成方法。1. A film is formed by utilizing the interaction of a magnetic field and an electric field, which includes a plasma generation chamber maintained in a reduced pressure state, a magnetic field generation means provided surrounding the generation chamber, and a means for supplying microwaves to the plasma generation chamber. In this method, a carbide gas is introduced into the plasma generation chamber, a magnetic field and microwaves are applied to the gas from the outside, and the magnetic field is within ±21.2% of the resonant magnetic field that satisfies the electron cyclotron resonance condition. 1. A method for forming a film, comprising: providing a substrate having a surface to be formed on, and forming a diamond film on the surface to be formed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14506790A JPH0317274A (en) | 1990-06-01 | 1990-06-01 | Film formation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14506790A JPH0317274A (en) | 1990-06-01 | 1990-06-01 | Film formation |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP61266834A Division JPS63121667A (en) | 1986-11-10 | 1986-11-10 | Device and method for forming thin film |
Related Child Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6145738A Division JP2769977B2 (en) | 1994-06-06 | 1994-06-06 | Plasma processing method |
| JP6145739A Division JP2739286B2 (en) | 1994-06-06 | 1994-06-06 | Plasma processing method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0317274A true JPH0317274A (en) | 1991-01-25 |
| JPH0543792B2 JPH0543792B2 (en) | 1993-07-02 |
Family
ID=15376617
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14506790A Granted JPH0317274A (en) | 1990-06-01 | 1990-06-01 | Film formation |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0317274A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07166359A (en) * | 1994-06-06 | 1995-06-27 | Semiconductor Energy Lab Co Ltd | Plasma treatment |
| KR20040033796A (en) * | 2002-10-16 | 2004-04-28 | 현대자동차주식회사 | Nozzle of injector |
| JP2007016694A (en) * | 2005-07-07 | 2007-01-25 | Toyota Motor Corp | Control device for spark ignition type cylinder injection type internal combustion engine |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60103098A (en) * | 1983-11-04 | 1985-06-07 | Kyocera Corp | Manufacture of diamond film |
-
1990
- 1990-06-01 JP JP14506790A patent/JPH0317274A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60103098A (en) * | 1983-11-04 | 1985-06-07 | Kyocera Corp | Manufacture of diamond film |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07166359A (en) * | 1994-06-06 | 1995-06-27 | Semiconductor Energy Lab Co Ltd | Plasma treatment |
| KR20040033796A (en) * | 2002-10-16 | 2004-04-28 | 현대자동차주식회사 | Nozzle of injector |
| JP2007016694A (en) * | 2005-07-07 | 2007-01-25 | Toyota Motor Corp | Control device for spark ignition type cylinder injection type internal combustion engine |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0543792B2 (en) | 1993-07-02 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPH01191780A (en) | Thin film-forming equipment | |
| KR900008505B1 (en) | Microwave Enhanced CVD Method for Carbon Precipitation | |
| US6838126B2 (en) | Method for forming I-carbon film | |
| JPS63210275A (en) | Method for removing unnecessary carbon matter in apparatus for producing carbon | |
| KR100325500B1 (en) | Method of producing thin semiconductor film and apparatus therefor | |
| JPH0420984B2 (en) | ||
| JP2965935B2 (en) | Plasma CVD method | |
| JPS63145782A (en) | Formation of thin film | |
| US5270029A (en) | Carbon substance and its manufacturing method | |
| JPH0543792B2 (en) | ||
| JP2660244B2 (en) | Surface treatment method | |
| US6677001B1 (en) | Microwave enhanced CVD method and apparatus | |
| JPH03122266A (en) | Production of thin nitride film | |
| JP2739286B2 (en) | Plasma processing method | |
| JPH0543793B2 (en) | ||
| JP2769977B2 (en) | Plasma processing method | |
| JP2715277B2 (en) | Thin film forming equipment | |
| JP2617539B2 (en) | Equipment for producing cubic boron nitride film | |
| JP2899254B2 (en) | Plasma CVD equipment | |
| JP2892347B2 (en) | Thin film formation method | |
| JPH01246357A (en) | Production of cubic boron nitride film | |
| JPS63169387A (en) | Formation of thin film | |
| JP3190100B2 (en) | Carbon material production equipment | |
| JP3212719B2 (en) | CVD method using low pressure inductively coupled plasma | |
| JPH1174204A (en) | Method and apparatus for manufacturing semiconductor thin film |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |