JPH03183688A - Device for continuously pulling up single crystal - Google Patents
Device for continuously pulling up single crystalInfo
- Publication number
- JPH03183688A JPH03183688A JP31886889A JP31886889A JPH03183688A JP H03183688 A JPH03183688 A JP H03183688A JP 31886889 A JP31886889 A JP 31886889A JP 31886889 A JP31886889 A JP 31886889A JP H03183688 A JPH03183688 A JP H03183688A
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- melt
- single crystal
- pulling
- double
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 39
- 239000000155 melt Substances 0.000 claims abstract description 28
- 239000002994 raw material Substances 0.000 claims description 20
- 239000007787 solid Substances 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000012535 impurity Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 229910002804 graphite Inorganic materials 0.000 description 3
- 239000010439 graphite Substances 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 238000005204 segregation Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
【発明の詳細な説明】
r産業上の利用分野]
本発明は原料i1続供給装置及び二重るつぼを備えた単
結晶連続引上げ装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a single crystal continuous pulling device equipped with a raw material i1 continuous supply device and a double crucible.
[従来の技術]
単結晶の引上げ装置としてはチョクラルスキー法による
装置が知られている。[Prior Art] As a single crystal pulling device, a device using the Czochralski method is known.
−eに融液よりチョクラルスキー法により単結晶を引上
げる場合、るつぼ内に所定量の固体原料を入れそれを融
液化して引上げるため、るつぼ内の原料の量によって得
られる単結晶の直径及び長さが決定される。また、融液
中に含まれる不純物は結晶の引上げに伴い偏析現象を起
こし濃化する。そのため引上げられた結晶の引上げ方向
の不純物濃度は、結晶の尾部側はど高くなり均一化が困
難であった。-e When pulling a single crystal from a melt using the Czochralski method, a predetermined amount of solid raw material is placed in the crucible, and the solid raw material is turned into a melt and pulled. The diameter and length are determined. In addition, impurities contained in the melt cause a segregation phenomenon and become concentrated as the crystals are pulled up. Therefore, the impurity concentration in the pulling direction of the pulled crystal is higher on the tail side of the crystal, making it difficult to make it uniform.
そのため、特開昭58−36997号公報には、単結晶
製造装置の縦断面模式図を第4図に示したように、原料
連続供給装置16を備え、るつぼを二重るつぼ1として
引上げた結晶の重量に見合った重量の原料、あるいは融
液中の不純物濃度を一定とするような量の原料を結晶の
引上げ中に外るつぼ9と内るつぼ2との間に供給するこ
により、連続的に長大な結晶の引上げ、あるいは、不純
物濃度が均一化された結晶の引上げが可能な連続引上げ
装置が開示されている。For this reason, Japanese Patent Application Laid-Open No. 58-36997 discloses that, as shown in FIG. 4, which is a schematic vertical cross-sectional view of a single crystal production apparatus, the apparatus is equipped with a raw material continuous supply apparatus 16, and the crucible is a double crucible 1. By continuously supplying a weight of raw material corresponding to the weight of the crystal, or an amount of raw material that maintains the impurity concentration in the melt between the outer crucible 9 and the inner crucible 2 during crystal pulling, A continuous pulling device is disclosed that is capable of pulling a long crystal or a crystal with a uniform impurity concentration.
なお、二重るつぼ構造は引上げ中に供給した原料が単結
晶に付着して結晶性を乱すことを防ぎ。The double crucible structure prevents the raw materials supplied during pulling from adhering to the single crystal and disturbing the crystallinity.
また、原料投下の際の融液面の乱れの結晶成長への影響
を防ぐため、連続引上げの際には不可欠の構造である。In addition, this structure is essential for continuous pulling in order to prevent disturbance of the melt surface during raw material injection from affecting crystal growth.
しかし、融液中への原料の供給は、供給湯所近f労の融
液温度を低下させる傾向がある。そのため、連続的に原
料を供給していくと外部加熱器(第4図におけるヒータ
4)による加熱では原料供給による融液温度低下を防ぐ
ことができなくなり、融液と接しており、かつ融ti温
度が外るつぼより低い領域である内るつぼの内面近傍(
第4図における14)から融液の固化が生じ、引上げが
不可能となる。However, feeding raw materials into the melt tends to lower the melt temperature near the supply well. Therefore, if raw materials are continuously supplied, heating by an external heater (heater 4 in Fig. 4) will not be able to prevent the temperature of the melt from decreasing due to the supply of raw materials. Near the inner surface of the inner crucible, where the temperature is lower than the outer crucible (
The melt solidifies from step 14) in FIG. 4, making it impossible to pull it up.
そのため、−船釣には、 ■るつぼ全体の融液温度を高めに設定する。Therefore, - for boat fishing, ■Set the melt temperature of the entire crucible to be high.
■大口径るつぼを使用し、結晶育成領域近傍(第4図に
おける15)の融液温度に対して内るつぼ内面近傍の融
液温度を十分高く保つ。(2) Use a large diameter crucible and keep the melt temperature near the inner surface of the inner crucible sufficiently higher than the melt temperature near the crystal growth region (15 in Figure 4).
という手法がとられていた。This method was used.
しかし上記の方法ではそれぞれ ■単結晶の引上げ速度が遅くなり生産性が低下する。However, each of the above methods ■The pulling speed of single crystal becomes slow and productivity decreases.
■るつぼの価格が高く、さらに、引上げ終了時の残融液
量が増加するため歩留りが低下すると言う問題点があっ
た。(2) The cost of the crucible is high, and there are also problems in that the yield decreases because the amount of melt remaining at the end of pulling increases.
[発明が解決しようとする課題1
本発明は上記従来技術の欠点を解決し、単結晶の引上げ
速度が速いと共に歩留りが高く、るつぼの価格を安価と
なし得る、単結晶連続引上げ装置を提供しようとするも
のである。[Problem to be Solved by the Invention 1] The present invention solves the above-mentioned drawbacks of the prior art, and provides a continuous single crystal pulling device that can pull a single crystal at a high speed, has a high yield, and can reduce the cost of the crucible. That is.
[課題を解決するための手段1
本発明は上記課題を解決するために、原料連続供給装置
及び二重るつぼを備えた単結晶引上げ装置において、引
上げられる前記単結晶と前記二重るつぼの内るつぼとの
間に、該内るつぼ内の融液面より放射される赤外線を内
るつぼの内面に近接する融液面に向けて反射する反射板
を設けたことを特徴とする単結晶連続引上げ装置を提供
するものである。[Means for Solving the Problems 1] In order to solve the above problems, the present invention provides a single crystal pulling device equipped with a raw material continuous supply device and a double crucible, in which the single crystal to be pulled and the inner crucible of the double crucible are A continuous single crystal pulling device characterized in that a reflecting plate is provided between the inner crucible and the melt surface that reflects infrared rays emitted from the melt surface in the inner crucible toward the melt surface close to the inner surface of the inner crucible. This is what we provide.
[作用]
本発明を実施例の縦断面模式図を示す第1図を用いて説
明する。[Function] The present invention will be explained using FIG. 1, which shows a schematic vertical cross-sectional view of an embodiment.
二重るつぼlの内るつぼ2の内側上方に、第1図に示す
ように赤外線放射を反射する反射板3を設けることによ
り、融液5の表面からの赤外線放射を反射させて内るつ
ぼ2の内面と融液5が接する内るつぼ内面近傍I4を局
所的に保温し、結晶成長領域近傍15に比べ、局部的に
融液温度を高く保つ、このことにより、融液の同化が最
初に始まる内るつぼ2の内面近傍14を局部的に高い温
度に保てるので、融液全体の温度を低めに設定しても内
るつぼ2内壁から融液の同化が始まることはなく、単結
晶の引上げ速度を高速に保つことができ、また大口径る
つぼを使用する必要もなくなる。By providing a reflecting plate 3 that reflects infrared radiation as shown in FIG. 1 above the inside of the inner crucible 2 of the double crucible 1, infrared radiation from the surface of the melt 5 is reflected and The area near the inner surface of the inner crucible I4, where the inner surface and the melt 5 are in contact, is locally kept warm, and the temperature of the melt is kept locally higher than that near the crystal growth region 15. By this, assimilation of the melt starts for the first time. Since the vicinity of the inner surface 14 of the crucible 2 can be maintained at a locally high temperature, even if the temperature of the entire melt is set to a low value, the assimilation of the melt does not start from the inner wall of the inner crucible 2, and the pulling speed of the single crystal can be increased. It also eliminates the need to use a large-diameter crucible.
反射板3には、赤外線を反射し易く、かつ耐熱性に優れ
た材料が用いられ、例えばモリブデンか好適である。The reflecting plate 3 is preferably made of a material that easily reflects infrared rays and has excellent heat resistance, such as molybdenum.
本発明の装置は、シリコン、GaAs等の単結晶の引上
げに好適に用いられる。The apparatus of the present invention is suitably used for pulling single crystals of silicon, GaAs, etc.
f実施IN) 本発明の実施例の縦断面模式図を第1図に示す。f implementation IN) A schematic vertical cross-sectional view of an embodiment of the present invention is shown in FIG.
黒鉛るつぼ7は支持棒8により支持されると共に支持棒
8の回転によって回転運動を与えられる。この黒鉛るつ
ぼ7に支持された二重るつぼ1は内るつぼ2と外るつぼ
9からなっており、内るつぼ2の直径は300mm、外
るつぼ9の直径は400mmとした。The graphite crucible 7 is supported by a support rod 8 and given rotational motion by the rotation of the support rod 8. The double crucible 1 supported by this graphite crucible 7 consisted of an inner crucible 2 and an outer crucible 9, the diameter of the inner crucible 2 was 300 mm, and the diameter of the outer crucible 9 was 400 mm.
固体原料10は原料連続供給袋a16により内るつぼ2
と外るつぼ9の間の融液中に投下される。固体原料IO
を溶解した融液は貫通孔11を経て内るつぼ2内に到達
する。ヒータ4は固体原料をるつぼ内で溶融させるため
の加熱器である。The solid raw material 10 is transferred to the inner crucible 2 by the raw material continuous supply bag a16.
and the outer crucible 9 into the melt. solid raw material IO
The melted liquid reaches the inner crucible 2 through the through hole 11. The heater 4 is a heater for melting the solid raw material within the crucible.
本発明に係る反射板3は、赤外線を反射し易く、かつ耐
熱性に優れたモリブデン製とした。The reflecting plate 3 according to the present invention was made of molybdenum, which easily reflects infrared rays and has excellent heat resistance.
第2図に用いた反射板3の形状を示した縦断面図で、厚
さ(d)2mm、長さ(a)50mm。This is a vertical cross-sectional view showing the shape of the reflector 3 used in FIG. 2, which has a thickness (d) of 2 mm and a length (a) of 50 mm.
角度1)45度の截頭逆円錐形とした0反射板3は、内
るつぼ2の内側の融液より上方に支持部材13により融
液表面との最接近距離を30mm、内るつぼ2と最接近
距離を30mmとなるように設置した。Angle 1) The zero reflection plate 3, which has a truncated inverted conical shape with a 45 degree angle, is placed above the melt inside the inner crucible 2 by a supporting member 13 so that the closest distance to the melt surface is 30 mm, and the closest distance to the inner crucible 2 is 30 mm. It was installed so that the approach distance was 30 mm.
これらの部材は、全てチャンバI2内に収納Sれている
。All of these members are housed in chamber I2.
上記のように構成された装置で直径6インチσシリコン
単結晶の引上げを行った。原料連続供給装置16からは
多結晶シリコン10を引上げた製品6の重量分だけ供給
し、常に融液5の量を〜哀となるようにした。A σ silicon single crystal having a diameter of 6 inches was pulled using the apparatus configured as described above. Polycrystalline silicon 10 was supplied from the raw material continuous supply device 16 in an amount equal to the weight of the pulled product 6, so that the amount of the melt 5 was always kept at a constant level.
第3図は1本実施例と外るつぼ9の直径力450mmの
第4図に示した従来の装置とを用して、シリコン単結晶
を引上げた場合の引上げ速趙の経時変化を示したグラフ
である。従来の装置に比べ1本発明の装置を使用するこ
とにより大口貸るつぼを使用せずども引上げ速度を大幅
に向上することができた。FIG. 3 is a graph showing the change in pulling speed over time when a silicon single crystal is pulled using this embodiment and the conventional device shown in FIG. It is. Compared to conventional devices, by using the device of the present invention, it was possible to significantly improve the pulling speed without using a large crucible.
〔発明の効果J
本発明による単結晶連続引上げ装置を用いることにより
、
■従来より小さいるつぼを用いても引上げ速度を従来よ
りも3倍程度高速にでき生産性が向上した。[Effects of the Invention J] By using the continuous single crystal pulling apparatus according to the present invention, (1) Even if a crucible smaller than the conventional one is used, the pulling speed can be made about three times faster than the conventional one, and productivity is improved.
■直径6インチのシリコン単結晶の連続引上げの場合、
従来は直径450mm以上のるつぼの使用が不可欠であ
ったが、直径400mmのるつぼでも引上げが可能とな
り、従来よりもるつぼにかかるコストを40%程度低減
でき、また。■In the case of continuous pulling of a silicon single crystal with a diameter of 6 inches,
Conventionally, it was essential to use a crucible with a diameter of 450 mm or more, but it is now possible to pull a crucible with a diameter of 400 mm, reducing the cost of crucibles by about 40% compared to conventional methods.
残存融液量も20%程度少なくでき1歩留りが向上した
。The amount of remaining melt was also reduced by about 20%, and the yield was improved.
第1図は本発明の実施例の縦断面模式図、第2図は実施
例における反射板の縦断面図、第3図は実施例と従来装
置による単結晶引上げ速度の経時変化を示すグラフ、第
4図は従来装置の縦断面模式図である。
1・・・二重るつぼ
2・・−内るつぼ
3・・−反射板
4−・・ヒータ
5・・・融液
6・・・単結晶
7・・・黒鉛るつぼ
8・・・支持棒
9・・−外るつぼ
10・・・固体原料
1]・・・貫通孔
12・・・チャンバ
13・・−支持部材
14・・・肖るつぼ内面近傍
15・・・単結晶成長領域近傍
16・・−原料連続供給装置
出
願
人
川崎
製
鉄
代
理
人FIG. 1 is a schematic vertical cross-sectional view of an example of the present invention, FIG. 2 is a vertical cross-sectional view of a reflector in the example, and FIG. 3 is a graph showing changes over time in the single crystal pulling rate of the example and the conventional apparatus. FIG. 4 is a schematic vertical cross-sectional view of a conventional device. 1...Double crucible 2...-Inner crucible 3...-Reflector 4-...Heater 5...Melt 6...Single crystal 7...Graphite crucible 8...Support rod 9... -Outer crucible 10...Solid raw material 1]...Through hole 12...Chamber 13...-Supporting member 14...Near the inner surface of the crucible 15...Near the single crystal growth region 16...-Raw material Continuous feeding device applicant Kawasaki Steel agent
Claims (1)
上げ装置において、引上げられる前記単結晶と前記二重
るつぼの内るつぼとの間に、該内るつぼ内の融液面より
放射される赤外線を内るつぼの内面に近接する融液面に
向けて反射する反射板を設けたことを特徴とする単結晶
連続引上げ装置。1. In a single crystal pulling device equipped with a raw material continuous supply device and a double crucible, infrared rays emitted from the melt surface in the inner crucible are placed between the single crystal to be pulled and the inner crucible of the double crucible. A single crystal continuous pulling device characterized by being provided with a reflector that reflects toward the melt surface close to the inner surface of the inner crucible.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31886889A JPH03183688A (en) | 1989-12-11 | 1989-12-11 | Device for continuously pulling up single crystal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP31886889A JPH03183688A (en) | 1989-12-11 | 1989-12-11 | Device for continuously pulling up single crystal |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03183688A true JPH03183688A (en) | 1991-08-09 |
Family
ID=18103862
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP31886889A Pending JPH03183688A (en) | 1989-12-11 | 1989-12-11 | Device for continuously pulling up single crystal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03183688A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1320173C (en) * | 2002-12-18 | 2007-06-06 | 日矿金属株式会社 | Process for producing single crystal of compound semiconductor and crystal growing apparatus |
| US20140144372A1 (en) * | 2012-11-29 | 2014-05-29 | Solaicx, Inc. | Weir For Improved Crystal Growth in A Continuous Czochralski Process |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5740119A (en) * | 1980-07-18 | 1982-03-05 | Skf Kugellagerfabriken Gmbh | Thin bearing bush made by pressdrawing |
| JPS581080A (en) * | 1981-06-16 | 1983-01-06 | ノルクス・ヒドロ・アクシエセルスカ−ブ | Water electrolytic cell diaphragm |
| JPH01286994A (en) * | 1988-05-11 | 1989-11-17 | Nkk Corp | Silicon single crystal manufacturing method and device |
| JPH0257962B2 (en) * | 1986-09-25 | 1990-12-06 | Kurita Machinery Manuf |
-
1989
- 1989-12-11 JP JP31886889A patent/JPH03183688A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5740119A (en) * | 1980-07-18 | 1982-03-05 | Skf Kugellagerfabriken Gmbh | Thin bearing bush made by pressdrawing |
| JPS581080A (en) * | 1981-06-16 | 1983-01-06 | ノルクス・ヒドロ・アクシエセルスカ−ブ | Water electrolytic cell diaphragm |
| JPH0257962B2 (en) * | 1986-09-25 | 1990-12-06 | Kurita Machinery Manuf | |
| JPH01286994A (en) * | 1988-05-11 | 1989-11-17 | Nkk Corp | Silicon single crystal manufacturing method and device |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1320173C (en) * | 2002-12-18 | 2007-06-06 | 日矿金属株式会社 | Process for producing single crystal of compound semiconductor and crystal growing apparatus |
| US20140144372A1 (en) * | 2012-11-29 | 2014-05-29 | Solaicx, Inc. | Weir For Improved Crystal Growth in A Continuous Czochralski Process |
| WO2014085391A1 (en) * | 2012-11-29 | 2014-06-05 | Solaicx, Inc. | Weir for improved crystal growth in a continuous czochralski process |
| CN104955991A (en) * | 2012-11-29 | 2015-09-30 | 索拉克斯有限公司 | Weir for improved crystal growth in a continuous Czochralski process |
| US9376762B2 (en) | 2012-11-29 | 2016-06-28 | Solaicx | Weir for improved crystal growth in a continuous Czochralski process |
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