JPH03186743A - Goniometer for x-ray diffraction - Google Patents

Goniometer for x-ray diffraction

Info

Publication number
JPH03186743A
JPH03186743A JP1326693A JP32669389A JPH03186743A JP H03186743 A JPH03186743 A JP H03186743A JP 1326693 A JP1326693 A JP 1326693A JP 32669389 A JP32669389 A JP 32669389A JP H03186743 A JPH03186743 A JP H03186743A
Authority
JP
Japan
Prior art keywords
arm
link
goniometer
sample
guide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1326693A
Other languages
Japanese (ja)
Other versions
JP2976380B2 (en
Inventor
Kazuo Koyanagi
和夫 小柳
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1326693A priority Critical patent/JP2976380B2/en
Publication of JPH03186743A publication Critical patent/JPH03186743A/en
Application granted granted Critical
Publication of JP2976380B2 publication Critical patent/JP2976380B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はX17回折用のゴニオメータに関する。[Detailed description of the invention] (Industrial application field) The present invention relates to a goniometer for X17 diffraction.

(従来の技術) XM回折用のゴニオメータは通常垂直軸を中心に構成さ
れ、X線源に対して試料台とX線検出器とを試料台を中
心として試料台の回転に対してX線検出器が2倍角だけ
回転するように試料台とX線検出器とを連動させである
。しかしこのゴニオメータでは試料面が垂直となるため
液体とか粉末の試料が扱い難い。
(Prior Art) A goniometer for XM diffraction is usually configured around a vertical axis, and a sample stage and an X-ray detector are connected to the X-ray source to detect X-rays as the sample stage rotates around the sample stage. The sample stage and the X-ray detector are linked so that the instrument rotates by twice the angle. However, with this goniometer, the sample surface is vertical, making it difficult to handle liquid or powder samples.

このため試料面を水平に保持できる水平軸型のゴニオメ
ータが提供されている。この型のゴニオメータは第3図
に示すように、試料面Sを水平にして試料を固定的保持
する試料台と試料台を中心に水平軸によって回動するX
線源XとX!11検出器りとよりなっている。所がX線
源には高電圧ケーブルとターゲット冷却用給排水管が接
続されている上、それ自身かなり大きく重い物であるか
ら、そのような物を水平軸によって回動させるために、
ゴニオメータを全体として頑丈な構造物としなければな
らない。
For this reason, a horizontal axis type goniometer that can hold the sample surface horizontally is provided. As shown in Figure 3, this type of goniometer consists of a sample stand that holds the sample fixedly with the sample surface S level, and an
Ray source X and X! It consists of 11 detectors. However, the X-ray source is connected to a high-voltage cable and target cooling water supply and drainage pipes, and is itself a fairly large and heavy object, so in order to rotate such an object around a horizontal axis, it is necessary to
The goniometer as a whole must be of solid construction.

(発明が解決しようとする課題〉 本発明は試料面を水平に保持できる水平軸型のX線回折
用ゴニオメータを軽量小型化しようとするものである。
(Problems to be Solved by the Invention) The present invention aims to reduce the weight and size of a horizontal axis type X-ray diffraction goniometer that can hold a sample surface horizontally.

(課題を解決するための手段) X線源を中心にして水平軸により回動可能な腕と、上記
水平軸より上記腕の回動面と平行水平に延びる直線ガイ
ドと、一端がこのガイドに沿って摺動し、この端部にX
線検出器が取付けられ、他端が上記腕の回動端と連結さ
れている上記腕と同長のリンクと、上記腕とリンクの結
合点を中心に上記腕およびリンクに対して回動可能で、
常に空間的に一方向を向いているようにX!11!源或
は上記ガイドの摺動子に連結されている試料台とでゴニ
オメータを構成した。
(Means for Solving the Problem) An arm rotatable about a horizontal axis around an X-ray source, a linear guide extending horizontally from the horizontal axis parallel to a rotation surface of the arm, and one end of which is connected to the guide. Slide along and mark this end with an
A link with the same length as the arm to which a line detector is attached and whose other end is connected to the rotating end of the arm, and is rotatable with respect to the arm and link around the connection point of the arm and link. in,
X to always look in one direction spatially! 11! A goniometer was constructed with the source or a sample stage connected to the slider of the guide.

(作用) 上記構成によるとX Lt源とガイドとは固定部となる
。腕とリンクとで二等辺三角形が形成され、その底辺の
一端がX線源に固定され、他端がガイド上を摺動するの
で、腕とリンクの結合点に位置する試料から見てX線源
とXi検出器とは同距離にあり、試料を中心に互いに反
対方向に同じ角度だけ回動するので、ゴニオメータの条
件を満足しており、X線源が位置固定だから、XIs源
を動かす構造に比し、全体が軽量小型化される。
(Function) According to the above configuration, the X Lt source and the guide become fixed parts. The arm and the link form an isosceles triangle, and one end of the base is fixed to the X-ray source and the other end slides on the guide, so the X-rays are Since the source and the Xi detector are at the same distance and rotate by the same angle in opposite directions around the sample, they satisfy the goniometer conditions.Since the X-ray source is fixed in position, the structure allows the XIs source to be moved. Compared to the above, the entire structure is lighter and smaller.

(実施例〉 第1図に本発明ゴニオメータの正面図を示し、第2図に
平面図を示す。1は装置本体で、0点を中心に水平軸に
より回動可能に腕2が取付けられており、この腕に中心
線が0点を通るようにX線管球3が取付けられている。
(Example) Fig. 1 shows a front view of the goniometer of the present invention, and Fig. 2 shows a plan view. 1 is a main body of the device, and an arm 2 is attached to the goniometer so as to be rotatable about the 0 point on a horizontal axis. An X-ray tube 3 is attached to this arm so that its center line passes through the zero point.

従ってX線管球の中心0点より右方へ水平にガイド4が
延びている。
Therefore, the guide 4 extends horizontally to the right from the center zero point of the X-ray tube.

5はこのガイド上を摺動する滑子であり、この滑子と上
記腕2とを腕2と同長のリンク6が連結しており、この
リンクの滑子5例の端にX線検出器7が固定されている
。腕2とリンク6との連結点に回動可能に試料台8が取
付けられている。試料台8にはプーリ81が固定されて
おり、滑子5から突設されているリンク結合ビンに固定
されたプーリ51とは同径で両者間に鋼ベルト9が掛け
てあり、両ブーりとベルト9との間には滑りがないよう
にしである。このため、t7を斜台8は滑子5がガイド
4上を左右に移動しても常に空間的に一定方向を向いて
おり、この試料台に水平な切欠かあって、そこに表面を
水平にして試料が設置できるようにしである。X線検出
器7はリンク6に取付けられているので、常に試料の方
を向いている。試料台8を一定方向に向けておく機構は
製図機械に用いられている機構と同じであり、ブーりの
代わりに腕とし、ベルトの代わりに腕と腕を連結するリ
ンクを用いてもよく、試料台と摺動子5とを連結する代
わりに試料台と0点を中心として本体との間に同様を機
構を設けてもよい。
Reference numeral 5 denotes a slide that slides on this guide, and a link 6 having the same length as the arm 2 connects this slide and the arm 2. The container 7 is fixed. A sample stage 8 is rotatably attached to the connection point between the arm 2 and the link 6. A pulley 81 is fixed to the sample stage 8, and has the same diameter as the pulley 51 fixed to the link coupling bottle protruding from the slider 5, and a steel belt 9 is hung between the two. There is no slippage between the belt 9 and the belt 9. Therefore, even if the slider 5 moves left and right on the guide 4, the tilting table 8 at t7 always points in the same spatial direction. This allows the sample to be placed in a horizontal position. Since the X-ray detector 7 is attached to the link 6, it always faces the sample. The mechanism for keeping the sample stage 8 oriented in a certain direction is the same as that used in drafting machines, and an arm may be used instead of a boob, and a link connecting the arms may be used instead of a belt. Instead of connecting the sample stage and the slider 5, a similar mechanism may be provided between the sample stage and the main body centered on the zero point.

(発明の効果) 本発明によればX線源は向きは変えるが移動せず、X線
検出器は水平に移動するだけであり、試料が円弧運動を
するが、試料は軽量であるがら、装置を動かすのに大き
な力は不要であり、重量部分が移動しないので、装置全
体が軽量小型にでき、第3図の従来例のようにX線源と
X1111検出器とを反対向きに回動させるような機構
が不要で、リンクリンク6の摺動端を摺動させるだけで
、リンク機構で全体が所定の位置関係を保って動くので
、機構的にも簡単となる。
(Effects of the Invention) According to the present invention, the X-ray source changes direction but does not move, the X-ray detector only moves horizontally, and the sample moves in an arc. Although the sample is lightweight, Since a large force is not required to move the device and the heavy parts do not move, the entire device can be made lightweight and compact, and the X-ray source and X1111 detector can be rotated in opposite directions as in the conventional example shown in Figure 3. There is no need for a mechanism to move the link, and by simply sliding the sliding end of the link link 6, the entire link mechanism moves while maintaining a predetermined positional relationship, so it is mechanically simple.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例の正面図、第2図は同じく平
面図、第3図は従来例の正面図である。 1・・・装置本体、2・・・腕、3・・・X線管球、4
・・・ガイド、5・・・摺動子、6・・・リンク、7・
・・X線検出器、8・・・試料台、51.81・・・プ
ーリ、9・・・ベルト。
FIG. 1 is a front view of one embodiment of the present invention, FIG. 2 is a plan view of the same, and FIG. 3 is a front view of a conventional example. 1... Device body, 2... Arm, 3... X-ray tube, 4
...Guide, 5...Slider, 6...Link, 7.
...X-ray detector, 8...sample stage, 51.81...pulley, 9...belt.

Claims (1)

【特許請求の範囲】[Claims] X線源を中心に回動可能な腕と、この腕の回動面と平行
にX線源より一方向に延びているガイドと、一端がこの
ガイドに沿って摺動し、この端部にX線検出器が取付け
られ、他端が上記腕の回動端に連結されている上記腕と
同長のリンクと、上記腕とこのリンクとの結合点に、常
に本体に対して一方向を向いているように機構的に本体
に連結された試料台とよりなるX線回折用ゴニオメータ
An arm that can rotate around the X-ray source, a guide that extends in one direction from the X-ray source parallel to the rotation plane of this arm, and one end that slides along this guide and that An X-ray detector is attached to a link having the same length as the arm, the other end of which is connected to the rotating end of the arm, and a link that always faces in one direction with respect to the main body at the connection point between the arm and this link. An X-ray diffraction goniometer consisting of a sample stage mechanically connected to the main body so as to face the sample.
JP1326693A 1989-12-16 1989-12-16 Goniometer for X-ray diffraction Expired - Lifetime JP2976380B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1326693A JP2976380B2 (en) 1989-12-16 1989-12-16 Goniometer for X-ray diffraction

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1326693A JP2976380B2 (en) 1989-12-16 1989-12-16 Goniometer for X-ray diffraction

Publications (2)

Publication Number Publication Date
JPH03186743A true JPH03186743A (en) 1991-08-14
JP2976380B2 JP2976380B2 (en) 1999-11-10

Family

ID=18190610

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1326693A Expired - Lifetime JP2976380B2 (en) 1989-12-16 1989-12-16 Goniometer for X-ray diffraction

Country Status (1)

Country Link
JP (1) JP2976380B2 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008020108B3 (en) * 2008-04-22 2010-01-14 Bruker Axs Gmbh X-ray diffractometer for the mechanically correlated method of source, detector and sample position
CN116592802A (en) * 2023-05-17 2023-08-15 丹东奥龙射线仪器集团有限公司 Power transmission and angle measurement device of X-ray diffraction angle measurement instrument and angle control method thereof
CN120908226A (en) * 2025-10-10 2025-11-07 安徽国科仪器科技有限公司 Y-type high-precision digital angle meter system and structure analysis method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5710440A (en) * 1980-06-23 1982-01-20 Nippon X Sen Kk X-ray diffraction goniometer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5710440A (en) * 1980-06-23 1982-01-20 Nippon X Sen Kk X-ray diffraction goniometer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008020108B3 (en) * 2008-04-22 2010-01-14 Bruker Axs Gmbh X-ray diffractometer for the mechanically correlated method of source, detector and sample position
US7852983B2 (en) 2008-04-22 2010-12-14 Bruker Axs Gmbh X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position
CN116592802A (en) * 2023-05-17 2023-08-15 丹东奥龙射线仪器集团有限公司 Power transmission and angle measurement device of X-ray diffraction angle measurement instrument and angle control method thereof
CN120908226A (en) * 2025-10-10 2025-11-07 安徽国科仪器科技有限公司 Y-type high-precision digital angle meter system and structure analysis method

Also Published As

Publication number Publication date
JP2976380B2 (en) 1999-11-10

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