JPH0319949U - - Google Patents
Info
- Publication number
- JPH0319949U JPH0319949U JP3844689U JP3844689U JPH0319949U JP H0319949 U JPH0319949 U JP H0319949U JP 3844689 U JP3844689 U JP 3844689U JP 3844689 U JP3844689 U JP 3844689U JP H0319949 U JPH0319949 U JP H0319949U
- Authority
- JP
- Japan
- Prior art keywords
- light
- curse
- analyzer
- cursed
- divided
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001228 spectrum Methods 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 4
- 239000000523 sample Substances 0.000 claims 8
- 230000003287 optical effect Effects 0.000 claims 4
- 230000001678 irradiating effect Effects 0.000 claims 2
- 238000001069 Raman spectroscopy Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- 230000002123 temporal effect Effects 0.000 description 1
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Description
第１図乃至第６図は本考案の一実施例に係り、
第１図はマルチチヤンネルカース測定装置の構成
図、第２図Ａ，Ｂは第１図に示す検光子７２，７
８の透過軸の配置と出力信号との関係を示すベク
トル図、第３図乃至第６図はこの実施例装置を用
いた試験結果を示し、第３図Ａ，Ｂは検光子７２
の透過軸Ａ１の第２図Ａの配置からのずれ角ψを
パラメータとした、ホトダイオードアレイ８４ｄ
のみから得られたスペクトル図、第４図は第２考
案に係る結果を示すスペクトル図、第５図は第１
考案に係るスペクトル図、第６図Ａ，Ｂ，Ｃはベ
ンゼンの波数９９２cm−１での第１考案に係る測
定値の時間的変動を従来装置での結果と比較して
示す図、第７図は従来のマルチチヤンネルカース
測定装置の検光子の透過軸の配置と出力信号との
関係を示すベクトル図である。
1 to 6 relate to an embodiment of the present invention,
Figure 1 is a block diagram of the multi-channel curse measuring device, and Figures 2A and B are the analyzers 72 and 7 shown in Figure 1.
8 is a vector diagram showing the relationship between the arrangement of the transmission axis and the output signal, FIGS. 3 to 6 show the test results using this embodiment device, and FIGS.
A photodiode array 84d with the deviation angle ψ of the transmission axis A1 from the arrangement shown in FIG. 2A as a parameter.
Figure 4 is a spectrum diagram showing the results related to the second design, Figure 5 is the spectrum diagram obtained from the first design.
Spectrum diagrams according to the invention, Figures 6A, B, and C are diagrams showing temporal fluctuations of measured values according to the first invention at a wave number of 992 cm -1 for benzene in comparison with results obtained using a conventional device, and Figure 7. is a vector diagram showing the relationship between the arrangement of the transmission axis of the analyzer and the output signal of a conventional multi-channel curse measuring device.
Claims (1)
２分割し、その一方でポンプ光を生成し、その他
方で色素レーザを励起して広波数域のプローブ光
を生成し、該ポンプ光及び該プローブ光を試料に
対し同一位置に同一時点で照射してカース光を生
成させるカース光生成光学系１０〜６８と、 該カース光が入射され、該カース光を２分割す
るビームスプリツタ７０と、 透過軸Ａ１が該試料の３次の非線形電気感受率
χ３の非共鳴バツクグラウンド成分ベクトルχＮ
Ｒに直角に設定され、分割された該カース光の一
方が入射される第１検光子７２と、 透過軸Ａ２が該試料の３次の非線形電気感受率
χ３の共鳴成分ベクトルχＲに直角に設定され、
分割された該カース光の他方が入射される第２検
光子７８と、 同一入射スリツトから入射された２光束を回折
格子で分散させて、各一対の受光素子が横方向に
対応して配置されかつ一体的に２列配列された２
つのラインセンサで該２光束の各々のスペクトル
を同時に検出するポリクロメータ８４と、 該第１及び第２の検光子から出射される光束を
該入射スリツトに導く光案内手段７４，７６，８
０と、 該第１及び第２のラインセンサから信号を読み
出し、両ラインセンサの対応する各受光素子につ
いて、該第１ラインセンサの出力値Ａ１を該第２
ラインセンサの出力値Ａ２で除することにより規
格化したスペクトルを得る信号処理手段８６，８
８と、 を有することを特徴とするマルチチヤンネルカ
ース測定装置。 ２ パルスレーザから放出される単一光パルスを
２分割し、その一方でポンプ光を生成し、その他
方で色素レーザを励起して広波数域のプローブ光
を生成し、該ポンプ光及び該プローブ光を試料に
対し同一位置に同一時点で照射してカース光を生
成させるカース光生成光学系１０〜６８と、 該カース光が入射され、該カース光を２分割す
るビームスプリツタ７０と、 透過軸Ａ１が該試料の３次の非線形電気感受率
χ３の共鳴成分ベクトルχＲに平行に設定され、
分割された該カース光の一方が入射される第１検
光子７２と、 透過軸Ａ２が該試料の３次の非線形電気感受率
χ３の該共鳴成分ベクトルχＲに直角に設定され
、分割された該カース光の他方が入射される第２
検光子７８と、 同一入射スリツトから入射された２光束を回折
格子で分散させて、各一対の受光素子が横方向に
対応して配置されかつ一体的に２列配列された２
つのラインセンサで該２光束の各々のスペクトル
を同時に検出するポリクロメータ８４と、 該第１及び第２の検光子から出射される光束を
該入射スリツトに導く光案内手段７４，７６，８
０と、 該第１及び第２のラインセンサから信号を読み
出し、両信号値の少なくとも一方を定数倍してラ
マン振動モードから離れた波数域でのこれらの値
Ａ１，Ａ２を等しくし、該ラインセンサの対応す
る各受光素子について、Ａ１−Ａ２／√Ａ２なる
演算を行つてスペクトルを得る信号処理手段８６
，８８と、 を有することを特徴とするマルチチヤンネルカ
ース測定装置。[Claims for Utility Model Registration] 1 A single optical pulse emitted from a pulsed laser is divided into two parts, one of which generates pump light, and the other part of which excites a dye laser to generate probe light in a wide wavenumber range. and a curse light generation optical system 10 to 68 that generates curse light by irradiating the pump light and the probe light onto the sample at the same position at the same time; and the curse light is incident and is divided into two. a beam splitter 70 that
a first analyzer 72 that is set perpendicular to R and into which one of the divided curse lights is incident; set,
A second analyzer 78 receives the other of the split cursed lights, and a second analyzer 78 receives the other of the split cursed lights, and a diffraction grating disperses the two light beams that enter from the same entrance slit, and each pair of light receiving elements are arranged in correspondence with each other in the lateral direction. and 2 integrally arranged in 2 rows.
a polychromator 84 that simultaneously detects the spectra of each of the two light beams with one line sensor; and light guide means 74, 76, 8 for guiding the light beams emitted from the first and second analyzers to the entrance slit.
0 and read signals from the first and second line sensors, and convert the output value A1 of the first line sensor to the second line sensor for each corresponding light receiving element of both line sensors.
The signal processing means 86, 8 obtains a normalized spectrum by dividing the output value A of the line sensor by 2 .
8. A multi-channel curse measuring device comprising: 2 A single optical pulse emitted from a pulsed laser is divided into two, one of which generates pump light, and the other of which excites a dye laser to generate a probe light in a wide wavenumber range, and the pump light and the probe are divided into two. Cursed light generation optical systems 10 to 68 that generate cursed light by irradiating light to the same position on the sample at the same time; a beam splitter 70 that receives the cursed light and splits the cursed light into two; The axis A1 is set parallel to the resonance component vector χR of the third-order nonlinear electric susceptibility χ3 of the sample,
A first analyzer 72 receives one of the divided curse lights, and a transmission axis A2 is set perpendicular to the resonance component vector χR of the third-order nonlinear electric susceptibility χ3 of the sample, and the divided curse light is incident on the first analyzer 72. the second one on which the other of the cursed lights is incident;
The analyzer 78 and the analyzer 78 have two light beams incident from the same entrance slit which are dispersed by a diffraction grating, and each pair of light receiving elements are arranged in correspondence with each other in the horizontal direction and are integrally arranged in two rows.
a polychromator 84 that simultaneously detects the spectra of each of the two light beams with one line sensor; and light guide means 74, 76, 8 for guiding the light beams emitted from the first and second analyzers to the entrance slit.
0, and read signals from the first and second line sensors, multiplying at least one of both signal values by a constant to make these values A 1 and A 2 equal in a wave number range away from the Raman vibration mode, A signal processing means 86 that obtains a spectrum by performing the calculation A 1 −A 2 /√A 2 for each corresponding light receiving element of the line sensor.
, 88, and a multi-channel curse measuring device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3844689U JPH075400Y2 (en) | 1989-03-31 | 1989-03-31 | Multi-channel curse measuring device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3844689U JPH075400Y2 (en) | 1989-03-31 | 1989-03-31 | Multi-channel curse measuring device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0319949U true JPH0319949U (en) | 1991-02-27 |
| JPH075400Y2 JPH075400Y2 (en) | 1995-02-08 |
Family
ID=31546461
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3844689U Expired - Lifetime JPH075400Y2 (en) | 1989-03-31 | 1989-03-31 | Multi-channel curse measuring device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH075400Y2 (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002123201A (en) * | 2000-10-18 | 2002-04-26 | Ys Yamazaki:Kk | Stand with hoisting pole |
| JP2013083460A (en) * | 2011-10-06 | 2013-05-09 | Nippon Telegr & Teleph Corp <Ntt> | Spectrometer |
-
1989
- 1989-03-31 JP JP3844689U patent/JPH075400Y2/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002123201A (en) * | 2000-10-18 | 2002-04-26 | Ys Yamazaki:Kk | Stand with hoisting pole |
| JP2013083460A (en) * | 2011-10-06 | 2013-05-09 | Nippon Telegr & Teleph Corp <Ntt> | Spectrometer |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH075400Y2 (en) | 1995-02-08 |
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