JPH03201470A - Optical semiconductor device - Google Patents

Optical semiconductor device

Info

Publication number
JPH03201470A
JPH03201470A JP1340099A JP34009989A JPH03201470A JP H03201470 A JPH03201470 A JP H03201470A JP 1340099 A JP1340099 A JP 1340099A JP 34009989 A JP34009989 A JP 34009989A JP H03201470 A JPH03201470 A JP H03201470A
Authority
JP
Japan
Prior art keywords
silica powder
epoxy resin
parts
component
optical semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1340099A
Other languages
Japanese (ja)
Other versions
JP2837478B2 (en
Inventor
Yutaka Aoki
豊 青木
Shuji Nishimori
修次 西森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP1340099A priority Critical patent/JP2837478B2/en
Publication of JPH03201470A publication Critical patent/JPH03201470A/en
Application granted granted Critical
Publication of JP2837478B2 publication Critical patent/JP2837478B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Compositions Of Macromolecular Compounds (AREA)
  • Epoxy Resins (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Led Device Packages (AREA)

Abstract

PURPOSE:To obtain sealing resin which is excellent in light transmittance and small in internal stress by a method wherein epoxy resin composition, which contains silica powder and a silane coupling agent, is used, where the refractive index difference between the silica powder and the cured body of the resin component is specified to stay in a specific range. CONSTITUTION:One part of gamma-glycidoxypropyltrimetoxylane as a silane coupling agent is added to 100 parts of silica powder, which is uniformly mixed in methanol and desolvated, and the desolvated substance is thermally treated to form surface treated silica powder. 82 parts of bisphenol A type epoxy resin (liquid resin) whose epoxy equivalent weight is 185, 12 parts of cycloaliphatic epoxy resin (liquid resin) whose epoxy equivalent weight is 252 and which is represented by the structural formula shown below, 100 parts of 4- methylhexahydrophthalic anhydride, 0.4 parts of 2-ethyl-4-methylimidazole, and 90 parts of the above surface treated silica powder are mixed together, and the mixed substance is thermally cured at a temperature of 120 deg.C to obtain an optical semiconductor element sealing resin. The cured body of the sealing resin concerned has such a high value as a light transmittance of 80% at a thickness of 4mm.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、光透過率および低応力性の双方に優れた封
止樹脂により樹脂封止された光半導体装置に関するもの
である。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an optical semiconductor device sealed with a sealing resin that is excellent in both light transmittance and low stress.

(従来の技術〕 LED (発光ダイオード)等の光半導体素子を封止す
る際に用いられる封止用樹脂組成物としては、その硬化
物が透明性を有することが要求され一般に、ビスフェノ
ールA型エポキシ樹脂、脂環式エポキシ樹脂等のエポキ
シ樹脂と、硬化剤に酸無水物とを用いて得られるエポキ
シ樹脂組成物が汎用されている。
(Prior Art) Encapsulating resin compositions used for encapsulating optical semiconductor devices such as LEDs (light emitting diodes) are required to have transparency in their cured products, and are generally made of bisphenol A epoxy. BACKGROUND ART Epoxy resin compositions obtained by using an epoxy resin such as a resin or an alicyclic epoxy resin and an acid anhydride as a curing agent are widely used.

しかし、上記エポキシ樹脂m酸物を封止樹脂として用い
ると、エポキシ樹脂組成物の硬化時の硬化収縮、または
エポキシ樹脂と光半導体素子との線膨張係数の差に起因
する歪みにより内部応力が発生する。その結果、光半導
体素子が劣化し、例えば、光半導体素子が発光素子の場
合、その輝度が低下するという問題が生しる。このため
、従来から、上記内部応力を低減させる方法として、シ
リカ粉末等の線膨張係数の小さい無機粉末を添加してエ
ポキシ樹脂組成物の線膨張係数を小さくし光半導体素子
のそれに近似させる方法が提案され一部で実行されてい
る。
However, when the above epoxy resin m-acid is used as a sealing resin, internal stress is generated due to curing shrinkage of the epoxy resin composition or distortion caused by the difference in linear expansion coefficient between the epoxy resin and the optical semiconductor element. do. As a result, the optical semiconductor element deteriorates, and for example, when the optical semiconductor element is a light emitting element, a problem arises in that its brightness decreases. For this reason, conventionally, as a method of reducing the above-mentioned internal stress, there has been a method of adding an inorganic powder with a small linear expansion coefficient such as silica powder to reduce the linear expansion coefficient of the epoxy resin composition to approximate that of an optical semiconductor element. It has been proposed and implemented in some cases.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、上記方法は、エポキシ樹脂組成物の光透
過率が著しく低下するという光半導体封止用樹脂組成物
としては致命的な欠点を有している。これに対し、上記
欠点を解決するために、樹脂成分とシリカ粉末の屈折率
の差を小さくする方法が提案され実行されている(特開
昭49−23847号)が、単に樹脂成分とシリカ粉末
の屈折率の差を小さくするだけでは、例えば、厚み2M
のエポキシ樹脂組成物硬化体の光透過率は70%程度で
あり、高輝度LED等の高性能光半導体素子の封止用樹
脂組成物としては不充分であり、より光透過率の高い、
しかも低応力性に優れた光半導体封止用樹脂組成物が切
望されている。
However, the above method has a fatal drawback as a resin composition for encapsulating optical semiconductors in that the light transmittance of the epoxy resin composition is significantly reduced. On the other hand, in order to solve the above-mentioned drawbacks, a method of reducing the difference in refractive index between the resin component and the silica powder has been proposed and implemented (Japanese Patent Application Laid-open No. 49-23847). For example, if the difference in refractive index of
The light transmittance of the cured epoxy resin composition is about 70%, which is insufficient as a resin composition for sealing high-performance optical semiconductor elements such as high-brightness LEDs.
In addition, there is a strong desire for a resin composition for encapsulating optical semiconductors that has excellent low stress properties.

この発明は、このような事情に鑑みなされたもので、内
部応力が小さく、しかも光透過性に優れた光半導体装置
に関するものである。
The present invention was made in view of the above circumstances, and relates to an optical semiconductor device that has low internal stress and excellent light transmittance.

〔課題を解決するための手段〕[Means to solve the problem]

上記の目的を達成するため、この発明の光半導体装置は
、下記の(A)〜(E)成分を含み、(D)成分のシリ
カ粉末の屈折率と、(A)〜(C)成分からなるエポキ
シ樹脂硬化体の屈折率との差が±0.01の範囲に設定
されているエポキシ樹脂組成物を用いて光半導体素子を
封止するという構成をとる。
In order to achieve the above object, the optical semiconductor device of the present invention contains the following components (A) to (E), and has the refractive index of the silica powder of the component (D) and the components (A) to (C). The optical semiconductor element is sealed using an epoxy resin composition whose refractive index difference from that of the cured epoxy resin is set within the range of ±0.01.

(A 透明性エポキシ樹脂。(A Transparent epoxy resin.

(B 酸無水物系硬化剤。(B Acid anhydride curing agent.

(C硬化触媒。(C curing catalyst.

(D シリカ粉末。(D Silica powder.

(E シランカップリング剤。(E Silane coupling agent.

(作用〕 すなわち、本発明者らは、内部応力が小さく、しかも光
透過性に優れた封止樹脂を得るために一連の研究を重ね
た。その研究の過程で、上記光透過性が低いのは、樹脂
成分とシリカ粉末との界面の密着性が低いのではないか
と想起し、この密着性を高めるために、さらに研究を重
ねた。その結果、シランカップリング剤を配合しシリカ
粉末を表面処理することにより樹脂成分とシリカ粉末の
界面の密着性を向上させ、シリカ粉末の屈折率をエポキ
シ樹脂硬化体のそれに近似させると、透明で内部応力の
低減された封止樹脂が得られることを見出しこの発明に
到達した。
(Function) In other words, the present inventors conducted a series of studies in order to obtain a sealing resin with low internal stress and excellent light transmittance. Recalling that the adhesion between the resin component and silica powder may be low, they conducted further research to improve this adhesion.As a result, they combined a silane coupling agent to bond the silica powder to the surface. It has been shown that by improving the adhesion of the interface between the resin component and silica powder through treatment and making the refractive index of the silica powder approximate that of the cured epoxy resin, a transparent sealing resin with reduced internal stress can be obtained. Heading arrived at this invention.

この発明に用いるエポキシ樹脂組成物は、透明性エポキ
シ樹脂(A成分)と、酸無水物系硬化剤(B成分)と、
硬化触媒(C成分)と、シリカ粉末(D成分)と、シラ
ンカップリング剤(E成分)とを用いて得られるもので
あって、通常、液状、粉末状もしくはこの粉末を打錠し
たタブレット状になっている。
The epoxy resin composition used in this invention includes a transparent epoxy resin (component A), an acid anhydride curing agent (component B),
It is obtained using a curing catalyst (component C), silica powder (component D), and a silane coupling agent (component E), and is usually in liquid, powder, or tablet form made by compressing this powder. It has become.

上記A成分(透明性エポキシ樹脂)としては、ビスフェ
ノール型エポキシ樹脂、脂環式エポキシ樹脂が透明性を
有するために好ましいが、場合により他のエポキシ樹脂
を併用してもよい。そして、上記他のエポキシ樹脂を用
いる場合、その使用割合は、通常、エポキシ樹脂全体の
50重量%(以下「%」と略す)以下に設定するのが好
適である。このようなエポキシ樹脂としては、一般に、
エポキシ当量100〜1000.軟化点120″C以下
のものが用いられる。なお、上記透明性エポキシ樹脂の
透明性とは、着色透明の場合をも含み、厚み1閣相当で
、600nmの波長の光透過率が80〜10「魯いう(
分光光度計により測定)。l上記A成分(透明性エポキ
シ樹脂)とともに用いられるB成分(酸無水物系硬化剤
)としては、分子量140〜200程度のものが好まし
く用いられ、例えば、ヘキサヒドロ無水フタル酸、テト
ラヒドロ無水フタル酸。メチルへキサヒドロ無水フタル
酸、メチルテトラヒドロ無水フタル酸等の無色ないし淡
黄色の酸無水物があげられる。上記B成分(酸無水物系
硬化剤)の配合量は、上記A成分(透明性エポキシ樹脂
)100重量部(以下「部」と略す)に対して50〜2
00部の範囲に設定することが好ましい。
As the component A (transparent epoxy resin), bisphenol type epoxy resins and alicyclic epoxy resins are preferred because they have transparency, but other epoxy resins may be used in combination depending on the case. When the other epoxy resins mentioned above are used, it is usually preferable to set the proportion thereof to 50% by weight (hereinafter abbreviated as "%") of the entire epoxy resin. Generally, such epoxy resins include:
Epoxy equivalent: 100-1000. The one used is one with a softening point of 120''C or less.The transparency of the transparent epoxy resin mentioned above includes the case of colored transparent epoxy resin, which is equivalent to a thickness of 1 mm, and has a light transmittance of 80 to 10 at a wavelength of 600 nm. “Luu (
(measured by spectrophotometer). Component B (acid anhydride curing agent) used together with Component A (transparent epoxy resin) is preferably one having a molecular weight of about 140 to 200, such as hexahydrophthalic anhydride and tetrahydrophthalic anhydride. Examples include colorless to pale yellow acid anhydrides such as methylhexahydrophthalic anhydride and methyltetrahydrophthalic anhydride. The blending amount of the above B component (acid anhydride curing agent) is 50 to 2 parts by weight per 100 parts by weight (hereinafter abbreviated as "parts") of the above A component (transparent epoxy resin).
It is preferable to set the amount in the range of 0.00 parts.

上記A成分(透明性エポキシ樹脂)、B成分(酸無水物
硬化剤)とともに用いられるC成分(硬化触媒)として
は、第三級アミン、イミダゾール化合物および有機金属
錯塩等があげられる。
Examples of component C (curing catalyst) used together with component A (transparent epoxy resin) and component B (acid anhydride curing agent) include tertiary amines, imidazole compounds, and organic metal complex salts.

なお、上記り成分(シリカ粉末)と、上記A〜C成分か
らなるエポキシ樹脂組成物硬化体の屈折率との差を±0
.01の範囲に設定する方法としては、下記の■〜■の
方法があげられる。
Note that the difference between the refractive index of the above component (silica powder) and the cured epoxy resin composition consisting of the above components A to C is ±0.
.. Examples of methods for setting the value in the range of 01 include methods ① to ② below.

■ 上記A−C成分からなるエポキシ樹脂組成物硬化体
のみの屈折率を調節する方法(例えば、A成分の種類の
選択、A成分の2種類以上の併用あるいはB成分の種類
の選択、B成分の2種類以上の併用等)。
■ A method of adjusting the refractive index of only the cured epoxy resin composition consisting of the above A-C components (for example, selection of the type of A component, combination of two or more types of A component, selection of the type of B component, combination of two or more types, etc.).

■ D成分(シリカ粉末)の屈折率を調節する方法。■ Method of adjusting the refractive index of component D (silica powder).

■ 上記のおよび■を併用する方法。■ Method of using the above and ■ together.

そして、上記A成分(透明性エポキシ樹脂)。and the above-mentioned component A (transparent epoxy resin).

B$、分(酸無水物硬化剤)、C成分(硬化触媒)とと
もに用いられるD成分(シリカ粉末)としては、溶融性
のものが用いられ、好ましくはシリカ粉末自体の屈折率
を上記■の方法にしたがい調節されたものがあげられる
。具体的には、シリカ粉末に微量の酸化鉛、酸化チタン
等の金属酸化物を混入することによりシリカ粉末自体の
屈折率(通常約1.40 )を調節してエポキシ樹脂の
屈折率(通常約1.50 )に近似させるのが一般的で
ある。
As component D (silica powder) used together with component B (acid anhydride curing agent) and component C (curing catalyst), a meltable component is used, and preferably the refractive index of the silica powder itself is set to Examples include those adjusted according to the method. Specifically, by mixing small amounts of metal oxides such as lead oxide and titanium oxide into silica powder, the refractive index of the silica powder itself (usually about 1.40) is adjusted, and the refractive index of the epoxy resin (usually about 1.40) is adjusted. 1.50).

このようなシリカ粉末としては、平均粒径3〜60μm
のものを用いるのが好ましい。すなわち、平均粒径が3
μm未満であると粘度が高くなりエポキシ樹脂組成物の
成形性が劣化し、60μmを超えると光半導体素子に損
傷を与える可能性が高くなるからである。さらに、シリ
カ粉末の含有量は、エポキシ樹脂組成物全体の10〜7
0%の範囲に設定するのが好適である。
Such silica powder has an average particle size of 3 to 60 μm.
It is preferable to use That is, the average particle size is 3
This is because if it is less than 60 μm, the viscosity becomes high and the moldability of the epoxy resin composition deteriorates, and if it exceeds 60 μm, there is a high possibility of damaging the optical semiconductor element. Furthermore, the content of silica powder is 10-7% of the total epoxy resin composition.
It is preferable to set it in the range of 0%.

上記A成分(透明性エポキシ樹脂)、B成分(酸無水物
硬化剤)、C成分(硬化触媒)およびD成分(シリカ粉
末)とともに用いられるEry、分(シランカップリン
グ剤)としては、エポキシ基またはアミノ基を有するも
のが好ましく、具体的には、エポキシ基を有するものと
して、β−(3゜4−エポキシシクロヘキシル)エチル
トリメトキシシラン、γ−グリシドキシプロビルトリメ
トキシシラン、T−グリシドキシプロピルメチルジェト
キシシラン等があげられ、アミノ基を有するものとして
は、N−β−アミノエチル−γ−アミノプロピルトリメ
トキシシラン、N−β−アミノエチル−T−アミノプロ
ピルメチルジメトキシシラン、T−アくノプロピルトリ
エトキシシラン、Nフェニル−γ−ア≧ノプロピルトリ
メトキシシラン等があげられる。上記Ed分(シランカ
ップリング剤)の使用量は、D成分(シリカ粉末)に対
して0.5〜3%の範囲内に設定するのが好適である。
The Ery and Min (silane coupling agent) used together with the above A component (transparent epoxy resin), B component (acid anhydride curing agent), C component (curing catalyst) and D component (silica powder) are epoxy groups. or those having an amino group are preferred. Specifically, those having an epoxy group include β-(3゜4-epoxycyclohexyl)ethyltrimethoxysilane, γ-glycidoxypropyltrimethoxysilane, T-glycidoxypropyltrimethoxysilane, Examples include sidoxypropylmethyljethoxysilane, and those having an amino group include N-β-aminoethyl-γ-aminopropyltrimethoxysilane, N-β-aminoethyl-T-aminopropylmethyldimethoxysilane, Examples include T-acnopropyltriethoxysilane, N-phenyl-γ-a≧nopropyltrimethoxysilane, and the like. The amount of the Ed component (silane coupling agent) used is preferably set within the range of 0.5 to 3% based on the D component (silica powder).

なお、この発明に用いるエポキシ樹脂組成物には、上記
A−E戒分塩分以外必要に応じて染料。
In addition, the epoxy resin composition used in this invention may contain dyes, if necessary, in addition to the above-mentioned A-E prescriptive salts.

変性剤、変色防止剤、老化防止剤、離型剤2反応性ない
し非反応性の希釈剤等の従来公知の添加剤を適宜配合す
ることができる。
Conventionally known additives such as a modifier, an anti-discoloration agent, an anti-aging agent, a mold release agent, a reactive or non-reactive diluent, and the like can be appropriately blended.

そして、この発明に用いるエポキシ樹脂組成物として、
上記A成分、B成分およびC成分からなるエポキシ樹脂
硬化体の屈折率と、上記り成分(シリカ粉末の屈折率と
の差が、±0.01以内のものを用いる必要がある。な
お、上記屈折率はアツヘ屈折計を用いて測定される。
And, as an epoxy resin composition used in this invention,
It is necessary to use one in which the difference between the refractive index of the cured epoxy resin consisting of the above A component, B component and C component and the refractive index of the above component (silica powder) is within ±0.01. Refractive index is measured using an Atsuh refractometer.

この発明に用いる上記エポキシ樹脂組成物は、例えばつ
ぎのようにして製造することができる。
The epoxy resin composition used in this invention can be produced, for example, as follows.

すなわち、上記A−E成分および従来公知の添加剤を配
合して溶融混合したのち、これを室温に冷却して公知の
手段により粉砕し必要に応じて打錠することにより製造
することができる。また、上記エポキシ樹脂組成物が液
状物の場合は、上記各成分を混合するのみでよい。なお
、上記製法において、各成分を混合するまえに、予めシ
ランカップリング剤を用いてシリカ粉末表面を表面処理
するのが光透過性および低応力性の向上の観点から効果
的である。この場合の表面処理方法としては、例えばメ
タノール中で、シランカップリング剤とシリカ粉末を均
一に混合し脱溶媒した後、約100°Cで約2時間熱処
理する方法があげられる。
That is, it can be produced by blending and melt-mixing the above-mentioned A-E components and conventionally known additives, cooling the mixture to room temperature, pulverizing it by known means, and tableting as necessary. Moreover, when the said epoxy resin composition is a liquid material, it is sufficient to just mix each said component. In the above manufacturing method, it is effective to previously treat the surface of the silica powder with a silane coupling agent before mixing each component from the viewpoint of improving light transmittance and low stress properties. In this case, the surface treatment method includes, for example, a method of uniformly mixing the silane coupling agent and silica powder in methanol, removing the solvent, and then heat-treating the mixture at about 100° C. for about 2 hours.

このようなエポキシ樹脂組成物を用いての光半導体素子
め封止は、特に限定するものではなく、通常のトランス
ファー成形、注型等の公知のモールド方法により行うこ
とができる。
The encapsulation of an optical semiconductor element using such an epoxy resin composition is not particularly limited, and can be performed by a known molding method such as ordinary transfer molding or casting.

このようにして得られる光半導体装置は、透明性に優れ
、内部応力が極めて小さく高い信頼性を備えている。こ
れは、シランカップリング剤を配合することによりシリ
カ粉末の表面処理がなされ、樹脂成分とシリカ粉末の界
面の密着性が向上し、しかも樹脂成分の硬化体とシリカ
粉末の屈折率の差が非常に小さいからであると考えられ
る。
The optical semiconductor device thus obtained has excellent transparency, extremely low internal stress, and high reliability. This is because the silica powder is surface-treated by adding a silane coupling agent, which improves the adhesion at the interface between the resin component and the silica powder. This is thought to be because it is relatively small.

[発明の効果] 以上のように、この発明の光半導体装置は、シリカ粉末
、シランカップリング剤を含み、しかもシリカ粉末と樹
脂成分の硬化体との屈折率の差が特定の範囲内であるエ
ポキシ樹脂組成物を用いて光半導体素子を樹脂封止して
構成されているため、その封止樹脂が光透過性に優れ、
しかも内部応力が小さく、例えば発光素子の輝度劣化の
抑制等のなされた信頼性の極めて高いものである。
[Effects of the Invention] As described above, the optical semiconductor device of the present invention contains silica powder and a silane coupling agent, and the difference in refractive index between the silica powder and the cured product of the resin component is within a specific range. Since the optical semiconductor element is resin-sealed using an epoxy resin composition, the sealing resin has excellent light transmittance,
Moreover, the internal stress is small, and the reliability is extremely high because, for example, deterioration in brightness of the light emitting element is suppressed.

つぎに、実施例について比較例と併せて説明する。Next, examples will be described together with comparative examples.

(実施例1〕 屈折率が1.536で、平均粒径25μmのシリカ粉末
(金属酸化物が混入されている)100部に、シランカ
ップリング剤としてT−グリシドキシプロピルトリメト
キシシランを上記シリカ粉末に対して1部添加したもの
を、メタノール中で均一に混合し脱溶媒した後、約10
0°Cで約2時間熱処理することにより表面処理シリカ
粉末を得た。
(Example 1) T-glycidoxypropyltrimethoxysilane as a silane coupling agent was added to 100 parts of silica powder (containing metal oxide) having a refractive index of 1.536 and an average particle size of 25 μm. After uniformly mixing 1 part of silica powder in methanol and removing the solvent,
Surface-treated silica powder was obtained by heat treatment at 0°C for about 2 hours.

つき゛に、エポキシ当量185のビスフェノールA型エ
ポキシ樹脂(液状樹脂)を82部、下記の構造式で表さ
れるエポキシ当W252の脂環式エポキシ樹脂(液状樹
脂)12部、 OりtLCH20C−工圧し0 1 4−メチルへキサヒドロ無水フタル酸100部、2−エ
チル−4−メチルイミダゾール0.4部(上記配合樹脂
組成物の硬化体の屈折率は1.536である)に、上記
表面処理シリカ粉末を90部添加混合したものを120
 ’Cで熱硬化させシリカ粉末含有エポキシ樹脂組酸物
硬化体を得た。この硬化体の光透過率は厚み4mmで8
0%という高い値であった。
Therefore, 82 parts of bisphenol A type epoxy resin (liquid resin) with an epoxy equivalent weight of 185, 12 parts of an alicyclic epoxy resin (liquid resin) with an epoxy equivalent weight of W252 represented by the structural formula below, and 12 parts of a bisphenol A type epoxy resin (liquid resin) with an epoxy equivalent weight of 185. 0 1 100 parts of 4-methylhexahydrophthalic anhydride, 0.4 parts of 2-ethyl-4-methylimidazole (the refractive index of the cured product of the blended resin composition is 1.536), and the surface-treated silica 120 parts of powder mixed with 90 parts
The mixture was thermally cured at C to obtain a cured acid product containing silica powder-containing epoxy resin. The light transmittance of this cured product is 8 at a thickness of 4 mm.
It was a high value of 0%.

(実施例2〕 屈折率が1.510で、平均粒径25μmのシリカ粉末
(金属酸化物が混入されている)100部にらシランカ
ップリング剤としてβ−(3,4エポキシシクロヘキシ
ル)エチルトリメトキシシランを上記シリカ粉末に対し
て1部添加したものを、メタノール中で均一に混合し脱
溶媒した後、約100 ’Cで約2時間熱処理すること
により表面処理シリカ粉末を得た。
(Example 2) 100 parts of silica powder (containing metal oxide) with a refractive index of 1.510 and an average particle size of 25 μm was used as a silane coupling agent, β-(3,4 epoxycyclohexyl)ethyltri One part of methoxysilane was added to the above silica powder, mixed uniformly in methanol, solvent removed, and then heat treated at about 100'C for about 2 hours to obtain surface-treated silica powder.

つぎに、エポキシ当量185のビスフェノールA型エポ
キシ樹脂(液状樹脂)を17部、下記の構造式で表され
るエポキシ当量252の脂環式エポキシ樹脂83部、 4−メチルへキサヒドロ無水フタル酸l00部、2−エ
チル−4−メチルイミダゾール0.4部(上記配合樹脂
組成物の硬化体の屈折率は1.510である)に、上記
表面処理シリカ粉末を90部添加混合したものを120
°Cで熱硬化させシリカ粉末含有エポキシ樹脂組成物硬
化体を得た。この硬化体の光透過率は厚み4mmで85
%という高い値であった。
Next, 17 parts of bisphenol A type epoxy resin (liquid resin) with an epoxy equivalent of 185, 83 parts of an alicyclic epoxy resin with an epoxy equivalent of 252 represented by the structural formula below, and 100 parts of 4-methylhexahydrophthalic anhydride. , 0.4 parts of 2-ethyl-4-methylimidazole (the refractive index of the cured product of the above blended resin composition is 1.510) was mixed with 90 parts of the above surface-treated silica powder.
It was thermally cured at °C to obtain a cured epoxy resin composition containing silica powder. The light transmittance of this cured product is 85 at a thickness of 4 mm.
It was a high value of %.

(実施例3〕 屈折率が1.531で、平均粒径20μmのシリカ粉末
(金属酸化物が混入されている)100部に、シランカ
ップリング剤としてT−アミノプロピルトリエトキシシ
ランを上記シリカ粉末に対して1部添加したものを、メ
タノール中で均一に混合し脱溶媒した後、約100°C
で約2時間熱処理することにより表面処理シリカ粉末を
得た。
(Example 3) T-aminopropyltriethoxysilane was added as a silane coupling agent to 100 parts of silica powder (containing a metal oxide) having a refractive index of 1.531 and an average particle size of 20 μm, and the above silica powder was added. After uniformly mixing in methanol and removing the solvent, heat at approximately 100°C.
A surface-treated silica powder was obtained by heat treatment for about 2 hours.

つぎに、エポキシ当量185のビスフェノールA型エポ
キシ樹脂を67部、エポキシ当量240のビスフェノー
ルAF型エポキシ樹脂(液状樹脂)を33部、4−メチ
ルへキサヒドロ無水フタル酸100部、2−エチル−4
−メチルイミダゾール0.4部(上記配合樹脂組成物の
硬化体の屈折率は1.536である)に、上記表面処理
シリカ粉末を90部添加混合したものを120 ’Cで
熱硬化させシリカ粉末含有エポキシ樹脂組成物硬化体を
得た。この硬化体の光透過率は厚み4肋で80%という
高い値であった。
Next, 67 parts of bisphenol A type epoxy resin with an epoxy equivalent of 185, 33 parts of bisphenol AF type epoxy resin (liquid resin) with an epoxy equivalent of 240, 100 parts of 4-methylhexahydrophthalic anhydride, and 2-ethyl-4
- Add and mix 90 parts of the above surface-treated silica powder to 0.4 parts of methylimidazole (the refractive index of the cured product of the above blended resin composition is 1.536), and heat cure the mixture at 120'C to powder the silica powder. A cured product of the containing epoxy resin composition was obtained. The light transmittance of this cured product was as high as 80% at a thickness of 4 ribs.

[比較例1] シランカップリング剤によるシリカ粉末の表面処理を行
わなかった。それ以外は実施例1と同様にしてシリカ粉
末含有エポキシ樹脂組成物硬化体を得た。この硬化体の
光透過率は厚み4mmで約50%であった。
[Comparative Example 1] Surface treatment of silica powder with a silane coupling agent was not performed. A cured epoxy resin composition containing silica powder was obtained in the same manner as in Example 1 except for the above. The light transmittance of this cured product was about 50% at a thickness of 4 mm.

〔比較例2] シランカップリング剤によるシリカ粉末の表面処理を行
わなかった。それ以外は実施例2と同様にしてシリカ粉
末含有エポキシ樹脂組成物硬化体を得た。この硬化体の
光透過率は厚み4Mで約50%であった。
[Comparative Example 2] Surface treatment of silica powder with a silane coupling agent was not performed. A cured epoxy resin composition containing silica powder was obtained in the same manner as in Example 2 except for the above. The light transmittance of this cured product was about 50% at a thickness of 4M.

(比較例3] シランカップリング剤によるシリカ粉末の表面処理を行
わなかった。それ以外は実施例2と同様にしてシリカ粉
末含有エポキシ樹脂組成物硬化体を得た。この硬化体の
光透過率は厚み4mmで約50%であった。
(Comparative Example 3) Surface treatment of silica powder with a silane coupling agent was not performed.Other than that, a cured product of an epoxy resin composition containing silica powder was obtained in the same manner as in Example 2.Light transmittance of this cured product was about 50% at a thickness of 4 mm.

〔実施例4〕 表面処理シリカ粉末の配合量を90部から200部に変
えた。それ以外は実施例1と同様にしてシリカ粉末含有
エポキシ樹脂組成物硬化体を得た。この硬化体の光透過
率は厚み4mmで約70%であった。
[Example 4] The amount of surface-treated silica powder was changed from 90 parts to 200 parts. A cured epoxy resin composition containing silica powder was obtained in the same manner as in Example 1 except for the above. The light transmittance of this cured product was about 70% at a thickness of 4 mm.

[実施例5〕 表面処理シリカ粉末の配合量を90部から60部に変え
た。それ以外は実施例2と同様にしてシリカ粉末含有エ
ポキシ樹脂組成物硬化体を得た。
[Example 5] The amount of surface-treated silica powder was changed from 90 parts to 60 parts. A cured epoxy resin composition containing silica powder was obtained in the same manner as in Example 2 except for the above.

この硬化体の光透過率は厚み4鵬で約85%であった。The light transmittance of this cured product was about 85% at a thickness of 4 mm.

〔実施例6〕 表面処理シリカ粉末の配合量を90部から370部に変
えた。それ以外は実施例3と同様にしてシリカ粉末含有
エポキシ樹脂組成物硬化体を得た。この硬化体の光透過
率は厚み4 mmで約70%であった。
[Example 6] The amount of surface-treated silica powder was changed from 90 parts to 370 parts. A cured epoxy resin composition containing silica powder was obtained in the same manner as in Example 3 except for the above. The light transmittance of this cured product was approximately 70% at a thickness of 4 mm.

〔比較例4] シリカ粉末を用いずに、ビスフェノールA型エポキシ樹
脂(液状樹脂)100部、4−メチルへキサフルヒドロ
無水フタル酸100部、2−エチル−4−メチルイミダ
ゾール0.4部を用いて添加混合してエポキシ樹脂組成
物を得た。
[Comparative Example 4] Using 100 parts of bisphenol A type epoxy resin (liquid resin), 100 parts of 4-methylhexafluhydrophthalic anhydride, and 0.4 parts of 2-ethyl-4-methylimidazole without using silica powder. They were added and mixed to obtain an epoxy resin composition.

つぎに、上記実施例1〜6および比較例4で得られたエ
ポキシ樹脂組成物を用いて発光ダイオードを注型により
樹脂封止して光半導体装置を作製した。そして、この光
半導体装置の通電輝度劣化を測定した。その結果を下記
の表に示す。なお、上記通電輝度劣化の測定方法は、つ
ぎのようにして行った。すなわち、上記光半導体装置(
LEDデバイス)に定電流を流し、輝度として電流印加
5秒後の受光素子の出力電流値を求め劣化率を測定した
Next, a light emitting diode was resin-sealed by casting using the epoxy resin compositions obtained in Examples 1 to 6 and Comparative Example 4 to produce an optical semiconductor device. Then, the deterioration of the energized brightness of this optical semiconductor device was measured. The results are shown in the table below. Note that the above-mentioned method for measuring the deterioration in energization brightness was performed as follows. That is, the above optical semiconductor device (
A constant current was applied to the LED device (LED device), and the output current value of the light-receiving element 5 seconds after the current application was determined as the brightness, and the deterioration rate was measured.

パッケージ:直径5mmのパイロットランプ。Package: 5mm diameter pilot lamp.

評価素子: GaAs、0.5mmX0.5mm。Evaluation element: GaAs, 0.5mm x 0.5mm.

評価条件: −30”C放置で20mA通電の1000
時間後の輝度劣化率を測定した。
Evaluation conditions: -30"C, 20mA current, 1000
The brightness deterioration rate after time was measured.

(以下余白) 上記表の結果から、実施測高は比較別品に比べて輝度劣
化が抑制され、光透過性とともに低応力性も向上してい
ることがわかる。
(The following is a margin.) From the results in the above table, it can be seen that the actual height measurement has suppressed brightness deterioration and has improved light transmittance and low stress property compared to the comparative product.

Claims (6)

【特許請求の範囲】[Claims] (1)下記の(A)〜(E)成分を含み、(D)成分の
シリカ粉末の屈折率と、(A)〜(C)成分からなるエ
ポキシ樹脂硬化体の屈折率との差が±0.01の範囲に
設定されているエポキシ樹脂組成物を用いて光半導体素
子を封止してなる光半導体装置。 (A)透明性エポキシ樹脂。 (B)酸無水物系硬化剤。 (C)硬化触媒。 (D)シリカ粉末。 (E)シランカップリング剤。
(1) Contains the following components (A) to (E), and the difference between the refractive index of the silica powder of component (D) and the refractive index of the cured epoxy resin body consisting of components (A) to (C) is ± An optical semiconductor device in which an optical semiconductor element is sealed using an epoxy resin composition set in a range of 0.01. (A) Transparent epoxy resin. (B) Acid anhydride curing agent. (C) Curing catalyst. (D) Silica powder. (E) Silane coupling agent.
(2)(E)成分のシランカップリング剤が、エポキシ
基またはアミノ基を有するものである請求項(1)記載
の光半導体装置。
(2) The optical semiconductor device according to claim (1), wherein the silane coupling agent as component (E) has an epoxy group or an amino group.
(3)(D)成分のシリカ粉末の含有量が、エポキシ樹
脂組成物全体の10〜70重量%である請求項(1)ま
たは(2)記載の光半導体装置。
(3) The optical semiconductor device according to claim 1 or 2, wherein the content of the silica powder as component (D) is 10 to 70% by weight of the entire epoxy resin composition.
(4)(A)成分の透明性エポキシ樹脂が、ビスフェノ
ール型エポキシ樹脂および脂環式エポキシ樹脂の少なく
とも一方である請求項(1)ないし(3)のいずれか一
項に記載の光半導体装置。
(4) The optical semiconductor device according to any one of claims (1) to (3), wherein the transparent epoxy resin of component (A) is at least one of a bisphenol type epoxy resin and an alicyclic epoxy resin.
(5)(D)成分のシリカ粉末が、平均粒径3〜60μ
mの範囲のものである請求項(1)ないし(4)のいず
れか一項に記載の光半導体装置。
(5) The silica powder of component (D) has an average particle size of 3 to 60μ
The optical semiconductor device according to any one of claims (1) to (4), wherein the optical semiconductor device has a range of m.
(6)下記の(A)〜(E)成分を含み、(D)成分の
シリカ粉末の屈折率と、(A)〜(C)成分からなるエ
ポキシ樹脂硬化体の屈折率との差が±0.01の範囲に
設定されている光半導体封止用エポキシ樹脂組成物。 (A)透明性エポキシ樹脂。 (B)酸無水物系硬化剤。 (C)硬化触媒。 (D)シリカ粉末。 (E)シランカップリング剤。
(6) Contains the following components (A) to (E), and the difference between the refractive index of the silica powder of component (D) and the refractive index of the cured epoxy resin body consisting of components (A) to (C) is ± An epoxy resin composition for encapsulating optical semiconductors set in a range of 0.01. (A) Transparent epoxy resin. (B) Acid anhydride curing agent. (C) Curing catalyst. (D) Silica powder. (E) Silane coupling agent.
JP1340099A 1989-12-28 1989-12-28 Optical semiconductor device Expired - Lifetime JP2837478B2 (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6221510B1 (en) * 1998-04-23 2001-04-24 Nitto Denko Corporation Epoxy resin composition for encapsulating photosemiconductor element and photosemiconductor device
WO2002065542A3 (en) * 2001-02-12 2003-07-31 Ibm Underfill compositions
JP2005327777A (en) * 2004-05-12 2005-11-24 Shin Etsu Chem Co Ltd Silicone resin composition for light emitting diode
US7009008B1 (en) * 1999-08-04 2006-03-07 Osram Gmbh Transparent liquid resin material for SMT-enabled led-applications at higher temperatures and higher luminosities
CN102030970A (en) * 2010-11-23 2011-04-27 上海旌纬微电子科技有限公司 Epoxy resin composition for packaging electronic element and preparation method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4923847A (en) * 1972-06-28 1974-03-02
JPS607153A (en) * 1983-06-24 1985-01-14 Denki Kagaku Kogyo Kk Epoxy-resin-conposition sealing type semiconductor device
JPH01242658A (en) * 1988-03-25 1989-09-27 Sumitomo Bakelite Co Ltd Epoxy resin composition for semiconductor sealing

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4923847A (en) * 1972-06-28 1974-03-02
JPS607153A (en) * 1983-06-24 1985-01-14 Denki Kagaku Kogyo Kk Epoxy-resin-conposition sealing type semiconductor device
JPH01242658A (en) * 1988-03-25 1989-09-27 Sumitomo Bakelite Co Ltd Epoxy resin composition for semiconductor sealing

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6221510B1 (en) * 1998-04-23 2001-04-24 Nitto Denko Corporation Epoxy resin composition for encapsulating photosemiconductor element and photosemiconductor device
US7009008B1 (en) * 1999-08-04 2006-03-07 Osram Gmbh Transparent liquid resin material for SMT-enabled led-applications at higher temperatures and higher luminosities
WO2002065542A3 (en) * 2001-02-12 2003-07-31 Ibm Underfill compositions
JP2005327777A (en) * 2004-05-12 2005-11-24 Shin Etsu Chem Co Ltd Silicone resin composition for light emitting diode
KR101136643B1 (en) * 2004-05-12 2012-04-18 신에쓰 가가꾸 고교 가부시끼가이샤 Silicone Resin Composition for Light Emitting Diode
CN102030970A (en) * 2010-11-23 2011-04-27 上海旌纬微电子科技有限公司 Epoxy resin composition for packaging electronic element and preparation method thereof

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