JPH03203394A - Manufacture of insulating substrate with thin metallic layer and manufacture of wiring board using insulating substrate manufactured thereby - Google Patents
Manufacture of insulating substrate with thin metallic layer and manufacture of wiring board using insulating substrate manufactured therebyInfo
- Publication number
- JPH03203394A JPH03203394A JP34335189A JP34335189A JPH03203394A JP H03203394 A JPH03203394 A JP H03203394A JP 34335189 A JP34335189 A JP 34335189A JP 34335189 A JP34335189 A JP 34335189A JP H03203394 A JPH03203394 A JP H03203394A
- Authority
- JP
- Japan
- Prior art keywords
- insulating substrate
- layer
- substrate
- copper
- thin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 53
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 21
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 34
- 238000000034 method Methods 0.000 claims abstract description 34
- 229910052751 metal Inorganic materials 0.000 claims abstract description 31
- 239000002184 metal Substances 0.000 claims abstract description 31
- 229910052802 copper Inorganic materials 0.000 claims abstract description 24
- 239000010949 copper Substances 0.000 claims abstract description 24
- 239000011888 foil Substances 0.000 claims abstract description 19
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 claims abstract description 10
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract description 10
- 229910052804 chromium Inorganic materials 0.000 claims abstract description 10
- 239000011651 chromium Substances 0.000 claims abstract description 10
- 229910001220 stainless steel Inorganic materials 0.000 claims abstract description 10
- 239000010935 stainless steel Substances 0.000 claims abstract description 10
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims abstract description 5
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052750 molybdenum Inorganic materials 0.000 claims abstract description 5
- 239000011733 molybdenum Substances 0.000 claims abstract description 5
- 229910052759 nickel Inorganic materials 0.000 claims abstract description 5
- 239000010936 titanium Substances 0.000 claims abstract description 5
- 229910052719 titanium Inorganic materials 0.000 claims abstract description 5
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052721 tungsten Inorganic materials 0.000 claims abstract description 5
- 239000010937 tungsten Substances 0.000 claims abstract description 5
- 229910052720 vanadium Inorganic materials 0.000 claims abstract description 5
- WPBNNNQJVZRUHP-UHFFFAOYSA-L manganese(2+);methyl n-[[2-(methoxycarbonylcarbamothioylamino)phenyl]carbamothioyl]carbamate;n-[2-(sulfidocarbothioylamino)ethyl]carbamodithioate Chemical compound [Mn+2].[S-]C(=S)NCCNC([S-])=S.COC(=O)NC(=S)NC1=CC=CC=C1NC(=S)NC(=O)OC WPBNNNQJVZRUHP-UHFFFAOYSA-L 0.000 claims abstract description 4
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 claims abstract 3
- 238000005530 etching Methods 0.000 claims description 10
- 239000002245 particle Substances 0.000 claims description 3
- 229920006254 polymer film Polymers 0.000 claims description 3
- 238000010030 laminating Methods 0.000 claims description 2
- 238000007747 plating Methods 0.000 claims description 2
- 230000003746 surface roughness Effects 0.000 claims description 2
- 150000002736 metal compounds Chemical class 0.000 claims 1
- 230000001070 adhesive effect Effects 0.000 abstract description 5
- 239000010408 film Substances 0.000 abstract 2
- 239000010409 thin film Substances 0.000 abstract 1
- 239000010410 layer Substances 0.000 description 41
- 239000011889 copper foil Substances 0.000 description 10
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 6
- 239000011521 glass Substances 0.000 description 6
- 238000004544 sputter deposition Methods 0.000 description 5
- 239000000654 additive Substances 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 229910052782 aluminium Inorganic materials 0.000 description 4
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 229920001721 polyimide Polymers 0.000 description 4
- 239000010953 base metal Substances 0.000 description 3
- 238000007772 electroless plating Methods 0.000 description 3
- 239000004744 fabric Substances 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- -1 polyethylene Polymers 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 239000004593 Epoxy Substances 0.000 description 2
- ROOXNKNUYICQNP-UHFFFAOYSA-N ammonium persulfate Chemical compound [NH4+].[NH4+].[O-]S(=O)(=O)OOS([O-])(=O)=O ROOXNKNUYICQNP-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000005566 electron beam evaporation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 238000007738 vacuum evaporation Methods 0.000 description 2
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000004809 Teflon Substances 0.000 description 1
- 229920006362 Teflon® Polymers 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 229910001870 ammonium persulfate Inorganic materials 0.000 description 1
- CXOWYMLTGOFURZ-UHFFFAOYSA-N azanylidynechromium Chemical compound [Cr]#N CXOWYMLTGOFURZ-UHFFFAOYSA-N 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 150000007530 organic bases Chemical class 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 229920005992 thermoplastic resin Polymers 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Landscapes
- Laminated Bodies (AREA)
- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は、高密度配線板の製造に使用される金属薄層付
絶縁基板の製造法及びその金属薄層付絶縁基板を使用し
た配線板の製造法に関する。Detailed Description of the Invention (Field of Industrial Application) The present invention relates to a method for manufacturing an insulating substrate with a thin metal layer used for manufacturing high-density wiring boards, and a wiring board using the insulating substrate with a thin metal layer. Concerning the manufacturing method.
(従来の技術)
配線板の製造に使用される銅張り積層板としては、ステ
ンレススチールの回転ドラム上に電解析出させた銅箔と
紙やガラス基材に熱硬化樹脂を含浸させたプリプレグと
を積層したものがある。(Prior technology) Copper-clad laminates used for manufacturing wiring boards include copper foil electrolytically deposited on a rotating stainless steel drum and prepreg made of paper or glass substrate impregnated with thermosetting resin. There are some that are laminated.
またフレキシブル配線板の製造に使用される銅箔付フィ
ルムとしては、例えばポリイミドフィルムと圧延銅箔と
を接着剤を介して熱圧着したものがある。これらの場合
、銅箔の厚さとしては、18μm135μm150μm
程度と厚いものが主流である。Further, as a copper foil-attached film used for manufacturing a flexible wiring board, there is, for example, a film made by thermocompression bonding a polyimide film and a rolled copper foil through an adhesive. In these cases, the thickness of the copper foil is 18 μm, 135 μm, 150 μm.
Medium and thick ones are the mainstream.
上記のような銅張り積層板あるいは銅箔付フィルムを使
った配線板の製造法としては、銅張り積層板等をエツチ
ングして回路加工を行うエツチドフォイル法や、銅箔を
レジスト形成用表面処理を施した後、レジスト形成−厚
付けめっき−レジスト除去−クイックエツチングによる
回路加工を行うセミアデイティブ法等がある。Manufacturing methods for wiring boards using copper-clad laminates or films with copper foil as described above include the etched foil method, in which circuit processing is performed by etching copper-clad laminates, etc., and the etched foil method, in which copper foil is used as a resist-forming surface. After processing, there is a semi-additive method in which circuit processing is performed by resist formation, thick plating, resist removal, and quick etching.
エツチドフォイル法は、サイドエツチングの問題があり
高密度配線の形成は困難である。The etched foil method has the problem of side etching, making it difficult to form high-density wiring.
セミアデイティブ法に於ける配線の微細・高密度化は下
地金属層(銅箔)の厚さに依存している。The fineness and high density of wiring in the semi-additive method depends on the thickness of the underlying metal layer (copper foil).
すなわち、エツチングする下地金属層の厚さが薄い程エ
ツチング精度が高くなる。そこで高密度配線を形成する
場合には、5〜9μmの薄い銅箔を用いた銅張り積層板
をベースとしているが、銅箔のキャリアーであるアルミ
箔(厚さ約50μm)を物理的あるいは化学的に除去す
る際に、アルミ箔の機械的強度がないために引き剥がす
途中でアルミ箔が破れたり、アルカリ系のエツチング液
でエツチング除去する際に多量の水素ガスが発生する問
題がある。更にプリプレグとの接着力を確保するために
銅箔を粗化する必要があり、そのためには最低でも厚さ
3μm程度の厚さにしなければならず、配線幅が20μ
m程度の超高密度配線を対象とした場合、配線のサイド
エツチングが問題となる。That is, the thinner the underlying metal layer to be etched, the higher the etching accuracy. Therefore, when forming high-density wiring, copper-clad laminates using thin copper foil of 5 to 9 μm are used as a base, but aluminum foil (approximately 50 μm thick), which is the carrier of the copper foil, is physically or chemically When removing the aluminum foil, there are problems such as the aluminum foil breaking during peeling due to its lack of mechanical strength, and a large amount of hydrogen gas being generated when removing it by etching with an alkaline etching solution. Furthermore, it is necessary to roughen the copper foil in order to ensure adhesion with the prepreg, and to do so, the thickness must be at least 3 μm, and the wiring width must be 20 μm.
When ultra-high-density wiring on the order of m is targeted, side etching of the wiring becomes a problem.
薄い下地金属層を形成する方法としては他に無電解めっ
き法、真空蒸着法、スパッタリング法などがある。Other methods for forming a thin base metal layer include electroless plating, vacuum evaporation, and sputtering.
無電解めっき法は絶縁基板表面を物理的又は化学的な方
法で処理してその表面を親水化・粗面化する工程を必要
とするうえ、生成した金属層〜基板間の接着力も低い。The electroless plating method requires a step of physically or chemically treating the surface of the insulating substrate to make the surface hydrophilic and rough, and also has low adhesion between the generated metal layer and the substrate.
このため、銅張り積層板の銅箔をエツチングした粗化面
に無電解めっきを施し接着力を確保する方法も提案され
ているが、レジスト形成時露光工程に於いて粗化面で露
光光が乱反射しレジストとなるべきでない箇所が露光さ
れるため、多量の現像残りが発生するという欠点がある
。For this reason, a method has been proposed in which electroless plating is applied to the roughened surface of the etched copper foil of a copper-clad laminate to ensure adhesive strength. This has the disadvantage that a large amount of undeveloped material is left behind because it causes diffuse reflection and exposes areas that should not become resists.
真空蒸着法及びスパッタリング法等の真空成膜法は平滑
な基板上にも安定して1μm以下の金属層を形成できる
が、基板として例えば、ガラス布−エポキシ積層板やガ
ラス布−ポリイミド積層板等を用いる場合、ガラス布に
吸着している水分及び樹脂層に残存している溶剤分のた
めに、蒸着やスパッタなどで必要となる高真空下では水
分や溶剤分がガス化し、ガラス布〜樹脂界面での剥離や
ボイドが生じてしまう。Vacuum film forming methods such as vacuum evaporation and sputtering can stably form a metal layer of 1 μm or less even on a smooth substrate. When using a glass cloth, due to the moisture adsorbed to the glass cloth and the solvent remaining in the resin layer, the moisture and solvent gasify under the high vacuum required for vapor deposition and sputtering, and the glass cloth to resin Peeling and voids occur at the interface.
こうした理由から、蒸着やスパッタリング工程を別工程
で行い、金属箔層を形成後、配線板用有機基材と積層す
る方法が提案されている(特開昭53−114074号
公報)。For these reasons, a method has been proposed in which the vapor deposition and sputtering steps are performed separately, and after forming a metal foil layer, it is laminated with an organic base material for a wiring board (Japanese Patent Application Laid-Open No. 114074/1983).
(発明が解決しようとする課題)
しかしこの方法に於いても、金属薄層を形成する転写フ
ィルムが粗化されているため、前述のようにレジスト形
成時のレジスト現像残りが問題となる。(Problems to be Solved by the Invention) However, even in this method, since the transfer film forming the thin metal layer is roughened, there is a problem of resist development residue during resist formation as described above.
セミアデイティブ法を用いて、配線幅が20μm程度の
超高密度配線を安定的に形成するためには、(1)下地
金属が1μm程度に薄いこと、(2)レジスト露光時に
下地金属表面での乱反射ができるだけ小さいこと、(3
)下地金属と絶縁基板間の接着力が大きいことなどが必
要である。本発明は、これらの要因を満足し、高密度配
線板を安定的に製造することを可能にする、金属箔層付
絶縁基板の製造法及びその金属薄層付絶縁基板を使用し
た配線板の製造法を提供するものである。In order to stably form ultra-high-density wiring with a wiring width of about 20 μm using the semi-additive method, (1) the base metal must be as thin as about 1 μm, and (2) the base metal surface must be thin during resist exposure. The diffuse reflection of is as small as possible, (3
) It is necessary that the adhesive strength between the underlying metal and the insulating substrate be strong. The present invention satisfies these factors and provides a method for manufacturing an insulating substrate with a metal foil layer, which makes it possible to stably manufacture a high-density wiring board, and a wiring board using the insulating substrate with a thin metal layer. It provides a manufacturing method.
(問題を解決するための手段)
本発明は、仮基板上に真空成膜法により仮基板に対する
引きはがし強さが0.2kgf/cm以下となるように
銅の第一の薄層を形成する工程と、銅の第一の薄層上に
真空成膜法によりクロム、チタン、バナジウム、ニッケ
ル、マンガン、モリブデン及びタングステンから選ばれ
る少なくとも一種の第二の薄層を形成する工程と、第二
の薄層を内側にして絶縁基板と積層一体化する工程と、
積層体から仮基板を剥離する工程により金属薄層付絶縁
基板をの製造するものである。(Means for solving the problem) The present invention forms a first thin layer of copper on a temporary substrate by a vacuum film forming method so that the peeling strength against the temporary substrate is 0.2 kgf/cm or less. forming a second thin layer of at least one selected from chromium, titanium, vanadium, nickel, manganese, molybdenum and tungsten on the first thin layer of copper by a vacuum deposition method; A process of laminating and integrating with an insulating substrate with the thin layer inside,
An insulating substrate with a metal thin layer is manufactured by a process of peeling off a temporary substrate from a laminate.
本発明の実施例を図面によって詳細に説明する。Embodiments of the present invention will be described in detail with reference to the drawings.
第1図(a)〜(d)は本発明の一実施例を説明する断
面図である。FIGS. 1(a) to 1(d) are sectional views illustrating an embodiment of the present invention.
第1図(a)の1は仮基板であり、例えば表面粗さか1
μm以下に調整された厚さ30μmのステンレス箔(新
日本製鉄(株)製の極薄ステンレス箔)であり、その片
側表面にエレクトロンビーム蒸着装置(日本真空(株)
社製、型式EBV−6DA)を用いて、次の条件で厚さ
5000Aの銅薄層2、続いて厚さ200Aのクロム層
3を連続して形成する(第1図(b))。1 in FIG. 1(a) is a temporary substrate, for example, the surface roughness is 1.
It is a stainless steel foil (extremely thin stainless steel foil made by Nippon Steel Corporation) with a thickness of 30 μm adjusted to less than μm, and one side of the foil is coated with an electron beam evaporation device (Japan Vacuum Co., Ltd.).
A thin copper layer 2 with a thickness of 5000 Å, followed by a chromium layer 3 with a thickness of 200 Å, were successively formed under the following conditions (FIG. 1(b)).
銅
加速電圧 1
圧 力 1
基板温度 2
製膜速度 1
KV
X 1 0−5
00℃
OA/秒
クロム
加速電圧 8KV
圧 力 8 X 10−’
基板温度 200℃
製膜速度 2A/秒
仮基板として、ステンレス箔の代りに、厚さ25〜20
0μmの高分子フィルムを用いても良い。適用可能な高
分子フィルムとしては、ポリイミドフィルム、テフロン
フィルム、ポリエチレンフィルム等が挙げられるが耐熱
性及び銅薄層との剥離性などの点からポリイミドフィル
ムが最も好ましい(ポリイミドフィルムの場合、銅とフ
ィルム間の引きはがし強さは約0 、1kgf/Cm
)。Copper acceleration voltage 1 Pressure 1 Substrate temperature 2 Film forming rate 1 KV Instead of stainless steel foil, thickness 25-20
A 0 μm polymer film may also be used. Applicable polymer films include polyimide film, Teflon film, polyethylene film, etc., but polyimide film is the most preferable in terms of heat resistance and peelability from copper thin layer (in the case of polyimide film, copper and film Peeling strength between is approximately 0, 1kgf/Cm
).
仮基板と銅薄層間の引きはがし強さは0.2kgf/c
m以下となるようにする。引きはがし強さが02kgf
/cmを越えると後工程で積層体から仮基板を剥離する
段階で剥離しにくくなる。Peeling strength between temporary substrate and copper thin layer is 0.2kgf/c
m or less. Peeling strength is 02kgf
/cm, it becomes difficult to peel off the temporary substrate from the laminate in a later step.
仮基板と銅薄層間の剥離性は、銅薄層を形成する際の銅
粒子のエネルギーに依存し、エネルギーが高い場合は仮
基板と銅薄層の接着性が向上するため剥離性が悪くなる
傾向がある。銅粒子のエネルギーは1eV〜50eVの
範囲にあれば良好な剥離性を示す。The peelability between the temporary substrate and the copper thin layer depends on the energy of the copper particles when forming the copper thin layer; if the energy is high, the adhesiveness between the temporary substrate and the copper thin layer improves, resulting in poor peelability. There is a tendency to If the energy of the copper particles is in the range of 1 eV to 50 eV, good releasability is exhibited.
成膜法としては、エレクトロンビーム蒸着法の他に、抵
抗加熱方式を用いた蒸着法、スパッタリング法、イオン
クラスタービーム法等が適用可能である。As a film forming method, in addition to the electron beam evaporation method, an evaporation method using a resistance heating method, a sputtering method, an ion cluster beam method, etc. can be applied.
仮基板のステンレス箔上に形成する銅薄層の厚さはその
後に形成する微細配線の配線幅を考慮して設定すること
が望ましく、配線幅が20〜30μm程度では、銅薄層
の厚さは2μm以下が良い。It is desirable to set the thickness of the thin copper layer formed on the stainless steel foil of the temporary substrate in consideration of the wiring width of the fine wiring to be formed afterwards. is preferably 2 μm or less.
次にクロム薄層を内側にしてガラス布−エポキンプリブ
レグ4(日立化成工業(株)社製、商品名GEA−67
−N)と170°C,40kgf/cm2で40分間加
熱圧着後(第1図(c))、ステンレス箔を引き剥がし
、金属薄層付ガラスエポキシ基板を得た(第1図
(d))。この場合、エポキシ基板〜金属薄層間の引き
はがし強さは約0 、8kgf/cmと良好な値を示し
た。 クロムの他に使用できる金属としてはチタン、ニ
ッケル、バナジウム、モリブデン、タングステン等が挙
げられる。なお、これらの金属のうち少なくとも一種を
含む化合物を使用することもできる。例えば、窒化クロ
ムを用いた場合の接着力は約0 、7kgf/cmであ
った。Next, with the thin chromium layer inside, the glass cloth-Epokin Prebreg 4 (manufactured by Hitachi Chemical Co., Ltd., product name GEA-67) was used.
-N) for 40 minutes at 170°C and 40 kgf/cm2 (Fig. 1 (c)), the stainless steel foil was peeled off to obtain a glass epoxy substrate with a thin metal layer (Fig. 1 (d)). . In this case, the peel strength between the epoxy substrate and the metal thin layer was approximately 0.8 kgf/cm, which was a good value. Examples of metals that can be used in addition to chromium include titanium, nickel, vanadium, molybdenum, and tungsten. Note that a compound containing at least one of these metals can also be used. For example, when chromium nitride was used, the adhesive strength was about 0.7 kgf/cm.
ステンレス箔等の仮基板1上に形成された二層金属薄層
2.3をアクリル系、ゴム系及び熱可塑性樹脂シートを
介して、セラミックス基板やアルミニウム等の金属基板
に接着しても良い。また、本発明は、多層配線板の表面
層作製だけでなく、内層基板の作製にも適用できる。The two-layer metal thin layer 2.3 formed on the temporary substrate 1 such as stainless steel foil may be adhered to a ceramic substrate or a metal substrate such as aluminum via an acrylic, rubber or thermoplastic resin sheet. Furthermore, the present invention can be applied not only to the fabrication of the surface layer of a multilayer wiring board, but also to the fabrication of the inner layer substrate.
次に、本発明の金属薄層付絶縁基板を用いた高密度配線
板の製造法の一実施例を説明する。Next, an embodiment of a method for manufacturing a high-density wiring board using the insulating substrate with a thin metal layer of the present invention will be described.
金属薄層表面にポジ型液状レジストTF−20(Shi
pley社製、商品名)を両面ロールコートし、80℃
で20分間プリベークを施した。更に大日本スクリーン
(株)社製MAP−1200大型マスクアライメント露
光機を用いて、マスクを介して露光1t500mJ/c
m2でコンタクト露光を行った。次に、5ipley社
製450デベロッパー(液温度=25℃、濃度:17%
)で3分間現像して最小ライン幅、スペースが20μm
の微細レジストパターンを形成後、セミアデイティブ法
を適用して所望する配線パターンを形成した。A positive liquid resist TF-20 (Shi
Roll coated with PLAY Co., Ltd. (trade name) on both sides and heated at 80°C.
Prebaking was performed for 20 minutes. Furthermore, using a MAP-1200 large mask alignment exposure machine manufactured by Dainippon Screen Co., Ltd., exposure was performed at 1t500mJ/c through the mask.
Contact exposure was performed at m2. Next, 450 developer manufactured by 5ipley (liquid temperature = 25°C, concentration: 17%)
) for 3 minutes to achieve a minimum line width and space of 20 μm.
After forming a fine resist pattern, a semi-additive method was applied to form a desired wiring pattern.
この場合、下地金属層はクロムと銅の二層2.3である
ため、それぞれのエツチング液として、銅が過硫酸アン
モニウム溶液(液温度:45℃、濃度;30g/l)
、クロムがフェリシアン化カリウムと水酸化カリウムの
混合溶液(液温度:50℃、濃度:フェリシアン化カリ
ウムが150g/l、水酸化カリウムが50g/l)を
用いた。In this case, since the underlying metal layer is a two-layered layer of chromium and copper, copper is etched in an ammonium persulfate solution (solution temperature: 45°C, concentration: 30 g/l).
For chromium, a mixed solution of potassium ferricyanide and potassium hydroxide (liquid temperature: 50°C, concentration: potassium ferricyanide: 150 g/l, potassium hydroxide: 50 g/l) was used.
(発明の効果)
本発明により、1μm以下の金属薄層を生産性良く配線
板用絶縁基板上に形成可能になるとともに、従来からの
問題点であったレジストパターン形成工程でのレジスト
の現像残りが激減し、かつ、基板と金属層間の接着性が
向上した。また、本発明による金属薄層付絶縁基板を配
線板に適用すれば、配線形成工程に於けるエツチング厚
さが1μm程度と非常に薄いため、エツチング精度が著
しく向上し、ライン幅とスペースが20μmの微細配線
を容易に形成できる。(Effects of the Invention) According to the present invention, it becomes possible to form a metal thin layer of 1 μm or less on an insulating substrate for a wiring board with high productivity, and the resist remains undeveloped in the resist pattern forming process, which has been a problem in the past. The adhesion between the substrate and the metal layer was improved. In addition, if the insulating substrate with a thin metal layer according to the present invention is applied to a wiring board, the etching thickness in the wiring forming process is very thin, about 1 μm, so the etching accuracy is significantly improved, and the line width and space can be reduced to 20 μm. can easily form fine wiring.
製造工程を説明する断面図である。It is a sectional view explaining a manufacturing process.
(符号の説明) 1、ステンレス箔(仮基板) 2、銅薄層(第1の金属薄層) 3、クロム層(第2の金属薄層) 4、プリプレグ(Explanation of symbols) 1. Stainless steel foil (temporary board) 2. Copper thin layer (first metal thin layer) 3. Chromium layer (second metal thin layer) 4. Prepreg
Claims (5)
がし強さが0.2kgf/cm以下となるように銅の第
一の薄層を形成する工程と、銅の第一の薄層上に真空成
膜法によりクロム、チタン、バナジウム、ニッケル、マ
ンガン、モリブデン及びタングステンから選ばれる少な
くとも一種の第二の薄層を形成する工程と、第二の薄層
を内側にして絶縁基板と積層一体化する工程と、積層体
から仮基板を剥離する工程とを含むことを特徴とする金
属薄層付絶縁基板の製造法。1. A step of forming a first thin layer of copper on the temporary substrate by a vacuum film forming method so that the peel strength with respect to the temporary substrate is 0.2 kgf/cm or less, and a step of forming at least one kind of second thin layer selected from chromium, titanium, vanadium, nickel, manganese, molybdenum, and tungsten by a film-forming method; and laminating and integrating with an insulating substrate with the second thin layer inside. 1. A method for producing an insulating substrate with a thin metal layer, the method comprising: a step of peeling off a temporary substrate from a laminate.
粒子のエネルギー範囲が1eV〜50eVである請求項
1記載の金属薄層付絶縁基板の製造法。2. 2. The method for producing an insulating substrate with a thin metal layer according to claim 1, wherein in the vacuum film forming method for forming the first thin layer of copper, the energy range of the copper particles is 1 eV to 50 eV.
厚さ20〜50μmのステンレス箔または厚さ25〜2
00μmの高分子フィルムである請求項1または2記載
の金属箔層付絶縁基板の製造法。3. The temporary substrate is a stainless steel foil with a thickness of 20 to 50 μm or a thickness of 25 to 2 μm with a surface roughness adjusted to 2.0 μm or less.
3. The method for producing an insulating substrate with a metal foil layer according to claim 1 or 2, wherein the insulating substrate is a polymer film with a thickness of 00 μm.
、チタン、バナジウム、マンガン、モリブデンおよびタ
ングステンから選ばれる少なくとも一種を含む金属化合
物からなる請求項1、2または3記載の金属薄層付絶縁
基板の製造法。4. The metal thin layer according to claim 1, 2 or 3, wherein the second thin layer on the first thin layer of copper is made of a metal compound containing at least one selected from nickel, chromium, titanium, vanadium, manganese, molybdenum and tungsten. A method for manufacturing a layered insulating substrate.
ジストパターンを形成し、所定の部分にめっきを施し、
レジストパターンを剥離した後、銅の第一の薄層及び第
二の薄層をエッチングすることを特徴とする配線板の製
造法。5. Forming a predetermined resist pattern on the surface of the insulating substrate with a metal thin layer according to claim 1, plating the predetermined portions,
1. A method for manufacturing a wiring board, which comprises etching a first thin layer and a second thin layer of copper after removing a resist pattern.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34335189A JPH03203394A (en) | 1989-12-29 | 1989-12-29 | Manufacture of insulating substrate with thin metallic layer and manufacture of wiring board using insulating substrate manufactured thereby |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP34335189A JPH03203394A (en) | 1989-12-29 | 1989-12-29 | Manufacture of insulating substrate with thin metallic layer and manufacture of wiring board using insulating substrate manufactured thereby |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03203394A true JPH03203394A (en) | 1991-09-05 |
Family
ID=18360851
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP34335189A Pending JPH03203394A (en) | 1989-12-29 | 1989-12-29 | Manufacture of insulating substrate with thin metallic layer and manufacture of wiring board using insulating substrate manufactured thereby |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03203394A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100717909B1 (en) * | 2006-02-24 | 2007-05-14 | 삼성전기주식회사 | A substrate comprising a nickel layer and a method of manufacturing the same |
| JP2008137367A (en) * | 2006-11-08 | 2008-06-19 | Hitachi Chem Co Ltd | Metal clad laminated sheet, printed-circuit board, and its manufacturing method |
| JP2008201117A (en) * | 2007-01-24 | 2008-09-04 | Hitachi Chem Co Ltd | Metal thin film with plastic, printed-circuit board, its manufacturing method, multilayer wiring board, and its manufacturing method |
-
1989
- 1989-12-29 JP JP34335189A patent/JPH03203394A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100717909B1 (en) * | 2006-02-24 | 2007-05-14 | 삼성전기주식회사 | A substrate comprising a nickel layer and a method of manufacturing the same |
| JP2008137367A (en) * | 2006-11-08 | 2008-06-19 | Hitachi Chem Co Ltd | Metal clad laminated sheet, printed-circuit board, and its manufacturing method |
| JP2008201117A (en) * | 2007-01-24 | 2008-09-04 | Hitachi Chem Co Ltd | Metal thin film with plastic, printed-circuit board, its manufacturing method, multilayer wiring board, and its manufacturing method |
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