JPH0321093B2 - - Google Patents
Info
- Publication number
- JPH0321093B2 JPH0321093B2 JP60080695A JP8069585A JPH0321093B2 JP H0321093 B2 JPH0321093 B2 JP H0321093B2 JP 60080695 A JP60080695 A JP 60080695A JP 8069585 A JP8069585 A JP 8069585A JP H0321093 B2 JPH0321093 B2 JP H0321093B2
- Authority
- JP
- Japan
- Prior art keywords
- cooling
- medium
- container
- boiling
- heat exchange
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W40/00—Arrangements for thermal protection or thermal control
- H10W40/70—Fillings or auxiliary members in containers or in encapsulations for thermal protection or control
- H10W40/73—Fillings or auxiliary members in containers or in encapsulations for thermal protection or control for cooling by change of state
Landscapes
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
Description
【発明の詳細な説明】
〔概要〕
超小型電子回路素子(LSI,MSI)等の冷却手
段に係る浸漬液冷装置において、密封冷却容器中
における媒体の気化と気化媒体の液化過程により
容器内素子発熱量を外部に放出せしめて素子の高
密度化並びに高電力印加による素子の高速化を具
現する冷却装置の構成法が提示されたものであ
る。[Detailed Description of the Invention] [Summary] In an immersion liquid cooling device for cooling means for microelectronic circuit elements (LSI, MSI), etc., the elements in the container are cooled by vaporizing a medium in a sealed cooling container and liquefying the vaporized medium. This paper presents a method for configuring a cooling device that emits heat to the outside to increase the density of devices and to increase the speed of devices by applying high power.
本発明は超小型電子回路などの浸漬冷却構造の
改良に係る浸漬液冷装置に関す。
The present invention relates to an immersion liquid cooling device for improving the immersion cooling structure for microelectronic circuits and the like.
近時、例えば電子計算機に塔載される集積回路
素子LSI,MSI等は、小型化・高速化が要請され
素子の単位面積当り動作電力が増加し、動作温度
の上昇による信頼性対策が問題とされる。 In recent years, integrated circuit elements LSI, MSI, etc. installed in electronic computers, for example, are required to be smaller and faster, and the operating power per unit area of the element has increased, and reliability measures have become a problem due to the rise in operating temperature. be done.
従来、回路素子LSI,MSI等の冷却手段とし
て、特定回路素子に放熱用フインを装着すると
か、あるいはフアンによる強制空冷方法等の空冷
冷却方法がある。然し、空冷冷却法による放熱手
段は限界があり、例えば、機器の動作温度が85℃
(動作の最高限界温度)とすれば、前記強制空冷
方式では、素子放熱面の単位面積当りの許容消費
電力はたかだか1watt/cm2が限度である。 Conventionally, as means for cooling circuit elements LSI, MSI, etc., there are air cooling methods such as attaching heat dissipation fins to specific circuit elements, or forced air cooling using a fan. However, there are limits to the heat dissipation method using air cooling, for example, when the operating temperature of the equipment is 85℃.
(maximum operating temperature limit), in the forced air cooling method, the allowable power consumption per unit area of the element heat dissipation surface is at most 1 watt/cm 2 .
然し、更に高い動作条件が必要とされる高速コ
ンピユータ用素子では、20watt/cm2の消費電力
を許容するような冷却方式が必要とされ、素子を
直接冷媒に浸漬する冷却方式が要請されている。 However, high-speed computer devices that require even higher operating conditions require a cooling method that can tolerate power consumption of 20 watts/cm 2 , and a cooling method that directly immerses the device in a coolant is required. .
前記の浸漬液冷装置は、80℃以下の非腐蝕性、
非解離性の低沸点冷媒、例えば沸点49℃のフレオ
ン(C2Cl3F3)、各種フルオロカーボン、例えば沸
点30℃のC5F12、沸点56℃のC6F14などの単組成、
または適宜沸点温度に調整混合する複合組成の冷
媒が用いられている。
The above-mentioned immersion liquid cooling device is non-corrosive at temperatures below 80℃,
Non-dissociable low-boiling refrigerants, such as freon (C 2 Cl 3 F 3 ) with a boiling point of 49 °C, various fluorocarbons, such as monocompositions such as C 5 F 12 with a boiling point of 30 °C, C 6 F 14 with a boiling point of 56 °C,
Alternatively, a refrigerant with a complex composition is used, which is mixed to adjust the boiling point temperature as appropriate.
第2図は従来の装置の概要構成を示す模式的断
面図である。 FIG. 2 is a schematic cross-sectional view showing the general configuration of a conventional device.
図は、冷却媒体4充填の容器3に冷却対象とす
るLSI等の回路素子1実装の基板2を浸漬せしめ
て、発生の損失熱を冷媒の沸騰気化潜熱により吸
収すると共に、沸騰気化の冷媒(図中、5で示す
気泡)を再液化する熱交換パイプ8を設けて容器
外部に熱放散を行う浸漬液冷装置である。 The figure shows a circuit board 2 mounted with a circuit element such as an LSI to be cooled immersed in a container 3 filled with a cooling medium 4, and the generated loss heat is absorbed by the latent heat of boiling vaporization of the coolant. This is an immersion liquid cooling device that is provided with a heat exchange pipe 8 that reliquefies air bubbles (indicated by 5 in the figure) to dissipate heat to the outside of the container.
前記浸漬液冷装置は、素子浸漬容器の上部空間
7に気化冷媒の再凝縮液化の熱交換部を形成せし
めた熱交換パイプを装着しているが、浸漬された
ことから、従来、気泡5が直接的に熱交換パイプ
8に被着し断熱層を形成することがなくなる。
又、多孔質板9は再液化媒体の流動性を妨げない
ことから、冷却対象素子にたいする装置能力が向
上する。
The immersion liquid cooling device is equipped with a heat exchange pipe that forms a heat exchange section for recondensing and liquefying the vaporized refrigerant in the upper space 7 of the device immersion container. There is no need to directly adhere to the heat exchange pipe 8 and form a heat insulating layer.
Furthermore, since the porous plate 9 does not impede the fluidity of the reliquefaction medium, the capacity of the apparatus for cooling the elements is improved.
以下、本発明の沸騰冷却媒体による集積回路素
子等の浸漬液冷装置の一実施例を、第1図の模式
的断面図に従つて詳細に説明する。
DETAILED DESCRIPTION OF THE INVENTION Hereinafter, an embodiment of the immersion liquid cooling device for integrated circuit devices and the like using a boiling cooling medium according to the present invention will be described in detail with reference to the schematic cross-sectional view of FIG.
模式的実施例図は、液冷装置を縦切断した一断
面図である。図中付与する参照番号の中、従来と
同一構成部分には同番号が付され、本発明の要旨
が明確となる様してある。 The schematic embodiment diagram is a longitudinal cross-sectional view of the liquid cooling device. Among the reference numerals given in the drawings, the same numbers are given to the same constituent parts as in the prior art, so that the gist of the present invention is made clear.
沸騰冷却媒体4が充填される容器1はステンレ
スとかアルミ等で成形されている。容器1は冷却
媒体4の充填後、11部分で気密封止(接合)さ
れる。銅管を成形した熱交換パイプ8は、沸騰冷
却媒体4の自由面12上の沸騰気化媒体5の充満
する容器空間7に設けることにより、媒体を液化
すると共に液化潜熱を容器外部に排出する。 The container 1 filled with the boiling cooling medium 4 is made of stainless steel, aluminum, or the like. After the container 1 is filled with the cooling medium 4, it is hermetically sealed (joined) at 11 parts. The heat exchange pipe 8 made of a copper tube is provided in the container space 7 filled with the boiling vaporizing medium 5 on the free surface 12 of the boiling cooling medium 4, thereby liquefying the medium and discharging the latent heat of liquefaction to the outside of the container.
熱交換パイプ8の媒体自由面12下方には、発
泡金属よりなる液化媒体に対して流動性のよい本
発明の要部をなす多孔性板(多孔質板)9が設け
られる。更に、パイプ8の気泡遮蔽をなす多孔質
板9には大量発生の気泡を容器内周辺10にガイ
ドする漏斗構造の気泡(気化媒体)案内部分6が
付設される。容器3は、冷却対象のLSI、又は
VLSI等の回路素子1が基板共々冷却媒体4に接
触(浸漬)する。 Below the medium free surface 12 of the heat exchange pipe 8, there is provided a porous plate 9, which is an important part of the present invention and is made of foamed metal and has good fluidity for the liquefied medium. Further, a porous plate 9 that blocks air bubbles in the pipe 8 is provided with a bubble (vaporized medium) guide portion 6 having a funnel structure for guiding a large amount of air bubbles to the inner periphery 10 of the container. Container 3 contains the LSI to be cooled or
A circuit element 1 such as a VLSI comes into contact with (immerses in) a cooling medium 4 together with a substrate.
この様な浸漬液冷装置に使用する低沸点冷媒と
浸漬の素子動作限界温度の関係を示すと次の通
り。 The relationship between the low boiling point refrigerant used in such an immersion liquid cooling system and the operating limit temperature of the immersion device is as follows.
沸騰冷却媒体4として、沸点50〜60℃の例えば
C6F14(沸点56℃)を使用するものとすれば、該沸
点より約5〜10℃高い温度で浸漬素子2の動作温
度が限界の最高温度より低く設定される。 As the boiling cooling medium 4, for example, a boiling point of 50 to 60°C
If C 6 F 14 (boiling point 56° C.) is used, the operating temperature of the immersion element 2 is set at a temperature approximately 5 to 10° C. above the boiling point and below the maximum limit temperature.
前記詳細に説明した本発明の多孔質板を配置せ
しめた装置構成によれば、これを第2図と比較参
照すれば更に明らかな様に、集積気泡の熱交換パ
イプ接触によるパイプ断熱層の形成とこれにとも
なう冷却能力の低下が改善され、高速化駆動素子
に対する安定な浸漬液冷装置が実現される。 According to the apparatus configuration in which the porous plates of the present invention are arranged as described in detail above, as will be further apparent when comparing this with FIG. The resulting decrease in cooling capacity is improved, and a stable immersion liquid cooling device for high-speed driving elements is realized.
前記説明のように本発明の浸漬液冷装置におい
ては、気泡に対する多孔質遮蔽板の設置により、
意図する素子単位面積当り消費換算熱量、20W/
cm2とする冷却能力が得られ、これを例えば高速性
が要求される電子計算機用の集積回路素子の冷却
に適用すればその効果は顕著なものがある。
As described above, in the immersion liquid cooling device of the present invention, by installing a porous shielding plate against air bubbles,
Intended heat consumption per unit area of element, 20W/
cm 2 of cooling capacity can be obtained, and if this is applied to cooling integrated circuit elements for electronic computers that require high speed, the effect will be remarkable.
第1図は本発明の浸漬液冷装置の模式的断面
図、第2図は従来の装置構成を示す模式的断面図
である。
図中、1は回路素子、3は冷却容器、4は冷却
媒体、5は沸騰気泡(気化媒体)、8は熱交換パ
イプ、9は多孔質板である。
FIG. 1 is a schematic sectional view of the immersion liquid cooling device of the present invention, and FIG. 2 is a schematic sectional view showing the configuration of the conventional device. In the figure, 1 is a circuit element, 3 is a cooling container, 4 is a cooling medium, 5 is a boiling bubble (vaporizing medium), 8 is a heat exchange pipe, and 9 is a porous plate.
Claims (1)
器3、該容器内の冷却媒体の気化媒体を再液化す
る熱交換パイプ8、を具備する液冷装置に於い
て、前記冷却媒体の沸騰気泡5を熱交換パイプの
外周に導出させる多孔質板9が配置されているこ
とを特徴とする浸漬液冷装置。1. In a liquid cooling device comprising a container 3 for immersing a circuit element 1 in a boiling cooling medium 4, and a heat exchange pipe 8 for re-liquefying the vaporized medium of the cooling medium in the container, boiling bubbles of the cooling medium are removed. 5. An immersion liquid cooling device characterized in that a porous plate 9 is disposed for guiding the heat exchanger 5 to the outer periphery of the heat exchange pipe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60080695A JPS61239654A (en) | 1985-04-16 | 1985-04-16 | Dipping liquid-cooling device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60080695A JPS61239654A (en) | 1985-04-16 | 1985-04-16 | Dipping liquid-cooling device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61239654A JPS61239654A (en) | 1986-10-24 |
| JPH0321093B2 true JPH0321093B2 (en) | 1991-03-20 |
Family
ID=13725461
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60080695A Granted JPS61239654A (en) | 1985-04-16 | 1985-04-16 | Dipping liquid-cooling device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61239654A (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5018555B2 (en) * | 2008-02-29 | 2012-09-05 | 日本電気株式会社 | Cooling module and composite mounting board |
-
1985
- 1985-04-16 JP JP60080695A patent/JPS61239654A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61239654A (en) | 1986-10-24 |
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