JPH03211781A - Outside resonator type variable wavelength semiconductor laser - Google Patents

Outside resonator type variable wavelength semiconductor laser

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Publication number
JPH03211781A
JPH03211781A JP694490A JP694490A JPH03211781A JP H03211781 A JPH03211781 A JP H03211781A JP 694490 A JP694490 A JP 694490A JP 694490 A JP694490 A JP 694490A JP H03211781 A JPH03211781 A JP H03211781A
Authority
JP
Japan
Prior art keywords
active layer
semiconductor laser
wavelength
diffraction grating
photons
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP694490A
Other languages
Japanese (ja)
Inventor
Tetsuya Suzuki
徹也 鈴木
Eiji Kawamo
英司 川面
Haruo Nagai
治男 永井
Toshio Tsuchiya
土屋 富志夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP694490A priority Critical patent/JPH03211781A/en
Publication of JPH03211781A publication Critical patent/JPH03211781A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To make it possible to increase a variable range of wavelength to a wider band by comprising a light source of monochrome coherent light which covers a wide range and an outside resonator and laying out in series an active layer whose composition comprises two types and more, which are different from each other, used as a semiconductor laser element having a wider light emitting range, which is the light source, along a wave guide passage or laminating the elements in the direction of their thickness. CONSTITUTION:Photons, generated in a first active layer 3 and a second active layer 4, are wave-guided along the first active layer 3 and the second active layer 4. One part of photons are reflected on a cleavage plane 5 and return to the first active layer 3 and the second active layer 4 while the other part of photons penetrate a reflection prevention film 6. The photons, which are penetrated the film, are collectled by a concave lens 7 and selectively reflected by a diffraction grating 8 and returns to the first active layer 3 and the second active layer 4 again, and get oscillated, making multiple reflection with the cleavage plane 5 and the diffraction grating 8. The oscillated light is outputted from the cleavage from the cleavage plane 5 and the diffraction grating 8 is controlled by a diffraction grating scanning means 9 so that only a required wavelength maybe selectively reflected thereon.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、コヒーレント光通信、干渉型光ファイバセン
サ、光応用測定器等の光源として使用される、外部共振
器型波長可変半導体レーザに関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an external cavity type wavelength tunable semiconductor laser used as a light source for coherent optical communications, interference type optical fiber sensors, optical application measuring instruments, etc.

〔従来の技術〕[Conventional technology]

従来の外部共振器型波長可変半導体レーザの構造図を第
9図に示す。基板上に形成された活性層で発生した光は
、反射防止膜を通過して半導体レーザ素子より出射され
集光レンズで集光され、回折格子で選択的に反射される
。回折格子で反射された光は、集光レンズで集光され反
射防止膜を通過して半導体レーザ素子に入射される。入
射された光は、へき開面で反射され再び半導体レーザ素
子より出射されるが、この間に入射光は活性層で誘導放
出によって増幅され、回折格子とへき開面の間で多重反
射することにより、回折格子で選択的に反射された波長
でレーザ発振する。なお、レーザ発振する波長を選択す
るためには、回折格子での反射角が入射光の波長により
異なることを利用し、回折格子を回転して必要とする波
長の光が入射光とちょうど逆向きに送出するように反射
角を変更することにより実現している。しかし、発振が
可能な波長範囲は半導体レーザ素子の活性層の利得スペ
クトルにより制限され、1.55μm帯の半導体レーザ
素子でおよそ70nm程度である。また、活性層の片方
の端面に形成される反射防止膜は反射率が低いことが望
まれるが、1.3μm帯の光に対して0.1%以下の低
反射率が得られる波長範囲は40nm程度であり、しか
もこのような低い反射率の反射防止膜を作るためには、
膜厚の誤差を±60Å以下にしなければならないので、
反射率や波長範囲がばらつくことが多かった。そのため
、回折格子の回転により選択できる可変波長範囲を、広
くすることは困難であった。
A structural diagram of a conventional external cavity type wavelength tunable semiconductor laser is shown in FIG. Light generated in an active layer formed on a substrate passes through an antireflection film, is emitted from a semiconductor laser element, is focused by a condensing lens, and is selectively reflected by a diffraction grating. The light reflected by the diffraction grating is condensed by a condenser lens, passes through an antireflection film, and enters a semiconductor laser element. The incident light is reflected by the cleavage plane and emitted from the semiconductor laser element again. During this time, the incident light is amplified by stimulated emission in the active layer and undergoes multiple reflections between the diffraction grating and the cleavage plane, resulting in diffraction. Laser oscillation occurs at wavelengths that are selectively reflected by the grating. To select the wavelength for laser oscillation, use the fact that the reflection angle on the diffraction grating differs depending on the wavelength of the incident light, and rotate the diffraction grating so that the light of the required wavelength is directed in exactly the opposite direction to the incident light. This is achieved by changing the reflection angle so that the beam is sent out. However, the wavelength range in which oscillation is possible is limited by the gain spectrum of the active layer of the semiconductor laser device, and is approximately 70 nm for a 1.55 μm band semiconductor laser device. Furthermore, it is desirable that the antireflection film formed on one end face of the active layer has a low reflectance, but the wavelength range in which a low reflectance of 0.1% or less can be obtained for light in the 1.3 μm band is In order to create an anti-reflection film with a wavelength of about 40 nm and such a low reflectance,
Since the error in film thickness must be kept within ±60 Å,
The reflectance and wavelength range often varied. Therefore, it has been difficult to widen the variable wavelength range that can be selected by rotating the diffraction grating.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

つまり、単一の組成の活性層のみでは、発振可能な波長
範囲は主に活性層の組成や形状により依存する利得スペ
クトルにより制限される。また、活性層の片方の端面に
反射防止膜を施しただけの構造の場合、反射防止膜のみ
で低反射率を実現しなければならないが、低反射が得ら
れる反射防止膜厚の許容範囲は狭いので反射率のばらつ
きが生じやすかった。また、低反射率の特性が得られる
波長範囲が狭く、波長のばらつきが生しやすかったので
、活性層の特性を十分に活かせなかった。
That is, with only an active layer having a single composition, the wavelength range that can be oscillated is limited mainly by the gain spectrum that depends on the composition and shape of the active layer. In addition, in the case of a structure in which only an anti-reflection film is applied to one end face of the active layer, low reflectance must be achieved with only the anti-reflection film, but the permissible range of anti-reflection film thickness that achieves low reflection is Because it was narrow, variations in reflectance were likely to occur. Furthermore, the wavelength range in which low reflectance characteristics can be obtained is narrow, and wavelength variations tend to occur, making it impossible to fully utilize the characteristics of the active layer.

本発明は、このような事情に鑑みてなされたものであり
、広帯域で、しかも波長可変なコヒーレント光を得るこ
とができる外部共振器型波長可変半導体レーザを提供す
ることを課題とする。
The present invention has been made in view of the above circumstances, and an object of the present invention is to provide an external cavity type wavelength tunable semiconductor laser that can obtain broadband and wavelength tunable coherent light.

〔課題を解決するための手段〕[Means to solve the problem]

上記課題を解決するために本発明の外部共振器型波長可
変半導体レーザにおいては、 ■発光周波数領域が広い半導体レーザ素子を用い、■半
導体レーザ素子から放出された光のうち所定の波長のみ
を選択して帰還させる構造をとった。
In order to solve the above problems, in the external cavity type wavelength tunable semiconductor laser of the present invention, 1) a semiconductor laser element with a wide emission frequency range is used, and 2) only a predetermined wavelength is selected from the light emitted from the semiconductor laser element. A structure was adopted in which the aircraft was transported back to Japan.

なお、波長選択の手段は、所定の波長のみを選択するよ
うに制御することとした。
Note that the wavelength selection means is controlled to select only a predetermined wavelength.

また、発光周波数領域が広い半導体レーザ素子としては
、 (a)2種類以上の組成の異なる活性層を、導波路に沿
って直列に従属接続する、 (b)または厚み方間に積み重ねる、 (C)または(a)と(b)を組合せる、構成をとるこ
とができる。
In addition, as a semiconductor laser device with a wide emission frequency range, (a) two or more active layers with different compositions are connected in series along a waveguide, (b) or stacked in the thickness direction (C ) or a combination of (a) and (b).

とくに、請求項(2)の外部共振器型波長可変半導体レ
ーザにおいては、 1)出射端面から延びる活性層と、活性層に続く窓端面
構造とを備えた半導体レーザ素子とし、2)窓端面構造
の外側に反射防止膜を備え、3)窓端面構造と反射防止
膜を通過して放出された光のうち所定の波長のみを選択
して帰還させる構造をとった。
In particular, the external cavity type wavelength tunable semiconductor laser according to claim (2) is a semiconductor laser element comprising: 1) an active layer extending from the emission end face and a window end face structure following the active layer; 2) a window end face structure. 3) A structure is adopted in which only a predetermined wavelength of the light emitted after passing through the window end face structure and the antireflection film is selected and returned.

なお、波長選択の手段は、請求項(1)と同様に所定の
波長のみを選択するように制御することとした。
Note that the wavelength selection means is controlled to select only a predetermined wavelength as in claim (1).

〔作用] このように構成された外部共振器型波長可変半導体レー
ザによれば、広い範囲をカバーできる単色コヒーレント
光の光源を得ることができる。とくに、活性層が単一の
組成だけの場合よりも広い波長範囲で発振を得ることが
できる。半導体レーザ素子を用いることによって、上記
の作用はさらに強調できる。
[Function] According to the external cavity type wavelength tunable semiconductor laser configured in this way, it is possible to obtain a light source of monochromatic coherent light that can cover a wide range. In particular, oscillation can be obtained in a wider wavelength range than when the active layer has only a single composition. By using a semiconductor laser element, the above effect can be further enhanced.

また、請求項(2)の窓端面構造によれば、広い波長範
囲で安定して反射率を低減できる。例えば、窓領域では
広い波長範囲において相対反射率を0.3%に低減でき
るので、反射防止膜の反射率への性能要求を低減でき、
反射防止膜厚の許容範囲が広がり、反射防止膜の反射率
の精度を製造上緩和できるようになる。具体的には、反
射防止膜と併せて0.005%以下の反射率が1100
n程度の波長範囲で得ることができ、このときの反射防
止膜厚の許容範囲は±200人程度程度る。つまり、活
性層の広帯域な利得スペクトルを有効に活用することが
できる。
Moreover, according to the window end face structure of claim (2), the reflectance can be stably reduced in a wide wavelength range. For example, in the window area, the relative reflectance can be reduced to 0.3% over a wide wavelength range, so the performance requirements for the reflectance of the anti-reflection coating can be reduced.
The allowable range for the thickness of the anti-reflection film is expanded, and the accuracy of the reflectance of the anti-reflection film can be relaxed during manufacturing. Specifically, the reflectance of 0.005% or less is 1100 in combination with the anti-reflection film.
It can be obtained in a wavelength range of about n, and the permissible range of the antireflection film thickness at this time is about ±200. In other words, the broadband gain spectrum of the active layer can be effectively utilized.

〔実施例〕〔Example〕

以下本発明の実施例を図面を用いて説明する。 Embodiments of the present invention will be described below with reference to the drawings.

(第一の実施例) 第1図は本発明の外部共振器型波長可変半導体レーザの
実施例を示す構造図である。第一の実施例では、波長選
択手段、制御手段および集光手段として、それぞれ回折
格子、回折格子を回転する回折格子回転手段、および凸
レンズを用いた。電極1と電極2間に電流を注入するこ
とにより、第1の活性層3および第2の活性層4で発生
した光子は第1の活性層3、第2の活性層4に沿って導
波し、一方の光子はへき開面5で反射して第1の活性層
3、第2の活性層4に戻り、他方の光子は反射防止膜6
を透過し、その透過した光子は凸レンズ7で集光され、
回折格子8で選択的に反射して再び第1の活性層3、第
2の活性層4に戻り、へき開面5と回折格子8とで多重
反射をして発振する。その発振した光がへき開面5から
出射される。なお、所望の波長のみを選択的に反射しう
るように回折格子8は、回折格子走査手段9により制御
される。
(First Embodiment) FIG. 1 is a structural diagram showing an embodiment of an external cavity type wavelength tunable semiconductor laser of the present invention. In the first embodiment, a diffraction grating, a diffraction grating rotation means for rotating the diffraction grating, and a convex lens were used as the wavelength selection means, the control means, and the condensing means, respectively. By injecting a current between the electrode 1 and the electrode 2, photons generated in the first active layer 3 and the second active layer 4 are guided along the first active layer 3 and the second active layer 4. However, one photon is reflected by the cleavage plane 5 and returns to the first active layer 3 and the second active layer 4, and the other photon is reflected by the antireflection film 6.
The transmitted photons are focused by the convex lens 7,
The light is selectively reflected by the diffraction grating 8, returns to the first active layer 3 and the second active layer 4, and undergoes multiple reflections by the cleavage plane 5 and the diffraction grating 8, causing oscillation. The oscillated light is emitted from the cleavage plane 5. Note that the diffraction grating 8 is controlled by a diffraction grating scanning means 9 so that only desired wavelengths can be selectively reflected.

第2図は本発明の外部共振器型波長可変半導体レーザの
半導体レーザ素子の製造工程を示す図である。1回目の
成長として液相成長(L P E)法、気相成長(VP
E、MO−CVD)法、または分子線エピタキシー(M
 B E )法等により、p形InP基板10上にp形
InPバンファ層11、第1のノンドープInGaAs
P活性層(λ:1.5μm組成)3、アンチメルトバッ
ク層(λ: 1.48μm)12、その上にn形1nP
クラッド層13を薄く成長させる。次に第2の活性層4
を成長させる部分を除くために、マスク14としてSi
Nx膜を形成し、エツチングにより不要なn形1nPク
ラッド層13、アンチメルトバック層12および第1の
ノンドープInGaAsP活性層3を除去する。2回目
の成長として、第2のノンドープInGaAsP活性層
(λ: 1.55μm組成)4、アンチメルトバック層
12、さらにn形InPクラッドN13を薄く成長させ
る。次にヤスク17を除去し、3回目の成長として、n
形1nPクラッド層13を成長させる。次に、メサエッ
チングにより成長した部分のうちストライプ部分のみを
残してエツチングをした後、n形1nP % p形In
Pの順に成長させ埋め込みへテロ(BH)構造を形成す
る。成長の終わった基板の両面には電極1および電極2
を蒸着し、チップ状にスクライブし、反射防止膜6を形
成する。このような工程で製造された半導体レーザ素子
15を外部共振器に組み込み、外部共振器型波長可変半
導体レーザを構成する。
FIG. 2 is a diagram showing the manufacturing process of the semiconductor laser element of the external cavity type wavelength tunable semiconductor laser of the present invention. For the first growth, liquid phase epitaxy (LPE) method and vapor phase epitaxy (VP
E, MO-CVD) method, or molecular beam epitaxy (M
A p-type InP bumper layer 11 and a first non-doped InGaAs layer are formed on the p-type InP substrate 10 by B E ) method or the like.
P active layer (λ: 1.5 μm composition) 3, anti-melt back layer (λ: 1.48 μm) 12, n-type 1nP layer on top of it
The cladding layer 13 is grown thin. Next, the second active layer 4
In order to remove the part where the Si
An Nx film is formed, and unnecessary n-type 1nP cladding layer 13, anti-meltback layer 12 and first non-doped InGaAsP active layer 3 are removed by etching. As the second growth, a second non-doped InGaAsP active layer (λ: 1.55 μm composition) 4, an anti-meltback layer 12, and an n-type InP cladding N13 are grown thinly. Next, remove Yask 17 and grow n for the third time.
A 1nP type cladding layer 13 is grown. Next, after etching leaving only the stripe part of the part grown by mesa etching, n-type 1nP% p-type In
The layers are grown in the order of P to form a buried hetero (BH) structure. Electrodes 1 and 2 are placed on both sides of the substrate after growth.
is vapor-deposited and scribed into chip shapes to form an antireflection film 6. The semiconductor laser element 15 manufactured through such a process is incorporated into an external resonator to constitute an external resonator type wavelength tunable semiconductor laser.

(第二の実施例) 第3図は本発明の外部共振器型波長可変半導体レーザの
第二の実施例を示す構造図である。第二の実施例では、
第一の実施例において第1の活性層3、打2の活性層4
上の半導体レーザ素子表面に形成する電極1を、第1の
活性層3および第2の活性層4の上面に分離して形成し
、分割電極1a、分割電極1bとする。これにより、そ
れぞれの活性層に注入する電流を独立に制御することが
でき、波長による利得のばらつきを少な(することがで
きる。
(Second Embodiment) FIG. 3 is a structural diagram showing a second embodiment of the external cavity type wavelength tunable semiconductor laser of the present invention. In a second embodiment,
In the first embodiment, the first active layer 3, the second active layer 4
The electrodes 1 formed on the upper surface of the semiconductor laser element are formed separately on the upper surfaces of the first active layer 3 and the second active layer 4 to form divided electrodes 1a and 1b. Thereby, the current injected into each active layer can be independently controlled, and variations in gain depending on wavelength can be reduced.

(第三の実施例) 第4図は本発明の外部共振器型波長可変半導体レーザの
第三の実施例を示す構造図である。第三の実施例では、
第一の実施例の第1の活性層3、第2の活性層4を厚み
方向に対して積み重ねる構成としたものであり、発振に
至る過程は第一〇実施例と同様である。
(Third Embodiment) FIG. 4 is a structural diagram showing a third embodiment of the external cavity type wavelength tunable semiconductor laser of the present invention. In a third embodiment,
The first active layer 3 and the second active layer 4 of the first embodiment are stacked in the thickness direction, and the process leading to oscillation is the same as that of the tenth embodiment.

(第四の実施例) 第5図は本発明の外部共振器型波長可変半導体レーザの
第四の実施例を示す構造図である。第四の実施例では、
第一の実施例の半導体レーザ素子15において、第2の
活性層4と反射防止膜6の間の活性層端面に窓端面構造
16を設けた構成としたものである。従来、反射防止膜
6だけでは低反射率を実現するのが困難であったが、こ
の構成により、窓端面構造16と反射防止膜6とで半導
体レーザ素子端面の反射率を制御できるので0.003
%程度の低い反射率を、広い波長範囲において得ること
ができ、従って活性層の広帯域な特性を有効に利用でき
る。(第五の実施例) 第6図は本発明の外部共振器型波長可変半導体レーザの
第五の実施例を示す構造図である。第五の実施例では、
第三の実施例の半導体レーザ素子15において、第1の
活性層2、第2の活性層4と反射防止膜6の間の活性層
端面に窓端面構造16を設けた構成としたものである。
(Fourth Embodiment) FIG. 5 is a structural diagram showing a fourth embodiment of the external cavity type wavelength tunable semiconductor laser of the present invention. In a fourth embodiment,
In the semiconductor laser device 15 of the first embodiment, a window end face structure 16 is provided on the end face of the active layer between the second active layer 4 and the antireflection film 6. Conventionally, it has been difficult to achieve a low reflectance using only the anti-reflection film 6, but with this configuration, the reflectance of the semiconductor laser element end face can be controlled by the window end face structure 16 and the anti-reflection film 6, so that the reflectance can be reduced to 0. 003
% can be obtained over a wide wavelength range, and therefore the broadband characteristics of the active layer can be effectively utilized. (Fifth Embodiment) FIG. 6 is a structural diagram showing a fifth embodiment of the external cavity type wavelength tunable semiconductor laser of the present invention. In a fifth embodiment,
In the semiconductor laser device 15 of the third embodiment, a window end face structure 16 is provided on the end face of the active layer between the first active layer 2, the second active layer 4, and the antireflection film 6. .

(第六の実施例) 第7図は本発明の外部共振器型波長可変半導体レーザの
第六の実施例を示す構造図である。第六の実施例では、
第四の実施例において、3第1の活性層3、第2の活性
層4に隣接する導波路17を設けたものである。この構
造により第1の活性層3、第2の活性層4で発生した光
子の一部分は、禁制帯幅が第1の活性層3、および第2
の活性層4より広<  InP基板より狭い組成の導波
路17に広がって導波する。この場合、第1の活性層3
で発生した光子がより禁制帯幅の狭い組成の第2の活性
層4により吸収される効果を低減することができる。
(Sixth Embodiment) FIG. 7 is a structural diagram showing a sixth embodiment of the external cavity type wavelength tunable semiconductor laser of the present invention. In a sixth embodiment,
In the fourth embodiment, three waveguides 17 are provided adjacent to the first active layer 3 and the second active layer 4. Due to this structure, a portion of the photons generated in the first active layer 3 and the second active layer 4 have a forbidden band width of the first active layer 3 and the second active layer 4.
The waveguide 17 has a composition wider than the active layer 4 and narrower than the InP substrate, and is guided. In this case, the first active layer 3
It is possible to reduce the effect of photons generated in the second active layer 4 being absorbed by the second active layer 4 having a composition with a narrower forbidden band width.

(第七の実施例) 第8図(a)は本発明の外部共振器型波長可変半導体レ
ーザの第七の実施例を示す構造図、第8図(b)は量子
井戸構造の詳細図、第8図(c)は波長と光出力の関係
を示す特性図である。第七の実施例では、第三の実施例
において、活性層を禁制帯幅の異なる数層の井戸層から
なる量子井戸構造としたものである。この構造により、
注入キャリアはそれぞれの井戸層に閉じ込められるので
、各井戸層の量子準位に応じた波長域で利得を生じさせ
ることができる。このため、井戸層の数が多いほど、発
振させることができる波長帯域を広くすることが可能で
ある。
(Seventh Embodiment) FIG. 8(a) is a structural diagram showing a seventh embodiment of the external cavity type wavelength tunable semiconductor laser of the present invention, FIG. 8(b) is a detailed diagram of the quantum well structure, FIG. 8(c) is a characteristic diagram showing the relationship between wavelength and optical output. In the seventh embodiment, the active layer in the third embodiment has a quantum well structure consisting of several well layers having different forbidden band widths. This structure allows
Since the injected carriers are confined in each well layer, gain can be generated in a wavelength range corresponding to the quantum level of each well layer. Therefore, the larger the number of well layers, the wider the wavelength band that can be oscillated.

なお、各実施例においては波長選択手段として回折格子
を用いたが、回折格子に限らず、■連続波長可変フィル
タを用い、透過中心波長を所定の値に制御する。
In each of the embodiments, a diffraction grating was used as the wavelength selection means; however, the transmission center wavelength is controlled to a predetermined value by using not only a diffraction grating but also a continuously variable wavelength filter.

■光学的圧電結晶を用い、光学的圧電結晶の電極に電圧
をかけ、所定の波長のみを選択的に偏向するように制御
する。
(2) Using an optical piezoelectric crystal, voltage is applied to the electrodes of the optical piezoelectric crystal, and control is performed to selectively deflect only a predetermined wavelength.

等で実現できることは、言うまでもない。It goes without saying that this can be achieved with etc.

〔発明の効果] 以上説明したように本発明の外部共振器型波長可変半導
体レーザは、広い範囲をカバーする単色コヒーレント光
の光源と、外部共振器とで構成され、光源である発光周
波数領域が広い半導体レーザ素子として2種類以上の組
成の異なる活性層を、導波路に沿って直列にするか、ま
たは厚み方向に積み重ねる構成とした。そのため、活性
層に入射した光子が増幅され得る波長範囲が広がるため
、波長の可変範囲をより広帯域にすることができる。
[Effects of the Invention] As explained above, the external cavity type wavelength tunable semiconductor laser of the present invention is composed of a light source of monochromatic coherent light that covers a wide range and an external cavity, and the emission frequency range of the light source is As a wide semiconductor laser element, two or more types of active layers having different compositions are arranged in series along a waveguide or stacked in the thickness direction. Therefore, since the wavelength range in which photons incident on the active layer can be amplified is widened, the wavelength variable range can be made wider.

また、請求項(2)の外部共振器型波長可変半導体レー
ザにおいては、半導体レーザ素子として出射端面から延
びる活性層と、活性層に続く窓端面構造を備えた構造と
した。すなわち、半導体レーザ素子端面の反射率を0.
003%程度に低減することができ、しかも、広帯域で
安定して低反射が得られる端面を実現できる。従って、
活性層の広帯域な特性を有効に活用することができる。
Further, in the external cavity type wavelength tunable semiconductor laser according to claim (2), the semiconductor laser element has a structure including an active layer extending from the emission end face and a window end face structure continuing from the active layer. That is, the reflectance of the semiconductor laser element end face is set to 0.
In addition, it is possible to realize an end face that can stably obtain low reflection over a wide band. Therefore,
The broadband characteristics of the active layer can be effectively utilized.

このような窓端面構造半導体レーザ素子を用いることに
より、狭スペクトル線幅、低ノイズ、広帯域で波長可変
な外部共振器型波長可変半導体レーザを安定に生産する
ことができる。
By using such a semiconductor laser device with a window end facet structure, it is possible to stably produce an external cavity type wavelength tunable semiconductor laser having a narrow spectral linewidth, low noise, and a wavelength tunable over a wide band.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の第一の実施例を示す構造図、第2図は
本発明の製造工程を示す図、 第3図は本発明の第二の実施例を示す構造図、第4図は
本発明の第三の実施例を示す構造図、第5図は本発明の
第四の実施例を示す構造図、第6図は本発明の第五の実
施例を示す構造図、第7図は本発明の第六の実施例を示
す構造図、第8図は本発明の第七の実施例を示す構造図
、第9図は従来の外部共振器型波長可変半導体レーザを
示す構造図。 1.2・・・電極、 1a、■b・・・分割電極、3.
4・・・活性層、5・・・へき開面、6・・・反射防止
膜、 7・・・集光手段(凸レンズ)、 8・・・波長可変手段(回折格子)、 9・・・制御手段(回折格子走査手段)、10・・・基
板、   11・・・バッファ層、12・ ・・アンチ
メルトバック層、 13・・・クラッド層、14・・・マスク、15・・・
半導体レーザ素子、16・・・窓端面構造、17・・・
導波路。
Fig. 1 is a structural diagram showing the first embodiment of the present invention, Fig. 2 is a diagram showing the manufacturing process of the invention, Fig. 3 is a structural diagram showing the second embodiment of the invention, Fig. 4 is a structural diagram showing a third embodiment of the present invention, FIG. 5 is a structural diagram showing a fourth embodiment of the present invention, FIG. 6 is a structural diagram showing a fifth embodiment of the present invention, and FIG. FIG. 8 is a structural diagram showing a sixth embodiment of the present invention, FIG. 8 is a structural diagram showing a seventh embodiment of the present invention, and FIG. 9 is a structural diagram showing a conventional external cavity type wavelength tunable semiconductor laser. . 1.2... Electrode, 1a, ■b... Divided electrode, 3.
4... Active layer, 5... Cleavage plane, 6... Antireflection film, 7... Condensing means (convex lens), 8... Wavelength variable means (diffraction grating), 9... Control Means (diffraction grating scanning means), 10... Substrate, 11... Buffer layer, 12... Anti-meltback layer, 13... Clad layer, 14... Mask, 15...
Semiconductor laser element, 16... Window end surface structure, 17...
waveguide.

Claims (2)

【特許請求の範囲】[Claims] (1)2種類以上の活性層を有する半導体レーザ素子と
、該半導体レーザ素子から放出された光を集光する集光
手段と、該集光手段によって集光された光を入射し所定
の波長のみを選択し入射光とは逆向きに送出する波長選
択手段と、該波長選択手段を所定の波長のみを選択する
ように制御する制御手段とを備えたことを特徴とする外
部共振器型波長可変半導体レーザ。
(1) A semiconductor laser device having two or more types of active layers, a condensing means for condensing light emitted from the semiconductor laser device, and a condensing means for condensing light emitted from the semiconductor laser device; an external resonator type wavelength, characterized by comprising a wavelength selection means for selecting only a predetermined wavelength and transmitting the wavelength in a direction opposite to that of the incident light; and a control means for controlling the wavelength selection means so as to select only a predetermined wavelength. Tunable semiconductor laser.
(2)前記半導体レーザ素子が出射端面から延びる活性
層と、該活性層に続く窓端面構造と、該窓端面構造の外
側に備えられた反射防止膜とを備えたことを特徴とする
請求項1記載の外部共振器型波長可変半導体レーザ。
(2) Claim characterized in that the semiconductor laser element includes an active layer extending from the emission end face, a window end face structure following the active layer, and an antireflection film provided on the outside of the window end face structure. 1. The external cavity type wavelength tunable semiconductor laser according to 1.
JP694490A 1990-01-16 1990-01-16 Outside resonator type variable wavelength semiconductor laser Pending JPH03211781A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP694490A JPH03211781A (en) 1990-01-16 1990-01-16 Outside resonator type variable wavelength semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP694490A JPH03211781A (en) 1990-01-16 1990-01-16 Outside resonator type variable wavelength semiconductor laser

Publications (1)

Publication Number Publication Date
JPH03211781A true JPH03211781A (en) 1991-09-17

Family

ID=11652352

Family Applications (1)

Application Number Title Priority Date Filing Date
JP694490A Pending JPH03211781A (en) 1990-01-16 1990-01-16 Outside resonator type variable wavelength semiconductor laser

Country Status (1)

Country Link
JP (1) JPH03211781A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1128507A3 (en) * 1999-12-22 2003-10-15 Anritsu Corporation Tunable laser source apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1128507A3 (en) * 1999-12-22 2003-10-15 Anritsu Corporation Tunable laser source apparatus

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