JPH03214052A - Heterogeneous layer detector - Google Patents

Heterogeneous layer detector

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Publication number
JPH03214052A
JPH03214052A JP976890A JP976890A JPH03214052A JP H03214052 A JPH03214052 A JP H03214052A JP 976890 A JP976890 A JP 976890A JP 976890 A JP976890 A JP 976890A JP H03214052 A JPH03214052 A JP H03214052A
Authority
JP
Japan
Prior art keywords
coil
measured
detection
probe
eddy current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP976890A
Other languages
Japanese (ja)
Inventor
Akira Mori
彰 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Komatsu Ltd
Original Assignee
Komatsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Komatsu Ltd filed Critical Komatsu Ltd
Priority to JP976890A priority Critical patent/JPH03214052A/en
Publication of JPH03214052A publication Critical patent/JPH03214052A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

PURPOSE:To make it possible to perform detection even if a heterogeneous layer is orthogonal to a measuring surface by tilting a probe for applying a magnetic field on a material to be measured with respect to the detecting surface of the surface to be measured. CONSTITUTION:In a detecting part 10, a Maxwell bridge is constituted of a detecting coil 14 of a probe 12, a correcting coil 16 and a pair of resistors 18 and 20. A bobbin 22 supports the coil 14 so that the coil 14 is tilted with respect to a detecting surface 26 of a material to be measured 24. The magnetic flux generated in the coil 14 is obliquely inputted into the detecting surface 26. One end of each of the coils 14 and 16 is connected to the output side of an amplifier 32 for amplifying the output of an oscillator 30. The other ends are connected to the resistors 18 and 20 and the input side of an amplifier 36. The amplifier 36 amplifies the output of the Maxwell bridge. The amplified signal is inputted into a phase detector 38 together with the output signal of the oscillator 30. The detector 38 detects the phase of the output signal of the oscillator 30, i.e. the exciting current for the coil 14 and the coil 16, and the phase of the output signal of the Maxwell bridge. The signal corresponding to the difference between both phases is outputted.

Description

【発明の詳細な説明】 〔産業上の111用分野〕 本発明は、金属等の被測定物にi#l@流を発生させ、
この渦電流による誘導起電力の変化を検知し′(探傷な
どを行う芥質層検出器に関する。
[Detailed description of the invention] [Industrial 111 field] The present invention generates an i#l@ flow in an object to be measured such as a metal,
This invention relates to a pulp layer detector that detects changes in the induced electromotive force due to this eddy current (for flaw detection, etc.).

C従来の技術〕 金属等の導電性の被測定物に渦電流を発生させ、この渦
電流の変化を検知して被測定物の傷や材質のチエ’7り
を行う非破壊検査装置が知られている。
C. Prior Art] A non-destructive inspection device is known that generates an eddy current in a conductive object such as a metal, detects changes in the eddy current, and checks the material for damage or damage to the object. It is being

このようなJl’:M壊検査装置は、交流磁場を発生す
るコイルを備えたプローブを被測定物に接触または近接
して配置し、プローブから被測定物に交流磁場を印加し
て被測定物に渦電流を発生させ、渦電流の変化によって
プローブの検出コイルに生ずる誘導起電力の変化を検知
し、被測定物中に存在する傷や組成の相違等の異質層を
検出するようになっている。
Such Jl':M fracture inspection equipment places a probe equipped with a coil that generates an alternating magnetic field in contact with or in close proximity to the object to be measured, and applies the alternating magnetic field from the probe to the object to be measured. By generating an eddy current in the probe and detecting changes in the induced electromotive force generated in the detection coil of the probe due to changes in the eddy current, it is now possible to detect foreign layers such as scratches or differences in composition that exist in the object to be measured. There is.

このような従来の検査装置は、被測定物に交流磁場を印
加するプローブを、被測定物の測定面に対して垂直に配
置し、プローブの先端面が測定面と平行となるようにし
ていた。すなわち、プローブは、被測定物に垂直の磁場
を与えるように配置され、測定面と平行に走査して異を
層の検出を行っていた。そして、渦電流の浸透深さは、
プローブのコイルに与える電流の周波数を変化させるこ
とにより調節し、またプローブに与える電流値を変える
ことによって、渦電流の大きさを変化させている。
In such conventional inspection equipment, the probe that applies an alternating magnetic field to the object to be measured is placed perpendicular to the measurement surface of the object, so that the tip of the probe is parallel to the measurement surface. . That is, the probe is arranged so as to apply a perpendicular magnetic field to the object to be measured, and scans parallel to the measurement surface to detect abnormalities in the layer. And the penetration depth of eddy current is
The magnitude of the eddy current is adjusted by changing the frequency of the current applied to the coil of the probe, and by changing the value of the current applied to the probe.

(発明が解決しようとする課題〕 上記のように被測定物に垂直磁場が印加させると、被測
定物に垂直に磁束が入射し、この磁束の周囲に同心固状
の渦電流が発生する。このため、従来のプローブの先端
面を測定面と平行にした検査装置においては、被測定物
に存在する欠陥等の冑′n層が小さい場合に、欠陥の渦
電流に与える影響が小さく、プローブを小さく−4る以
外に検出する方法がなかった。また、異質層が測定面と
垂直になっている場合にも、磁束が異質層を平行に透過
するため、異質層が渦電流に与える影響がが小さく、検
出信号の変化が微小となり、測定が極めて困難であった
(Problems to be Solved by the Invention) When a perpendicular magnetic field is applied to the object to be measured as described above, a magnetic flux is perpendicularly incident on the object to be measured, and a solid concentric eddy current is generated around this magnetic flux. For this reason, in conventional inspection equipment in which the tip surface of the probe is parallel to the measurement surface, when the thickness of the layer such as a defect existing on the object to be measured is small, the influence on the eddy current of the defect is small, and the probe There was no other way to detect the eddy current than by making it smaller than -4.Furthermore, even when the heterogeneous layer is perpendicular to the measurement surface, the magnetic flux passes through the heterogeneous layer in parallel, so the influence of the heterogeneous layer on the eddy current is small. was small, and the changes in the detection signal were minute, making measurement extremely difficult.

本発明は、前記従来技術の欠点を解消するためになされ
たもので、異la層が測定面に垂直な場合にも検出する
ことができる異1rJi検出器を提供することを目的と
する。
The present invention has been made to eliminate the drawbacks of the prior art, and aims to provide a different 1rJi detector that can detect even when the different la layer is perpendicular to the measurement surface.

(課題を解決するための手段〕 ]二記の目的を達成するために、本発明に係るW質層検
出器は、被測定物に渦電流を発生させてRil記被測定
物内の異質層を検出する異質層検出器において、前記被
測定物に磁場を印加するプローフを前記被測定物の検出
面に対して傾斜させ、前記被測定物に印加する磁場を前
記検出面に斜交さゼなことを特徴としている。
(Means for Solving the Problems) ] In order to achieve the above two objects, the tungsten layer detector according to the present invention generates an eddy current in the object to be measured and detects the heterogeneous layer in the object to be measured. In a heterogeneous layer detector for detecting a magnetic field, a probe for applying a magnetic field to the object to be measured is tilted with respect to a detection surface of the object to be measured, and the magnetic field applied to the object to be measured is oriented obliquely to the detection surface. It is characterized by

〔作用〕[Effect]

上記の如く構成した本発明は、被測定物に磁場を印加す
るプローブが被測定物の検出面と傾斜しているため、プ
ローブから被測定物に与える磁場が検出面と斜交し、磁
場の接線方向と一致する磁束も検出面と斜交する。この
ため、被測定物中を透過する磁束が検出面と垂直な異質
層を横切り、磁束の経路に乱れが生じるとともに、磁束
周囲に生ずる間心円状の渦電流が検出面に対して傾斜し
た状態に発生し、検出面と垂直な欠陥等の異質層と斜交
して異質層が見掛は上大きくなり、渦電流の経路が大き
く変化して、検出信号の変動も大きくなる。従って、従
来検出が困難であった検出面に垂直な欠陥等の異質層を
容易に検出することができる。
In the present invention configured as described above, since the probe that applies a magnetic field to the object to be measured is inclined to the detection surface of the object to be measured, the magnetic field applied from the probe to the object to be measured is oblique to the detection surface, and the magnetic field is The magnetic flux that coincides with the tangential direction also intersects obliquely with the detection surface. For this reason, the magnetic flux passing through the object to be measured crosses the heterogeneous layer perpendicular to the detection surface, causing disturbances in the magnetic flux path, and the circular eddy currents generated around the magnetic flux are inclined to the detection surface. This occurs in a state where the foreign layer crosses diagonally with a foreign layer such as a defect perpendicular to the detection surface, making the foreign layer appear larger, the path of the eddy current changes greatly, and the fluctuation of the detection signal also increases. Therefore, foreign layers such as defects perpendicular to the detection surface, which have been difficult to detect in the past, can be easily detected.

また、薄板の溶接等の検出面の深さ方向に厚みのない被
測定物中の異flをも容易に検出することができる。
In addition, it is possible to easily detect abnormal fl in an object to be measured, such as a welded thin plate, which has no thickness in the depth direction of the detection surface.

(実施例〕 本発明に係る異質層検出器の好ましい実施例を、添付図
面に従って詳説する。
(Embodiments) Preferred embodiments of the heterogeneous layer detector according to the present invention will be described in detail with reference to the accompanying drawings.

第1図は、本発明の実施例に係る異質層検出器の説明図
である。
FIG. 1 is an explanatory diagram of a heterogeneous layer detector according to an embodiment of the present invention.

第1図において、検出部10は、プローブ12の検出コ
イル14と補正コイル16と一対の抵抗16.20とに
よってマクスウェルブリッジを構成している。
In FIG. 1, the detection unit 10 constitutes a Maxwell bridge by the detection coil 14 of the probe 12, the correction coil 16, and a pair of resistors 16 and 20.

プローブI2の検出コイル14は、コイルを支持するボ
ビン22に巻回しである。このボビン22は、被測定物
24に対面する先端が斜めに切除され、検出コイル14
を被測定物24の検出面26に対して1頃斜させて支持
し、検出コイル14が発生した磁束を検出面26に斜交
して入射するようになっている。
The detection coil 14 of the probe I2 is wound around a bobbin 22 that supports the coil. This bobbin 22 has its tip facing the object to be measured 24 cut off obliquely, and the detection coil 14
is supported at an angle of about 1 with respect to the detection surface 26 of the object to be measured 24, so that the magnetic flux generated by the detection coil 14 is obliquely incident on the detection surface 26.

補正コイル16は、検出部IOの出力を周囲温度および
被測定物24の材質に応じた補正をするもので、ボビン
28に巻回されていて、検出部2Gに垂直に保持される
ようになっている。これらのコイル14.16は、一端
が発振器30の出力を増幅する増幅器32の出力側に接
続され、発振器30から励磁電流を受けるようになって
いる。
The correction coil 16 corrects the output of the detection section IO according to the ambient temperature and the material of the object to be measured 24, and is wound around a bobbin 28 and held perpendicularly to the detection section 2G. ing. These coils 14 and 16 are connected at one end to the output side of an amplifier 32 that amplifies the output of the oscillator 30, and receive excitation current from the oscillator 30.

そして、検出コイル14は、矢印34に示したように、
検出面26と平行に移動して検出部26を走査し、被測
定物24中の異質層である欠陥50の有無を検知する。
Then, the detection coil 14, as shown by the arrow 34,
The detection unit 26 moves parallel to the detection surface 26 to scan, and detects the presence or absence of a defect 50, which is a foreign layer, in the object 24.

検出コイル14と補正コイル16との他端は、接地しで
ある抵抗16.20と増幅器36の入力端に接続しであ
る。増幅536は、マクスウェルブリッジの出力を増幅
するもので、増幅した信号が発振器30の出力信号とと
もに位相検波器38に入力する。位相検波器38は、発
振器30の出力信号、すなわち検出コイル14、補正コ
イル16の励磁電流の位相とマクスウェルブリッジの出
力信号の位相とを検波し、両者の位相差に応じた信号を
出力する。そして、位相検波器38の出力信号は、増幅
器40によって増幅される。
The other ends of the detection coil 14 and the correction coil 16 are connected to a resistor 16.20 which is grounded and to the input end of the amplifier 36. The amplifier 536 amplifies the output of the Maxwell bridge, and the amplified signal is input to the phase detector 38 together with the output signal of the oscillator 30. The phase detector 38 detects the output signal of the oscillator 30, that is, the phase of the excitation current of the detection coil 14 and the correction coil 16, and the phase of the output signal of the Maxwell bridge, and outputs a signal according to the phase difference between the two. The output signal of the phase detector 38 is then amplified by an amplifier 40.

上記の如く構成した実施例の作用は、次のとおりである
The operation of the embodiment configured as described above is as follows.

発振器30は、所定の周波数の励磁電流を検出コイル1
4と補正コイル1Gとに与えるとともに、その励磁電流
の位相信号を位相検波器38に入力する。検出口1イル
I4と補正コイル16とは、発振器:30から励6イ1
電流を受けると、コイルの軸線方向の交/A磁場を発生
し、磁束を被測定物24に入射し′ζ被測定物24に渦
電流を発生させる。
The oscillator 30 detects the excitation current of a predetermined frequency by the coil 1.
4 and the correction coil 1G, and the phase signal of the excitation current is input to the phase detector 38. The detection port 1 I4 and the correction coil 16 are connected to the excitation 6 I1 from the oscillator 30.
When receiving a current, it generates an alternating/A magnetic field in the axial direction of the coil, injects magnetic flux into the object 24 to be measured, and generates an eddy current in the object 24.

被測定物24に渦電流が発生ずると、検出コイル14と
補iEコイルI6とには、渦電流による誘導起電力が生
し、この両コイルに生ずる誘導起電力の差が増幅器36
によって増幅され、位相検波器38に送られる。
When an eddy current is generated in the object to be measured 24, an induced electromotive force due to the eddy current is generated in the detection coil 14 and the auxiliary iE coil I6, and the difference in the induced electromotive force generated in both coils is applied to the amplifier 36.
and sent to the phase detector 38.

ずなわら、補正コイル16は、被測定物24のiU’!
’iな部分に4ff束を41直に入射し、その部分に渦
電lNを発生させ、この渦電流の大きさに応した誘導起
電力を検出信号として出力する。一方、プローブI2の
検出コイル14は、第2図に示したように、ボビン22
によって検出面26に対して角度θだけ傾斜して支持さ
れており、この傾斜した状態のまま第1図の矢印34の
ように検出面2Gに沿って移動し、検出面26に斜交し
た磁束φを被測定物24に入射する。このため、検出面
2Gに斜交した磁束φが検出面26に垂直な欠陥50を
横切り、磁束−の経路に乱れを生ずる。また、磁束φの
変化に伴って被測定物24内に生ずる誘導起電力が検出
面26に対して傾斜した面内に生じ、この誘導起電力に
よる渦電流iが検出面26と傾斜して発生する。従って
、被測定物24内に生ずる渦電流1に乱れを生ずるとと
もに、欠陥50が検出面26に垂直であっても、見掛け
の大きさが大きくなり、渦電流iに大きな変化を与る。
Of course, the correction coil 16 adjusts iU'! of the object to be measured 24!
A 4ff flux is directly incident on the part 41 to generate an eddy current lN in that part, and an induced electromotive force corresponding to the magnitude of this eddy current is output as a detection signal. On the other hand, the detection coil 14 of the probe I2 is connected to the bobbin 22 as shown in FIG.
It is supported at an angle θ with respect to the detection surface 26, and in this inclined state, it moves along the detection surface 2G as shown by the arrow 34 in FIG. φ is incident on the object to be measured 24. Therefore, the magnetic flux φ obliquely crossing the detection surface 2G crosses the defect 50 perpendicular to the detection surface 26, causing disturbance in the path of the magnetic flux. Further, an induced electromotive force generated in the object to be measured 24 due to a change in the magnetic flux φ is generated in a plane inclined to the detection surface 26, and an eddy current i due to this induced electromotive force is generated inclined to the detection surface 26. do. Therefore, the eddy current 1 generated in the object to be measured 24 is disturbed, and even if the defect 50 is perpendicular to the detection surface 26, the apparent size increases, causing a large change in the eddy current i.

そして、この渦電流iの大きな変化が、検出コイル14
に誘起される誘導起電力の変動を大きくし、検出コイル
14の検出信号を変動させる。この結果、欠陥50が微
小なものであったあり、検出面2Gに垂直であっても、
検出信号の変動が大きくなり、容易に検出できる。また
、被測定物24が極めて薄い0.1mm程度のもにであ
っても、溶接部などを検出することが可能となる。
This large change in the eddy current i causes the detection coil 14
This increases the variation in the induced electromotive force induced by the sensor, thereby causing the detection signal of the detection coil 14 to vary. As a result, the defect 50 was minute, and even though it was perpendicular to the detection surface 2G,
The fluctuation of the detection signal becomes large and can be easily detected. Moreover, even if the object to be measured 24 is extremely thin, about 0.1 mm, it is possible to detect welds and the like.

検出コイル14の出力信号の変化は増幅器36によって
増幅され、位相検波器38に送られる。
Changes in the output signal of the detection coil 14 are amplified by an amplifier 36 and sent to a phase detector 38.

位相検波器3Bは、両コイルの誘導起電力の差に基づく
信号と発振器30の出力信号との位相差を求めて欠陥5
0の大きさに応した信号を出力する。
The phase detector 3B determines the phase difference between the signal based on the difference in the induced electromotive force of both coils and the output signal of the oscillator 30, and detects the defect 5.
A signal corresponding to the magnitude of 0 is output.

なお、渦電流の浸透深さδは、磁場の周波数fと火工(
の関係にあり、検出コイル14と補正コイル16とに惟
える励磁電流の周波数によって変化する。
The penetration depth δ of the eddy current is determined by the frequency f of the magnetic field and the pyrotechnic (
The relationship is as follows, and it changes depending on the frequency of the excitation current that flows through the detection coil 14 and the correction coil 16.

δ−l/f1]−「ア ただし、ここに、σは被測定物24の電気伝導率、μは
被測定物24の透磁率である。
δ-l/f1] - "a, where σ is the electrical conductivity of the object to be measured 24, and μ is the magnetic permeability of the object to be measured 24.

従って、検出コイル14を励磁する周波数を変えること
により、被測定物24に発生させる渦電流の浸i8深さ
を変えることができ、被測定物24の濶さ方向における
欠陥50等の異質層の存在を検出することができる。そ
して、欠陥50の位置は、被測定物24を走査するプロ
ーブ12の位置を求めることにより知ることができる。
Therefore, by changing the frequency at which the detection coil 14 is excited, the immersion depth i8 of the eddy current generated in the object to be measured 24 can be changed, and the depth of penetration i8 of the eddy current generated in the object to be measured 24 can be changed. presence can be detected. The position of the defect 50 can be determined by determining the position of the probe 12 scanning the object to be measured 24.

また、渦電流の大きさは、前記したようにコイルに与え
る励MW流の大きさを変えることにより調節することが
できる。
Further, the magnitude of the eddy current can be adjusted by changing the magnitude of the excitation MW flow applied to the coil as described above.

なお、前記実施例においては、金属の場合について説明
したが、導電性プラスチック等にも適用することができ
る。また、前記実施例においては、検出コイル14と補
正コイルI6とによって磁場を被測定物24に印加する
とともに、被測定物24に生じた渦電流を検出する場合
について説明したが、励磁用コイルと渦電流検出用コイ
ルとを別々に設けてもよい、そして、前記実施例におい
ては、位相検波器3日によって異質層の大きさ等を検出
する場合について説明したが、コイルとコンデンサによ
るインピーダンスの変化を読み取る等の方法によって異
質層の大きさ等を求めてもよい。
In the above embodiments, the case of metal has been described, but the present invention can also be applied to conductive plastic or the like. Furthermore, in the embodiment described above, a case has been described in which a magnetic field is applied to the object to be measured 24 by the detection coil 14 and the correction coil I6, and an eddy current generated in the object to be measured 24 is detected. A coil for detecting eddy current may be provided separately.Although in the above embodiment, the size of a foreign layer is detected using a phase detector, changes in impedance due to the coil and capacitor may be used. The size of the heterogeneous layer may be determined by a method such as reading .

さらに、各コイル14.16のボビン22.28内にコ
アを設けてもよいし、コアに直接コイルを巻回してもよ
い、この場合、検出コイル14のコアの先端にコアを傾
けて支持する支持部材を取り付ける。
Furthermore, the core may be provided in the bobbin 22.28 of each coil 14.16, or the coil may be wound directly around the core. In this case, the core is tilted and supported at the tip of the core of the detection coil 14. Attach the support member.

(発明の効果) 以上に説明したように、本発明によれば、被測定物に磁
場を印加するプローブが被測定物の検出面と傾斜してい
るため、プローブから被測定物に与える磁場が検出面と
斜交し、被測定物中をi3遇する磁束が検出面と垂直な
異質層を横切り、磁束の経路に乱れが生じるとともに、
磁束周囲に生ずる同心円状の渦電流が検出面に対して傾
斜した状態に発生し、検出面に垂直な欠陥等の異質層と
斜交して貨質層が見掛は上大きくなって渦電流の経路を
大きく変化させ、従来検出が困難であった検出面に垂直
な欠陥等の異質層を容易に検出することができる。
(Effects of the Invention) As explained above, according to the present invention, since the probe that applies a magnetic field to the object to be measured is inclined to the detection surface of the object to be measured, the magnetic field applied from the probe to the object to be measured is The magnetic flux obliquely intersecting the detection surface and flowing through the object to be measured crosses the heterogeneous layer perpendicular to the detection surface, causing disturbance in the path of the magnetic flux, and
Concentric eddy currents generated around the magnetic flux are generated at an angle to the detection surface, and intersect diagonally with foreign layers such as defects perpendicular to the detection surface, making the material layer appear larger and causing eddy currents. By greatly changing the path of the sensor, it is possible to easily detect foreign layers such as defects perpendicular to the detection surface, which were previously difficult to detect.

【図面の簡単な説明】[Brief explanation of drawings]

′:j41図は本発明の実施例に係る異質層検出器の説
明図、第2図は実施例の作用説明図である。 lO検出部、12  プローブ、14 検出コイル、1G  補正コイル。
':j Figure 41 is an explanatory diagram of a heterogeneous layer detector according to an embodiment of the present invention, and Fig. 2 is an explanatory diagram of the operation of the embodiment. 1O detection section, 12 probes, 14 detection coils, 1G correction coil.

Claims (1)

【特許請求の範囲】[Claims] (1)被測定物に渦電流を発生させて前記被測定物内の
異質層を検出する異質層検出器において、前記被測定物
に磁場を印加するプローブを前記被測定物の検出面に対
して傾斜させ、前記被測定物に印加する磁場を前記検出
面に斜交させたことを特徴とする異質層検出器。
(1) In a heterogeneous layer detector that detects a heterogeneous layer within an object to be measured by generating an eddy current in the object, a probe that applies a magnetic field to the object is directed toward the detection surface of the object. A heterogeneous layer detector characterized in that the magnetic field applied to the object to be measured is obliquely crossed to the detection surface.
JP976890A 1990-01-18 1990-01-18 Heterogeneous layer detector Pending JPH03214052A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP976890A JPH03214052A (en) 1990-01-18 1990-01-18 Heterogeneous layer detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP976890A JPH03214052A (en) 1990-01-18 1990-01-18 Heterogeneous layer detector

Publications (1)

Publication Number Publication Date
JPH03214052A true JPH03214052A (en) 1991-09-19

Family

ID=11729447

Family Applications (1)

Application Number Title Priority Date Filing Date
JP976890A Pending JPH03214052A (en) 1990-01-18 1990-01-18 Heterogeneous layer detector

Country Status (1)

Country Link
JP (1) JPH03214052A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011025049A1 (en) * 2009-08-26 2011-03-03 Sumitomo Chemical Company, Limited Method for inspecting an austenitic stainless steel weld
JP2012032180A (en) * 2010-07-28 2012-02-16 Toshiba Corp Eddy current detector, method, and program

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011025049A1 (en) * 2009-08-26 2011-03-03 Sumitomo Chemical Company, Limited Method for inspecting an austenitic stainless steel weld
JP2012032180A (en) * 2010-07-28 2012-02-16 Toshiba Corp Eddy current detector, method, and program

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