JPH03218226A - Sensor power supply reverse connection destruction prevention circuit - Google Patents
Sensor power supply reverse connection destruction prevention circuitInfo
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- JPH03218226A JPH03218226A JP2013102A JP1310290A JPH03218226A JP H03218226 A JPH03218226 A JP H03218226A JP 2013102 A JP2013102 A JP 2013102A JP 1310290 A JP1310290 A JP 1310290A JP H03218226 A JPH03218226 A JP H03218226A
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- Prior art keywords
- power supply
- circuit
- sensor
- voltage
- reverse connection
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Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は光電センサ、近接センサ、超音波センサ等のセ
ンサの内蔵電源回路の入力側に設けられる電源逆接続破
壊防止回路に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a reverse power connection damage prevention circuit provided on the input side of a built-in power supply circuit of a sensor such as a photoelectric sensor, a proximity sensor, or an ultrasonic sensor.
人や物体の検出を行う光電センサ、近接センサ、超音波
センサは、通常その制御対象機器である自動ドアの駆動
部等から離れた地点に取付けられるため、別電源が供給
される。そして取付環境に応じた様々な電源を使用する
ことを可能にし、長い電源供給線における電圧降下を許
容するため、例えば3.8〜30Vといった広い電圧範
囲で電源供給できるようにしている。Photoelectric sensors, proximity sensors, and ultrasonic sensors that detect people and objects are usually installed at a location remote from the device to be controlled, such as an automatic door drive unit, and therefore are supplied with a separate power source. In addition, it is possible to use various power sources depending on the installation environment, and in order to tolerate voltage drops in long power supply lines, power can be supplied in a wide voltage range of 3.8 to 30V, for example.
従来のセンサの回路構成を、電源部を主として示すと、
例えば第3図に示すようになる。The circuit configuration of a conventional sensor, mainly showing the power supply section, is as follows:
For example, as shown in FIG.
第3図において、(1)は直流電源人力端子で、例えば
3.8V〜30Vの直流電圧が供給される。(2)は直
流電源入方端子(1)の次段に接続されたサージ吸収回
路で、抵抗RとコンデンサCとから構成される。(3)
はサージ吸収回路(2)の次段に順方向接続されたスイ
ッチングダイオードで、電源の逆接続から内部回路を保
護する。(4)はスイッチングダイオード(3)の次段
に接続された電源回路で、定電圧を発生する。(5)は
センサ回路で、光電センサの場合は投光素子、受光素子
、及びその駆動回路等からなる。(6)はLEDからな
る動作表示灯で、センサ回路(5)に供給されている電
圧を抵抗(7)を通して受ける。In FIG. 3, (1) is a direct current power supply terminal, to which a direct current voltage of, for example, 3.8V to 30V is supplied. (2) is a surge absorption circuit connected to the next stage of the DC power input terminal (1), and is composed of a resistor R and a capacitor C. (3)
is a switching diode that is forward-connected to the next stage of the surge absorption circuit (2) and protects the internal circuit from reverse connection of the power supply. (4) is a power supply circuit connected to the next stage of the switching diode (3) and generates a constant voltage. (5) is a sensor circuit, which, in the case of a photoelectric sensor, consists of a light emitting element, a light receiving element, a driving circuit thereof, and the like. (6) is an operation indicator light made of an LED, which receives the voltage supplied to the sensor circuit (5) through a resistor (7).
上記センサ(8)の電源供給の概略は、直流電源入力端
子(1)に供給された外部電源のサージ成分をサージ吸
収回路(2)で除去し、電源回路(4)で定電圧化して
センサ回路(5)に供給するもので、電源回路(5)の
定電圧化動作によって、直流電源入力端子(1)への供
給電圧を、例えば3.8V〜30Vと広範囲なものとす
る。またスイッチングダイオード(3)は、直流電源入
力端子(1)への極性を誤った外部電源の接続があった
とき、通電を阻止してセンサ回路(5)を保護する。The outline of the power supply to the sensor (8) is that the surge component of the external power supply supplied to the DC power input terminal (1) is removed by the surge absorption circuit (2), and the voltage is made constant by the power supply circuit (4). The voltage supplied to the DC power input terminal (1) is set to be within a wide range of 3.8V to 30V, for example, by the constant voltage operation of the power supply circuit (5). Furthermore, the switching diode (3) protects the sensor circuit (5) by blocking current flow when an external power source with incorrect polarity is connected to the DC power input terminal (1).
上記センサ(8)は、外部から供給される電圧を広範囲
に許容しているが、その範囲の低い側の電圧レベルにつ
いて考察して見る。Although the sensor (8) accepts a wide range of externally supplied voltages, consider the voltage levels at the lower end of that range.
第3図に示す従来のセンサ(8)において、直流電源入
力端子(1)に直流3■が供給された場合を考える。セ
ンサ回路(5)が約20mAを消費するとして、サージ
吸収回路(2)の抵抗R ( 4.7Ω)で約0,IV
の電圧降下、スイッチングダイオード(3)の順方向電
圧降下で約0.9■、電源回路(4)で約0.2■の電
圧降下が生じる。ここでスイッチングダイオード(3)
の電圧降下は、一般的な値であり、電源回路(4)の電
圧降下は、接続された外部電源の電圧によって大きく変
動するが、0.2vは最小レヘルの場合である。In the conventional sensor (8) shown in FIG. 3, let us consider a case where 3cm of DC is supplied to the DC power input terminal (1). Assuming that the sensor circuit (5) consumes approximately 20mA, the resistance R (4.7Ω) of the surge absorption circuit (2) is approximately 0.IV.
, a forward voltage drop of about 0.9 cm in the switching diode (3), and a voltage drop of about 0.2 cm in the power supply circuit (4). Here the switching diode (3)
The voltage drop is a typical value, and the voltage drop of the power supply circuit (4) varies greatly depending on the voltage of the external power supply connected, but 0.2 V is the minimum level.
このように従来の電源入力回路では、3■という低い電
圧が供給されると直流電源入力端子(1)からセンサ回
路(5)までの間に0.1+0.9+ 0.2= 1.
2Vもの電圧降下があって、センサ回路(5)には約1
.8Vの電圧しか供給されない。この結果、センサ回路
(5)は動作せず、その動作表示灯(6)を点灯させる
こともできない。In this way, in the conventional power input circuit, when a voltage as low as 3■ is supplied, the distance between the DC power input terminal (1) and the sensor circuit (5) is 0.1+0.9+0.2=1.
There is a voltage drop of 2V, and the sensor circuit (5) has a voltage drop of about 1V.
.. Only 8V voltage is supplied. As a result, the sensor circuit (5) does not operate, and its operation indicator light (6) cannot be turned on.
上記従来のセンサ(8)において、使用可能な外部供給
電圧の最低レベルを決定する主要因は、上記例示のよう
にスイッチングダイオード(3)における電圧降下であ
る。このように従来はスイッチングダイオード(3)を
使用していたために、使用できる外部電源の最小電圧が
、大きく制約され、使用条件を狭めるという問題があっ
た。In the conventional sensor (8), the main factor determining the lowest level of external supply voltage that can be used is the voltage drop across the switching diode (3), as exemplified above. As described above, since the switching diode (3) was conventionally used, there was a problem in that the minimum voltage of the external power supply that can be used was greatly restricted, and the conditions of use were narrowed.
そこで、本発明は逆接続破壊防止用の回路として、順方
向電圧降下が、従来のスイッチングダイオードより、か
なり小さいものの提供を目的とする。Therefore, an object of the present invention is to provide a circuit for preventing reverse connection breakdown, which has a forward voltage drop that is considerably smaller than that of conventional switching diodes.
本発明は、制御対象機器から離隔配置され、制御対象機
器に検出信号を出力するセンサの内蔵電源回路と、その
直流電源入力端子の間に挿入接続される電源逆接続破壊
防止回路であって、内蔵電源回路側にソース電極を接続
し、ゲート電極を抵抗を介して接地し、直流電源入力端
(5)
子の能動端子側にドレイン電極を接続したP(外部電源
が負電源の場合はN)チャンネル形FETと、このFE
Tのソース〜ゲート間に逆バイアス接続されたツェナー
ダイオードとから構成されたことを特徴とするセンサー
の電源逆接続破壊防止回路を開示する。The present invention is a power supply reverse connection destruction prevention circuit that is inserted and connected between a built-in power supply circuit of a sensor that is placed apart from a controlled device and outputs a detection signal to the controlled device, and its DC power input terminal, The source electrode is connected to the built-in power supply circuit side, the gate electrode is grounded via a resistor, and the drain electrode is connected to the active terminal side of the DC power input terminal (5). ) channel type FET and this FE
Disclosed is a reverse power supply breakdown prevention circuit for a sensor, characterized in that it is comprised of a Zener diode connected in reverse bias between the source and gate of a sensor.
上記逆接続破壊防止回路(24)のP (N)チャンネ
ルFET(25)は、第1図に示すように、そのゲート
電極が抵抗(27)を介して接地されているので、直流
電源入力端子(22)から正しい接続で電源が供給され
ると、ソース〜ゲート電極間にバイアス電圧が加わり、
ドレイン〜ソース電極間が導通する。As shown in FIG. 1, the P (N) channel FET (25) of the reverse connection breakdown prevention circuit (24) has its gate electrode grounded via the resistor (27), so the DC power input terminal When power is supplied from (22) with the correct connection, a bias voltage is applied between the source and gate electrodes,
Electrical conduction occurs between the drain and source electrodes.
この導通時のドレイン〜ソース電極間の電圧降下は約0
.1V程度と小さく、外部から接続される電源の使用可
能な最低電圧を、スイッチングダイオードを用いた場合
に比べ約0.9− 0.1= 0.8Vだけ低下できる
。.m(7)FET (25) ノソース〜ゲート電極
間に接続されたツェナーダ(6)
イオード(26)はソース〜ゲート電極間に定格を越え
るハイアス電圧が加わるのを防止し、FETを保護する
。一方直流電源入力端子(22)に極性が逆向きに電源
が供給されるとソース〜ゲート間の逆バイアス電圧がF
ET(25)を非導通状態にし、電源回路(28)への
電流の流入は遮断される。The voltage drop between the drain and source electrodes during this conduction is approximately 0.
.. It is as small as about 1V, and the minimum usable voltage of an externally connected power source can be lowered by about 0.9-0.1=0.8V compared to when a switching diode is used. .. m(7) FET (25) The zener diode (26) connected between the source and the gate electrode prevents a high-ass voltage exceeding the rating from being applied between the source and the gate electrode, thereby protecting the FET. On the other hand, if power is supplied to the DC power input terminal (22) with opposite polarity, the reverse bias voltage between the source and the gate will be F.
The ET (25) is brought into a non-conductive state, and the flow of current into the power supply circuit (28) is interrupted.
次に本発明の回路の動作を一層明瞭にするため、本発明
の逆接続破壊防止回路(21)に一見して似ているが、
動作が全く異なる定電圧回路を、参考のため、第4図に
示し、説明する。この定電圧回路(9)は本発明の逆接
続破壊防止回路(21)とは異なり、正電源に対しては
Nチャンネル形FET(10)を使用し、そのゲート電
極とアースライン間にツェナーダイオード(11)を接
続し、ドレイン〜ゲート電極間に抵抗(12)を接続し
ている。Next, in order to further clarify the operation of the circuit of the present invention, although it looks similar to the reverse connection breakdown prevention circuit (21) of the present invention,
For reference, a constant voltage circuit whose operation is completely different is shown in FIG. 4 and will be explained. This constant voltage circuit (9) differs from the reverse connection breakdown prevention circuit (21) of the present invention in that it uses an N-channel FET (10) for the positive power supply, and a Zener diode is connected between its gate electrode and the ground line. (11) is connected, and a resistor (12) is connected between the drain and gate electrodes.
この回路(9)は、ソース電極の出力電圧を、ツェナー
ダイオード(11)のツェナー電圧によって決定される
ゲート電極の電圧と同レベルに保つようにドレイン〜ソ
ース電極間で電圧降下させるもので、本発明とはFET
の極性が逆であり、抵抗(12)とツェナーダイオード
(11)の使われ方も全く異なる。This circuit (9) drops the voltage between the drain and source electrodes so that the output voltage of the source electrode is kept at the same level as the voltage of the gate electrode determined by the Zener voltage of the Zener diode (11). The invention is FET
The polarity of the resistor (12) and the Zener diode (11) are completely different.
本発明の一実施例を第1図に示し以下説明する。 An embodiment of the present invention is shown in FIG. 1 and will be described below.
第1図は本発明の逆接続破壊防止回路(24)を組み込
んだセンサ(21)の回路構成を示し、(22)は直流
電源入力端子、(23)は抵抗RとコンデンサCとから
なるサージ吸収回路である(24)は逆接続破壊防止回
路であって、Pチャンネル形FET(25)とツェーナ
ーダイオード(26)と、抵抗(27)とから構成され
る。Figure 1 shows the circuit configuration of a sensor (21) incorporating the reverse connection breakdown prevention circuit (24) of the present invention, (22) is a DC power input terminal, and (23) is a surge sensor consisting of a resistor R and a capacitor C. The absorption circuit (24) is a reverse connection breakdown prevention circuit, and is composed of a P-channel FET (25), a Zener diode (26), and a resistor (27).
(28)は定電圧に安定化した電圧を出力する電源回路
、(29)はセンサ回路で、光電センサの場合は投光素
子、受光素子及びそれらの制御回路を含む。(30)は
センサの動作表示灯で、LEDが使用され、センサ回路
(29)に供給された電圧を抵抗(31)を介して受け
る。(28) is a power supply circuit that outputs a voltage stabilized to a constant voltage, and (29) is a sensor circuit, which in the case of a photoelectric sensor includes a light emitting element, a light receiving element, and their control circuits. (30) is a sensor operation indicator light, which uses an LED and receives the voltage supplied to the sensor circuit (29) via a resistor (31).
上記センザ(21)の電源供給は、第3図に示した従来
のセンサ(8)と同様に直流電源入力端子(22)に接
続された外部電源のサージ成分をサージ吸収回路(23
)で除去し、電源回路(28)で定電圧に安定化してセ
ンサ回路(29)に供給するものである。ただし逆接続
破壊防止回路(24)は、従来のスイッチングダイオー
ド(3)とは異なり、Pチャンネル形FET(25)を
用いて構成されている。The power supply to the sensor (21) is carried out by using a surge absorbing circuit (21) to supply surge components of an external power source connected to the DC power input terminal (22), similar to the conventional sensor (8) shown in FIG.
), the voltage is stabilized at a constant voltage by a power supply circuit (28), and the voltage is supplied to a sensor circuit (29). However, the reverse connection breakdown prevention circuit (24) is configured using a P-channel type FET (25), unlike the conventional switching diode (3).
この逆接続破壊防止回路(24)の動作は次のようにな
る。The operation of this reverse connection breakdown prevention circuit (24) is as follows.
直流電源入力端子(22)に、極性を誤って外部から電
源が接続されると(接地端子に+、能動端子にー)、抵
抗(27)の作用によりPチャンネル形FET(25)
のゲート電極の電位がソース電極より高くなるので、F
ET(25)は導通せず、電源回路等のセンサ内部回路
は、逆極性電流の流入による破壊から保護される。If an external power source is connected to the DC power input terminal (22) with the wrong polarity (+ to the ground terminal, - to the active terminal), the P-channel FET (25) will be damaged by the action of the resistor (27).
Since the potential of the gate electrode of F becomes higher than that of the source electrode, F
ET (25) is not conductive, and the internal circuits of the sensor, such as the power supply circuit, are protected from destruction due to the inflow of reverse polarity current.
一方、直流電源入力端子(22)に正しい極性で外部電
源を接続すると、Pチャンネル形FE(9)
T (25)のソース電極の電位がゲート電極の電位よ
り高くなり、ドレイン〜ソース電極間は導通する。この
ときツェナーダイオード(26)は、ソース〜ゲート電
極間の電圧が最大定格を越えないようにする。例えば、
この最大定格が6■のときツェナー電圧を5.6■に選
べば、Pチャンネル形FET(25)は、略完全な導通
状態になり、ドレイン〜ソース電極間の電圧降下は約0
.1vと小さい。On the other hand, when an external power supply is connected to the DC power input terminal (22) with the correct polarity, the potential of the source electrode of the P-channel type FE (9) T (25) becomes higher than the potential of the gate electrode, and the voltage between the drain and source electrodes becomes Conduct. At this time, the Zener diode (26) prevents the voltage between the source and gate electrodes from exceeding the maximum rating. for example,
If the maximum rating is 6■ and the Zener voltage is selected to be 5.6■, the P-channel FET (25) becomes almost completely conductive, and the voltage drop between the drain and source electrodes is approximately 0.
.. It's as small as 1v.
この結果、本発明のセンサ(21)の電源入力段の電圧
降下は、従来のスイッヂングダイオードを用いた場合と
比べ約0.1 0.1= 0.8Vと小さくなりる。そ
のためサージ電圧吸収回路(23)と電源回路(28)
が、第1図に示す従来のセンサ(8)と同一のものであ
るとすれば、センサ(21)を動作させることが可能な
外部電源の電圧を、従来より0.8V程度低くすること
ができる。例えば外部電源の電圧が3■であったとして
もセンサ回路(29)にば3 − 0.1−0.2−2
.6Vが供給できるのでセンザ(21)の動作(10)
も可能であるし、動作表示灯(30)も点灯できる。As a result, the voltage drop at the power input stage of the sensor (21) of the present invention is reduced to approximately 0.1 V = 0.8 V, compared to when a conventional switching diode is used. Therefore, surge voltage absorption circuit (23) and power supply circuit (28)
However, if it is the same as the conventional sensor (8) shown in Fig. 1, the voltage of the external power supply that can operate the sensor (21) can be lowered by about 0.8 V than the conventional one. can. For example, even if the external power supply voltage is 3■, the sensor circuit (29) will have a voltage of 3-0.1-0.2-2.
.. Since 6V can be supplied, the sensor (21) can be operated (10) and the operation indicator light (30) can also be lit.
なお、上記第1図に示すセンサ(21)の実施例は、直
流電源入力端子(22)に正電源を加える場合を示した
が、負電源を加える場合は、第2図に示すようにNチャ
ンネル型FET(25a)を用い、ツェナーダイオード
(26)の極性を反転して組み込めばよい。Note that the embodiment of the sensor (21) shown in FIG. 1 above shows the case where a positive power source is applied to the DC power input terminal (22), but when applying a negative power source, as shown in FIG. A channel type FET (25a) may be used and the polarity of the Zener diode (26) may be reversed and incorporated.
本発明によれば、P (N)チャンネル形FETを用い
ることによりセンサの電源回路の前段に組み込む外部電
源の逆接続破壊防止回路として、電圧降下が従来の約1
/9程度のものを提供できる。この結果、センサを動作
させることができる外部供給電源の電圧範囲の下限を、
例えば、従来の3.8vから3■まにまで拡大すること
ができ、この種センサの動作条件を緩やかにし、外部電
源の電圧降下に対して動作の信頼性を高めるとともに、
その設置工事を容易にする。According to the present invention, by using a P (N) channel type FET, a voltage drop can be reduced by about 1% compared to the conventional one as a reverse connection breakdown prevention circuit for an external power supply that is incorporated in the front stage of a sensor power supply circuit.
/9 can be provided. As a result, the lower limit of the voltage range of the external power supply that can operate the sensor is
For example, it can be expanded from the conventional 3.8V to 3V, making the operating conditions of this type of sensor gentler and increasing the reliability of operation against voltage drops in the external power supply.
To facilitate the installation work.
第1図は本発明の逆接続破壊防止回路を組み込んだセン
サの回路構成図、第2図は第1図とは極性が異なる電源
に使用する本発明の逆接続破壊防止回路の回路図である
。
第3図は従来のセンザの回路構成図、第4図は本発明の
逆接続破壊防止回路に類似した定電圧回路の回路図であ
る。
(21)−センサ、
(22) −−一直流電源入力端子、
(24) 一逆接続破壊防止回路、
(25)・−Pチャンネル型FET、
(26) − ツェナーダイオード、
(27L−−一抵抗、 (2B) 一電源回路。FIG. 1 is a circuit diagram of a sensor incorporating the reverse connection breakdown prevention circuit of the present invention, and FIG. 2 is a circuit diagram of the reverse connection breakdown prevention circuit of the present invention used for a power source with a polarity different from that in FIG. 1. . FIG. 3 is a circuit diagram of a conventional sensor, and FIG. 4 is a circuit diagram of a constant voltage circuit similar to the reverse connection breakdown prevention circuit of the present invention. (21) - Sensor, (22) - - DC power supply input terminal, (24) - Reverse connection breakdown prevention circuit, (25) - P channel type FET, (26) - Zener diode, (27L - - resistance , (2B) One power supply circuit.
Claims (1)
号を出力するセンサの内蔵電源回路と、その直流電源入
力端子の間に挿入接続される電源逆接続破壊防止回路で
あって、 内蔵電源回路側にソース電極を接続し、ゲート電極を抵
抗を介して接地し、直流電源入力端子の能動端子側にド
レイン電極を接続したP(外部電源が負電源の場合はN
)チャンネル形FETと、このFETのソース〜ゲート
電極間に逆バイアス接続されたツェナーダイオードとか
ら構成されたことを特徴とするセンサの電源逆接続破壊
防止回路。[Scope of Claims] A power supply reverse connection breakdown prevention circuit that is inserted and connected between a built-in power supply circuit of a sensor that is placed apart from a controlled device and outputs a detection signal to the controlled device, and its DC power input terminal. Then, the source electrode is connected to the built-in power supply circuit side, the gate electrode is grounded via a resistor, and the drain electrode is connected to the active terminal side of the DC power supply input terminal.
) A reverse power supply breakdown prevention circuit for a sensor, comprising a channel type FET and a Zener diode connected in reverse bias between the source and gate electrodes of the FET.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013102A JP2804333B2 (en) | 1990-01-22 | 1990-01-22 | Sensor power supply reverse connection destruction prevention circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013102A JP2804333B2 (en) | 1990-01-22 | 1990-01-22 | Sensor power supply reverse connection destruction prevention circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH03218226A true JPH03218226A (en) | 1991-09-25 |
| JP2804333B2 JP2804333B2 (en) | 1998-09-24 |
Family
ID=11823789
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2013102A Expired - Fee Related JP2804333B2 (en) | 1990-01-22 | 1990-01-22 | Sensor power supply reverse connection destruction prevention circuit |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2804333B2 (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997013308A1 (en) * | 1995-10-02 | 1997-04-10 | Rion Co., Ltd. | Circuit for rationalizing polarity of power source |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6680102B2 (en) | 2016-06-16 | 2020-04-15 | 富士電機株式会社 | Semiconductor integrated circuit device |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61107027U (en) * | 1984-12-20 | 1986-07-07 | ||
| JPS649426U (en) * | 1987-07-02 | 1989-01-19 |
-
1990
- 1990-01-22 JP JP2013102A patent/JP2804333B2/en not_active Expired - Fee Related
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61107027U (en) * | 1984-12-20 | 1986-07-07 | ||
| JPS649426U (en) * | 1987-07-02 | 1989-01-19 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1997013308A1 (en) * | 1995-10-02 | 1997-04-10 | Rion Co., Ltd. | Circuit for rationalizing polarity of power source |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2804333B2 (en) | 1998-09-24 |
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