JPH03220430A - Interferometer - Google Patents

Interferometer

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Publication number
JPH03220430A
JPH03220430A JP1688590A JP1688590A JPH03220430A JP H03220430 A JPH03220430 A JP H03220430A JP 1688590 A JP1688590 A JP 1688590A JP 1688590 A JP1688590 A JP 1688590A JP H03220430 A JPH03220430 A JP H03220430A
Authority
JP
Japan
Prior art keywords
light
mirror
incident light
interferometer
incident
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1688590A
Other languages
Japanese (ja)
Inventor
Hisakazu Nishisaka
西坂 久和
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd filed Critical Jeol Ltd
Priority to JP1688590A priority Critical patent/JPH03220430A/en
Publication of JPH03220430A publication Critical patent/JPH03220430A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To prevent other light than the light from a light source which causes variations from entering in the direction of an incident light by making lights from the same light source enter simultaneously the position of two different incident lights. CONSTITUTION:This interferometer is in such a structure that the direction of the light from a semi-transparent mirror 1 to a fixed mirror 2 to a moving mirror 3 is different from that of the incident light from the mirrors 2, 3 to the mirror 1. Since the projecting light is generated at two points centering the mirror 1, two detectors I, II are arranged at the corresponding points. One incident light projected from a light source 9 is allowed to enter the detectors I, II through reflecting mirrors M1, M2 in a direction I, while the other incident light projected from the same light source 9 is made to enter the detectors I, II through reflecting mirrors M3, M4 in a direction II. The light source 9 is generally similar to a black body at a fixed temperature, so that the light other than the light from the light source 9 which is a cause of variations is prevented from entering in the directions I, II. Since it is possible to obtain a signal corresponding to the spectral characteristic of a sample by adding interferogram signals obtained by the detectors I, II, the characteristic of the sample can be easily detected with high accuracy.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半透鏡、咳半透鏡を透過した光と反射した光
をそれぞれ半透鏡へ向けて反射させる固定鏡系及び移動
鏡系からなり、特に、フーリエ変換赤外分光光度計に使
用するのに適した干渉計に関する。
[Detailed Description of the Invention] [Industrial Application Field] The present invention consists of a semi-transparent mirror, a fixed mirror system and a movable mirror system that respectively reflect the light transmitted through the cough semi-transparent mirror and the reflected light towards the semi-transparent mirror. , in particular, relates to interferometers suitable for use in Fourier transform infrared spectrophotometers.

ご従来の技術〕 第6図に従来のマイケルソン型干渉計の構成を示す。図
中、1は半透鏡、2は固定鏡、3は移動鏡を示している
。従来より周知のマイケルソン干渉計は、第6図に示す
ように入射光と出射光の一部が同一方向に入出射するよ
うになっている。すなわち、入射光は、半透鏡1によっ
て反射光と透過光に分割され、それぞれ固定鏡2と移動
鏡3によって反射された後、再び半透鏡lに入射して干
渉光を形成する。このような干渉計では、固定鏡2側光
路長と移動鏡3側光路長との差によって発生するインタ
ーフェログラムと呼ばれる干渉信号を利用する場合、出
射光の半分が入射光の方向へ戻ってしまって分離が困難
なため、出射光の残り半分を測定に使用することになる
。また、入射光の方向へ戻った光は、光源等に悪影響を
及ぼすことにもなる。
Prior Art] Figure 6 shows the configuration of a conventional Michelson interferometer. In the figure, 1 is a semi-transparent mirror, 2 is a fixed mirror, and 3 is a movable mirror. In the conventionally well-known Michelson interferometer, as shown in FIG. 6, part of the input light and the output light enter and exit in the same direction. That is, the incident light is split into reflected light and transmitted light by the semi-transparent mirror 1, reflected by the fixed mirror 2 and the movable mirror 3, respectively, and then enters the semi-transparent mirror 1 again to form interference light. In such an interferometer, when using an interference signal called an interferogram generated by the difference between the optical path length on the fixed mirror 2 side and the optical path length on the movable mirror 3 side, half of the emitted light returns to the direction of the incident light. Since it is difficult to separate the emitted light, the remaining half of the emitted light is used for measurement. Furthermore, the light that returns in the direction of the incident light may have a negative effect on the light source and the like.

この点とは別に、第6図のような構成によると、出射光
Hの方向に検知器を配置したとき、検知器からの光が干
渉計を経て検知器自身に戻って信号光の中に混入するた
め、検知器から得られるインターフエロダラム信号の変
動原因となり得る。そのため、干渉計と検知器の間にス
リットないしアパーチャーを配置するか、又は、スリッ
トないしアパーチャー状の試料ホルダーに試料を入れて
測定することにより、検知器からの光が干渉計に入射し
な51ようにすることも考えられるが、検知器かろの光
が上記スリットを−いしアバ−チア−(又よ、スリット
ないしアパーチャー状の試料ホルダ)に当たってはね返
り、同様に検知器に入る可能性もある。このため、検知
器周辺に温度変動があるときや、スリットないしアパー
チャーに温度変動があるとき:ま、この温度変動による
干渉計の出力変動の原因になる。
Apart from this point, according to the configuration shown in Fig. 6, when the detector is placed in the direction of the emitted light H, the light from the detector returns to the detector itself through the interferometer and becomes the signal light. This can cause fluctuations in the interferodalum signal obtained from the detector. Therefore, by placing a slit or aperture between the interferometer and the detector, or by placing the sample in a slit or aperture-shaped sample holder, it is possible to prevent the light from the detector from entering the interferometer. However, there is also a possibility that the light from the detector hits the slit or the aperture (also, the slit or aperture-shaped sample holder) and is reflected and enters the detector as well. Therefore, when there are temperature fluctuations around the detector, or when there are temperature fluctuations in the slit or aperture, these temperature fluctuations cause interferometer output fluctuations.

上記のようi;従来のマイケルソン干渉計の欠点である
出射光の半分が入射光の方向へ戻るのを避けるために、
本発明者は実開昭60 72511号公報におし)で、
第7図に示すように、固定鏡2と移動鏡3を2面鏡で構
成し、半透鏡1からそれぞれの鏡2.3への入射方向と
それぞれの鏡2.3かろの反射光の半透鏡1に対する入
射方向とが異なるように構成して、半透鏡1の面積を増
やさなくとも、入射光■側へ戻る出射光■を入射光■か
ら分離して利用できるようにして測定精度を向上させ、
また、光源への出射光の悪影響を一一<シた干渉計を提
案した。
As mentioned above, in order to avoid half of the emitted light returning to the direction of the incident light, which is a drawback of conventional Michelson interferometers,
The present inventor published Utility Model Application No. 60 72511),
As shown in FIG. 7, the fixed mirror 2 and the movable mirror 3 are constructed with two mirrors, and the incident direction from the semi-transparent mirror 1 to each mirror 2.3 and the half of the reflected light from each mirror 2.3 are shown. By configuring the transmissive mirror 1 in a different direction from the incident direction, it is possible to separate and use the emitted light ■ returning to the incident light ■ side from the incident light ■ without increasing the area of the semi-transparent mirror 1, thereby improving measurement accuracy. let me,
We also proposed an interferometer that eliminates the negative effects of emitted light on the light source.

しかしながら、第7図のように入射光I側へ戻る出射光
■も測定に利用できるようにする場合も、第8図に示す
ように、検知器■、検知器■何れの側からも、入射光■
及び入射光Hの2か所から入射光が入ってくるように見
えるので、測定に使用していない入射光側(工ないし■
)の温度変動等の影響を受けることになり、干渉計の出
力が変動し得ることになる(なお、第8図においては、
矢印は検知器■から干渉計を覗いた状態を示す。)。
However, even in the case where the emitted light ■ returning to the incident light I side can be used for measurement as shown in Figure 7, as shown in Figure 8, the incident light from either side of the detector ■ or Light ■
Since the incident light appears to be coming from two places, i.e., incident light H and
), and the output of the interferometer may fluctuate (in Fig. 8,
The arrow indicates the interferometer viewed from the detector ■. ).

そこで、第7図に示すような複数の入射光方向を有し、
入射光方向と出射光方向が分離している干渉計において
、使用しない入射光方向の温度変化等の影響を受けない
ようにするため、その方向に定温黒体を配置し、入射光
が入射しない入射光側から変動の大きいバンクグラウン
ド光が入るのを防ぐようにすることができる。
Therefore, by having a plurality of incident light directions as shown in FIG.
In an interferometer where the direction of the incident light and the direction of the output light are separated, in order to prevent the unused direction of the incident light from being affected by temperature changes, etc., a constant-temperature black body is placed in that direction so that the incident light does not enter. Bank ground light with large fluctuations can be prevented from entering from the incident light side.

この点を、第9図を用し)でさらに説明すると、このよ
う−;干渉計におし)では、入射光は図示の入射光1及
−(入射光Hの2か所の位置の何れから入れてもよく、
通常は何れか一方の位置から入射光を入射させ(図示の
場合は入射光Iの方向から入れて″、)る。)、他方の
入射光(図示の場合は入射光■)の位置には何も配置し
なくとも、第8図にア一)で説明したように、この方向
から温度変動等の影響を含んだ光が検知器■及び検知器
■に入射して測定に影響を与え得るので、この方向に定
温黒体4を配置する。図示のように検知器■又は検知器
■の側から干渉計を覗くと、干渉計、入射光I、定温黒
体4が重−一って見える。したがって、入射光■側に定
温黒体4を配置したことにより、入射光■側かろ変動の
大きいバックグラウンド光が入るのを防ぐことができる
。定温黒体4としては、例えば周囲を断熱材で覆し)内
面を黒く塗った積分球、同様な円錐体を用いる。
To further explain this point with reference to FIG. You can also put it in from
Normally, the incident light enters from one of the positions (in the case shown, it enters from the direction of the incident light I''), and the other incident light (in the case shown, the incident light ■) enters the position. Even if nothing is placed, as explained in Figure 8 (a), light that includes the effects of temperature fluctuations etc. may enter the detectors ■ and ■ from this direction and affect the measurements. Therefore, the constant-temperature black body 4 is placed in this direction.When looking into the interferometer from the detector ■ or the detector ■ side as shown in the figure, the interferometer, the incident light I, and the constant-temperature black body 4 are all aligned. Therefore, by placing the constant temperature black body 4 on the side of the incident light (1), it is possible to prevent background light with large fluctuations from entering from the side of the incident light (2). Use an integrating sphere whose inner surface is painted black, or a similar cone.

ところで、第7図のような干渉計において、入射光■の
方向に定温黒体4の代わりに定温黒体と同様の作用をす
る別の光源を配置してもよい。
By the way, in the interferometer as shown in FIG. 7, another light source having the same effect as the constant temperature black body may be placed in place of the constant temperature black body 4 in the direction of the incident light (1).

したがって、本発明の目的は、2つの入射元方 。Therefore, the object of the present invention is to provide two sources of incidence.

向を有し、入射光方向と出射光方向が分離している干渉
計において、入射光方向から光源からの光以外の変動要
因となる光が入るのを防止した干渉計を提供することで
ある。
An object of the present invention is to provide an interferometer in which light that is a variable factor other than light from a light source is prevented from entering from the direction of the incident light in an interferometer in which the direction of the incident light and the direction of the outgoing light are separated. .

〔課題を解決するための手段〕[Means to solve the problem]

そのために、本発明の干渉計は、半透鏡、該半透鏡を透
過した光と反射した光をそれぞれ半透鏡へ向けて反射さ
せる固定鏡系及び移動鏡系からなり、入射光の方向と出
射光の方向が分離され、かつ、入射光、出射光とも2つ
の異なる位置をとることが可能な干渉計において、異な
る2つの入射光の位置に同一光源からの光を同時に入射
させるように構成したことを特徴とするものである。
For this purpose, the interferometer of the present invention consists of a semi-transparent mirror, a fixed mirror system and a movable mirror system that reflect the light transmitted through the semi-transparent mirror and the reflected light toward the semi-transparent mirror, respectively, and the direction of the incident light and the output light In an interferometer, the directions of which are separated, and both the incident light and the outgoing light can take two different positions, the interferometer is configured so that light from the same light source is simultaneously incident on two different incident light positions. It is characterized by:

〔作用〕[Effect]

本発明の干渉計では、何れの入射光方向にも定温黒体と
同様の作用をする光源が配置されているので、入射光側
から光源からの光以外の変動要因となる光が入るのを防
ぐことができる。しかも、これら光源が同一の光源であ
るので、異なる2つの出射光位置に検知器を配置しその
出力を加算することにより、試料の特性を簡単に高精度
で計測することができる。
In the interferometer of the present invention, a light source that has the same effect as a constant-temperature black body is placed in both directions of incident light, so that light that causes fluctuations other than the light from the light source enters from the incident light side. It can be prevented. Furthermore, since these light sources are the same light source, the characteristics of the sample can be easily measured with high precision by arranging detectors at two different emission light positions and adding the outputs.

〔実施例〕〔Example〕

以下、図面を参照しつつ本発明の実施例を説閂する。 Embodiments of the present invention will be explained below with reference to the drawings.

第1図は本発明に係る干渉計の1実施例の構成を示す図
であり、1は半透鏡、2は固定鏡、3は移動鏡、9は光
源、M、−M、は反射鏡をそれぞれ示す。
FIG. 1 is a diagram showing the configuration of one embodiment of the interferometer according to the present invention, where 1 is a semi-transparent mirror, 2 is a fixed mirror, 3 is a movable mirror, 9 is a light source, and M and -M are reflective mirrors. Each is shown below.

第1図の干渉計自体の構成は、前記したように本発胡者
が実開昭60−72511号公報において提案したもの
であり、マイケルソン干渉計において、固定鏡2と移動
鏡3を2面鏡で構成し、半透鏡lからそれぞれの鏡2.
3へ向かう光の方向とそれぞれの鏡2.3から半透鏡l
へ入射する光の方向とが異なるように構成して、入射光
I側へ戻る出射光を入射光Iから分離したものである。
The configuration of the interferometer itself shown in FIG. 1 was proposed by the inventor in Japanese Utility Model Application Publication No. 1983-72511 as mentioned above, and in the Michelson interferometer, the fixed mirror 2 and the movable mirror 3 are Consisting of plane mirrors, each mirror 2.
Direction of light towards 3 and each mirror 2.3 to semi-transparent mirror l
The direction of the incident light is different from that of the incident light I, and the outgoing light that returns to the incident light I side is separated from the incident light I.

この干渉計においては、出射光は半透鏡1を対照面とし
て2か所に生じるので、それぞれの位置に検知器I、検
知器■を配置する。入射光についても、ダ示の入射光I
及び入射光Hの2か所の位置の何れから入れてもよいが
、本発明に基づいて、同一光源9から別々の方向に放射
された光を、入射光1方向については反射鏡M、 、M
、を経て、また、入射光■方向については反射鏡M3、
M。
In this interferometer, since the emitted light is generated at two locations with the semi-transparent mirror 1 as the symmetrical surface, a detector I and a detector (2) are placed at each location. Regarding the incident light, the incident light I shown in
Although the incident light H may enter from any of the two positions, based on the present invention, the light emitted from the same light source 9 in different directions is reflected by the reflecting mirror M, , for one direction of the incident light. M
, and for the incident light direction, the reflecting mirror M3,
M.

を経て入射させる。このように配置すると、光源9は一
般的に定温黒体に近いので、入射光I、■方向から光源
からの光用外の変動要因となる光が入るのを防ぐことが
できる。なお、このような入射光■と出射光Iを分離す
る形式の干渉計においては、検知器■、■自身からの光
は干渉計に入って光源9にも達するが、その影響は少な
い。
It is made incident through the . When arranged in this manner, the light source 9 is generally close to a constant-temperature blackbody, so that it is possible to prevent light from entering from the light source that causes fluctuations other than the light from the direction of the incident light I and (2). Note that in such an interferometer that separates the incident light (1) and the output light I, the light from the detectors (2) and (2) themselves enters the interferometer and reaches the light source 9, but its influence is small.

ところで、このような干渉計においては、検知器Iから
得られるインターフェログラム信号と検知器Hかろ得ら
れるインターフェログラム信号とは逆位相になる(この
点は、両者のエネルギーの和が一定であることから、簡
単に理解できる。)。
By the way, in such an interferometer, the interferogram signal obtained from detector I and the interferogram signal obtained from detector H have opposite phases (this is because the sum of their energies is constant). (It's easy to understand.)

したがって、光源9から半透鏡lに到る2つの光路の何
れにも何らの試料を挿入しない場合、検知器Iから得ら
れるインターフェログラム信号と検知器■から得られる
インタ−7エロダラム信号とを加算するとゼロになる。
Therefore, if no sample is inserted into either of the two optical paths from the light source 9 to the semitransparent mirror l, the interferogram signal obtained from the detector I and the interferogram signal obtained from the detector When added, it becomes zero.

ところが、一方の光路に測定試料を入れると、この加算
信号から試料の分光特性に応じた信号が得られる。その
ため、この加算信号は従来の干渉計からの信号に比べて
ピーク値が低くなるので、A/D変換してフーリエ変換
する時に必要なビット数が少なくてすみ、簡単に処理で
きる。なお、必ずしも必要ではないが、光源9から半透
鏡1に到る2つの光路は半透鏡lに対して対称になるよ
うに配置するのが望ましい。
However, when a measurement sample is placed in one of the optical paths, a signal corresponding to the spectral characteristics of the sample is obtained from this added signal. Therefore, since this added signal has a lower peak value than the signal from a conventional interferometer, the number of bits required for A/D conversion and Fourier transformation is small, and processing is easy. Although not necessarily required, it is desirable that the two optical paths from the light source 9 to the semi-transparent mirror 1 be arranged symmetrically with respect to the semi-transparent mirror l.

なお、本発明は、前記した第7図の干渉計に限らず、入
射光の方向と出射光の方向が分離され、入射光、出射光
とも2つの位置が可能な全ての干渉計に適用できる。こ
のような干渉計の例を第2図から第5図に示す。
Note that the present invention is not limited to the above-mentioned interferometer shown in FIG. 7, but can be applied to any interferometer in which the direction of the incident light and the direction of the outgoing light are separated, and two positions are possible for both the incoming light and the outgoing light. . Examples of such interferometers are shown in FIGS. 2 to 5.

第2図の干渉計は、J、 F、 James、 R,S
、 5ternbery″The Design of
 0ptical Spectrometers p、
 139(Chapman and Hall、 19
69)に示されているもので、固定鏡2、移動鏡3とし
て直交する2枚鏡ないし3枚鏡(コーナーキューブミラ
ー)を用し1、半透鏡1として、固定鏡2経る光路及び
移動鏡3を経る光路を同一特性にするため、入射光Iの
光路上の半透膜11と出射光光路路上の半透膜12を結
晶板10の表裏に別々に蒸着したものを用いている。こ
の場合も、図面から明らかなように、入射光の位置とし
ては入射光IとHの2つの位置が可能であり、検知器も
同様に検知器Iと■を配置できるので、同一光源からの
光を入射光I、■方向から入射させることにより、光源
からの光用外の変動要因となる光が入るのを防ぐことが
できると共に、検知器■から得られる信号と検知器■か
ら得られる信号とを加算することにより、簡単に処理可
能な高精度な信号が得られる。
The interferometers in Figure 2 are J, F, James, R, S.
, 5ternberry''The Design of
0ptical Spectrometers p,
139 (Chapman and Hall, 19
69), in which two or three mirrors (corner cube mirrors) orthogonal are used as a fixed mirror 2 and a movable mirror 3, and a semi-transparent mirror 1 is used to control the optical path passing through the fixed mirror 2 and the movable mirror. In order to have the same characteristics for the optical path passing through the crystal plate 10, a semi-transparent film 11 on the optical path of the incident light I and a semi-transparent film 12 on the optical path of the output light are separately deposited on the front and back sides of the crystal plate 10. In this case as well, as is clear from the drawing, there are two possible positions for the incident light, I and H, and the detectors I and ■ can be placed in the same way. By inputting light from the incident light I and ■ directions, it is possible to prevent light from entering that causes fluctuations other than light from the light source, and also to prevent the signal obtained from the detector ■ and the signal obtained from the detector ■ from entering. By adding the signals, a highly accurate signal that can be easily processed can be obtained.

また、第3図の干渉計は、Griffiths、de 
Haseth ”Fourier Transform
 InfraredSpectroscopyp、59
5 (John Wiley & 5ons、 198
6)に示されているもので、マイケルソン干渉計におい
て、固定鏡2、移動鏡3に対して入射光を垂直からずら
して入射させるようにし、入射光と出射光を分離するよ
うにしたものである。この場合も、図面から明らかなよ
うに、入射光の位置としては入射光■とHの2つの位置
が可能であり、検知器も同様に検知器Iと■を配置でき
るので、同一光源からの光を入射光■、■方向から入射
させることにより、光源からの光以外の変動要因となる
光が入るのを防ぐことができると共に、検知器Iから得
られる信号と検知器■から得られる信号とを加算するこ
とにより、簡単に処理可能な高精度な信号が得られる。
Furthermore, the interferometer shown in FIG.
Haseth “Fourier Transform”
Infrared Spectroscopy, 59
5 (John Wiley & 5ons, 198
6), which is a Michelson interferometer in which the incident light is shifted from perpendicular to the fixed mirror 2 and movable mirror 3, and the incident light and the outgoing light are separated. It is. In this case as well, as is clear from the drawing, there are two possible positions for the incident light: ■ and H, and detectors I and ■ can be placed in the same way, so that the two positions of the incident light from the same light source are possible. By inputting light from the incident light direction ■ and ■, it is possible to prevent light that is a fluctuation factor other than the light from the light source from entering, and the signal obtained from detector I and the signal obtained from detector ■ can be prevented from entering. By adding these, a highly accurate signal that can be easily processed can be obtained.

さらに、第4図の干渉計は本発明者が実願平15109
1号において提案したものの1つであり、第1図の干渉
計を空間的に立体的に配置するように変形したもので、
半透鏡lに対する人出射光をできるだけ垂直にするため
、固定鏡2に対する入射光と反射光を含む平面が移動鏡
3に対する入射光と反射光を含む平面と異なる平面を形
成するように入射光Iの角度並びに固定鏡2及び移動鏡
3の配置角度を設定したものである。この場合も、図面
から明らかなように、入射光の位置としては入射光Iと
■の2つの位置が可能であり、検知器も同様に検知器I
と■を配置できるので、同一光源からの光を入射光I、
■方向から入射させることにより、光源からの光以外の
変動要因となる光が入るのを防ぐことができると共に、
検知器Iから得られる信号と検知器■から得られる信号
とを加算することにより、簡単に処理可能な高精度な信
号が得られる。なお、上記の出願の他の干渉計において
も、光源を同様に配置して同様の効果を得ることができ
る。
Furthermore, the interferometer shown in FIG.
This is one of the proposals proposed in No. 1, and is a modification of the interferometer shown in Figure 1 so that it is spatially arranged three-dimensionally.
In order to make the human output light as perpendicular to the semi-transparent mirror I as possible, the incident light I is arranged so that the plane containing the incident light and reflected light on the fixed mirror 2 forms a different plane from the plane containing the incident light and reflected light on the movable mirror 3. , and the arrangement angles of the fixed mirror 2 and movable mirror 3. In this case as well, as is clear from the drawing, there are two possible positions for the incident light, I and ■, and the detector is also located at the detector I.
and ■ can be arranged, so the light from the same light source can be input into
■ By letting the light enter from the direction, it is possible to prevent light that is a variable factor other than the light from the light source from entering, and
By adding the signal obtained from detector I and the signal obtained from detector 2, a highly accurate signal that can be easily processed is obtained. Note that in other interferometers of the above-mentioned application, the light sources can be similarly arranged to obtain the same effect.

また、第5図の干渉計も本発明者が平成2年1月12日
に「干渉計」との名称で特許出願した干渉計の1つであ
り、半透鏡1で反射した入射光の半分は、固定鏡I5、
固定鏡II6を経て半透鏡lの同じ位置に戻るように配
置されている。また、半透鏡1を透過した入射光の半分
は、移動鏡■7、移動鏡I8を経て半透鏡1の同じ位置
に戻るように配置されている。半透鏡1の位置に戻って
きた双方の光は、半透鏡1の表裏で干渉し、出射光11
出射光Hの2方向に出射する。図から明らかなように、
半透鏡1から固定鏡I5、固定鏡■6を経る光路と半透
鏡1かろ移動鏡■7、移動鏡I8を経る光路とは、はぼ
同じ空間に並列していて、同平面上に存在しなし)ので
、半透鏡lを境とする一方側の空間の雰囲気の変化、例
えば温度の変化等による屈折率の変化があっても、自動
的にこの影響を補償することができる干渉計である。こ
の場合も、図面から明らかなように、入射光の位置とし
ては入射光IとHの2つの位置が可能であり、検知器も
同様に検知器Iと■を配置できるので、同一光源からの
光を入射光I、■方向から入射させることにより、光源
からの光以外の変動要因となる光が入るのを防ぐことが
できると共に、検知器rから得られる信号と検知器■か
ら得られる信号とを加算することにより、簡単に処理可
能な高精度:′=倍信号得られる。なお、上記の出願の
他の干渉計におし)でも、光源を同様に配置して同様の
効果を得ることができる。
Furthermore, the interferometer shown in FIG. is fixed mirror I5,
It is arranged so that it returns to the same position on the semi-transparent mirror I via the fixed mirror II6. Further, half of the incident light transmitted through the semi-transparent mirror 1 is arranged so as to return to the same position on the semi-transparent mirror 1 via the movable mirror 7 and the movable mirror I8. Both lights that have returned to the position of the semi-transparent mirror 1 interfere with each other on the front and back sides of the semi-transparent mirror 1, and the output light 11
The emitted light H is emitted in two directions. As is clear from the figure,
The optical path from the semi-transparent mirror 1 through the fixed mirror I5 and the fixed mirror ■6 and the optical path from the semi-transparent mirror 1 through the movable mirror ■7 and the movable mirror I8 are parallel to each other in the same space and exist on the same plane. Therefore, even if there is a change in the refractive index due to a change in the atmosphere on one side of the space bordering the semi-transparent mirror, such as a change in temperature, this interferometer can automatically compensate for this effect. . In this case as well, as is clear from the drawing, there are two possible positions for the incident light, I and H, and the detectors I and ■ can be placed in the same way. By making light incident from the incident light I and ■ directions, it is possible to prevent light that is a fluctuation factor other than the light from the light source from entering, and the signal obtained from the detector r and the signal obtained from the detector ■ can be prevented from entering. By adding , we can obtain an easily processable high-precision signal: ' = double signal. Note that the same effects can be obtained in other interferometers of the above-mentioned application by arranging the light sources in the same manner.

以上は本発明の実施例であり、本発明はこれらの実施例
に限定されるものではなく、その他の入射光の方向と出
射光の方向が分離され、入射光、出射光とも2つの位置
が可能な全ての干渉計に適用できる。
The above are examples of the present invention, and the present invention is not limited to these examples.The direction of the other incident light and the direction of the output light are separated, and both the input light and the output light have two positions. Applicable to all possible interferometers.

〔発明の効果〕〔Effect of the invention〕

以上の説明から明らかなように、本発明においては、何
れの入射光方向にも定温黒体と同様の作用をする光源が
配置されているので、入射光側から光源からの光以外の
変動要因となる光が入るのを防ぐことができる。しかも
、これら光源が同一の光源であるので、異なる2つの出
射光位置に検知器を配置しその出力を加算することによ
り、試料の特性を簡単に高精度で計測することができる
As is clear from the above explanation, in the present invention, a light source that has the same effect as a constant-temperature black body is arranged in either direction of incident light, so that fluctuation factors other than light from the light source are removed from the incident light side. It can prevent light from entering. Furthermore, since these light sources are the same light source, the characteristics of the sample can be easily measured with high precision by arranging detectors at two different emission light positions and adding the outputs.

したがって、特に本発明の干渉計をフーリエ変換赤外分
光光度計に使用する場合、測定精度が向上する。
Therefore, especially when the interferometer of the present invention is used in a Fourier transform infrared spectrophotometer, measurement accuracy is improved.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る干渉計の1実施例の構成を示す図
、第2図から第5図は本発明の別の実施例の構成を示す
図、第6図は従来のマイケルソン型干渉計の構成を示す
図、第7図は他の従来の干渉計の構成を示す図、第8図
は第7図の干渉計の作用を説明するための図、第9図は
入射光方向の一方に定温黒体を配置する場合の作用を説
明するための図である。 1・・半透鏡、2.5.6・・・固定鏡、3.7.8・
・・移動鏡、4・・・定温黒体、9・・・光源、lO・
・・結晶板、11・・・半透膜、12・・・半透膜出 
 願  人  日本電子株式会社
FIG. 1 is a diagram showing the configuration of one embodiment of the interferometer according to the present invention, FIGS. 2 to 5 are diagrams showing the configuration of another embodiment of the present invention, and FIG. Figure 7 is a diagram showing the configuration of an interferometer, Figure 7 is a diagram showing the configuration of another conventional interferometer, Figure 8 is a diagram explaining the operation of the interferometer in Figure 7, Figure 9 is a diagram showing the direction of incident light. FIG. 3 is a diagram for explaining the effect when a constant-temperature blackbody is placed on one side of the screen. 1. Semi-transparent mirror, 2.5.6... Fixed mirror, 3.7.8.
...Moving mirror, 4... Constant temperature black body, 9... Light source, lO.
...Crystal plate, 11...Semipermeable membrane, 12...Semipermeable membrane exit
Applicant JEOL Ltd.

Claims (1)

【特許請求の範囲】[Claims] (1)半透鏡、該半透鏡を透過した光と反射した光をそ
れぞれ半透鏡へ向けて反射させる固定鏡系及び移動鏡系
からなり、入射光の方向と出射光の方向が分離され、か
つ、入射光、出射光とも2つの異なる位置をとることが
可能な干渉計において、異なる2つの入射光の位置に同
一光源からの光を同時に入射させるように構成したこと
を特徴とする干渉計。
(1) A semi-transparent mirror, consisting of a fixed mirror system and a movable mirror system that reflect the light transmitted and reflected by the semi-transparent mirror toward the semi-transparent mirror, and the direction of the incident light and the direction of the emitted light are separated, and An interferometer capable of taking two different positions for both incident light and output light, characterized in that the interferometer is configured so that light from the same light source is simultaneously incident on two different positions of the incident light.
JP1688590A 1990-01-25 1990-01-25 Interferometer Pending JPH03220430A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1688590A JPH03220430A (en) 1990-01-25 1990-01-25 Interferometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1688590A JPH03220430A (en) 1990-01-25 1990-01-25 Interferometer

Publications (1)

Publication Number Publication Date
JPH03220430A true JPH03220430A (en) 1991-09-27

Family

ID=11928627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1688590A Pending JPH03220430A (en) 1990-01-25 1990-01-25 Interferometer

Country Status (1)

Country Link
JP (1) JPH03220430A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021085442A1 (en) * 2019-10-29 2021-05-06 横河電機株式会社 Fourier spectrophotometer

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2021085442A1 (en) * 2019-10-29 2021-05-06 横河電機株式会社 Fourier spectrophotometer
JP2021071303A (en) * 2019-10-29 2021-05-06 横河電機株式会社 Fourier spectroscopic analyzer

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