JPH0322066B2 - - Google Patents

Info

Publication number
JPH0322066B2
JPH0322066B2 JP56024024A JP2402481A JPH0322066B2 JP H0322066 B2 JPH0322066 B2 JP H0322066B2 JP 56024024 A JP56024024 A JP 56024024A JP 2402481 A JP2402481 A JP 2402481A JP H0322066 B2 JPH0322066 B2 JP H0322066B2
Authority
JP
Japan
Prior art keywords
light
layer
type layer
type
epitaxial growth
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP56024024A
Other languages
Japanese (ja)
Other versions
JPS57138188A (en
Inventor
Tatsuhiko Niina
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanyo Electric Co Ltd
Original Assignee
Sanyo Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanyo Electric Co Ltd filed Critical Sanyo Electric Co Ltd
Priority to JP2402481A priority Critical patent/JPS57138188A/en
Publication of JPS57138188A publication Critical patent/JPS57138188A/en
Publication of JPH0322066B2 publication Critical patent/JPH0322066B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10HINORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H29/00Integrated devices, or assemblies of multiple devices, comprising at least one light-emitting semiconductor element covered by group H10H20/00
    • H10H29/10Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00
    • H10H29/14Integrated devices comprising at least one light-emitting semiconductor component covered by group H10H20/00 comprising multiple light-emitting semiconductor components

Landscapes

  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Led Devices (AREA)

Description

【発明の詳細な説明】 本発明は青を含む複数の発光色を有する固体発
光装置の製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for manufacturing a solid state light emitting device that emits a plurality of colors including blue.

赤及び緑色の各発光層を液相エピタキシヤル成
長法により積層形成する固体発光装置の製造方法
は既に提案されている。斯る製造方法に従えば、
青色の発光をも行なわせる場合、同様に青色の発
光層を液相エピタキシヤル成長法により更に積層
することになるが、通常、青色発光層の成長に必
要な温度は1000℃程度と高く、このため青色発光
層成長時に既に形成されている赤や緑色発光層が
損傷を受けやすい。
A method for manufacturing a solid-state light emitting device has already been proposed in which red and green light emitting layers are laminated by liquid phase epitaxial growth. If you follow this manufacturing method,
In order to emit blue light as well, a blue light emitting layer must be further laminated using the liquid phase epitaxial growth method, but the temperature required to grow the blue light emitting layer is usually as high as around 1000°C. Therefore, the already formed red and green light emitting layers are easily damaged during the growth of the blue light emitting layer.

本発明は斯る点に鑑みてなされたもので、その
特徴は青色発光に寄与する発光層を分子線エピタ
キシヤル成長法で形成することにある。
The present invention has been made in view of these points, and its feature lies in that a light-emitting layer contributing to blue light emission is formed by molecular beam epitaxial growth.

第1図は本発明実施例を示し、まず同図Aの工
程で、N型GaP(燐化ガリウム)基板1上に、液
相エピタキシヤル成長法により第1N型層2、第
1P型層3、第2P型層4及び第2N型層5の各GaP
結晶が順次積層されて発光基体6が形成される。
このとき、第1N型層2と第1P型層3との境界の
第1PN接合7付近にはZn(亜鉛)とO(酸素)と
が添加され、又第2P型層4と第2N型層5との境
界の第2PN接合8付近には窒素が添加されてお
り、従つて第1,第2PN接合7及び8は順方向
バイアス時、夫々赤色及び緑色の発光をなす。
FIG. 1 shows an embodiment of the present invention. First, in the process shown in FIG. 1A, a first N-type layer 2, a first N-type layer 2, and a
Each GaP of the 1P type layer 3, the second P type layer 4 and the second N type layer 5
A light emitting substrate 6 is formed by sequentially stacking crystals.
At this time, Zn (zinc) and O (oxygen) are added near the first PN junction 7 at the boundary between the first N-type layer 2 and the first P-type layer 3, and the second P-type layer 4 and the second N-type layer Nitrogen is added to the vicinity of the second PN junction 8 at the boundary between the first and second PN junctions 7 and 5, so that the first and second PN junctions 7 and 8 emit red and green light, respectively, when forward biased.

第1図Bの工程では、発光基体6の表面よりそ
の中央部を除いてZnの拡散を行ない第3、第4P
型層9,10が設けられる。このとき拡散深さは
第2P型層4に達する。尚拡散温度は800℃程度で
あり、第1、第2PN接合7,8はこの温温度に
より損傷を受けない。
In the process shown in FIG. 1B, Zn is diffused from the surface of the light-emitting substrate 6 except for the central part, and
Mold layers 9, 10 are provided. At this time, the diffusion depth reaches the second P-type layer 4. Note that the diffusion temperature is about 800° C., and the first and second PN junctions 7 and 8 are not damaged by this temperature.

第1図Cの工程では、発光基体6の表面より、
第2N型層5と第3、第4P型層9,10との各境
界に沿つてエツチングが施され、第2P型層4に
達する分離溝11,12が形成される。
In the step of FIG. 1C, from the surface of the light emitting substrate 6,
Etching is performed along each boundary between the second N-type layer 5 and the third and fourth P-type layers 9 and 10 to form separation grooves 11 and 12 that reach the second P-type layer 4.

第1図Dの工程では、第4P型層10上に、
GaAs1-xPx(砒化燐化ガリウム、o≦x≦1)か
らなる第5P型層13、GaAs(砒化ガリウム)か
らなる第6P型層14及び第3N型層15が夫々分
子線エピタキシヤル成長法により形成される。即
ち、10-11Torr程度の超高真空中に、上記発光基
体6とGa,As,Pの各蒸着源とを配し、基体6
温度を500〜600℃に保持し、上記各蒸着源温度を
コントロールすることにより所望組成のエピタキ
シヤル成長層が得られる。上記の如く基板6温度
は低く、従つて斯る工程でも第1、第2PN接合
7,8は損傷を受けない。第5P型層13は、そ
の成長初期にAsをほとんど含まず、成長に従つ
て増加するAsと減少するPを含み、成長終期に
Pをほとんど含まない。従つて第6P型層14と
第3N型層15とが作る第3PN接合16は赤外発
光をなし、第5P型層13は第4P型層10と第6P
型層14との間の結晶構造の相違を緩和する緩衝
層として働く。
In the step of FIG. 1D, on the fourth P-type layer 10,
A fifth P-type layer 13 made of GaAs 1-x P x (gallium arsenide phosphide, o≦x≦1), a sixth P-type layer 14 and a third N-type layer 15 made of GaAs (gallium arsenide) are formed by molecular beam epitaxy. Formed by growth method. That is, the light-emitting substrate 6 and vapor deposition sources of Ga, As, and P are arranged in an ultra-high vacuum of about 10 -11 Torr, and the substrate 6 is placed in an ultra-high vacuum of about 10 -11 Torr.
By maintaining the temperature at 500 to 600°C and controlling the temperatures of each of the vapor deposition sources mentioned above, an epitaxially grown layer having a desired composition can be obtained. As mentioned above, the temperature of the substrate 6 is low, so the first and second PN junctions 7 and 8 are not damaged even in this process. The fifth P-type layer 13 contains almost no As at the initial stage of growth, contains As which increases and P which decreases as it grows, and almost no P at the final stage of growth. Therefore, the third PN junction 16 formed by the sixth P-type layer 14 and the third N-type layer 15 emits infrared light, and the fifth P-type layer 13
It acts as a buffer layer that alleviates the difference in crystal structure between the mold layer 14 and the mold layer 14 .

第1図Eの工程では、基板1、第2N型層5、
第3P型層9及び第3N型層15の各表面にオーミ
ツク電極17,18,19,20が夫々設けら
れ、更に第3N型層15上面に赤外光励起により
青色光を生ずる螢光体21が塗布されて装置が完
成する。尚螢光体21としてはYF3:Yb:Tm
(フツ化イツトリウム:イツテルビウム:ツリウ
ム)が好適である。
In the step of FIG. 1E, the substrate 1, the second N-type layer 5,
Ohmic electrodes 17, 18, 19, and 20 are provided on each surface of the third P-type layer 9 and the third N-type layer 15, respectively, and a phosphor 21 that generates blue light by excitation with infrared light is further provided on the upper surface of the third N-type layer 15. After coating, the device is completed. Furthermore, as the phosphor 21, YF 3 :Yb:Tm
(yttrium fluoride: ytterbium: thulium) is preferred.

完成した装置は今や明らかな如く、オーミツク
電極19を共通正極とし、他のオーミツク電極1
7,18,20を負極とすることにより、赤、
緑、青の各光を選択的に放出する。
As is now clear, the completed device uses the ohmic electrode 19 as a common positive electrode and the other ohmic electrode 1.
By using 7, 18, and 20 as negative electrodes, red,
Selectively emits green and blue light.

第2図は本発明の他の実施例を示し、同図Aの
工程では第1図Aの工程と同様にして、N型GaP
基板30上に、第1N型層31、第1P型層32、
第2P型層33及び第2N型層34が順次積層され
て、赤色及び緑色発光用第1、第2PN接合35,
36を含む発光基体37が形成される。
FIG. 2 shows another embodiment of the present invention, in which the process of A in the figure is similar to the process of FIG.
On the substrate 30, a first N-type layer 31, a first P-type layer 32,
A second P-type layer 33 and a second N-type layer 34 are sequentially stacked, and first and second PN junctions 35 for red and green light emission,
A light emitting substrate 37 including 36 is formed.

第2図Bの工程では、発光基板37の表面より
Znの選択拡散を行なつて、第2P型層33に達す
る第3P型層38と、第2N型層34と第3P型層3
8との境界に沿つて第2P型層33に達する分離
溝39とが設けられる。
In the process shown in FIG. 2B, from the surface of the light emitting substrate 37,
A third P-type layer 38 that reaches the second P-type layer 33 through selective diffusion of Zn, a second N-type layer 34 and a third P-type layer 3
A separation groove 39 that reaches the second P-type layer 33 is provided along the boundary with the second P-type layer 33 .

第2図Cの工程では第2N型層34上に、第1
図Dの工程と同様の分子線エピタキシヤル成長法
によりGaAs1-xPxからなる第3N型層40とZnSe
(セレン化亜鉛)からなる第4N型層41とが順次
積層される。尚、第3N型層40は第1図の第5P
型層13と同様に緩衝層として働く。又、第4N
型層41形成時の基体37温度は300〜400℃が好
適である。
In the step of FIG. 2C, the first
A third N-type layer 40 made of GaAs 1-x P x and ZnSe are grown by molecular beam epitaxial growth similar to the process shown in Figure D.
A fourth N-type layer 41 made of (zinc selenide) is sequentially laminated. Note that the third N-type layer 40 is the 5P layer in FIG.
Like the mold layer 13, it functions as a buffer layer. Also, the 4th N
The temperature of the base 37 when forming the mold layer 41 is preferably 300 to 400°C.

第2図Dの工程では、第4N型層41表面に
CVD法によりSiO2(2酸化シリコン)等の絶縁膜
42が形成され、次いで、基板30、第2N型層
34、第3P型層38上に夫々オーミツク電極4
3,44,45が設けられ、更に絶縁膜42上に
MIS電極46が形成されて装置が完成する。尚
MIS電極46は第4N型層41、絶縁膜42と共
にMIS構造を形成し、斯る構造は青色発光機能を
有する。
In the process shown in FIG. 2D, the surface of the fourth N-type layer 41 is
An insulating film 42 such as SiO 2 (silicon dioxide) is formed by the CVD method, and then ohmic electrodes 4 are formed on the substrate 30, the second N-type layer 34, and the third P-type layer 38, respectively.
3, 44, and 45 are provided, and further on the insulating film 42.
The MIS electrode 46 is formed to complete the device. still
The MIS electrode 46 forms an MIS structure together with the fourth N-type layer 41 and the insulating film 42, and this structure has a blue light emitting function.

完成した装置では、オーミツク電極45を共通
正極とし、他のオーミツク電極43,44を負極
とすることにより、赤、緑の各光が生じ、又オー
ミツク電極44を負極、MIS電極46を正極とす
ることにより青色の発光が生じる。
In the completed device, red and green lights are generated by using the ohmic electrode 45 as the common positive electrode and the other ohmic electrodes 43 and 44 as the negative electrode, and also using the ohmic electrode 44 as the negative electrode and the MIS electrode 46 as the positive electrode. This causes blue light emission.

尚上記の各実施例では、発光基体6,37は赤
及び緑の両発光機能を有するが、不要とあれば、
何れか一方のみにして良いことはもちろんであ
る。
In each of the above embodiments, the light emitting substrates 6 and 37 have both red and green light emitting functions, but if unnecessary,
Of course, it is fine to use only one of them.

かくして本発明によれば、赤及び又は緑色の発
光層を液相エピタキシヤル成長法により、又青色
の発光に寄与する付加的発光層を低温で実施可能
な分子線エピタキシヤル成長法により夫々順次形
成するものであるから、上記付加的発光層の形成
時に赤及び又は緑色の発光層が損傷を受けること
がなく、また、青色発光を取り出す構造として、
P型及びN型の砒化ガリウム積層体と螢光体との
組み合わせ、あるいは一導電型のセレン化亜鉛の
MIS構造を用いることによつて、赤、緑色発光と
共に青色発光が実現される。又、液相エピタキシ
ヤル成長法と分子線エピタキシヤル成長法とを組
合わすことにより全ての発光層を分子線エピタキ
シヤル成長法により形成する方法に比し短時間で
装置を完成することができる。
Thus, according to the present invention, a red and/or green light emitting layer is sequentially formed by a liquid phase epitaxial growth method, and an additional light emitting layer contributing to blue light emission is formed sequentially by a molecular beam epitaxial growth method which can be performed at low temperatures. Therefore, the red and/or green light emitting layer is not damaged during the formation of the additional light emitting layer, and the structure extracts blue light.
A combination of P-type and N-type gallium arsenide laminate and phosphor, or one conductivity type zinc selenide.
By using the MIS structure, blue light emission is realized in addition to red and green light emission. Furthermore, by combining the liquid phase epitaxial growth method and the molecular beam epitaxial growth method, the device can be completed in a shorter time than when all the light emitting layers are formed by the molecular beam epitaxial growth method.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図及び第2図は本発明の実施例を示す工程
別側面図である。 6,37……発光基体。
FIGS. 1 and 2 are step-by-step side views showing an embodiment of the present invention. 6,37...Light-emitting substrate.

Claims (1)

【特許請求の範囲】 1 赤及び又は緑色発光を行うPN接合を含み、
該PN接合を形成するP型及びN型半導体層が液
相エピタキシヤル成長法で形成された発光基体上
に、青色発光に寄与する付加的発光層を分子線エ
ピタキシヤル成長法で形成する工程を備え、上記
付加的発光層を赤外発光を行うP型及びN型の各
砒化ガリウム層の積層体とすると共に、該砒化ガ
リウム層上に赤外光励起により青色光を生ずる螢
光体を設けることを特徴とする固体発光装置の製
造方法。 2 赤及び又は緑色発光を行うPN接合を含み、
該PN接合を形成するP型及びN型半導体層が液
相エピタキシヤル成長法で形成された発光基体上
に、青色発光に寄与する付加的発光層を分子線エ
ピタキシヤル成長法で形成する工程を備え、上記
付加的発光層を一導電型のセレン化亜鉛層とする
と共に、該セレン化亜鉛層上に絶縁膜及び電極を
順次被着することを特徴とする固体発光装置の製
造方法。
[Claims] 1. Includes a PN junction that emits red and/or green light,
A step of forming an additional light-emitting layer contributing to blue light emission by molecular beam epitaxial growth on the light-emitting substrate on which the P-type and N-type semiconductor layers forming the PN junction are formed by liquid phase epitaxial growth. The additional light-emitting layer is a laminate of P-type and N-type gallium arsenide layers that emit infrared light, and a phosphor that generates blue light when excited by infrared light is provided on the gallium arsenide layer. A method for manufacturing a solid-state light emitting device characterized by: 2 Including a PN junction that emits red and/or green light,
A step of forming an additional light-emitting layer contributing to blue light emission by molecular beam epitaxial growth on the light-emitting substrate on which the P-type and N-type semiconductor layers forming the PN junction are formed by liquid phase epitaxial growth. A method for manufacturing a solid-state light emitting device, characterized in that the additional light emitting layer is a zinc selenide layer of one conductivity type, and an insulating film and an electrode are sequentially deposited on the zinc selenide layer.
JP2402481A 1981-02-19 1981-02-19 Manufacture of solid state light-emitting device Granted JPS57138188A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2402481A JPS57138188A (en) 1981-02-19 1981-02-19 Manufacture of solid state light-emitting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2402481A JPS57138188A (en) 1981-02-19 1981-02-19 Manufacture of solid state light-emitting device

Publications (2)

Publication Number Publication Date
JPS57138188A JPS57138188A (en) 1982-08-26
JPH0322066B2 true JPH0322066B2 (en) 1991-03-26

Family

ID=12126955

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2402481A Granted JPS57138188A (en) 1981-02-19 1981-02-19 Manufacture of solid state light-emitting device

Country Status (1)

Country Link
JP (1) JPS57138188A (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5651371U (en) * 1979-09-26 1981-05-07

Also Published As

Publication number Publication date
JPS57138188A (en) 1982-08-26

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