JPH03257380A - Supporting system for analysis of trouble of electronic circuit module - Google Patents

Abstract

PURPOSE:To discover an extraordinary part in an early stage by providing a function test means, an environment test means, a checkup test means which delivers and receives data on a condition setting signal and the like, a knowledge base which makes the content of determination of an operation and the like into rules, a checkup test file, etc. CONSTITUTION:An expert system 1 is provided with a knowledge base 2, a data file 3, an inference element 4 and a checkup file 6. A checkup test device is constructed by providing it with an external function test device 7 composed of a signal converter 70 and with an external environment test device 8 composed of a checkup object module 81 and a condition setting element 82. The system 1 is constructed of a work station having an interface function which enables execution of data communication with an external device and the like. In the knowledge base 2, diagnostic rules for determination and diagnosis of the operation of an electronic circuit module are stored. The analysis of a trouble is conducted in such a manner that operation data showing the state of the trouble are taken out of the file 3 and that an inference is executed on the file 3 and that an inference is executed on the basis of the diagnostic rules taken in the inference element 4 from the knowledge base 2. A checkup test controller 5 takes in the result of the inference element 4 through a signal line (c) and reads necessary checkup test data from the file 6.

Description

[Detailed Description of the Invention] [Object of the Invention] (Industrial Application Field) The present invention relates to a system that supports trouble analysis of electronic circuit modules that are the main components of various monitoring, control, and protection devices, and in particular, The present invention relates to a trouble analysis support system for electronic circuit modules, which has a function of estimating the location of an abnormality by attempting to reproduce the trouble given that state when the trouble is only reproducible in a specific operating state.

(Hakarai's technology) In general, in trouble analysis of electronic circuit modules, which are the main components of various monitoring, control, and protection devices,
The location of the abnormality is determined by trial and error using circuit diagrams and test equipment. Furthermore, when a problem does not recur, environmental tests such as high-temperature aging are also carried out to wait for the abnormality to reoccur. For this reason, trouble analysis requires many years of experience and specialized knowledge. Moreover, if the problem does not recur,
In order to systematically consider and implement analytical studies, it may be necessary to temporarily mobilize a large number of people from related departments.
This has a significant impact on production activities.

However, with the above-mentioned trouble analysis format, there is a problem in that it places a heavy burden on experts and the analysis and investigation are not sufficient, and that prompt responses and measures cannot be taken when the trouble does not recur. be. In particular, in order to find abnormalities, it is not sufficient to check just one operating state of the electronic circuit due to the influence of mutually correlated events between components, and it is necessary to check the operating mode with several input conditions. .

(Problems to be Solved by the Invention) As described above, in the past, when trouble analysis is performed on electronic circuit modules, there has been a problem in that prompt responses and measures cannot be taken if the trouble does not recur.

An object of the present invention is to perform a reproduction investigation test based on an abnormal state when troubleshooting an electronic circuit module.
An extremely reliable trouble analysis support system for electronic circuit modules that can determine abnormal events based on the state of electronic circuits, estimate abnormal locations or failed parts, and support early detection of abnormal parts and analysis and investigation activities. It is about providing.

[Structure of the Invention] (Means for Solving the Problems) In order to achieve the objective of the present invention, the present invention comprises a functional test means for performing a functional test of an electronic circuit module, and an environmental test means for providing operating environment conditions. It is an investigation test means that has the function of externally controlling test conditions and operation so that data such as condition setting signals and operation control signals can be sent and received, and the format of "operation judgment contents and inference results" from the operation status of electronic circuit modules. In addition to creating diagnostic rules, we also create a knowledge base that is prepared by creating rules in the form of "operation judgment contents and inference results" regarding the mutual operation coordination of parts, and the conditions and methods of investigation tests that correspond to the inference results of the diagnostic rules. It consists of an investigation test file that stores guidance data, a search function that searches for guidance data based on inference results, and an investigation test controller that has functions that set conditions and control operation of investigation test means from guidance data. It is equipped with an expert system that controls the means to try to reproduce the problem and estimate the location of the abnormality.

(Function) Therefore, in the electronic circuit module trouble analysis support system according to the present invention, when trouble analysis is performed, the expert system is executed to judge the operation of the electronic circuit module, and the investigation is performed based on the inference results of the diagnostic rules. The test controller is started. Then, the investigation test controller searches the investigation file for investigation test data that corresponds to the inference result, and reads condition data such as temperature of the environmental test means and setting data of the function test means of the electronic circuit module. . Further, appropriate conditions for the functional test means and the environmental test means are determined based on the state of the trouble, and a condition setting signal is sent to each test means to perform a trouble reproduction investigation test.

At this time, the electronic circuit module to be analyzed and investigated is connected to the functional test means and housed in the environmental test means, and each test means receives signal data from the expert system and sets conditions. The operating state is controlled.

On the other hand, the operating state of the electronic circuit module during the trouble reproduction investigation test is detected by the functional test means and is taken into the expert system as electronic circuit module data at a predetermined timing. The expert system uses this data to determine if the problem will be reproduced, and when an abnormality occurs in the electronic circuit, it executes diagnostic rules to estimate the location of the abnormality or failed part, and displays the results as a diagnosis. In addition, by connecting the electronic circuit module to be analyzed for trouble to the functional test means and placing it in the storage location within the environmental test means, the expert system sets the conditions for each test means and performs the investigation test. Analytical investigation can be easily performed by determining whether the circuit trouble is reproduced and estimating the location of the abnormality.

(Example) Hereinafter, an example of the present invention will be described with reference to the drawings.

FIG. 1 is a block diagram showing a configuration example of a trouble analysis support system for an electronic circuit module according to the present invention. 1st
In the figure, the electronic circuit module trouble analysis support system includes an expert system 1 comprising a knowledge base 2, a data file 3, an inference section 4, an investigation test controller 5, and an investigation file 6, and a signal converter 7.
an external functional testing device 7 consisting of o, an external environmental testing device 8 consisting of an investigation target module 81, and a condition setting section 82.
It consists of an investigation and testing device equipped with

Here, the expert system 1 is comprised of a workstation having an interface function capable of data communication with external devices and the like. The knowledge base 2 stores diagnostic rules for determining and diagnosing the operation of electronic circuit modules. At the initial stage of diagnosis, it is assumed that the data file 3 stores the trouble operating state at the time of starting the trouble analysis of the electronic circuit module. Trouble analysis is
Operation data indicating the trouble status of the electronic circuit module is extracted from the data file 3 via the signal line a, and diagnostic rules related to trouble investigation are extracted from the knowledge base via the signal line a.
The information is taken into the inference unit 4 via the inference unit 4 and inference is executed. Further, the investigation test controller 5 is provided between the inference section 4 and the investigation file 6, and between the external functional test device 7 and the environmental test device 8, and transmits the results of the inference section 4 to the signal line C. The necessary investigation test condition data is retrieved from the investigation file 6 and read through the signal line d. Furthermore, the condition setting data for the investigation test is supplied to the signal converter 70 of the functional test device 7 and the condition adjuster 82 of the environmental test device 8 via signal lines e and f to perform operational control.

On the other hand, the functional testing device 7 detects the supply of the input signal l and the output signal m of the module to be investigated 8 according to the command from the expert system 1, and uses the data file 3 via the signal line g as the operation data of the electronic circuit module. Data is sent to the inference section 4 using the input and signal line. During the investigation test, the inference section 4 performs trouble reproduction determination and inference of abnormal locations, and when the trouble is reproduced, the diagnosis result is displayed on the CRTQ via the signal line.

Next, the operation of the electronic circuit module trouble analysis support system configured as described above will be explained using FIGS. 2 and 3.

FIG. 2 is a functional flowchart showing the inference process of the expert system 1 in FIG. In FIG. 2, in processing step 1o, output status data X at the time of trouble of the electronic circuit module to be analyzed. is read, and in processing step 11, the diagnostic rule is applied to determine the trouble operation event y of the electronic circuit module. is confirmed. Thereafter, the investigation test controller 5 is started and step 12.13 is executed, and the investigation test guidance data corresponding to the trouble operation event is taken in, and the setting conditions T of the environmental test device 8 and the setting conditions P of the functional test device 7 are Decide and
Condition setting commands T and P and external operation command R are sent to each device.

Next, in processing step 14, the electronic circuit module operation data X under investigation test is read, and in step 15,
Apply the diagnostic rule again and increase the trouble behavior ljf by +4
A current judgment is made. If the trouble does not recur, the setting conditions for the investigation test are reset in step 16, and steps 14 and 15 are repeated. on the other hand,
If the trouble occurs again, step 7 is executed to estimate the abnormal location or failed component based on the diagnostic rule related to the operating state of the circuit. Next, step 18
Then, the estimated result of the abnormal location is displayed on the CRT as the diagnosis result.
displayed on display 9.

FIG. 3 is a block diagram showing a configuration example when this embodiment is applied to zero trouble analysis of a timer circuit module. In FIG. 3, the timer circuit module 81 includes a clock oscillator 91, a counter 92, a determination logic 93, and a delay time setter 94. When the human input signal i enters the counter 92, the clock oscillator 91
The pulse signal j sent from The signal m is output.The trouble state is that the signal m becomes non-output during use and has returned to normal when trouble analysis is started.

Next, the state of the system is determined by a signal generator 71 that generates an input signal i in response to a command from the expert system 1 to the function test device 7, and a signal generator 71 that generates an input signal i according to a command from the expert system 1, and a signal generator 71 that detects an output signal m and outputs measured values such as level values and delay times to the expert system. A signal detector 73 is provided to send to the system 1.

Furthermore, a circuit measuring device 72 is provided for measuring the state 1 of the pulse signal j1 count of the timer circuit module 81 and the one delay time count value ρ. The environmental testing device 8 includes a temperature controller 82 that can create a desired temperature environment according to commands from the expert system 1, and a space for storing a module to be analyzed, in which a timer circuit module 81 to be analyzed is installed.

On the other hand, data file 3 of the early timer circuit module
contains the state of the output signal m when a trouble occurs, and is taken into the expert system 1. The expert system 1 includes knowledge regarding normal/abnormal operation of the timer circuit module 81, a counter 92, and judgment logic 93.
A group of diagnostic rules, such as operation timing, is stored in a knowledge base 2, and necessary knowledge is retrieved at the request of the inference section 4 to confirm troublesome operation events. When the trouble operation event is confirmed, the investigation test controller 5 is started, the conditions for the trouble reproduction test are determined, and a test temperature control command e is sent to the environmental test device 8, and the timer circuit module 81 is sent to the function test device 7. Timing command f to input signal i
Output.

2. On the other hand, during the investigation test, the operating state of the timer circuit module 81 is measured by the circuit measuring device 72 and the signal detector 73,
The data is input to the expert system 1 via the signal lines g and b, and the trouble operation event is determined to be reproduced. If the trouble does not reproduce, a test temperature reset command e is sent via the investigation test controller 5, and processing is performed. Do this repeatedly.

In addition, if the trouble occurs again, use the diagnostic rules in the knowledge base 2 from each measurement data during the investigation test to determine whether there is an abnormality in the components or connections of the timer circuit module 81, and estimate the location of the abnormality. , and display the results on the CRTQ as the trouble analysis investigation results. for example,
When the trouble is reproduced at the test temperature T°C, if the count number k of the counter 92 reaches the set delay time count value p and indicates a normal operating state, the expert system 1 checks the circuit of the judgment logic 93. The abnormal location is estimated as the judgment logic using the diagnosis rule, and the diagnosis result is "
``Determination logic malfunction'' is displayed on the CRTQ.

3. As described above, the electronic circuit module trouble analysis support system according to this embodiment can have the following effects. In other words, when analyzing troubles in electronic circuit modules, it is necessary to investigate the reproduction of troubles and find abnormalities at an early stage. It becomes possible to estimate the location of the abnormality.

In addition, operators can easily perform trouble analysis without having circuit knowledge related to normal/abnormal operation of various electronic circuit modules or knowledge of investigation test conditions and methods. It is possible to support activities and significantly shorten the research period.

FIG. 4 is another embodiment of the present invention, and is a flowchart showing the diagnostic action when applied to an operation limit quantity investigation using a normal crystal of a power supply circuit module. In Figure 4, the abnormality judgment value is determined based on the specification values and reference values of the power supply enclosure module, and the settings of four investigation test conditions and circuit human power values are set to examine environmental resistance such as temperature and humidity. and carry out the investigation.

An abnormality is determined from the circuit status such as output voltage and current during the investigation test, and the environmental test conditions and circuit input conditions are changed and the test is performed again until an abnormal condition occurs. When an abnormality occurs, the investigated test temperature and circuit input voltage values are displayed as operating limit values. Furthermore, by estimating the abnormally operating parts when an abnormality occurs, it becomes possible to understand the weak points of the electronic circuit module, which can be introduced into investigation tests for the purpose of improvement.

[Effects of the Invention] As explained above, according to the present invention, the present invention includes a function test means for performing a function test of an electronic circuit module and an environment test means for providing operating environment conditions, Investigative testing means that has the function of externally controlling test conditions and operation so that data can be sent and received; diagnosis rules are created in the form of "operation judgment contents and inference results" from the operating status of electronic circuit modules, and mutual behavior of components Regarding coordination, there is a knowledge base that is prepared as rules in the form of "action judgment contents and inference results", and an investigation test file that stores guidance data such as conditions and methods of investigation tests that correspond to the inference results of diagnostic rules. It consists of a search function that searches for guidance data based on inference results, and an investigation test controller that has a function that sets conditions and controls the operation of the investigation test means from the guidance data.It controls the investigation test means and attempts to reproduce the trouble. Since the configuration is equipped with an expert system that estimates abnormal locations, when analyzing troubles in electronic circuit modules, a reproduction investigation test based on the normal state of the hole can be attempted, and abnormal events can be determined and abnormal locations can be determined based on the state of the electronic circuit. Alternatively, it is possible to provide an extremely reliable trouble analysis support system for electronic circuit modules that can estimate failure parts and support early detection of abnormal parts and analysis and investigation activities.

[Brief explanation of drawings]

FIG. 1 is a block diagram showing an embodiment of the electronic circuit module trouble analysis support system according to the present invention, FIG. 2 is a flowchart for explaining the operation of the same embodiment, and FIG. FIG. 4 is a block diagram showing a configuration example when applied to trouble analysis of a practical electronic circuit module, and FIG. 4 is a flow chart diagram for explaining the inference operation according to another embodiment of the present invention. 1...Expert system, 2...Knowledge base,
3...Electronic circuit module data file, 4...
- Reasoning unit, 5... Investigation test controller, 6... Investigation file, 7... Functional test device, 8... Environmental test device, 9... CRT, 70... Signal converter, 81・
...Target module, 82...Condition setting section.

Claims (1)

[Scope of Claims] Consisting of a function test means for performing a function test of an electronic circuit module and an environment test means for providing operating environment conditions, the test conditions can be transmitted and received from the outside so that data such as condition setting signals and operation control signals can be transmitted and received. An investigation test means that has functions to perform operation control and operation control, and “
In addition to creating diagnostic rules in the format of "action determination contents and inference results," we also create a knowledge base that is prepared by creating rules for the mutual operation coordination of parts in the format of "operation determination contents and inference results," and the inference results of the diagnostic rules. A survey test file that stores guidance data such as conditions and methods for applicable survey tests, a search function that searches for the guidance data based on inference results, and condition setting and operation control of the survey test means from the guidance data. an expert system that controls the investigation test means to try to reproduce the trouble and estimate the location of the abnormality. system.