JPH03291384A - Electroless plating method and apparatus - Google Patents
Electroless plating method and apparatusInfo
- Publication number
- JPH03291384A JPH03291384A JP9267790A JP9267790A JPH03291384A JP H03291384 A JPH03291384 A JP H03291384A JP 9267790 A JP9267790 A JP 9267790A JP 9267790 A JP9267790 A JP 9267790A JP H03291384 A JPH03291384 A JP H03291384A
- Authority
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- Japan
- Prior art keywords
- component
- plating
- electroless plating
- replenishment
- amount
- Prior art date
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Abstract
Description
【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、無電解めっき液の連続的使用方法に関する。[Detailed description of the invention] [Industrial application field] The present invention relates to a method for continuously using an electroless plating solution.
C従来の技術〕
無電解めっきでは使用に伴って、還元され析出する金属
イオンや還元剤が消費され、その結果、装置液中のこれ
らの成分の濃度が減少する。C. Prior Art] With use of electroless plating, metal ions and reducing agents that are reduced and precipitated are consumed, and as a result, the concentration of these components in the device liquid decreases.
ホルムアルデヒドを還元剤として使用する無電解銅めっ
きの場合を例として次式に示す。An example of electroless copper plating using formaldehyde as a reducing agent is shown in the following equation.
Cu”+2GH1(還元剤) +40H−−Cu’(め
っき金属)+ 21(!O+Hzτ+ 21(COO−
・・−−一−−−−−−・−−−(1)式から明らかな
ように、めっき液の使用に伴って銅イオン、ホルムアル
デヒド、水酸イオンが消費される。無電解めっき液を長
時間、連続的に使用するためには、これらの消費成分を
補給しなければならない。Cu"+2GH1 (reducing agent) +40H--Cu' (plating metal)+21(!O+Hzτ+21(COO-
As is clear from the formula (1), copper ions, formaldehyde, and hydroxide ions are consumed as the plating solution is used. In order to use the electroless plating solution continuously for a long time, these consumed components must be replenished.
また、この時、めっき析出速度や、めつきによって得ら
れる皮膜の特性、めっき液の安定性は、めっき液中成分
の濃度に支配されるので、成分濃度を管理する必要があ
る。Further, at this time, the plating deposition rate, the characteristics of the film obtained by plating, and the stability of the plating solution are controlled by the concentration of the components in the plating solution, so it is necessary to control the component concentrations.
そこで、成分の分析と分析値に基づ(成分の補給が行わ
れている。金属イオン濃度は、吸光光度法や選択性イオ
ン電極で測定される。pH調整成分(水酸イオン)はp
H電極や、酸、塩基滴定法で測定される。還元側も化学
分析やイオンクロマトグラムなどの方法で測定される。Therefore, based on component analysis and analysis values (component replenishment is carried out).Metal ion concentration is measured by spectrophotometry or selective ion electrode.pH adjusting component (hydroxide ion) is
Measured by H electrode, acid, and base titration methods. The reduced side is also measured using methods such as chemical analysis and ion chromatography.
これらの測定は、ある一定の時間毎に行われる。そして
次の測定までの期間の成分補給量が決められる。この成
分補給量は、成分測定周期(単位:分又は時間)に対す
る成分補給装置の作動時間で決められる。These measurements are performed at regular intervals. Then, the amount of component replenishment for the period until the next measurement is determined. The amount of component replenishment is determined by the operating time of the component replenishment device with respect to the component measurement period (unit: minutes or hours).
一般には比例制御が採られており、管理中心濃度の時、
作動時間を測定周期に対して50%、管理中心濃度より
も低濃度になるに従い、比例的に作動時間が50から1
00%まで増加する。逆に、管理中心濃度よりも高濃度
になるに従って、比例的に作動時間が50〜0%まで減
少する。この時、作動時間が100%と0%になる時の
下限値及び上限値濃度を設定してお(、従来の成分管理
装置は上記のようなものである。Generally, proportional control is adopted, and when the concentration is at the control center,
The operating time is 50% of the measurement cycle, and as the concentration becomes lower than the control center concentration, the operating time increases proportionally from 50% to 1%.
Increases to 00%. Conversely, as the concentration becomes higher than the control center concentration, the operating time decreases proportionally by 50-0%. At this time, lower and upper limit concentrations are set when the operating time becomes 100% and 0% (the conventional component management device is as described above).
ところで、めっき液を連続的に使用していると、被めっ
き物の出し入れは避けられない、被めっき物のめっき面
積をいつも一定にすることは困難である。そこで、実際
には、被めっき物のめっき面積が変わるような条件で、
めっき液の成分濃度を一定に管理する必要がある。By the way, when a plating solution is continuously used, it is inevitable that the objects to be plated are taken in and out, and it is difficult to always keep the plating area of the objects to be plated constant. Therefore, in reality, under conditions that change the plating area of the object to be plated,
It is necessary to control the component concentration of the plating solution at a constant level.
上記の成分濃度管理方法で問題が生じるのは、以下の理
由のためである。成分消費量と成分補給量の関係式をそ
れぞれ(2)、 (3)に示す。Problems arise with the above component concentration control method for the following reasons. The relational expressions between the amount of component consumed and the amount of component replenishment are shown in (2) and (3), respectively.
成分消費量■めっき析出速度×めっき面積−(2)成分
補給量=成分補給装置の作動時間X単位作動時間当りの
補給量−・・・・−−−−−−−−−−−(3)成分が
消費しつつある時に、一定濃度を保持するには成分消費
量と成分補給量が等しいことが必要である。(2)と(
3)に示されていることから明らかなように従来の方法
では、めっき面積が急激に変動した場合(例えば、被め
っき物がめつき液から取り出されているような場合)次
の成分測定までの間、前回の測定値に基づいて成分が補
給されるので、管理の上限値を越える場合が発生する。Component consumption ■ Plating deposition rate x plating area - (2) Component replenishment amount = Component replenishment device operating time x replenishment amount per unit operating time - ... ) When a component is being consumed, maintaining a constant concentration requires equal component consumption and component replenishment. (2) and (
As is clear from 3), in the conventional method, when the plating area changes rapidly (for example, when the object to be plated is removed from the plating solution), the time required for the next component measurement is During this time, components are replenished based on the previous measured value, so there may be cases where the upper limit for management is exceeded.
また、逆に被めっき物がめつき液に入れられた場合は、
管理の下限値を下まわる場合が発生する。Conversely, if the object to be plated is placed in the plating solution,
There are cases where the value falls below the lower limit of management.
この問題は、成分補給装置の単位作動時間当りの補給量
が制御されていないためにおこる問題である。This problem occurs because the amount of replenishment per unit operating time of the component replenishment device is not controlled.
本発明は、めっき面積が変動しても、成分濃度を目標管
理範囲内に制御できる方法を提供するものである。The present invention provides a method that allows component concentrations to be controlled within a target control range even if the plating area varies.
即ち、本発明は無電解めっき液中の成分濃度を制御しな
がら、めっきを連続的に行う方法において、成分濃度を
分析し、得られた分析値をもとに、次に分析するまでの
間の成分補給装置の作動時間割合を決め、更に、単位め
っき液量に対するめつき面積をもとに、成分補給装置の
単位作動時間当りの補給量を決めることを特徴とするめ
つき液中の成分濃度管理方法である。That is, the present invention is a method of continuously performing plating while controlling the concentration of components in an electroless plating solution, in which the concentration of components is analyzed, and based on the obtained analysis value, the concentration of components is The component concentration in the plating solution is determined by determining the operating time ratio of the component replenishing device, and further determining the replenishment amount per unit operating time of the component replenishing device based on the plating area for the unit plating solution amount. It is a management method.
無電解めっき液としては、銅、ニッケル、スズ、Ag、
Coなど組成を管理しながらめっきを行う無電解めっき
液に適用できる。成分濃度分析は、サンプリングしため
っき液を一定の時間毎に間欠的に行うものである。そし
て、この分析値に基づいて、次の分析時間までの間の成
分補給装置の作動時間を決めるものである。この作動時
間は次のような場合を含む。例えば、分析時間間隔が1
0分間一定とした場合で、成分補給装置の作動時間が5
分間とする場合、この5分間を分析間隔10分間に平均
的に時間分割し、補給する場合を含む。Electroless plating solutions include copper, nickel, tin, Ag,
It can be applied to electroless plating solutions that perform plating while controlling the composition of Co, etc. Component concentration analysis is performed intermittently on a sampled plating solution at regular intervals. Then, based on this analysis value, the operating time of the component replenishing device until the next analysis time is determined. This operating time includes the following cases: For example, if the analysis time interval is 1
If the operating time of the component replenishment device is 5 minutes,
In the case of 5 minutes, this 5 minutes is divided into an analysis interval of 10 minutes on average, and this includes the case where replenishment is performed.
即ち、この場合、成分補給装置を30秒間作動、30秒
間停止の繰り返しで、合計補給時間が5分間とする場合
を含む、連続的にめっきを行うためには、少なくとも金
属イオン、還元剤を補給する必要があるが、1種類の成
分の分析値をもとに、他の成分の補給時間を決める場合
も含む。That is, in this case, in order to perform continuous plating, including when the component replenishment device is repeatedly activated for 30 seconds and stopped for 30 seconds for a total replenishment time of 5 minutes, at least metal ions and reducing agent must be replenished. Although it is necessary to do so, it also includes cases in which the replenishment time of other components is determined based on the analysis value of one type of component.
単位めっき液量に対するめっき面積の範囲はゼロから1
0dnf71の範囲である。被めっき物が、例えば、プ
リント配線板のような板状物の場合は、決められた枚数
をかごに入れて、このかごをめっき液に入れている。そ
こで、1つのめっき槽に入っているかごの数量でめっき
面積が決まることになる。このかごの数量を自動的に検
知する方法には、位置センサー等が使用できる。即ち、
所定位置におけるかごの有無を位置センサーで読みとる
。このようにして得られためっき面積の情報をもとに、
成分補給装置の単位作動時間当りの補給量を決める。一
般には、補給成分は液体にして取り扱われる。従って補
給装置としては、−gにポンプが使用される。補給量を
制御するには、シリンター式の場合、ストローク数やピ
ストンの変位量で変化できる。最も適当なポンプの例と
しては、ダイアフラムポンプでダイアフラムの変位量を
制御する方式のものである。このようなものの市販品の
例としては、−日本計器製作新製のピエゾポンプがある
。このポンプの場合、単位時間当りの補給量は0.01
mJ!/分〜40GmJ/分の間で任意に選べる。The range of plating area for unit plating solution amount is from zero to 1.
The range is 0dnf71. When the object to be plated is, for example, a plate-like object such as a printed wiring board, a predetermined number of sheets are placed in a basket, and the basket is placed in the plating solution. Therefore, the plating area is determined by the number of baskets in one plating tank. A position sensor or the like can be used to automatically detect the number of baskets. That is,
A position sensor reads the presence or absence of a car at a predetermined location. Based on the information on the plating area obtained in this way,
Determine the amount of replenishment per unit operating time of the component replenishment device. Generally, supplementary components are handled in liquid form. Therefore, a pump is used for -g as a replenishment device. In the case of a cylinder type, the amount of replenishment can be controlled by changing the number of strokes or the displacement of the piston. The most suitable pump is a diaphragm pump in which the amount of displacement of the diaphragm is controlled. An example of a commercially available product of this kind is a piezo pump manufactured by Nippon Keiki Seizo. In the case of this pump, the replenishment amount per unit time is 0.01
mJ! It can be arbitrarily selected between /min and 40GmJ/min.
従って、めっき面積をかごの有無の位置センサーで情報
化し、この情報をもとにピエゾポンプの補給量を自動的
に設定する。Therefore, the plating area is converted into information using a position sensor that indicates the presence or absence of a car, and the replenishment amount of the piezo pump is automatically set based on this information.
めっき液の組成、めっき条件は以下の内容で行った。 The composition of the plating solution and the plating conditions were as follows.
Cu S Oa ・5 Ht O−8g / IEDT
A ・4Na −40g/1pH(NaOHで調
整)−12,3
36%HCHO= 4 m l / 1添加荊
=少量
エアレーシッン −5Q m It / j 、
分液塩 =70℃
液量 =30004!めっき面積
−最大・2drd/11かご当りのめっき面積
=1200dr/めっきできるかごの数量=5かご(こ
の条件の時のめっき面積が2drI?/1)
めっき成分の自動分析、自動補給装置は日立化成工業間
PDB−300型を使用した。この装置で7分間毎に自
動分析し、分析値をもとに補給装置の作動時間を比例制
御した。めっき槽のかごをセントする所定の場所に位置
センサーを5かご分つけた。補給装置は一日本計器製製
作所ビエゾボンプ(流量を電気的に可変可能)を使用し
、かご有無の位置センサーの信号によってポンプの補給
量を変化できるようにした。Cu S Oa ・5 Ht O-8g / IEDT
A ・4Na -40g/1pH (adjusted with NaOH) -12,3 36%HCHO=4 ml/1 addition
= Small amount of air racing -5Q m It / j,
Separating salt = 70℃ Liquid volume = 30004! Plating area
- Maximum plating area per 2 drd/11 cars = 1200 dr/number of cars that can be plated = 5 cars (Plating area under these conditions is 2 drI?/1) Automatic analysis of plating components and automatic replenishment equipment are provided by Hitachi Chemical Co., Ltd. A PDB-300 model was used. This device automatically analyzed every 7 minutes, and based on the analyzed values, the operating time of the replenishment device was proportionally controlled. Position sensors were attached to five baskets at predetermined locations in the plating tank where the baskets were placed. The replenishment device uses Ichi Nippon Keiki Seisakusho's Viezo Bump (flow rate can be electrically varied), and the amount of replenishment from the pump can be changed based on the signal from the position sensor indicating the presence or absence of the car.
一方、比較例である従来方法では、補給装置として、補
給量を電気的に変化させることのできないダイアフラム
ポンプを使用した。On the other hand, in the conventional method as a comparative example, a diaphragm pump whose replenishment amount cannot be changed electrically was used as a replenishment device.
以上のめっき液組成、めっき浴条件及び設備条件でめっ
き面積を変化させた。この時のめっき液組成の変化とめ
っき状態の結果を表に示す。The plating area was varied using the above plating solution composition, plating bath conditions, and equipment conditions. The changes in the plating solution composition and the results of the plating condition at this time are shown in the table.
表に示した結果のように、従来(比較例)の方法では、
めっき面積が急激に変動した場合、成分濃度も変動し、
めっき表面にザラツキが発生した。As shown in the results shown in the table, the conventional (comparative example) method
If the plating area changes rapidly, the component concentration will also change,
Roughness occurred on the plating surface.
本発明の場合は、めっき面積の変動に伴い、自動的に補
給装置の単位時間当りの補給量を制御できるので、めっ
き液を安定に、しかも、長時間使用することが可能にな
る。また、この実施例では、無電解銅めっきの場合を説
明したが、他の無電解めっきにも同様に適用できる。In the case of the present invention, since the amount of replenishment per unit time of the replenishing device can be automatically controlled in accordance with changes in the plating area, it is possible to stably use the plating solution for a long time. Further, in this example, the case of electroless copper plating has been described, but it can be similarly applied to other electroless plating.
以上に説明したように、本発明によって無電解めっき液
の各成分の濃度の管理に優れた方法と、その方法に使用
される装置を提供することかできた。As explained above, according to the present invention, it was possible to provide a method excellent in controlling the concentration of each component of an electroless plating solution and an apparatus used in the method.
Claims (4)
めっきを連続的に行う方法において、各成分の濃度を分
析し、得られた分析値をもとに、次に分析するまでの各
成分の補給装置の作動時間間隔を決め、更に、単位めっ
き液量に対するめっき面積をもとに、前記補給装置の単
位作動時間当りの補給量を決めることを特徴とする無電
解めっき方法。1. While controlling the concentration of each component in the electroless plating solution,
In a method where plating is performed continuously, the concentration of each component is analyzed, and based on the obtained analysis value, the operating time interval of the replenishment device for each component is determined until the next analysis, and the unit plating solution is An electroless plating method characterized in that the amount of replenishment per unit operating time of the replenishing device is determined based on the plating area relative to the amount.
予め設定された各成分とその測定した結果とを比較し、
減少した成分を減少した量に応じて補給する手段とを備
えた連続無電解めっき装置において、その成分が減少し
た量に応じて補給装置の作動時間間隔を定める手段と、
被めっき体の面積に応じて補給量を定める手段とを有す
ることを特徴とする無電解めっき装置。2. A means for measuring the concentration of each component of the electroless plating solution,
Compare each preset component and its measured results,
In a continuous electroless plating apparatus, the continuous electroless plating apparatus includes a means for replenishing a reduced component in accordance with a reduced amount, and a means for determining an operating time interval of the replenishing device in accordance with a reduced amount of the component;
1. An electroless plating apparatus, comprising means for determining the amount of replenishment according to the area of an object to be plated.
センサーにより検出することを特徴とする請求項2に記
載の無電解めっき装置。3. 3. The electroless plating apparatus according to claim 2, wherein the method for detecting the plating area includes detecting the presence or absence of the object to be plated using a position sensor.
プラムポンプであることを特徴とする請求項2又は3の
うちいずれかに記載の無電解めっき装置。4. 4. The electroless plating apparatus according to claim 2, wherein the component replenishment device is a diaphragm pump whose replenishment amount can be electrically varied.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9267790A JPH03291384A (en) | 1990-04-06 | 1990-04-06 | Electroless plating method and apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9267790A JPH03291384A (en) | 1990-04-06 | 1990-04-06 | Electroless plating method and apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH03291384A true JPH03291384A (en) | 1991-12-20 |
Family
ID=14061118
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9267790A Pending JPH03291384A (en) | 1990-04-06 | 1990-04-06 | Electroless plating method and apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH03291384A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111733406A (en) * | 2020-07-15 | 2020-10-02 | 赤壁市聚茂新材料科技有限公司 | A kind of long-term electroless tin plating solution with thick coating and tin plating method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61199069A (en) * | 1985-02-28 | 1986-09-03 | C Uyemura & Co Ltd | Plating solution concentration automatic continuous control device |
-
1990
- 1990-04-06 JP JP9267790A patent/JPH03291384A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61199069A (en) * | 1985-02-28 | 1986-09-03 | C Uyemura & Co Ltd | Plating solution concentration automatic continuous control device |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111733406A (en) * | 2020-07-15 | 2020-10-02 | 赤壁市聚茂新材料科技有限公司 | A kind of long-term electroless tin plating solution with thick coating and tin plating method |
| CN111733406B (en) * | 2020-07-15 | 2022-09-20 | 赤壁市聚茂新材料科技有限公司 | Tin plating method of long-acting chemical tin plating solution for thick plating layer |
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