JPH0330873U - - Google Patents
Info
- Publication number
- JPH0330873U JPH0330873U JP9191189U JP9191189U JPH0330873U JP H0330873 U JPH0330873 U JP H0330873U JP 9191189 U JP9191189 U JP 9191189U JP 9191189 U JP9191189 U JP 9191189U JP H0330873 U JPH0330873 U JP H0330873U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- lead terminal
- inspection apparatus
- product storage
- measures
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 16
- 238000007689 inspection Methods 0.000 claims description 8
- 230000002950 deficient Effects 0.000 claims description 5
- 238000005259 measurement Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 7
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9191189U JPH0330873U (da) | 1989-08-03 | 1989-08-03 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9191189U JPH0330873U (da) | 1989-08-03 | 1989-08-03 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0330873U true JPH0330873U (da) | 1991-03-26 |
Family
ID=31641370
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9191189U Pending JPH0330873U (da) | 1989-08-03 | 1989-08-03 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0330873U (da) |
-
1989
- 1989-08-03 JP JP9191189U patent/JPH0330873U/ja active Pending
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