JPH0331802A - Phase type diffuser plate and its manufacturing method - Google Patents
Phase type diffuser plate and its manufacturing methodInfo
- Publication number
- JPH0331802A JPH0331802A JP16790789A JP16790789A JPH0331802A JP H0331802 A JPH0331802 A JP H0331802A JP 16790789 A JP16790789 A JP 16790789A JP 16790789 A JP16790789 A JP 16790789A JP H0331802 A JPH0331802 A JP H0331802A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- uneven pattern
- light beam
- substrate surface
- diffuser plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Viewfinders (AREA)
- Optical Elements Other Than Lenses (AREA)
Abstract
Description
【発明の詳細な説明】 (R1上の利用分野) 本発明は位相型拡散板とその製造方法に関し。[Detailed description of the invention] (Application field on R1) The present invention relates to a phase type diffuser plate and a method for manufacturing the same.
例えば写真用カメラ簿においてファインダー像を形成す
る焦点板として用いた場合、所定の拡散特性を有し、良
好なるファインダー像の観察が01能な位相型拡散板と
その製造方法に関するものである。For example, the present invention relates to a phase-type diffuser plate that has predetermined diffusion characteristics and enables good observation of a finder image when used as a focus plate for forming a finder image in a photographic camera, and a method for manufacturing the same.
(従来の技術)
従来より光学的に透明な基板面上に一定の高さの所定形
状の微細パターンを複数個形成し、誠微細パターンを通
過する光束に他の光束に対して位相差を付与して所定の
拡散特性を持たせた所謂bi −(パイ)レベルの位相
型拡散板が例えば特開昭55−70827号公報で提案
されている。(Prior art) Conventionally, a plurality of fine patterns of a predetermined shape and a constant height are formed on an optically transparent substrate surface, and a phase difference is imparted to the light beam passing through the Makoto fine pattern with respect to other light beams. A so-called bi-(pi) level phase type diffuser plate which has a predetermined diffusion characteristic is proposed, for example, in Japanese Patent Laid-Open No. 55-70827.
第4図は同公報で提案されているパイレベルの位相型拡
散板の要部概略図である。同図において101は基板で
あり、該基板lO1[IjEに一定の高さの微細パター
ン+02が形成されている。そして基板101面上の領
域へを通過する光束とパターン102の領域Bを通過す
る光束間に位相差を付すし、所定の拡散特性を得ている
。FIG. 4 is a schematic diagram of the main parts of the pi-level phase type diffuser plate proposed in the publication. In the figure, 101 is a substrate, and a fine pattern +02 of a constant height is formed on the substrate lO1[IjE. Then, a phase difference is created between the light beam passing through the area on the surface of the substrate 101 and the light beam passing through the area B of the pattern 102, and a predetermined diffusion characteristic is obtained.
(発明が解決しようとする問題点)
位相型拡散板に光束が入射すると第5図に示すように0
次回強光を中心に所定の強度の11次、12次、・・・
等の回折光が生じる0位相型拡散板はこれにより所望の
拡散特性を得ている。(Problem to be solved by the invention) When a light beam is incident on a phase type diffuser plate, as shown in FIG.
Next time, the 11th, 12th, etc. of a predetermined intensity centering on strong light.
The 0-phase type diffuser plate, which generates diffracted light such as , obtains desired diffusion characteristics.
一般にパイレベルの位相型拡散板は撮影レンズが開放時
で焦点距離が長くなると標準レンズに比べで霞結像位置
が合わなくなり光線がケラレ周辺光晴が落ちたり、又は
色ムラ簿の原因により所謂望遠スポットが発生してくる
。In general, when the focal length of a pie-level phase type diffuser plate is long when the shooting lens is wide open, the hazy image formation position is not aligned compared to a standard lens, and the light rays become vignetted, the peripheral brightness decreases, or the so-called telephoto spot is caused by color unevenness. will occur.
又、パイレベルの位相型拡散板は拡散特性のバラツキが
悪い為に開放時及び小絞りのときにボケ像に色ムラが発
生してくる。この色ムラは略バイレベルの潔さに依存し
、これを補正することは大変難しい。Further, since the pie-level phase type diffuser plate has poor dispersion characteristics, color unevenness occurs in the blurred image when the aperture is wide open or when the aperture is small. This color unevenness depends on almost bi-level cleanliness, and it is very difficult to correct it.
又、0次回強光の強度は最小実測で4〜5%程度が限界
であり、これより小さくすることは難しく、この為例え
ばファインダー像を大きくボカすことができないといっ
た問題点があった。Moreover, the minimum actual measurement of the intensity of the 0th order strong light is about 4 to 5%, and it is difficult to make it smaller than this, which poses the problem that, for example, it is not possible to greatly blur the finder image.
本発明は基板面上に所定パターンの異った位相差を有す
るWi数の凹凸部を適切に設定することにより例えばフ
ァインダー系に適用したとき白色の0次光が少なく、対
称性の良いボケ味を有し1色ムラ及びそれに伴う望遠ス
ポットの発生を防11ニジた良好なるファインダー像の
観察が可能な位相型拡散板の援供を目的とする。The present invention has a predetermined pattern of irregularities with different phase differences and a Wi number of concave and convex portions on the substrate surface, so that when applied to a finder system, for example, there is less white zero-order light and a symmetrical bokeh is achieved. The object of the present invention is to provide a phase-type diffuser plate which prevents the occurrence of one-color unevenness and the accompanying telephoto spot and enables observation of a good viewfinder image.
(問題点を解決するための手段)
本発明の位相型拡散板根は光学的に透明な基板面Fに該
基板面を基準面として、入射光束に位相差θ1を付与す
る第1凹凸パターンを設け、誤第1凹凸パターンのパタ
ーン模様の少なくとも一部に市なり合うように入射光束
に位相差θ2を付与する第2凹凸パターンを設け、入射
光束に対して全体として4つの位相差0、θ1.θ2.
(θ1+02)を付与することにより該入射光束を回折
又は/及び散乱させて所望の拡散特性を得たことを特徴
としている。(Means for Solving the Problems) The phase-type diffuser plate base of the present invention has a first concavo-convex pattern on an optically transparent substrate surface F, using the substrate surface as a reference plane, which imparts a phase difference θ1 to an incident light beam. A second uneven pattern is provided which imparts a phase difference θ2 to the incident light beam so as to coincide with at least a part of the pattern of the first uneven pattern, and a total of four phase differences 0 and θ1 are provided to the incident light beam. .. θ2.
(θ1+02), the incident light beam is diffracted and/or scattered to obtain desired diffusion characteristics.
又、本発明に係る位相型拡散板は次の工程により製造し
ていることを特徴としている。即ち、基板面上に感光体
を形成し、所定のパターンを露光、現像又は漂白する第
1工程と、第1のエツチングにより該基板面上に第1凹
凸パターンを形成し、その後該基板面上に残存した感光
体を除去する第2工程と、該基板面上に感光体を形成し
。Further, the phase type diffuser plate according to the present invention is characterized in that it is manufactured by the following process. That is, a first step of forming a photoreceptor on a substrate surface, exposing, developing or bleaching a predetermined pattern, and forming a first uneven pattern on the substrate surface by first etching, and then forming a photoreceptor on the substrate surface. a second step of removing the photoreceptor remaining on the substrate; and forming a photoreceptor on the surface of the substrate.
j第1凹凸パターンのパターン模様の少なくとも一部に
1なり合うように所定のパターンを配置し、該パターン
を露光、現像又は漂白する第3工程と第1のエツチング
とは異ったエツチング看を有する第2のエツチングによ
り該基板面上に第2凹凸パターンを形成する第4工程を
介して入射光束に対して全体として異った4つの位相差
を付与することにより入射光束を回折又は/及び散古り
させて所望の拡散特性を得ている。j. A third step of arranging a predetermined pattern so as to overlap at least a part of the pattern of the first concavo-convex pattern, and exposing, developing or bleaching the pattern, and an etching process different from the first etching. A fourth step of forming a second concave-convex pattern on the substrate surface by a second etching process provides four different phase differences to the incident light beam as a whole, thereby diffracting the incident light beam and/or The desired diffusion properties are obtained by scattering.
(実施例)
第1図(A)は本発明の第1実施例の要部斜視図、第1
図(B)は同図(A)のA−A断面図である。(Embodiment) FIG. 1(A) is a perspective view of the main part of the first embodiment of the present invention.
Figure (B) is a sectional view taken along line AA in Figure (A).
図中11は基板で光学的に透明な材料より成っている。In the figure, reference numeral 11 denotes a substrate made of an optically transparent material.
該基板IIの表面は基準面Iとなっており第ルベルを形
成している。The surface of the substrate II serves as a reference plane I and forms a first rubel.
2は第1凹凸パターンであり、同図では基板11の基準
面!を基準とし、入射光束に位相差θlを付与する凹状
パターンより成り、第2レベルを形成している。3は第
2凹凸パターンであり第1凹凸パターン2のパターン模
様の少なくとも一部と重なり合うようなパターンより成
り、同図では入射光束に対して位相差θ2を付与する凹
状パターンより成っており第3レベルを形成している、
4は第3凹凸パターンであり第1凹凸パターン2と第2
凹凸パターン3とが市なり合った領域より成っており、
入射光束に対して位相差(ol+02)を<−を与する
第4レベルを形成している。2 is the first uneven pattern, which is the reference surface of the substrate 11 in the figure! It is made up of a concave pattern that imparts a phase difference θl to the incident light beam, and forms a second level. Reference numeral 3 denotes a second concave-convex pattern, which is composed of a pattern that overlaps at least a part of the pattern of the first concave-convex pattern 2, and in the figure, it is composed of a concave pattern that imparts a phase difference θ2 to the incident light beam; forming a level,
4 is the third uneven pattern, which is the first uneven pattern 2 and the second uneven pattern.
It consists of areas where the uneven pattern 3 overlaps with each other,
A fourth level is formed that gives a phase difference (ol+02) of <- to the incident light beam.
第1レベル1から第4レベル4は第1図(13)に示す
ように各々異った4つの高さより成っている。これによ
り入射光束に対して各々異った位相差0、θl、θ2.
(θl+θ2)を付与し、即ち4レベルの位相差を付与
し入射光束を回折又は/及び散乱させ所望の拡散特性を
44 シた所謂4レベルの位相型拡散板を構成している
。The first level 1 to the fourth level 4 are each made up of four different heights, as shown in FIG. 1 (13). As a result, different phase differences 0, θl, θ2, .
(θl+θ2), that is, a four-level phase difference is provided, and the incident light beam is diffracted and/or scattered, thereby forming a so-called 4-level phase type diffuser plate that has a desired diffusion characteristic of 44 degrees.
パイレベルの位相型拡散板は白色0次光の色はト青叉は
赤色成分が残存し、青から赤色の間に色ムプが生じてく
る。In the pie-level phase type diffuser plate, the white 0th-order light has a blue or red component remaining, and a color difference occurs between blue and red.
これに対して本実施例において拡散板を通過する全拡散
光は基準面lと第1凹凸パターン(i=■、2.3)を
通過した光束どうし、又第1凹凸パターンと第1凹凸パ
ターン(j=2.3)を通過した光束どうし、史に第2
凹凸パターンと第3凹凸バター二ノを通過した光束どう
しが!【いに小ね合わさってイルし合って射出してくる
光束となる。On the other hand, in this embodiment, the total diffused light passing through the diffuser plate is divided between the light beams passing through the reference surface l and the first uneven pattern (i=■, 2.3), and between the first uneven pattern and the first uneven pattern. (j=2.3)
The light beams that passed through the uneven pattern and the third uneven butterfly! [The light beams combine and illuminate each other to form a beam of light.
即ちこのような組み合わせの光束どうしが互いに色を打
も消し合って全拡散光の分光特性をフラットにして色ム
ラのない良好なるファインダー像の観察を可能としてい
る。In other words, the colors of such combinations of light beams cancel each other out, making the spectral characteristics of the total diffused light flat, thereby making it possible to observe a good finder image without color unevenness.
特に本実施例では白色の0次光の色をパイレベルの位相
型拡散板に比べてより白色に近づけることができ、色ム
ラを少なくしている。In particular, in this embodiment, the color of white zero-order light can be made closer to white than in a pie-level phase type diffuser plate, and color unevenness is reduced.
本実施例における4レベルの位相型拡散型ではパイレベ
ルの位相型拡散板と同様に品々Φね合わせるパターンの
単位格f−内が点対称でない(μm以上ずれている。)
小パターンが配列されかつ単位格子が周期構造でないと
ファインダー系で観察したとき凹凸パターンによる粒状
性が1−1qっでくる。In the 4-level phase type diffusion plate in this embodiment, the unit case f- of the pattern for aligning the items Φ is not point symmetrical (deviated by more than μm), similar to the pi-level phase type diffusion plate.
If the small patterns are arranged and the unit cell does not have a periodic structure, the graininess due to the uneven pattern will be 1-1q when observed with a finder system.
そこで本実施例では第3図のフローチャートで示すよう
に次の方法により4レベルの位相グJ拡故板を製造して
いる。Therefore, in this embodiment, as shown in the flowchart of FIG. 3, a four-level phase magnification plate is manufactured by the following method.
まず第1L稈として基板面にに感光性樹脂膜、銀塩膜、
そして高解像度のポジ型レジスト等の感光体を形成し、
所定のパターンマスクを密行、若しくは僅かの隙間を隔
てて対向配WtL2、又は投影系を介して縮少投影して
、露光、現像又は漂白(ブリーチ)する、そしてパター
ン像を形成する。First, as the first L culm, a photosensitive resin film, a silver salt film,
Then, a photoreceptor such as a high-resolution positive resist is formed,
A predetermined pattern mask is exposed, developed, or bleached by exposing, developing, or bleaching, and forming a pattern image by facing the WtL2 closely or with a small gap therebetween, or by reducing and projecting the mask through a projection system.
第2に稈として第1のエツチングにより譲基板面上にA
パターンに基づく第1凹凸パターンを通過光束に対して
位相差θ1を付与するように所定の潔さとなるように形
成し、その後該基板而Fに残存した感光体、その他の不
要物を除去する。Second, as a culm, A is etched on the transfer substrate surface by the first etching.
A first concavo-convex pattern based on the pattern is formed to have a predetermined cleanliness so as to impart a phase difference θ1 to the passing light beam, and then the photoreceptor and other unnecessary materials remaining on the substrate F are removed.
第3に稈として該基板面」−に第11Fi!と同様の感
光体を形成し、マスクパターンが該第1凹凸パターンの
パターン8!様の少なくとも一部に盾なり合うように例
^ば原盤とマスクパターンを所定用回転、又は変位させ
て、第1工Cノと同様にして露光、現像又は漂白(ブリ
ーチ)する。Thirdly, as a culm, the 11th Fi! A photoconductor similar to the above is formed, and the mask pattern is pattern 8! of the first concavo-convex pattern! For example, the master and mask pattern are rotated or displaced in a predetermined manner so that at least a portion of the mask pattern shields each other, and exposed, developed, or bleached in the same manner as in step C.
第4玉程として第2工程の第1のエツチングとは異った
エツチング環をイイする第2のエツチングにより3ノλ
板面上.に第2凹凸パターンを通過光束に対して位相差
θ2を付与するように所定の潔さとなるように形成し、
その接顔)A h面上に8(fした感光体その他の不要
物を取り除く。As the fourth etching process, the second etching process, which is different from the first etching ring in the second step, is performed to form a 3-λ etching ring.
On the board. A second concave-convex pattern is formed to have a predetermined cleanness so as to impart a phase difference θ2 to the passing light beam,
Remove the photoreceptor and other unnecessary items on the A h surface.
このとき本実施例では第1のエツチングによる位相差θ
lと第2のエツチングによるイθ相差θ2がθ1〈θ2
のときθ1/θ2<0.95、θ1/θ2>1.05と
なるようにしている。At this time, in this embodiment, the phase difference θ due to the first etching is
The phase difference θ2 due to l and the second etching is θ1<θ2
When θ1/θ2<0.95, θ1/θ2>1.05.
本実施例ではこのようにして入射光束に対して全体とし
て異った4つの位相70、θl、θ2゜〈θ1+θ2)
を付与することにより、入射光束を回折又は/及び散乱
させて所望の拡散特性を円でいる。In this embodiment, four phases 70, θl, θ2゜〈θ1+θ2〜〈θ1+θ2〜, which are totally different from each other with respect to the incident light beam, are thus obtained.
By imparting this, the incident light beam is diffracted and/or scattered to obtain desired diffusion characteristics in a circular manner.
(を体的な数傾倒を不すど、対象とする光のIiI長を
λ、lrL長λにおCブる基への材質の屈折率を02第
1図(13)に示すように位相差θlに相当すう潔さを
(11,□+ 、 Lrj相差相差θ相当する潔さをd
、1.イI′L相差(θI+1)2)に相当する潔さを
d雪としたとき、本実施例では次の諸F1値より晶要木
を構成している。(Without considering the physical numbers, the IiI length of the target light is λ, and the refractive index of the material for the C group is 02 as shown in Figure 1 (13). The cleanliness corresponding to the phase difference θl is (11,□+, Lrj The cleanliness corresponding to the phase difference θ is d
, 1. When the purity corresponding to I'L phase difference (θI+1)2) is defined as d snow, in this embodiment, the crystal key tree is constructed from the following F1 values.
(a flf1例1)
θ1 =d、、(n−11=0.45八〇2
=d+−* (n−1)=0.59八〇l+02
= d t (n −1) = 1 、04人(
数値例2)
171 =d、−,(n−1)−0,39人02
=dl−1(n−1)=0.53人θ1+02
=d* (n−1)=0.92人第2 INは本発
明の第2実施例の要部斜視図である。(a flf1 example 1) θ1 = d, (n-11 = 0.45802
=d+-*(n-1)=0.5980l+02
= d t (n -1) = 1, 04 people (
Numerical example 2) 171 = d, -, (n-1) -0, 39 people 02
=dl-1(n-1)=0.53 people θ1+02
=d*(n-1)=0.92 people 2nd IN is a perspective view of a main part of a second embodiment of the present invention.
同図において第1図(A)と同一要素には同符番を付し
ている。In this figure, the same elements as in FIG. 1(A) are given the same reference numerals.
本実施例では第2凹凸パターン3を形成するとき、その
パターン模様が第1凹凸パターン2のパターン模様を全
て含むようにして形成し、双方の屯なり合った領域より
第3凹凸パターン4を形成している。In this embodiment, when forming the second uneven pattern 3, the pattern is formed so as to include all of the pattern of the first uneven pattern 2, and the third uneven pattern 4 is formed from an area where both areas overlap. There is.
そして第1図(A)の第1実施例と同様に基準面lを基
準にして入射光束に対して4つの位相差0、 01.0
2.<01+02)を付Tし、即ち4レベルの位相差を
付与し、所望の拡散特性を有した4レベルの位相型拡散
板を得ている。Similarly to the first embodiment shown in FIG. 1(A), there are four phase differences of 0 and 01.0 with respect to the incident light beam with respect to the reference plane l.
2. <01+02) is added, that is, a four-level phase difference is imparted to obtain a four-level phase type diffuser plate having desired diffusion characteristics.
(発明の効果)
本発明によればl1iI述の如く基板面上に所定形状の
複数の微細パターンより成る高さの異なる4種類のf面
部、mち4つの位相差を有するパターンを設けることに
より1例えば写真用カメラの焦点板として用いた場合2
次のような効果を有した焦点板を得ることができる。(Effects of the Invention) According to the present invention, as described in I1I, by providing on the substrate surface four types of f-plane portions having different heights, m, which are composed of a plurality of fine patterns having a predetermined shape, and having four phase differences. 1 For example, when used as a focusing plate for a photographic camera 2
A focusing plate having the following effects can be obtained.
(イ)O次回指光の色付きが小さいため、標準レンズに
おいて絞りを小絞りにした状態であってもファインダー
視野全面が0次回指光の色に色付く様なことがなく自然
な色を呈する良好なるファインダー像を得ることができ
る。(b) Since the coloring of the O-order light is small, even when using a standard lens with a small aperture, the entire field of view in the viewfinder will not be colored by the color of the 0-order light and will exhibit natural colors. You can obtain a viewfinder image that looks like this.
(ロ)0次回指光の色付きが小さいため、望遠レンズの
様な瞳が合りていないレンズ系に3いて絞りを小絞りに
したときでも望遠スポットの発生を防止し色ムラを小さ
くすることができる。(b) Since the coloring of the 0th order light is small, it is possible to prevent the occurrence of a telephoto spot and reduce color unevenness even when the aperture is set to a small aperture in a lens system such as a telephoto lens where the eyes do not match. I can do it.
(ハ)白色の0次回指光強度を弱くすることができるた
め、ボケを大きくすることができ、又望遠レンズにおい
て絞りを小絞りにしたときの光層ムラを小さくすること
ができる。(c) Since the intensity of the white zero-order light can be weakened, it is possible to increase the blur, and it is also possible to reduce the unevenness of the light layer when the aperture is set to a small aperture in a telephoto lens.
(ニ)4レベルの位相差を有する拡散板を同様な5J造
玉程を2回繰り返すことにより容易に製造することがで
きる。(d) A diffuser plate having four levels of phase difference can be easily manufactured by repeating the same 5J ball-making process twice.
第1図(A)、第2図は本発明の第1、第2実施例の要
部斜視図、第1図(B)は第1図(A)のA−A断面図
、第3図は本発明の位相型拡散板の製造方法の一実施例
のフローチャート、第4図は従来の位相型拡散板の要部
斜視図、第5図は位相型拡散板を通過する回折光の説明
図である。
図中11は基板、lは基準面、2は第1凹凸パターン、
3は第2凹凸パターン、4は第3凹凸パターン、である
。
第 1
図
諏 2 図1(A) and 2 are perspective views of essential parts of the first and second embodiments of the present invention, FIG. 1(B) is a sectional view taken along line AA in FIG. 1(A), and FIG. 4 is a flowchart of an embodiment of the method for manufacturing a phase type diffuser plate of the present invention, FIG. 4 is a perspective view of essential parts of a conventional phase type diffuser plate, and FIG. 5 is an explanatory diagram of diffracted light passing through the phase type diffuser plate. It is. In the figure, 11 is the substrate, l is the reference surface, 2 is the first uneven pattern,
3 is a second uneven pattern, and 4 is a third uneven pattern. Figure 1 Figure 2
Claims (2)
て、入射光束に位相差θ1を付与する第1凹凸パターン
を設け、該第1凹凸パターンのパターン模様の少なくと
も一部に重なり合うように入射光束に位相差θ2を付与
する第2凹凸パターンを設け、入射光束に対して全体と
して4つの位相差0、θ1、θ2、(θ1+θ2)を付
与することにより該入射光束を回折又は/及び散乱させ
て所望の拡散特性を得たことを特徴とする位相型拡散板
。(1) A first uneven pattern that imparts a phase difference θ1 to an incident light beam is provided on an optically transparent substrate surface, using the substrate surface as a reference surface, and overlaps at least a part of the pattern of the first uneven pattern. By providing a second concavo-convex pattern that imparts a phase difference θ2 to the incident light beam, and imparting a total of four phase differences 0, θ1, θ2, (θ1+θ2) to the incident light beam, the incident light beam can be diffracted or / and a phase type diffuser plate characterized in that a desired diffusion characteristic is obtained by scattering.
光、現像又は漂白する第1工程と、第1のエッチングに
より該基板面上に第1凹凸パターンを形成し、その後該
基板面上に残存した感光体を除去する第2工程と、該基
板面上に感光体を形成し、該第1凹凸パターンのパター
ン模様の少なくとも一部に重なり合うように所定のパタ
ーンを配置し、該パターンを露光、現像又は漂白する第
3工程と第1のエッチングとは異ったエッチング量を有
する第2のエッチングにより該基板面上に第2凹凸パタ
ーンを形成する第4工程を介して入射光束に対して全体
として異った4つの位相差を付与することにより入射光
束を回折又は/及び散乱させて所望の拡散特性を得たこ
とを特徴とする位相型拡散板の製造方法。(2) A first step of forming a photoreceptor on the substrate surface, exposing, developing or bleaching a predetermined pattern, and forming a first uneven pattern on the substrate surface by first etching, and then forming a first uneven pattern on the substrate surface. a second step of removing the photoreceptor remaining on the substrate, forming a photoreceptor on the substrate surface, arranging a predetermined pattern so as to overlap at least a part of the pattern of the first uneven pattern; and a fourth step of forming a second uneven pattern on the substrate surface by a second etching having an etching amount different from the first etching. 1. A method for manufacturing a phase type diffuser plate, characterized in that a desired diffusion characteristic is obtained by diffracting and/or scattering an incident light beam by imparting four different phase differences as a whole.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16790789A JPH0331802A (en) | 1989-06-28 | 1989-06-28 | Phase type diffuser plate and its manufacturing method |
| US07/482,840 US5189454A (en) | 1989-02-28 | 1990-02-21 | Phase-type focusing screen and process for manufacturing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16790789A JPH0331802A (en) | 1989-06-28 | 1989-06-28 | Phase type diffuser plate and its manufacturing method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0331802A true JPH0331802A (en) | 1991-02-12 |
Family
ID=15858260
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16790789A Pending JPH0331802A (en) | 1989-02-28 | 1989-06-28 | Phase type diffuser plate and its manufacturing method |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0331802A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005124400A1 (en) * | 2004-06-16 | 2005-12-29 | Nikon Corporation | Diffractive diffusion element and lighting device |
| JP2007192742A (en) * | 2006-01-20 | 2007-08-02 | Sii Nanotechnology Inc | Scanning probe microscope |
-
1989
- 1989-06-28 JP JP16790789A patent/JPH0331802A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2005124400A1 (en) * | 2004-06-16 | 2005-12-29 | Nikon Corporation | Diffractive diffusion element and lighting device |
| JP2007192742A (en) * | 2006-01-20 | 2007-08-02 | Sii Nanotechnology Inc | Scanning probe microscope |
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