JPH0336948U - - Google Patents

Info

Publication number
JPH0336948U
JPH0336948U JP9780489U JP9780489U JPH0336948U JP H0336948 U JPH0336948 U JP H0336948U JP 9780489 U JP9780489 U JP 9780489U JP 9780489 U JP9780489 U JP 9780489U JP H0336948 U JPH0336948 U JP H0336948U
Authority
JP
Japan
Prior art keywords
vial
hard mask
view
window
suction support
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9780489U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9780489U priority Critical patent/JPH0336948U/ja
Publication of JPH0336948U publication Critical patent/JPH0336948U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案装置を使用した検査装置の一部
を省略した平面図、第2図は瓶吸引支持機構部の
一部切欠正面図、第3図は瓶吸引支持ブロツクに
バイアル瓶を吸引支持している状態を示す一部切
欠正面図、第4図は同上バイアル瓶を解放した状
態の一部切欠正面図、第5図はバイアル瓶の底部
と稜辺部近傍のビリ状などの欠陥検出装置Aの一
部切欠正面図、第6図は同上スリツト光照射部材
の斜視図、第7図は同上ハードマスクの斜視図、
第8図はバイアル瓶胴部の破損、ビリ、口欠けビ
リなどの欠陥検出装置Bの一部切欠正面図、第9
図はケーキ部の破損、ビリ、乾燥不良、ゴミ、汚
れなどの欠陥検出装置Cの一部切欠正面図、第1
0図は同上スリツト光照射部材の斜視図、第11
図は同上検査状態の説明図、第12図はバイアル
瓶旋回装置Dの平面図、第13図は同上一部切欠
正面図、第14図は旋回中のバイアル瓶底部の破
損、ケーキの乾燥不良などの欠陥検出装置Eの一
部切欠正面図、第15図はバイアル瓶底のゴミ、
汚れなどの欠陥検出装置Fの一部切欠正面図、第
16図はバイアル瓶の底面図、第17図はケーキ
部を除く自転旋回中のバイアル瓶胴部の破損など
の欠陥検出装置Gの平面図、第18図は同上一部
切欠正面図、第19図は上記検出装置A,E,F
では不充分な欠陥を対象とする欠陥検出装置Hの
平面図、第20図は同上一部切欠正面図、第21
図はバイアル瓶の樹脂キヤツプの有無、アルミプ
ロテクターの巻締不良、および、バイアル瓶の首
、肩部のビリなどの欠陥検出装置Iの一部切欠正
面図、第22図は同上一部切欠正面図である。 A……欠陥検出装置、1……回転軸、2……円
盤、3……バイアル瓶、4……瓶吸引支持ブロツ
ク、17……バイアル瓶の供給機構、22……搬
出機構、28……ハードマスク、28a……垂直
辺、28b……水平辺、28c……窓ブロツク、
29……プリズム、30a……集光レンズ、30
……電子シヤツターカメラ、31……スリツト光
照射部材。
Fig. 1 is a partially omitted plan view of an inspection device using the device of the present invention, Fig. 2 is a partially cutaway front view of the bottle suction support mechanism, and Fig. 3 is a vial suctioned into a bottle suction support block. Fig. 4 is a partially cutaway front view showing the vial in the supported state; Fig. 5 is a partially cutaway front view showing the vial in the released state; Fig. 5 shows defects such as burrs on the bottom and near the edges of the vial. A partially cutaway front view of the detection device A, FIG. 6 is a perspective view of the slit light irradiation member as above, FIG. 7 is a perspective view of the hard mask as above,
Figure 8 is a partially cutaway front view of the device B for detecting defects such as damage to the vial body, rips, cracks, etc.
The figure is a partially cutaway front view of device C for detecting defects such as damage to the cake part, cracks, poor drying, dust, dirt, etc.
Figure 0 is a perspective view of the same slit light irradiation member, No. 11.
Figure 12 is a plan view of the vial rotating device D, Figure 13 is a partially cutaway front view of the same as the above, Figure 14 shows damage to the bottom of the vial during rotation, and defective drying of the cake. Fig. 15 is a partially cutaway front view of defect detection device E such as
A partially cutaway front view of the device F for detecting defects such as dirt, FIG. 16 is a bottom view of the vial, and FIG. 17 is a plane view of the device G for detecting defects such as damage to the body of the vial during rotation excluding the cake portion. Figure 18 is a partially cutaway front view of the same as above, and Figure 19 is the above detection device A, E, F.
FIG. 20 is a plan view of the defect detection device H for detecting insufficient defects; FIG.
The figure is a partially cutaway front view of the device I for detecting defects such as the presence or absence of a resin cap on a vial, poor tightening of the aluminum protector, and cracks in the neck and shoulder of the vial. Figure 22 is a partially cutaway front view of the same as above. It is a diagram. A... Defect detection device, 1... Rotating shaft, 2... Disc, 3... Vial, 4... Bottle suction support block, 17... Vial supply mechanism, 22... Carrying out mechanism, 28... Hard mask, 28a...vertical side, 28b...horizontal side, 28c...window block,
29... Prism, 30a... Condensing lens, 30
...Electronic shutter camera, 31...Slit light irradiation member.

Claims (1)

【実用新案登録請求の範囲】 一側にバイアル瓶の供給機構を、他側に搬出機
構を連設したバイアル瓶吸引支持搬送体の一側に
、上記バイアル瓶を所定の角度回転する旋回装置
を臨設するとともに、この旋回装置で区切られた
複数の検査ゾーンにバイアル瓶の各部欠陥検出装
置を配設したバイアル瓶の外観自動検査装置にお
いて、 上記検査ゾーンの全部、または、一部に対応す
る上記バイアル瓶吸引支持搬送体の一側に、バイ
アル瓶の凍乾ケーキ部の側面、および、底面が透
視しうる窓部を備えたハードマスクを配設すると
ともに、該ハードマスクの窓部の斜め下方に、こ
の窓部を通してバイアル瓶の側面、底面の画像を
取り込む電子シヤツターカメラを斜め上向きに配
設せしめ、更に、上記バイアル瓶吸引支持搬送体
の外側に、上記ハードマスク部を通過するバイア
ル瓶の上端部にスリツト光を照射するスリツト光
照射部材を配設せる欠陥検出装置Aを設けたこと
を特徴とするバイアル瓶の外観自動検査装置。
[Scope of Claim for Utility Model Registration] A rotating device for rotating the vial at a predetermined angle is provided on one side of the vial suction support and conveyance body, which has a vial supply mechanism on one side and a delivery mechanism on the other side. In an automatic vial visual inspection system that is temporarily installed and has defect detection devices for each part of the vial installed in multiple inspection zones separated by this rotating device, A hard mask equipped with a window through which the side surface and bottom of the freeze-dried cake part of the vial can be seen is provided on one side of the vial suction support carrier, and a hard mask is provided diagonally below the window of the hard mask. In addition, an electronic shutter camera that captures images of the side and bottom surfaces of the vial through this window is disposed diagonally upward, and furthermore, an electronic shutter camera that captures images of the side and bottom surfaces of the vial is placed diagonally upward, and the vial that passes through the hard mask section is placed on the outside of the vial suction support carrier. 1. An automatic appearance inspection device for vials, characterized in that a defect detection device A is provided in which a slit light irradiation member for irradiating slit light is disposed on the upper end of the vial.
JP9780489U 1989-08-21 1989-08-21 Pending JPH0336948U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9780489U JPH0336948U (en) 1989-08-21 1989-08-21

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9780489U JPH0336948U (en) 1989-08-21 1989-08-21

Publications (1)

Publication Number Publication Date
JPH0336948U true JPH0336948U (en) 1991-04-10

Family

ID=31646931

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9780489U Pending JPH0336948U (en) 1989-08-21 1989-08-21

Country Status (1)

Country Link
JP (1) JPH0336948U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5527917A (en) * 1978-08-17 1980-02-28 Hitachi Zosen Corp Method of detecting crack on bottle type body

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5527917A (en) * 1978-08-17 1980-02-28 Hitachi Zosen Corp Method of detecting crack on bottle type body

Similar Documents

Publication Publication Date Title
JPH0785061B2 (en) Foreign substance inspection device at the bottom of the transparent glass container
TW201834115A (en) Inspection system which can efficiently check the wear level of the wheels provided in the transport vehicle
HUP9801049A2 (en) Apparatus and method for inspecting of container
PT1636104E (en) Automated pallet inspection and repair
JPH0336948U (en)
JPH0336950U (en)
JPH0312776U (en)
JPH0336949U (en)
JP3241666B2 (en) Glass container defect inspection equipment
US3176842A (en) Inspecting hollow containers for line-over-finish defects
JPH0323560Y2 (en)
JPS59113707U (en) Mirror surface inspection device
JPS6447673A (en) Device for detecting start and stop of vehicle
JPS6252930U (en)
JPS6214727U (en)
JPH0452508A (en) Inspecting device of surface defect
JP3733360B2 (en) Inspection device, control method of inspection device, control program, and recording medium
JPS58108442A (en) Inspecting device for bottle
JPS63163454U (en)
JPS647317Y2 (en)
JPH10144744A (en) Tray for semiconductor wafer appearance inspection
JPS6431417A (en) Reduction projection aligner
JPS6415151U (en)
JPS61195458U (en)
JPH0441284Y2 (en)