JPH0338523B2 - - Google Patents
Info
- Publication number
- JPH0338523B2 JPH0338523B2 JP6458284A JP6458284A JPH0338523B2 JP H0338523 B2 JPH0338523 B2 JP H0338523B2 JP 6458284 A JP6458284 A JP 6458284A JP 6458284 A JP6458284 A JP 6458284A JP H0338523 B2 JPH0338523 B2 JP H0338523B2
- Authority
- JP
- Japan
- Prior art keywords
- line
- displacement meter
- optical displacement
- coordinates
- measurement surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Description
【発明の詳細な説明】
〔発明の技術分野〕
本発明は、非接触方式で、光変位計を用いた三
次元座標自動計測方法に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a non-contact method for automatically measuring three-dimensional coordinates using an optical displacement meter.
従来、この種の計測は、第1図に示す方法で行
なわれていた。図において1はリニア・スケール
が挿着されたX、Y、Zの直交三軸移動機構、2
はそのZ軸に取付けられた三次元接触センサ、3
はそのセンサにおいて計測表面にタツチするボー
ル・プローブで、4は計測される自由曲面、5は
自由曲面4上に敷れた線である。
Conventionally, this type of measurement has been carried out by the method shown in FIG. In the figure, 1 is an orthogonal three-axis movement mechanism of X, Y, and Z in which a linear scale is inserted, and 2
is a three-dimensional contact sensor attached to its Z axis, 3
is a ball probe that touches the measurement surface in the sensor, 4 is the free-form surface to be measured, and 5 is a line laid on the free-form surface 4.
次に動作について説明する。接触式センサのプ
ローブ部3を計測しようとする計測面4上の線5
にもつていき、この線に接触させ、この瞬間プロ
ーブは接触したという事で信号を発生する。この
信号で直交三軸に取付けられたリニア・スケール
の座標データをサンプルする。このように、線上
の座標を計測する時、プローブの先端を人手で線
上に接触させて計測する。 Next, the operation will be explained. A line 5 on the measurement surface 4 on which the probe part 3 of the contact sensor is to be measured
The probe also touches this line, and at this moment the probe generates a signal as it makes contact. Using this signal, sample the coordinate data of the linear scale installed on three orthogonal axes. In this way, when measuring coordinates on a line, the tip of the probe is manually brought into contact with the line.
従来の接触方式の三次元座標計測方法は以上の
ようになされているので、計測対象物上の線上に
人が手でプローブ部を持つていき計測するため、
多大な時間と労力を用し、対象の線が複雑な曲面
を描けば描く程、作業は大変なものとなつてい
た。 The conventional contact-type three-dimensional coordinate measurement method is performed as described above, so a person manually holds the probe part on a line on the object to be measured.
It took a lot of time and effort, and the more complex the curved surface the target lines were drawn, the more difficult the task became.
この発明は、上記のような従来のものの欠点を
除去するためになされたもので、接触プローブの
代わりに、光量制御量が出力される光変位計を用
い、計測面とその上にある線状との光量差を感知
して、線状をウイビングしながら線上の三次元座
標を自動的に計測する装置を提供する事を目的と
している。
This invention was made in order to eliminate the drawbacks of the conventional ones as described above. Instead of a contact probe, an optical displacement meter that outputs a light amount control amount is used to measure the measurement surface and the linear shape on it. The purpose of the present invention is to provide a device that automatically measures three-dimensional coordinates on a line while weaving the line by sensing the difference in light intensity between the line and the line.
〔発明の実施例〕
以下、この発明の一実施例を図について説明す
る。第2図は本システムのブロツク図で、1はリ
ニア・スケールを挿着した直交三軸移動機構、6
は光量制御量が出力される非接触式の光変位計、
7は光変位計6の角度θ、β、γ軸を制御する回
転軸機構とその角度割出し機構、8は三軸移動機
構1のリニア・スケールの座標値と光変位計6の
値と機構7の角度検出値とから、光変位計6から
出されたレーザー光が被測定物面に作るスポツト
点の座標を演算する座標演算プロセツサ、9はこ
の座標値をフアイルしたり、全体の機構を監理す
る監理プロセツサ、10は現在の座標値から次に
動く座標値を演算し、これをリニア・スケールの
値や角度に変換する逆座標変換演算プロセツサ、
11はリニア・スケールの移動機構1及び回転軸
機構7を動作させるサーボ・アンプである。[Embodiment of the Invention] An embodiment of the invention will be described below with reference to the drawings. Figure 2 is a block diagram of this system, where 1 is an orthogonal three-axis movement mechanism with a linear scale inserted, 6
is a non-contact optical displacement meter that outputs the light amount control amount,
7 is a rotating shaft mechanism that controls the angles θ, β, and γ axes of the optical displacement meter 6 and its angle indexing mechanism; 8 is the coordinate value of the linear scale of the three-axis moving mechanism 1, the value of the optical displacement meter 6, and the mechanism A coordinate calculation processor 9 calculates the coordinates of the spot point created by the laser beam emitted from the optical displacement meter 6 on the surface of the object to be measured from the angle detection value 7; a supervising processor for supervising; 10 a reverse coordinate transformation calculation processor that calculates the next moving coordinate value from the current coordinate value and converts it into a linear scale value or angle;
Reference numeral 11 denotes a servo amplifier that operates the linear scale moving mechanism 1 and rotating shaft mechanism 7.
次に動作について説明する。第3図aに示すよ
うに、計測面4の上に面とは異なる材質の線5が
あり、光変位計6が矢印方向に移動してこの線を
光変位計6が横切る時、光変位計6のレーザー光
12が計測面に作るスポツト点13からの反射光
が材質により異なるため、光変位計6から出力さ
れる光量制御量C0と変位量は第3図bに示すよ
うになる。変位量は、計測面と光変位計との距離
が同じであるため一定であるのに対し、光量制御
量は、線上部分で変化する。そこで、この光量制
御量を調べる事で、計測面のどこに線が存在する
か感知する事ができる。 Next, the operation will be explained. As shown in FIG. 3a, there is a line 5 made of a material different from the surface on the measurement surface 4, and when the optical displacement meter 6 moves in the direction of the arrow and crosses this line, the optical displacement Since the reflected light from the spot points 13 created by the six laser beams 12 on the measurement surface differs depending on the material, the light amount control amount C 0 and the displacement amount output from the optical displacement meter 6 are as shown in Figure 3b. . The amount of displacement is constant because the distance between the measurement surface and the optical displacement meter is the same, whereas the amount of light amount control changes on the line. Therefore, by examining this light amount control amount, it is possible to sense where the line exists on the measurement surface.
第4図は、計測面4の上に計測面と異なる材質
の線5が引かれている時、この線5の座標を計測
する時のレーザースポツト点13の移動を示した
ものである。線5をレーザースポツトを横切る
時、光変位計から出力される光量制御量が変化す
るので、この信号変化をつかまえて、レーザース
ポツト点13の移動角度を、X、Y、Zの直交軸
及び、交変位計の角度制御軸、θ、β軸を動かし
て、線に追従するように制御して、線の座標を計
測する。 FIG. 4 shows the movement of the laser spot point 13 when measuring the coordinates of a line 5 drawn on the measurement surface 4 made of a material different from that of the measurement surface. When the line 5 crosses the laser spot, the light quantity control amount output from the optical displacement meter changes, so by grasping this signal change, the moving angle of the laser spot point 13 can be adjusted along the X, Y, and Z orthogonal axes. The coordinates of the line are measured by moving the angle control axes, θ, and β axes of the displacement meter so that they follow the line.
以上のように、この発明によれば、光量制御量
が出力される非接触式変位計と、角度センサ、リ
ニア・センサ等の構成により三次元の自由曲線上
にある、材質の異なつた線の座標を自動的に、高
速で計測できる効果がある。
As described above, according to the present invention, the structure of a non-contact displacement meter that outputs a light amount control amount, an angle sensor, a linear sensor, etc. enables the detection of lines made of different materials on a three-dimensional free curve. This has the effect of automatically measuring coordinates at high speed.
第1図は従来の三次元計測システムを示すブロ
ツク図、第2図はこの発明の方法を適用するシス
テム構成の一実施例を示すブロツク図、第3図
a,bは光変位計から出力きれる信号を示す図、
第4図は光変位計のレーザースポツトの移動を示
した図である。
1……直交三軸移動機構、4……計測面、5…
…計測面上にある材質の異なる線、6……光変位
計、7……回転軸機構とその角度割出し機構、8
……座標演算プロセツサ、9……監理プロセツ
サ、10……逆座標演算プロセツサ、11……サ
ーボ・アンプ、12……光変位計のレーザー光、
13……レーザー・スポツト。なお、図中、同一
符号は同一又は相当部分を示す。
Fig. 1 is a block diagram showing a conventional three-dimensional measurement system, Fig. 2 is a block diagram showing an example of a system configuration to which the method of the present invention is applied, and Fig. 3 a and b are outputs from an optical displacement meter. Diagram showing the signal,
FIG. 4 is a diagram showing the movement of the laser spot of the optical displacement meter. 1...Orthogonal three-axis movement mechanism, 4...Measurement surface, 5...
... Lines made of different materials on the measurement surface, 6 ... Optical displacement meter, 7 ... Rotating shaft mechanism and its angle indexing mechanism, 8
... Coordinate calculation processor, 9 ... Supervision processor, 10 ... Inverse coordinate calculation processor, 11 ... Servo amplifier, 12 ... Laser light of optical displacement meter,
13... Laser spot. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.
Claims (1)
制御量が出力される非接触式変位計と、この光変
位計の姿勢を制御する角度制御機構を持つ三次元
計測方法において、計測面上に設定した線を追従
しながら該線の座標を計測する事を特徴とした三
次元自動計測方法。1 In a three-dimensional measurement method that has a movement mechanism for the three-axis orthogonal coordinates of X, Y, and Z, a non-contact displacement meter that outputs a light amount control amount, and an angle control mechanism that controls the attitude of this optical displacement meter, A three-dimensional automatic measurement method characterized by measuring the coordinates of a line set on a surface while following the line.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6458284A JPS60205307A (en) | 1984-03-30 | 1984-03-30 | Automatic three-dimensional measuring system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6458284A JPS60205307A (en) | 1984-03-30 | 1984-03-30 | Automatic three-dimensional measuring system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS60205307A JPS60205307A (en) | 1985-10-16 |
| JPH0338523B2 true JPH0338523B2 (en) | 1991-06-11 |
Family
ID=13262378
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6458284A Granted JPS60205307A (en) | 1984-03-30 | 1984-03-30 | Automatic three-dimensional measuring system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60205307A (en) |
-
1984
- 1984-03-30 JP JP6458284A patent/JPS60205307A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS60205307A (en) | 1985-10-16 |
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