JPH0338535B2 - - Google Patents
Info
- Publication number
- JPH0338535B2 JPH0338535B2 JP17690384A JP17690384A JPH0338535B2 JP H0338535 B2 JPH0338535 B2 JP H0338535B2 JP 17690384 A JP17690384 A JP 17690384A JP 17690384 A JP17690384 A JP 17690384A JP H0338535 B2 JPH0338535 B2 JP H0338535B2
- Authority
- JP
- Japan
- Prior art keywords
- value
- calibration
- temperature
- detector
- resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000011156 evaluation Methods 0.000 claims description 14
- 230000001419 dependent effect Effects 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 5
- 238000011088 calibration curve Methods 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000009529 body temperature measurement Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000001360 synchronised effect Effects 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000012432 intermediate storage Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
- G01K7/20—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer in a specially-adapted circuit, e.g. bridge circuit
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K17/00—Measuring quantity of heat
- G01K17/06—Measuring quantity of heat conveyed by flowing media, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device
- G01K17/08—Measuring quantity of heat conveyed by flowing media, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device based upon measurement of temperature difference or of a temperature
- G01K17/10—Measuring quantity of heat conveyed by flowing media, e.g. in heating systems e.g. the quantity of heat in a transporting medium, delivered to or consumed in an expenditure device based upon measurement of temperature difference or of a temperature between an inlet and an outlet point, combined with measurement of rate of flow of the medium if such, by integration during a certain time-interval
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Measuring Volume Flow (AREA)
- Measuring And Recording Apparatus For Diagnosis (AREA)
- Details Of Flowmeters (AREA)
Description
【発明の詳細な説明】
発明の関連する技術分野
本発明は、少なくとも１つの温度に依存する検
出器抵抗と、検出器抵抗の温度に依存する電圧降
下を処理する評価回路とを用いて温度値を測定す
る装置に関する。DETAILED DESCRIPTION OF THE INVENTION Related Field of the Invention The present invention uses at least one temperature-dependent detector resistor and an evaluation circuit to process the temperature-dependent voltage drop across the detector resistor to determine the temperature value. This invention relates to a device for measuring.
従来技術
この形式の公知の装置では暖房装置の供給流温
度と戻り流温度とが各々１つの温度に依存する抵
抗を用いて測定される。温度測定信号変換器が温
度と共に直線的に変化する電流信号を発生する。
この電流信号は負荷抵抗を介して伝達され、この
負荷抵抗から温度に比例する電圧降下が検出され
る。さらに流量用の電流信号が供給されるので、
第３の負荷抵抗において流量に比例する電圧降下
を検出することができる。これらの電圧降下は順
次マルチプレクサを介して評価回路に供給され、
そこでＡ−Ｄ変換された後に中間記憶される。記
憶されたデータ表から温度に依存して取出し可能
な温度係数を用いて、温度係数と流量と乗算する
ことによつて温度差を形成して、伝達された熱量
を積分により算出し且つ指示し且つ記憶しておく
ことができる。PRIOR ART In known devices of this type, the supply stream temperature and the return stream temperature of the heating device are each measured using a temperature-dependent resistance. A temperature measurement signal converter generates a current signal that varies linearly with temperature.
This current signal is transmitted through a load resistor from which a voltage drop proportional to temperature is detected. In addition, a current signal for flow rate is supplied, so
A voltage drop proportional to the flow rate can be detected at the third load resistance. These voltage drops are sequentially fed to the evaluation circuit via a multiplexer,
There, the data is subjected to A-D conversion and then intermediately stored. Using a temperature coefficient that can be retrieved depending on the temperature from a stored data table, the temperature difference is formed by multiplying the temperature coefficient by the flow rate, and the amount of heat transferred is calculated and indicated by integration. And it can be stored.
発明が解決しようとする問題点
検出器温度に比例する電流信号を送出すべき温
度測定信号変換器は極めてコストがかかる。また
調整も複雑である。なぜならこの形式の２つの測
定信号変換器では各々３つのポテンシオメータを
調整しなければならないからである。温度差の測
定結果には両温度測定信号変換器の許容偏差と負
荷抵抗の許容偏差とが含まれるので、小さな温度
差での測定結果に著しい誤差が生ずることがあ
る。Problems to be Solved by the Invention Temperature measurement signal converters, which are to deliver a current signal proportional to the detector temperature, are extremely expensive. Adjustment is also complicated. This is because two measuring signal converters of this type each require three potentiometers to be adjusted. Since the measurement result of the temperature difference includes the tolerance of both temperature measurement signal converters and the tolerance of the load resistance, a significant error may occur in the measurement result with a small temperature difference.
本発明の課題は、従来に比べて所望の温度を遥
かに僅かなコストで検出でき且つ調整が遥かに容
易な、冒頭に述べた形式の温度測定装置を提供す
ることにある。 The object of the invention is to provide a temperature measuring device of the type mentioned at the outset, which can detect a desired temperature at a much lower cost and is much easier to adjust than before.
問題点を解決するための手段
この課題は本発明によれば次のような構成によ
り解決される。即ち少なくとも１つの検出器抵抗
が２つの固定較正抵抗、即ち基準抵抗および差動
抵抗との直列接続にて共通の電流源に接続されて
おり、基準抵抗は、所定の低い温度のときに検出
器抵抗が示す最小較正値を有しており、また差抵
抗の差較正値は検出器抵抗が所定の高い温度のと
きに示す最大較正値を較正抵抗の直列接続が有す
るような大きさになつており、較正値記憶装置が
設けられており、較正抵抗のうちの少なくとも１
つないし複数の較正抵抗の直列接続において少な
くとも１つの較正電圧降下を検出可能であり、ま
た各検出器抵抗において１つの測定電圧降下を検
出可能であり、評価回路が実際温度値を少なくと
も１つの測定電圧降下から、少なくとも１つの目
盛値とこれに対応する較正電圧降下とから形成さ
れる較正曲線に基づいて検出する冒頭に述べた形
式の温度測定装置。Means for Solving the Problem This problem is solved by the following configuration according to the present invention. That is, at least one detector resistor is connected to a common current source in series with two fixed calibration resistors, namely a reference resistor and a differential resistor, the reference resistor being connected to a common current source at a predetermined low temperature. The resistor has a minimum calibrated value, and the differential calibrated value of the differential resistance is such that the series connection of the calibrated resistors has a maximum calibrated value that the detector resistance exhibits at a given high temperature. and a calibration value storage device is provided for at least one of the calibration resistors.
At least one calibrated voltage drop can be detected in the series connection of several calibration resistors and one measured voltage drop can be detected in each detector resistor, and the evaluation circuit can detect the actual temperature value in at least one measured value. A temperature measuring device of the type mentioned at the outset, which detects the voltage drop on the basis of a calibration curve formed from at least one scale value and a corresponding calibration voltage drop.
実施例
次に本発明の実施例を図面を用いて詳細に説明
する。Embodiments Next, embodiments of the present invention will be described in detail with reference to the drawings.
第１図によれば、温度に依存する実抵抗値Rf1
を有する供給流用検出器抵抗Ｆ１と、温度に依存
する実抵抗値Rf2を有する戻り流用検出器抵抗Ｆ
２とが２つの較正抵抗、即ち基準抵抗Ｇと差抵抗
Ｄとの直列接続にて共通の電流源１に接続されて
いる。直列接続回路を流れる電流Ｉは例えば１ｍ
Ａ±５％の値を有する。基準抵抗Ｇは所定の値、
即ち最小較正値Re1、例えば100Ω士0.01％を有す
る。差抵抗Ｄも所定の値、即ち差較正値Rd、例
えば50Ω±0.01％を有する。従つて較正抵抗の直
列接続Ｇ、Ｄは所定の抵抗値、即ち最大較正値
Re2（この場合150Ωとなる）を有する。検出器抵
抗Ｆ１およびＦ２はこの実施例の場合PT100抵抗
であり、従つて最小較正値Re1は検出器抵抗の０
℃のときの抵抗値に相当し、最大較正値Re2は
130℃のときの検出器抵抗の抵抗値に相当する。
電流Ｉが流れると、検出器抵抗Ｆ１およびＦ２に
おいて、測定電圧降下Vf1ないしVf2が検出され
る。較正抵抗ＧないしＤ、ないし較正抵抗の直列
回路において較正電圧降下Ve1ないしVdないし
Ve2が取出される。しかし動作中はこれらの較正
電圧降下のうちのせいぜい２つを検出しさえすれ
ばよい。残りの１つの較正電圧降下はこれらの２
つから算出することができる。 According to Figure 1, the temperature-dependent actual resistance R f1
a detector resistance F1 for the supply flow having a temperature-dependent real resistance R f2 and a detector resistance F1 for the return flow having a temperature-dependent actual resistance value R f2
2 are connected to a common current source 1 through a series connection of two calibration resistors, namely a reference resistor G and a differential resistor D. The current I flowing through the series connection circuit is, for example, 1 m.
It has a value of A±5%. The reference resistance G is a predetermined value,
That is, it has a minimum calibration value R e1 , for example 0.01% across 100Ω. The differential resistance D also has a predetermined value, ie a differential calibration value R d , for example 50Ω±0.01%. Therefore, the series connection G and D of calibration resistors has a predetermined resistance value, that is, the maximum calibration value.
It has R e2 (150Ω in this case). Detector resistances F1 and F2 are PT100 resistors in this example, so the minimum calibration value R e1 is 0 for the detector resistance.
It corresponds to the resistance value at °C, and the maximum calibration value R e2 is
Corresponds to the resistance value of the detector resistance at 130℃.
When a current I flows, a measured voltage drop V f1 or V f2 is detected across the detector resistors F1 and F2. Calibration voltage drop V e1 or V d in a series circuit of calibration resistors G or D or calibration resistors
V e2 is taken out. However, during operation, it is only necessary to detect at most two of these calibrated voltage drops. The remaining calibration voltage drop is these two
It can be calculated from one.
第２図に示すように、マルチプレクサ３の入力
側２に既述の較正電圧降下Ve1およびVe2と測定
電圧降下Vf1およびVf2、ならびに熱交換器を貫流
する際に生じる貫流電圧降下Vqとその較正に使
用される較正電圧降下Ve3とが加えられる。入力
側２は制御入力側４を介して供給されるアドレス
信号により順次呼出され、その際例えば測定電圧
降下Vf1，Vf2と貫流電圧降下Vqとが少なくとも
１秒に１度マルチプレクサ３の出力側５から取出
され、他の較正電圧降下Ve1，Ve2，Ve3は約10秒
ごとにマルチプレクサ３の出力側５から取出され
る。この出力側５は、場合によつては１つの図示
していない増幅器を介して、アナログ−デイジタ
ル変換器６（最も簡単な場合電圧制御発振器）に
接続されており、このＡ−Ｄ変換器はデイジタル
信号をホトカプラ７を介してマイクロプロセツサ
９の計算機回路８に送出する。マイクロプロセツ
サもマルチプレクサ３に対するアドレス信号を発
生し、このアドレス信号はマルチプレクサ３の制
御入力側４に別のホトカプラ１０を介して送出さ
れる。マイクロプロセツサ９は種々異なる記憶場
所、例えばマルチプレクサ３を介して供給される
デイジタル化された信号の中間記憶のための中間
記憶装置１１や、幾つかのまたはすべての較正値
Re1，Re2ないしRdが入力される入力側１３を有
する記憶装置１２などを有する。ホトカプラ７お
よび１０により、上記のような構造を有する評価
回路の入力段１４が、他の機器から電気的に分離
されている。マイクロプロセツサ９はさらに時間
基準発生器１５を有し、時間基準発生器には例え
ば極めて精密に動作する水晶が設けられている。 As shown in FIG. 2, the already mentioned calibrated voltage drops V e1 and V e2 and the measured voltage drops V f1 and V f2 are present on the input side 2 of the multiplexer 3, as well as the flow-through voltage drop V that occurs when the flow passes through the heat exchanger. q and the calibration voltage drop V e3 used for its calibration are added. The inputs 2 are sequentially addressed by address signals supplied via the control inputs 4, in which case, for example, the measured voltage drops V f1 , V f2 and the flow-through voltage drop V q are activated at least once every second at the output of the multiplexer 3. Other calibration voltage drops V e1 , V e2 , V e3 are taken from the output side 5 of the multiplexer 3 approximately every 10 seconds. This output 5 is connected, possibly via an amplifier not shown, to an analog-to-digital converter 6 (in the simplest case a voltage-controlled oscillator), which The digital signal is sent to the computer circuit 8 of the microprocessor 9 via the photocoupler 7. The microprocessor also generates an address signal for the multiplexer 3, which address signal is sent via a further optocoupler 10 to the control input 4 of the multiplexer 3. The microprocessor 9 has various storage locations, for example an intermediate storage 11 for intermediate storage of the digitized signals supplied via the multiplexer 3 and some or all calibration values.
It includes a storage device 12 having an input side 13 into which R e1 , R e2 to R d are input. By means of the photocouplers 7 and 10, the input stage 14 of the evaluation circuit having the structure described above is electrically isolated from other equipment. The microprocessor 9 furthermore has a time reference generator 15, which is provided, for example, with a very precisely operated crystal.
マイクロプロセツサ９の出力側１６には機器が
接続されており、この機器は２つの機械的カウン
タ１７および１８ならびに指示装置１９を備えて
いる。カウンタ１７は例えば連続的に流量を加算
し、カウンタ１８は熱量を加算する。指示装置１
９は切換スイツチ２０で種々異なる値に切換えら
れる。例えばこれらの値には、供給流の温度、戻
り流の温度、温度差、最低温度差、流量、流量の
目盛限界値、熱量等がある。 A device is connected to the output 16 of the microprocessor 9, which device comprises two mechanical counters 17 and 18 and an indicating device 19. For example, the counter 17 continuously adds up the flow rate, and the counter 18 adds up the amount of heat. Instructing device 1
9 can be switched to various different values by a changeover switch 20. For example, these values include supply stream temperature, return stream temperature, temperature difference, minimum temperature difference, flow rate, scale limit value of flow rate, amount of heat, etc.
別の出力側２１はデイジタル−アナログ変換器
２２に接続されており、このＤ−Ａ変換器の出力
側２３からはプログラマブル電流信号が送出さ
れ、この信号は例えば熱量、流量、供給流温度、
戻り流温度、または温度差に関している。出力電
流は例えば４〜20ｍＡの一定の電流信号により形
成できる。 A further output 21 is connected to a digital-to-analog converter 22, the output 23 of which provides a programmable current signal, which can e.g.
It concerns the return flow temperature, or temperature difference. The output current can be generated by a constant current signal of, for example, 4 to 20 mA.
マイクロプロセツサ９のさらに別の出力側２４
は複数のホトカプラ２５，２６，２７，２８に接
続されている。ホトカプラ２５はカウンタ１７に
同期したパルス、即ち貫流流量に同期したパルス
を発生し、ホトカプラ２６はカウンタ１８に同期
した、即ち熱量に同期したパルスを発生する。ホ
トカプラ２７は例えば温度差が設定された最小温
度差よりも小さいときにアラーム信号を送出す
る。ホトカプラ２８は例えば検出器の故障や電流
断等に依存してエラー信号を発生する。 A further output 24 of the microprocessor 9
are connected to a plurality of photocouplers 25, 26, 27, and 28. The photocoupler 25 generates pulses synchronized with the counter 17, that is, pulses synchronized with the flow rate, and the photocoupler 26 generates pulses synchronized with the counter 18, that is, pulses synchronized with the amount of heat. The photocoupler 27 sends out an alarm signal, for example, when the temperature difference is smaller than a set minimum temperature difference. The photocoupler 28 generates an error signal depending on, for example, a detector failure or a current interruption.
複数の設定スイツチ２９は、熱量測定装置を
種々異なる用途に合わせて設定するのに用いられ
る。こうして例えば最小温度差またはＤ−Ａ変換
器２２における出力電流またはカウンタ１７およ
び１８に対する乗算係数を設定することができ
る。４つの切換スイツチ３０では、２進化10進数
に対して０〜9999m3／ｈの貫流流量目盛の限界領
域を設定することができる。 A plurality of setting switches 29 are used to set the calorimeter for different applications. In this way, for example, the minimum temperature difference or the output current in the D/A converter 22 or the multiplication factor for the counters 17 and 18 can be set. With the four changeover switches 30, it is possible to set the limit range of the flow rate scale from 0 to 9999 m 3 /h in binary coded decimal notation.
第３図は電圧降下Ｖに関する較正抵抗値Ｒの経
過を示す。図示の特性曲線Ｋは、較正値対Re1／
Ve1とRe2／Ve2とRd／Vdのうちの２つを使用す
るとき、これらの使用したデータに基き如何に表
わされるかを示す。さらに、測定電圧効果下Vf1
ないしVf2が分かつているときには、対応する検
出器抵抗Ｆ１ないしＦ２の抵抗値Rf1ないしRf2は
直ちに算出される。何らかの外的状況により、例
えば電流Ｉの変化により、特性曲線が変化して
も、検出器抵抗の抵抗値は正しい値に保たれる。 FIG. 3 shows the course of the calibrated resistance value R with respect to the voltage drop V. The illustrated characteristic curve K shows the calibration value versus R e1 /
When two of V e1 and R e2 /V e2 and R d /V d are used, how they are expressed based on the data used will be shown. Furthermore, under the measurement voltage effect V f1
When V f2 is known, the resistance value R f1 or R f2 of the corresponding detector resistance F1 or F2 is immediately calculated. Even if the characteristic curve changes due to some external circumstances, for example due to a change in the current I, the resistance value of the detector resistor remains at the correct value.
例えば第３図に示すデータから、特性曲線Ｋの
勾配に関して次のような式が得られる。 For example, from the data shown in FIG. 3, the following equation regarding the slope of the characteristic curve K can be obtained.
Rf1−Re／Vf1−Ve＝Rd／Vd (1)
この式から簡単な変形によつて特許請求の範囲第
２項記載の式
Rf1＝Re＋（Vf1−Ve）Rd／Vd
が得られる。 R f1 −R e /V f1 −V e =R d /V d (1) By simple modification of this formula, the formula R f1 =R e +(V f1 −V e ) R d /V d is obtained.
差形成の際にも次式が成立つ。 The following equation also holds true when forming a difference.
Rf1−Rf2／Vf1−Vf2＝Rd／Vd (2) この式から特許請求の範囲第４項記載の式 Rf1−Rf2＝（Vf1−Vf2）Rd／Vd が導出される。 R f1 −R f2 /V f1 −V f2 =R d /V d (2) From this formula, the formula recited in claim 4: R f1 −R f2 = (V f1 −V f2 )R d /V d is derived.
従つて差形成の際は単に特性曲線Ｋの勾配のみ
が問題であり、単に、差抵抗Ｄに注目さればよ
い。基準抵抗Ｇは省かれる。従つて差抵抗Ｄの許
容偏差を考慮しさえすればよく、この許容偏差に
ついても、測定電圧降下の差Vf1−Vf2の差抵抗に
おける較正電圧降下Vdに対する関係についての
み考慮しさえすればよい。 Therefore, when forming a difference, only the slope of the characteristic curve K matters, and it is only necessary to pay attention to the difference resistance D. The reference resistance G is omitted. Therefore, it is only necessary to take into account the tolerance of the differential resistance D, and regarding this tolerance only the relationship of the measured voltage drop difference V f1 −V f2 to the calibrated voltage drop V d across the differential resistance. good.
例えばPT100抵抗の場合に差較正値が50Ω±
0.01％で差領域が０〜130℃のとき、１℃は約380
ｍΩに相当する。差抵抗Ｄの全許容偏差は±５ｍ
Ωである。これは差が130℃のとき0.013℃に相当
する。故に差が１℃のときの精度は0.0001℃／℃
である。従つて温度差が極めて小さい場合でも誤
差は問題にならなくなる。 For example, in the case of PT100 resistor, the difference calibration value is 50Ω±
When the difference range is 0 to 130℃ at 0.01%, 1℃ is approximately 380℃.
Corresponds to mΩ. Total tolerance of differential resistance D is ±5m
It is Ω. This corresponds to 0.013°C when the difference is 130°C. Therefore, when the difference is 1℃, the accuracy is 0.0001℃/℃
It is. Therefore, even if the temperature difference is extremely small, errors will not be a problem.
以上述べた装置は温度測定の別の用途にも用い
ることができ、例えば海運装置および工業装置に
おけるプロセツサの監視・制御用にも用いること
ができる。 The device described above can also be used for other applications of temperature measurement, for example for monitoring and controlling processors in maritime and industrial equipment.
また別の温度に依存する抵抗、例えばニツケル
センサを用いてもよい。 Other temperature dependent resistors may also be used, for example nickel sensors.
発明の効果
本発明の装置では温度測定信号変換器が必要な
い。むしろ検出器温度に対する重要な尺度となる
信号は検出器抵抗での電圧降下として直接得られ
る。較正電圧降下と記憶された較正値とから形成
される較正曲線に基づいて換算することにより、
検出器抵抗の極めて正確な抵抗値が得られ、この
値から相応に正確に測定すべき温度が検出され
る。最初に、較正に用いられる固定抵抗の抵抗
値、即ち較正値を正確に記憶しておけば充分であ
る。こうすれば動作中装置が自動的に調整され
る。すべての抵抗に同じ電流が流れるので、殊
に、電圧降下をもたらす電流の変動は全く問題に
ならない。Effects of the Invention The device of the invention does not require a temperature measurement signal converter. Rather, a signal that is an important measure of the detector temperature is obtained directly as a voltage drop across the detector resistance. By converting based on a calibration curve formed from a calibrated voltage drop and a stored calibration value,
A very precise resistance value of the detector resistor is obtained, from which the temperature to be measured can be detected with corresponding precision. Initially, it is sufficient to accurately memorize the resistance value of the fixed resistor used for calibration, ie the calibration value. This will automatically adjust the device during operation. Since the same current flows through all resistors, in particular, current fluctuations that result in voltage drops are not a problem at all.
このようにして温度差、例えば供給流温度と戻
り流温度との差を求めようとする場合、極めて大
きな利点が得られる。つまり差形成の際に１つの
較正抵抗を完全にまたは事実上完全に無視するこ
とができるので、計算結果に他方の較正抵抗の許
容偏差しか影響せず、しかも全許容偏差の数分の
１の、つまりこの較正抵抗の全温度範囲に対する
温度差の比での偏差しか影響しない。 Significant advantages are obtained in this way when determining the temperature difference, for example the difference between the supply stream temperature and the return stream temperature. This means that one calibration resistor can be completely or virtually completely ignored during the difference formation, so that only the tolerance of the other calibration resistor influences the calculation result, and only a fraction of the total tolerance. , that is, only the deviation in the ratio of the temperature difference over the entire temperature range of this calibration resistor affects.
特許請求の範囲第２項記載の構成により、検出
器抵抗の実抵抗値を３つの測定された電圧降下と
２つの記憶された較正値とから得ることができ
る。このようにして得られた実抵抗値から通常の
方法で検出器抵抗の温度を算出でき、これは検出
器温度と検出器抵抗との間に直線的関係がなくて
も行なえる。 With the arrangement according to claim 2, the actual resistance value of the detector resistance can be obtained from three measured voltage drops and two stored calibration values. The temperature of the detector resistance can be calculated in the usual way from the actual resistance value thus obtained, and this can be done even if there is no linear relationship between the detector temperature and the detector resistance.
従つて少なくとも１つの検出器抵抗を、その抵
抗値が温度の自乗に依存するPT100抵抗により構
成することができる。 The at least one detector resistor can therefore be constituted by a PT100 resistor whose resistance value depends on the square of the temperature.
簡単には特許請求の範囲第４項記載の構成で充
分である。実際の検出器抵抗の抵抗値の差を形成
するので、換算は較正値とこれに対応する較正電
圧降下またはその等価量のみ用いて行なえばよ
い。このような簡易化は、検出器抵抗と温度とが
互いに直線的に依存するときかまたはこの直線性
からのずれが殊に温度差の小さいときはほとんど
問題にならないときに、可能である。 Simply speaking, the configuration described in claim 4 is sufficient. Since it forms the difference in the resistance value of the actual detector resistance, the conversion need only be performed using the calibration value and the corresponding calibration voltage drop or its equivalent. Such a simplification is possible when detector resistance and temperature are linearly dependent on each other or when deviations from this linearity are of little concern, especially at small temperature differences.
特許請求の範囲第５項記載の構成により、測定
された電圧降下を直接且つ簡単な方法で評価回路
に供給することができる。 The arrangement according to claim 5 makes it possible to supply the measured voltage drop to the evaluation circuit directly and in a simple manner.
第１図は較正抵抗と検出器抵抗との直列接続の
回路図、第２図は熱交換器中で伝達された熱量を
測定する装置のための評価回路のブロツク回路
図、第３図は較正曲線図である。
Ｆ１，Ｆ２……検出器抵抗、Ｇ……基準抵抗、
Ｄ……差抵抗、１……電流源、１２……較正値記
憶装置、１４……評価回路、Ｋ……較正曲線。
Figure 1 is a circuit diagram of the series connection of a calibration resistor and a detector resistor, Figure 2 is a block diagram of an evaluation circuit for a device for measuring the amount of heat transferred in a heat exchanger, and Figure 3 is a circuit diagram of a series connection of a calibration resistor and a detector resistor. It is a curve diagram. F1, F2...Detector resistance, G...Reference resistance,
D...Differential resistance, 1...Current source, 12...Calibration value storage device, 14...Evaluation circuit, K...Calibration curve.
Claims (1)
と、検出器抵抗の温度に依存する電圧降下を処理
する評価回路とを用いて温度値を測定する装置に
おいて、少なくとも１つの検出器抵抗Ｆ１，Ｆ２
が２つの固定較正抵抗、即ち基準抵抗Ｇおよび差
抵抗Ｄと共に直列接続にて共通の電流源１に接続
されており、基準抵抗は、所定の低い温度のとき
に検出器抵抗が示す最小較正値（Re1）を有して
おり、また差抵抗の差較正値（Rd）は、検出器
抵抗が所定の高い温度のときに示す最大較正値
（Re2）を較正抵抗の直列接続が有するような大
きさになつており、較正値記憶装置１２が設けら
れており、較正抵抗のうちの少なくとも１つない
しは複数の較正抵抗の直列接続において少なくと
も１つの較正電圧降下（Ve1，Ve2，Vd）を検出
可能であり、また検出器抵抗において各々１つの
測定電圧降下（Vf1，Vf2）を検出可能であり、評
価回路１４が実際温度値を少なくとも１つの測定
電圧降下から、少なくとも１つの較正値とこれに
対応する較正電圧降下とから形成される較正曲線
Ｋに基づいて検出することを特徴とする温度測定
装置。 ２ 評価回路１４が式Rf1＝Re＋（Vf1−Ve）Rd／Vd により算出された検出器抵抗Ｆ１の実際の抵抗値
から実際の検出器温度を検出し、ただしRf1は検
出器抵抗の実際の抵抗値Vf1は検出器抵抗での電
源電圧降下、Reは最小または最大較正値、Veは
対応する較正電圧降下、Rdは差較正値すなわち
最大較正値と最小較正値との差、Vdは差較正値
に対応する較正電圧降下ないし対応する較正電圧
降下の差、である特許請求の範囲第１項記載の温
度測定装置。 ３ 少なくとも１つの検出器抵抗Ｆ１，Ｆ２が
PT100抵抗である特許請求の範囲第２項記載の温
度測定装置。 ４ 評価回路１４が式Rf1−Rf2＝（Vf1−Vf2）Rd／Vd により算出された２つの検出器抵抗Ｆ１，Ｆ２の
抵抗値差から実際の温度差を検出し、ただし Rf1は第１の検出器抵抗の実際の抵抗値、 Vf1は第１の検出器抵抗の測定電圧降下、 Rf2は第２の検出器抵抗の実際の抵抗値、 Vf2は第２の検出器抵抗の測定電圧降下、 Rdは差較正値ないし最大較正値と最小較正値
との差、 Vdは差較正値に対応する較正電圧降下ないし
較正電圧降下の差、 である特許請求の範囲第１項記載の温度測定抵
抗。 ５ 直列接続の抵抗Ｇ，Ｄ、Ｆ１，Ｆ２に設けら
れた電圧降下タツプが時間的に順次評価回路１４
のマルチプレクサ１３の入力側に接続され、さら
に評価回路がこの電圧降下用の中間記憶装置１１
を有する特許請求の範囲第１項から第４項までの
いずれかに記載の温度測定装置。 ６ 評価回路がＡ−Ｄ変換器とデイジタル計算回
路とを備えており、該デイジタル計算回路が、熱
交換装置の供給流温度と戻り流温度との間の差
と、測定された流量と、１つの温度に依存する温
度係数とから伝達された熱量を算出し、前記デイ
ジタル計算回路８がさらに検出器抵抗Ｆ１，Ｆ２
の実際の抵抗値の算出および温度値への換算も行
う特許請求の範囲第１項記載の温度測定装置。[Claims] 1. A device for measuring a temperature value using at least one temperature-dependent detector resistance and an evaluation circuit that processes a temperature-dependent voltage drop across the detector resistance, resistance F1, F2
is connected in series to a common current source 1 with two fixed calibration resistors, namely a reference resistor G and a differential resistor D, the reference resistor being the minimum calibrated value exhibited by the detector resistance at a given low temperature. (R e1 ), and the differential calibration value (R d ) of the differential resistance is such that the series connection of the calibration resistors has the maximum calibration value (R e2 ) that the detector resistance exhibits when it is at a predetermined high temperature. A calibration value storage device 12 is provided and at least one calibration voltage drop (V e1 , V e2 , V d ) and one measured voltage drop (V f1 , V f2 ) in each case across the detector resistance, the evaluation circuit 14 determines the actual temperature value from at least one measured voltage drop. A temperature measuring device characterized in that detection is based on a calibration curve K formed from at least one calibration value and a corresponding calibration voltage drop. 2. The evaluation circuit 14 detects the actual detector temperature from the actual resistance value of the detector resistor F1 calculated by the formula R f1 = R e + (V f1 − V e ) R d /V d , where R f1 is the actual resistance of the detector resistor, V f1 is the supply voltage drop across the detector resistor, R e is the minimum or maximum calibrated value, V e is the corresponding calibrated voltage drop, and R d is the difference or maximum calibrated value. 2. The temperature measuring device according to claim 1, wherein the difference from the minimum calibration value, Vd , is a calibration voltage drop corresponding to the differential calibration value or a difference between the corresponding calibration voltage drops. 3 At least one detector resistor F1, F2 is
The temperature measuring device according to claim 2, which is a PT100 resistor. 4. The evaluation circuit 14 detects the actual temperature difference from the resistance value difference between the two detector resistors F1 and F2 calculated by the formula R f1 - R f2 = (V f1 - V f2 ) R d /V d , but R f1 is the actual resistance value of the first detector resistor, V f1 is the measured voltage drop across the first detector resistor, R f2 is the actual resistance value of the second detector resistor, V f2 is the actual resistance value of the second detector resistor, The measured voltage drop across the detector resistance, R d is the difference between the differential calibration value or the maximum calibration value and the minimum calibration value, and V d is the calibration voltage drop or the difference between the calibration voltage drops corresponding to the differential calibration value. Temperature measuring resistor according to range 1. 5 The voltage drop taps provided on the series-connected resistors G, D, F1, and F2 are sequentially evaluated in time by the evaluation circuit 14.
The evaluation circuit is connected to the input side of the multiplexer 13 of
A temperature measuring device according to any one of claims 1 to 4. 6. The evaluation circuit comprises an analog-to-digital converter and a digital calculation circuit, the digital calculation circuit determining the difference between the supply stream temperature and the return stream temperature of the heat exchanger, the measured flow rate, and 1 The digital calculation circuit 8 further calculates the amount of heat transferred from the temperature coefficient that depends on the two temperatures, and the digital calculation circuit 8 further calculates the amount of heat transferred from the
2. The temperature measuring device according to claim 1, which also calculates an actual resistance value and converts it into a temperature value.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19833330915 DE3330915C2 (en) | 1983-08-27 | 1983-08-27 | Device for determining a temperature value by means of at least one temperature-dependent sensor resistor |
| DE3330915.9 | 1983-08-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS6071925A JPS6071925A (en) | 1985-04-23 |
| JPH0338535B2 true JPH0338535B2 (en) | 1991-06-11 |
Family
ID=6207574
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP17690384A Granted JPS6071925A (en) | 1983-08-27 | 1984-08-27 | Temperature measuring device |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JPS6071925A (en) |
| CA (1) | CA1213672A (en) |
| DE (1) | DE3330915C2 (en) |
| DK (1) | DK163610C (en) |
| SE (1) | SE8403843L (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3808475A1 (en) * | 1988-03-14 | 1989-10-19 | Friedhelm Meyer | Method and device to measure a temperature |
| DE19637561C1 (en) * | 1996-09-14 | 1998-02-26 | Dienes Apparatebau Gmbh | Sensorless temperature control of a heating device |
| FR2874692B1 (en) * | 2004-08-27 | 2006-10-13 | Actaris Sas Soc Par Actions Si | DEVICE FOR MEASURING TEMPERATURE IN A THERMAL ENERGY COUNTER |
| DE102005029319A1 (en) * | 2005-06-24 | 2006-12-28 | Abb Patent Gmbh | Circuit arrangement, for determining temperature difference between two sensors, has digital microprocessor to determine temperature difference from digitized signals of analog-to-digital converter and provide temperature difference signal |
| JP5579097B2 (en) * | 2011-02-16 | 2014-08-27 | アズビル株式会社 | 4-wire RTD input circuit |
| DE102017130135A1 (en) | 2017-12-15 | 2019-06-19 | Endress + Hauser Wetzer Gmbh + Co. Kg | Condition monitoring of a temperature sensor |
| CN110220606B (en) * | 2019-06-24 | 2021-09-14 | 宁波华仪宁创智能科技有限公司 | Temperature measuring device with calibration function and method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DD206176A3 (en) * | 1981-04-22 | 1984-01-18 | METHOD AND CIRCUIT ARRANGEMENT FOR TEMPERATURE MEASUREMENT |
-
1983
- 1983-08-27 DE DE19833330915 patent/DE3330915C2/en not_active Expired
-
1984
- 1984-07-24 SE SE8403843A patent/SE8403843L/en not_active Application Discontinuation
- 1984-08-22 DK DK400784A patent/DK163610C/en not_active IP Right Cessation
- 1984-08-27 JP JP17690384A patent/JPS6071925A/en active Granted
- 1984-08-27 CA CA000461899A patent/CA1213672A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| SE8403843D0 (en) | 1984-07-24 |
| SE8403843L (en) | 1985-02-28 |
| JPS6071925A (en) | 1985-04-23 |
| DK163610C (en) | 1992-08-10 |
| DE3330915C2 (en) | 1986-09-04 |
| DK400784A (en) | 1985-02-28 |
| DK163610B (en) | 1992-03-16 |
| CA1213672A (en) | 1986-11-04 |
| DE3330915A1 (en) | 1985-03-14 |
| DK400784D0 (en) | 1984-08-22 |
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