JPH0339476A - Gas introducing device for cvd device - Google Patents

Gas introducing device for cvd device

Info

Publication number
JPH0339476A
JPH0339476A JP17408889A JP17408889A JPH0339476A JP H0339476 A JPH0339476 A JP H0339476A JP 17408889 A JP17408889 A JP 17408889A JP 17408889 A JP17408889 A JP 17408889A JP H0339476 A JPH0339476 A JP H0339476A
Authority
JP
Japan
Prior art keywords
gas
bubbler
film
temperature
reaction tube
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP17408889A
Other languages
Japanese (ja)
Inventor
Hitoshi Abe
仁志 阿部
Taiji Tsuruoka
鶴岡 泰治
Toshio Hayashi
俊雄 林
Yoichi Kato
洋一 加藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oki Electric Industry Co Ltd
Ulvac Inc
Original Assignee
Oki Electric Industry Co Ltd
Ulvac Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oki Electric Industry Co Ltd, Ulvac Inc filed Critical Oki Electric Industry Co Ltd
Priority to JP17408889A priority Critical patent/JPH0339476A/en
Publication of JPH0339476A publication Critical patent/JPH0339476A/en
Pending legal-status Critical Current

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  • Crystals, And After-Treatments Of Crystals (AREA)
  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To uniformly heat the gas introducing device even if there is some difference in heat capacity between respective parts by housing the gas introducing device provided with a bubbler for generating a film forming gas, a control valve, etc., in an oven kept at a fixed temp. CONSTITUTION:The gas introducing device 2 is connected to a film forming reaction tube 1 of the CVD device for growing the thin film of a compd. semiconductor or a ceramic high temp. superconductor. The device 2 is provided with the bubbler 3 for gasifying the solid or liq. having a low vapor pressure at ordinary temp. and an introduced gas pipe 5 for introducing the gas generated by the bubbler 3 into the reaction tube 1 through the control valve 4. The device 2 is housed in the temp.-controlled oven 6.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、化合物半導体やセラミック高温超伝導体の薄
膜を成長させるCVD装置のガス導入装置に関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a gas introduction device for a CVD apparatus for growing thin films of compound semiconductors and ceramic high temperature superconductors.

(従来の技術) 従来、化合物半導体やセラミック高温超伝導体の薄膜を
成長させるCVD装置では、凝縮性の成膜ガスを使用す
ることがあり、この場合、該CVD装置の成膜用反応管
へ成膜ガスを送るガス導入管、制御用のバルブ及び成膜
ガスを発生させるバブラーのガス導入装置を線ヒータな
どで加熱し、成膜ガスがガス導入管内で凝縮したり或い
は凝縮1;よってガス導入管が詰まることを防止してい
る。
(Prior art) Conventionally, CVD equipment for growing thin films of compound semiconductors and ceramic high-temperature superconductors sometimes uses a condensable film-forming gas, and in this case, it is necessary to use a condensable film-forming gas in the film-forming reaction tube of the CVD equipment. The gas introduction pipe that sends the film-forming gas, the control valve, and the gas introduction device of the bubbler that generates the film-forming gas are heated with a wire heater, etc., and the film-forming gas condenses in the gas introduction pipe, or condenses 1; Prevents the introduction tube from clogging.

(発明が解決しようとする課8) 前記のように、線ヒータなどをガス導入管やバルブに巻
き付けて加熱するように構成したものは、均一に加熱す
ることができず、部分的に温度の高いところと低いとこ
ろとが発生し、温度の低いところに成膜ガスが凝縮して
ガス導入管の詰まりを起す欠点があった。また成膜ガス
の種類によっては、温度を高くしすぎると分解を起すも
のがあり、この場合、分解が生ずると望む膜質が得られ
なくなる。更に、低温部を成膜ガスが凝縮しない温度に
すると、高温部では成膜ガスの分解反応が発生する不都
合があることが分った。
(Problem 8 to be solved by the invention) As mentioned above, a wire heater or the like that is configured to heat the gas inlet pipe or valve cannot be heated uniformly, and the temperature may partially rise. There were disadvantages in that high temperatures and low temperatures occurred, and the film-forming gas condensed in the low temperature areas, causing clogging of the gas introduction pipe. Furthermore, depending on the type of film-forming gas, some gases may decompose if the temperature is raised too high, and in this case, if decomposition occurs, the desired film quality cannot be obtained. Furthermore, it has been found that if the low temperature section is set to a temperature at which the film forming gas does not condense, a decomposition reaction of the film forming gas occurs in the high temperature section.

これを更に具体的に述べると、化合物半導体やセラミッ
ク高温超伝導体の薄膜を成長させるためのCVDには、
常温で液体か固体で、蒸気圧の低い、凝縮性の強い物質
が成膜ガスとして用いられ、例えばセラミック高温超伝
導体のCVDに用いられる81 s (hexaf l
 uoroacety l acetonato)co
pper (璽 )  :   Cu(DPM)z  
やTrls(dtptva+oy!Iethanato
)yttrtu@ : Y(DPM)3などの物質は、
殆どが常温で固体で融点或いは昇華点が100℃〜20
0℃のものが多く、また、これらの物質は 300℃〜
400℃で分解反応を起すものが多い。従って、非常に
狭い温度範囲で制御してこれらの物質の蒸気を成膜用反
応管に導入することが必要になる。成膜ガスの分解が起
った場合、導入ガス管内部に粉末として堆積したり、望
む化学組成の薄膜成長が得られなくなる。
To explain this more specifically, CVD for growing thin films of compound semiconductors and ceramic high-temperature superconductors includes:
Substances that are liquid or solid at room temperature, have low vapor pressure, and are highly condensable are used as film-forming gases, such as 81 s (hexaf l
uroacety l acetonato)co
pper (seal): Cu(DPM)z
and Trls(dtptva+oy!Iethanato
)yttrtu@: Substances such as Y(DPM)3 are
Most are solid at room temperature and have a melting point or sublimation point of 100°C to 20°C.
Many of these substances have a temperature of 0℃, and these substances also have a temperature of 300℃~
Many of them undergo decomposition reactions at 400°C. Therefore, it is necessary to introduce the vapors of these substances into the film-forming reaction tube while controlling the temperature within a very narrow range. If the film-forming gas decomposes, it may be deposited as powder inside the introducing gas pipe, or a thin film with the desired chemical composition cannot be grown.

固体や液体を気化させるためのバブラーは、気密性を得
るために通常ステンレスで作成され、その熱容量は非常
に大きい。また、空気圧作動型のバルブも比較的熱容量
は大きく、導入ガス管の熱容量とは大きな差がある。こ
れらの熱容量の違いのあるガス導入装置の構成部品を同
時に線ヒータにより加熱すると、その熱容量の差のため
に各構成部品間に於いて温度差が生じ、測定によればガ
ス導入管とバブラーとの間で100℃を越え、物質によ
ってはその蒸気がガス導入装置内で凝縮或いは分解を生
じて好ましくない。
Bubblers for vaporizing solids and liquids are usually made of stainless steel to ensure airtightness and have a very large heat capacity. Furthermore, pneumatically actuated valves also have a relatively large heat capacity, which is significantly different from the heat capacity of the inlet gas pipe. When these components of a gas introduction device with different heat capacities are heated simultaneously by a wire heater, a temperature difference occurs between each component due to the difference in heat capacity, and measurements show that the gas introduction tube and bubbler Depending on the substance, the vapor may condense or decompose within the gas introduction device, which is not preferable.

本発明は、こうした欠点や不都合を解決し、成膜ガスの
凝縮や分解を生じないように一定温度に保ち得るCVD
装置のガス導入装置を提供することを目的とするもので
ある。
The present invention solves these shortcomings and inconveniences by using a CVD method that can maintain a constant temperature without causing condensation or decomposition of the film-forming gas.
The object of the present invention is to provide a gas introduction device for the device.

(課題を解決するための手段) 本発明では、化合物半導体やセラミック高温超伝導体の
薄膜を成長させるCVD装置の成膜用反応管に、常温で
蒸気圧の低い固体や液体をガス化するバブラーと、該バ
ブラーで発生するガスを制御用のバルブを介して該成膜
用反応管へ導く導入ガス管とを備えたガス導入装置を接
続するようにしたものに於いて、該ガス導入装置を温度
制御されたオープン内に収めることにより、前記目的を
達成するようにした。前記成膜用反応管に複数のバブラ
ーを接続し、各バブラーを夫々独立して温度制御できる
オープンに収めることが可能であり、更に前記成膜用反
応管の入口部と、前記バブラーと、前記制御用のバルブ
及び導入ガス管の一部とを夫々独立したオープンに収め
て夫々に温度制御することも可能である。
(Means for Solving the Problems) In the present invention, a bubbler for gasifying solids and liquids with low vapor pressure at room temperature is installed in a film-forming reaction tube of a CVD apparatus for growing thin films of compound semiconductors and ceramic high-temperature superconductors. and an introduction gas pipe for guiding the gas generated in the bubbler to the film-forming reaction tube via a control valve. The above objective was achieved by housing the device in a temperature-controlled open space. A plurality of bubblers can be connected to the film-forming reaction tube, and each bubbler can be housed in an open space whose temperature can be controlled independently, and the inlet of the film-forming reaction tube, the bubbler, and the It is also possible to separately control the temperature of the control valve and part of the gas introduction pipe by placing them in separate openings.

(作 用) 例えばCu(DPM)zを使用してCVDによりセラミ
ック高温超伝導体の薄膜を成長させる場合、成膜用反応
管内に加熱した基板を用意し、そこにガス導入装置から
Cu(DPM) 2の蒸気を導入して行なわれるが、C
u(DPM) 2の蒸気を発生させるバブラー、導入ガ
ス管及び制御用のバルブがオープン内に収められている
ので、各部の熱容量に差があっても各部に大きな温度差
を生じないようほぼ均一に加熱することが出来る。実際
の測定では、最大30@以内の温度差しか発生せず、し
かもその温度差は時間と共に小さくなった。
(Function) For example, when growing a thin film of a ceramic high-temperature superconductor by CVD using Cu(DPM)z, a heated substrate is prepared in a film-forming reaction tube, and Cu(DPM) is injected into it from a gas introduction device. ) 2 steam is introduced, but C
The bubbler that generates the steam of u(DPM) 2, the inlet gas pipe, and the control valve are housed in an open space, so even if there are differences in the heat capacity of each part, the temperature is almost uniform so that there is no large difference in temperature between each part. It can be heated to In actual measurements, a maximum temperature difference of less than 30@ was observed, and the temperature difference became smaller over time.

(実施例) 本発明の実施例を別紙図面に基づき説明するに、図面に
於いて符号(1〉はCVD装置の成膜用反応管、(2〉
は該成膜用反応管(1)へ成膜ガスを導入するガス導入
装置を示す。該ガス導入装置(2)は、Cu(DPM)
2その他の原料物質のガスを発生させるバブラー〈3〉
と、該バブラー(3)で発生したガス(蒸気)を制御用
の空気圧作動型のバルブ(4a)や手動型のバルブ(4
b)等のバルブ(4〉を介在した導入ガス管(5)とで
構成され、これらの構成部品はオープン(6〉内に収め
られて恒温状態に加熱される。
(Example) An example of the present invention will be described based on the attached drawings.
1 shows a gas introduction device for introducing a film-forming gas into the film-forming reaction tube (1). The gas introduction device (2) is made of Cu (DPM)
2 Bubbler that generates gas from other raw materials <3>
The gas (steam) generated by the bubbler (3) is controlled by a pneumatically operated valve (4a) or a manual valve (4).
It consists of an inlet gas pipe (5) with a valve (4>) intervening, such as b), and these components are housed in an open space (6>) and heated to a constant temperature state.

該ガス導入装置(2)は、原料物質が1種類の場合、1
個のバブラー(3)が設けられるが、この場合バルブ(
4)及び導入ガス管(5)と共に1つのオープン(6)
に収め、該オープン(6〉の温度と該バブラー(3)内
の物質のガスを発生させるに適した温度に制御する。こ
れによって、ガス導入装置(2)の全体をガスが凝縮或
いは分解しない恒温状態に維持され、良好なCVD処理
を行なえる。
When there is only one type of raw material, the gas introduction device (2)
bubblers (3) are provided, in which case the valve (
4) and one open (6) along with the inlet gas pipe (5)
The temperature of the open (6) and the substance in the bubbler (3) are controlled to a temperature suitable for generating gas.This prevents the gas from condensing or decomposing the entire gas introduction device (2). It is maintained at constant temperature and can perform good CVD processing.

図示の例は4個のバブラー(3a) (3b) (3c
) (3d)を設け、1つのバブラーと1部のバルブ(
4〉及び導入ガス管〈5〉を1つの電気式のオープン(
6)に収め、残りのバルブ(4)及び導入ガス管(5)
を別のオープン(8e)に収めるようにしたもので、バ
ブラー (3a)には例えばY(DPM)! 、バブラ
ー(3b〉にはCU(DPM)2 、バブラー(ac)
 (3d)にはBa(DPM) 2、Ca(DPM)2
、B1 (CsHs) 3(7)イずれかを収め、オー
プン(8a) (6b)を130℃〜180℃の温度範
囲で制御し、オープン(Be) (6d)を260℃〜
300℃の温度範囲で制御する。具体的実施例では、Y
(DPM)sのバブラー(3a)のオープン(8a)を
125℃、Cu (DPM) 2のバブラー(3b)の
オープン(ab)を126℃、Ba(DPM) 2のバ
ブラー(3c〉のオープン(6c)を226 ”Cに温
度制御し、成膜用反応管(1)内の800℃に加熱され
たSrT10g (100)基板上にYB*zCuJt
−xの結晶成長を行い、Tc−88Kを示すセラミック
高温超伝導薄膜を形成した。
The example shown is four bubblers (3a) (3b) (3c
) (3d), one bubbler and one part valve (
4> and the inlet gas pipe <5> with one electric open (
6) and the remaining valves (4) and inlet gas pipes (5)
is placed in another open (8e), and the bubbler (3a) has, for example, Y (DPM)! , CU (DPM) 2 for bubbler (3b), bubbler (ac)
(3d) contains Ba (DPM) 2, Ca (DPM) 2
, B1 (CsHs) 3 (7), open (8a) (6b) is controlled in the temperature range of 130℃ to 180℃, open (Be) (6d) is controlled in the temperature range of 260℃ to
Controlled within a temperature range of 300°C. In specific embodiments, Y
(DPM) s bubbler (3a) open (8a) at 125℃, Cu (DPM) 2 bubbler (3b) open (ab) at 126℃, Ba (DPM) 2 bubbler (3c) open ( 6c) at 226"C, YB
-x crystal growth was performed to form a ceramic high temperature superconducting thin film exhibiting Tc-88K.

オープン(6e)には高温配管部を収め、バブラーから
輸送される有機金属化合物の成膜ガスの凝縮と分解を防
ぐように250℃〜300℃に温度制御される。
The high-temperature piping section is housed in the open (6e), and the temperature is controlled at 250°C to 300°C to prevent condensation and decomposition of the organometallic compound film-forming gas transported from the bubbler.

成膜用反応管(1)には長い入口部(la)が設けられ
るが該入口部(la)もオープン(6r)に収め、オー
プン(6e)と同じ温度に制御するようにした。
The film-forming reaction tube (1) was provided with a long inlet (la), but the inlet (la) was also kept open (6r) and controlled at the same temperature as the open (6e).

(DはArガス等のキャリヤガスのガス源、(8)は安
定性のある02ガス等の成膜ガスのガス源、(9)はロ
ータリーポンプ等の排気ポンプである。
(D is a gas source of carrier gas such as Ar gas, (8) is a gas source of stable film forming gas such as 02 gas, and (9) is an exhaust pump such as a rotary pump.

以上の実施例はセラミック高温超伝導体の成膜について
述べたが、凝縮性のガスを用いる他のCVD技術、例え
ば化合物反導体用の140cVDにも適用可能である。
Although the above embodiments have been described for the deposition of ceramic high temperature superconductors, they are also applicable to other CVD techniques using condensable gases, such as 140 cVD for compound anticonductors.

(発明の効果) 以上のように本発明によるときは1、CvD装置の成膜
用反応管へ成膜ガスを供給するガス導入装置をオープン
内に収めるようにしたので、凝縮性のガスを用いるCV
D処理に於いて非常に狭い温度範囲に成膜ガスの温度を
制御することが出来、ガス導入管の詰まりや成膜ガスの
分解反応を生ずることがなく、所望の膜質の薄膜を能率
良く作成出来る等の効果がある。
(Effects of the Invention) As described above, according to the present invention, 1. Since the gas introduction device that supplies film-forming gas to the film-forming reaction tube of the CvD apparatus is housed in the open space, condensable gas is used. CV
In the D process, the temperature of the film-forming gas can be controlled within a very narrow temperature range, preventing clogging of the gas introduction pipe or decomposition reaction of the film-forming gas, and efficiently producing a thin film with the desired quality. There are effects such as being able to do it.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明の実施例の線図ある。 (1)・・・成膜用反応管 (2)・・・ガス導入装置 (3) (3a) (3b) (3c) (3d)−バ
ブラー(4) (4a) (4b)・・・バルブ(5)
・・・導入ガス管 (6) (6a) (8b) (Be) (ad) (
Be) (60−オープン特 許 出 願 人 沖電気工業株式会社 外3名
The drawings are diagrams of embodiments of the invention. (1)... Reaction tube for film formation (2)... Gas introduction device (3) (3a) (3b) (3c) (3d) - Bubbler (4) (4a) (4b)... Valve (5)
...Introduction gas pipe (6) (6a) (8b) (Be) (ad) (
Be) (60-Open patent applicant Oki Electric Industry Co., Ltd. and 3 others)

Claims (3)

【特許請求の範囲】[Claims] 1.化合物半導体やセラミック高温超伝導体の薄膜を成
長させるCVD装置の成膜用反応管に、常温で蒸気圧の
低い固体や液体をガス化するバブラーと、該バブラーで
発生するガスを制御用のバルブを介して該成膜用反応管
へ導く導入ガス管とを備えたガス導入装置を接続するよ
うにしたものに於いて、該ガス導入装置を温度制御され
たオープン内に収めることを特徴とするCVD装置のガ
ス導入装置。
1. A bubbler that gasifies solids and liquids with low vapor pressure at room temperature and a valve that controls the gas generated by the bubbler are installed in the film-forming reaction tube of a CVD device that grows thin films of compound semiconductors and ceramic high-temperature superconductors. The gas introduction device is connected to an introduction gas pipe that leads to the film-forming reaction tube via the gas introduction device, and is characterized in that the gas introduction device is housed in a temperature-controlled opening. Gas introduction device for CVD equipment.
2.前記成膜用反応管に複数のバブラーを接続し、各バ
ブラーを夫々独立して温度制御できるオープンに収めた
ことを特徴とする請求項1に記載のCVD装置のガス導
入装置。
2. 2. The gas introduction device for a CVD apparatus according to claim 1, wherein a plurality of bubblers are connected to the film-forming reaction tube, and each bubbler is housed in an open structure whose temperature can be controlled independently.
3.前記成膜用反応管の入口部と、前記バブラーと、前
記制御用のバルブ及び導入ガス管の一部とを夫々独立し
たオープンに収めて夫々に温度制御することを特徴とす
る請求項1に記載のCVD装置のガス導入装置。
3. 2. The method according to claim 1, wherein the inlet portion of the film-forming reaction tube, the bubbler, the control valve, and a part of the introduction gas pipe are each placed in independent openings to control the temperature of each. A gas introduction device for the CVD apparatus described above.
JP17408889A 1989-07-07 1989-07-07 Gas introducing device for cvd device Pending JPH0339476A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17408889A JPH0339476A (en) 1989-07-07 1989-07-07 Gas introducing device for cvd device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17408889A JPH0339476A (en) 1989-07-07 1989-07-07 Gas introducing device for cvd device

Publications (1)

Publication Number Publication Date
JPH0339476A true JPH0339476A (en) 1991-02-20

Family

ID=15972442

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17408889A Pending JPH0339476A (en) 1989-07-07 1989-07-07 Gas introducing device for cvd device

Country Status (1)

Country Link
JP (1) JPH0339476A (en)

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