JPH0351369U - - Google Patents

Info

Publication number
JPH0351369U
JPH0351369U JP11033389U JP11033389U JPH0351369U JP H0351369 U JPH0351369 U JP H0351369U JP 11033389 U JP11033389 U JP 11033389U JP 11033389 U JP11033389 U JP 11033389U JP H0351369 U JPH0351369 U JP H0351369U
Authority
JP
Japan
Prior art keywords
probe
inspected
magnet
guide rail
moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11033389U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11033389U priority Critical patent/JPH0351369U/ja
Publication of JPH0351369U publication Critical patent/JPH0351369U/ja
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例の側面図、第2図
は同じく正面図、第3図は従来の探傷検査装置の
作用説明側面図であるる。 1……被検査体、2……探触子、3……マグネ
ツト、6……ガイドレール、7……探触子移動用
操作板。なお、各図中、同一符号は同一又は相当
部分を示す。
FIG. 1 is a side view of an embodiment of this invention, FIG. 2 is a front view of the same, and FIG. 3 is a side view illustrating the operation of a conventional flaw detection and inspection device. DESCRIPTION OF SYMBOLS 1...Object to be inspected, 2...Probe, 3...Magnet, 6...Guide rail, 7...Operation plate for moving the probe. In each figure, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 探触子と、この探触子を磁力により被検査体に
係合させるマグネツトと、前記探触子に連結され
可撓性薄板でなるガイドレールおよび探触子移動
用操作板とを備えてなる探傷検査装置。
It comprises a probe, a magnet for engaging the probe with the object to be inspected by magnetic force, a guide rail made of a flexible thin plate connected to the probe, and an operation plate for moving the probe. Flaw detection inspection equipment.
JP11033389U 1989-09-22 1989-09-22 Pending JPH0351369U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11033389U JPH0351369U (en) 1989-09-22 1989-09-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11033389U JPH0351369U (en) 1989-09-22 1989-09-22

Publications (1)

Publication Number Publication Date
JPH0351369U true JPH0351369U (en) 1991-05-20

Family

ID=31658871

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11033389U Pending JPH0351369U (en) 1989-09-22 1989-09-22

Country Status (1)

Country Link
JP (1) JPH0351369U (en)

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