JPH0351385U - - Google Patents
Info
- Publication number
- JPH0351385U JPH0351385U JP2513290U JP2513290U JPH0351385U JP H0351385 U JPH0351385 U JP H0351385U JP 2513290 U JP2513290 U JP 2513290U JP 2513290 U JP2513290 U JP 2513290U JP H0351385 U JPH0351385 U JP H0351385U
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- terminal
- burn
- ground terminal
- test device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図はこの考案の一実施例によるバーンイン
試験装置および被試験対象を示す回路図、第２図
は被試験対象の回路各部の電位、電流、電荷を示
す信号波形図、第３図は被試験対象の一例である
ＤＳＰを示すブロツク接続図である。
２０ａ……接地用端子、２３ａ……電源用端子
、３０……バーンイン試験装置、３１……基準電
圧源（電圧発生部）、３２……可変抵抗素子（電
圧発生部）、３４……制御器（電圧発生部）、３
５……タイマ（電圧発生部）。なお、図中、同一
符号は同一、又は相当部分を示す。
Fig. 1 is a circuit diagram showing a burn-in test device and an object under test according to an embodiment of the invention, Fig. 2 is a signal waveform diagram showing the potential, current, and charge of each part of the circuit under test, and Fig. 3 is a circuit diagram showing the burn-in test device and the object under test. 1 is a block connection diagram showing a DSP that is an example of a test target. FIG. 20a... Grounding terminal, 23a... Power supply terminal, 30... Burn-in test device, 31... Reference voltage source (voltage generation section), 32... Variable resistance element (voltage generation section), 34... Controller (voltage generator), 3
5...Timer (voltage generator). In addition, in the figures, the same reference numerals indicate the same or equivalent parts.
Claims (1)
、前記電圧を半導体集積回路の電源入力端子およ
び接地端子に供給する電源用端子および接地用端
子とを備えたバーンイン試験装置。 A burn-in test device comprising: a voltage generating section that generates a periodically fluctuating voltage; and a power supply terminal and a ground terminal that supply the voltage to a power input terminal and a ground terminal of a semiconductor integrated circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2513290U JPH0351385U (en) | 1989-03-24 | 1990-03-13 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3258489 | 1989-03-24 | ||
| JP2513290U JPH0351385U (en) | 1989-03-24 | 1990-03-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0351385U true JPH0351385U (en) | 1991-05-20 |
Family
ID=31717546
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2513290U Pending JPH0351385U (en) | 1989-03-24 | 1990-03-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0351385U (en) |
-
1990
- 1990-03-13 JP JP2513290U patent/JPH0351385U/ja active Pending
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