JPH0355435B2 - - Google Patents
Info
- Publication number
- JPH0355435B2 JPH0355435B2 JP62315845A JP31584587A JPH0355435B2 JP H0355435 B2 JPH0355435 B2 JP H0355435B2 JP 62315845 A JP62315845 A JP 62315845A JP 31584587 A JP31584587 A JP 31584587A JP H0355435 B2 JPH0355435 B2 JP H0355435B2
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- substrate
- gas
- diamond
- temperature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 claims description 44
- 239000007789 gas Substances 0.000 claims description 32
- 229910003460 diamond Inorganic materials 0.000 claims description 28
- 239000010432 diamond Substances 0.000 claims description 28
- 238000000034 method Methods 0.000 claims description 13
- 238000000151 deposition Methods 0.000 claims description 10
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims description 6
- 229930195733 hydrocarbon Natural products 0.000 claims description 5
- 150000002430 hydrocarbons Chemical class 0.000 claims description 5
- 150000002894 organic compounds Chemical class 0.000 claims description 5
- -1 In this method Substances 0.000 claims description 4
- 239000004215 Carbon black (E152) Substances 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- 239000003575 carbonaceous material Substances 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 238000001704 evaporation Methods 0.000 claims description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 10
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 5
- 229910052786 argon Inorganic materials 0.000 description 5
- 230000008021 deposition Effects 0.000 description 5
- 239000007787 solid Substances 0.000 description 5
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 4
- 229910052750 molybdenum Inorganic materials 0.000 description 4
- 239000011733 molybdenum Substances 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000033001 locomotion Effects 0.000 description 3
- 238000001556 precipitation Methods 0.000 description 3
- 239000003507 refrigerant Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000011017 operating method Methods 0.000 description 2
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 1
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 150000001412 amines Chemical class 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000001273 butane Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002091 carbon monoxide Inorganic materials 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- NEHMKBQYUWJMIP-NJFSPNSNSA-N chloro(114C)methane Chemical compound [14CH3]Cl NEHMKBQYUWJMIP-NJFSPNSNSA-N 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000000112 cooling gas Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 229910052736 halogen Inorganic materials 0.000 description 1
- 150000002367 halogens Chemical class 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 150000002431 hydrogen Chemical class 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- IJDNQMDRQITEOD-UHFFFAOYSA-N n-butane Chemical compound CCCC IJDNQMDRQITEOD-UHFFFAOYSA-N 0.000 description 1
- OFBQJSOFQDEBGM-UHFFFAOYSA-N n-pentane Natural products CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 229930192474 thiophene Natural products 0.000 description 1
- RXJKFRMDXUJTEX-UHFFFAOYSA-N triethylphosphine Chemical compound CCP(CC)CC RXJKFRMDXUJTEX-UHFFFAOYSA-N 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Carbon And Carbon Compounds (AREA)
Description
【発明の詳細な説明】
産業上の利用分野
本発明は高温プラズマを利用するダイヤモンド
の製造法に関する。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for producing diamond using high temperature plasma.
従来技術
本出願人はさきに、直流、低周波交流、高周
波、またはマイクロ波を用いて発生させたガス温
度1700K以上の高温プラズマがダイヤモンドの高
速合成に有効であることを見出した。しかし、高
温プラズマは高い気体温度を有するため、ダイヤ
モンドのような高温で不安定な物質を合成するた
めには、活性種濃度を下げることなく気体の温度
を下げることが必要である。Prior Art The present applicant has previously discovered that high-temperature plasma with a gas temperature of 1700 K or higher generated using direct current, low-frequency alternating current, high frequency, or microwave is effective for high-speed synthesis of diamond. However, since high-temperature plasma has a high gas temperature, in order to synthesize a substance that is unstable at high temperatures, such as diamond, it is necessary to lower the gas temperature without lowering the concentration of active species.
その温度を下げる方法として、これまで(1)水や
冷媒で冷やして低温にした固体表面に接触させる
方法。(2)冷ガスあるいは冷媒を吹き付ける方法。
(3)気体を断熱膨張させて冷却する方法。(4)磁場を
用いて電磁流体力学的作用により冷却する方法等
を見出した。しかし、(1),(2)の方法ではダイヤモ
ンドが成長する基体表面あるいは成長空間での温
度不均一が起こり易く、制御が難しい欠点があ
り、また(3)(4)の方法では排気装置や磁場発生装置
等の大型装置を必要とする欠点があつた。 The methods to lower the temperature so far have been (1) by bringing it into contact with a solid surface that has been cooled to a low temperature by cooling with water or a refrigerant; (2) Method of spraying cold gas or refrigerant.
(3) A method of cooling gas by adiabatically expanding it. (4) We discovered a method of cooling by magnetohydrodynamic action using a magnetic field. However, methods (1) and (2) have the drawback that temperature non-uniformity tends to occur on the substrate surface where diamond grows or in the growth space, making it difficult to control. It had the disadvantage of requiring large equipment such as a magnetic field generator.
発明の目的
本発明は従来方法における欠点を解消すべくな
されたもので、大型装置を必要としない簡便な方
法で、かつダイヤモンド析出基体の温度を均一な
適温に保持し得られ、ダイヤモンドを均一析出さ
せ得られる方法を提供するにある。Purpose of the Invention The present invention has been made to eliminate the drawbacks of conventional methods, and is a simple method that does not require large equipment, and can maintain the temperature of a diamond deposition substrate at a uniform and appropriate temperature, thereby allowing diamond to be deposited uniformly. We are here to provide you with a way to get it done.
発明の構成
本発明者は前記目的を達成すべく鋭意研究の結
果、高温プラズマを用いて基体上にダイヤモンド
を析出させる場合、基体またはプラズマトーチを
動かして基体とプラズマの相対的位置を変化させ
ると、容易に基体表面温度を均一に制御し得られ
ダイヤモンドを均一層で得られることを見出し
た。この知見に基づいて本発明を完成した。Composition of the Invention As a result of intensive research to achieve the above object, the present inventor has found that when depositing diamond on a substrate using high-temperature plasma, the relative position between the substrate and the plasma is changed by moving the substrate or the plasma torch. It has been found that it is possible to easily control the surface temperature of the substrate uniformly and obtain a uniform layer of diamond. The present invention was completed based on this knowledge.
本発明の要旨は、
炭化水素ガス、水素ガス及び不活性ガスから選
ばれた単独ガスまたは混合ガスに、放電によりガ
ス温度1700K以上の高温プラズマを発生させ、該
プラズマの中で有機化合物または炭素材を分解ま
たは蒸発させて得られる気体からダイヤモンドを
プラズマ中またはプラズマ尾炎部に設置された基
体上に析出させる方法において、基体またはプラ
ズマトーチを動かして基体とプラズマとの相対的
位置を変化させながらダイヤモンドを基体上に析
出させることを特徴とするダイヤモンドの製造
法、にある。 The gist of the present invention is to generate a high-temperature plasma with a gas temperature of 1700K or more by electric discharge in a single gas or a mixture of gases selected from hydrocarbon gas, hydrogen gas, and inert gas, and to generate organic compounds or carbon materials in the plasma. In this method, diamond is deposited from the gas obtained by decomposing or evaporating diamond into the plasma or onto a substrate placed in the plasma tail flame, while changing the relative position of the substrate and the plasma by moving the substrate or plasma torch. A method for producing diamond, characterized by depositing diamond on a substrate.
本発明において用いるプラズマは放電により得
られるガス温度が1700K以上の高温プラズマであ
ることが望ましく、これより低いと析出速度がお
そくなる。放電に用いる電源は、直流、低周波交
流、高周波、マイクロ波のいずれでも良く、また
有電極、無電極のいずれでも良い。 The plasma used in the present invention is preferably a high-temperature plasma with a gas temperature of 1700 K or higher obtained by discharge; if it is lower than this, the deposition rate will be slow. The power source used for discharge may be any one of direct current, low frequency alternating current, high frequency, and microwave, and may be electroded or electrodeless.
プラズマ発生用ガスとしては、炭化水素ガス、
アルゴン、ヘリウム等の不活性ガスあるいは水素
ガスを単独または混合ガスとして用いられる。 Hydrocarbon gas,
An inert gas such as argon or helium or hydrogen gas may be used alone or as a mixed gas.
不活性ガス、水素ガスをプラズマ発生用ガスと
して用いる場合は、炭素源として有機化合物ある
いは炭素材をプラズマ中に注入する。有機化合物
としては、プラズマ中で分解し、炭素を含むイオ
ン種、ラジカル種を生成し得るものであれば、ガ
ス状、液状、固体状のいずれでもよい。 When an inert gas or hydrogen gas is used as a plasma generating gas, an organic compound or carbon material is injected into the plasma as a carbon source. The organic compound may be gaseous, liquid, or solid, as long as it can be decomposed in plasma to generate carbon-containing ionic species or radical species.
例えば、メタン、エタン、プロパン、ブタン、
エチレン、ベンゼン等の炭化水素、ポリエチレ
ン、ポリプロピレン等の高分子物質、あるいはア
ルコール、アセトン、アミン、塩化メチル、チオ
フエン、トリエチルフオスフイン等の含酸素、含
窒素、含ハロゲン、含硫黄、含リン等の有機化合
物が挙げられる。 For example, methane, ethane, propane, butane,
Hydrocarbons such as ethylene and benzene, polymeric substances such as polyethylene and polypropylene, or oxygen-containing, nitrogen-containing, halogen-containing, sulfur-containing, phosphorus-containing substances such as alcohol, acetone, amines, methyl chloride, thiophene, triethylphosphine, etc. Examples include organic compounds.
また、水素ガスあるいは炭化水素をプラズマ中
に混合する場合には炭素源として一酸化炭素、二
酸化炭素を用いることができ、固体炭素源として
は黒鉛などが挙げられる。 Further, when hydrogen gas or hydrocarbon is mixed into the plasma, carbon monoxide or carbon dioxide can be used as a carbon source, and graphite or the like can be used as a solid carbon source.
プラズマのガス圧は10-4〜5×102気圧までの
範囲で用いられる。低い圧力ではダイヤモンドの
析出速度がおそく、高い圧力ては容器の取り扱い
に手数がかかる欠点が生ずる。 The plasma gas pressure used is in the range of 10 -4 to 5×10 2 atm. At low pressures, the rate of diamond precipitation is slow, and at high pressures, the disadvantage is that the container is difficult to handle.
基体を動かす方法としては、基体もしくは基体
を乗せたホルダーを回転させたり、あるいは往復
運転させることにより行うことができる。すなわ
ち、高温プラズマの温度分布を利用し、基体を高
温部と低温部の間、あるいはプラズマが当たる位
置と当たらない位置との間で動かし、その時の運
動速度、周期等により基体表面温度を制御し得ら
れる。これにより基体表面へのダイヤモンドの析
出を均一になし得られる。このような基体を動か
す代わりに、プラズマトーチを動かしても同様に
制御し得られる。 The base can be moved by rotating the base or a holder on which the base is mounted, or by reciprocating the base. In other words, the temperature distribution of high-temperature plasma is used to move the substrate between a high-temperature part and a low-temperature part, or between a position where the plasma hits and a position where it does not hit, and the surface temperature of the base is controlled by the speed of movement, period, etc. can get. This makes it possible to uniformly deposit diamond on the surface of the substrate. Similar control can be obtained by moving the plasma torch instead of moving such a substrate.
この基体を動かす動作はモーターなどの外部動
力で行うことができるが、ガス流によつても行う
こともできる。 This operation of moving the base body can be performed using external power such as a motor, but it can also be performed using a gas flow.
また、この動かす動作と共に例えば外部に電気
抵抗等の適当な負荷をつなぐことにより、流れの
エネルギーをモーターなどを通して外部に取り出
し、基体に当たる気体の温度を下げることもでき
る。この場合の取り出すエネルギー量制御はモー
ターとホルダーのギア比と負荷抵抗を変化させる
ことにより基体の運動速度とは独立に行うことが
できる。 Furthermore, by connecting an appropriate load such as an electric resistance to the outside along with this moving operation, the energy of the flow can be taken out to the outside through a motor or the like, and the temperature of the gas hitting the base can be lowered. In this case, the amount of energy taken out can be controlled independently of the movement speed of the base by changing the gear ratio of the motor and holder and the load resistance.
本発明の方法を実施する装置の図面に基づいて
説明する。第1図は高周波放電を、第2図は直流
放電を用いた場合の概要図である。 DESCRIPTION OF THE PREFERRED EMBODIMENTS An apparatus for carrying out the method of the present invention will be explained based on the drawings. FIG. 1 is a schematic diagram using high frequency discharge, and FIG. 2 is a schematic diagram using direct current discharge.
第1図において、1は高周波プラズマトーチ、
2は高周波電源、3は基体、3′は円板状の基体
ホルダーで外部からモーターで回転できるように
なつている。4はプラズマ、5は析出室、6は排
気装置、7はガス供給装置、8〜8″はガス流量
調節バルブを示す。 In FIG. 1, 1 is a high-frequency plasma torch;
2 is a high frequency power source, 3 is a base, and 3' is a disc-shaped base holder which can be rotated by a motor from the outside. 4 is a plasma, 5 is a deposition chamber, 6 is an exhaust device, 7 is a gas supply device, and 8 to 8'' are gas flow rate control valves.
操作手順は、まず排気装置6により析出室5及
びプラズマトーチ部を真空にした後、バルブ8′,
8″を通じて所定のプラズマ発生用ガスを供給し、
析出室5を所定の圧力とした後、ワークコイル1
3に電源2より電力を供給しプラズマを発生させ
る。このプラズマ中にバルブ8より原料ガス、あ
るいは固体・流体原料供給装置14より原料を供
給し、あらかじめ回転運動させておいた基体3上
にダイヤモンドを析出させる。この回転に代わ
り、基体ホルダーを往復運動もしくは二次元的な
運動をさせてもよい。 The operating procedure is to first evacuate the deposition chamber 5 and the plasma torch section using the exhaust device 6, then open the valves 8',
8″ to supply a predetermined plasma generation gas,
After setting the precipitation chamber 5 to a predetermined pressure, the work coil 1
3 from the power source 2 to generate plasma. A raw material gas is supplied into this plasma from the valve 8 or a raw material is supplied from the solid/fluid raw material supply device 14, and diamond is deposited on the substrate 3 which has been rotated in advance. Instead of this rotation, the substrate holder may be moved reciprocatingly or in a two-dimensional manner.
第2図において、21は直流プラズマトーチ、
22は直流電源、3″はスクリユー状の基体ホル
ダー、9は発電用モーター、9′は負荷抵抗で、
他は第1図と同様である。 In FIG. 2, 21 is a DC plasma torch;
22 is a DC power supply, 3'' is a screw-shaped base holder, 9 is a generator motor, 9' is a load resistor,
The rest is the same as in FIG.
操作手順は第1図の場合と同様にして(プラズ
マ発生電源が相違するが)プラズマの発生及び原
料ガスの分解を行わせ、基体3上にダイヤモンド
を析出させる。 The operating procedure is the same as that shown in FIG. 1 (although the plasma generation power source is different) to generate plasma and decompose the source gas, and deposit diamond on the substrate 3.
この場合は基体ホルダー3″をプラズマトーチ
のガス流により回転させ、また、負荷抵抗9′に
電気的エネルギーを取り出す。この負荷抵抗を整
合させることにより基板の温度を低下させる効果
を上げることができる。なお、この回転基体ホル
ダー3″にはスクリユー状に代え、軸流型の回転
子を用いることもできる。 In this case, the substrate holder 3'' is rotated by the gas flow of the plasma torch, and electrical energy is taken out to the load resistor 9'. By matching the load resistors, it is possible to increase the effect of lowering the temperature of the substrate. Incidentally, instead of the screw-like rotor, an axial-flow type rotor may be used for the rotary base holder 3''.
基板としては、モンブデン、ステンレスなどの
金属、シリコンなどの半導体、アルミナ等のセラ
ミツクス、及びダイヤモンド単結晶等が用いられ
る。基体温度は400〜1700℃であることが好まし
い。この温度の調整は、上記の本発明の方法に加
えて、冷媒、ガスによる基体、基体ホルダーの冷
却を併用してもよい。 As the substrate, metals such as monbuden and stainless steel, semiconductors such as silicon, ceramics such as alumina, single crystal diamond, etc. are used. The substrate temperature is preferably 400 to 1700°C. In addition to the method of the present invention described above, the temperature may be adjusted by cooling the substrate and substrate holder using a refrigerant or gas.
発明の効果
本発明の方法によると、基板温度の冷却を従来
におけるような大型装置を必要とせず、簡便な方
法で容易に制御し得られ、これにより基板上にダ
イヤモンドの膜厚を均一に析出し得られる。Effects of the Invention According to the method of the present invention, it is possible to easily control the cooling of the substrate temperature using a simple method without the need for large-scale equipment as in the conventional method, thereby depositing a diamond film with a uniform thickness on the substrate. can be obtained.
実施例 1
第1図に示す装置を用い、バルブ8より1.1
g/minのアルコール蒸気とアルゴン4/min
の混合ガス、バルブ8′よりアルゴン4/min、
バルブ8″よりアルゴン10/minと水素12/
minの混合ガスをプラズマトーチ1中に流し、1
気圧下にて周波数4MHz、真空管プレート入力
50kwの高周波により10分間放電させた。プラズ
マ温度は約8000Kであつた。70φの水冷基板ホル
ダーを1回転/秒で回転させ、基板ホルダー上の
6枚の20φのモリブデン基板上にダイヤモンドを
析出させた。基板温度は約900℃であつた。基板
上に厚さ8μmのダイヤモンド膜が得られた。生
成膜厚分布は基板ホルダーの回転運動の接線方向
で±5%、半径方向で±15%で、膜厚が均一性の
ものであつた。Example 1 Using the device shown in Figure 1, 1.1 from valve 8
g/min alcohol vapor and argon 4/min
mixed gas, argon 4/min from valve 8',
Argon 10/min and hydrogen 12/min from valve 8″
Flow min mixed gas into plasma torch 1,
Frequency 4MHz under atmospheric pressure, vacuum tube plate input
It was discharged for 10 minutes using a high frequency of 50kw. The plasma temperature was approximately 8000K. A 70φ water-cooled substrate holder was rotated at 1 rotation/second, and diamond was deposited on six 20φ molybdenum substrates on the substrate holder. The substrate temperature was approximately 900°C. A diamond film with a thickness of 8 μm was obtained on the substrate. The produced film thickness distribution was ±5% in the tangential direction of the rotational motion of the substrate holder and ±15% in the radial direction, and the film thickness was uniform.
比較例 1
実施例1と同条件で基板ホルダーを回転させな
いで行つたところ、モリブデン基板は融解してダ
イヤモンド膜が得られなかつた。そこでモリブデ
ン基板を基板ホルダーにビスで密着固定して回転
させないで行つたところ、基板温度は約1000℃
で、基板の中央で約30μm膜厚、基板周辺部で約
60μm膜厚の不均一な膜厚のダイヤモンドであつ
た。Comparative Example 1 When the test was carried out under the same conditions as in Example 1 without rotating the substrate holder, the molybdenum substrate was melted and no diamond film was obtained. Therefore, when we fixed the molybdenum substrate tightly to the substrate holder with screws and did not rotate it, the substrate temperature was approximately 1000℃.
The film thickness is about 30μm at the center of the board, and about 30μm at the periphery of the board.
The diamond had an uneven thickness of 60 μm.
実施例 2
第2図に示す装置を用い、バルブ8よりアルゴ
ン25/minと水素5/minの混合ガスを、バ
ルブ8′よりメタン1/minを流し、電源出力
20kwの放電を10分間させた。Example 2 Using the device shown in Figure 2, a mixed gas of 25/min of argon and 5/min of hydrogen was flowed through valve 8, and 1/min of methane was flowed through valve 8', and the power output was
A 20kw discharge was applied for 10 minutes.
外周径40mmφのプロペラ状回転基板ボルダー上
に固定した10mmφのモリブデン板上にダイヤモン
ド膜を形成させた。この際、反応中に析出室圧力
を約150Torrとし、負荷抵抗9′への出力を約
10Wとした。得られたダイヤモンド膜厚は約5μ
mの均一性のものであつた。 A diamond film was formed on a 10 mmφ molybdenum plate fixed on a propeller-shaped rotating substrate boulder with an outer diameter of 40 mmφ. At this time, the pressure in the precipitation chamber was set to about 150 Torr during the reaction, and the output to the load resistor 9' was set to about 150 Torr.
It was set to 10W. The resulting diamond film thickness is approximately 5μ
It had a uniformity of m.
図面は本発明方法を実施する装置の概要図で、
第1図は高周波放電を、第2図は直流放電を用い
てプラズマを発生させて、基板上にダイヤモンド
を析出させる装置の実施態様図である。
1:高周波プラズマトーチ、2:高周波発振
機、3:基体、3′,3″:基板ホルダー、4:プ
ラズマ、5:析出室、6:排気装置、7:ガス供
給装置、8,8′,8″:バルブ、9:発電機、
9′:負荷抵抗、13:ワークコイル、14:固
体、流体原料導入装置、21:直流プラズマトー
チ、22:直流電源。
The drawing is a schematic diagram of an apparatus for carrying out the method of the present invention.
FIG. 1 is an embodiment of an apparatus for depositing diamond on a substrate by generating plasma using high frequency discharge and FIG. 2 using direct current discharge. 1: High frequency plasma torch, 2: High frequency oscillator, 3: Substrate, 3', 3'': Substrate holder, 4: Plasma, 5: Deposition chamber, 6: Exhaust device, 7: Gas supply device, 8, 8', 8″: Valve, 9: Generator,
9': Load resistance, 13: Work coil, 14: Solid, fluid raw material introduction device, 21: DC plasma torch, 22: DC power source.
Claims (1)
選ばれた単独ガスまたは混合ガスに、放電により
ガス温度1700K以上の高温プラズマを発生させ、
該プラズマ中で有機化合物または炭素材を分解ま
たは蒸発させて得られる気体からダイヤモンドを
プラズマ中またはプラズマ尾炎部に設置された基
体上に析出させる方法において、基体またはプラ
ズマトーチを動かして基体とプラズマとの相対的
位置を変化させながらダイヤモンドを基体上に析
出させることを特徴とするダイヤモンドの製造
法。1 Generate high-temperature plasma with a gas temperature of 1700K or higher by electric discharge in a single gas or a mixed gas selected from hydrocarbon gas, hydrogen gas, and inert gas,
In this method, diamond is deposited from the gas obtained by decomposing or evaporating an organic compound or carbon material in the plasma onto a substrate placed in the plasma or in the plasma tail flame, in which the substrate or the plasma torch is moved to separate the substrate and the plasma. A diamond manufacturing method characterized by depositing diamond on a substrate while changing its relative position with the substrate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62315845A JPH01157498A (en) | 1987-12-14 | 1987-12-14 | Production of diamond with high temperature plasma |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62315845A JPH01157498A (en) | 1987-12-14 | 1987-12-14 | Production of diamond with high temperature plasma |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01157498A JPH01157498A (en) | 1989-06-20 |
| JPH0355435B2 true JPH0355435B2 (en) | 1991-08-23 |
Family
ID=18070274
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62315845A Granted JPH01157498A (en) | 1987-12-14 | 1987-12-14 | Production of diamond with high temperature plasma |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01157498A (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3350929B2 (en) * | 1991-05-10 | 2002-11-25 | セレステック,インコーポレーテッド | Plasma deposition method and apparatus |
| AT501408B1 (en) | 2004-12-07 | 2011-03-15 | Physikalisches Buero Steinmueller Gmbh | BIOLOGICAL SURFACES |
-
1987
- 1987-12-14 JP JP62315845A patent/JPH01157498A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPH01157498A (en) | 1989-06-20 |
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