JPH0355576U - - Google Patents

Info

Publication number
JPH0355576U
JPH0355576U JP11692489U JP11692489U JPH0355576U JP H0355576 U JPH0355576 U JP H0355576U JP 11692489 U JP11692489 U JP 11692489U JP 11692489 U JP11692489 U JP 11692489U JP H0355576 U JPH0355576 U JP H0355576U
Authority
JP
Japan
Prior art keywords
pair
package
microstrip line
lead
conductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11692489U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11692489U priority Critical patent/JPH0355576U/ja
Publication of JPH0355576U publication Critical patent/JPH0355576U/ja
Pending legal-status Critical Current

Links

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  • Testing Electric Properties And Detecting Electric Faults (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図イは本考案マイクロ波ICパツケージの
測定治具を測定器に実装した測定系の上面図、同
図ロは測定治具の分解斜視図、第2図イ,ロ,ハ
はICパツケージの各種マイクロ波電気的特性を
測定するときの内部配置図、第3図イは第1図の
導体ブロツク,上に載置固定される誘電体板
の上面図、同図ロは同図イのG−G断面図、第4
図は従来のマイクロ波ICパツケージの特性測定
系の上面図である。 2……ICパツケージ、3,4……リードピン
、7,8……コネクタ(ポート)、9,10,1
7,18……校正面、11……ネツトワーク・ア
ナライザ、19,20,411……セラミツク基
板、22,23……マイクロストリツプライン、
24,25……同軸マイクロストリツプライン変
換部、191,201,211……導体ブロツク
,,、192,202,212……壁部、
26……ねじ穴、27,28……誘電体板、29
,30……突起、31……取付穴、32,33…
…凹部、34,35……凸部、36,37,38
……細長穴、71,81……ジヨイント、311
……導電部。
Figure 1A is a top view of the measurement system in which the measurement jig for the microwave IC package of the present invention is mounted on a measuring instrument, Figure 2B is an exploded perspective view of the measurement jig, and Figure 2A, B, and C are for the IC package. Figure 3A is a top view of the dielectric plate placed and fixed on top of the conductor block in Figure 1, and Figure 3A is a top view of the dielectric plate placed and fixed on top of the conductor block in Figure 1. GG sectional view, 4th
The figure is a top view of a conventional microwave IC package characteristic measurement system. 2...IC package, 3, 4...Lead pin, 7,8...Connector (port), 9,10,1
7, 18... Calibration surface, 11... Network analyzer, 19, 20, 411... Ceramic substrate, 22, 23... Microstrip line,
24, 25... Coaxial microstripline conversion section, 191, 201, 211... Conductor block, 192, 202, 212... Wall section,
26...Screw hole, 27, 28...Dielectric plate, 29
, 30...Protrusion, 31...Mounting hole, 32, 33...
...Concave portion, 34, 35...Convex portion, 36, 37, 38
...Elongated hole, 71, 81 ...Joint, 311
...Conductive part.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ICパツケージの対向リードピン相互間でマイ
クロ波電気的特性を計測するための測定治具にお
いて、一対のネツトワーク・アナライザ端子から
導出した可撓性ある同軸ケーブルの開放端夫夫に
接続して対称配置され、一端を上記同軸ケーブル
の心線に接続固定したマイクロストリツプライン
が上面に露出し且つ三辺に浅い壁部により取囲ま
れた導体ブロツク一対と、双方向にリードピンを
導出した被測定ICパツケージが搭載され、上記
リードピンの導出方向に沿う対向辺に夫夫浅い壁
部が起立し且つ上記一対の導体ブロツクに接合挾
持される中央の導体ブロツクと、上記一対の導体
ブロツク夫夫の壁部に全面を覆い上記マイクロス
トリツプラインの他端と上記リードピンとを押圧
接触する如く固定する誘電体板とより成り、上記
導体ブロツク夫夫の相対位置を可変して連続的に
測定するようにしたことを特徴とするマイクロ波
ICパツケージの測定用治具。
In a measurement jig for measuring microwave electrical characteristics between opposing lead pins of an IC package, a pair of network analyzer terminals are connected to the open ends of a flexible coaxial cable and arranged symmetrically. A pair of conductor blocks with a microstrip line connected and fixed at one end to the core wire of the coaxial cable exposed on the top surface and surrounded by shallow walls on three sides, and an IC to be measured with lead pins led out in both directions. A central conductor block on which the package is mounted, shallow wall portions standing up on opposite sides along the lead-out direction of the lead pins and joined and clamped by the pair of conductor blocks, and a wall portion of the pair of conductor blocks. and a dielectric plate that covers the entire surface of the microstrip line and fixes the other end of the microstrip line and the lead pin so that they are in pressure contact with each other, and the relative position of the conductor block husbands is varied so that continuous measurement can be carried out. A jig for measuring a microwave IC package, characterized in that:
JP11692489U 1989-10-04 1989-10-04 Pending JPH0355576U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11692489U JPH0355576U (en) 1989-10-04 1989-10-04

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11692489U JPH0355576U (en) 1989-10-04 1989-10-04

Publications (1)

Publication Number Publication Date
JPH0355576U true JPH0355576U (en) 1991-05-29

Family

ID=31665179

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11692489U Pending JPH0355576U (en) 1989-10-04 1989-10-04

Country Status (1)

Country Link
JP (1) JPH0355576U (en)

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