JPH0357573A - Electron beam working machine - Google Patents

Electron beam working machine

Info

Publication number
JPH0357573A
JPH0357573A JP18895789A JP18895789A JPH0357573A JP H0357573 A JPH0357573 A JP H0357573A JP 18895789 A JP18895789 A JP 18895789A JP 18895789 A JP18895789 A JP 18895789A JP H0357573 A JPH0357573 A JP H0357573A
Authority
JP
Japan
Prior art keywords
electron beam
workpiece
work
work distance
welded
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18895789A
Other languages
Japanese (ja)
Inventor
Kiyuuzou Arakawa
及蔵 荒川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP18895789A priority Critical patent/JPH0357573A/en
Publication of JPH0357573A publication Critical patent/JPH0357573A/en
Pending legal-status Critical Current

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  • Welding Or Cutting Using Electron Beams (AREA)

Abstract

PURPOSE:To facilitate the work by correcting a work distance by utilizing a fact the spot diameter of an electron beam is varied by a variation of the work distance, and a detection waveform of a weld line detecting device becomes small suddenly except a prescribed work distance. CONSTITUTION:A memory contained driving device 15 drives an object 4 to be welded, and can vary a distance between an electron gun 2 and the object 4 to be welded, that is, a work distance. When a focus of an electron beam 3 is adjusted so that its spot diameter becomes smaller, it becomes sharp and the peak is large as a detection waveform 16c of an oscilloscope 13. In a middle position of welding, the focus of the electron beam 3 is shifted due to a set error of the object 4 to be welded and as for a detection waveform 17c, its peak becomes small. In this case, when the object 4 to be welded is moved so as to becomes as the detection waveform 16c, the work distance can be corrected to prescribed length. In such a way, both the detection of a weld line and the correction of the work distance can be executed, and the work can be executed easily.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は、電子ビーム加工機、特に電子ビームを用い
て大型の被加工物を加工する場合に加工線を検出できる
のみならず電子銃と被加工物の距離〈以下、ワークディ
スクンスと云う。)を一定に保てる電子ビーム加工機に
関するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention not only can detect machining lines when machining a large workpiece using an electron beam processing machine, particularly an electron beam, but also can detect machining lines using an electron gun. Distance of the workpiece (hereinafter referred to as work discance). ) is related to an electron beam processing machine that can maintain a constant value.

[従来の技術] 第4図は、例えば特開昭60 − 3985号公報に開
示された加工線例えば溶接線を検出する装置を持つ従来
の電子ビーム加工機としての電子ビーム溶接機を示ず概
略楕或図である。
[Prior Art] Fig. 4 schematically shows an electron beam welding machine as a conventional electron beam processing machine having a device for detecting processing lines, such as welding lines, as disclosed in, for example, Japanese Patent Laid-Open No. 60-3985. It is an elliptical diagram.

図において、(1)は一端例えば十端子がアースされた
高電圧電源、(2)はこの高電圧電源(1)の両端間に
接続された電子銃、(3)はこの電子銃(2)が発生し
た電子ビーム、(4)はこの電子ビーム(3)で加工さ
れる被加工物、この場合は被溶接物、(5)は電子銃〈
2〉と被溶接物(4)の間に配置されて電2 子銃(2〉が発生した電子ビーム(3)を被溶接物(4
)の表面に集束させるための集束コイル、(6)はこの
集束コイル(5)と被溶接物〈4)の間に配置されて電
子ビーム(3)が被溶接物(4〉の加工線例えば溶接線
〈7)を横切るように電子ビーム〈3〉を走査させるた
めの偏向コイル、(8)はこの偏向コイル〈6〉と被溶
接物(4)の間に配置されて射突電子ビーム(3)の反
射電子および二次電子(9)を捕捉するセンサとしての
コレクタ、(10)は信号発生器、(11)はこの信号
発生器(10)の出力測に接続された波形変換部、(I
2)はこの波形変換部(I1)と偏向コイル(6)の間
に接続された電流増幅器、R1はこの電流増幅器(12
)と偏向コイル(6)の間に接続された抵抗器、R2は
コレクタ(8)とアースの間に接続された抵抗器、(1
3)は抵抗器R1の各端にそれぞれ接続されている水平
軸偏向端子(13a)(13b)および抵抗器R2の各
端にそれぞれ接続されている垂直軸偏向端子(13c)
. (13d)を有してコレクタ(8)と一緒に溶接線
検出装置を構成するオシロスコープ、<14)はこのオ
シロスコープ(13)の画面上に現れる輝点てある。
In the figure, (1) is a high-voltage power supply with one end, for example, the ten terminal, grounded, (2) is an electron gun connected between both ends of this high-voltage power supply (1), and (3) is this electron gun (2). (4) is the workpiece to be processed by this electron beam (3), in this case the workpiece, and (5) is the electron gun.
The electron beam (3) generated by the electron gun (2) is placed between the object to be welded (4) and the object to be welded (4).
A focusing coil (6) is placed between the focusing coil (5) and the object to be welded (4) to direct the electron beam (3) onto the surface of the object to be welded (4), e.g. A deflection coil (8) for scanning the electron beam (3) across the welding line (7) is placed between the deflection coil (6) and the workpiece (4) to scan the electron beam (3) across the welding line (7). 3) a collector as a sensor that captures the reflected electrons and secondary electrons (9); (10) is a signal generator; (11) is a waveform converter connected to the output of the signal generator (10); (I
2) is a current amplifier connected between this waveform converter (I1) and the deflection coil (6), and R1 is this current amplifier (12).
) and the deflection coil (6), R2 is the resistor connected between the collector (8) and ground, (1
3) are horizontal axis deflection terminals (13a) (13b) connected to each end of resistor R1, and vertical axis deflection terminals (13c) connected to each end of resistor R2, respectively.
.. An oscilloscope having (13d) and constituting a welding line detection device together with the collector (8), <14) is a bright spot appearing on the screen of this oscilloscope (13).

従来の電子ビーム溶接機は上述したように構成されてお
り、以下にその動作を詳しく説明する。
A conventional electron beam welding machine is constructed as described above, and its operation will be explained in detail below.

第4図の電子ビーム溶接機において、信号発生器(10
)の出力は、波形変換部(11〉において後述する波形
変換が行われてから電流増幅器(12)に入力され、こ
\で所定の大きさに増幅された後、偏向コイル(6)に
供給されると共に、抵抗器R1の両端間の信号はオシロ
スコープ(13)の水平軸偏向端子(13a)および(
13b)に入力される。一方、集束コイル(5)により
被溶接物(4)の表面に集束された電子ビーム(3)は
偏向コイル(6〉によって被溶接物(4〉の溶接線(7
)を横切るように走査される。
In the electron beam welding machine shown in Fig. 4, a signal generator (10
) is input to the current amplifier (12) after being subjected to waveform conversion (described later) in the waveform conversion section (11>), where it is amplified to a predetermined size and then supplied to the deflection coil (6). At the same time, the signal across the resistor R1 is transmitted to the horizontal axis deflection terminal (13a) of the oscilloscope (13) and (
13b). On the other hand, the electron beam (3) focused on the surface of the workpiece (4) by the focusing coil (5) is transmitted to the welding line (7) of the workpiece (4) by the deflection coil (6>).
) is scanned across.

また、電子ビーム(3)の反射電子および二次電子(9
)はコレクタ(8)により捕捉され、抵抗器R2の両端
間の信号は、オシロスコープ(13)の垂直軸偏向端子
(13c)および(13d)に入力される。信号発生器
(10)は三角波状の信号を出力し、この信号は波形変
換部(11)で第5図に示されるような波形を変換され
る。第5図に示される波形は各電圧零点が時間tの間、
引き延ばされている。これにより電子ビーム(3)が偏
向されない点、すなわち電子ビーム(3)が溶接線(7
)の上にあるとき、オシロスコープ(13)では電圧波
形が第5図中の時間tの間停止するので、画面には輝点
(l4〉が生ずることとなる。従って、反射電子および
二次電子ク9)のコレクタ(8)への到達量が溶接線(
7)の位置において減少する特徴を利用し、輝点(14
〉と、コレクタク8)よりの信号減少のピーク点とを一
致させれば、位置決めが達成されることとなる。
In addition, the reflected electrons and secondary electrons (9) of the electron beam (3)
) is captured by the collector (8) and the signal across the resistor R2 is input to the vertical axis deflection terminals (13c) and (13d) of the oscilloscope (13). The signal generator (10) outputs a triangular waveform signal, and this signal is converted into a waveform as shown in FIG. 5 by a waveform converter (11). The waveform shown in FIG. 5 shows that each voltage zero point is for a time t,
It's stretched out. As a result, the point where the electron beam (3) is not deflected, that is, the point where the electron beam (3) is
), the voltage waveform on the oscilloscope (13) stops for the time t in Figure 5, and a bright spot (l4) appears on the screen.Therefore, reflected electrons and secondary electrons (9) reaching the collector (8) is the welding line (
Using the feature that decreases at the position of bright spot (14)
> and the peak point of the signal decrease from the collector 8), positioning will be achieved.

[発明が解決しようとする課題] 従来の電子ビーム加工機は、加工線を検出できるが、被
加工物が大型構造物である場合に被加工物を精度よくセ
ットしかつワークデイスタンスを一定に保つことができ
ないと云う問題点があった。
[Problem to be solved by the invention] Conventional electron beam processing machines can detect processing lines, but when the workpiece is a large structure, it is difficult to set the workpiece accurately and keep the work distance constant. The problem was that it could not be maintained.

この発明は、上述したような問題点を解決するためにな
されたもので、加工線を検出できるのみならずワークデ
ィスタンスを一定に保てる電子ビーム加工機を得ること
を目的とする。
This invention was made to solve the above-mentioned problems, and an object of the present invention is to provide an electron beam processing machine that can not only detect processing lines but also maintain a constant work distance.

[課題を解決するための手段コ 4 この発明に係る電子ビーム加工機は、電子ビーム発生手
段と被加工物の少なくとも一方を駆動するメモリ内蔵型
駆動装置を設けたものである。
[Means for Solving the Problems #4] The electron beam processing machine according to the present invention is provided with a memory built-in drive device that drives at least one of the electron beam generating means and the workpiece.

[作 用] この発明におけるワークディスクンスの補正は、ワーク
ディスクンスの変化で電子ビームのスポット径が変化し
、所定のワークディスタンス以外では溶接線検出装置の
検出波形が急激に小さくなることを利用し、ワークディ
スタンスを補正する。
[Function] The workpiece discance correction in this invention utilizes the fact that the spot diameter of the electron beam changes with a change in the workpiece discance, and the detection waveform of the welding line detection device suddenly becomes smaller outside of a predetermined work distance. and correct the work distance.

[実施例] 以下、この発明の一実施例を図について説明する。この
一実施例の概略構成を示す第1図において、(1)〜(
14)は従来例におけるものと全く同一である。(15
)は被溶接物(4)を駆動するメモリ内蔵型駆動装置で
あって、電子銃(2)と被溶接物(4)の距離すなわち
ワークディスタンスを変えることができる。
[Example] Hereinafter, an example of the present invention will be described with reference to the drawings. In FIG. 1 showing the schematic configuration of this embodiment, (1) to (
14) is exactly the same as that in the conventional example. (15
) is a memory built-in drive device that drives the workpiece (4), and can change the distance between the electron gun (2) and the workpiece (4), that is, the work distance.

この発明の電子ビーム加工機例えば電子ビーム溶接機は
上述したように構成されており、以下にその動作を詳し
く説明する。
The electron beam processing machine, such as the electron beam welding machine, of the present invention is constructed as described above, and its operation will be explained in detail below.

6 第2図は被溶接物と電子銃の関係を示す図であり、第3
図はワークディスタンスと検出波形の関係を示す図であ
る。第2図に符号(16b)で示すように大型の被溶接
物(4)は溶接方向に対して水平にセットすることは極
めて困難である。
6 Figure 2 is a diagram showing the relationship between the workpiece and the electron gun.
The figure is a diagram showing the relationship between work distance and detected waveform. As shown by the reference numeral (16b) in FIG. 2, it is extremely difficult to set a large workpiece (4) horizontally with respect to the welding direction.

溶接開始点は所定のワークディスタンス(16a)に調
整でき、また電子ビーム(3)の焦点を合わせてそのス
ポット径が最も小さくなるようにすると、オシロスコー
プ(13)の検出波形は(16c)のようにシャープで
ピークが大きい。一方、溶接中間位置では被溶接物(4
〉のセット誤差のためにワークデイスタンスは(17a
)と所定以外の長さになり、被溶接物(4)上では電子
ビーム(3)の焦点がずれてそのスポット径が大きくな
り、検出波形は(17c)のようにピークが小さくなる
The welding starting point can be adjusted to a predetermined work distance (16a), and if the electron beam (3) is focused so that its spot diameter is the smallest, the detected waveform of the oscilloscope (13) will be as shown in (16c). sharp and large peaks. On the other hand, at the welding intermediate position, the workpiece (4
> Due to the setting error, the work distance is (17a
), the electron beam (3) becomes defocused on the object to be welded (4), the spot diameter becomes large, and the detected waveform has a small peak as shown in (17c).

この時、検出波形が再び(16c)のようになるように
被溶接物(4〉を移動させれば、ワークディスタンスを
所定の長さに補正することができる。
At this time, the work distance can be corrected to a predetermined length by moving the workpiece (4>) so that the detected waveform becomes as shown in (16c) again.

(17b)が被溶接物(4)の補正された位置である。(17b) is the corrected position of the workpiece (4).

この補正量(被溶接物の移動量)を駆動装置(15〉7 が内蔵するメモリに予め記憶しておき溶接時にプレイバ
ックすることにより駆動装置(15)が常に所定のワー
クディスタンスを保つように被溶接物(4)を駆動しな
がら電子ビーム(3)で被溶接物(4)を溶接すること
が可能となる。
This correction amount (the amount of movement of the workpiece) is stored in advance in the memory built into the drive device (15〉7) and played back during welding so that the drive device (15) always maintains a predetermined work distance. It becomes possible to weld the workpiece (4) with the electron beam (3) while driving the workpiece (4).

なお、上記実施例はこの発明を電子ビーム溶接機に適用
した例について述べたが、この発明を溶接以外の例えば
切断などに適用しても良い。
In the above embodiment, the present invention is applied to an electron beam welding machine, but the present invention may also be applied to other applications other than welding, such as cutting.

また、上記実施例では被溶接物を駆動装置で移動させた
が、電子銃またはこれら両者を移動させても上記実施例
と同様の効果を奏する。更に、コレクタの代わりにX線
センサを用いても上記実施例と同様の効果を奏する。
Further, in the above embodiment, the object to be welded was moved by a drive device, but the same effect as in the above embodiment can be obtained even if the electron gun or both of them are moved. Furthermore, even if an X-ray sensor is used instead of the collector, the same effects as in the above embodiment can be obtained.

[発明の効果] 以上のように、この発明は、電子ビーム発生手段と被加
工物の少なくとも一方を駆動するメモリ内蔵型駆動装置
を備え、溶接線検出装置の検出波形がワークディスタン
スによって変わることを利用してワークディスタンスを
補正するので同一装置で溶接線の検出とワークディスタ
ンスの補正とができ装置を安価にできるとともに、大型
の被加工物を精度よくセットする必要がなくなり、作業
を大幅に容易にする効果を奏する。
[Effects of the Invention] As described above, the present invention includes a drive device with a built-in memory that drives at least one of the electron beam generating means and the workpiece, and detects that the detection waveform of the welding line detection device changes depending on the work distance. Since the work distance is corrected using the same device, the same device can detect the weld line and correct the work distance, making the device less expensive, and eliminating the need to accurately set large workpieces, making the work much easier. It has the effect of

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明による電子ビーム溶接機の一実施例を
示す概略構成図、第2図は被溶接物と電子銃の関係を示
す図、第3図はワークディスタンスと検出波形の関係を
示す図、第4図は従来の電子ビーム溶接機を示す概略構
成図、第5図は波形変換部の電圧を示す波形図である。 図において、(2)は電子銃、〈3)は電子ビーム、(
4)は被溶接物、(5)は集束コイル、〈6〉は偏向コ
イル、〈7)は溶接線、(8)はコレクタ、〈9〉は反
射電子または二次電子、(13〉はオシロスコープ、(
15)はメモリ内蔵型駆動装置である。 なお、図中、同一符号は同一、又は相当部分を示す。
FIG. 1 is a schematic configuration diagram showing an embodiment of an electron beam welding machine according to the present invention, FIG. 2 is a diagram showing the relationship between the workpiece and the electron gun, and FIG. 3 is a diagram showing the relationship between the work distance and the detected waveform. FIG. 4 is a schematic configuration diagram showing a conventional electron beam welding machine, and FIG. 5 is a waveform diagram showing the voltage of a waveform converting section. In the figure, (2) is an electron gun, (3) is an electron beam, (
4) is the object to be welded, (5) is the focusing coil, <6> is the deflection coil, <7) is the welding wire, (8) is the collector, <9> is the reflected electron or secondary electron, (13> is the oscilloscope) ,(
15) is a memory built-in drive device. In addition, in the figures, the same reference numerals indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] (1)、被加工物を加工する電子ビームを発生する電子
ビーム発生手段と、この電子ビーム発生手段と前記被加
工物の間に配置され、前記電子ビームを前記被加工物上
に集束させるとともに前記被加工物の加工線を横切るよ
うに前記電子ビームを走査させる集束・偏向手段と、こ
の集束・偏向手段と前記被加工物の間に配置され、前記
被加工物に射突した電子ビームの反射電子または二次電
子を捕捉して前記加工線を検出する加工線検出装置と、
前記電子ビーム発生手段と前記被加工物の少なくとも一
方を駆動するメモリ内蔵型駆動装置とを備え、加工線検
出時には前記被加工物の加工開始点から加工終了点まで
の電子銃−被加工物間距離の、所定値からの補正量を検
出して前記メモリに予め記憶しておき、加工時には前記
補正量をプレイバックして前記所定値を保ちながら前記
被加工物を加工することを特徴とする電子ビーム加工機
(1) an electron beam generating means for generating an electron beam for processing a workpiece; an electron beam generating means disposed between the electron beam generating means and the workpiece; and focusing the electron beam on the workpiece; a focusing/deflecting means for scanning the electron beam across the machining line of the workpiece; a focusing/deflecting means disposed between the focusing/deflecting means and the workpiece; a processed line detection device that detects the processed line by capturing reflected electrons or secondary electrons;
A drive device with a built-in memory that drives at least one of the electron beam generating means and the workpiece is provided, and when detecting a machining line, the electron beam generating means and the workpiece are connected between the electron gun and the workpiece from a machining start point to a machining end point. The method is characterized in that a distance correction amount from a predetermined value is detected and stored in the memory in advance, and during processing, the correction amount is played back and the workpiece is processed while maintaining the predetermined value. Electron beam processing machine.
JP18895789A 1989-07-24 1989-07-24 Electron beam working machine Pending JPH0357573A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18895789A JPH0357573A (en) 1989-07-24 1989-07-24 Electron beam working machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18895789A JPH0357573A (en) 1989-07-24 1989-07-24 Electron beam working machine

Publications (1)

Publication Number Publication Date
JPH0357573A true JPH0357573A (en) 1991-03-12

Family

ID=16232886

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18895789A Pending JPH0357573A (en) 1989-07-24 1989-07-24 Electron beam working machine

Country Status (1)

Country Link
JP (1) JPH0357573A (en)

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