JPH0358043B2 - - Google Patents
Info
- Publication number
- JPH0358043B2 JPH0358043B2 JP3863983A JP3863983A JPH0358043B2 JP H0358043 B2 JPH0358043 B2 JP H0358043B2 JP 3863983 A JP3863983 A JP 3863983A JP 3863983 A JP3863983 A JP 3863983A JP H0358043 B2 JPH0358043 B2 JP H0358043B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- scale
- half mirror
- reflected
- mirror
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
- G01D5/32—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light
- G01D5/34—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells
- G01D5/347—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light with attenuation or whole or partial obturation of beams of light the beams of light being detected by photocells using displacement encoding scales
- G01D5/34707—Scales; Discs, e.g. fixation, fabrication, compensation
- G01D5/34715—Scale reading or illumination devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Optical Transform (AREA)
Description
【発明の詳細な説明】
本発明は反射形のスケールを用いて可干渉光の
回折光の干渉を利用してスケールの移動量を測定
し、位相差板による光の位相遅れを利用してスケ
ールの移動方向を測定することができるようにし
た光学式スケール読取装置に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention uses a reflective scale to measure the amount of movement of the scale by utilizing the interference of diffracted light of coherent light, and measures the amount of movement of the scale by using the phase delay of the light caused by the retardation plate. The present invention relates to an optical scale reading device that can measure the direction of movement of a scale.
光の干渉を利用した光学式スケール読取装置と
しては、従来より種々のものが知られている。第
1図は、従来のこの種の装置の一構成を示す図で
ある。レーザから発射されたレーザ光lは、鏡M
1およびレンズL1,L2を通過してスケール1
に照射される。スケール1で回折した+1次回折
光は鏡M2へ、0次回折光は鏡M3へ入射する。
鏡M2からの+1次回折光はそのままレンズL3
へ、また鏡M3からの0次回折光はスケール1上
で回折し、−1次回折光としてレンズL3に入射
する。このとき、+1次、−1次回折光はそれぞれ
偏光子P1,P2により互いに90゜偏光面のずれ
た直線偏光となる。レンズL3で集光された光
は、分光器2で3方向に分けられ光電変換素子D
1〜D3へ入射する。ここでD3の出力は、レー
ザ光を一定に保つための自動利得制御用に用いら
れる。また、D1,D2に入る光は、それぞれ1/
4波長板13で90゜の位相差がつけられ偏光面が
45゜になるように配された検光子P3,P4によ
つて±1次回折光が混合される。この結果干渉縞
を生じた光は、光電変換素子D1,D2で電気信
号に変換される。これら光電変換素子の出力は所
定の処理を経てスケール移動値に変換される。 Various types of optical scale reading devices that utilize light interference have been known. FIG. 1 is a diagram showing the configuration of a conventional device of this type. The laser beam l emitted from the laser is reflected by the mirror M
1 and lenses L1 and L2 to scale 1.
is irradiated. The +1st-order diffracted light diffracted by the scale 1 enters the mirror M2, and the 0th-order diffracted light enters the mirror M3.
The +1st-order diffracted light from mirror M2 goes directly to lens L3.
Also, the 0th order diffracted light from the mirror M3 is diffracted on the scale 1 and enters the lens L3 as -1st order diffracted light. At this time, the +1st-order and -1st-order diffracted lights become linearly polarized lights with polarization planes shifted by 90 degrees from each other by polarizers P1 and P2, respectively. The light focused by the lens L3 is divided into three directions by the spectroscope 2 and sent to the photoelectric conversion element D.
1 to D3. Here, the output of D3 is used for automatic gain control to keep the laser light constant. Also, the light entering D1 and D2 is 1/
A phase difference of 90° is provided by the 4-wave plate 13, and the plane of polarization is
The ±1st-order diffracted lights are mixed by analyzers P3 and P4 arranged at an angle of 45°. The light that has produced interference fringes as a result is converted into electrical signals by photoelectric conversion elements D1 and D2. The outputs of these photoelectric conversion elements are converted into scale movement values through predetermined processing.
第2図は出願人が既に提案した光学式スケール
読取装置の一実施例を示す構成図である。図にお
いて、11は可干渉性光源、L11は該光源の出
力光を集光する第1のレンズ、12は該レンズの
通過光を受ける偏光キユーブプリズム、13は該
プリズムを透過した光を受ける1/4波長板、L1
2は該波長板の透過光を受ける第2の集光レン
ズ、14は該レンズの通過光を受けるスケール、
Aはスケール14から反射した回折光が結像する
結像部である。15は結像部Aに置かれた0次回
折光除去用のストツパ、Sは結像部Aの後方部に
生じた干渉縞、16は干渉縞Sを受ける受光素子
である。 FIG. 2 is a block diagram showing an embodiment of an optical scale reading device already proposed by the applicant. In the figure, 11 is a coherent light source, L11 is a first lens that condenses the output light of the light source, 12 is a polarizing cube prism that receives light passing through the lens, and 13 is a polarizing cube prism that receives light that has passed through the prism. 1/4 wavelength plate, L1
2 is a second condenser lens that receives the light transmitted through the wavelength plate; 14 is a scale that receives the light that passes through the lens;
A is an imaging section where the diffracted light reflected from the scale 14 forms an image. Reference numeral 15 denotes a stopper placed in the imaging section A to remove the 0th order diffracted light, S denotes interference fringes generated at the rear of the imaging section A, and 16 denotes a light receiving element that receives the interference fringes S.
光源11から出射された光は、続くレンズL1
1で集光されて偏光キユーブプリズム12に入
る。キユーブプリズムに入射した光のうち、該プ
リズムと偏光角が一致した成分のみが該プリズム
を通過する。光源11として半導体レーザを用い
ると大部分が直線偏光なのでプリズム12を通過
することができる。そして、キユーブプリズムを
通過した光は1/4波長板13に入る。1/4波長板1
3を通過した光は円偏光となり、レンズL12で
集光され、スケール14に照射される。スケール
14に入射した光は、反射する際に多モードの回
折光を生じさせる。ここで、0次回折光の第1結
像点をO1、+1次回折光および−1次回折光の
結像点をそれぞれP1,Q1とする。スケール1
4によつて反射された回折光は、第1結像点O
1,P1,Q1から出たように進みレンズL12
で集光される。レンズL12を通過した光は、再
び1/4波長板13に入る。ここで、反射光は再び
直線偏光にもどされる。かつ、その偏光角は、入
射直線偏光と90゜異なるため、今度はキユーブプ
リズム12に入つた反射光は、全て反射される。
反射した回折光は、結像部Aで再び結像される。
図中、O2は0次の、P2は+1次の、Q2は−
1次のそれぞれ回折光の結像点である。0次の回
折光は、結像部Aに設けられたストツパ15で除
去される結果、±1次回折光同士による干渉縞が
生じる。干渉縞Sを受ける受光素子16は、多分
割されたフオトダイオードより構成されており、
各フオトダイオードごとに光の明暗に応じた電気
信号を発生させている。 The light emitted from the light source 11 passes through the following lens L1.
1 and enters the polarizing cube prism 12. Of the light incident on the Cube prism, only the component whose polarization angle matches that of the prism passes through the prism. When a semiconductor laser is used as the light source 11, most of the light is linearly polarized and can pass through the prism 12. The light that has passed through the Cube prism enters the 1/4 wavelength plate 13. 1/4 wavelength plate 1
The light that has passed through the lens L12 becomes circularly polarized light, is focused by the lens L12, and is irradiated onto the scale 14. The light incident on the scale 14 generates multimode diffracted light when reflected. Here, the first imaging point of the 0th-order diffracted light is O1, and the imaging points of the +1st-order diffracted light and the -1st-order diffracted light are P1 and Q1, respectively. scale 1
The diffracted light reflected by 4 is directed to the first imaging point O
1, P1, advance as if it came out from Q1 Lens L12
The light is focused. The light that has passed through the lens L12 enters the quarter-wave plate 13 again. Here, the reflected light is converted back into linearly polarized light. Moreover, since its polarization angle differs by 90 degrees from the incident linearly polarized light, all of the reflected light that enters the cube prism 12 is reflected.
The reflected diffracted light is again imaged at the imaging section A.
In the figure, O2 is 0th order, P2 is +1st order, and Q2 is -
Each of the first-order diffracted lights is an imaging point. The 0th-order diffracted light is removed by a stopper 15 provided in the imaging section A, resulting in interference fringes between the ±1st-order diffracted lights. The light receiving element 16 that receives the interference fringes S is composed of a multi-segmented photodiode,
Each photodiode generates an electrical signal depending on the brightness of the light.
今、光源11から可干渉性の光が照射されてい
る状態で、スケールを或る方向に移動させたとす
る。このとき、受光素子16上の干渉縞Sはスケ
ール14の移動に応じ移動する。フオトダイオー
ドを90゜ずつ位相が異なるように配しておけば、
これら各フオトダイオードはそれぞれ90゜ずつ位
相の異なつた正弦波を出力する。これら各フオト
ダイオードの出力の制御回路(図示せず)で演算
処理することにより、スケール14の変位を求め
ることができる。何れの例も出力は90゜の位相差
を持つ正弦波で、正弦波のピーク値を計数するこ
とでスケールの移動量が、また2つの正弦波の位
相関係を判別すれば移動方向がそれぞれ測定でき
る。ここで、更に高分解能を得ようとすれば正弦
波の位相電圧をアナログ的に分割することが考え
られる。従つて、正弦波の形及び90゜の位相差は
できるかぎり正確であることか必要である。 Now, assume that the scale is moved in a certain direction while being irradiated with coherent light from the light source 11. At this time, the interference fringes S on the light receiving element 16 move in accordance with the movement of the scale 14. If you arrange the photodiodes so that their phases differ by 90 degrees,
Each of these photodiodes outputs a sine wave with a phase difference of 90 degrees. The displacement of the scale 14 can be determined by performing arithmetic processing on the output of each of these photodiodes using a control circuit (not shown). In both examples, the output is a sine wave with a phase difference of 90 degrees, and by counting the peak value of the sine wave, you can measure the amount of movement of the scale, and by determining the phase relationship between the two sine waves, you can measure the direction of movement. can. Here, in order to obtain even higher resolution, it is conceivable to divide the phase voltage of the sine wave in an analog manner. Therefore, it is necessary that the shape of the sine wave and the 90° phase difference be as accurate as possible.
上述したような装置は何れも透過形のスケール
を用いているのでスケールの固定方法が難しく、
第2図の場合においてはスケール14のピツチが
小さいと回折角が大きくなるのでL12に高NA
のレンズが必要となり受光素子16上に達する光
が反射されるスケール14上の面積が非常に小さ
くなりスケール上のゴミや汚れの影響を受けやす
くなるという欠点があつた。 The above-mentioned devices all use transparent scales, so it is difficult to fix the scales.
In the case of Figure 2, if the pitch of the scale 14 is small, the diffraction angle becomes large, so L12 has a high NA.
This has the disadvantage that the area on the scale 14 where the light reaching the light receiving element 16 is reflected becomes very small, making it susceptible to dust and dirt on the scale.
本発明はこのような点に鑑みてなされたもので
あつて、スケールとして反射形のものを用い、ス
ケールに照射する光ビームの径を大きくしてゴミ
の影響等を小さくし、位相差板を利用して90゜の
位相差をつくることにより構成が簡単で操作性の
よい超高分解能の光学式スケール読取装置を実現
したものである。 The present invention has been made in view of these points, and uses a reflective scale as the scale, increases the diameter of the light beam irradiated to the scale, reduces the influence of dust, etc., and uses a retardation plate. By utilizing this to create a 90° phase difference, we have realized an ultra-high resolution optical scale reading device that is simple in construction and easy to operate.
以下、図面を参照して本発明を詳細に説明す
る。 Hereinafter, the present invention will be explained in detail with reference to the drawings.
第3図は本発明の一実施例を示す構成図であ
る。図において、20は可干渉性光源、L21はレ
ンズ、M21は複数の回折光を同一方向に導くハ
ーフミラー、21はスケール、22は第1の位相
差板、M22は反射回折光を2方向に分離させる
ビームスプリツタ、23は第1の偏光板、24は
第2の位相差板、25は第2の偏光板、PD1,
PD2は受光素子、26,27はそれぞれ演算増
幅器U1,U2を主として構成された増幅器、2
8は各増幅器の出力を受ける波形成形回路、29
は該波形成形回路の出力を受けて演算処理し所望
の分解能に分割する演算回路、30は該演算回路
の出力を表示する表示部である。可干渉性光源2
0としては例えば半導体レーザが用いられ、位相
差板22,24としては例えばハーフミラーが用
いられ、ビームスプリツタM22としては例えば
ハーフミラーが用いられる。このように構成され
た装置の動作を説明すれば、以下のとおりであ
る。 FIG. 3 is a configuration diagram showing an embodiment of the present invention. In the figure, 20 is a coherent light source, L21 is a lens, M21 is a half mirror that guides multiple diffracted lights in the same direction, 21 is a scale, 22 is a first retardation plate, and M22 is a mirror that directs reflected diffracted lights in two directions. A beam splitter for separating, 23 a first polarizing plate, 24 a second retardation plate, 25 a second polarizing plate, PD1,
PD2 is a light receiving element, 26 and 27 are amplifiers mainly composed of operational amplifiers U1 and U2, respectively;
8 is a waveform shaping circuit that receives the output of each amplifier; 29
Reference numeral 30 indicates an arithmetic circuit that receives the output of the waveform shaping circuit, performs arithmetic processing on it, and divides it into a desired resolution, and 30 a display unit that displays the output of the arithmetic circuit. Coherent light source 2
For example, a semiconductor laser is used as the beam splitter M22, a half mirror is used as the retardation plates 22 and 24, and a half mirror is used as the beam splitter M22. The operation of the device configured as described above will be explained as follows.
半導体レーザ20の出力は光はレンズL21に
よつ受光素子上に集光する角度(又は平行光)に
される。このとき、偏光面は図に示すように紙面
に垂直にしておく。この光をハーフミラーM21
によつて分離し2方向に分ける。ハーフミラーM
21の透過光l1はスケール21にθ1の角度で入射
する。ハーフミラーM21の反射光l2は波長板2
2を通過した後入射角θ1でスケール21に入射す
る。ここで、1/4波長板22の角度を速軸、遅軸
が入射光の偏光面と第4図のaに示すように45゜
になるようにすれば該1/4波長板を通つた光は円
偏光になる。第4図は各部の偏波面の状態を示す
図である。aは前述したように第1の1/4波長板
22の、bは第2の1/4波長板24の、cは第1
の変更板23の、dは第2の偏光板25のそれぞ
れ状態を示している。 The output of the semiconductor laser 20 is made into an angle (or parallel light) so that the light is focused onto the light receiving element by the lens L21. At this time, the plane of polarization is perpendicular to the plane of the paper as shown in the figure. Half mirror M21
and separate it into two directions. Half mirror M
The transmitted light l 1 of 21 is incident on the scale 21 at an angle of θ 1 . The reflected light l 2 of the half mirror M21 is the wavelength plate 2
2 and then enters the scale 21 at an incident angle θ 1 . Here, if the angle of the quarter-wave plate 22 is set so that the fast axis and the slow axis are at 45 degrees with the polarization plane of the incident light, as shown in Figure 4a, the light passes through the quarter-wave plate. The light becomes circularly polarized. FIG. 4 is a diagram showing the state of the polarization plane of each part. As mentioned above, a is the first 1/4 wavelength plate 22, b is the second 1/4 wavelength plate 24, and c is the first 1/4 wavelength plate 22.
In the change plate 23, d indicates the state of the second polarizing plate 25, respectively.
ここで、半導体レーザ20の波長をλ、スケー
ルピツチをdとし、スケール21で反射した±1
次回折光l3,l4がそれぞれ入射光l2,l1と同じ方向
に反射するためには入射角θ1は次式を満たさなけ
ればならない。 Here, the wavelength of the semiconductor laser 20 is λ, the scale pitch is d, and ±1
In order for the diffracted lights l 3 and l 4 to be reflected in the same direction as the incident lights l 2 and l 1 , respectively, the incident angle θ 1 must satisfy the following equation.
sinθ1+ginθ1=λ/d これからθ1は次式で表わされる。 sinθ 1 +ginθ 1 =λ/d From now on, θ 1 can be expressed by the following equation.
θ1=sin-1λ/2d
0次回折光l5,l6はそれぞれ図に示す方向へ反
射し、自動的に除去される。+1次回折光l3は再
び1/4波長板22に入り入射光l2の偏光面と90゜ず
れた(即ち紙面と平行な)偏光面となつてハーフ
ミラーM21を通過する。−1次回折光l4はスケ
ール21からそのままハーフミラー21で反射し
+1次回折光l3と同じ方向へ進む。このとき、±
1次回折光l3,l4は偏波面が90゜異なるので相互干
渉しない。この±1次回折光を第2のハーフミラ
ーM22によつて2つに分ける。該ハーフミラー
を反射した光は偏光板23を通つて受光素子PD
1に達する。このとき偏光板23の偏光面を、第
4図cに示すように±1次回折光l3,l4とそれぞ
れ45゜になる方向にすると、通過光は±1次回折
光それぞれの偏光面方向の成分が干渉しあい、受
光素子PD1の出力はスケール21の移動に応じ
た正弦波となる。 θ 1 =sin −1 λ/2d The 0th order diffracted lights l 5 and l 6 are each reflected in the directions shown in the figure and are automatically removed. The +1st-order diffracted light l 3 enters the 1/4 wavelength plate 22 again, becomes a polarization plane that is 90° different from the polarization plane of the incident light l 2 (that is, parallel to the plane of the paper), and passes through the half mirror M21. The -1st-order diffracted light l4 is directly reflected from the scale 21 by the half mirror 21 and proceeds in the same direction as the +1st-order diffracted light l3 . At this time, ±
Since the polarization planes of the first-order diffracted lights l 3 and l 4 differ by 90°, they do not interfere with each other. This ±1st-order diffracted light is divided into two by a second half mirror M22. The light reflected by the half mirror passes through the polarizing plate 23 and reaches the light receiving element PD.
Reach 1. At this time, if the polarization plane of the polarizing plate 23 is set in the direction of 45 degrees for each of the ±1st-order diffracted lights l 3 and l 4 as shown in FIG. The components interfere with each other, and the output of the light receiving element PD1 becomes a sine wave corresponding to the movement of the scale 21.
一方、ハーフミラーM22を通過した光は1/4
波長板24を通過する。このとき、該波長板の遅
軸を+1次(または−1次)に一致させると、+
1次(または−1次)が−1次(または+1次)
に対し位相が90゜遅れる。これを第2の偏光板2
5を通して第1の偏光板23と同様に+1次、−
1次回折光を干渉させると偏光板25の通過光を
受ける第2の受光素子PD2の出力もスケール2
1の移動に応じて正弦波状の出力となり。、PD1
の出力に比べ位相が90゜遅れる(または進む)こ
とになる。この位相差90゜の出力は一般的にこの
種のスケール読取装置で行われているように、増
幅器26,27で増幅した後、波形成形回路28
で波形成形し、演算回路29で所望の分解能に分
割し、方向を弁別してカウンタ30で計数しスケ
ールの移動距離として表示するか又は帰還してス
ケールの位置制御用に用いられる。 On the other hand, the light passing through half mirror M22 is 1/4
It passes through the wave plate 24. At this time, if the slow axis of the wave plate is aligned with the +1st order (or -1st order), +
1st order (or -1st order) becomes -1st order (or +1st order)
The phase is delayed by 90°. This is transferred to the second polarizing plate 2.
Similarly to the first polarizing plate 23, +1st order and −
When the first-order diffracted light is interfered with, the output of the second light receiving element PD2 that receives the light passing through the polarizing plate 25 also becomes scale 2.
According to the movement of 1, the output becomes a sine wave. , PD1
The phase will be delayed (or advanced) by 90° compared to the output of . This output with a phase difference of 90° is amplified by amplifiers 26 and 27, as is generally done in this type of scale reading device, and then sent to a waveform shaping circuit 28.
The waveform is shaped by the arithmetic circuit 29, divided into a desired resolution by the arithmetic circuit 29, and the direction is discriminated and counted by the counter 30 and displayed as the moving distance of the scale or fed back and used for controlling the position of the scale.
以上説明した本発明装置の特徴を列挙すれば、
次の通りである。 The features of the device of the present invention explained above are as follows:
It is as follows.
(1) 反射型のスケールを使用しているのでスケー
ルとヘツドの取付が簡単で小形にできる。(1) Since a reflective scale is used, the scale and head can be easily installed and made smaller.
(2) スケールとヘツドの間隔が自由に変えられ
る。(2) The spacing between the scale and head can be changed freely.
(3) スケールに照射する光束が太く、受光素子上
で空間フイルタ(スリツト)を使用しないので
スケール上のゴミや汚れの影響が少い。(3) The light beam that irradiates the scale is wide, and no spatial filter (slit) is used on the light receiving element, so there is little influence from dust or dirt on the scale.
上述の説明では反射回折光を2方向に分離する
のにハーフミラーM22を用いたが、これに限る
必要はなく、例えば第5図に示すようなグレーテ
イング形のビームスプリツタを用いてもよい。図
において40がグレーテイング形のビームスプリ
ツタである。必要な場合には図に示すように、そ
に前に集光レンズL40を置くようにしてもよ
い。また。、上述の説明では斜めに入射する可干
渉性光源をハーフミラーを用いて2つの光束をス
ケール上に投射する場合を例にとつて説明したが
これに限る必要はない。第6図は斜めに入射する
可干渉性光源をミラーを用いて1光束をスケール
に投射するようにした各種実施例を示す図であ
る。図中、LDは半導体レーザ、HMはハーフミ
ラー、Mはミラー、Gはグレーテイング、λ/
2,λ/4は位相差板、PDは受光素子である。 In the above explanation, the half mirror M22 was used to separate the reflected and diffracted light into two directions, but the invention is not limited to this, and for example, a grating type beam splitter as shown in FIG. 5 may be used. . In the figure, 40 is a grating type beam splitter. If necessary, a condensing lens L40 may be placed in front of it, as shown in the figure. Also. In the above description, a case where two light beams are projected onto a scale using a half mirror from an obliquely incident coherent light source has been described as an example, but the present invention is not limited to this. FIG. 6 is a diagram showing various embodiments in which a coherent light source that enters obliquely is projected onto a scale by using a mirror. In the figure, LD is a semiconductor laser, HM is a half mirror, M is a mirror, G is a grating, and λ/
2, λ/4 is a retardation plate, and PD is a light receiving element.
以上詳細に説明したように、本発明によればス
ケールとして反射形のものを用い、スケールに照
射する光ビームの径を大きくしてゴミの影響など
の影響等を小さくし、更にハーフミラーの反射に
よる光の位相後れを利用して90゜の位相差をつく
ることにより構成が簡単で操作性のよい光学式ス
ケール読取装置を実現することができる。 As explained in detail above, according to the present invention, a reflective scale is used, the diameter of the light beam irradiated to the scale is increased to reduce the influence of dust, etc., and the reflection of the half mirror is further reduced. By creating a 90° phase difference by utilizing the phase lag of light due to the phase shift of the light, it is possible to realize an optical scale reading device with a simple configuration and good operability.
第1図、第2図は従来のこの種の装置の実施例
を示す図、第3図は本発明の一実施例を示す構成
図、第4図は偏波面の状態を示す図、第5図はビ
ームスプリツタの他の実施例を示す図、第6図は
本発明の他の実施例を示す図である。
1,14……透過形スケール、2……分光器、
L1〜L3,L11,L12,L21,L40…
…レンズ、M1〜M3……鏡、P1,P2……偏
光子、P3,P4……検光子、13,22,24
……1/4波長板、D1〜D3……光電変換素子、
11,20……半導体レーザ、12……偏光キユ
ーブプリズム、16,PD1,PD2……受光素
子、21……反射形スケール、23,25……偏
光板、26,27……増幅器、28……波形成形
回路、29……演算回路、30……表示部、M2
1……ハーフミラー、M22,40……ビームス
プリツタ。
1 and 2 are diagrams showing an embodiment of a conventional device of this type, FIG. 3 is a configuration diagram showing an embodiment of the present invention, FIG. 4 is a diagram showing the state of the polarization plane, and FIG. This figure shows another embodiment of the beam splitter, and FIG. 6 shows another embodiment of the present invention. 1, 14... Transmission type scale, 2... Spectrometer,
L1~L3, L11, L12, L21, L40...
...Lens, M1-M3...Mirror, P1, P2...Polarizer, P3, P4...Analyzer, 13, 22, 24
...1/4 wavelength plate, D1 to D3...photoelectric conversion element,
11, 20... Semiconductor laser, 12... Polarizing cube prism, 16, PD1, PD2... Light receiving element, 21... Reflective scale, 23, 25... Polarizing plate, 26, 27... Amplifier, 28... ... Waveform shaping circuit, 29 ... Arithmetic circuit, 30 ... Display section, M2
1... Half mirror, M22, 40... Beam splitter.
Claims (1)
折光の一方を他方に対し偏光面を直交させる第1
の位相差板と、両回折光を同一方向に導くハーフ
ミラーと、その光を2又は3方向に分離させるビ
ームスプリツタと、それぞれの方向で回折光同士
を干渉させるための偏光板と、これら干渉光に位
相差をもたせる第2の位相差板と、位相差のある
干渉光ごとに受光する2又は3個の受光素子と、
これら受光素子の出力を処理してスケールの移動
距離を測定するようにした光学式スケール読取装
置。 2 斜めに入射する可干渉性光源をハーフミラー
を用いて2つの光束をスケールに投射するように
したことを特徴とする特許請求の範囲第1項記載
の光学式スケール読取装置。 3 斜めに入射する可干渉性光源をミラーを用い
て1光束をスケールに投射するようにしたことを
特徴とする特許請求の範囲第1項記載の光学式ス
ケール読取装置。[Claims] 1. A coherent light source, a reflective scale, and a first device that makes one of the reflected and diffracted lights perpendicular to the other with a polarization plane.
a retardation plate, a half mirror that guides both diffracted lights in the same direction, a beam splitter that separates the light into two or three directions, a polarizing plate that causes the diffracted lights to interfere with each other in each direction, and these a second retardation plate that provides a phase difference to the interference light; two or three light receiving elements that receive each interference light that has a phase difference;
An optical scale reading device that measures the moving distance of the scale by processing the outputs of these light receiving elements. 2. The optical scale reading device according to claim 1, wherein the obliquely incident coherent light source uses a half mirror to project two light beams onto the scale. 3. The optical scale reading device according to claim 1, wherein a coherent light source that enters obliquely projects one beam of light onto the scale using a mirror.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3863983A JPS59163517A (en) | 1983-03-09 | 1983-03-09 | optical scale reader |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3863983A JPS59163517A (en) | 1983-03-09 | 1983-03-09 | optical scale reader |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS59163517A JPS59163517A (en) | 1984-09-14 |
| JPH0358043B2 true JPH0358043B2 (en) | 1991-09-04 |
Family
ID=12530807
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3863983A Granted JPS59163517A (en) | 1983-03-09 | 1983-03-09 | optical scale reader |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59163517A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101137666B1 (en) * | 2010-12-28 | 2012-04-20 | 주식회사 동양기술개발 | a |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0690052B2 (en) * | 1987-06-12 | 1994-11-14 | 株式会社東京精密 | Optical interferometer |
| JPS63309817A (en) * | 1987-06-12 | 1988-12-16 | Tokyo Seimitsu Co Ltd | Linear encoder |
| JP2582272B2 (en) * | 1987-12-24 | 1997-02-19 | 株式会社 東京精密 | Linear encoder |
| JPH02147816A (en) * | 1988-11-29 | 1990-06-06 | Tokyo Seimitsu Co Ltd | Scale reader |
| JP2629606B2 (en) * | 1994-07-08 | 1997-07-09 | キヤノン株式会社 | encoder |
| US7636165B2 (en) | 2006-03-21 | 2009-12-22 | Asml Netherlands B.V. | Displacement measurement systems lithographic apparatus and device manufacturing method |
| JP2013145863A (en) * | 2011-11-29 | 2013-07-25 | Gigaphoton Inc | Two-beam interference apparatus and two-beam interference exposure system |
-
1983
- 1983-03-09 JP JP3863983A patent/JPS59163517A/en active Granted
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101137666B1 (en) * | 2010-12-28 | 2012-04-20 | 주식회사 동양기술개발 | a |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS59163517A (en) | 1984-09-14 |
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