JPH0358453A - Resin sealed type semiconductor integrated circuit device - Google Patents

Resin sealed type semiconductor integrated circuit device

Info

Publication number
JPH0358453A
JPH0358453A JP1195013A JP19501389A JPH0358453A JP H0358453 A JPH0358453 A JP H0358453A JP 1195013 A JP1195013 A JP 1195013A JP 19501389 A JP19501389 A JP 19501389A JP H0358453 A JPH0358453 A JP H0358453A
Authority
JP
Japan
Prior art keywords
resin
integrated circuit
semiconductor integrated
circuit device
type semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1195013A
Other languages
Japanese (ja)
Inventor
Mitsuhiro Takahashi
光浩 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamagata Ltd
Original Assignee
NEC Yamagata Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamagata Ltd filed Critical NEC Yamagata Ltd
Priority to JP1195013A priority Critical patent/JPH0358453A/en
Publication of JPH0358453A publication Critical patent/JPH0358453A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/756Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink

Landscapes

  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は樹脂封止型半導体集積回路装置に関し5特にト
ランスファモールト或形にて樹脂封止した樹脂封止型半
導体集積図路装置に関する.r従来の技術〕 従来、この種の半導体集積回路装置における樹脂封止は
、トランスファモールド或形にて1回で樹脂封止し、パ
ッケージの外形を形或している。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a resin-sealed semiconductor integrated circuit device, and particularly to a resin-sealed semiconductor integrated circuit device that is resin-sealed using a transfer mold. [Prior Art] Conventionally, resin sealing in this type of semiconductor integrated circuit device is carried out in one step using transfer molding to form the outer shape of the package.

また、液状の樹脂を半導体チップ全面にボッティングし
、樹脂を硬化させたのちトランスファモールド成形にて
樹脂封止し2、パッケージ外形を形成している. 〔発明が解決しようとする課題〕 上述した従来の樹脂封止構造においては、集積回路の多
機能化が進み半導体チップのサイズが大型化すること、
及び、組立設備の合理化により、封止樹脂に対する特性
要求の例としてレーザー捺印による発色性のよい封止樹
脂や商品イメージを反映したカラー樹脂や耐湿性向上を
図った封止樹脂や低応力化を図った封止樹脂などあげら
れるが、全ての特性を一つの封止樹脂でかなえることは
不可能であり,1回のトランスファモールド成形では、
これら全てを満足できないという欠点がある. 本発明の目的は、発色性やカラー化や耐湿性や低応力化
などの封止樹脂の特性を同時に満足できる樹脂封止型半
導体集積回路装置を提供することにある. 〔課題を解決するための手段〕 本発明は、樹脂封止型半導体集積回路装置において、少
くとも2種類の封止樹脂を用いて、少゛くとも2層のト
ランスファ樹脂封止構造となっている。
In addition, liquid resin is potted onto the entire surface of the semiconductor chip, the resin is hardened, and then the resin is sealed using transfer molding 2 to form the package outline. [Problems to be Solved by the Invention] In the conventional resin encapsulation structure described above, the size of semiconductor chips is increasing as integrated circuits become more multifunctional.
In addition, by rationalizing assembly equipment, we have created molding resins with good color development by laser marking, colored resins that reflect the product image, molded resins with improved moisture resistance, and low stress, as examples of characteristic requirements for molded resins. However, it is impossible to achieve all the characteristics with one sealing resin, and with one transfer molding,
The drawback is that it cannot satisfy all of these requirements. An object of the present invention is to provide a resin-sealed semiconductor integrated circuit device that can simultaneously satisfy the characteristics of a sealing resin, such as color development, colorization, moisture resistance, and low stress. [Means for Solving the Problems] The present invention provides a resin-sealed semiconductor integrated circuit device that uses at least two types of sealing resins to have at least a two-layer transfer resin sealing structure. There is.

〔実施例〕〔Example〕

以下、図面を参照して本発明の実施例を詳細に説明する
. 第1図(a).(b)は本発明の一実施例の斜視図及び
A−A’線断面図である。
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Figure 1(a). (b) is a perspective view and a sectional view taken along the line AA' of an embodiment of the present invention.

第1図(a).(b)に示すように、まず、リード・フ
レーム1のアイランドに、半導体チップ2を搭載し、半
導体チップ2の電極端子とリード・フレーム1のリード
をボンディングワイヤ3にて接続する。
Figure 1(a). As shown in FIG. 1B, first, the semiconductor chip 2 is mounted on the island of the lead frame 1, and the electrode terminals of the semiconductor chip 2 and the leads of the lead frame 1 are connected with bonding wires 3.

次に、半導体チップ2を搭載したリード・フレーム1を
トランスファモールド或形にて、芯となる高密着性封止
樹脂6を被覆し、樹脂封止する.次に、同じ方法にて、
高密着性封止樹脂6を中間層となる低応力封止樹脂5に
て被覆する.更に、同じ方法にて、中間層となる低応力
封止樹脂5を表面層となるレーザー捺印発色性封止樹脂
4にて被覆する。
Next, the lead frame 1 on which the semiconductor chip 2 is mounted is covered with a highly adhesive sealing resin 6 serving as a core using a transfer molding method, and is sealed with the resin. Next, in the same way,
The highly adhesive sealing resin 6 is covered with a low stress sealing resin 5 serving as an intermediate layer. Furthermore, by the same method, the low stress sealing resin 5 which will be the intermediate layer is covered with the laser-markable color-forming sealing resin 4 which will be the surface layer.

Mf&に、レーザ捺印によるマーキング、リードの成形
等を行い、本実施例の積層構造の樹脂封止型半導体集積
回路装置が得られる. 〔発明の効果〕 以上説明したように本発明は、従来、トランスファモー
ルド戒形を1回で行なった構造を2層以上に積層した構
造としたので、特性の異なる封止樹脂を用いることによ
り、樹脂封止型半導体集積回路装置の信頼性向上とカラ
ー樹脂を使用することにより商品イメージの向上と、捺
印文字を鮮明にできる効果がある.
Marking by laser stamping, molding of leads, etc. are performed on Mf&, and the resin-sealed semiconductor integrated circuit device with the laminated structure of this example is obtained. [Effects of the Invention] As explained above, the present invention changes the conventional structure in which transfer molding is performed in one time to a structure in which two or more layers are laminated, so by using sealing resins with different characteristics, Improving the reliability of resin-sealed semiconductor integrated circuit devices and using colored resin have the effect of improving the product image and making the printed text clearer.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a),(b)は本発明の一実施例の斜視図及び
A−A’線断面図である. 1・・・リード・フレーム、2・・・半導体チップ、3
・・・ボンディングワイヤ、4・・・レーザー捺印発色
性封止樹脂、 5・・・低応力封止樹脂、 6・・・高密着性封 止樹脂。
FIGS. 1(a) and 1(b) are a perspective view and a sectional view taken along the line AA' of an embodiment of the present invention. 1... Lead frame, 2... Semiconductor chip, 3
. . . Bonding wire, 4. Laser-marked color-forming sealing resin, 5. Low-stress sealing resin, 6. High-adhesion sealing resin.

Claims (1)

【特許請求の範囲】[Claims] 樹脂封止型半導体集積回路装置において、少くとも2種
類の封止樹脂を用いて、少くとも2層のトランスファ樹
脂封止構造としたことを特徴とする樹脂封止型半導体集
積回路装置。
A resin-sealed semiconductor integrated circuit device, characterized in that the resin-sealed semiconductor integrated circuit device uses at least two types of sealing resins to have at least a two-layer transfer resin sealing structure.
JP1195013A 1989-07-26 1989-07-26 Resin sealed type semiconductor integrated circuit device Pending JPH0358453A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1195013A JPH0358453A (en) 1989-07-26 1989-07-26 Resin sealed type semiconductor integrated circuit device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1195013A JPH0358453A (en) 1989-07-26 1989-07-26 Resin sealed type semiconductor integrated circuit device

Publications (1)

Publication Number Publication Date
JPH0358453A true JPH0358453A (en) 1991-03-13

Family

ID=16334083

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1195013A Pending JPH0358453A (en) 1989-07-26 1989-07-26 Resin sealed type semiconductor integrated circuit device

Country Status (1)

Country Link
JP (1) JPH0358453A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5886400A (en) * 1995-08-31 1999-03-23 Motorola, Inc. Semiconductor device having an insulating layer and method for making
US6818968B1 (en) * 2000-10-12 2004-11-16 Altera Corporation Integrated circuit package and process for forming the same
JP2008227348A (en) * 2007-03-15 2008-09-25 Sanyo Electric Co Ltd Semiconductor device and manufacturing method thereof

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5886400A (en) * 1995-08-31 1999-03-23 Motorola, Inc. Semiconductor device having an insulating layer and method for making
US6818968B1 (en) * 2000-10-12 2004-11-16 Altera Corporation Integrated circuit package and process for forming the same
JP2008227348A (en) * 2007-03-15 2008-09-25 Sanyo Electric Co Ltd Semiconductor device and manufacturing method thereof

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