JPH0361722U - - Google Patents

Info

Publication number
JPH0361722U
JPH0361722U JP12208389U JP12208389U JPH0361722U JP H0361722 U JPH0361722 U JP H0361722U JP 12208389 U JP12208389 U JP 12208389U JP 12208389 U JP12208389 U JP 12208389U JP H0361722 U JPH0361722 U JP H0361722U
Authority
JP
Japan
Prior art keywords
circuit
comparator
expected value
reference voltage
comparison
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12208389U
Other languages
Japanese (ja)
Other versions
JPH0756514Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12208389U priority Critical patent/JPH0756514Y2/en
Publication of JPH0361722U publication Critical patent/JPH0361722U/ja
Application granted granted Critical
Publication of JPH0756514Y2 publication Critical patent/JPH0756514Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

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  • Tests Of Electronic Circuits (AREA)
  • Manipulation Of Pulses (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本考案に係るコンパレータ回路の構成
図、第2図は第1図のコンパレータ回路のタイミ
ングチヤート、第3図は従来のコンパレータ回路
の構成図、第4図は従来のコンパレータ回路のタ
イミングチヤートである。 1……信号出力回路、4……比較回路、5……
判定回路、7……リフアレンス電圧切り替えスイ
ツチ、8……コンパレータ。
Fig. 1 is a block diagram of a comparator circuit according to the present invention, Fig. 2 is a timing chart of the comparator circuit of Fig. 1, Fig. 3 is a block diagram of a conventional comparator circuit, and Fig. 4 is a timing chart of a conventional comparator circuit. It's a chat. 1...Signal output circuit, 4...Comparison circuit, 5...
Judgment circuit, 7... Reference voltage changeover switch, 8... Comparator.

Claims (1)

【実用新案登録請求の範囲】 異なつたレベルを有するリフアレンス電圧を切
り替えるリフアレンス電圧切り替え回路と、 この切り替え回路によつて選択されたリフアレ
ンス電圧と入力信号を比較し、比較結果をハイ側
とロー側の2つの出力信号で出力する差動出力コ
ンパレータと、 このコンパレータからの2つの出力信号と、期
待値を入力し、期待値のレベルに応じて2つの出
力の一方を選択し、期待値と比較する比較回路と
、 判定ストローブのタイミングで比較の結果をラ
ツチする判定回路と、 を有することを特徴とするコンパレータ回路。
[Claims for Utility Model Registration] A reference voltage switching circuit that switches reference voltages having different levels; a reference voltage selected by the switching circuit is compared with an input signal, and the comparison results are used for high-side and low-side A differential output comparator that outputs two output signals, input the two output signals from this comparator and the expected value, select one of the two outputs according to the level of the expected value, and compare it with the expected value. A comparator circuit comprising: a comparison circuit; and a determination circuit that latches the comparison result at the timing of a determination strobe.
JP12208389U 1989-10-18 1989-10-18 LSI test system Expired - Lifetime JPH0756514Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12208389U JPH0756514Y2 (en) 1989-10-18 1989-10-18 LSI test system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12208389U JPH0756514Y2 (en) 1989-10-18 1989-10-18 LSI test system

Publications (2)

Publication Number Publication Date
JPH0361722U true JPH0361722U (en) 1991-06-17
JPH0756514Y2 JPH0756514Y2 (en) 1995-12-25

Family

ID=31670099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12208389U Expired - Lifetime JPH0756514Y2 (en) 1989-10-18 1989-10-18 LSI test system

Country Status (1)

Country Link
JP (1) JPH0756514Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304818A (en) * 1999-04-21 2000-11-02 Advantest Corp Semiconductor test device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000304818A (en) * 1999-04-21 2000-11-02 Advantest Corp Semiconductor test device

Also Published As

Publication number Publication date
JPH0756514Y2 (en) 1995-12-25

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