JPH0362435A - Thin film formation device - Google Patents
Thin film formation deviceInfo
- Publication number
- JPH0362435A JPH0362435A JP1198438A JP19843889A JPH0362435A JP H0362435 A JPH0362435 A JP H0362435A JP 1198438 A JP1198438 A JP 1198438A JP 19843889 A JP19843889 A JP 19843889A JP H0362435 A JPH0362435 A JP H0362435A
- Authority
- JP
- Japan
- Prior art keywords
- plasma
- substrate
- arc
- thin film
- film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Electron Sources, Ion Sources (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は良質な薄膜を形成する装置に関するものである
。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to an apparatus for forming high-quality thin films.
〔従来の技術]
従来、ガスを導入し、アークプラズマで活性化させたガ
スの反応物や、RFプラズマで活性させたガスの反応物
をそれぞれ個々に基板上に堆積させるCVD法はすでに
よく知られている。[Prior Art] Conventionally, the CVD method in which a gas is introduced and reactants of the gas activated by arc plasma and reactants of the gas activated by RF plasma are individually deposited on a substrate is already well known. It is being
ところで、アークプラズマだけではガス中のイオン化は
低く、ラジカルの量も低いのでラジカル量を増やすため
にチャンバー内の圧力を高くしなければ充分の蒸着速度
が得られない。しかし、そうすれば電極と基板間距離は
かなり接近させなければならず、電極の影響を受けやす
い。一方、RFプラズマだけでもガスのイオン化はそれ
ほど高くなく、ラジカルの量もそれほど多くはない。By the way, with arc plasma alone, ionization in the gas is low and the amount of radicals is also low, so a sufficient deposition rate cannot be obtained unless the pressure in the chamber is increased to increase the amount of radicals. However, if this is done, the distance between the electrode and the substrate must be made quite close, making it susceptible to the influence of the electrode. On the other hand, with only RF plasma, the ionization of the gas is not so high, and the amount of radicals is not so large.
本発明の目的はRFプラズマを発生させ、かつ同時にア
ークプラズマによってガスの活性化を促進することによ
って、高速で成膜し、かつ良質な薄膜を形成できる装置
を提供することにある。An object of the present invention is to provide an apparatus capable of forming a high-quality thin film at high speed by generating RF plasma and simultaneously promoting activation of gas by arc plasma.
前記目的を達成するため、本発明に係る薄膜形成装置に
おいては、基板を搭載する基板ホルダを内蔵した真空槽
と、該真空槽外でRFプラズマを発生させるRFコイル
と、アークプラズマを発生し、前記基板に作用させる前
記RFプラズマ中の反応生成物を活性化させるアーク発
生電極とを有するものである。In order to achieve the above object, the thin film forming apparatus according to the present invention includes a vacuum chamber incorporating a substrate holder for mounting a substrate, an RF coil for generating RF plasma outside the vacuum chamber, and generating arc plasma. and an arc generating electrode that activates reaction products in the RF plasma acting on the substrate.
〔作用]
本発明においては、真空槽の外に設けられたコイル電極
を通して発生されたRFプラズマの中にあるイオンや電
子によって反応した生成物を、その下方に設置されたア
ーク電極で発生されたプラズマによってさらに活性化を
高めることができるので、良質かつ高速で薄膜が形成で
きることになる。[Function] In the present invention, products reacted by ions and electrons in the RF plasma generated through the coil electrode installed outside the vacuum chamber are transferred to the products generated by the arc electrode installed below the RF plasma. Since activation can be further enhanced by plasma, thin films can be formed with high quality and at high speed.
以下に本発明の実施例を図によって説明する。 Embodiments of the present invention will be described below with reference to the drawings.
第1図において、脱気口13を有する真空槽lの上部に
石英管10が付設されている。真空槽l内にはヒータ1
1を内蔵した基板ホルダ2が設置され、前記石英管10
に向き合わせて基板3を搭載するようになっている。1
2は前記ヒータl’lの加熱用AC電源である。前記基
板ホルダ2の直上で、前記石英管10に臨ませてアーク
プラズマを発生させるアーク用電極4を設置する。8は
アーク用電極である。In FIG. 1, a quartz tube 10 is attached to the upper part of a vacuum chamber l having a degassing port 13. There is a heater 1 in the vacuum chamber l.
A substrate holder 2 containing the quartz tube 10 is installed.
The board 3 is mounted facing the board 3. 1
2 is an AC power source for heating the heater l'l. An arc electrode 4 for generating arc plasma is installed directly above the substrate holder 2, facing the quartz tube 10. 8 is an arc electrode.
一方、真空槽1に通ずる前記石英管10にはRFプラズ
マを発生させるRFコイル5を設置する。7はRFコイ
ル5に通電するRF電源である。前記石英管10にはバ
ルブ6を有するガス導入管9が接続されている。On the other hand, an RF coil 5 for generating RF plasma is installed in the quartz tube 10 communicating with the vacuum chamber 1. Reference numeral 7 denotes an RF power source that energizes the RF coil 5. A gas introduction pipe 9 having a valve 6 is connected to the quartz tube 10 .
この装置によって、−例としてダイヤモンド薄膜を形成
する場合を具体的に説明する。A case in which a diamond thin film is formed using this apparatus will be specifically described as an example.
まず、拡散ポンプあるいはターボポンプと油回転ポンプ
を用い、脱気口13より脱気して真空槽1内を1×l〇
−“Torr以下まで排気する。基板温度を約500℃
に設定し、次に、ガスを導入するためにバルブ6を開き
、高純度のHヨガスと炭化水素ガスあるいは有機化合物
ガスを導入し、真空槽l内金体の真空度を1OTorr
程度に設定する。さらにアーク用電極4と基板3との距
離を1cm程度に設定してこの状態でコイル5に500
〜100OWのRFI!力を印加して放電を起こし、そ
れと同時にアーク用電極4に数十VでIOA程度の電流
を流してアークプラズマを発生させて基板3に膜を成長
させる。First, using a diffusion pump or a turbo pump and an oil rotary pump, the inside of the vacuum chamber 1 is evacuated to a temperature below 1×10-” Torr by degassing from the degassing port 13. The substrate temperature is set to about 500°C.
Next, open the valve 6 to introduce gas, introduce high-purity H yogas and hydrocarbon gas or organic compound gas, and set the vacuum degree of the metal body in the vacuum chamber to 1OTorr.
Set to a certain degree. Further, the distance between the arc electrode 4 and the substrate 3 is set to about 1 cm, and in this state, the coil 5 is
~100OW RFI! A force is applied to cause discharge, and at the same time, a current of several tens of volts and about IOA is passed through the arc electrode 4 to generate arc plasma and grow a film on the substrate 3.
本実施例ではこの状態で約10分間膜形成を行った。こ
のようにして形成されたダイヤモンド膜の膜厚は約10
pmであった。その膜をラマン分光法で測定したところ
1330cm−’だけに鋭いピークが得られた。In this example, film formation was performed in this state for about 10 minutes. The thickness of the diamond film formed in this way is approximately 10
It was pm. When the film was measured by Raman spectroscopy, a sharp peak was obtained only at 1330 cm-'.
また、この膜のビッカース硬度を測定したところ約12
000という値が得られた。この値は天然ダイヤモンド
と同じ値である。また、薄膜の熱伝導率を測定したとこ
ろ約200W/Kcmという値が得られた。これは高圧
合成されたダイヤモンドと同じである。このように、本
発明によって低温での良質のダイヤモンド薄膜が得られ
ることが分かる。In addition, the Vickers hardness of this film was measured and was approximately 12.
A value of 000 was obtained. This value is the same as that of natural diamond. Furthermore, when the thermal conductivity of the thin film was measured, a value of about 200 W/Kcm was obtained. This is the same as high-pressure synthesized diamond. Thus, it can be seen that a high quality diamond thin film can be obtained at low temperatures according to the present invention.
〔発明の効果]
本発明は以上のようにRFプラズマとアークプラズマと
を組合せて、ガスの活性化を高めるため、比較的低温で
良質な薄膜を形成できる。なお、アーク用電極と基板間
にバイアスを加えても同様に良質なダイヤモンド膜が得
られる。[Effects of the Invention] As described above, the present invention combines RF plasma and arc plasma to enhance the activation of gas, so that a high-quality thin film can be formed at a relatively low temperature. Note that a high-quality diamond film can be obtained similarly even if a bias is applied between the arc electrode and the substrate.
第1図は本発明による一実施例の薄膜形成装置を示す断
面図である。
l・・・真空槽 2・・・基板ホルダ3・・
・基板 4,8・・・アーク用電極5・・
・RFコイル 6・・・バルブ7・・・RF電
源
lO・・・石英管
12・・・AC電源FIG. 1 is a sectional view showing a thin film forming apparatus according to an embodiment of the present invention. l...Vacuum chamber 2...Substrate holder 3...
・Substrate 4, 8... Arc electrode 5...
・RF coil 6...Valve 7...RF power supply lO...Quartz tube 12...AC power supply
Claims (1)
該真空槽外でRFプラズマを発生させるRFコイルと、
アークプラズマを発生し、前記基板に作用させる前記R
Fプラズマ中の反応生成物を活性化させるアーク発生電
極とを有することを特徴とする薄膜形成装置。(1) A vacuum chamber with a built-in substrate holder for mounting the substrate,
an RF coil that generates RF plasma outside the vacuum chamber;
said R for generating arc plasma and acting on said substrate;
A thin film forming apparatus characterized by having an arc generating electrode that activates reaction products in F plasma.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1198438A JPH0362435A (en) | 1989-07-31 | 1989-07-31 | Thin film formation device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1198438A JPH0362435A (en) | 1989-07-31 | 1989-07-31 | Thin film formation device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0362435A true JPH0362435A (en) | 1991-03-18 |
Family
ID=16391086
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1198438A Pending JPH0362435A (en) | 1989-07-31 | 1989-07-31 | Thin film formation device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0362435A (en) |
-
1989
- 1989-07-31 JP JP1198438A patent/JPH0362435A/en active Pending
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