JPH0366300U - - Google Patents

Info

Publication number
JPH0366300U
JPH0366300U JP12355589U JP12355589U JPH0366300U JP H0366300 U JPH0366300 U JP H0366300U JP 12355589 U JP12355589 U JP 12355589U JP 12355589 U JP12355589 U JP 12355589U JP H0366300 U JPH0366300 U JP H0366300U
Authority
JP
Japan
Prior art keywords
speaker
adjustment mechanism
position adjustment
electrode pins
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12355589U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP12355589U priority Critical patent/JPH0366300U/ja
Publication of JPH0366300U publication Critical patent/JPH0366300U/ja
Pending legal-status Critical Current

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  • Testing Electric Properties And Detecting Electric Faults (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの考案に係るスピーカの検査装置の
実施例を示し、第1図aは斜視図、第1図bは電
極ピンと取付板との正面図、第1図cは同底面図
である。第2図は従来の実施例の斜視図である。 主な符号の説明、1……検査装置、2……蓋、
3……水平位置調整機構、3a,4d……スライ
ドシヤフト、3b,4a……スライドブロツク、
3c……水平調整ねじ、3d,4c……ツマミ、
4……上下位置調整機構、4b……垂直調整ねじ
、5……取付板、5a……切欠き、6……ねじ、
7,8……電極ピン、7a,7b,7c,8a,
8b,8c……スプリングピン、11,12……
コネクタ、S……スピーカ、S,S……入力
端子。
Fig. 1 shows an embodiment of the speaker inspection device according to this invention, Fig. 1a is a perspective view, Fig. 1b is a front view of an electrode pin and a mounting plate, and Fig. 1c is a bottom view of the same. . FIG. 2 is a perspective view of a conventional embodiment. Explanation of main symbols, 1... Inspection device, 2... Lid,
3...Horizontal position adjustment mechanism, 3a, 4d...Slide shaft, 3b, 4a...Slide block,
3c...Horizontal adjustment screw, 3d, 4c...Knob,
4... Vertical position adjustment mechanism, 4b... Vertical adjustment screw, 5... Mounting plate, 5a... Notch, 6... Screw,
7, 8...electrode pins, 7a, 7b, 7c, 8a,
8b, 8c... Spring pin, 11, 12...
Connector, S...Speaker, S1 , S2 ...Input terminal.

Claims (1)

【実用新案登録請求の範囲】 1 スピーカの入力端子に(+)電極と(-)電極の2
つの電極ピンを接触させてスピーカの実動検査を
行うスピーカの検査装置において、 前記各々の電極ピンは少なくとも2つの以上の
スプリングピンで構成したことを特徴とするスピ
ーカの検査装置。 2 電極ピンの位置調整機構を設け、位置調整機
構は水平位置を調整する水平位置調整機構と上下
位置を調整する上下位置調整機構とで構成したこ
とを特徴とする請求項1記載のスピーカの検査装
置。 3 電極ピンは位置調整機構を介して検査装置の
蓋に固定したことを特徴とする請求項2記載のス
ピーカの検査装置。 4 電極ピンは取付板を介して検査装置に固定さ
れ、且つ、電極ピンはコネクタに接続されて、電
極ピンの着脱を可能に構成したことを特徴とする
請求項1または2または3記載のスピーカの検査
装置。 5 取付板にはL字状の切欠きを設けたことを特
徴とする請求項4記載のスピーカの検査装置。
[Claims for Utility Model Registration] 1. 2 (+) electrodes and (-) electrodes on the input terminal of the speaker.
What is claimed is: 1. A speaker testing device that performs an actual operational test of a speaker by bringing two electrode pins into contact with each other, wherein each of the electrode pins is comprised of at least two or more spring pins. 2. Inspection of a speaker according to claim 1, characterized in that an electrode pin position adjustment mechanism is provided, and the position adjustment mechanism is composed of a horizontal position adjustment mechanism that adjusts the horizontal position and a vertical position adjustment mechanism that adjusts the vertical position. Device. 3. The speaker testing device according to claim 2, wherein the electrode pin is fixed to the lid of the testing device via a position adjustment mechanism. 4. The speaker according to claim 1, 2 or 3, wherein the electrode pins are fixed to the inspection device via a mounting plate, and the electrode pins are connected to a connector so that the electrode pins can be attached and detached. inspection equipment. 5. The speaker inspection device according to claim 4, wherein the mounting plate is provided with an L-shaped notch.
JP12355589U 1989-10-24 1989-10-24 Pending JPH0366300U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12355589U JPH0366300U (en) 1989-10-24 1989-10-24

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12355589U JPH0366300U (en) 1989-10-24 1989-10-24

Publications (1)

Publication Number Publication Date
JPH0366300U true JPH0366300U (en) 1991-06-27

Family

ID=31671524

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12355589U Pending JPH0366300U (en) 1989-10-24 1989-10-24

Country Status (1)

Country Link
JP (1) JPH0366300U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276847A (en) * 1986-05-26 1987-12-01 Hitachi Ltd probe device
JPS6471141A (en) * 1987-09-11 1989-03-16 Hitachi Ltd Inspection device for semiconductor element

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62276847A (en) * 1986-05-26 1987-12-01 Hitachi Ltd probe device
JPS6471141A (en) * 1987-09-11 1989-03-16 Hitachi Ltd Inspection device for semiconductor element

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