JPH0368503B2 - - Google Patents

Info

Publication number
JPH0368503B2
JPH0368503B2 JP60178772A JP17877285A JPH0368503B2 JP H0368503 B2 JPH0368503 B2 JP H0368503B2 JP 60178772 A JP60178772 A JP 60178772A JP 17877285 A JP17877285 A JP 17877285A JP H0368503 B2 JPH0368503 B2 JP H0368503B2
Authority
JP
Japan
Prior art keywords
electron
electrode
ion
microchannel plate
secondary electrons
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP60178772A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6240147A (ja
Inventor
Yutaka Ido
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP60178772A priority Critical patent/JPS6240147A/ja
Publication of JPS6240147A publication Critical patent/JPS6240147A/ja
Publication of JPH0368503B2 publication Critical patent/JPH0368503B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Measurement Of Radiation (AREA)
  • Electron Tubes For Measurement (AREA)
JP60178772A 1985-08-14 1985-08-14 イオン検出装置 Granted JPS6240147A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60178772A JPS6240147A (ja) 1985-08-14 1985-08-14 イオン検出装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60178772A JPS6240147A (ja) 1985-08-14 1985-08-14 イオン検出装置

Publications (2)

Publication Number Publication Date
JPS6240147A JPS6240147A (ja) 1987-02-21
JPH0368503B2 true JPH0368503B2 (fr) 1991-10-28

Family

ID=16054353

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60178772A Granted JPS6240147A (ja) 1985-08-14 1985-08-14 イオン検出装置

Country Status (1)

Country Link
JP (1) JPS6240147A (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH083987B2 (ja) * 1989-01-09 1996-01-17 株式会社日立製作所 質量分析装置の後段加速検知器
US6906318B2 (en) 2003-02-13 2005-06-14 Micromass Uk Limited Ion detector
CA2457522C (fr) * 2003-02-13 2012-09-25 Micromass Uk Limited Detecteur pour spectrometre de masse
JP4249548B2 (ja) * 2003-06-17 2009-04-02 浜松ホトニクス株式会社 電子増倍管
US7417235B2 (en) * 2005-05-11 2008-08-26 El-Mul Technologies, Ltd. Particle detector for secondary ions and direct and or indirect secondary electrons
WO2010125670A1 (fr) * 2009-04-30 2010-11-04 キヤノンアネルバ株式会社 Dispositif de détection d'ion et procédé de détection d'ion
JP5597572B2 (ja) * 2011-02-16 2014-10-01 株式会社神戸製鋼所 荷電粒子検出器，飛行時間型質量分析装置

Also Published As

Publication number Publication date
JPS6240147A (ja) 1987-02-21

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