JPH0372153B2 - - Google Patents
Info
- Publication number
- JPH0372153B2 JPH0372153B2 JP60066170A JP6617085A JPH0372153B2 JP H0372153 B2 JPH0372153 B2 JP H0372153B2 JP 60066170 A JP60066170 A JP 60066170A JP 6617085 A JP6617085 A JP 6617085A JP H0372153 B2 JPH0372153 B2 JP H0372153B2
- Authority
- JP
- Japan
- Prior art keywords
- target material
- powder
- density
- alloy
- sputtering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
- Optical Record Carriers And Manufacture Thereof (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Thermal Transfer Or Thermal Recording In General (AREA)
Description
〔産業上の利用分野〕
本発明は、テルル、セレンおよびアンチモンの
うち1種もしくは2種以上を含む薄膜層をスパツ
タリング法により形成する場合に使用されるテル
ル、セレンおよびアンチモンのうち1種又は2種
以上からなる焼結合金ターゲツト材の製造方法に
関する。
〔従来の技術〕
周知のように、テルル、セレンおよびアンチモ
ンのうち1種もしくは2種以上、および/又はそ
れ等の1種以上を含む合金等は光デイスクの記録
媒体薄膜層に好適な素材として実用化されてお
り、同薄膜層は、一般にスパツタリング法により
製造されている。このスパツタリング法に用いら
れるターゲツトは、円形または角形板状のテル
ル、セレンおよびアンチモンのうち1種もしくは
2種以上および/又はそれ等の1種以上を含む合
金等のターゲツト材(以下ターゲツト材という)
とそれにロウ付けされたパツキングプレート(冷
却板)とからなつている。
従来、このようなターゲツト材は、溶解鋳造法
或いは粉末焼結法によつてつくられている。
〔発明が解決しようとする問題点〕
しかし、テルル、セレンおよびアンチモンのう
ちいずれか1種もしくは2種以上を含むこれらタ
ーゲツト材としての組成は、Te,Se,Sb,Te−
Se,Te−Pb,Te−Ge,Te−Se−Cd,Te−Se
−Sb−Ag,Se−Sb,Se−Sn,Se−Sn−In,Se
−Te−Sb等があるが、いずれも極めて脆く、展
延性がなく塑性加工が出来ない。
そのため、溶解鋳造法においては割れ易く、製
品歩留りが悪いのみならず、鋳塊の結晶粒が大き
く、凝固時のガス巻込みがあり、ガスホールを生
じ、したがつて溶解鋳造によるターゲツト材を用
いてスパツタリングを行なうとスパツタリング中
に必ず異常放電が起り安定して薄膜を形成するこ
とが出来ない欠点がある。さらに合金において
は、偏析を生じ易いので、結局、薄膜での組成が
均一に保持出来ない。
他方焼結法はテルル、セレンおよびアンチモン
の単体またはテルル、セレン、およびアンチモン
のうち1種以上を含む合金化した鋳塊を粉砕し、
加圧成形して焼結するものである。この方法によ
つてつくられたターゲツト材は、上記溶解鋳造法
によつてつくられたターゲツト材の種々な欠点は
なくなるが、スパツタリングを行なう場合、ター
ゲツト材の熱伝導が悪く、発生する熱を充分に除
去出来ないため温度が上昇し、高出力に上げるこ
とが出来ない欠点がある。
本発明者らは、上記欠点を解消すべく鋭意研究
した結果、焼結法によつてつくられたターゲツト
材の密度が、単体またはその合金の密度に対して
従来80〜84%であつたものを僅かに高くして85%
以上にすることにより、熱伝導率が大幅に向上す
ることを見出だした。また、加圧成形する際に粉
末原料の粒径を100〜625メツシユに限定すること
により、従来では実現困難だつた85%以上という
焼結密度が得られるという新規な知見を得た。な
お、従来では一般に、原料粉末として100メツシ
ユ程度以下の粉末を用いており、その粒径の下限
を設定していなかつた。このため、原料には625
メツシユよりも微細な粉末が多量に含まれ、また
粒径分布が広い場合には、100メツシユより大き
い粒子もかなり混入していた。前記のような微細
粉末はその単位重量当たりの表面積が極めて大き
いため、粒子表面に自然形成される酸化層の割合
が大きく、粒子間の密着密度が低下し、最終的に
高い密度が得られないものと考えられる。また、
100メツシユよりも大きな粒子が多く混入すれば、
粒子間の隙間が大きくなり、高い焼結密度が得ら
れないものと推測される。
本発明は上記知見に基づいて完成されたもの
で、高出力において効率よくスパツタリングを行
うことができ、均質、平滑で優れたテルル、セレ
ンおよびアンチモンのうち1種もしくは2種以上
を含む合金薄膜が得られるターゲツト材の製造方
法を提供することを目的とする。
〔問題を解決するための手段〕
本発明は、上記の目的を達成するためになされ
たもので、その手段は、テルル、セレンおよびア
ンチモンの単体またはテルル、セレンおよびアン
チモンのうちいずれか1種以上を含む合金の鋳塊
を粉砕し、粒径が100〜625メツシユの均質な粉末
とし、それを高い冷間静水圧で加圧成形して焼成
することにより、密度を単体或いはその合金の密
度の85%以上としたターゲツト材の製造方法であ
る。さらに本発明を詳しく説明する。
本発明に係るターゲツト材の原料として使用さ
れる合金は、テルル、セレンおよびアンチモンの
うちいずれかを10原子%以上含有する合金であ
る。この合金またはテルル、セレンもしくはアン
チモン単体を粉砕し、篩い分け等によつて粒度を
調整し、混合して、100〜625メツシユの結晶サイ
ズの微細化された全体的に均質な粉末とする。こ
の粉末の粒度分布が広過ぎると不均質となり、ま
た粒径が大きすぎても小さすぎても成形体の強度
が上らず、加工中或いはスパツタ中にクラツクが
入りスパツタ中の異常放電の原因となり、さらに
ターゲツト材の密度も高くならない。
次いで通常上記粉末を真空に保持して脱ガスす
る。真空脱ガスの条件としては温度は30℃以上か
ら粉末そのものの蒸気圧が1Torr以下である温度
までの範囲で選択され、真空度は1Torr以下と
し、1〜5時間位の処理が行なわれる。この真空
脱ガス処理は、場合によつてはスパツタリング前
のターゲツト材に施すこともある。
この粉末を高い冷間静水圧によつて加圧成形
し、さらに焼結して単体又は合金そのものの密度
の85%以上の密度の焼結体をつくり、これを機械
加工してターゲツト材を切出し、パツキングプレ
ートとロウ付けしてターゲツトとする。このよう
にして得られたターゲツトは熱伝導率がよく、冷
却が充分に行なわれるので、高出力によつてスパ
ツタリングを行なうことができる。
〔作用〕
本発明に係るターゲツト材の製造方法によれ
ば、単体またはその合金の密度の85%以上の密度
を有するターゲツト材を得ることができ、このタ
ーゲツト材を用いて作成したターゲツトは、よく
冷却され、高出力を付与しても温度があがらず、
効率的なスパツタリングを行うことが可能とな
る。
以下に実施例および比較例を示して本発明をさ
らに詳しく説明する。
〔実施例 1〜14〕
単体または合金をボールミルによつて粉砕し、
篩分けして100〜625メツシユの粉末とし、表に示
す条件で真空脱気した。これを冷間静水圧プレス
によつて加圧成形し、焼結してそれぞれ単体また
は合金塊密度の85%以上の密度の焼結体とした。
この焼結体を機械加工して径が150mm、厚さが6
mmのターゲツト材とした。このターゲツト材にパ
ツキングプレートとして鋼板をロウ付けしてター
ゲツトとし、所定の温度、流量の水で冷却してス
パツタリングを行なつた。
〔比較例 1〜14〕
原料粉末として、粒径分布が100〜625メツシユ
より広いものを使用し、焼結体の密度を単体また
は合金塊の密度の85%未満とした外は、実施例と
同じにしてスパツタリングを行なつた。
実施例、比較例の結果を第1表に示す。
また、第1表の結果を用い、実施例と比較例の
同No.のものについて、焼結密度の向上率(%)
と、熱伝導度の向上率(%)をそれぞれ算出し
た。その結果を第2表に示す。なお、算出方法
は、
(実施例数値−比較例数値)/比較例数値×100
とした。
[Industrial Application Field] The present invention relates to one or more of tellurium, selenium, and antimony used when forming a thin film layer containing one or more of tellurium, selenium, and antimony by a sputtering method. The present invention relates to a method for producing a sintered alloy target material comprising at least one species. [Prior Art] As is well known, one or more of tellurium, selenium and antimony, and/or alloys containing one or more of these, are suitable materials for the recording medium thin film layer of optical disks. In practical use, the thin film layer is generally manufactured by a sputtering method. The target used in this sputtering method is a circular or square plate-shaped target material (hereinafter referred to as target material) such as one or more of tellurium, selenium, and antimony, and/or an alloy containing one or more of these.
It consists of a packing plate (cooling plate) that is soldered to it. Conventionally, such target materials have been produced by melt casting or powder sintering. [Problems to be solved by the invention] However, the composition of these target materials containing one or more of tellurium, selenium, and antimony is Te, Se, Sb, Te-
Se, Te−Pb, Te−Ge, Te−Se−Cd, Te−Se
−Sb−Ag, Se−Sb, Se−Sn, Se−Sn−In, Se
-Te-Sb, etc., but all of them are extremely brittle, have no malleability, and cannot be subjected to plastic working. Therefore, in the melt casting method, not only is the ingot easily cracked and the product yield is poor, but the crystal grains of the ingot are large and gas entrainment occurs during solidification, resulting in gas holes. If sputtering is carried out, abnormal discharge always occurs during sputtering, making it impossible to form a stable thin film. Furthermore, since alloys are prone to segregation, it is not possible to maintain a uniform composition in a thin film. On the other hand, the sintering method involves pulverizing tellurium, selenium, and antimony alone or an alloyed ingot containing one or more of tellurium, selenium, and antimony;
It is press-formed and sintered. The target material made by this method does not have the various disadvantages of the target material made by the above-mentioned melting and casting method, but when sputtering is performed, the target material has poor heat conduction and cannot absorb the generated heat sufficiently. Since it cannot be removed, the temperature rises and the output cannot be increased to a high level. As a result of intensive research aimed at solving the above drawbacks, the present inventors found that the density of the target material made by the sintering method was 80 to 84% of the density of the single substance or its alloy. slightly higher to 85%
It has been found that by doing the above, the thermal conductivity can be significantly improved. In addition, by limiting the particle size of the powder raw material during pressure molding to 100 to 625 mesh, we obtained a new finding that a sintered density of 85% or more, which was difficult to achieve in the past, could be obtained. In addition, in the past, a powder of about 100 mesh or less was generally used as the raw material powder, and no lower limit of the particle size was set. Therefore, the raw material contains 625
A large amount of powder finer than a mesh was contained, and when the particle size distribution was wide, a considerable amount of particles larger than 100 mesh were also mixed in. Since the above-mentioned fine powder has an extremely large surface area per unit weight, a large proportion of the oxidized layer naturally forms on the particle surface, which reduces the adhesion density between the particles and ultimately makes it impossible to obtain a high density. considered to be a thing. Also,
If many particles larger than 100 mesh are mixed in,
It is presumed that the gaps between particles become large, making it impossible to obtain a high sintered density. The present invention was completed based on the above findings, and it is possible to efficiently perform sputtering at high power, and to create an alloy thin film containing one or more of tellurium, selenium, and antimony that is homogeneous, smooth, and excellent. The object of the present invention is to provide a method for manufacturing the target material obtained. [Means for Solving the Problems] The present invention has been made to achieve the above-mentioned object, and the means thereof include the use of tellurium, selenium and antimony alone or any one or more of tellurium, selenium and antimony. By crushing the ingot of the alloy containing the alloy into a homogeneous powder with a particle size of 100 to 625 mesh, press-forming it under high cold isostatic pressure and firing it, the density can be reduced to that of the single substance or the alloy. This is a method for producing a target material with a concentration of 85% or more. The present invention will be further explained in detail. The alloy used as a raw material for the target material according to the present invention is an alloy containing 10 atomic percent or more of any one of tellurium, selenium, and antimony. This alloy or tellurium, selenium, or antimony alone is ground, the particle size is adjusted by sieving, etc., and mixed to obtain a fine, entirely homogeneous powder with a crystal size of 100 to 625 mesh. If the particle size distribution of this powder is too wide, it will become non-uniform, and if the particle size is too large or too small, the strength of the compact will not increase, and cracks will occur during processing or sputtering, causing abnormal electrical discharge during sputtering. Furthermore, the density of the target material does not increase. The powder is then typically held under vacuum to degas it. As conditions for vacuum degassing, the temperature is selected from a range of 30° C. or higher to a temperature at which the vapor pressure of the powder itself is 1 Torr or less, the degree of vacuum is 1 Torr or less, and the treatment is carried out for about 1 to 5 hours. In some cases, this vacuum degassing treatment may be applied to the target material before sputtering. This powder is press-molded using high cold isostatic pressure, and then sintered to create a sintered body with a density of 85% or more of the density of the single substance or alloy itself, which is then machined to cut out the target material. , solder it to the packing plate and use it as a target. Since the target thus obtained has good thermal conductivity and is sufficiently cooled, sputtering can be performed with high output. [Function] According to the method for producing a target material according to the present invention, a target material having a density of 85% or more of the density of a single substance or an alloy thereof can be obtained, and a target made using this target material has a good performance. It is cooled and the temperature does not rise even when high output is applied.
It becomes possible to perform efficient sputtering. The present invention will be explained in more detail by showing Examples and Comparative Examples below. [Examples 1 to 14] Grinding a single substance or alloy with a ball mill,
The powder was sieved to a powder size of 100 to 625 mesh, and vacuum degassed under the conditions shown in the table. This was pressure-formed by cold isostatic pressing and sintered to form a single body or a sintered body having a density of 85% or more of the alloy mass density.
This sintered body is machined to a diameter of 150 mm and a thickness of 6 mm.
The target material was mm. A steel plate was brazed to this target material as a packing plate to serve as a target, and sputtering was performed by cooling with water at a predetermined temperature and flow rate. [Comparative Examples 1 to 14] Same as the examples except that the raw material powder used was one with a particle size distribution wider than 100 to 625 meshes, and the density of the sintered body was less than 85% of the density of the single substance or alloy ingot. Sputtering was performed in the same manner. Table 1 shows the results of Examples and Comparative Examples. In addition, using the results in Table 1, we calculated the improvement rate (%) of sintered density for the same No. of the example and comparative example.
and the improvement rate (%) of thermal conductivity were calculated. The results are shown in Table 2. The calculation method was (Example numerical value - Comparative example numerical value)/Comparative example numerical value x 100.
【表】【table】
【表】【table】
【表】【table】
【表】【table】
以上述べたように、本発明の焼結合金ターゲツ
ト材の製造方法では、原料粉末の粒径を100〜625
メツシユに限定し、その焼結密度を85%以上に高
めることによつて、熱伝導率を大幅に向上したタ
ーゲツト材を製造することができる。そして、こ
のターゲツト材では、冷却が充分に行なわれるの
でターゲツト表面の温度が上らないため高出力に
よるスパツタリングが可能となり、薄膜の形成速
度が早く、従来の焼結法によつてつくられたター
ゲツト材に比して極めて効率のよいスパツタリン
グを行なうことが出来る。
As described above, in the method for producing a sintered alloy target material of the present invention, the particle size of the raw material powder is set to 100 to 625.
By limiting the method to mesh and increasing its sintered density to 85% or more, it is possible to produce a target material with significantly improved thermal conductivity. With this target material, sufficient cooling is performed, so the temperature of the target surface does not rise, making it possible to perform sputtering with high output, resulting in a faster formation of a thin film, compared to targets made by conventional sintering methods. It is possible to perform sputtering with extremely high efficiency compared to other materials.
第1図は本発明の効果を示すグラフである。 FIG. 1 is a graph showing the effects of the present invention.
Claims (1)
もしくは2種以上の粉末および/またはこれらの
一種もしくは2種以上を含む合金粉末を冷間静水
圧で加圧成形し、焼結する焼結合金ターゲツト材
の製造方法において、前記粉末の粒径を100〜625
メツシユに限定するとともに、全体的に組成を均
一とし、焼結密度を85%以上とすることを特徴と
する焼結合金ターゲツト材の製造方法。1 Production of a sintered alloy target material by press-forming powder of one or more of tellurium, selenium, and antimony and/or alloy powder containing one or more of these using cold isostatic pressure and sintering. In the method, the particle size of the powder is 100-625
A method for producing a sintered alloy target material, which is limited to a mesh, has a uniform composition overall, and has a sintered density of 85% or more.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60066170A JPS61227167A (en) | 1985-03-29 | 1985-03-29 | Sintered alloy target material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60066170A JPS61227167A (en) | 1985-03-29 | 1985-03-29 | Sintered alloy target material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61227167A JPS61227167A (en) | 1986-10-09 |
| JPH0372153B2 true JPH0372153B2 (en) | 1991-11-15 |
Family
ID=13308103
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60066170A Granted JPS61227167A (en) | 1985-03-29 | 1985-03-29 | Sintered alloy target material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61227167A (en) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS621146A (en) * | 1985-06-27 | 1987-01-07 | Toyo Soda Mfg Co Ltd | Sputtering target for optical recording and its production |
| JPS6395983A (en) * | 1986-10-14 | 1988-04-26 | Mitsubishi Kasei Corp | Optical recording medium |
| JPS63143258A (en) * | 1986-12-05 | 1988-06-15 | Mitsubishi Metal Corp | Sputtering target |
| CN100369141C (en) * | 2002-02-25 | 2008-02-13 | 日矿金属株式会社 | Sputtering target for phase change memory and method for producing same |
| JP4497228B2 (en) * | 2008-05-01 | 2010-07-07 | ソニー株式会社 | Optical recording medium and method for manufacturing the same, target for sputtering and method for manufacturing the same |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57203771A (en) * | 1981-06-10 | 1982-12-14 | Mitsubishi Metal Corp | Manufacture of target for vapor-deposition |
-
1985
- 1985-03-29 JP JP60066170A patent/JPS61227167A/en active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61227167A (en) | 1986-10-09 |
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