JPH0374858A - Carrying device - Google Patents

Carrying device

Info

Publication number
JPH0374858A
JPH0374858A JP1210148A JP21014889A JPH0374858A JP H0374858 A JPH0374858 A JP H0374858A JP 1210148 A JP1210148 A JP 1210148A JP 21014889 A JP21014889 A JP 21014889A JP H0374858 A JPH0374858 A JP H0374858A
Authority
JP
Japan
Prior art keywords
retaining
holding table
stand
recess
carried
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1210148A
Other languages
Japanese (ja)
Other versions
JP2804794B2 (en
Inventor
Takashi Miyatani
孝 宮谷
Kazuya Okubo
一也 大久保
Takashi Araki
隆 荒木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP21014889A priority Critical patent/JP2804794B2/en
Publication of JPH0374858A publication Critical patent/JPH0374858A/en
Application granted granted Critical
Publication of JP2804794B2 publication Critical patent/JP2804794B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To reverse an object to be carried without smearing its abrasion surface and enable it to be carried to a next process automatically by holding a recessed part for retaining and storing the object to be carried with spray of a fluid from the bottom surface using two retaining stands which can be reversed and then carrying it. CONSTITUTION:A silicon wafer 30 which is machined by a branches and leaves type abrasion machine has its abrasion surface to be directed downward by a vacuum chuck 40, is positioned on a retaining stand 1, and is retained in a lifted state by spray of pure water from a spray port 11. Then, a second retaining stand 2 is rotated and is placed on the retaining stand 1, pure water is sprayed also from a second spray port 22, thus resulting in inversion around an axis 15 by a rotary actuator 17 while the wafer 30 is lifted halfway at a recessed part of both retaining stands and directing the abrasion surface upward. By stopping spraying of water of the retaining stand 1 and then opening it, the wafer 30 can be automatically carried to another treatment device 50 without being in contact with the retaining stand since the spray port 22 of the retaining stand 2 slants toward the opening side of the recessed part.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は搬送装置に関し、特に研磨加工された薄板、例
えばシリコンウェハや石英フォトマスクなどの搬送に使
用されるものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a transport device, and is particularly used for transporting polished thin plates, such as silicon wafers and quartz photomasks.

〔従来の技術及び発明が解決しようとする課題〕従来、
研磨加工されたシリコンウェハや石英フォトマスクなど
は、例えばビンセットを用いて下向きになった研磨面を
上向きに反転させて搬送している。
[Problems to be solved by conventional techniques and inventions] Conventionally,
Polished silicon wafers, quartz photomasks, and the like are transported using, for example, a bin set with the polished surface facing downward turned upward.

しかし、ビンセット−を用いた場合、 ■シリコンウェハや石英フォトマスクの研磨面をビンセ
ットで挟むので、研磨面にビンセットの汚れが移る。
However, when a bottle set is used, (1) the polished surface of a silicon wafer or quartz photomask is sandwiched between the bottle sets, so dirt from the bottle set is transferred to the polished surface.

■手作業であるため、シリコンウェハや石英フォトマス
クをカセットに挿入する際カセットに接触して、研磨面
に□カセットの汚れが移る。
■Since it is done by hand, when inserting a silicon wafer or quartz photomask into the cassette, it comes into contact with the cassette and dirt from the □cassette is transferred to the polished surface.

■手作業であるため、ロフト単位の処理にならざるを得
ず、1分間に1枚処理するなどの間欠処理や枚葉処理に
は不向きである。
■Since it is a manual process, it has to be processed in units of lofts, making it unsuitable for intermittent processing or single-wafer processing, such as processing one sheet per minute.

本発明は前述した問題点を解消するためになされたもの
であり、シリコンウェハや石英フォトマスクの研磨面を
汚すことのなく、枚葉処理も可能な搬送装置を提供する
ことを目的とする。
The present invention has been made in order to solve the above-mentioned problems, and an object of the present invention is to provide a transfer device that can perform single-wafer processing without contaminating the polished surfaces of silicon wafers and quartz photomasks.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の搬送装置は、平板状の被搬送体を収容可能な凹
部を有し、この凹部底面に流体の噴出口が設けられた第
1の保持台と、この第1の保持台に回動可能に取り付け
られ、第1の保持台の凹部に対向するように、平板状の
被搬送体を収容可能で一側面が開放した凹部を有し、こ
の凹部底面に開放した側面方向へ傾斜した流体の噴出口
が設けられた第2の保持台と、前記第1及び第2の保持
台を水平軸を中心として反転させる機構とを具備したこ
とを特徴とするものである。
The conveyance device of the present invention has a recess capable of accommodating a flat plate-shaped object to be conveyed, and a first holding table provided with a fluid spout at the bottom of the recess, and a rotatable portion of the first holding table. The first holding table has a recess capable of accommodating a flat object and having one side open so as to face the recess of the first holding table, and a fluid inclined toward the open side at the bottom of the recess. The present invention is characterized by comprising a second holding stand provided with a spout, and a mechanism for inverting the first and second holding stands about a horizontal axis.

〔作 用〕[For production]

本発明の搬送装置では、以下のようにしてシリコンウェ
ハや石英フォトマスクなどの被搬送体を搬送する。研磨
機で加工された被搬送体を、他の搬送装置によりその研
磨面を下に向けた状態で第1の保持台上に搬送する。第
1の保持台から被搬送体の研磨面へ水又はエアなどの流
体を噴出させ、他の搬送装置から被搬送体を放して、第
1の保持台の凹部にこれを浮揚させた状態で保持する。
The transport device of the present invention transports objects to be transported, such as silicon wafers and quartz photomasks, in the following manner. The object to be transported that has been processed by the polishing machine is transported onto the first holding table with its polished surface facing downward by another transport device. Fluid such as water or air is ejected from the first holding table onto the polishing surface of the object to be conveyed, the object to be conveyed is released from the other conveyance device, and the object is levitated in the recessed part of the first holding table. Hold.

第1の保持台上に第2の保持台をかぶせた後、第1及び
第2の保持台から被搬送体の両面へ流体を噴出させて両
者の間の凹部に被搬送体を浮揚させた状態で保持する。
After the second holding table was placed over the first holding table, fluid was ejected from the first and second holding tables to both sides of the object to be transported, and the object to be transported was levitated in the recess between them. hold in condition.

第1及び第2の保持台を水平軸を中心として反転させ、
被搬送体の研磨面を上に向ける。第1の保持台から流体
の噴出を止めて、第2の保持台上から第1の保持台をは
ずす。第2の保持台の噴出口から流体の噴出を続けると
、この噴出口は開放した側面方向へ傾斜しているため、
水平方向の推進力を受け、第2の保持台の開放した側面
から他の処理装置上へ搬送することができる。
inverting the first and second holding tables around the horizontal axis;
Turn the polished side of the transported object upward. The ejection of fluid from the first holding table is stopped, and the first holding table is removed from the second holding table. When fluid continues to be ejected from the ejection port of the second holding table, since this ejection port is inclined toward the open side,
It can be transferred from the open side of the second holding table onto another processing device by receiving a horizontal propulsion force.

〔実施例〕〔Example〕

以下、本発明の実施例を図面を参照して説明する。 Embodiments of the present invention will be described below with reference to the drawings.

第1図(a)〜(e)は本発明に係る搬送装置の操作方
法を示す断面図、第2図は第1図(b)の■−■矢視図
、第3図は第1図(b)の■−■矢視図である。以下の
実施例においては、本発明に係る搬送装置を用いて研磨
面加工されたシリコンウェハを搬送する場合について説
明する。
1(a) to 1(e) are cross-sectional views showing the operating method of the conveying device according to the present invention, FIG. 2 is a view taken along the ■-■ arrow in FIG. 1(b), and FIG. It is a ■-■ arrow view of (b). In the following embodiments, a case will be described in which a silicon wafer whose surface has been polished is transported using a transport device according to the present invention.

第1図〜第3図において、第1の保持台1と第2の保持
台2とはヒンジ3により回動可能に取り付けられている
。第1の保持台1はシリコンウェハを収容できる円形の
凹部11を有し、この凹部11の底面には鉛直方向に噴
出口12が設けられている。
In FIGS. 1 to 3, a first holding stand 1 and a second holding stand 2 are rotatably attached by a hinge 3. As shown in FIGS. The first holding table 1 has a circular recess 11 capable of accommodating a silicon wafer, and a spout 12 is provided in the bottom surface of the recess 11 in the vertical direction.

この噴出口12は第1の保持台1の内部に設けられた流
通路13に連通し、この流通路t3にはパイプ14が接
続されている。この第1の保持台1では、外部から圧送
された純水がバイブ14及び流通路13を通って噴出口
12から噴出する。また、この第1の保持台1には軸1
5が取り付けられ、この軸15は軸受16によって支持
され、ロータリーアクチュエータ17によって回転でき
るようになっている。第2の保持台2は、第1図(b)
の状態で第1の保持台1の凹部11に対向するように、
シリコンウェハ\を収容できる凹部21を有しているが
、第2の保持台2のヒンジ3と反対側の側面には凹部側
壁がなく、この側面は外部へ開放されている。この凹部
21の底面には開放された側面方向へ傾斜した噴出口2
2が設けられている。この噴出口22は第2の保持台2
の内部に設けられた流通路23に連通し、この流通路2
3にはバイブ24が接続されている。この第2の保持台
2では、外部から圧送された純水がパイプ24及び流通
路23を通って噴出口22から噴出する。
This spout 12 communicates with a flow passage 13 provided inside the first holding table 1, and a pipe 14 is connected to this flow passage t3. In this first holding table 1 , pure water that is force-fed from the outside passes through the vibrator 14 and the flow path 13 and is ejected from the ejection port 12 . Also, this first holding table 1 has a shaft 1.
5 is attached, this shaft 15 is supported by a bearing 16, and can be rotated by a rotary actuator 17. The second holding table 2 is shown in FIG. 1(b).
so as to face the recess 11 of the first holding base 1 in the state of
Although it has a recess 21 capable of accommodating a silicon wafer, there is no recess side wall on the side of the second holding table 2 opposite to the hinge 3, and this side is open to the outside. The bottom of this recess 21 has a spout 2 that is open and slopes toward the side.
2 is provided. This spout 22 is connected to the second holding base 2
communicates with a flow path 23 provided inside the flow path 2.
3 is connected to a vibrator 24. In this second holding table 2, pure water pumped from the outside passes through the pipe 24 and the flow path 23 and is ejected from the ejection port 22.

この搬送装置を用いてシリコンウェハを搬送する操作を
第1図(a)〜(e)を参照して説明する。
The operation of transporting a silicon wafer using this transport device will be explained with reference to FIGS. 1(a) to 1(e).

まず、枚葉形研磨機で加工されたシリコンウェハ30を
、真空チャック40によりその研磨面を下に向けた状態
で第1の保持台1上に搬送されて位置決めする。次に、
IJIの保持台1の噴出口11からシリコンウェハ30
の研磨面へ純水を噴出させ、真空チャック40からシリ
コンウェハ30を放して、第1の保持台1の凹部11に
これを浮揚させた状態で保持する。つづいて、第2の保
持台2を回動させ、第1の保持台1上に第2の保持台2
をかぶせた後、第2の保持台2の噴出口22からも純水
を噴出させる。こうして、シリコンウェハ30の両面へ
純水を噴出させ、第1の保持台1と第2の保持台2との
間の凹部にシリコンウェハ30を浮揚させた状態で保持
する。次いで、ロータリーアクチュエータ17を作動さ
せ、第1の保持台1及び第2の保持台2を水平軸を中心
として反転させ、シリコンウェハ30の研磨面を上に向
ける。その後、第1の保持台1から純水の噴出を止めて
、第1の保持台1を回動させて第2の保持台2上から第
1の保持台1をはずす。更に、第2の保持台2の噴出口
22から純水の噴出を続けると、この噴出口22は開放
した側面方向へ傾斜しているため、水平方向の推進力を
受け、第2の保持台2の開放した側面から他の処理装置
50上へ搬送することができる。
First, a silicon wafer 30 processed by a single-wafer polishing machine is transported and positioned on the first holding table 1 with its polished surface facing downward by a vacuum chuck 40. next,
Silicon wafer 30 from the spout 11 of the holding table 1 of IJI
The silicon wafer 30 is released from the vacuum chuck 40 and held in the recess 11 of the first holding table 1 in a suspended state. Next, the second holding table 2 is rotated, and the second holding table 2 is placed on the first holding table 1.
After covering with water, pure water is also spouted from the spout 22 of the second holding table 2. In this way, pure water is jetted onto both sides of the silicon wafer 30, and the silicon wafer 30 is held in a floating state in the recess between the first holding table 1 and the second holding table 2. Next, the rotary actuator 17 is actuated to invert the first holding table 1 and the second holding table 2 about the horizontal axis, so that the polished surface of the silicon wafer 30 faces upward. Thereafter, the jetting of pure water from the first holding table 1 is stopped, the first holding table 1 is rotated, and the first holding table 1 is removed from the second holding table 2. Furthermore, when pure water continues to be spouted from the spout 22 of the second holding table 2, since the spout 22 is inclined toward the opened side, it receives a horizontal driving force, and the second holding table 2 2 can be transferred onto another processing device 50 from the open side.

〔発明の効果〕〔Effect of the invention〕

以上詳述したように本発明の搬送装置を用いれば、次の
ような効果が得られる。
As described in detail above, by using the conveying device of the present invention, the following effects can be obtained.

■被搬送体を反転させる際に、その研磨面を搬送装置本
体に接触させることがないので、研磨面に汚れが移るこ
とがない。
(2) When reversing the conveyed object, the polished surface does not come into contact with the main body of the conveying device, so dirt does not transfer to the polished surface.

■搬送装置の動作を自動化して、枚葉形研磨機のサイク
ルに合わせて被搬送体を搬送することができる。
- The operation of the transport device can be automated to transport objects in accordance with the cycle of the single-fed polisher.

■噴出口から噴出させる流体として純水を用いれば、洗
浄効果も付与することができる。
(2) If pure water is used as the fluid spouted from the spout, a cleaning effect can also be imparted.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(a)〜(C)は本発明に係る搬送装置の操作方
法を示す断面図、第2図は第1図(b)の■−■矢視図
、第3図は第1図(b)の■−■矢視図である。 1・・・第1の保持台、2・・・第2の保持台、3・・
・ヒンジ、IL 21・・・凹部、12.22・・・噴
出口、13.23・・・流通路、14.24・・・パイ
プ、15・・・軸、IB・・・軸受、17・・・ロータ
リーアクチュエータ、30・・・シリコンウェハ、40
・・・真空チャック、50・・・搬送装置。
FIGS. 1(a) to (C) are cross-sectional views showing the operating method of the conveying device according to the present invention, FIG. 2 is a view taken along the ■-■ arrow in FIG. 1(b), and FIG. It is a ■-■ arrow view of (b). 1... first holding stand, 2... second holding stand, 3...
・Hinge, IL 21... Recess, 12.22... Spout, 13.23... Flow path, 14.24... Pipe, 15... Shaft, IB... Bearing, 17. ...Rotary actuator, 30...Silicon wafer, 40
...Vacuum chuck, 50...Transfer device.

Claims (1)

【特許請求の範囲】[Claims] 平板状の被搬送体を収容可能な凹部を有し、この凹部底
面に流体の噴出口が設けられた第1の保持台と、この第
1の保持台に回動可能に取り付けられ、第1の保持台の
凹部に対向するように、平板状の被搬送体を収容可能で
一側面が開放した凹部を有し、この凹部底面に開放した
側面方向へ傾斜した流体の噴出口が設けられた第2の保
持台と、前記第1及び第2の保持台を水平軸を中心とし
て反転させる機構とを具備したことを特徴とする搬送装
置。
a first holding table having a recess capable of accommodating a flat plate-shaped object and having a fluid spout provided at the bottom of the recess; Opposed to the recess of the holding table, the recess is capable of accommodating a flat plate-shaped object and is open on one side, and a fluid spout is provided at the bottom of the recess that slopes toward the open side. A conveying device comprising: a second holding table; and a mechanism for reversing the first and second holding tables about a horizontal axis.
JP21014889A 1989-08-16 1989-08-16 Transfer device Expired - Fee Related JP2804794B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP21014889A JP2804794B2 (en) 1989-08-16 1989-08-16 Transfer device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP21014889A JP2804794B2 (en) 1989-08-16 1989-08-16 Transfer device

Publications (2)

Publication Number Publication Date
JPH0374858A true JPH0374858A (en) 1991-03-29
JP2804794B2 JP2804794B2 (en) 1998-09-30

Family

ID=16584563

Family Applications (1)

Application Number Title Priority Date Filing Date
JP21014889A Expired - Fee Related JP2804794B2 (en) 1989-08-16 1989-08-16 Transfer device

Country Status (1)

Country Link
JP (1) JP2804794B2 (en)

Also Published As

Publication number Publication date
JP2804794B2 (en) 1998-09-30

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