JPH0376111A - Vapor deposition process and device therefor - Google Patents
Vapor deposition process and device thereforInfo
- Publication number
- JPH0376111A JPH0376111A JP21207489A JP21207489A JPH0376111A JP H0376111 A JPH0376111 A JP H0376111A JP 21207489 A JP21207489 A JP 21207489A JP 21207489 A JP21207489 A JP 21207489A JP H0376111 A JPH0376111 A JP H0376111A
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- phase growth
- vapor phase
- substrate surface
- gas
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、周期律表■属とV属の原料成分、または、周
期律表r1mと■属の原料成分を混合して気相成長ガス
とし、これを気相成長室内の所定の温度に昇温させた基
板上に供給して該基板上で加熱分解させ、該加熱分解に
伴う反応生成物を該基板面上に堆積させて薄膜を形成す
る気相成長方法及びその装置に関し、熱分解しにくい原
料成分、または、比較的低温で反応してしまう原料成分
を用いた場合に好適な気相成長方法及びその装置に関す
るものである。Detailed Description of the Invention [Industrial Application Field] The present invention provides a method for producing a vapor-phase growth gas by mixing raw material components in Groups II and V of the Periodic Table, or raw material components in Groups R1M and Group II of the Periodic Table. This is supplied onto a substrate heated to a predetermined temperature in a vapor phase growth chamber, thermally decomposed on the substrate, and reaction products resulting from the thermal decomposition are deposited on the substrate surface to form a thin film. The present invention relates to a vapor phase growth method and an apparatus therefor, which are suitable for using a raw material component that is difficult to thermally decompose or a raw material component that reacts at a relatively low temperature.
気相成長方法は、通常、原料成分を予め混合して気相成
長ガスとし、これを気相成長室内の基板上に供給してい
る。In the vapor phase growth method, raw material components are usually mixed in advance to form a vapor phase growth gas, which is then supplied onto a substrate in a vapor phase growth chamber.
しかし、ホスフィン(PH3、V属の原料成分)のよう
に熱分解しにくい原料成分を含む気相成長ガスでは、ホ
スフィンの使用量が他の■属の原料成分に対して増加し
、コストの上昇をもたらすと共に、除害装置にも過大な
負担をかけることとなり、また、比較的低温で反応し易
い原料成分、例えば、トリメチルジンク(TMZn11
I属の原料成分)とセレン化水素(H2Se、■属の原
料成分)を用いてZn5e薄膜を形成する場合にも、こ
れらを予め混合すると気相成長室に到達する前に一部反
応生成物を生成してしまい良好な気相成長が実施できな
いと言う不都合がある。However, in vapor growth gases that contain raw material components that are difficult to thermally decompose, such as phosphine (PH3, a raw material component of group V), the amount of phosphine used increases relative to other raw material components of group II, resulting in an increase in cost. At the same time, it places an excessive burden on the abatement equipment, and raw material components that easily react at relatively low temperatures, such as trimethyl zinc (TMZn11
Even when forming a Zn5e thin film using hydrogen selenide (H2Se, a raw material component in group I) and hydrogen selenide (H2Se, a raw material component in group This has the disadvantage that good vapor phase growth cannot be carried out due to the formation of .
そこで、これらの原料成分を用いる場合には、個々に気
相成長室内に供給し、該気相成長室内で混合して気相成
長ガスとしている。Therefore, when these raw material components are used, they are individually supplied into a vapor phase growth chamber and mixed in the vapor phase growth chamber to form a vapor phase growth gas.
例えば、第3図に例示した従来装置では、ホスフィンと
トリメチルガリウム(TMGa、m属の原料成分)を用
いて基板上にガリウムリン(GaP)薄膜を形成する場
合は、ホスフィンをヒータ1を有するガス導入管2の該
ヒータ1で600〜1000℃に加熱して、また、トリ
メチルガリウムはガス導入管3を介してそのまま、各々
気相成長室4内の基板Pの上流側に導入し、ここで混合
して気相成長ガスとして基板P上に供給している。For example, in the conventional apparatus illustrated in FIG. The heater 1 of the introduction tube 2 heats the trimethyl gallium to 600 to 1000°C, and trimethyl gallium is directly introduced to the upstream side of the substrate P in the vapor growth chamber 4 through the gas introduction tube 3. The mixed gases are supplied onto the substrate P as a vapor growth gas.
上記装置によれば、ホスフィンは前記ヒータ1によって
一部分解され、多量の活性種を生成するので、加熱しな
い場合より少量のホスフィンで所望の薄膜を形成するこ
とができる。なお、トリメチルジンクとセレン化水素を
気相成長室内に個々に導入する場合には前記ヒータ1は
不要である。According to the above apparatus, phosphine is partially decomposed by the heater 1 and a large amount of active species are generated, so that a desired thin film can be formed using a smaller amount of phosphine than when no heating is performed. Note that the heater 1 is not required when trimethyl zinc and hydrogen selenide are individually introduced into the vapor phase growth chamber.
しかし、前記のように個々の原料成分を気相成長室4内
で混合するようにしても、例えば、ホスフィンとトリメ
チルガリウムを同時に気相成長室4内に供給した場合、
混合直後にトリメチルガリウムが高温のホスフィンに接
触して熱分解し、基板Pに到達する前に反応生成物が一
部生成されるため良好な気相成長が実施できない不都合
があった。また、トリメチルジンクとセレン化水素の場
合も気相成長室内で混合直後に反応するため同様の不都
合を生じていた。However, even if the individual raw material components are mixed in the vapor phase growth chamber 4 as described above, for example, if phosphine and trimethyl gallium are simultaneously supplied into the vapor phase growth chamber 4,
Immediately after mixing, trimethyl gallium comes into contact with high-temperature phosphine and thermally decomposes, and some reaction products are generated before reaching the substrate P, resulting in the inconvenience that good vapor phase growth cannot be performed. Further, trimethyl zinc and hydrogen selenide also react with each other immediately after being mixed in the vapor growth chamber, resulting in a similar problem.
そこで、これを避けるため、例えば、前記第3図の従来
装置のホスフィン用のガス導入管2の開口端を破線で示
したように基板面に近接させて前記混合時の反応生成物
の生成を防止することも提案されているが、このように
すると今度は基板面での混合状態が不十分となり、良好
な気相成長ガスが生成されず、やはり良好な気相成長が
実施できなかった。Therefore, in order to avoid this, for example, the open end of the gas introduction tube 2 for phosphine in the conventional apparatus shown in FIG. Although it has been proposed to prevent this, the mixing state on the substrate surface is insufficient, and a good vapor phase growth gas is not generated, so that good vapor phase growth cannot be performed.
本発明はこのような不都合を解決した気相成長方法及び
その装置を提供することを目的とする。It is an object of the present invention to provide a vapor phase growth method and an apparatus therefor that solve these problems.
前記不都合に鑑み、本発明者は種々考究した結果、複数
の原料成分を基板面に平行(=供給して該基板面上で混
合すると良好な気相成長ガスが生成されることを見い出
し、これに基づいて本発明を完成したものである。In view of the above-mentioned disadvantages, the present inventor conducted various studies and found that a good vapor phase growth gas can be produced by supplying a plurality of raw material components parallel to the substrate surface and mixing them on the substrate surface. The present invention was completed based on this.
本発明は前記知見に基づいてなされたもので、請求項1
に記載の発明は、複数の原料成分を各々、水平回転させ
た基板の基板面に、該基板面と同一高さで、かつ該基板
面に平行に供給し、該基板面上で混合して気相成長ガス
を生成すると共に、該気相成長ガスを該基板面上で加熱
分解して反応生成物を該基板面上に堆積させて薄膜を形
成することを特徴とする。The present invention has been made based on the above knowledge, and claims 1
In the invention described in , a plurality of raw material components are each supplied to the substrate surface of a horizontally rotated substrate at the same height as the substrate surface and parallel to the substrate surface, and mixed on the substrate surface. The method is characterized in that a vapor phase growth gas is generated, the vapor phase growth gas is thermally decomposed on the substrate surface, and a reaction product is deposited on the substrate surface to form a thin film.
また、請求項2に記載の発明は、気相成長室の下部に基
板交換室を連設し、基板を載置した保持台を水平回転可
能かつ気相成長室と基板交換室間に昇降可能に設けた気
相成長装置において、複数の原料成分を各々供給するガ
ス導入管を気相成長室の側面に夫々設けるとともに、各
ガス導入管のフローチャンネルを気相成長室内に上昇し
ている保持台に近接するよう配置し、かつ各フローチャ
ンネルの下面部を気相成長室内で水平回転している基板
面と同一高さに設定したことを特徴とする。In addition, the invention according to claim 2 has a substrate exchange chamber connected to the lower part of the vapor growth chamber, and the holding table on which the substrate is placed can be horizontally rotated and can be moved up and down between the vapor growth chamber and the substrate exchange chamber. In a vapor-phase growth apparatus installed in It is characterized in that it is arranged close to the table, and the lower surface of each flow channel is set at the same height as the surface of the substrate that is horizontally rotating in the vapor growth chamber.
〔作 用〕
本発明に係る気相成長ガス及びその装置によれば、個々
の原料成分は基板上で初めて混合し、直後に反応生成物
が生成されるので良好な気相成長が実施できる。[Function] According to the vapor phase growth gas and apparatus thereof according to the present invention, the individual raw material components are mixed for the first time on the substrate, and reaction products are generated immediately after, so that good vapor phase growth can be performed.
基板上に個々に供給された原料成分は、その供給端では
混合不十分であるが基板上を流通する過程での他の原料
成分と混合し、良好な気相成長ガスが形成される。そし
て、基板は前記の如く水平回転しているので、原料成分
の供給端で多少の混合不十分が生じても平均化し、基板
上には均一な薄膜が形成される。Although the raw material components individually supplied onto the substrate are not sufficiently mixed at the supply end, they are mixed with other raw material components during the course of flowing over the substrate, and a good vapor phase growth gas is formed. Since the substrate is horizontally rotated as described above, even if some insufficient mixing occurs at the supply end of the raw material components, it is averaged out and a uniform thin film is formed on the substrate.
以下、図面を用いて本発明の一実施例を説明する。 An embodiment of the present invention will be described below with reference to the drawings.
第1図は本発明方法を応用した実施例装置の正面断面図
、第2図は第1図の■−■断面図で、この気相成長装置
10は、円筒状の気相成長室11の下部に、成膜基板と
未処理基板の交換を行う基板交換室12が連設し、該基
板交換室12には、上端に基板の保持と加熱とを行う保
持台13を有して両室11.12間を昇降すると共に、
水平方向に回転可能に構成された軸部材14が設けられ
ている。FIG. 1 is a front cross-sectional view of an embodiment of an apparatus to which the method of the present invention is applied, and FIG. 2 is a cross-sectional view taken along the line ■-■ in FIG. At the bottom, a substrate exchange chamber 12 for exchanging film-formed substrates and unprocessed substrates is installed, and the substrate exchange chamber 12 has a holding table 13 at the upper end for holding and heating the substrate, so that both chambers can be exchanged. As well as going up and down between 11 and 12,
A shaft member 14 configured to be horizontally rotatable is provided.
また、気相成長室11には、側面に3つのガス導入管1
5.16.17と1つのガス導出管18が設けられてお
り、これらガス導入管15.16゜17は、気相成長室
11の側面に同一高さで、かつ、相互の角度を60度に
して配置されていると共に、各々基板P側に向けて拡開
する扇形のフローチャンネル19.20,21を有して
いる。In addition, the vapor growth chamber 11 has three gas introduction pipes 1 on the side.
5, 16, 17 and one gas outlet pipe 18 are provided, and these gas inlet pipes 15, 16, 17 are at the same height on the side of the vapor growth chamber 11, and at an angle of 60 degrees to each other. The flow channels 19, 20, and 21 each have a fan shape that expands toward the substrate P side.
このフローチャンネル19.20.21は、基板側開口
端の上面部が保持台13の天井面を形成する円形の天板
22に連設され、また、基板側開口端の下面部は保持台
13上の基板面(基板Pは薄いので実質的に保持台13
の上面部とほぼ同一)と同一高さで、かつ、保持台13
の側面の形状に合わせて弧状に切り欠かれて該保持台1
3に近接されている。なお、図の実施例装置では、第1
のガス導入管15をホスフィン導入用とするため、該ガ
ス導入管15の出口端にヒータ23を設けである。The flow channel 19, 20, 21 has an upper surface part of the opening end on the substrate side connected to a circular top plate 22 forming the ceiling surface of the holding table 13, and a lower surface part of the opening end on the substrate side forming the ceiling surface of the holding table 13. The upper substrate surface (substrate P is thin, so it is practically the holding base 13
(almost the same as the top surface of the holding table 13), and
The holding base 1 is cut out in an arc shape according to the shape of the side surface of the holding base 1.
It is close to 3. In addition, in the example device shown in the figure, the first
In order to use the gas introduction pipe 15 for introducing phosphine, a heater 23 is provided at the outlet end of the gas introduction pipe 15.
次に、この気相成長装置10を用いて、保持台13上に
3枚の基板Pを配置し、該基板P上にGaP薄膜を形成
する場合について説明する。Next, a case will be described in which three substrates P are placed on the holding table 13 and a GaP thin film is formed on the substrates P using this vapor phase growth apparatus 10.
まず、基板交換室12内で、保持台13上に未処理基板
Pを載置し、軸部材14を上動して該保持台13を気相
成長室11内の所定の位置にセットシ、基板Pの上面を
フローチャンネル19,20.21の下面部と同一高さ
にする。First, in the substrate exchange chamber 12, an unprocessed substrate P is placed on the holding table 13, and the shaft member 14 is moved upward to set the holding table 13 at a predetermined position in the vapor growth chamber 11. The upper surface of P is at the same height as the lower surface of the flow channels 19, 20, and 21.
次いで、軸部材14を介して保持台13を水平方向に回
転すると共に、該保持台13のヒータ(図示省略)を作
動して基板Pを所定の温度に昇温し、第1のガス導入管
15にホスフィンを、第2のガス導入管16にトリメチ
ルガリウムを各々キャリアガスに同伴させて導入する。Next, the holding table 13 is rotated in the horizontal direction via the shaft member 14, and the heater (not shown) of the holding table 13 is activated to raise the temperature of the substrate P to a predetermined temperature, and the first gas introduction pipe is heated. Phosphine is introduced into 15, and trimethyl gallium is introduced into the second gas introduction pipe 16 together with a carrier gas.
これによって、ホスフィンはヒータ23で予熱され一部
分解された状態で基板面に供給され、方、トリメチルガ
リウムはそのまま基板面に供給されて該基板面上で熱分
解して前記熱分解されたホスフィンと混合して気相成長
ガスが生成されると同時に、この生成された気相成長ガ
スが該基板面上で反応して反応生成物が生成され該基板
面上に堆積して薄膜が形成される。As a result, phosphine is preheated by the heater 23 and is supplied to the substrate surface in a partially decomposed state, while trimethyl gallium is supplied as it is to the substrate surface and is thermally decomposed on the substrate surface to form the thermally decomposed phosphine. At the same time that the vapor phase growth gas is mixed and generated, the generated vapor phase growth gas reacts on the substrate surface to generate a reaction product, which is deposited on the substrate surface to form a thin film. .
このように、原料成分は、各々基板面上で熱分解された
状態で混合し、直ちに反応を開始するか−、基板面上で
の反応なので反応生成物は基板面に堆積し良好な薄膜が
形成される。In this way, the raw material components are either mixed in a thermally decomposed state on the substrate surface and immediately start the reaction, or because the reaction is on the substrate surface, the reaction products are deposited on the substrate surface and a good thin film is formed. It is formed.
なお、各フローチャンネルの開口端での原料成分は他の
原料成分との混合が十分ではないが、基板上を基板面と
平行に流通する過程で他の原料成分と混合し良好な気相
成長ガスが形成され、かつ、基板は前記の如く水平回転
しているので混合状態が均一化し、基板上には均一な薄
膜が形成される。Note that although the raw material components at the open end of each flow channel are not sufficiently mixed with other raw material components, they mix with other raw material components during the process of flowing over the substrate parallel to the substrate surface, resulting in good vapor phase growth. Since the gas is formed and the substrate is horizontally rotated as described above, the mixing state becomes uniform, and a uniform thin film is formed on the substrate.
基板上に所定の薄膜が形成され成膜基板が得られたら、
気相成長ガスの導入を停止し、気相成長室11内をパー
ジした後、軸部材14を下動して保持台13を基板交換
室12内に搬送し、該保持台13上に成膜基板と未処理
基板を移し替え、以下、軸部材14を上動して再び気相
成長を実施する。Once a predetermined thin film is formed on the substrate and a film-forming substrate is obtained,
After stopping the introduction of the vapor growth gas and purging the inside of the vapor growth chamber 11, the shaft member 14 is moved down to transport the holding table 13 into the substrate exchange chamber 12, and a film is formed on the holding table 13. After the substrate and the untreated substrate are transferred, the shaft member 14 is moved upward and vapor phase growth is performed again.
なお、前記実施例では、ガス導入管15.16を用いた
が、これに限定されず任意の2つのガス導入管を用いて
も良く、この場合、2つの原料成分の流れ方向が180
度以下、望ましくは120度以下の角度になるようにす
るのが好ましい。In the above embodiment, the gas introduction pipes 15 and 16 were used, but the present invention is not limited to this, and any two gas introduction pipes may be used. In this case, the flow direction of the two raw material components is 180 degrees.
Preferably, the angle is less than 120 degrees, preferably less than 120 degrees.
また、前記実施例装置10では、ガス導入管を3本設け
たので3種類の原料成分を同時に供給して気相成長を実
施できるが、原料成分を基板面と同一高さでかつ基板面
に平行に供給できるよう構成すれば、ガス導入管を任意
の本数設けてもよい。In addition, in the apparatus 10 of the embodiment, three gas introduction pipes are provided, so that three types of raw material components can be simultaneously supplied to carry out vapor phase growth. Any number of gas introduction pipes may be provided as long as they can be supplied in parallel.
さらに、前記実施例装置10では、保持台13の天井面
を形成する天板22をフローチャンネル19.20.2
1の基板側開口端の上面部に連設したが、この天板22
を保持台13に着脱自在に設ければ、基板交換室12内
で清浄済みの天板と容易に交換することができる。Furthermore, in the embodiment device 10, the top plate 22 forming the ceiling surface of the holding table 13 is connected to the flow channels 19, 20, 2.
This top plate 22
If it is detachably provided on the holding stand 13, it can be easily replaced with a cleaned top plate in the board exchange chamber 12.
以上の説明では、基板上にGaP薄膜を形成する場合で
説明したが、Zn5e薄膜を形成する場合も同様に実施
でき、この場合は、トリメチルジンクとセレン化水素と
が基板面上で混合され気相成長ガスを形成すると共に、
この気相成長ガスが基板面上で直ちに反応して反応生成
物が基板上に堆積し成膜基板が得られる。なお、Zn5
e薄膜の形成では、前記ヒータ23は不要である。In the above explanation, we have explained the case of forming a GaP thin film on the substrate, but it can be carried out in the same way when forming a Zn5e thin film. In this case, trimethyl zinc and hydrogen selenide are mixed on the substrate surface and gas Along with forming phase growth gas,
This vapor phase growth gas immediately reacts on the substrate surface, and a reaction product is deposited on the substrate to obtain a film-formed substrate. In addition, Zn5
The heater 23 is not necessary when forming an e-thin film.
以上述べたように、本発明に係る気相成長方法及びその
装置によれば、複数の原料成分は、夫々水平回転してい
る基板の基板面に供給され、基板面上で混合されるから
、ホスフィンなどの熱分解しにくい原料成分、または比
較的低温で反応してしまう原料成分を用いた場合であっ
ても良好な気相成長を実施することができる。As described above, according to the vapor phase growth method and its apparatus according to the present invention, a plurality of raw material components are respectively supplied to the substrate surface of the horizontally rotating substrate and mixed on the substrate surface. Even when using a raw material component that is difficult to thermally decompose, such as phosphine, or a raw material component that reacts at a relatively low temperature, good vapor phase growth can be performed.
第1図、第2図は本発明方法を応用した実施例装置で、
第1図はその断面正面図、第2図は第1図の■−■断面
図、第3図は従来装置の断面正面図である。
10・・・気相成長装置 11・・・気相成長室12
・・・基板交換室 13・・・保持台 15,16
.17・・・ガス導入管 18・・・ガス導出管19
.20.21・・・フローチャンネル 22・・・天
板 P・・・基板Figures 1 and 2 show an example device to which the method of the present invention is applied,
FIG. 1 is a sectional front view thereof, FIG. 2 is a sectional view taken along the line -■ in FIG. 1, and FIG. 3 is a sectional front view of the conventional device. 10... Vapor phase growth apparatus 11... Vapor phase growth chamber 12
... Board exchange room 13 ... Holding stand 15, 16
.. 17... Gas inlet pipe 18... Gas outlet pipe 19
.. 20.21...Flow channel 22...Top plate P...Substrate
Claims (1)
面に、該基板面と同一高さで、かつ該基板面に平行に供
給し、該基板面上で混合して気相成長ガスを生成すると
共に、該気相成長ガスを該基板面上で加熱分解して反応
生成物を該基板面上に堆積させて薄膜を形成することを
特徴とする気相成長方法。 2、気相成長室の下部に基板交換室を連設し、基板を載
置した保持台を水平回転可能かつ気相成長室と基板交換
室間に昇降可能に設けた気相成長装置において、複数の
原料成分を各々供給するガス導入管を気相成長室の側面
に夫々設けるとともに、各ガス導入管のフローチャンネ
ルを気相成長室内に上昇している保持台に近接するよう
配置し、かつ各フローチャンネルの下面部を気相成長室
内で水平回転している基板面と同一高さに設定したこと
を特徴とする気相成長装置。[Claims] 1. A plurality of raw material components are each supplied to the substrate surface of a horizontally rotated substrate at the same height and parallel to the substrate surface, and mixed on the substrate surface. vapor phase growth, characterized in that a vapor phase growth gas is produced, and the vapor phase growth gas is thermally decomposed on the substrate surface to deposit a reaction product on the substrate surface to form a thin film. Method. 2. A vapor phase growth apparatus in which a substrate exchange chamber is connected to the lower part of the vapor phase growth chamber, and a holding table on which the substrate is placed is horizontally rotatable and movable up and down between the vapor phase growth chamber and the substrate exchange chamber, Gas introduction pipes for supplying each of the plurality of raw material components are provided on the side surfaces of the vapor phase growth chamber, and the flow channels of each gas introduction pipe are arranged so as to be close to a holding table elevated within the vapor growth chamber, and A vapor phase growth apparatus characterized in that the lower surface of each flow channel is set at the same height as the surface of a substrate rotating horizontally within a vapor phase growth chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21207489A JPH0376111A (en) | 1989-08-17 | 1989-08-17 | Vapor deposition process and device therefor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21207489A JPH0376111A (en) | 1989-08-17 | 1989-08-17 | Vapor deposition process and device therefor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0376111A true JPH0376111A (en) | 1991-04-02 |
Family
ID=16616434
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21207489A Pending JPH0376111A (en) | 1989-08-17 | 1989-08-17 | Vapor deposition process and device therefor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0376111A (en) |
-
1989
- 1989-08-17 JP JP21207489A patent/JPH0376111A/en active Pending
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