JPH0385563U - - Google Patents
Info
- Publication number
- JPH0385563U JPH0385563U JP14686589U JP14686589U JPH0385563U JP H0385563 U JPH0385563 U JP H0385563U JP 14686589 U JP14686589 U JP 14686589U JP 14686589 U JP14686589 U JP 14686589U JP H0385563 U JPH0385563 U JP H0385563U
- Authority
- JP
- Japan
- Prior art keywords
- output
- variable gain
- input
- gain amplifier
- amplifier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims description 2
- 238000006243 chemical reaction Methods 0.000 claims 1
- 230000003760 hair shine Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Description
第１図は本考案の光デイスクの検査装置の一実
施例のブロツク図、第２図ａ〜ｄは第１図の実施
例の各部の動作波形を示す図、第３図は従来例の
構成を示すブロツク図、第４図はａ，ｂは従来例
の問題点を説明するための動作波形を示す図であ
る。
１……光ヘツド、２……プリアンプ、３……ゲ
イン固定アンプ、４……ローパスフイルタＬＰＦ
、５……可変ゲインアンプ、６……ハイパスフイ
ルタＨＰＦ、７……コンパレータ、８……Ｄ／Ａ
変換器、９……Ａ／Ｄ変換器、１０……傷測定ブ
ロツク、１１……ＣＰＵ。
Fig. 1 is a block diagram of an embodiment of the optical disk inspection device of the present invention, Figs. 2 a to d are diagrams showing operating waveforms of each part of the embodiment of Fig. 1, and Fig. 3 is the configuration of a conventional example. In FIG. 4, a and b are diagrams showing operating waveforms for explaining the problems of the conventional example. 1...Optical head, 2...Preamplifier, 3...Fixed gain amplifier, 4...Low pass filter LPF
, 5...Variable gain amplifier, 6...High pass filter HPF, 7...Comparator, 8...D/A
Converter, 9...A/D converter, 10...Flaw measurement block, 11...CPU.
Claims (1)
を当て、その反射光を受光して反射光量に比例し
た電流出力を得、該電流出力を電流／電圧変換タ
イプの前置増幅器２で増幅した後、該増幅された
電圧出力を可変利得増幅器５に入力し、該可変利
得増幅器５の出力を傷検査手段６，７，１０，１
１に入力して傷の有無の検査を行う光デイスクの
検査装置であつて、 前記前置増幅器２の出力を入力として、前記可
変利得増幅器５とは並列に設けられた増幅器３と
、 該増幅器３の出力を入力とする帯域制限回路４
と、 該帯域制限回路４の出力を入力とするＡ／Ｄ変
換器９と、 該Ａ／Ｄ変換器９の出力データを受信してデイ
スクの平均反射率を測定するＣＲＵ１１と、 該ＣＰＵ１１により設定される、前記デイスク
の平均反射率に比例したデジタル値をアナログ信
号に変換し、該変換されたアナログ信号を前記可
変利得増幅器５へ利得制御信号として送出するＤ
／Ａ変換器８とを有する光デイスクの検査装置。[Claims for Utility Model Registration] The optical head 1 shines light on the disk to be inspected, receives the reflected light, obtains a current output proportional to the amount of reflected light, and transmits the current output to the front of the current/voltage conversion type. After being amplified by the stationary amplifier 2, the amplified voltage output is input to the variable gain amplifier 5, and the output of the variable gain amplifier 5 is input to the flaw inspection means 6, 7, 10, 1.
1, which inspects the presence or absence of scratches by inputting the output from the preamplifier 2 to the amplifier 3, which is connected in parallel to the variable gain amplifier 5; Bandwidth limiting circuit 4 whose input is the output of 3.
an A/D converter 9 that receives the output of the band limiting circuit 4 as an input; a CRU 11 that receives the output data of the A/D converter 9 and measures the average reflectance of the disk; and a set by the CPU 11. D converting a digital value proportional to the average reflectance of the disk into an analog signal, and sending the converted analog signal to the variable gain amplifier 5 as a gain control signal.
/A converter 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14686589U JPH0385563U (en) | 1989-12-20 | 1989-12-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14686589U JPH0385563U (en) | 1989-12-20 | 1989-12-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0385563U true JPH0385563U (en) | 1991-08-29 |
Family
ID=31693407
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14686589U Pending JPH0385563U (en) | 1989-12-20 | 1989-12-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0385563U (en) |
-
1989
- 1989-12-20 JP JP14686589U patent/JPH0385563U/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| RU2150698C1 (en) | Multichannel acoustic emission device to test articles | |
| JPS6114506A (en) | Optical sensor | |
| US5253032A (en) | Active distance measuring apparatus | |
| JPS626493Y2 (en) | ||
| JP2581464Y2 (en) | Filter evaluation device | |
| JP3055716B2 (en) | Optical spectrum analyzer | |
| JPS6348178U (en) | ||
| JPS63141434U (en) | ||
| Pollak et al. | Recent advances in the photodensitometric evaluation of thin-media chromatograms | |
| JPS6323766Y2 (en) | ||
| JPH0230659B2 (en) | ||
| JPS6273103A (en) | Film-thickness measuring method | |
| JPS62133432A (en) | Method and circuit for automatically determining exposure value | |
| JPS6129778A (en) | Separating circuit for disturbing lighet noise | |
| JPS59154603U (en) | Radiation position detection device | |
| JPS59195867U (en) | Color document reading device | |
| JPS62173045U (en) | ||
| JPS598142U (en) | Optical rot detection device | |
| JPS6339691U (en) | ||
| JPS5810016U (en) | Photoelectric encoder failure detection circuit | |
| JPS63152563U (en) | ||
| JPS5865517U (en) | digital converter | |
| JPH0310226U (en) | ||
| JPS61135243U (en) | ||
| JPH076735U (en) | Optical signal detector for spectroscope |